WO2000036389A3 - Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking - Google Patents
Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking Download PDFInfo
- Publication number
- WO2000036389A3 WO2000036389A3 PCT/US1999/028515 US9928515W WO0036389A3 WO 2000036389 A3 WO2000036389 A3 WO 2000036389A3 US 9928515 W US9928515 W US 9928515W WO 0036389 A3 WO0036389 A3 WO 0036389A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- phase
- signal
- signals
- time delay
- during irradiation
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/205,755 | 1998-12-04 | ||
US09/205,755 US6157037A (en) | 1998-12-04 | 1998-12-04 | Sensing device and method for measuring emission time delay during irradiation of targeted samples |
Publications (3)
Publication Number | Publication Date |
---|---|
WO2000036389A2 WO2000036389A2 (en) | 2000-06-22 |
WO2000036389A3 true WO2000036389A3 (en) | 2000-10-19 |
WO2000036389A9 WO2000036389A9 (en) | 2001-04-19 |
Family
ID=22763518
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/028627 WO2000037850A1 (en) | 1998-12-04 | 1999-12-02 | Sensing device and method for measuring emission time delay during irradiation of targeted samples |
PCT/US1999/028515 WO2000036389A2 (en) | 1998-12-04 | 1999-12-02 | Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US1999/028627 WO2000037850A1 (en) | 1998-12-04 | 1999-12-02 | Sensing device and method for measuring emission time delay during irradiation of targeted samples |
Country Status (7)
Country | Link |
---|---|
US (2) | US6157037A (en) |
EP (1) | EP1144909A1 (en) |
JP (1) | JP4532744B2 (en) |
AU (1) | AU778322B2 (en) |
BR (1) | BR9916948A (en) |
CA (1) | CA2353421C (en) |
WO (2) | WO2000037850A1 (en) |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6766183B2 (en) | 1995-11-22 | 2004-07-20 | Medtronic Minimed, Inc. | Long wave fluorophore sensor compounds and other fluorescent sensor compounds in polymers |
US7764130B2 (en) | 1999-01-22 | 2010-07-27 | Multigig Inc. | Electronic circuitry |
DE19910415B4 (en) * | 1999-03-10 | 2010-12-09 | Robert Bosch Gmbh | Method and device for tuning a first oscillator with a second oscillator |
DE59911551D1 (en) * | 1999-03-18 | 2005-03-10 | Nanosurf Ag Liestal | Electronic frequency measuring device and its use |
AU2001256482A1 (en) | 2000-05-11 | 2001-11-26 | Multigig Limited | Electronic pulse generator and oscillator |
US6534774B2 (en) * | 2000-09-08 | 2003-03-18 | Mitsubishi Materials Silicon Corporation | Method and apparatus for evaluating the quality of a semiconductor substrate |
US7009210B2 (en) * | 2000-10-06 | 2006-03-07 | Alphion Corporation | Method and apparatus for bit-rate and format insensitive performance monitoring of lightwave signals |
US6673626B1 (en) | 2000-10-31 | 2004-01-06 | Science & Technology Corporation University Of New Mexico | Optoelectronic circuit for detecting changes in fluorescence lifetime |
WO2002066986A2 (en) * | 2001-02-15 | 2002-08-29 | Medtronic Minimed, Inc. | Polymers functionalized with fluorescent boronate motifs |
US7045361B2 (en) | 2001-09-12 | 2006-05-16 | Medtronic Minimed, Inc. | Analyte sensing via acridine-based boronate biosensors |
WO2003025546A2 (en) * | 2001-09-19 | 2003-03-27 | Joule Microsystems Canada Inc. | A spectrometer incorporating signal matched filtering |
US6819052B2 (en) * | 2002-05-31 | 2004-11-16 | Nagano Japan Radio Co., Ltd. | Coaxial type impedance matching device and impedance detecting method for plasma generation |
IL151745A (en) * | 2002-09-12 | 2007-10-31 | Uzi Sharon | Explosive detection and identification system |
US6912050B2 (en) * | 2003-02-03 | 2005-06-28 | Hach Company | Phase shift measurement for luminescent light |
US6914668B2 (en) * | 2003-05-14 | 2005-07-05 | International Technologies (Laser) Ltd. | Personal identification verification and controlled substance detection and identification system |
US7197293B2 (en) * | 2003-08-11 | 2007-03-27 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Absorbing sum signal energy in a mixer |
US7286214B2 (en) * | 2003-08-25 | 2007-10-23 | University Of South Florida | Method and program product for determining a radiance field in an optical environment |
US20090283699A1 (en) * | 2003-09-29 | 2009-11-19 | Baltz Nathan T | Frequency domain luminescence instrumentation |
GB0416732D0 (en) * | 2004-07-27 | 2004-09-01 | Precisense As | A method and apparatus for measuring the phase shift induced in a light signal by a sample |
AT501443B1 (en) | 2005-02-04 | 2007-03-15 | Atomic Austria Gmbh | SPORTS SHOE FOR RUNNING OR SHIELDING |
US7615938B2 (en) * | 2005-04-06 | 2009-11-10 | Apple Inc. | Method and system for variable LED output in an electronic device |
WO2007058978A1 (en) * | 2005-11-10 | 2007-05-24 | Tautheta Instruments Llc | Apparatus and method for system identification |
AT502194B1 (en) * | 2005-12-16 | 2007-02-15 | Joanneum Res Forschungsgmbh | Sample`s fluorescence determining method, involves separating optical path of excitation light and fluorescent light from optical path of reference light having same wavelength as excitation light |
WO2008121857A1 (en) | 2007-03-29 | 2008-10-09 | Multigig Inc. | Wave reversing system and method for a rotary traveling wave oscillator |
US8913978B2 (en) * | 2007-04-09 | 2014-12-16 | Analog Devices, Inc. | RTWO-based down converter |
US8742857B2 (en) | 2008-05-15 | 2014-06-03 | Analog Devices, Inc. | Inductance enhanced rotary traveling wave oscillator circuit and method |
KR101248874B1 (en) * | 2009-01-09 | 2013-04-01 | 미쯔이 죠센 가부시키가이샤 | Fluorescence detecting device and fluorescence detecting method |
EP2390655A1 (en) * | 2009-01-22 | 2011-11-30 | Mitsui Engineering & Shipbuilding Co., Ltd. | Fluorescence detecting device and fluorescence detecting method |
WO2010143367A1 (en) * | 2009-06-12 | 2010-12-16 | 三井造船株式会社 | Fluorescence detection device and fluorescence detection method |
FR2980577B1 (en) * | 2011-09-26 | 2013-09-20 | Biomerieux Sa | IN VITRO FLUORIMETRIC DETECTION AND / OR QUANTIFICATION SYSTEM |
US8487710B2 (en) | 2011-12-12 | 2013-07-16 | Analog Devices, Inc. | RTWO-based pulse width modulator |
US8581668B2 (en) | 2011-12-20 | 2013-11-12 | Analog Devices, Inc. | Oscillator regeneration device |
DE102012212978B3 (en) * | 2012-07-24 | 2013-08-22 | Siemens Aktiengesellschaft | Process measuring device for measuring physical or chemical quantities, such as pressure or flow used in process automation and process technology, has measuring unit for converting non-electrical quantity into electrical measurement signal |
CN106134105B (en) | 2014-03-20 | 2020-02-04 | 艾里尔大学研究与开发有限公司 | Method and system for controlling signal phase and application equipment thereof |
CN104655863B (en) * | 2015-02-10 | 2016-08-24 | 中国科学院苏州生物医学工程技术研究所 | A kind of sample delivery detecting system |
EP3360247B1 (en) | 2015-10-08 | 2020-12-09 | Ariel-University Research and Development Company Ltd. | Method and system for controlling phase of a signal |
US10312922B2 (en) | 2016-10-07 | 2019-06-04 | Analog Devices, Inc. | Apparatus and methods for rotary traveling wave oscillators |
US10277233B2 (en) | 2016-10-07 | 2019-04-30 | Analog Devices, Inc. | Apparatus and methods for frequency tuning of rotary traveling wave oscillators |
US11527992B2 (en) | 2019-09-19 | 2022-12-13 | Analog Devices International Unlimited Company | Rotary traveling wave oscillators with distributed stubs |
US11264949B2 (en) | 2020-06-10 | 2022-03-01 | Analog Devices International Unlimited Company | Apparatus and methods for rotary traveling wave oscillators |
US11539353B2 (en) | 2021-02-02 | 2022-12-27 | Analog Devices International Unlimited Company | RTWO-based frequency multiplier |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196709A (en) * | 1991-05-03 | 1993-03-23 | University Of Maryland Systems | Fluorometry method and apparatus using a semiconductor laser diode as a light source |
US5757013A (en) * | 1995-12-06 | 1998-05-26 | American Research Corporation Of Virginia | Fluorescence decay measurement by calculation of inner product |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4840485A (en) * | 1986-12-17 | 1989-06-20 | I.S.S. (U.S.A.) Inc. | Frequency domain cross-correlation fluorometry with phase-locked loop frequency synthesizers |
US4716363A (en) * | 1987-05-08 | 1987-12-29 | Hewlett-Packard Company | Exponential decay time constant measurement using frequency of offset phase-locked loop: system and method |
US4845368A (en) * | 1987-06-26 | 1989-07-04 | The United States Of America As Represented By The United States Department Of Energy | Method for the substantial reduction of quenching effects in luminescence spectrometry |
WO1990009637A1 (en) * | 1989-02-13 | 1990-08-23 | Research Corporation Technologies, Inc. | Method and means for parallel frequency acquisition in frequency domain fluorometry |
GB9000740D0 (en) * | 1990-01-12 | 1990-03-14 | Univ Salford | Measurement of luminescence |
EP0552241B1 (en) * | 1990-10-10 | 2000-06-28 | The University Of Maryland | Method and apparatus for performing phase fluorescence lifetime measurements in flow cytometry |
WO1992013265A1 (en) * | 1991-01-24 | 1992-08-06 | The University Of Maryland | Method and apparatus for multi-dimensional phase fluorescence lifetime imaging |
EP0694164A1 (en) * | 1991-05-03 | 1996-01-31 | Joseph R. Lakowicz | Method for optically measuring chemical analytes |
EP0515211A3 (en) * | 1991-05-23 | 1993-04-07 | Becton Dickinson And Company | Apparatus and method for phase resolved fluorescence lifetimes of independent and varying amplitude pulses |
US5212386A (en) * | 1991-12-13 | 1993-05-18 | I.S.S. (U.S.A.) Inc. | High speed cross-correlation frequency domain fluorometry-phosphorimetry |
US5398681A (en) * | 1992-12-10 | 1995-03-21 | Sunshine Medical Instruments, Inc. | Pocket-type instrument for non-invasive measurement of blood glucose concentration |
US5424843A (en) * | 1992-12-23 | 1995-06-13 | The Regents Of The University Of California | Apparatus and method for qualitative and quantitative measurements of optical properties of turbid media using frequency-domain photon migration |
US5418371A (en) * | 1993-02-01 | 1995-05-23 | Aslund; Nils R. D. | Apparatus for quantitative imaging of multiple fluorophores using dual detectors |
US5462879A (en) * | 1993-10-14 | 1995-10-31 | Minnesota Mining And Manufacturing Company | Method of sensing with emission quenching sensors |
US5515864A (en) * | 1994-04-21 | 1996-05-14 | Zuckerman; Ralph | Method and apparatus for the in vivo measurement of oxygen concentration levels by the indirect determination of fluoescence lifetime |
JP3364333B2 (en) * | 1994-09-19 | 2003-01-08 | 浜松ホトニクス株式会社 | Attenuation characteristic measuring device |
US5646734A (en) * | 1995-08-28 | 1997-07-08 | Hewlett-Packard Company | Method and apparatus for independently measuring the thickness and index of refraction of films using low coherence reflectometry |
US5633712A (en) * | 1995-08-28 | 1997-05-27 | Hewlett-Packard Company | Method and apparatus for determining the thickness and index of refraction of a film using low coherence reflectometry and a reference surfaces |
US5610716A (en) * | 1995-08-28 | 1997-03-11 | Hewlett-Packard Company | Method and apparatus for measuring film thickness utilizing the slope of the phase of the Fourier transform of an autocorrelator signal |
US5818582A (en) * | 1996-09-19 | 1998-10-06 | Ciencia, Inc. | Apparatus and method for phase fluorometry |
US5945850A (en) | 1997-11-03 | 1999-08-31 | Lucent Technologies Inc. | Edge signal restoration circuit and method |
-
1998
- 1998-12-04 US US09/205,755 patent/US6157037A/en not_active Expired - Lifetime
-
1999
- 1999-12-02 WO PCT/US1999/028627 patent/WO2000037850A1/en active IP Right Grant
- 1999-12-02 AU AU39960/00A patent/AU778322B2/en not_active Expired
- 1999-12-02 WO PCT/US1999/028515 patent/WO2000036389A2/en active Application Filing
- 1999-12-02 BR BR9916948-7A patent/BR9916948A/en not_active IP Right Cessation
- 1999-12-02 JP JP2000589872A patent/JP4532744B2/en not_active Expired - Lifetime
- 1999-12-02 CA CA2353421A patent/CA2353421C/en not_active Expired - Lifetime
- 1999-12-02 EP EP99972012A patent/EP1144909A1/en not_active Withdrawn
-
2000
- 2000-08-22 US US09/642,596 patent/US7084409B1/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196709A (en) * | 1991-05-03 | 1993-03-23 | University Of Maryland Systems | Fluorometry method and apparatus using a semiconductor laser diode as a light source |
US5757013A (en) * | 1995-12-06 | 1998-05-26 | American Research Corporation Of Virginia | Fluorescence decay measurement by calculation of inner product |
Non-Patent Citations (1)
Title |
---|
VADDE ET AL.: "A closed loop scheme for phase-sensitive fluorometry", REV. SCI. INSTRUM.,, vol. 66, no. 7, July 1995 (1995-07-01), pages 3750 - 3754, XP000524265 * |
Also Published As
Publication number | Publication date |
---|---|
US7084409B1 (en) | 2006-08-01 |
JP2002533658A (en) | 2002-10-08 |
EP1144909A1 (en) | 2001-10-17 |
AU3996000A (en) | 2000-07-12 |
WO2000036389A9 (en) | 2001-04-19 |
WO2000036389A2 (en) | 2000-06-22 |
CA2353421A1 (en) | 2000-06-29 |
CA2353421C (en) | 2011-09-13 |
WO2000037850A1 (en) | 2000-06-29 |
AU778322B2 (en) | 2004-11-25 |
US6157037A (en) | 2000-12-05 |
JP4532744B2 (en) | 2010-08-25 |
WO2000037850A9 (en) | 2000-11-30 |
BR9916948A (en) | 2001-11-06 |
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