WO1999035547A3 - Power contact for testing a power source - Google Patents

Power contact for testing a power source Download PDF

Info

Publication number
WO1999035547A3
WO1999035547A3 PCT/US1999/000204 US9900204W WO9935547A3 WO 1999035547 A3 WO1999035547 A3 WO 1999035547A3 US 9900204 W US9900204 W US 9900204W WO 9935547 A3 WO9935547 A3 WO 9935547A3
Authority
WO
WIPO (PCT)
Prior art keywords
circuit board
printed circuit
power
power source
testing
Prior art date
Application number
PCT/US1999/000204
Other languages
French (fr)
Other versions
WO1999035547A2 (en
Inventor
David J Ayers
Michael Brownell
Original Assignee
Intel Corp
David J Ayers
Michael Brownell
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp, David J Ayers, Michael Brownell filed Critical Intel Corp
Priority to AU23116/99A priority Critical patent/AU2311699A/en
Priority to JP2000527868A priority patent/JP2002501280A/en
Priority to EP99902992A priority patent/EP1046093A4/en
Publication of WO1999035547A2 publication Critical patent/WO1999035547A2/en
Publication of WO1999035547A3 publication Critical patent/WO1999035547A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits

Abstract

An improved test system comprises a printed circuit board (13) and a tested assembly wherein the printed circuit board (13) has a plastic chassis encompassing one surface and a set of power pads (33, 35) may be coupled to conductors on the one surface of the printed circuit board (13) and a second surface of the set of power pads (33, 35) is available for electrical coupling through an opening in the plastic chassis. The test assembly vertically pushes down on the printed circuit board until the second surface of the set of power pads contacts a power source, thus electrically coupling the printed circuit board to the power source (15).
PCT/US1999/000204 1998-01-12 1999-01-05 Power contact for testing a power source WO1999035547A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
AU23116/99A AU2311699A (en) 1998-01-12 1999-01-05 An improved power contact for testing a power delivery system
JP2000527868A JP2002501280A (en) 1998-01-12 1999-01-05 Improved power contacts for testing power delivery systems
EP99902992A EP1046093A4 (en) 1998-01-12 1999-01-05 An improved power contact for testing a power delivery system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US560998A 1998-01-12 1998-01-12
US09/005,609 1998-01-12

Publications (2)

Publication Number Publication Date
WO1999035547A2 WO1999035547A2 (en) 1999-07-15
WO1999035547A3 true WO1999035547A3 (en) 1999-09-30

Family

ID=21716741

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1999/000204 WO1999035547A2 (en) 1998-01-12 1999-01-05 Power contact for testing a power source

Country Status (5)

Country Link
EP (1) EP1046093A4 (en)
JP (1) JP2002501280A (en)
CN (1) CN1296568A (en)
AU (1) AU2311699A (en)
WO (1) WO1999035547A2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4099120A (en) * 1976-04-19 1978-07-04 Akin Aksu Probe head for testing printed circuit boards
US4160207A (en) * 1977-06-27 1979-07-03 Haines Fred E Printed circuit board tester with removable head
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2344239B2 (en) * 1973-09-01 1977-11-03 Luther, Erich, 3050 Wunstorf; Maelzer, Fritz; Maelzer, Martin; 7910 Reutti Post Neu-Ulm; Türkkan, Tamer, 3011 Laatzen CONTACT DEVICE FOR CONNECTING A PRINTED CIRCUIT TO A TESTING DEVICE
US4164704A (en) * 1976-11-01 1979-08-14 Metropolitan Circuits, Inc. Plural probe circuit card fixture using a vacuum collapsed membrane to hold the card against the probes
US4636723A (en) * 1986-03-21 1987-01-13 Coffin Harry S Testing device for printed circuit boards
EP0305951B1 (en) * 1987-08-31 1994-02-02 Everett/Charles Contact Products Inc. Testing of integrated circuit devices on loaded printed circuit boards
US5153504A (en) * 1991-04-23 1992-10-06 International Business Machines Corporation Pneumatically actuated hold down gate
US5686833A (en) * 1995-07-31 1997-11-11 Spinner; Howard D. Load board enhanced for differential pressure retention in an IC test head
FR2741953A1 (en) * 1995-12-05 1997-06-06 Vaucher Christophe Contacting method for testing printed circuit tracks

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4099120A (en) * 1976-04-19 1978-07-04 Akin Aksu Probe head for testing printed circuit boards
US4160207A (en) * 1977-06-27 1979-07-03 Haines Fred E Printed circuit board tester with removable head
US4352061A (en) * 1979-05-24 1982-09-28 Fairchild Camera & Instrument Corp. Universal test fixture employing interchangeable wired personalizers

Also Published As

Publication number Publication date
JP2002501280A (en) 2002-01-15
AU2311699A (en) 1999-07-26
EP1046093A2 (en) 2000-10-25
EP1046093A4 (en) 2001-01-31
CN1296568A (en) 2001-05-23
WO1999035547A2 (en) 1999-07-15

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