WO2000048444A3 - Packaging for a semiconductor chip - Google Patents
Packaging for a semiconductor chip Download PDFInfo
- Publication number
- WO2000048444A3 WO2000048444A3 PCT/EP2000/000678 EP0000678W WO0048444A3 WO 2000048444 A3 WO2000048444 A3 WO 2000048444A3 EP 0000678 W EP0000678 W EP 0000678W WO 0048444 A3 WO0048444 A3 WO 0048444A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- semiconductor chip
- packaging
- interposer
- relates
- semiconductor
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
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- H01L23/13—Mountings, e.g. non-detachable insulating substrates characterised by the shape
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
Abstract
The invention relates to packaging for a semiconductor chip (10), in which the semiconductor chip (10) is bonded to an interposer (20), which has a central opening (26) over a central bonding pad area (16) of the semiconductor chip (10). Wire bridges (40) passing through said central opening (26) lead from bonding pads (18) on the semiconductor chip (10) to connecting pads (36) on the interposer (20). The invention also relates to a semiconductor component and a memory module having corresponding characteristics, as well as to a method of production used notably for the production of a semiconductor component of this kind.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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AU22941/00A AU2294100A (en) | 1999-02-16 | 2000-01-28 | Packaging for a semiconductor chip |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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DE29902754.6 | 1999-02-16 | ||
DE29902754U DE29902754U1 (en) | 1998-02-20 | 1999-02-16 | Package for a semiconductor chip |
Publications (2)
Publication Number | Publication Date |
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WO2000048444A2 WO2000048444A2 (en) | 2000-08-24 |
WO2000048444A3 true WO2000048444A3 (en) | 2003-05-22 |
Family
ID=8069480
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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PCT/EP2000/000678 WO2000048444A2 (en) | 1999-02-16 | 2000-01-28 | Packaging for a semiconductor chip |
Country Status (2)
Country | Link |
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AU (1) | AU2294100A (en) |
WO (1) | WO2000048444A2 (en) |
Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0428260A (en) * | 1990-05-23 | 1992-01-30 | Matsushita Electric Ind Co Ltd | Method of mounting semiconductor chip |
JPH07321244A (en) * | 1994-05-27 | 1995-12-08 | Matsushita Electric Ind Co Ltd | Electronic part, and manufacture of electronic part |
JPH09260441A (en) * | 1996-03-26 | 1997-10-03 | Mitsubishi Electric Corp | Semiconductor device |
US5674785A (en) * | 1995-11-27 | 1997-10-07 | Micron Technology, Inc. | Method of producing a single piece package for semiconductor die |
EP0810655A2 (en) * | 1996-05-29 | 1997-12-03 | Texas Instruments Incorporated | A package for a semiconductor device |
US5703405A (en) * | 1993-03-15 | 1997-12-30 | Motorola, Inc. | Integrated circuit chip formed from processing two opposing surfaces of a wafer |
GB2320616A (en) * | 1996-12-18 | 1998-06-24 | Hyundai Electronics Ind | Semiconductor chip package |
US5858815A (en) * | 1996-06-21 | 1999-01-12 | Anam Semiconductor Inc. | Semiconductor package and method for fabricating the same |
JPH1154537A (en) * | 1997-07-31 | 1999-02-26 | Mitsui High Tec Inc | Semiconductor device and its manufacture |
EP0915505A1 (en) * | 1997-11-06 | 1999-05-12 | Sharp Kabushiki Kaisha | Semiconductor device package, manufacturing method thereof and circuit board therefor |
-
2000
- 2000-01-28 AU AU22941/00A patent/AU2294100A/en not_active Abandoned
- 2000-01-28 WO PCT/EP2000/000678 patent/WO2000048444A2/en active Application Filing
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0428260A (en) * | 1990-05-23 | 1992-01-30 | Matsushita Electric Ind Co Ltd | Method of mounting semiconductor chip |
US5703405A (en) * | 1993-03-15 | 1997-12-30 | Motorola, Inc. | Integrated circuit chip formed from processing two opposing surfaces of a wafer |
JPH07321244A (en) * | 1994-05-27 | 1995-12-08 | Matsushita Electric Ind Co Ltd | Electronic part, and manufacture of electronic part |
US5674785A (en) * | 1995-11-27 | 1997-10-07 | Micron Technology, Inc. | Method of producing a single piece package for semiconductor die |
JPH09260441A (en) * | 1996-03-26 | 1997-10-03 | Mitsubishi Electric Corp | Semiconductor device |
EP0810655A2 (en) * | 1996-05-29 | 1997-12-03 | Texas Instruments Incorporated | A package for a semiconductor device |
US5858815A (en) * | 1996-06-21 | 1999-01-12 | Anam Semiconductor Inc. | Semiconductor package and method for fabricating the same |
GB2320616A (en) * | 1996-12-18 | 1998-06-24 | Hyundai Electronics Ind | Semiconductor chip package |
JPH1154537A (en) * | 1997-07-31 | 1999-02-26 | Mitsui High Tec Inc | Semiconductor device and its manufacture |
EP0915505A1 (en) * | 1997-11-06 | 1999-05-12 | Sharp Kabushiki Kaisha | Semiconductor device package, manufacturing method thereof and circuit board therefor |
Non-Patent Citations (6)
Title |
---|
AMAGAI M: "Chip scale package (CSP) solder joint reliability and modeling", 2ND 1998 IEMT/IMC SYMPOSIUM (IEEE CAT. NO.98EX225), 2ND 1998 IEMT/IMC SYMPOSIUM, TOKYO, JAPAN, 15-17 APRIL 1998, 1998, TOKYO, JAPAN, ORGANIZING COMMITTEE 1998 IEMT/IMC SYMPOSIUM, JAPAN, PAGE(S) 216 - 223, ISBN: 0-7803-5090-1, XP002136547 * |
CHANCHANI R ET AL: "A NEW MINI BALL GRID ARRAY (MBGA) MULTICHIP MODULE TECHNOLOGY", INTERNATIONAL JOURNAL OF MICROCIRCUITS AND ELECTRONIC PACKAGING,US,INTERNATIONAL MICROELECTRONICS & PACKAGING SOCIETY, vol. 18, no. 3, 1 July 1995 (1995-07-01), pages 185 - 192, XP000538985, ISSN: 1063-1674 * |
PATENT ABSTRACTS OF JAPAN vol. 016, no. 196 (E - 1200) 12 May 1992 (1992-05-12) * |
PATENT ABSTRACTS OF JAPAN vol. 1996, no. 04 30 April 1996 (1996-04-30) * |
PATENT ABSTRACTS OF JAPAN vol. 1998, no. 02 30 January 1998 (1998-01-30) * |
PATENT ABSTRACTS OF JAPAN vol. 1999, no. 05 31 May 1999 (1999-05-31) * |
Also Published As
Publication number | Publication date |
---|---|
WO2000048444A2 (en) | 2000-08-24 |
AU2294100A (en) | 2000-09-04 |
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