WO2001009627A3 - Environmental test chamber and carrier for use therein - Google Patents

Environmental test chamber and carrier for use therein Download PDF

Info

Publication number
WO2001009627A3
WO2001009627A3 PCT/US2000/021083 US0021083W WO0109627A3 WO 2001009627 A3 WO2001009627 A3 WO 2001009627A3 US 0021083 W US0021083 W US 0021083W WO 0109627 A3 WO0109627 A3 WO 0109627A3
Authority
WO
WIPO (PCT)
Prior art keywords
test chamber
carrier
environmental test
pallets
receive
Prior art date
Application number
PCT/US2000/021083
Other languages
French (fr)
Other versions
WO2001009627A2 (en
Inventor
Donald J Wanek
Loren L Swanson
Richard L Sands
Mark Troutman
James A Melville
Original Assignee
Pemstar Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pemstar Inc filed Critical Pemstar Inc
Priority to AU63970/00A priority Critical patent/AU6397000A/en
Priority to JP2001514585A priority patent/JP2003506687A/en
Publication of WO2001009627A2 publication Critical patent/WO2001009627A2/en
Publication of WO2001009627A3 publication Critical patent/WO2001009627A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests

Abstract

One aspect of the present invention is a system of fabricating a barrier wall between the testing and tester volumes of an environmental test chamber. This aspect may use a plurality of pallets adapted to receive a device under test and a testing apparatus, a framework adapted to receive a plurality of pallets, and a plurality of insulation bricks associated with the plurality of pallets. The insulation bricks may be adapted such that they can cooperate to form an insulating barrier between the device under test and the testing apparatus.
PCT/US2000/021083 1999-08-02 2000-08-02 Environmental test chamber and carrier for use therein WO2001009627A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
AU63970/00A AU6397000A (en) 1999-08-02 2000-08-02 Environmental test chamber and carrier for use therein
JP2001514585A JP2003506687A (en) 1999-08-02 2000-08-02 Environmental test chamber and carrier used in the environmental test chamber

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
US14681299P 1999-08-02 1999-08-02
US60/146,812 1999-08-02
US14698899P 1999-08-03 1999-08-03
US60/146,988 1999-08-03
US15828099P 1999-10-07 1999-10-07
US60/158,280 1999-10-07
US17093999P 1999-12-15 1999-12-15
US60/170,939 1999-12-15

Publications (2)

Publication Number Publication Date
WO2001009627A2 WO2001009627A2 (en) 2001-02-08
WO2001009627A3 true WO2001009627A3 (en) 2002-03-28

Family

ID=27495726

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2000/021083 WO2001009627A2 (en) 1999-08-02 2000-08-02 Environmental test chamber and carrier for use therein

Country Status (5)

Country Link
US (3) US6526841B1 (en)
JP (1) JP2003506687A (en)
CN (1) CN1382260A (en)
AU (1) AU6397000A (en)
WO (1) WO2001009627A2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8964361B2 (en) 2010-07-21 2015-02-24 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US11953519B2 (en) 2020-10-22 2024-04-09 Teradyne, Inc. Modular automated test system

Families Citing this family (91)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6526841B1 (en) * 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
GB9928211D0 (en) * 1999-11-29 2000-01-26 Havant International Ltd Disk drive kit
US6806700B2 (en) * 2001-04-25 2004-10-19 Pemstar, Inc. Hard drive test fixture
TW577542U (en) * 2002-10-23 2004-02-21 Quanta Comp Inc Thermal testing control system
US7131040B2 (en) * 2003-05-12 2006-10-31 Kingston Technology Corp. Manifold-Distributed Air Flow Over Removable Test Boards in a Memory-Module Burn-In System With Heat Chamber Isolated by Backplane
US20040252746A1 (en) * 2003-06-13 2004-12-16 Kendro Laboratory Products, Lp Method and apparatus for temperature calibration of an incubator
US7232101B2 (en) * 2003-11-26 2007-06-19 Pemstar, Inc. Hard drive test fixture
US20050225338A1 (en) * 2004-03-31 2005-10-13 Sands Richard L Hard drive test fixture
KR20070062521A (en) * 2004-09-17 2007-06-15 지라텍스 테크놀로지 리미티드 Housings and devices for disk drives
JP2008539501A (en) * 2005-04-26 2008-11-13 イノヴェイティヴ ポリマーズ ピーティーイー リミテッド Test carrier for storage devices
EP1924996A1 (en) * 2005-09-16 2008-05-28 Xyratex Technology Limited Method and apparatus for controlling the temperature of a disk drive during manufacture
US20070064385A1 (en) * 2005-09-19 2007-03-22 Paul Dieter G Receiving frame having removable computer drive carrier and fan modules
US20070174664A1 (en) * 2006-01-04 2007-07-26 Ess Data Recovery, Inc. Data recovery application
US7830770B1 (en) * 2006-03-15 2010-11-09 Emc Corporation Techniques for storing and retrieving data using a sphere-shaped data storage structure
JP4831544B2 (en) * 2006-08-29 2011-12-07 エスアイアイ・ナノテクノロジー株式会社 Thermal analyzer
US7752562B2 (en) * 2006-12-15 2010-07-06 Sap Ag Detection of procedural deficiency across multiple business applications
US20090082907A1 (en) * 2007-09-21 2009-03-26 Seagate Technology Llc Mechanically isolated environmental test chamber
US8875528B2 (en) * 2007-12-14 2014-11-04 Venturedyne, Ltd. Test chamber with temperature and humidity control
US20090153993A1 (en) * 2007-12-18 2009-06-18 Teradyne, Inc. Disk Drive Testing
US7996174B2 (en) * 2007-12-18 2011-08-09 Teradyne, Inc. Disk drive testing
US8549912B2 (en) 2007-12-18 2013-10-08 Teradyne, Inc. Disk drive transport, clamping and testing
US20090262455A1 (en) 2008-04-17 2009-10-22 Teradyne, Inc. Temperature Control Within Disk Drive Testing Systems
US8095234B2 (en) * 2008-04-17 2012-01-10 Teradyne, Inc. Transferring disk drives within disk drive testing systems
US7945424B2 (en) * 2008-04-17 2011-05-17 Teradyne, Inc. Disk drive emulator and method of use thereof
US8305751B2 (en) 2008-04-17 2012-11-06 Teradyne, Inc. Vibration isolation within disk drive testing systems
US7848106B2 (en) * 2008-04-17 2010-12-07 Teradyne, Inc. Temperature control within disk drive testing systems
US20110123301A1 (en) * 2008-04-17 2011-05-26 Scott Noble Bulk feeding storage devices to storage device testing systems
US8102173B2 (en) * 2008-04-17 2012-01-24 Teradyne, Inc. Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
US8238099B2 (en) 2008-04-17 2012-08-07 Teradyne, Inc. Enclosed operating area for disk drive testing systems
US8160739B2 (en) * 2008-04-17 2012-04-17 Teradyne, Inc. Transferring storage devices within storage device testing systems
US8117480B2 (en) 2008-04-17 2012-02-14 Teradyne, Inc. Dependent temperature control within disk drive testing systems
US8041449B2 (en) 2008-04-17 2011-10-18 Teradyne, Inc. Bulk feeding disk drives to disk drive testing systems
US8086343B2 (en) * 2008-06-03 2011-12-27 Teradyne, Inc. Processing storage devices
KR101217806B1 (en) * 2008-12-19 2013-01-03 한국전자통신연구원 Chamber of environmental test with moving type panel and Method for driving the same
US7644631B1 (en) * 2009-01-09 2010-01-12 International Business Machines Corporation Electronics cabinet acoustical and thermal test device
US7995349B2 (en) 2009-07-15 2011-08-09 Teradyne, Inc. Storage device temperature sensing
US8687356B2 (en) * 2010-02-02 2014-04-01 Teradyne, Inc. Storage device testing system cooling
US8466699B2 (en) 2009-07-15 2013-06-18 Teradyne, Inc. Heating storage devices in a testing system
US8116079B2 (en) 2009-07-15 2012-02-14 Teradyne, Inc. Storage device testing system cooling
US8628239B2 (en) 2009-07-15 2014-01-14 Teradyne, Inc. Storage device temperature sensing
US7920380B2 (en) * 2009-07-15 2011-04-05 Teradyne, Inc. Test slot cooling system for a storage device testing system
US8547123B2 (en) * 2009-07-15 2013-10-01 Teradyne, Inc. Storage device testing system with a conductive heating assembly
US8272780B1 (en) * 2009-08-21 2012-09-25 Rantec Power Systems, Inc. Multiple-unit thermal test apparatus for electrical devices
US8225682B2 (en) * 2009-10-07 2012-07-24 Atlas Materials Testing Technology, Llc Accelerated weathering test apparatus with calibration-access assembly
US8270118B1 (en) 2009-10-30 2012-09-18 Western Digital Technologies, Inc. Head stack assembly cartridge
US8218256B1 (en) 2009-10-30 2012-07-10 Western Digital Technologies, Inc. Disk spindle assembly cartridge
GB0919832D0 (en) * 2009-11-13 2009-12-30 Airbus Operations Ltd Thermal test apparatus and method
US20110128988A1 (en) * 2009-12-02 2011-06-02 Juniper Networks Inc. Temperature control of conduction-cooled devices during testing at high temperatures
US8759084B2 (en) * 2010-01-22 2014-06-24 Michael J. Nichols Self-sterilizing automated incubator
US9779780B2 (en) 2010-06-17 2017-10-03 Teradyne, Inc. Damping vibrations within storage device testing systems
US8432630B1 (en) 2010-06-30 2013-04-30 Western Digital Technologies, Inc. Disk drive component test system
US8621945B2 (en) * 2010-11-14 2014-01-07 Kla Tencor Method and apparatus for improving the temperature stability and minimizing the noise of the environment that encloses an interferometric measuring system
KR101185180B1 (en) * 2011-05-20 2012-09-24 (주)에스엠인스트루먼트 Apparatus for measuring hdd noise and method
KR20130032647A (en) * 2011-09-23 2013-04-02 삼성전자주식회사 Wafer test apparatus
US8602641B2 (en) * 2011-10-26 2013-12-10 Temptronic Corporation Environmental test system and method with in-situ temperature sensing of device under test (DUT)
US20130181059A1 (en) * 2012-01-13 2013-07-18 Nissan North America, Inc. Testing apparatus for preventing freezing of relays in electrical components
US9383786B2 (en) * 2012-12-14 2016-07-05 Dell Products L.P. Telescoping enclosure for information handling system component
US10161962B2 (en) 2014-06-06 2018-12-25 Advantest Corporation Universal test cell
US9726717B2 (en) 2013-12-10 2017-08-08 Seagate Technology Llc Testing system with differing testing slots
US9618570B2 (en) * 2014-06-06 2017-04-11 Advantest Corporation Multi-configurable testing module for automated testing of a device
US9638749B2 (en) 2014-06-06 2017-05-02 Advantest Corporation Supporting automated testing of devices in a test floor system
US9678148B2 (en) * 2014-06-06 2017-06-13 Advantest Corporation Customizable tester having testing modules for automated testing of devices
US9618574B2 (en) 2014-06-06 2017-04-11 Advantest Corporation Controlling automated testing of devices
DE102014111585A1 (en) * 2014-08-13 2016-02-18 Horiba Europe Gmbh Test bench with a Kühlgaszuströmvorrichtung
US9478250B1 (en) 2015-04-24 2016-10-25 Seagate Technology Llc Data storage component testing system
US9412411B1 (en) 2015-04-24 2016-08-09 Seagate Technology Llc Modular data storage device testing system
US9449643B1 (en) 2015-04-24 2016-09-20 Seagate Technology Llc Data storage component test deck
US9514781B2 (en) 2015-04-24 2016-12-06 Seagate Technology Llc Data storage component test deck system
US10495565B2 (en) 2016-05-12 2019-12-03 Weiss Technik North America, Inc. Environmental test chamber with uniform airflow
JP6543224B2 (en) * 2016-06-15 2019-07-10 エスペック株式会社 Environmental test equipment and air conditioner
US11047151B2 (en) * 2016-10-25 2021-06-29 Qianyan Cheng Surface mounted barn door privacy lock
WO2018207270A1 (en) * 2017-05-09 2018-11-15 株式会社ダイチューテクノロジーズ Evaluation test device for recording media
US11226390B2 (en) 2017-08-28 2022-01-18 Teradyne, Inc. Calibration process for an automated test system
US10725091B2 (en) 2017-08-28 2020-07-28 Teradyne, Inc. Automated test system having multiple stages
US10948534B2 (en) 2017-08-28 2021-03-16 Teradyne, Inc. Automated test system employing robotics
US10845410B2 (en) 2017-08-28 2020-11-24 Teradyne, Inc. Automated test system having orthogonal robots
CN108593705B (en) * 2018-04-04 2024-04-02 镇江市建设工程质量检测中心有限公司 Test frame and wall body thermal insulation performance detection device
US10983145B2 (en) 2018-04-24 2021-04-20 Teradyne, Inc. System for testing devices inside of carriers
US10775408B2 (en) 2018-08-20 2020-09-15 Teradyne, Inc. System for testing devices inside of carriers
CN111796638B (en) * 2019-04-08 2022-04-29 富联精密电子(天津)有限公司 Expansion card fixing support and case
CN112114207A (en) * 2019-06-19 2020-12-22 泰克元有限公司 Test board and test chamber
CN112213614A (en) * 2019-07-11 2021-01-12 富泰华工业（深圳）有限公司 Testing device
US11714464B2 (en) * 2019-07-25 2023-08-01 Seagate Technology Llc Adjustable tray assembly for data storage devices
US11754622B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Thermal control system for an automated test system
US11899042B2 (en) 2020-10-22 2024-02-13 Teradyne, Inc. Automated test system
TW202232104A (en) * 2020-10-22 2022-08-16 美商泰瑞達公司 Modular automated test system
US11867749B2 (en) 2020-10-22 2024-01-09 Teradyne, Inc. Vision system for an automated test system
US11754596B2 (en) 2020-10-22 2023-09-12 Teradyne, Inc. Test site configuration in an automated test system
WO2022146225A1 (en) * 2020-12-30 2022-07-07 Msv Systems & Services Pte Ltd Apparatus, transfer method, chamber and frame for semiconductor burn-in process
CN114184940B (en) * 2022-02-16 2022-05-20 海拓仪器(江苏)有限公司 Chip aging test device
CN117214477A (en) * 2023-10-09 2023-12-12 闫生 Electric power detection equipment and detection method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5021732A (en) * 1988-10-27 1991-06-04 Grumman Aerospace Corporation Burn-in testing equipment having an instrumentation control module
US5072177A (en) * 1989-04-26 1991-12-10 Venturedyne, Ltd. Product carrier with extended port interface
US5126656A (en) * 1991-05-31 1992-06-30 Ej Systems, Inc. Burn-in tower
US5446394A (en) * 1994-02-01 1995-08-29 Vlsi Technology, Inc. Test fixture with permanent circuit board extractor thereon
WO1997006532A1 (en) * 1995-08-04 1997-02-20 Havant International Limited Disk file mounting
US5721669A (en) * 1995-09-15 1998-02-24 Apple Computer, Inc. Gear-driven docking apparatus for removable mass-storage drives
EP0834879A1 (en) * 1996-10-03 1998-04-08 Hewlett-Packard Company A mounting arrangement for mounting either of two differently-sized subsystem units
US5927504A (en) * 1998-06-23 1999-07-27 Samsung Electronics Co., Ltd. Apparatus for carrying plural printed circuit boards for semiconductor module

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2614413A (en) * 1947-07-01 1952-10-21 Jr Henry G Alley Cargo tester which simulates ship's motion
US3184275A (en) * 1963-10-25 1965-05-18 Colin D Gardner Forced air cooling of electronic equipment
US3302615A (en) * 1965-04-15 1967-02-07 Becton Dickinson Co Controlled environmental system for handling and rearing laboratory and research animals
US4000460A (en) * 1974-07-01 1976-12-28 Xerox Corporation Digital circuit module test system
US4178545A (en) * 1977-05-09 1979-12-11 Dale Electronics, Inc. Electrical resistor testing fixture
US4313679A (en) * 1979-11-29 1982-02-02 The United States Of America As Represented By The Secretary Of The Air Force Test sample support assembly
JPS5798583A (en) * 1980-12-10 1982-06-18 Sumikin Coke Co Ltd Method for raising temperature of hot stacking and replacing operation of coke oven
JPS57151842A (en) * 1981-03-13 1982-09-20 Daifuku Co Ltd Truck for testing and test facility using the same
US4521333A (en) * 1983-06-20 1985-06-04 Minnesota Mining And Manufacturing Company Intumescent silicates having improved stability
SU1251043A2 (en) * 1984-10-11 1986-08-15 Предприятие П/Я А-1298 Heat chamber
US4854726A (en) * 1986-05-29 1989-08-08 Hughes Aircraft Company Thermal stress screening system
SU1578596A1 (en) * 1987-06-15 1990-07-15 Предприятие П/Я Р-6043 Chamber for testing articles for action of salt mist
US4812750A (en) * 1987-09-28 1989-03-14 Avex Electronics Inc. Environmental stress screening apparatus
US4926118A (en) * 1988-02-22 1990-05-15 Sym-Tek Systems, Inc. Test station
US5039228A (en) * 1989-11-02 1991-08-13 The United States Of America As Represented By The Secretary Of The Navy Fixtureless environmental stress screening apparatus
US5298299A (en) * 1990-05-24 1994-03-29 Shea Lawrence E Double wall fire proof duct
US5431599A (en) * 1990-08-29 1995-07-11 Intelligent Enclosures Corporation Environmental control system
US5195384A (en) * 1991-01-28 1993-03-23 Duesler Jr Ira D Environmental stress screening device transfer apparatus
US5143450A (en) * 1991-02-01 1992-09-01 Aetrium, Inc. Apparatus for handling devices under varying temperatures
DE4104962A1 (en) * 1991-02-18 1992-08-20 Bosch Siemens Hausgeraete COOKER WITH A WARMING COMPARTMENT
US5147136A (en) * 1991-05-20 1992-09-15 Crane Plastics Company Temperature cycling test chambers
US5206518A (en) * 1991-12-02 1993-04-27 Q-Panel Company Accelerated weathering apparatus
JPH081417B2 (en) * 1991-12-20 1996-01-10 オリオン機械株式会社 Fixed structure such as rails in line type environmental test equipment
JPH07104264B2 (en) * 1991-12-20 1995-11-13 オリオン機械株式会社 Conveying structure of line type environmental test equipment
US5361450A (en) * 1992-12-31 1994-11-08 Zellweger Uster, Inc. Direct control of fiber testing or processing performance parameters by application of controlled, conditioned gas flows
US5540109A (en) 1992-11-05 1996-07-30 Qualmark Corporation Apparatus and method for thermal and vibrational stress screening
EP0611968B1 (en) * 1993-02-10 1999-03-31 Sieba Ag Apparatus for testing modules
US5381701A (en) * 1993-03-26 1995-01-17 At&T Corp. Dust particle exposure chamber
US5660103A (en) * 1993-05-05 1997-08-26 Henny Penny Corporation Humidity generating system
US5363688A (en) * 1993-08-12 1994-11-15 Novitas Incorporated Method of calibrating motion detectors within a scaled environment
US5543727A (en) * 1994-04-05 1996-08-06 Bellsouth Corporation Run-in test system for PC circuit board
US5528161A (en) * 1994-09-15 1996-06-18 Venturedyne Limited Through-port load carrier and related test apparatus
US5675048A (en) * 1994-10-14 1997-10-07 Uop Dual regeneration zone solid catalyst alkylation process
US5503032A (en) * 1995-02-23 1996-04-02 Atlas Electric Devices Co. High accuracy weathering test machine
US5834946A (en) * 1995-10-19 1998-11-10 Mosaid Technologies Incorporated Integrated circuit test head
US5792427A (en) * 1996-02-09 1998-08-11 Forma Scientific, Inc. Controlled atmosphere incubator
KR100214308B1 (en) 1996-05-11 1999-08-02 윤종용 Test apparatus for hard disc driver
KR100209018B1 (en) * 1996-09-16 1999-07-15 윤종용 Oven for testing auxiliary memory
KR100209017B1 (en) 1996-09-16 1999-07-15 윤종용 Auxiliary memory test device
US5842313A (en) * 1996-09-24 1998-12-01 American Access Technologies, Inc. Communications cable interconnection apparatus and associated method for an open office architecture
KR100223651B1 (en) 1996-10-30 1999-10-15 윤종용 Acceptance tester for manufacture processing
US5767424A (en) * 1996-12-23 1998-06-16 Electronic Controls Design, Inc. Wave solder analyzer
US6009748A (en) * 1997-01-13 2000-01-04 Tannas Co. Rapidly cyclable foam testing oven
US6070478A (en) * 1998-02-19 2000-06-06 Hewlett-Packard Company Removable fixture adapter with RF connections
JP3874322B2 (en) * 1998-06-02 2007-01-31 エスペック株式会社 Environmental test equipment with drawer type door
TW433461U (en) * 1998-06-08 2001-05-01 Inventec Corp Test apparatus of temperature endurance
US6526841B1 (en) 1999-08-02 2003-03-04 Pemstar, Inc. Environmental test chamber and a carrier for use therein
US6272767B1 (en) 1999-10-21 2001-08-14 Envirotronics, Inc. Environmental test chamber
US6806700B2 (en) 2001-04-25 2004-10-19 Pemstar, Inc. Hard drive test fixture

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5021732A (en) * 1988-10-27 1991-06-04 Grumman Aerospace Corporation Burn-in testing equipment having an instrumentation control module
US5072177A (en) * 1989-04-26 1991-12-10 Venturedyne, Ltd. Product carrier with extended port interface
US5126656A (en) * 1991-05-31 1992-06-30 Ej Systems, Inc. Burn-in tower
US5446394A (en) * 1994-02-01 1995-08-29 Vlsi Technology, Inc. Test fixture with permanent circuit board extractor thereon
WO1997006532A1 (en) * 1995-08-04 1997-02-20 Havant International Limited Disk file mounting
US5721669A (en) * 1995-09-15 1998-02-24 Apple Computer, Inc. Gear-driven docking apparatus for removable mass-storage drives
EP0834879A1 (en) * 1996-10-03 1998-04-08 Hewlett-Packard Company A mounting arrangement for mounting either of two differently-sized subsystem units
US5927504A (en) * 1998-06-23 1999-07-27 Samsung Electronics Co., Ltd. Apparatus for carrying plural printed circuit boards for semiconductor module

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8964361B2 (en) 2010-07-21 2015-02-24 Teradyne, Inc. Bulk transfer of storage devices using manual loading
US9001456B2 (en) 2010-08-31 2015-04-07 Teradyne, Inc. Engaging test slots
US9459312B2 (en) 2013-04-10 2016-10-04 Teradyne, Inc. Electronic assembly test system
US11953519B2 (en) 2020-10-22 2024-04-09 Teradyne, Inc. Modular automated test system

Also Published As

Publication number Publication date
AU6397000A (en) 2001-02-19
JP2003506687A (en) 2003-02-18
US20030121337A1 (en) 2003-07-03
CN1382260A (en) 2002-11-27
US6526841B1 (en) 2003-03-04
US20010035058A1 (en) 2001-11-01
WO2001009627A2 (en) 2001-02-08
US6679128B2 (en) 2004-01-20
US7070323B2 (en) 2006-07-04

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