WO1999010566A3 - Process chamber and method for depositing and/or removing material on a substrate - Google Patents

Process chamber and method for depositing and/or removing material on a substrate Download PDF

Info

Publication number
WO1999010566A3
WO1999010566A3 PCT/US1998/016174 US9816174W WO9910566A3 WO 1999010566 A3 WO1999010566 A3 WO 1999010566A3 US 9816174 W US9816174 W US 9816174W WO 9910566 A3 WO9910566 A3 WO 9910566A3
Authority
WO
WIPO (PCT)
Prior art keywords
sleeve
wafer
electrolyte
support
depositing
Prior art date
Application number
PCT/US1998/016174
Other languages
French (fr)
Other versions
WO1999010566A2 (en
Inventor
Ting H Chiu
William H Holtkamp
Wen C Ko
Kenneth J Lowery
Peter Cho
Original Assignee
Cutek Research Inc
Ting H Chiu
William H Holtkamp
Wen C Ko
Kenneth J Lowery
Peter Cho
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cutek Research Inc, Ting H Chiu, William H Holtkamp, Wen C Ko, Kenneth J Lowery, Peter Cho filed Critical Cutek Research Inc
Priority to JP2000507868A priority Critical patent/JP3274457B2/en
Priority to DE69823556T priority patent/DE69823556T2/en
Priority to EP98938314A priority patent/EP1051544B1/en
Priority to AU86864/98A priority patent/AU8686498A/en
Publication of WO1999010566A2 publication Critical patent/WO1999010566A2/en
Publication of WO1999010566A3 publication Critical patent/WO1999010566A3/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F7/00Constructional parts, or assemblies thereof, of cells for electrolytic removal of material from objects; Servicing or operating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/001Apparatus specially adapted for electrolytic coating of wafers, e.g. semiconductors or solar cells
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/02Tanks; Installations therefor
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/10Electrodes, e.g. composition, counter electrode
    • C25D17/12Shape or form
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00Processes for servicing or operating cells for electrolytic coating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D7/00Electroplating characterised by the article coated
    • C25D7/12Semiconductors
    • C25D7/123Semiconductors first coated with a seed layer or a conductive layer

Abstract

A processing chamber for depositing and/or removing material onto/from a semiconductor wafer when the wafer is subjected to an electrolyte and in an electric field. A hollow sleeve is utilized to form a containment chamber for holding the electrolyte. A wafer residing on a support is moved vertically upward to engage the sleeve to form an enclosing floor for the containment chamber. One electrode is disposed within the containment chamber while the opposite electrode is comprised of several electrodes distributed around the circumference of the wafer. The electrodes are also protected from the electrolyte when the support is raised and engaged to the sleeve. In one embodiment, the support and the sleeve are stationary during processing, while in another embodiment, both are rotated or oscillated during processing.
PCT/US1998/016174 1997-08-22 1998-08-03 Process chamber and method for depositing and/or removing material on a substrate WO1999010566A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2000507868A JP3274457B2 (en) 1997-08-22 1998-08-03 Processing chamber and method for depositing and / or removing material from a substrate
DE69823556T DE69823556T2 (en) 1997-08-22 1998-08-03 PROCESS CHAMBER AND METHOD FOR CUTTING MATERIAL ON A SUBSTRATE AND / OR REMOVING MATERIAL FROM A SUBSTRATE
EP98938314A EP1051544B1 (en) 1997-08-22 1998-08-03 Process chamber and method for depositing and/or removing material on a substrate
AU86864/98A AU8686498A (en) 1997-08-22 1998-08-03 Process chamber and method for depositing and/or removing material on a substrate

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/916,564 US6017437A (en) 1997-08-22 1997-08-22 Process chamber and method for depositing and/or removing material on a substrate
US08/916,564 1997-08-22

Publications (2)

Publication Number Publication Date
WO1999010566A2 WO1999010566A2 (en) 1999-03-04
WO1999010566A3 true WO1999010566A3 (en) 1999-05-06

Family

ID=25437473

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1998/016174 WO1999010566A2 (en) 1997-08-22 1998-08-03 Process chamber and method for depositing and/or removing material on a substrate

Country Status (8)

Country Link
US (3) US6017437A (en)
EP (1) EP1051544B1 (en)
JP (1) JP3274457B2 (en)
KR (1) KR100375869B1 (en)
AU (1) AU8686498A (en)
DE (1) DE69823556T2 (en)
TW (1) TW457572B (en)
WO (1) WO1999010566A2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9435049B2 (en) 2013-11-20 2016-09-06 Lam Research Corporation Alkaline pretreatment for electroplating

Families Citing this family (179)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6017437A (en) * 1997-08-22 2000-01-25 Cutek Research, Inc. Process chamber and method for depositing and/or removing material on a substrate
TW405158B (en) * 1997-09-17 2000-09-11 Ebara Corp Plating apparatus for semiconductor wafer processing
US6416647B1 (en) * 1998-04-21 2002-07-09 Applied Materials, Inc. Electro-chemical deposition cell for face-up processing of single semiconductor substrates
US6099702A (en) * 1998-06-10 2000-08-08 Novellus Systems, Inc. Electroplating chamber with rotatable wafer holder and pre-wetting and rinsing capability
US6716334B1 (en) 1998-06-10 2004-04-06 Novellus Systems, Inc Electroplating process chamber and method with pre-wetting and rinsing capability
US7136173B2 (en) * 1998-07-09 2006-11-14 Acm Research, Inc. Method and apparatus for end-point detection
US6395152B1 (en) * 1998-07-09 2002-05-28 Acm Research, Inc. Methods and apparatus for electropolishing metal interconnections on semiconductor devices
US6447668B1 (en) 1998-07-09 2002-09-10 Acm Research, Inc. Methods and apparatus for end-point detection
US6497801B1 (en) * 1998-07-10 2002-12-24 Semitool Inc Electroplating apparatus with segmented anode array
US6183611B1 (en) * 1998-07-17 2001-02-06 Cutek Research, Inc. Method and apparatus for the disposal of processing fluid used to deposit and/or remove material on a substrate
US6187152B1 (en) * 1998-07-17 2001-02-13 Cutek Research, Inc. Multiple station processing chamber and method for depositing and/or removing material on a substrate
US7033463B1 (en) * 1998-08-11 2006-04-25 Ebara Corporation Substrate plating method and apparatus
TW522455B (en) * 1998-11-09 2003-03-01 Ebara Corp Plating method and apparatus therefor
US6290865B1 (en) * 1998-11-30 2001-09-18 Applied Materials, Inc. Spin-rinse-drying process for electroplated semiconductor wafers
TW483950B (en) * 1998-12-31 2002-04-21 Semitool Inc Method, chemistry, and apparatus for high deposition rate solder electroplating on a microelectronic workpiece
US7429537B2 (en) * 1999-01-22 2008-09-30 Semitool, Inc. Methods and apparatus for rinsing and drying
US6557237B1 (en) * 1999-04-08 2003-05-06 Applied Materials, Inc. Removable modular cell for electro-chemical plating and method
US7264698B2 (en) * 1999-04-13 2007-09-04 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
US6916412B2 (en) * 1999-04-13 2005-07-12 Semitool, Inc. Adaptable electrochemical processing chamber
US7020537B2 (en) * 1999-04-13 2006-03-28 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US20030038035A1 (en) * 2001-05-30 2003-02-27 Wilson Gregory J. Methods and systems for controlling current in electrochemical processing of microelectronic workpieces
US7438788B2 (en) * 1999-04-13 2008-10-21 Semitool, Inc. Apparatus and methods for electrochemical processing of microelectronic workpieces
US7189318B2 (en) * 1999-04-13 2007-03-13 Semitool, Inc. Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
US7160421B2 (en) * 1999-04-13 2007-01-09 Semitool, Inc. Turning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
CN1217034C (en) * 1999-04-13 2005-08-31 塞米用具公司 Workpiece processor having processing chamber with improved processing fluid flow
US6197182B1 (en) * 1999-07-07 2001-03-06 Technic Inc. Apparatus and method for plating wafers, substrates and other articles
US6516815B1 (en) 1999-07-09 2003-02-11 Applied Materials, Inc. Edge bead removal/spin rinse dry (EBR/SRD) module
US6344129B1 (en) 1999-10-13 2002-02-05 International Business Machines Corporation Method for plating copper conductors and devices formed
JP2001188254A (en) * 1999-10-21 2001-07-10 Matsushita Electric Ind Co Ltd Selective electrochemical processor within substrate, selective chemical processor within substrate, and examination and correction method of active substrate
WO2001041191A2 (en) * 1999-10-27 2001-06-07 Semitool, Inc. Method and apparatus for forming an oxidized structure on a microelectronic workpiece
US20020000380A1 (en) * 1999-10-28 2002-01-03 Lyndon W. Graham Method, chemistry, and apparatus for noble metal electroplating on a microelectronic workpiece
GB2355459B (en) * 1999-11-29 2001-09-26 Isis Innovation A dominant conditional lethal genetic system
CN1319130C (en) * 1999-12-24 2007-05-30 株式会社荏原制作所<Del/> Apparatus for plating semiconductor substrate, method for plating semiconductor substrate
US6632335B2 (en) * 1999-12-24 2003-10-14 Ebara Corporation Plating apparatus
WO2001076326A1 (en) * 2000-03-30 2001-10-11 Tokyo Electron Limited Optical monitoring and control system and method for plasma reactors
US20050183959A1 (en) * 2000-04-13 2005-08-25 Wilson Gregory J. Tuning electrodes used in a reactor for electrochemically processing a microelectric workpiece
EP1204139A4 (en) * 2000-04-27 2010-04-28 Ebara Corp Rotation holding device and semiconductor substrate processing device
US6478936B1 (en) * 2000-05-11 2002-11-12 Nutool Inc. Anode assembly for plating and planarizing a conductive layer
US7195696B2 (en) * 2000-05-11 2007-03-27 Novellus Systems, Inc. Electrode assembly for electrochemical processing of workpiece
TWI228548B (en) * 2000-05-26 2005-03-01 Ebara Corp Apparatus for processing substrate and apparatus for processing treatment surface of substrate
US6398926B1 (en) * 2000-05-31 2002-06-04 Techpoint Pacific Singapore Pte Ltd. Electroplating apparatus and method of using the same
US6428673B1 (en) * 2000-07-08 2002-08-06 Semitool, Inc. Apparatus and method for electrochemical processing of a microelectronic workpiece, capable of modifying processing based on metrology
US6747734B1 (en) * 2000-07-08 2004-06-08 Semitool, Inc. Apparatus and method for processing a microelectronic workpiece using metrology
WO2002004887A1 (en) * 2000-07-08 2002-01-17 Semitool, Inc. Methods and apparatus for processing microelectronic workpieces using metrology
US20020112964A1 (en) * 2000-07-12 2002-08-22 Applied Materials, Inc. Process window for gap-fill on very high aspect ratio structures using additives in low acid copper baths
JP3284496B2 (en) * 2000-08-09 2002-05-20 株式会社荏原製作所 Plating apparatus and plating solution removal method
US7153195B2 (en) * 2000-08-30 2006-12-26 Micron Technology, Inc. Methods and apparatus for selectively removing conductive material from a microelectronic substrate
US7220166B2 (en) * 2000-08-30 2007-05-22 Micron Technology, Inc. Methods and apparatus for electromechanically and/or electrochemically-mechanically removing conductive material from a microelectronic substrate
US7192335B2 (en) * 2002-08-29 2007-03-20 Micron Technology, Inc. Method and apparatus for chemically, mechanically, and/or electrolytically removing material from microelectronic substrates
US7112121B2 (en) * 2000-08-30 2006-09-26 Micron Technology, Inc. Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
US7129160B2 (en) 2002-08-29 2006-10-31 Micron Technology, Inc. Method for simultaneously removing multiple conductive materials from microelectronic substrates
US7134934B2 (en) * 2000-08-30 2006-11-14 Micron Technology, Inc. Methods and apparatus for electrically detecting characteristics of a microelectronic substrate and/or polishing medium
US7078308B2 (en) 2002-08-29 2006-07-18 Micron Technology, Inc. Method and apparatus for removing adjacent conductive and nonconductive materials of a microelectronic substrate
US6464855B1 (en) 2000-10-04 2002-10-15 Speedfam-Ipec Corporation Method and apparatus for electrochemical planarization of a workpiece
JP4644926B2 (en) * 2000-10-13 2011-03-09 ソニー株式会社 Semiconductor manufacturing apparatus and semiconductor device manufacturing method
DE10052762A1 (en) * 2000-10-25 2002-05-16 Infineon Technologies Ag Method and device for cleaning a semiconductor wafer
US6363624B1 (en) 2000-11-21 2002-04-02 Applied Materials, Inc. Apparatus for cleaning a semiconductor process chamber
US7188142B2 (en) 2000-11-30 2007-03-06 Applied Materials, Inc. Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
US6896776B2 (en) * 2000-12-18 2005-05-24 Applied Materials Inc. Method and apparatus for electro-chemical processing
US6579439B1 (en) 2001-01-12 2003-06-17 Southern Industrial Chemicals, Inc. Electrolytic aluminum polishing processes
US6402592B1 (en) 2001-01-17 2002-06-11 Steag Cutek Systems, Inc. Electrochemical methods for polishing copper films on semiconductor substrates
JP2002212786A (en) * 2001-01-17 2002-07-31 Ebara Corp Substrate processor
US6736952B2 (en) * 2001-02-12 2004-05-18 Speedfam-Ipec Corporation Method and apparatus for electrochemical planarization of a workpiece
US20050061676A1 (en) * 2001-03-12 2005-03-24 Wilson Gregory J. System for electrochemically processing a workpiece
US7582564B2 (en) * 2001-03-14 2009-09-01 Applied Materials, Inc. Process and composition for conductive material removal by electrochemical mechanical polishing
US7160432B2 (en) * 2001-03-14 2007-01-09 Applied Materials, Inc. Method and composition for polishing a substrate
US7128825B2 (en) * 2001-03-14 2006-10-31 Applied Materials, Inc. Method and composition for polishing a substrate
US7323416B2 (en) * 2001-03-14 2008-01-29 Applied Materials, Inc. Method and composition for polishing a substrate
US6811680B2 (en) 2001-03-14 2004-11-02 Applied Materials Inc. Planarization of substrates using electrochemical mechanical polishing
US7232514B2 (en) * 2001-03-14 2007-06-19 Applied Materials, Inc. Method and composition for polishing a substrate
US6899804B2 (en) 2001-12-21 2005-05-31 Applied Materials, Inc. Electrolyte composition and treatment for electrolytic chemical mechanical polishing
US20060169597A1 (en) * 2001-03-14 2006-08-03 Applied Materials, Inc. Method and composition for polishing a substrate
US7189647B2 (en) * 2001-04-05 2007-03-13 Novellus Systems, Inc. Sequential station tool for wet processing of semiconductor wafers
US6572755B2 (en) 2001-04-11 2003-06-03 Speedfam-Ipec Corporation Method and apparatus for electrochemically depositing a material onto a workpiece surface
US6852618B2 (en) * 2001-04-19 2005-02-08 Micron Technology, Inc. Combined barrier layer and seed layer
EP1256639A1 (en) * 2001-05-08 2002-11-13 Universite Catholique De Louvain Multiple bath electrodeposition
JP2002332597A (en) * 2001-05-11 2002-11-22 Tokyo Electron Ltd Solution treatment apparatus and solution treatment method
US6722942B1 (en) 2001-05-21 2004-04-20 Advanced Micro Devices, Inc. Chemical mechanical polishing with electrochemical control
CN1516895A (en) * 2001-06-14 2004-07-28 马特森技术公司 Barrier enhancement process for copper interconnects
US20020192966A1 (en) * 2001-06-19 2002-12-19 Shanmugasundram Arulkumar P. In situ sensor based control of semiconductor processing procedure
US7047099B2 (en) * 2001-06-19 2006-05-16 Applied Materials Inc. Integrating tool, module, and fab level control
US7101799B2 (en) * 2001-06-19 2006-09-05 Applied Materials, Inc. Feedforward and feedback control for conditioning of chemical mechanical polishing pad
US7082345B2 (en) * 2001-06-19 2006-07-25 Applied Materials, Inc. Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities
US7160739B2 (en) 2001-06-19 2007-01-09 Applied Materials, Inc. Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US6910947B2 (en) * 2001-06-19 2005-06-28 Applied Materials, Inc. Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life
US7698012B2 (en) 2001-06-19 2010-04-13 Applied Materials, Inc. Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US6558750B2 (en) 2001-07-16 2003-05-06 Technic Inc. Method of processing and plating planar articles
US6524463B2 (en) 2001-07-16 2003-02-25 Technic, Inc. Method of processing wafers and other planar articles within a processing cell
US6723224B2 (en) 2001-08-01 2004-04-20 Applied Materials Inc. Electro-chemical polishing apparatus
US6984198B2 (en) * 2001-08-14 2006-01-10 Applied Materials, Inc. Experiment management system, method and medium
US6638840B1 (en) 2001-08-20 2003-10-28 Megic Corporation Electrode for electroplating planar structures
US20040253810A1 (en) * 2001-08-23 2004-12-16 Hui Wang Dummy structures to reduce metal recess in electropolishing process
EP1481114A4 (en) * 2001-08-31 2005-06-22 Semitool Inc Apparatus and methods for electrochemical processing of microelectronic workpieces
US20070295611A1 (en) * 2001-12-21 2007-12-27 Liu Feng Q Method and composition for polishing a substrate
US6824612B2 (en) 2001-12-26 2004-11-30 Applied Materials, Inc. Electroless plating system
US6770565B2 (en) 2002-01-08 2004-08-03 Applied Materials Inc. System for planarizing metal conductive layers
US6742279B2 (en) 2002-01-16 2004-06-01 Applied Materials Inc. Apparatus and method for rinsing substrates
US6843852B2 (en) * 2002-01-16 2005-01-18 Intel Corporation Apparatus and method for electroless spray deposition
US7138014B2 (en) * 2002-01-28 2006-11-21 Applied Materials, Inc. Electroless deposition apparatus
US6913651B2 (en) * 2002-03-22 2005-07-05 Blue29, Llc Apparatus and method for electroless deposition of materials on semiconductor substrates
US6689258B1 (en) * 2002-04-30 2004-02-10 Advanced Micro Devices, Inc. Electrochemically generated reactants for chemical mechanical planarization
US20030209326A1 (en) * 2002-05-07 2003-11-13 Mattson Technology, Inc. Process and system for heating semiconductor substrates in a processing chamber containing a susceptor
US6790336B2 (en) * 2002-06-19 2004-09-14 Intel Corporation Method of fabricating damascene structures in mechanically weak interlayer dielectrics
US20040063224A1 (en) * 2002-09-18 2004-04-01 Applied Materials, Inc. Feedback control of a chemical mechanical polishing process for multi-layered films
US20050040049A1 (en) * 2002-09-20 2005-02-24 Rimma Volodarsky Anode assembly for plating and planarizing a conductive layer
DE10247051A1 (en) * 2002-10-09 2004-04-22 Polymer Latex Gmbh & Co Kg Latex and process for its manufacture
US7025862B2 (en) * 2002-10-22 2006-04-11 Applied Materials Plating uniformity control by contact ring shaping
US6796887B2 (en) 2002-11-13 2004-09-28 Speedfam-Ipec Corporation Wear ring assembly
US7087117B2 (en) * 2002-11-15 2006-08-08 Ebara Corporation Substrate processing apparatus and substrate processing method
WO2004046835A2 (en) 2002-11-15 2004-06-03 Applied Materials, Inc. Method, system and medium for controlling manufacture process having multivariate input parameters
US20040104119A1 (en) * 2002-12-02 2004-06-03 Applied Materials, Inc. Small volume electroplating cell
US20040108212A1 (en) * 2002-12-06 2004-06-10 Lyndon Graham Apparatus and methods for transferring heat during chemical processing of microelectronic workpieces
US7596886B1 (en) * 2002-12-18 2009-10-06 Lam Research Corporation Method and system to separate and recycle divergent chemistries
US6892472B2 (en) * 2003-03-18 2005-05-17 Novellus Systems, Inc. Method and apparatus for cleaning and drying a workpiece
US7390429B2 (en) * 2003-06-06 2008-06-24 Applied Materials, Inc. Method and composition for electrochemical mechanical polishing processing
US6860944B2 (en) * 2003-06-16 2005-03-01 Blue29 Llc Microelectronic fabrication system components and method for processing a wafer using such components
US7883739B2 (en) 2003-06-16 2011-02-08 Lam Research Corporation Method for strengthening adhesion between dielectric layers formed adjacent to metal layers
WO2005005693A1 (en) 2003-07-01 2005-01-20 Superpower, Inc. Process control methods of electropolishing for metal substrate preparation in producing ybco coated conductors
US7100954B2 (en) * 2003-07-11 2006-09-05 Nexx Systems, Inc. Ultra-thin wafer handling system
US7112122B2 (en) * 2003-09-17 2006-09-26 Micron Technology, Inc. Methods and apparatus for removing conductive material from a microelectronic substrate
US20050092620A1 (en) * 2003-10-01 2005-05-05 Applied Materials, Inc. Methods and apparatus for polishing a substrate
US7722747B2 (en) * 2003-10-22 2010-05-25 Nexx Systems, Inc. Method and apparatus for fluid processing a workpiece
US7727366B2 (en) * 2003-10-22 2010-06-01 Nexx Systems, Inc. Balancing pressure to improve a fluid seal
WO2005055283A2 (en) * 2003-11-26 2005-06-16 Acm Research, Inc. Monitoring an electropolishing process in integrated circuit fabrication
US7128821B2 (en) * 2004-01-20 2006-10-31 Taiwan Semiconductor Manufacturing Co., Ltd. Electropolishing method for removing particles from wafer surface
US7390744B2 (en) 2004-01-29 2008-06-24 Applied Materials, Inc. Method and composition for polishing a substrate
US20060021974A1 (en) * 2004-01-29 2006-02-02 Applied Materials, Inc. Method and composition for polishing a substrate
US7153777B2 (en) * 2004-02-20 2006-12-26 Micron Technology, Inc. Methods and apparatuses for electrochemical-mechanical polishing
US7226860B2 (en) * 2004-04-28 2007-06-05 Taiwan Semiconductor Manfacturing Co. Ltd. Method and apparatus for fabricating metal layer
US20050283993A1 (en) * 2004-06-18 2005-12-29 Qunwei Wu Method and apparatus for fluid processing and drying a workpiece
WO2006020565A2 (en) * 2004-08-09 2006-02-23 Blue29, Llc Barrier layer configurations and methods for processing microelectronic topographies having barrier layers
DE102004039443B4 (en) * 2004-08-13 2023-05-25 Beijing E-Town Semiconductor Technology, Co., Ltd. Process for the thermal treatment of disc-shaped substrates
US7566391B2 (en) 2004-09-01 2009-07-28 Micron Technology, Inc. Methods and systems for removing materials from microfeature workpieces with organic and/or non-aqueous electrolytic media
JP4556576B2 (en) * 2004-09-13 2010-10-06 トヨタ自動車株式会社 Separator manufacturing method and electrodeposition coating apparatus
US20060091551A1 (en) * 2004-10-29 2006-05-04 Taiwan Semiconductor Manufacturing Co., Ltd. Differentially metal doped copper damascenes
US7651306B2 (en) 2004-12-22 2010-01-26 Applied Materials, Inc. Cartesian robot cluster tool architecture
US7819079B2 (en) * 2004-12-22 2010-10-26 Applied Materials, Inc. Cartesian cluster tool configuration for lithography type processes
US20060182535A1 (en) * 2004-12-22 2006-08-17 Mike Rice Cartesian robot design
US7699021B2 (en) * 2004-12-22 2010-04-20 Sokudo Co., Ltd. Cluster tool substrate throughput optimization
US7798764B2 (en) * 2005-12-22 2010-09-21 Applied Materials, Inc. Substrate processing sequence in a cartesian robot cluster tool
US20060130767A1 (en) * 2004-12-22 2006-06-22 Applied Materials, Inc. Purged vacuum chuck with proximity pins
JP2006299367A (en) * 2005-04-22 2006-11-02 Yamamoto Mekki Shikenki:Kk Electroplating tester
US20060241813A1 (en) * 2005-04-22 2006-10-26 Applied Materials, Inc. Optimized cluster tool transfer process and collision avoidance design
US20060249394A1 (en) * 2005-05-05 2006-11-09 Applied Materials, Inc. Process and composition for electrochemical mechanical polishing
US20060249395A1 (en) * 2005-05-05 2006-11-09 Applied Material, Inc. Process and composition for electrochemical mechanical polishing
US20070181441A1 (en) * 2005-10-14 2007-08-09 Applied Materials, Inc. Method and apparatus for electropolishing
US20070151866A1 (en) * 2006-01-05 2007-07-05 Applied Materials, Inc. Substrate polishing with surface pretreatment
FR2898138B1 (en) * 2006-03-03 2008-05-16 Commissariat Energie Atomique METHOD FOR ELECTROCHEMICAL STRUCTURING OF A CONDUCTIVE OR SEMICONDUCTOR MATERIAL, AND DEVICE FOR CARRYING OUT SAID METHOD
US20070254485A1 (en) * 2006-04-28 2007-11-01 Daxin Mao Abrasive composition for electrochemical mechanical polishing
US20070281106A1 (en) * 2006-05-30 2007-12-06 Applied Materials, Inc. Process chamber for dielectric gapfill
US20080083623A1 (en) * 2006-10-04 2008-04-10 Golden Josh H Method and apparatus for treatment of plating solutions
US7601264B2 (en) * 2006-10-04 2009-10-13 Applied Materials, Inc. Method for treatment of plating solutions
US20090120584A1 (en) * 2007-11-08 2009-05-14 Applied Materials, Inc. Counter-balanced substrate support
US7964040B2 (en) * 2007-11-08 2011-06-21 Applied Materials, Inc. Multi-port pumping system for substrate processing chambers
US20090120368A1 (en) * 2007-11-08 2009-05-14 Applied Materials, Inc. Rotating temperature controlled substrate pedestal for film uniformity
US20090277587A1 (en) * 2008-05-09 2009-11-12 Applied Materials, Inc. Flowable dielectric equipment and processes
US8425687B2 (en) * 2009-02-10 2013-04-23 Tel Nexx, Inc. Wetting a workpiece surface in a fluid-processing system
KR101274363B1 (en) 2009-05-27 2013-06-13 노벨러스 시스템즈, 인코포레이티드 Pulse sequence for plating on thin seed layers
US9677188B2 (en) 2009-06-17 2017-06-13 Novellus Systems, Inc. Electrofill vacuum plating cell
US20100320081A1 (en) * 2009-06-17 2010-12-23 Mayer Steven T Apparatus for wetting pretreatment for enhanced damascene metal filling
US9455139B2 (en) 2009-06-17 2016-09-27 Novellus Systems, Inc. Methods and apparatus for wetting pretreatment for through resist metal plating
US9138784B1 (en) 2009-12-18 2015-09-22 Novellus Systems, Inc. Deionized water conditioning system and methods
US9385035B2 (en) 2010-05-24 2016-07-05 Novellus Systems, Inc. Current ramping and current pulsing entry of substrates for electroplating
GB201021326D0 (en) * 2010-12-16 2011-01-26 Picofluidics Ltd Electro chemical deposition apparatus
US20120180954A1 (en) 2011-01-18 2012-07-19 Applied Materials, Inc. Semiconductor processing system and methods using capacitively coupled plasma
FR2982877B1 (en) * 2011-11-18 2014-10-03 Alchimer MACHINE SUITABLE FOR METALLIZING A CAVITY OF A SEMICONDUCTOR OR CONDUCTIVE SUBSTRATE SUCH AS A VIA-TYPE VIA STRUCTURE
KR102092416B1 (en) 2012-03-30 2020-03-24 노벨러스 시스템즈, 인코포레이티드 Cleaning electroplating substrate holders using reverse current deplating
US8889566B2 (en) 2012-09-11 2014-11-18 Applied Materials, Inc. Low cost flowable dielectric films
US9018108B2 (en) 2013-01-25 2015-04-28 Applied Materials, Inc. Low shrinkage dielectric films
US9613833B2 (en) 2013-02-20 2017-04-04 Novellus Systems, Inc. Methods and apparatus for wetting pretreatment for through resist metal plating
US10385471B2 (en) 2013-03-18 2019-08-20 Spts Technologies Limited Electrochemical deposition chamber
GB2512056B (en) 2013-03-18 2018-04-18 Spts Technologies Ltd Electrochemical deposition chamber
US9412581B2 (en) 2014-07-16 2016-08-09 Applied Materials, Inc. Low-K dielectric gapfill by flowable deposition
US9481942B2 (en) 2015-02-03 2016-11-01 Lam Research Corporation Geometry and process optimization for ultra-high RPM plating
US9617648B2 (en) 2015-03-04 2017-04-11 Lam Research Corporation Pretreatment of nickel and cobalt liners for electrodeposition of copper into through silicon vias
US11495932B2 (en) 2017-06-09 2022-11-08 Applied Materials, Inc. Slip ring for use in rotatable substrate support
US10995409B2 (en) 2018-05-22 2021-05-04 Etx Corporation Method and apparatus for transfer of two-dimensional materials
WO2022138999A1 (en) * 2020-12-21 2022-06-30 주식회사 애니캐스팅 3d printing device using selective electrochemical deposition, and control method therefor
WO2022139000A1 (en) * 2020-12-21 2022-06-30 주식회사 애니캐스팅 Three-dimensional printing device using selective electrochemical deposition

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2871174A (en) * 1957-04-25 1959-01-27 Bell Telephone Labor Inc Method for electropolishing semiconducting material
US5441629A (en) * 1993-03-30 1995-08-15 Mitsubishi Denki Kabushiki Kaisha Apparatus and method of electroplating

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2751344A (en) * 1949-06-21 1956-06-19 Charles A Kienberger Electropolisher
US4096042A (en) * 1969-04-04 1978-06-20 The United States Of America As Represented By The United States Department Of Energy Electroplating method and apparatus
DE2051710B2 (en) * 1970-10-21 1975-09-04 Robert Bosch Gmbh, 7000 Stuttgart Machine for electrochemical metalworking with several processing points
IT1129345B (en) * 1980-10-29 1986-06-04 Fiat Ricerche DISP * SITE FOR ELECTROLYTIC TREATMENT OF THE SURFACE OF MACHINE PARTS, PARTICULARLY OF CYLINDERS OF INTERNAL COMBUSTION ENGINES
SE8101046L (en) * 1981-02-16 1982-08-17 Europafilm DEVICE FOR PLANTS, Separate for the matrices of gramophone discs and the like
US5024746A (en) * 1987-04-13 1991-06-18 Texas Instruments Incorporated Fixture and a method for plating contact bumps for integrated circuits
US5000827A (en) * 1990-01-02 1991-03-19 Motorola, Inc. Method and apparatus for adjusting plating solution flow characteristics at substrate cathode periphery to minimize edge effect
US5368711A (en) * 1990-08-01 1994-11-29 Poris; Jaime Selective metal electrodeposition process and apparatus
US5256274A (en) * 1990-08-01 1993-10-26 Jaime Poris Selective metal electrodeposition process
JP2734269B2 (en) * 1991-12-26 1998-03-30 日本電気株式会社 Semiconductor manufacturing equipment
JP3200468B2 (en) * 1992-05-21 2001-08-20 日本エレクトロプレイテイング・エンジニヤース株式会社 Wafer plating equipment
US5516414A (en) * 1992-09-15 1996-05-14 Atr Wire & Cable Co., Inc. Method and apparatus for electrolytically plating copper
JP3377849B2 (en) * 1994-02-02 2003-02-17 日本エレクトロプレイテイング・エンジニヤース株式会社 Wafer plating equipment
US6042712A (en) * 1995-05-26 2000-03-28 Formfactor, Inc. Apparatus for controlling plating over a face of a substrate
US5597460A (en) * 1995-11-13 1997-01-28 Reynolds Tech Fabricators, Inc. Plating cell having laminar flow sparger
US5830805A (en) * 1996-11-18 1998-11-03 Cornell Research Foundation Electroless deposition equipment or apparatus and method of performing electroless deposition
DE29701092U1 (en) * 1997-01-23 1997-03-20 Technotrans Gmbh Galvanic deposition device
JP3490238B2 (en) * 1997-02-17 2004-01-26 三菱電機株式会社 Plating apparatus and plating method
US5865984A (en) * 1997-06-30 1999-02-02 International Business Machines Corporation Electrochemical etching apparatus and method for spirally etching a workpiece
US6017437A (en) * 1997-08-22 2000-01-25 Cutek Research, Inc. Process chamber and method for depositing and/or removing material on a substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2871174A (en) * 1957-04-25 1959-01-27 Bell Telephone Labor Inc Method for electropolishing semiconducting material
US5441629A (en) * 1993-03-30 1995-08-15 Mitsubishi Denki Kabushiki Kaisha Apparatus and method of electroplating

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9435049B2 (en) 2013-11-20 2016-09-06 Lam Research Corporation Alkaline pretreatment for electroplating

Also Published As

Publication number Publication date
TW457572B (en) 2001-10-01
DE69823556T2 (en) 2005-04-14
KR100375869B1 (en) 2003-03-15
US6017437A (en) 2000-01-25
US6077412A (en) 2000-06-20
DE69823556D1 (en) 2004-06-03
EP1051544B1 (en) 2004-04-28
JP3274457B2 (en) 2002-04-15
AU8686498A (en) 1999-03-16
JP2001514332A (en) 2001-09-11
KR20010052062A (en) 2001-06-25
EP1051544A2 (en) 2000-11-15
US6179982B1 (en) 2001-01-30
WO1999010566A2 (en) 1999-03-04

Similar Documents

Publication Publication Date Title
WO1999010566A3 (en) Process chamber and method for depositing and/or removing material on a substrate
AU5537098A (en) Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method
EP0887853A3 (en) Electrostatic chucks for holding substrates in process chambers
EP0673545A4 (en) Process and apparatus for etching semiconductor wafers.
DE69501018D1 (en) Multiple electrode electrostatic chuck
EP1213746A3 (en) Single wafer type substrate cleaning method and apparatus
AU3585197A (en) Methods and apparatuses for clamping and declamping a semiconductor wafer in a wafer processing system
AU7262596A (en) Method and apparatus for chemical processing semiconductor wafers
TW287304B (en) Methods and apparatus for etching semiconductor wafers
WO2004008493A3 (en) Method and apparatus for supporting semiconductor wafers
KR960032633A (en) Plasma etching method
EP0806793A3 (en) Insulated wafer spacing mask for a substrate support chuck and method of fabricating same
EP0368334A3 (en) Etching apparatus and method of using the same
AU4183300A (en) Method and apparatus for forming an electrical contact with a semiconductor substrate
EP1193751A4 (en) Electrode, wafer stage, plasma device, method of manufacturing electrode and wafer stage
GB2346260B (en) Method of integrating substrate contact on SOI wafers with STI process
CA2286326A1 (en) Article, method, and apparatus for electrochemical fabrication
EP0869542A3 (en) Cleaning and drying apparatus, wafer processing system and wafer processing method
EP0840434A3 (en) Improved topographical structure of an electrostatic chuck and method of fabricating same
AU5173100A (en) Apparatus and methods for drying batches of wafers
ID17230A (en) METHOD OF PROCESSING LAYERS DOWN
AU5290098A (en) Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus
TW370701B (en) Monopolar electrostatic chuck having an electrode in contact with a workpiece
GB2375883A (en) A method and apparatus for implanting semiconductor wafer substrates
TW375765B (en) Method for reducing particles deposited onto a semiconductor wafer during plasma processing

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AL AM AT AT AU AZ BA BB BG BR BY CA CH CN CU CZ CZ DE DK DK EE EE ES FI GB GE GH GM HR HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

AK Designated states

Kind code of ref document: A3

Designated state(s): AL AM AT AT AU AZ BA BB BG BR BY CA CH CN CU CZ CZ DE DK DK EE EE ES FI GB GE GH GM HR HU ID IL IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK SL TJ TM TR TT UA UG US UZ VN YU ZW

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): GH GM KE LS MW SD SZ UG ZW AM AZ BY KG KZ MD RU TJ TM AT BE CH CY DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN GW ML MR NE SN TD TG

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
121 Ep: the epo has been informed by wipo that ep was designated in this application
WWE Wipo information: entry into national phase

Ref document number: 1020007001828

Country of ref document: KR

WWE Wipo information: entry into national phase

Ref document number: 1998938314

Country of ref document: EP

REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

WWP Wipo information: published in national office

Ref document number: 1998938314

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: CA

WWP Wipo information: published in national office

Ref document number: 1020007001828

Country of ref document: KR

WWG Wipo information: grant in national office

Ref document number: 1020007001828

Country of ref document: KR

WWG Wipo information: grant in national office

Ref document number: 1998938314

Country of ref document: EP