WO2002015237A3 - Changing local compressibility of a wafer support member - Google Patents

Changing local compressibility of a wafer support member Download PDF

Info

Publication number
WO2002015237A3
WO2002015237A3 PCT/US2001/024904 US0124904W WO0215237A3 WO 2002015237 A3 WO2002015237 A3 WO 2002015237A3 US 0124904 W US0124904 W US 0124904W WO 0215237 A3 WO0215237 A3 WO 0215237A3
Authority
WO
WIPO (PCT)
Prior art keywords
support member
wafer support
sealant material
pores
wager
Prior art date
Application number
PCT/US2001/024904
Other languages
French (fr)
Other versions
WO2002015237A2 (en
WO2002015237B1 (en
Inventor
Diane B Scott
Original Assignee
Rodel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rodel Inc filed Critical Rodel Inc
Publication of WO2002015237A2 publication Critical patent/WO2002015237A2/en
Publication of WO2002015237A3 publication Critical patent/WO2002015237A3/en
Publication of WO2002015237B1 publication Critical patent/WO2002015237B1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67126Apparatus for sealing, encapsulating, glassing, decapsulating or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support

Abstract

A wafer support member (1), and a method of changing local compressibility of a wafer support member (1) to provide a seal, includes, dispensing a curable sealant material (9) onto a resiliently compressible wager support member (1), the support member having pores (6) for directing either fluid borne pressure or fluid borne vaccuum between the wafer support member (1) and a backside of a wager to be supported, wicking the sealant material (9) into pores (6) of the wager support member (1), curing the sealant material (9) to provide a film closing each of the pores (6) that are intercepted by the sealant material (9), to change local compressibility of the edge margin (5) of the wafer support member (1), and provide a seal.
PCT/US2001/024904 2000-08-11 2001-08-08 Changing local compressibility of a wafer support member WO2002015237A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US22431900P 2000-08-11 2000-08-11
US60/224,319 2000-08-11

Publications (3)

Publication Number Publication Date
WO2002015237A2 WO2002015237A2 (en) 2002-02-21
WO2002015237A3 true WO2002015237A3 (en) 2002-04-11
WO2002015237B1 WO2002015237B1 (en) 2002-06-27

Family

ID=22840138

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2001/024904 WO2002015237A2 (en) 2000-08-11 2001-08-08 Changing local compressibility of a wafer support member

Country Status (3)

Country Link
US (1) US20020022082A1 (en)
TW (1) TW506038B (en)
WO (1) WO2002015237A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7055229B2 (en) * 2003-12-31 2006-06-06 Intel Corporation Support system for semiconductor wafers and methods thereof
CN104076619A (en) * 2014-07-03 2014-10-01 无锡宏纳科技有限公司 Contact type photoetching machine sucking disc
CN109887877B (en) * 2019-01-02 2021-09-14 长江存储科技有限责任公司 Wafer fixing table and wafer bonding equipment
CN113471135B (en) * 2021-07-06 2022-07-29 华海清科股份有限公司 Wafer clamping device and wafer cleaning device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0776730A1 (en) * 1995-11-30 1997-06-04 Rodel Nitta Company Workpiece retaining device and method for producing the same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0776730A1 (en) * 1995-11-30 1997-06-04 Rodel Nitta Company Workpiece retaining device and method for producing the same

Also Published As

Publication number Publication date
WO2002015237A2 (en) 2002-02-21
US20020022082A1 (en) 2002-02-21
TW506038B (en) 2002-10-11
WO2002015237B1 (en) 2002-06-27

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