WO1999044355A3 - Dead pixel correction by row/column substitution - Google Patents

Dead pixel correction by row/column substitution Download PDF

Info

Publication number
WO1999044355A3
WO1999044355A3 PCT/US1999/004036 US9904036W WO9944355A3 WO 1999044355 A3 WO1999044355 A3 WO 1999044355A3 US 9904036 W US9904036 W US 9904036W WO 9944355 A3 WO9944355 A3 WO 9944355A3
Authority
WO
WIPO (PCT)
Prior art keywords
row
pixel correction
dead pixel
column substitution
bad
Prior art date
Application number
PCT/US1999/004036
Other languages
French (fr)
Other versions
WO1999044355A2 (en
Inventor
Eric R Fossum
Nick Doudoumopoulos
Roger Panicacci
Original Assignee
Photobit Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Photobit Corp filed Critical Photobit Corp
Priority to AU27869/99A priority Critical patent/AU2786999A/en
Publication of WO1999044355A2 publication Critical patent/WO1999044355A2/en
Publication of WO1999044355A3 publication Critical patent/WO1999044355A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects

Abstract

Bad pixels (200, 202, 204) in an optical device are investigated and corrected. An upper limit of bad areas is defined. Each bad area can be one, or more than one pixel.
PCT/US1999/004036 1998-02-26 1999-02-24 Dead pixel correction by row/column substitution WO1999044355A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU27869/99A AU2786999A (en) 1998-02-26 1999-02-24 Dead pixel correction by row/column substitution

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/031,145 US6611288B1 (en) 1998-02-26 1998-02-26 Dead pixel correction by row/column substitution
US09/031,145 1998-02-26

Publications (2)

Publication Number Publication Date
WO1999044355A2 WO1999044355A2 (en) 1999-09-02
WO1999044355A3 true WO1999044355A3 (en) 2000-04-13

Family

ID=21857875

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1999/004036 WO1999044355A2 (en) 1998-02-26 1999-02-24 Dead pixel correction by row/column substitution

Country Status (3)

Country Link
US (1) US6611288B1 (en)
AU (1) AU2786999A (en)
WO (1) WO1999044355A2 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6665009B1 (en) * 1998-05-20 2003-12-16 Omnivision Technologies, Inc. On-chip dead pixel correction in a CMOS imaging sensor
JP4199874B2 (en) * 1999-03-30 2008-12-24 富士フイルム株式会社 Image processing apparatus and processing method
JP3825935B2 (en) * 1999-04-08 2006-09-27 キヤノン株式会社 Image processing apparatus, image processing method, recording medium, and image processing system
US6819358B1 (en) * 1999-04-26 2004-11-16 Microsoft Corporation Error calibration for digital image sensors and apparatus using the same
US7126631B1 (en) * 1999-06-30 2006-10-24 Intel Corporation Sensing with defective cell detection
US6900836B2 (en) * 2001-02-19 2005-05-31 Eastman Kodak Company Correcting defects in a digital image caused by a pre-existing defect in a pixel of an image sensor
US7034873B2 (en) * 2001-06-29 2006-04-25 Vanguard International Semiconductor Corporation Pixel defect correction in a CMOS active pixel image sensor
US6987577B2 (en) * 2001-09-14 2006-01-17 Eastman Kodak Company Providing a partial column defect map for a full frame image sensor
US20040239782A1 (en) * 2003-05-30 2004-12-02 William Equitz System and method for efficient improvement of image quality in cameras
US7812867B2 (en) * 2004-10-29 2010-10-12 Canon Kabushiki Kaisha Image processing apparatus adapted to correct image signal
US7852391B2 (en) * 2004-12-14 2010-12-14 Bae Systems Information And Electronic Systems Integration Inc. Substitution of defective readout circuits in imagers
JP2006345279A (en) * 2005-06-09 2006-12-21 Fujifilm Holdings Corp Method of detecting pixel defect for solid state imaging device
US7710472B2 (en) * 2006-05-01 2010-05-04 Warner Bros. Entertainment Inc. Detection and/or correction of suppressed signal defects in moving images
US20070291145A1 (en) * 2006-06-15 2007-12-20 Doherty C Patrick Methods, devices, and systems for selectable repair of imaging devices
US7649555B2 (en) * 2006-10-02 2010-01-19 Mtekvision Co., Ltd. Apparatus for processing dead pixel
WO2008089216A1 (en) * 2007-01-16 2008-07-24 Bae Systems Information And Electronic Systems Integration Inc. Real-time pixel substitution for thermal imaging systems

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4567525A (en) * 1983-10-18 1986-01-28 Kabushiki Kaisha Toshiba CCD Picture element defect compensating apparatus
US4805023A (en) * 1985-10-15 1989-02-14 Texas Instruments Incorporated Programmable CCD imager defect compensator
US5354977A (en) * 1992-02-27 1994-10-11 Alex Roustaei Optical scanning head

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01224881A (en) * 1988-03-04 1989-09-07 Toshiba Mach Co Ltd Pattern inspecting device
US5544256A (en) * 1993-10-22 1996-08-06 International Business Machines Corporation Automated defect classification system
JPH10508133A (en) * 1995-08-25 1998-08-04 ピーエスシー・インコーポレイテッド Optical reader with integrated CMOS circuit
US5982946A (en) * 1996-09-20 1999-11-09 Dainippon Screen Mfg. Co., Ltd. Method of identifying defective pixels in digital images, and method of correcting the defective pixels, and apparatus and recording media therefor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4567525A (en) * 1983-10-18 1986-01-28 Kabushiki Kaisha Toshiba CCD Picture element defect compensating apparatus
US4805023A (en) * 1985-10-15 1989-02-14 Texas Instruments Incorporated Programmable CCD imager defect compensator
US5354977A (en) * 1992-02-27 1994-10-11 Alex Roustaei Optical scanning head

Also Published As

Publication number Publication date
AU2786999A (en) 1999-09-15
WO1999044355A2 (en) 1999-09-02
US6611288B1 (en) 2003-08-26

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