WO2002010828A3 - Control of position and orientation of sub-wavelength aperture array in near-field microscopy - Google Patents
Control of position and orientation of sub-wavelength aperture array in near-field microscopy Download PDFInfo
- Publication number
- WO2002010828A3 WO2002010828A3 PCT/US2001/023656 US0123656W WO0210828A3 WO 2002010828 A3 WO2002010828 A3 WO 2002010828A3 US 0123656 W US0123656 W US 0123656W WO 0210828 A3 WO0210828 A3 WO 0210828A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sub
- sample
- mask
- orientation
- control
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
- G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q10/00—Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
- G01Q10/04—Fine scanning or positioning
- G01Q10/06—Circuits or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/06—Probe tip arrays
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01957287A EP1303777A2 (en) | 2000-07-27 | 2001-07-27 | Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
JP2002515498A JP2004505312A (en) | 2000-07-27 | 2001-07-27 | Control of subwavelength aperture array position and orientation in near-field microscopy |
AU2001279047A AU2001279047A1 (en) | 2000-07-27 | 2001-07-27 | Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US22128700P | 2000-07-27 | 2000-07-27 | |
US60/221,287 | 2000-07-27 |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2002010828A2 WO2002010828A2 (en) | 2002-02-07 |
WO2002010828A3 true WO2002010828A3 (en) | 2003-01-03 |
WO2002010828A9 WO2002010828A9 (en) | 2004-05-06 |
Family
ID=22827165
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2001/023656 WO2002010828A2 (en) | 2000-07-27 | 2001-07-27 | Control of position and orientation of sub-wavelength aperture array in near-field microscopy |
Country Status (5)
Country | Link |
---|---|
US (1) | US6552805B2 (en) |
EP (1) | EP1303777A2 (en) |
JP (1) | JP2004505312A (en) |
AU (1) | AU2001279047A1 (en) |
WO (1) | WO2002010828A2 (en) |
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US6403124B1 (en) * | 1997-04-16 | 2002-06-11 | Sigma-Tau Industrie Farmaceutiche Riunite S.P.A. | Storage and maintenance of blood products including red blood cells and platelets |
DE60016761T2 (en) * | 1999-08-02 | 2005-12-15 | Zetetic Institute, Tucson | INTERFEROMETRIC CONFOCUS NEAR FIELD SCREENING MICROSCOPY |
EP1303778A2 (en) * | 2000-07-27 | 2003-04-23 | Zetetic Institute | Differential interferometric scanning near-field confocal microscopy |
JP2004505314A (en) * | 2000-07-27 | 2004-02-19 | ゼテティック・インスティチュート | Scanning interference near-field confocal microscopy with attenuated and compensated background amplitude |
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US6858436B2 (en) * | 2002-04-30 | 2005-02-22 | Motorola, Inc. | Near-field transform spectroscopy |
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US7084983B2 (en) * | 2003-01-27 | 2006-08-01 | Zetetic Institute | Interferometric confocal microscopy incorporating a pinhole array beam-splitter |
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US4659429A (en) * | 1983-08-03 | 1987-04-21 | Cornell Research Foundation, Inc. | Method and apparatus for production and use of nanometer scale light beams |
US5371588A (en) * | 1993-11-10 | 1994-12-06 | University Of Maryland, College Park | Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
EP0757271A2 (en) * | 1995-08-04 | 1997-02-05 | International Business Machines Corporation | Interferometric near-field apparatus and method |
DE19858490A1 (en) * | 1998-12-18 | 2000-06-21 | Laser & Med Tech Gmbh | Near-field optical analysis of biological objects employs matrix of light micro- or nano-sources excited by scanning laser or free electron beam, causing secondary optical emissions |
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2001
- 2001-07-27 EP EP01957287A patent/EP1303777A2/en not_active Withdrawn
- 2001-07-27 JP JP2002515498A patent/JP2004505312A/en active Pending
- 2001-07-27 US US09/917,401 patent/US6552805B2/en not_active Expired - Fee Related
- 2001-07-27 AU AU2001279047A patent/AU2001279047A1/en not_active Abandoned
- 2001-07-27 WO PCT/US2001/023656 patent/WO2002010828A2/en not_active Application Discontinuation
Patent Citations (4)
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US4659429A (en) * | 1983-08-03 | 1987-04-21 | Cornell Research Foundation, Inc. | Method and apparatus for production and use of nanometer scale light beams |
US5371588A (en) * | 1993-11-10 | 1994-12-06 | University Of Maryland, College Park | Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
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Non-Patent Citations (2)
Title |
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Also Published As
Publication number | Publication date |
---|---|
US6552805B2 (en) | 2003-04-22 |
WO2002010828A2 (en) | 2002-02-07 |
US20020033952A1 (en) | 2002-03-21 |
AU2001279047A1 (en) | 2002-02-13 |
WO2002010828A9 (en) | 2004-05-06 |
EP1303777A2 (en) | 2003-04-23 |
JP2004505312A (en) | 2004-02-19 |
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