WO2002044687A3 - Method and device utilizing plasma source for real-time gas sampling - Google Patents

Method and device utilizing plasma source for real-time gas sampling Download PDF

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Publication number
WO2002044687A3
WO2002044687A3 PCT/US2001/044585 US0144585W WO0244687A3 WO 2002044687 A3 WO2002044687 A3 WO 2002044687A3 US 0144585 W US0144585 W US 0144585W WO 0244687 A3 WO0244687 A3 WO 0244687A3
Authority
WO
WIPO (PCT)
Prior art keywords
gas
wave bands
real
flow
plasma source
Prior art date
Application number
PCT/US2001/044585
Other languages
French (fr)
Other versions
WO2002044687A2 (en
Inventor
Gary Powell
Richard L Hazard
Original Assignee
Lightwind Corp
Gary Powell
Richard L Hazard
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/726,195 external-priority patent/US6538734B2/en
Application filed by Lightwind Corp, Gary Powell, Richard L Hazard filed Critical Lightwind Corp
Priority to JP2002546186A priority Critical patent/JP2004515066A/en
Priority to AU2002241526A priority patent/AU2002241526A1/en
Publication of WO2002044687A2 publication Critical patent/WO2002044687A2/en
Publication of WO2002044687A3 publication Critical patent/WO2002044687A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N1/22—Devices for withdrawing samples in the gaseous state
    • G01N1/2226—Sampling from a closed space, e.g. food package, head space
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields

Abstract

Aspects of the present invention provide novel methods and devices for sampling gas, exciting the sampled gas (105) to emit radiation and detecting (109) in real time from the emitted radiation a plurality of wave bands of an emission spectrum. Energy used to excite the sampled gas may be adjusted based on the detected wave bands. A process may be controlled in real time based on the detected wave bands. Novel interfaces (112) may be used to display portions of the detected wave bands. A known flow of a reference gas may be included in the flow of sampled gases and an unknown flow of an unknown flow gas determined.
PCT/US2001/044585 2000-11-29 2001-11-29 Method and device utilizing plasma source for real-time gas sampling WO2002044687A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002546186A JP2004515066A (en) 2000-11-29 2001-11-29 Method and device utilizing a plasma source for real-time gas sampling
AU2002241526A AU2002241526A1 (en) 2000-11-29 2001-11-29 Method and device utilizing plasma source for real-time gas sampling

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US09/726,195 2000-11-29
US09/726,195 US6538734B2 (en) 2000-11-29 2000-11-29 Method and device utilizing real-time gas sampling
US10/038,090 2001-10-29
US10/038,090 US6791692B2 (en) 2000-11-29 2001-10-29 Method and device utilizing plasma source for real-time gas sampling

Publications (2)

Publication Number Publication Date
WO2002044687A2 WO2002044687A2 (en) 2002-06-06
WO2002044687A3 true WO2002044687A3 (en) 2003-02-27

Family

ID=26714845

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/044585 WO2002044687A2 (en) 2000-11-29 2001-11-29 Method and device utilizing plasma source for real-time gas sampling

Country Status (6)

Country Link
US (3) US6791692B2 (en)
JP (1) JP2004515066A (en)
CN (1) CN1296685C (en)
AU (1) AU2002241526A1 (en)
TW (1) TW530156B (en)
WO (1) WO2002044687A2 (en)

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Also Published As

Publication number Publication date
CN1489685A (en) 2004-04-14
US7019829B2 (en) 2006-03-28
US7202946B2 (en) 2007-04-10
US6791692B2 (en) 2004-09-14
US20050030531A1 (en) 2005-02-10
US20060203239A1 (en) 2006-09-14
CN1296685C (en) 2007-01-24
TW530156B (en) 2003-05-01
US20020135761A1 (en) 2002-09-26
AU2002241526A1 (en) 2002-06-11
WO2002044687A2 (en) 2002-06-06
JP2004515066A (en) 2004-05-20

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