WO2000036389A3 - Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking - Google Patents

Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking Download PDF

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Publication number
WO2000036389A3
WO2000036389A3 PCT/US1999/028515 US9928515W WO0036389A3 WO 2000036389 A3 WO2000036389 A3 WO 2000036389A3 US 9928515 W US9928515 W US 9928515W WO 0036389 A3 WO0036389 A3 WO 0036389A3
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WO
WIPO (PCT)
Prior art keywords
phase
signal
signals
time delay
during irradiation
Prior art date
Application number
PCT/US1999/028515
Other languages
French (fr)
Other versions
WO2000036389A9 (en
WO2000036389A2 (en
Inventor
J D Sheldon Danielson
Original Assignee
Photosense L L C
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photosense L L C filed Critical Photosense L L C
Publication of WO2000036389A2 publication Critical patent/WO2000036389A2/en
Publication of WO2000036389A3 publication Critical patent/WO2000036389A3/en
Publication of WO2000036389A9 publication Critical patent/WO2000036389A9/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6408—Fluorescence; Phosphorescence with measurement of decay time, time resolved fluorescence

Abstract

An apparatus (10) for measuring emission time delay during irradiation of a sample (32). A mechanism (14) generates first and second digital input signals (16, 26) of known frequencies with a known phase relationship, and a device (20, 28) then converts the first and second digital input signals (16, 26) to analog sinusoidal signals. A radiation source (22) is modulated at a specific frequency and irradiates the sample (32) and generate a sample emission (34). A device (36) detects the sample emission (34) and produces a first output signal (38) having a phase shift relative to the phase of the first input signal (16), and a mechanism (48, 50) converts the first and second analog output signals (38, 46) to digital signals. A mixer (52) receives the output signals (38, 46) and compares the signal phase to produce a signal (54) indicative of the change in phase. A feedback arrangement (56, 58) alters the phase of the second input signal (26) based on the mixer signal (54) to place the first and second output signals (38, 46) in quadrature.
PCT/US1999/028515 1998-12-04 1999-12-02 Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking WO2000036389A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/205,755 1998-12-04
US09/205,755 US6157037A (en) 1998-12-04 1998-12-04 Sensing device and method for measuring emission time delay during irradiation of targeted samples

Publications (3)

Publication Number Publication Date
WO2000036389A2 WO2000036389A2 (en) 2000-06-22
WO2000036389A3 true WO2000036389A3 (en) 2000-10-19
WO2000036389A9 WO2000036389A9 (en) 2001-04-19

Family

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Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/US1999/028627 WO2000037850A1 (en) 1998-12-04 1999-12-02 Sensing device and method for measuring emission time delay during irradiation of targeted samples
PCT/US1999/028515 WO2000036389A2 (en) 1998-12-04 1999-12-02 Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase tracking

Family Applications Before (1)

Application Number Title Priority Date Filing Date
PCT/US1999/028627 WO2000037850A1 (en) 1998-12-04 1999-12-02 Sensing device and method for measuring emission time delay during irradiation of targeted samples

Country Status (7)

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US (2) US6157037A (en)
EP (1) EP1144909A1 (en)
JP (1) JP4532744B2 (en)
AU (1) AU778322B2 (en)
BR (1) BR9916948A (en)
CA (1) CA2353421C (en)
WO (2) WO2000037850A1 (en)

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Also Published As

Publication number Publication date
US7084409B1 (en) 2006-08-01
JP2002533658A (en) 2002-10-08
EP1144909A1 (en) 2001-10-17
AU3996000A (en) 2000-07-12
WO2000036389A9 (en) 2001-04-19
WO2000036389A2 (en) 2000-06-22
CA2353421A1 (en) 2000-06-29
CA2353421C (en) 2011-09-13
WO2000037850A1 (en) 2000-06-29
AU778322B2 (en) 2004-11-25
US6157037A (en) 2000-12-05
JP4532744B2 (en) 2010-08-25
WO2000037850A9 (en) 2000-11-30
BR9916948A (en) 2001-11-06

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