WO1998022860A3 - Computer aided inspection machine - Google Patents

Computer aided inspection machine Download PDF

Info

Publication number
WO1998022860A3
WO1998022860A3 PCT/US1997/020431 US9720431W WO9822860A3 WO 1998022860 A3 WO1998022860 A3 WO 1998022860A3 US 9720431 W US9720431 W US 9720431W WO 9822860 A3 WO9822860 A3 WO 9822860A3
Authority
WO
WIPO (PCT)
Prior art keywords
points
analyzed
dimensions
disclosed
structured light
Prior art date
Application number
PCT/US1997/020431
Other languages
French (fr)
Other versions
WO1998022860A2 (en
Inventor
B Shawn Buckley
Jihong Chen
Dao Shan Yang
Hui Cheng Zhou
Original Assignee
B Shawn Buckley
Jihong Chen
Dao Shan Yang
Hui Cheng Zhou
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by B Shawn Buckley, Jihong Chen, Dao Shan Yang, Hui Cheng Zhou filed Critical B Shawn Buckley
Priority to AU51746/98A priority Critical patent/AU5174698A/en
Publication of WO1998022860A2 publication Critical patent/WO1998022860A2/en
Publication of WO1998022860A3 publication Critical patent/WO1998022860A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Abstract

An automatic inspection method and apparatus using structured light (3) and machine vision cameras (2) to inspect an object (4) in conjunction with the geometric model of the object (4) is disclosed. Camera images of the object (4) are analyzed by computer to produce the location of points on the object's surface in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object (4). Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object (4) dimensions. The inspection device uses several multiplexed sensors, each composed of a camera (2) and a structured light source (3), to measure all sides of the object (4) on a single pass. Calibration and compensation methods are also disclosed.
PCT/US1997/020431 1996-11-08 1997-11-07 Computer aided inspection machine WO1998022860A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AU51746/98A AU5174698A (en) 1996-11-08 1997-11-07 Computer aided inspection machine

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US3077196P 1996-11-08 1996-11-08
US60/030,771 1996-11-08

Publications (2)

Publication Number Publication Date
WO1998022860A2 WO1998022860A2 (en) 1998-05-28
WO1998022860A3 true WO1998022860A3 (en) 2000-08-24

Family

ID=21855929

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1997/020431 WO1998022860A2 (en) 1996-11-08 1997-11-07 Computer aided inspection machine

Country Status (3)

Country Link
US (1) US6064759A (en)
AU (1) AU5174698A (en)
WO (1) WO1998022860A2 (en)

Families Citing this family (317)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5988862A (en) * 1996-04-24 1999-11-23 Cyra Technologies, Inc. Integrated system for quickly and accurately imaging and modeling three dimensional objects
ES2222474T3 (en) * 1996-12-31 2005-02-01 Datalogic S.P.A. PROCEDURE AND APPARATUS FOR MEASURING THE VOLUME OF AN OBJECT.
EP0880023A1 (en) * 1997-05-23 1998-11-25 Siemag Transplan Gmbh Method and device for the automatic detection of surface faults during the continuous mechanical removal of material from casted products
JPH1137731A (en) * 1997-07-24 1999-02-12 Sumitomo Kinzoku Erekutorodebaisu:Kk Image taking-in system
JP3186667B2 (en) * 1997-10-07 2001-07-11 日本電気株式会社 Inspection terminal position determination device, inspection terminal position determination method, and recording medium recording inspection terminal position determination program
US6915006B2 (en) * 1998-01-16 2005-07-05 Elwin M. Beaty Method and apparatus for three dimensional inspection of electronic components
US6072898A (en) * 1998-01-16 2000-06-06 Beaty; Elwin M. Method and apparatus for three dimensional inspection of electronic components
US7065462B2 (en) * 1998-07-24 2006-06-20 Merilab, Inc. Vehicle wheel alignment by rotating vision sensor
WO2000029809A1 (en) * 1998-11-17 2000-05-25 Stowe Woodward Company Laser-based system for measuring cylindrical objects
US6246805B1 (en) * 1998-12-04 2001-06-12 Intel Corporation Efficient beveling of extruded regions in video processing
US7092860B1 (en) * 1999-02-03 2006-08-15 Mitutoyo Corporation Hardware simulation systems and methods for vision inspection systems
US6298474B1 (en) * 1999-04-30 2001-10-02 Intergral Vision, Inc. Method and system for interactively developing a graphical control-flow structure and associated application software for use in a machine vision system and computer-readable storage medium having a program for executing the method
US7420588B2 (en) * 1999-06-09 2008-09-02 Mitutoyo Corporation Measuring method, measuring system and storage medium
US6415051B1 (en) * 1999-06-24 2002-07-02 Geometrix, Inc. Generating 3-D models using a manually operated structured light source
GB2352030A (en) * 1999-07-14 2001-01-17 Ibm Measuring surface roughness and contaminant thickness using ellipsometry
US7069101B1 (en) * 1999-07-29 2006-06-27 Applied Materials, Inc. Computer integrated manufacturing techniques
DE10040981A1 (en) * 1999-09-18 2001-03-22 Nexpress Solutions Llc Position determining method for object having edge e.g. paper sheet stack in printer involves illuminating predefined illumination areas within boundaries on edge of sheet stack by diverging infrared light beam irradiated from light source
US20030020906A1 (en) * 1999-10-25 2003-01-30 Perry Y. Li Scanning apparatus
US6640151B1 (en) 1999-12-22 2003-10-28 Applied Materials, Inc. Multi-tool control system, method and medium
US6529790B1 (en) * 1999-12-28 2003-03-04 Koninklijke Philips Electronics N.V. Computation of die-per-wafer considering production technology and wafer size
US6522940B1 (en) * 1999-12-28 2003-02-18 Koninklijke Philips Electronics N.V. Method and system for varying die shape to increase wafer productivity
WO2001057471A1 (en) * 2000-01-31 2001-08-09 Omron Corporation Visual displacement sensor
US6674089B2 (en) * 2000-04-10 2004-01-06 The United States Of America As Represented By The Secretary Of The Navy Optical technique for the detection of suspended trip-wires and cables
JP2001296105A (en) * 2000-04-12 2001-10-26 Nikon Corp Surface-position detecting apparatus, and aligner and aligning method using the detecting apparatus
US7075565B1 (en) * 2000-06-14 2006-07-11 Landrex Technologies Co., Ltd. Optical inspection system
US6701001B1 (en) * 2000-06-20 2004-03-02 Dunkley International, Inc. Automated part sorting system
KR100383816B1 (en) * 2000-06-26 2003-05-16 한국전력공사 A 3-D shape measuring method and system using a adaptive area clustering
US6609951B1 (en) 2000-06-30 2003-08-26 3M Innovative Properties Company Method of making a surface treating article
US6708074B1 (en) 2000-08-11 2004-03-16 Applied Materials, Inc. Generic interface builder
US6825936B2 (en) * 2000-08-23 2004-11-30 Lmi Technologies, Inc. High speed camera based sensors
DE10041292A1 (en) * 2000-08-23 2002-03-07 Daimler Chrysler Ag Registering actual description of measured object using desired description e.g. for CAD coordinate measuring machine, by iterative method
US6618155B2 (en) * 2000-08-23 2003-09-09 Lmi Technologies Inc. Method and apparatus for scanning lumber and other objects
US6493079B1 (en) * 2000-09-07 2002-12-10 National Instruments Corporation System and method for machine vision analysis of an object using a reduced number of cameras
CZ299647B6 (en) * 2000-11-02 2008-10-01 Rieter Cz A. S. Device for contactless measurement of a linear textile formation, such as a yarn, thread, textile fiber, sliver and the like
US6795200B1 (en) * 2000-11-13 2004-09-21 Point Grey Research Inc. Method and system for dimensioning boxes or other cuboid objects
US7188142B2 (en) 2000-11-30 2007-03-06 Applied Materials, Inc. Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
US20020065637A1 (en) * 2000-11-30 2002-05-30 Thompson John S. Method and apparatus for simulating the measurement of a part without using a physical measurement system
DE10065120C2 (en) * 2000-12-28 2003-03-20 Inb Vision Ag Method for determining the deviation of the pixel location of the pixels of at least one image recording matrix from the target position
DE10065121A1 (en) * 2000-12-28 2002-07-11 Inb Vision Ag Methods to improve the accuracy of 3D optical measurement methods
US6531675B2 (en) * 2001-01-31 2003-03-11 Unova Ip Corp. Laser welding method and apparatus
US6788984B2 (en) * 2001-02-02 2004-09-07 The Coca-Cola Company Container design process
US20020128735A1 (en) * 2001-03-08 2002-09-12 Hawkins Parris C.M. Dynamic and extensible task guide
US7340076B2 (en) * 2001-05-10 2008-03-04 Digimarc Corporation Digital watermarks for unmanned vehicle navigation
US20020169962A1 (en) * 2001-05-10 2002-11-14 Brundage Trent J. Digital watermarks used in automation equipment
US7160739B2 (en) 2001-06-19 2007-01-09 Applied Materials, Inc. Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US7698012B2 (en) 2001-06-19 2010-04-13 Applied Materials, Inc. Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US6922599B2 (en) * 2001-08-13 2005-07-26 The Boeing Company System and method for producing an assembly by directly implementing three-dimensional computer-aided design component definitions
US6975747B2 (en) 2001-08-14 2005-12-13 Acuity Cimatrix, Inc. Method and system for monitoring and controlling workpieces
US6730926B2 (en) 2001-09-05 2004-05-04 Servo-Robot Inc. Sensing head and apparatus for determining the position and orientation of a target object
FR2830079B1 (en) * 2001-09-26 2004-04-30 Holo 3 METHOD AND DEVICE FOR MEASURING AT LEAST ONE GEOMETRIC SIZE OF AN OPTICALLY REFLECTIVE SURFACE
US6580971B2 (en) 2001-11-13 2003-06-17 Thierica, Inc. Multipoint inspection system
FI111755B (en) * 2001-11-23 2003-09-15 Mapvision Oy Ltd Method and system for calibrating an artificial vision system
JP2005515910A (en) * 2002-01-31 2005-06-02 ブレインテック カナダ インコーポレイテッド Method and apparatus for single camera 3D vision guide robotics
US20030199112A1 (en) 2002-03-22 2003-10-23 Applied Materials, Inc. Copper wiring module control
US6672716B2 (en) * 2002-04-29 2004-01-06 Xerox Corporation Multiple portion solid ink stick
US6879389B2 (en) * 2002-06-03 2005-04-12 Innoventor Engineering, Inc. Methods and systems for small parts inspection
JP2004012257A (en) * 2002-06-06 2004-01-15 Yamaha Fine Technologies Co Ltd Appearance inspection device and appearance inspection method for work
DE10226663A1 (en) * 2002-06-14 2003-12-24 Sick Ag Method for locating objects on a carrier level
US6974964B1 (en) * 2002-06-17 2005-12-13 Bu-Chin Wang Method and apparatus for three-dimensional surface scanning and measurement of a moving object
US7745805B2 (en) 2002-06-17 2010-06-29 Johnson Thread-View Systems Product inspection system and a method for implementing same that incorporates a correction factor
AU2003243617A1 (en) * 2002-06-17 2003-12-31 Stanley P. Johnson An inspection system and method
US8035094B2 (en) 2002-06-17 2011-10-11 Quest Metrology, LLC Methods for measuring at least one physical characteristic of a component
US8410466B2 (en) * 2002-06-17 2013-04-02 Quest Metrology Group, Llc Non-contact component inspection system
US7777209B2 (en) * 2002-06-17 2010-08-17 Johnson Stanley P Product inspection system and a method for implementing same
DE10235437B4 (en) * 2002-08-02 2007-09-20 Pdf Solutions Gmbh Method for correcting physical errors when measuring an object
US6867423B2 (en) * 2002-09-17 2005-03-15 Quad/Tech, Inc. Method and apparatus for visually inspecting a substrate on a printing press
US20040188644A1 (en) * 2002-09-17 2004-09-30 Quad/Tech, Inc. Method and apparatus for visually inspecting a substrate on a printing press
US20040063224A1 (en) * 2002-09-18 2004-04-01 Applied Materials, Inc. Feedback control of a chemical mechanical polishing process for multi-layered films
US7272459B2 (en) * 2002-11-15 2007-09-18 Applied Materials, Inc. Method, system and medium for controlling manufacture process having multivariate input parameters
CA2806522C (en) * 2002-12-10 2016-09-27 Chep Technology Pty Limited Automated pallet inspection and repair
US6809330B2 (en) * 2002-12-18 2004-10-26 Lockheed Martin Corporation Automatic calibration and built-in diagnostic procedures for line scan cameras
US7352892B2 (en) * 2003-03-20 2008-04-01 Micron Technology, Inc. System and method for shape reconstruction from optical images
US20040184653A1 (en) * 2003-03-20 2004-09-23 Baer Richard L. Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients
GB0308509D0 (en) * 2003-04-12 2003-05-21 Antonis Jan Inspection apparatus and method
US20100259764A1 (en) * 2003-06-13 2010-10-14 Johnson Stanley P Product inspection system and a method for implementing same
DE10328537B4 (en) * 2003-06-24 2015-03-26 Pixargus Gmbh Apparatus and method for measuring the dimension of a body
WO2005001722A2 (en) * 2003-06-25 2005-01-06 Bae Systems Plc Design optimisation of computationally intensive design problems
US7272254B2 (en) * 2003-07-09 2007-09-18 General Electric Company System and method for analyzing and identifying flaws in a manufactured part
DE10339499A1 (en) * 2003-08-27 2005-04-14 Siemens Ag Device for determining the volume of conveyed goods
US7725206B2 (en) * 2003-11-12 2010-05-25 The Boeing Company System and method for manufacturing and after-market support using as-built data
US20050105789A1 (en) * 2003-11-17 2005-05-19 Isaacs Hugh S. Method and apparatus for detecting, monitoring, and quantifying changes in a visual image over time
ES2365239T3 (en) 2003-12-19 2011-09-27 Chep Technology Pty Limited APPARATUS AND PROCEDURE FOR THE INSPECTION AND AUTOMATIC REPAIR OF PALLETS.
DE10361018C9 (en) * 2003-12-23 2021-03-04 QUISS Qualitäts-Inspektionssysteme und Service GmbH Method for recognizing a structure to be applied to a substrate with a plurality of cameras and a device therefor
US7359545B2 (en) * 2003-12-31 2008-04-15 Tokyo Electron Limited Method and system to compensate for lamp intensity differences in a photolithographic inspection tool
US7693325B2 (en) * 2004-01-14 2010-04-06 Hexagon Metrology, Inc. Transprojection of geometry data
US20050157920A1 (en) * 2004-01-21 2005-07-21 John Doherty Machine vision system and method
US20050174567A1 (en) * 2004-02-09 2005-08-11 Mectron Engineering Company Crack detection system
DE102004007829B4 (en) * 2004-02-18 2007-04-05 Isra Vision Systems Ag Method for determining areas to be inspected
US7324682B2 (en) * 2004-03-25 2008-01-29 Mitutoyo Corporation System and method for excluding extraneous features from inspection operations performed by a machine vision inspection system
CN104392292B (en) * 2004-05-21 2019-07-26 派拉斯科技术公司 Graphical re-inspection user setup interface
US20050286753A1 (en) * 2004-06-25 2005-12-29 Triant Technologies Inc. Automated inspection systems and methods
US7398179B2 (en) * 2004-08-25 2008-07-08 Gm Global Technology Operations, Inc. Part measurement prioritization system and method
US7522163B2 (en) * 2004-08-28 2009-04-21 David Holmes Method and apparatus for determining offsets of a part from a digital image
US7375826B1 (en) * 2004-09-23 2008-05-20 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration (Nasa) High speed three-dimensional laser scanner with real time processing
US20060066877A1 (en) * 2004-09-30 2006-03-30 Daniel Benzano Capture and display of image of three-dimensional object
DE102004052508B4 (en) * 2004-10-21 2006-08-03 Pixargus Gmbh System and method for measuring and monitoring the surface of a body
DE102004061177B4 (en) * 2004-12-16 2011-07-07 Benteler Automobiltechnik GmbH, 33102 Device for measuring components
DE102005042902A1 (en) * 2004-12-16 2007-03-22 Benteler Automobiltechnik Gmbh Device for measuring components and evaluation unit
US7796800B2 (en) * 2005-01-28 2010-09-14 Hewlett-Packard Development Company, L.P. Determining a dimensional change in a surface using images acquired before and after the dimensional change
CN1815212B (en) * 2005-02-05 2010-06-16 香港中文大学 Diagnosis method for metal punching course and apparatus thereof
US7809158B2 (en) * 2005-05-02 2010-10-05 Siemens Industry, Inc. Method and apparatus for detecting doubles in a singulated stream of flat articles
DE102005026419B4 (en) * 2005-06-08 2011-01-05 Mühlbauer Ag Method and device for geometric measurement of flat bodies
KR20070088318A (en) * 2005-06-17 2007-08-29 오므론 가부시키가이샤 Image processing device and image processing method for performing three dimensional measurement
DE102005029733B4 (en) * 2005-06-24 2007-08-02 Bühnenbau Wertheim GmbH Device for determining the density of wooden components
US7576347B2 (en) * 2005-10-24 2009-08-18 General Electric Company Method and apparatus for optically inspecting an object using a light source
US7365862B2 (en) * 2005-10-24 2008-04-29 General Electric Company Methods and apparatus for inspecting an object
US7301165B2 (en) * 2005-10-24 2007-11-27 General Electric Company Methods and apparatus for inspecting an object
US7898651B2 (en) * 2005-10-24 2011-03-01 General Electric Company Methods and apparatus for inspecting an object
US7492450B2 (en) * 2005-10-24 2009-02-17 General Electric Company Methods and apparatus for inspecting an object
US7285767B2 (en) * 2005-10-24 2007-10-23 General Electric Company Methods and apparatus for inspecting an object
US7336374B2 (en) * 2005-10-24 2008-02-26 General Electric Company Methods and apparatus for generating a mask
DE102005051318B4 (en) * 2005-10-26 2011-11-17 Mathias Reiter Optical shape determination method
DE102005054658A1 (en) * 2005-11-16 2007-05-24 Sick Ag Method for automatically paramenting measuring systems
DE102005058873A1 (en) * 2005-12-09 2007-06-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Device and method for measuring the surface of a body
JP4839827B2 (en) * 2005-12-26 2011-12-21 コニカミノルタセンシング株式会社 3D measuring device
US20070159655A1 (en) * 2006-01-11 2007-07-12 Lexmark International, Inc. Method and apparatus for compensating two-dimensional images for illumination non-uniformities
US20070193012A1 (en) * 2006-02-22 2007-08-23 Robert Bergman Metal forming process
DE102006013584B4 (en) * 2006-03-22 2014-07-10 Benteler Automobiltechnik Gmbh Device for measuring components
FR2898969B1 (en) * 2006-03-24 2008-10-24 Peugeot Citroen Automobiles Sa METHOD AND INSTALLATION FOR CONTROLLING THE QUALITY OF PARTS
US20070237356A1 (en) * 2006-04-07 2007-10-11 John Dwinell Parcel imaging system and method
US8139117B2 (en) 2006-04-21 2012-03-20 Sick, Inc. Image quality analysis with test pattern
US7814441B2 (en) * 2006-05-09 2010-10-12 Inus Technology, Inc. System and method for identifying original design intents using 3D scan data
US8036773B2 (en) * 2006-05-10 2011-10-11 Mckesson Automation Inc. System, method and corresponding apparatus for storing, retrieving and delivering unit dose blisters
WO2007149183A2 (en) * 2006-05-25 2007-12-27 Braintech Canada, Inc. System and method of robotically engaging an object
CN100494891C (en) * 2006-08-03 2009-06-03 北京联合大学 Sub-picture element level outline extracting method in photographic measurement
CN101136008A (en) * 2006-08-29 2008-03-05 鸿富锦精密工业（深圳）有限公司 Straight-line degree analytical system and method
WO2008036354A1 (en) * 2006-09-19 2008-03-27 Braintech Canada, Inc. System and method of determining object pose
WO2008076942A1 (en) * 2006-12-15 2008-06-26 Braintech Canada, Inc. System and method of identifying objects
JP4991365B2 (en) * 2007-03-29 2012-08-01 カヤバ工業株式会社 Dimension measuring apparatus and dimension measuring method
US8132728B2 (en) * 2007-04-04 2012-03-13 Sick, Inc. Parcel dimensioning measurement system and method
WO2008123849A1 (en) 2007-04-04 2008-10-16 Sick, Inc Parcel dimensioning measurement system and method
ITBO20070280A1 (en) * 2007-04-18 2008-10-19 Cefla Coop APPARATUS FOR DETECTING TRANSIT AND / OR DIMENSIONAL AND / OR SHAPE CHARACTERISTICS OF PANELS OR OTHER PARTS WITH EXTENSIVE PLAIN EXTENSION, LOCATED ON A TRANSPORTATION LINE AND TO GOVERN SUBSEQUENT OPERATING MEANS.
GB0707921D0 (en) * 2007-04-24 2007-05-30 Renishaw Plc Apparatus and method for surface measurement
US20100255973A1 (en) * 2007-05-15 2010-10-07 Desmedt Eric Method of making and inspecting bags
WO2008148219A1 (en) * 2007-06-07 2008-12-11 Universite Laval Method and device for the measurement of the abdominal sagittal diameter and/or other physical dimensions
CN101720476B (en) * 2007-07-02 2013-06-05 特里伯耶拿有限公司 Feature detection apparatus and metod for measuring object distances
US8111907B2 (en) * 2007-07-31 2012-02-07 United Technologies Corporation Method for repeatable optical determination of object geometry dimensions and deviations
US7957583B2 (en) * 2007-08-02 2011-06-07 Roboticvisiontech Llc System and method of three-dimensional pose estimation
CA2597891A1 (en) * 2007-08-20 2009-02-20 Marc Miousset Multi-beam optical probe and system for dimensional measurement
CN100491903C (en) * 2007-09-05 2009-05-27 北京航空航天大学 Method for calibrating structural parameter of structure optical vision sensor
US8488129B2 (en) * 2007-10-05 2013-07-16 Artec Group, Inc. Combined object capturing system and display device and associated method
US7812970B2 (en) * 2007-10-23 2010-10-12 Gii Acquisition, Llc Method and system for inspecting parts utilizing triangulation
US8264697B2 (en) * 2007-11-27 2012-09-11 Intelligrated Headquarters, Llc Object detection device
US8285025B2 (en) * 2008-03-25 2012-10-09 Electro Scientific Industries, Inc. Method and apparatus for detecting defects using structured light
JP5175600B2 (en) * 2008-04-09 2013-04-03 株式会社日立ハイテクノロジーズ Inspection device
US20090295796A1 (en) * 2008-05-29 2009-12-03 Brown Clayton D Method of updating a model
US7899573B2 (en) * 2008-06-16 2011-03-01 GM Global Technology Operations LLC Non-contact method and system for inspecting a multi-faceted machine surface
US20090323084A1 (en) * 2008-06-25 2009-12-31 Joseph Christen Dunn Package dimensioner and reader
KR101495333B1 (en) * 2008-07-02 2015-02-25 삼성전자 주식회사 Apparatus and method for detecting obstacles
EP2325625A1 (en) * 2008-08-07 2011-05-25 Kde Corporation Inspection system
US8559699B2 (en) * 2008-10-10 2013-10-15 Roboticvisiontech Llc Methods and apparatus to facilitate operations in image based systems
US9689655B2 (en) * 2008-10-29 2017-06-27 Renishaw Plc Measurement method
US20100169053A1 (en) * 2008-12-30 2010-07-01 Caterpillar Inc. Method for creating weldment inspection documents
US8908995B2 (en) 2009-01-12 2014-12-09 Intermec Ip Corp. Semi-automatic dimensioning with imager on a portable device
DE102009009393A1 (en) 2009-02-18 2010-08-19 Pixargus Gmbh Device and method for measuring a body
US8108168B2 (en) 2009-03-12 2012-01-31 Etegent Technologies, Ltd. Managing non-destructive evaluation data
US8521480B2 (en) * 2009-03-12 2013-08-27 Etegent Technologies, Ltd. Managing non-destructive evaluation data
US8929641B2 (en) * 2009-03-17 2015-01-06 Aesynt Incorporated System and method for determining the orientation of a unit dose package
US8164507B2 (en) * 2009-04-21 2012-04-24 Raytheon Company Fusing multi-sensor data to provide estimates of structures
IT1394363B1 (en) * 2009-05-20 2012-06-15 CEFLA Società Cooperativa OPTOELECTRONIC APPARATUS TO DISCOVER AND TRANSMIT AN OPERATING SYSTEM OF INFORMATION CONCERNING THE SHAPE AND POSITION IN THE PANEL OR OTHER POSITION WITH PREVALENT FLAT EXTENSION.
US8526705B2 (en) * 2009-06-10 2013-09-03 Apple Inc. Driven scanning alignment for complex shapes
US20110025830A1 (en) * 2009-07-31 2011-02-03 3Dmedia Corporation Methods, systems, and computer-readable storage media for generating stereoscopic content via depth map creation
WO2011014419A1 (en) * 2009-07-31 2011-02-03 3Dmedia Corporation Methods, systems, and computer-readable storage media for creating three-dimensional (3d) images of a scene
US9380292B2 (en) 2009-07-31 2016-06-28 3Dmedia Corporation Methods, systems, and computer-readable storage media for generating three-dimensional (3D) images of a scene
ES2374514T3 (en) * 2009-09-29 2012-02-17 Leuze Electronic Gmbh + Co. Kg OPTICAL SENSOR.
EP2316582B1 (en) * 2009-11-02 2014-01-22 Sontec AG Device and method for optical checking of workpieces
US8538167B2 (en) * 2010-01-07 2013-09-17 Raytheon Company Designating corridors to provide estimates of structures
US8271224B2 (en) * 2010-01-13 2012-09-18 Raytheon Company Fusing structures from multi-sensor data
US8290741B2 (en) * 2010-01-13 2012-10-16 Raytheon Company Fusing multi-sensor data sets according to relative geometrical relationships
JP5170154B2 (en) * 2010-04-26 2013-03-27 オムロン株式会社 Shape measuring apparatus and calibration method
DE102010021317A1 (en) * 2010-05-22 2011-12-08 Bernhard Schäfer Hand-held device for measuring mass of e.g. cuboid-shaped objects, has measuring panels determining ends of intersection lines, where mass of side surface of objects is calculated by data of intersection lines
US9344701B2 (en) 2010-07-23 2016-05-17 3Dmedia Corporation Methods, systems, and computer-readable storage media for identifying a rough depth map in a scene and for determining a stereo-base distance for three-dimensional (3D) content creation
US9390486B2 (en) 2010-09-29 2016-07-12 Neeraj Khurana System and method for automatic orientation of a chip to the CAD layout with sub-optical resolution
US8115761B1 (en) * 2010-10-12 2012-02-14 Google Inc. Locking geometric and camera parameters in image-based three-dimensional modeling, and applications thereof
JP5515039B2 (en) 2010-10-22 2014-06-11 株式会社ミツトヨ Image measuring device
US9185388B2 (en) 2010-11-03 2015-11-10 3Dmedia Corporation Methods, systems, and computer program products for creating three-dimensional video sequences
US10200671B2 (en) 2010-12-27 2019-02-05 3Dmedia Corporation Primary and auxiliary image capture devices for image processing and related methods
US8274552B2 (en) 2010-12-27 2012-09-25 3Dmedia Corporation Primary and auxiliary image capture devices for image processing and related methods
CN102620651B (en) * 2011-01-28 2015-11-25 鸿富锦精密工业（深圳）有限公司 Image measurer
US10586341B2 (en) 2011-03-04 2020-03-10 General Electric Company Method and device for measuring features on or near an object
US9984474B2 (en) 2011-03-04 2018-05-29 General Electric Company Method and device for measuring features on or near an object
US10019812B2 (en) 2011-03-04 2018-07-10 General Electric Company Graphic overlay for measuring dimensions of features using a video inspection device
US9875574B2 (en) 2013-12-17 2018-01-23 General Electric Company Method and device for automatically identifying the deepest point on the surface of an anomaly
US10157495B2 (en) 2011-03-04 2018-12-18 General Electric Company Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object
US20110298916A1 (en) * 2011-04-18 2011-12-08 Lmi Technologies Ltd. Sensor system processing architecture
US8768873B2 (en) * 2011-05-03 2014-07-01 Space-Time Insight Space-time-node engine signal structure
US9793673B2 (en) 2011-06-13 2017-10-17 Kla-Tencor Corporation Semiconductor inspection and metrology system using laser pulse multiplier
CN103857982A (en) 2011-08-15 2014-06-11 纽约市哥伦比亚大学理事会 Systems and methods for performing machine vision using diffuse structured light
US9234843B2 (en) * 2011-08-25 2016-01-12 Alliance For Sustainable Energy, Llc On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging
CN104023629B (en) * 2011-09-08 2017-02-22 Apn健康有限责任公司 Automatically determining 3d catheter location and orientation using 2d fluoroscopy only
DE202011051565U1 (en) * 2011-10-06 2011-11-03 Leuze Electronic Gmbh & Co. Kg Optical sensor
JP6023415B2 (en) * 2011-10-17 2016-11-09 キヤノン株式会社 Three-dimensional measuring apparatus, control method and program for three-dimensional measuring apparatus
US20130101158A1 (en) * 2011-10-21 2013-04-25 Honeywell International Inc. Determining dimensions associated with an object
US10197501B2 (en) 2011-12-12 2019-02-05 Kla-Tencor Corporation Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors
US8742287B2 (en) * 2011-12-15 2014-06-03 Guardian Industries Corp. Lighting solution for apparatuses for vacuum insulating glass (VIG) unit tip-off, and/or associated methods
DE102012003620B4 (en) * 2012-02-20 2014-02-27 Salzgitter Mannesmann Grobblech Gmbh Method and device for non-contact geometric measurement of a measurement object
US9496425B2 (en) 2012-04-10 2016-11-15 Kla-Tencor Corporation Back-illuminated sensor with boron layer
US20130287288A1 (en) * 2012-04-25 2013-10-31 General Electric Company Method and device for determining the offset distance between two surfaces
US9779546B2 (en) 2012-05-04 2017-10-03 Intermec Ip Corp. Volume dimensioning systems and methods
US9007368B2 (en) 2012-05-07 2015-04-14 Intermec Ip Corp. Dimensioning system calibration systems and methods
US10007858B2 (en) 2012-05-15 2018-06-26 Honeywell International Inc. Terminals and methods for dimensioning objects
US9601299B2 (en) 2012-08-03 2017-03-21 Kla-Tencor Corporation Photocathode including silicon substrate with boron layer
US10321127B2 (en) 2012-08-20 2019-06-11 Intermec Ip Corp. Volume dimensioning system calibration systems and methods
US8888480B2 (en) 2012-09-05 2014-11-18 Aprecia Pharmaceuticals Company Three-dimensional printing system and equipment assembly
US9939259B2 (en) 2012-10-04 2018-04-10 Hand Held Products, Inc. Measuring object dimensions using mobile computer
US20140104413A1 (en) 2012-10-16 2014-04-17 Hand Held Products, Inc. Integrated dimensioning and weighing system
US9151940B2 (en) 2012-12-05 2015-10-06 Kla-Tencor Corporation Semiconductor inspection and metrology system using laser pulse multiplier
US9529182B2 (en) 2013-02-13 2016-12-27 KLA—Tencor Corporation 193nm laser and inspection system
US9080856B2 (en) 2013-03-13 2015-07-14 Intermec Ip Corp. Systems and methods for enhancing dimensioning, for example volume dimensioning
US9864366B2 (en) 2013-03-15 2018-01-09 Etegent Technologies Ltd. Manufacture modeling and monitoring
US11543811B2 (en) 2013-03-15 2023-01-03 Etegent Technologies Ltd. Manufacture modeling and monitoring
US9608399B2 (en) 2013-03-18 2017-03-28 Kla-Tencor Corporation 193 nm laser and an inspection system using a 193 nm laser
WO2014156723A1 (en) * 2013-03-27 2014-10-02 株式会社ニコン Shape measurement device, structure production system, shape measurement method, structure production method, and shape measurement program
US9478402B2 (en) 2013-04-01 2016-10-25 Kla-Tencor Corporation Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor
US9269022B2 (en) * 2013-04-11 2016-02-23 Digimarc Corporation Methods for object recognition and related arrangements
US9488469B1 (en) * 2013-04-22 2016-11-08 Cognex Corporation System and method for high-accuracy measurement of object surface displacement using a laser displacement sensor
US9374898B2 (en) * 2013-04-24 2016-06-21 Apple Inc. Electrical and mechanical interconnection for electronic components
US10108774B2 (en) 2013-04-25 2018-10-23 Brigham Young University Method and apparatus for concurrent multi-user toolpath creation
DE102013007611A1 (en) * 2013-05-03 2014-11-06 Vollmer Werke Maschinenfabrik Gmbh Method for measuring cutting edges arranged on a cutter support and device for this purpose
US9605950B2 (en) * 2013-05-22 2017-03-28 Cognex Corporation System and method for efficient surface measurement using a laser displacement sensor
US10228452B2 (en) 2013-06-07 2019-03-12 Hand Held Products, Inc. Method of error correction for 3D imaging device
CZ2013450A3 (en) * 2013-06-12 2014-02-12 Rieter Cz S.R.O. Method of monitoring linear formation and apparatus for making the same
US9239950B2 (en) 2013-07-01 2016-01-19 Hand Held Products, Inc. Dimensioning system
US9049369B2 (en) 2013-07-10 2015-06-02 Christie Digital Systems Usa, Inc. Apparatus, system and method for projecting images onto predefined portions of objects
US9047514B2 (en) 2013-07-10 2015-06-02 Christie Digital Systems Usa, Inc. Apparatus, system and method for projecting images onto predefined portions of objects
US9464885B2 (en) 2013-08-30 2016-10-11 Hand Held Products, Inc. System and method for package dimensioning
JP6452086B2 (en) * 2013-10-31 2019-01-16 キヤノン株式会社 Shape calculating apparatus and method, measuring apparatus, article manufacturing method, and program
DE102013112553A1 (en) * 2013-11-14 2015-06-03 Odos Imaging Ltd. Lighting device and method for illuminating an object
US8805088B1 (en) 2013-12-16 2014-08-12 Google Inc. Specularity determination from images
US9818039B2 (en) 2013-12-17 2017-11-14 General Electric Company Method and device for automatically identifying a point of interest in a depth measurement on a viewed object
US9842430B2 (en) 2013-12-17 2017-12-12 General Electric Company Method and device for automatically identifying a point of interest on a viewed object
US9748294B2 (en) 2014-01-10 2017-08-29 Hamamatsu Photonics K.K. Anti-reflection layer for back-illuminated sensor
US11176655B2 (en) 2014-01-27 2021-11-16 Cognex Corporation System and method for determining 3D surface features and irregularities on an object
JP6306903B2 (en) * 2014-03-06 2018-04-04 キヤノン株式会社 Information processing apparatus, information processing apparatus control method, and program
US9410901B2 (en) 2014-03-17 2016-08-09 Kla-Tencor Corporation Image sensor, an inspection system and a method of inspecting an article
US9804101B2 (en) 2014-03-20 2017-10-31 Kla-Tencor Corporation System and method for reducing the bandwidth of a laser and an inspection system and method using a laser
US9952160B2 (en) * 2014-04-04 2018-04-24 Packaging Corporation Of America System and method for determining an impact of manufacturing processes on the caliper of a sheet material
US9823059B2 (en) 2014-08-06 2017-11-21 Hand Held Products, Inc. Dimensioning system with guided alignment
US9767986B2 (en) 2014-08-29 2017-09-19 Kla-Tencor Corporation Scanning electron microscope and methods of inspecting and reviewing samples
US9748729B2 (en) 2014-10-03 2017-08-29 Kla-Tencor Corporation 183NM laser and inspection system
US9779276B2 (en) 2014-10-10 2017-10-03 Hand Held Products, Inc. Depth sensor based auto-focus system for an indicia scanner
US10810715B2 (en) 2014-10-10 2020-10-20 Hand Held Products, Inc System and method for picking validation
US10775165B2 (en) 2014-10-10 2020-09-15 Hand Held Products, Inc. Methods for improving the accuracy of dimensioning-system measurements
US10060729B2 (en) 2014-10-21 2018-08-28 Hand Held Products, Inc. Handheld dimensioner with data-quality indication
US9762793B2 (en) 2014-10-21 2017-09-12 Hand Held Products, Inc. System and method for dimensioning
US9752864B2 (en) 2014-10-21 2017-09-05 Hand Held Products, Inc. Handheld dimensioning system with feedback
US9557166B2 (en) 2014-10-21 2017-01-31 Hand Held Products, Inc. Dimensioning system with multipath interference mitigation
US9897434B2 (en) 2014-10-21 2018-02-20 Hand Held Products, Inc. Handheld dimensioning system with measurement-conformance feedback
US10788813B2 (en) * 2014-10-28 2020-09-29 The Boeing Company Systems and methods for machining to nominal geometry using local features
KR101610148B1 (en) * 2014-11-17 2016-04-08 현대자동차 주식회사 System for inspecting vehicle body and method thereof
FR3034233B1 (en) * 2015-03-25 2018-08-10 Morpho METHOD OF CORRECTING AN IMAGE OF AT LEAST ONE REMOTELY PRESENTED OBJECT IN FRONT OF AN IMAGER AND LIGHTING BY A LIGHTING SYSTEM AND SHOOTING SYSTEM FOR IMPLEMENTING SAID METHOD
US9860466B2 (en) * 2015-05-14 2018-01-02 Kla-Tencor Corporation Sensor with electrically controllable aperture for inspection and metrology systems
US9786101B2 (en) 2015-05-19 2017-10-10 Hand Held Products, Inc. Evaluating image values
US10066982B2 (en) 2015-06-16 2018-09-04 Hand Held Products, Inc. Calibrating a volume dimensioner
US9857167B2 (en) 2015-06-23 2018-01-02 Hand Held Products, Inc. Dual-projector three-dimensional scanner
US20160377414A1 (en) 2015-06-23 2016-12-29 Hand Held Products, Inc. Optical pattern projector
US10074191B1 (en) 2015-07-05 2018-09-11 Cognex Corporation System and method for determination of object volume with multiple three-dimensional sensors
US9835486B2 (en) 2015-07-07 2017-12-05 Hand Held Products, Inc. Mobile dimensioner apparatus for use in commerce
EP3396313B1 (en) 2015-07-15 2020-10-21 Hand Held Products, Inc. Mobile dimensioning method and device with dynamic accuracy compatible with nist standard
US10094650B2 (en) 2015-07-16 2018-10-09 Hand Held Products, Inc. Dimensioning and imaging items
US20170017301A1 (en) 2015-07-16 2017-01-19 Hand Held Products, Inc. Adjusting dimensioning results using augmented reality
EP3337624A4 (en) 2015-08-21 2019-10-30 Aprecia Pharmaceuticals LLC Three-dimensional printing system and equipment assembly
US10249030B2 (en) 2015-10-30 2019-04-02 Hand Held Products, Inc. Image transformation for indicia reading
US10757394B1 (en) 2015-11-09 2020-08-25 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US10812778B1 (en) 2015-11-09 2020-10-20 Cognex Corporation System and method for calibrating one or more 3D sensors mounted on a moving manipulator
US11562502B2 (en) 2015-11-09 2023-01-24 Cognex Corporation System and method for calibrating a plurality of 3D sensors with respect to a motion conveyance
US10225544B2 (en) 2015-11-19 2019-03-05 Hand Held Products, Inc. High resolution dot pattern
US10025314B2 (en) 2016-01-27 2018-07-17 Hand Held Products, Inc. Vehicle positioning and object avoidance
US10313622B2 (en) 2016-04-06 2019-06-04 Kla-Tencor Corporation Dual-column-parallel CCD sensor and inspection systems using a sensor
US10778925B2 (en) 2016-04-06 2020-09-15 Kla-Tencor Corporation Multiple column per channel CCD sensor architecture for inspection and metrology
US10217236B2 (en) 2016-04-08 2019-02-26 Orbital Insight, Inc. Remote determination of containers in geographical region
WO2017176487A1 (en) * 2016-04-08 2017-10-12 Orbital Insight, Inc. Remote determination of quantity stored in containers in geographical region
US10339352B2 (en) 2016-06-03 2019-07-02 Hand Held Products, Inc. Wearable metrological apparatus
US9940721B2 (en) 2016-06-10 2018-04-10 Hand Held Products, Inc. Scene change detection in a dimensioner
US10163216B2 (en) 2016-06-15 2018-12-25 Hand Held Products, Inc. Automatic mode switching in a volume dimensioner
US10380767B2 (en) * 2016-08-01 2019-08-13 Cognex Corporation System and method for automatic selection of 3D alignment algorithms in a vision system
WO2018035082A1 (en) * 2016-08-15 2018-02-22 Raptor Maps, Inc. Systems, devices, and methods for monitoring and assessing characteristics of harvested specialty crops
US10480935B2 (en) 2016-12-02 2019-11-19 Alliance For Sustainable Energy, Llc Thickness mapping using multispectral imaging
CN108180825B (en) * 2016-12-08 2019-07-26 中国科学院沈阳自动化研究所 A kind of identification of cuboid object dimensional and localization method based on line-structured light
US10909708B2 (en) 2016-12-09 2021-02-02 Hand Held Products, Inc. Calibrating a dimensioner using ratios of measurable parameters of optic ally-perceptible geometric elements
CN106595524A (en) * 2016-12-23 2017-04-26 北京主导时代科技有限公司 Method and apparatus for measuring the three-dimensional morphology of train wheel surface
US10175555B2 (en) 2017-01-03 2019-01-08 KLA—Tencor Corporation 183 nm CW laser and inspection system
JP6858878B2 (en) * 2017-02-28 2021-04-14 クオリティー ヴィジョン インターナショナル インコーポレイテッドＱｕａｌｉｔｙ Ｖｉｓｉｏｎ Ｉｎｔｅｒｎａｔｉｏｎａｌ， Ｉｎｃ． Automatic alignment of 3D model to test object
US11047672B2 (en) 2017-03-28 2021-06-29 Hand Held Products, Inc. System for optically dimensioning
JP6798388B2 (en) * 2017-03-29 2020-12-09 株式会社デンソー Welding position detection device for members and welding position detection method for members
EP3635771A4 (en) * 2017-06-08 2021-03-10 Rudolph Technologies, Inc. Wafer inspection system including a laser triangulation sensor
US20180364033A1 (en) * 2017-06-19 2018-12-20 Faro Technologies, Inc. Three-dimensional measurement device with color camera
US10733748B2 (en) 2017-07-24 2020-08-04 Hand Held Products, Inc. Dual-pattern optical 3D dimensioning
CN107270817A (en) * 2017-08-15 2017-10-20 深圳市威富智能设备有限公司 The screw mounting device and screw installation method of view-based access control model processing
JP6280281B1 (en) * 2017-10-18 2018-02-14 株式会社浅沼技研 Inspection master, reference member for inspection master, and measurement method for measuring the traceability of optical CMM
US10323930B1 (en) 2017-11-14 2019-06-18 Facebook Technologies, Llc Systems and methods for a movable structured light projector
JP6669714B2 (en) * 2017-11-28 2020-03-18 ファナック株式会社 Teaching operation panel and robot control system
FI129042B (en) 2017-12-15 2021-05-31 Oy Mapvision Ltd Machine vision system with a computer generated virtual reference object
CN107966102A (en) * 2018-01-18 2018-04-27 中山市鑫光智能系统有限公司 A kind of plate production six-face detection device
US10957072B2 (en) 2018-02-21 2021-03-23 Cognex Corporation System and method for simultaneous consideration of edges and normals in image features by a vision system
JP2019184380A (en) * 2018-04-09 2019-10-24 株式会社アドダイス Imaging device and inspection system using imaging device
DE102018206662A1 (en) * 2018-04-30 2019-10-31 Siemens Aktiengesellschaft Method for recognizing a component, computer program and computer-readable storage medium
US10584962B2 (en) 2018-05-01 2020-03-10 Hand Held Products, Inc System and method for validating physical-item security
CN110567397B (en) * 2018-06-05 2021-07-27 成都精工华耀科技有限公司 Fastener spring tongue separation detection method
US11114489B2 (en) 2018-06-18 2021-09-07 Kla-Tencor Corporation Back-illuminated sensor and a method of manufacturing a sensor
DE102018114725A1 (en) * 2018-06-19 2019-12-19 Carl Zeiss Industrielle Messtechnik Gmbh Calibration device and calibration method for an optical coordinate measuring machine
JP7064404B2 (en) * 2018-08-13 2022-05-10 株式会社キーエンス Optical displacement meter
TWI672107B (en) * 2018-08-29 2019-09-21 立普思股份有限公司 Production apparatus with depth image detection
US11114491B2 (en) 2018-12-12 2021-09-07 Kla Corporation Back-illuminated sensor and a method of manufacturing a sensor
US11639846B2 (en) 2019-09-27 2023-05-02 Honeywell International Inc. Dual-pattern optical 3D dimensioning
US11573138B2 (en) * 2020-01-08 2023-02-07 Zebra Technologies Corporation Doubly interlaced sensor array and method to support low power counting and identification
CN111429423B (en) * 2020-03-19 2022-04-08 南通大学 Multi-spectral welding image identification method based on quaternion multi-degree-of-freedom neurons
US11848350B2 (en) 2020-04-08 2023-12-19 Kla Corporation Back-illuminated sensor and a method of manufacturing a sensor using a silicon on insulator wafer
US20220080519A1 (en) * 2020-09-16 2022-03-17 T Bailey, Inc. Welding tracking and/or motion system, device and/or process
US11741758B2 (en) 2020-10-27 2023-08-29 General Inspection, Llc Inspection system for manufactured components
EP4001832A1 (en) * 2020-11-11 2022-05-25 Mike Giger Method for measuring a frame-shaped object
CN112347686B (en) * 2020-11-30 2024-03-26 中国运载火箭技术研究院 Bolt checking method of instrument mounting structure
CN112577445B (en) * 2020-12-18 2021-08-03 深圳市泽峰光电科技有限公司 Log end face profile extraction method of rotary grating
CN113375566B (en) * 2021-06-09 2023-09-08 江苏中科贯微自动化科技有限公司 Accurate measurement method and system for object size
CN115383850A (en) * 2022-09-20 2022-11-25 上海寰宇物流科技有限公司 Improved oil point nailing equipment applied to floor
CN116071357B (en) * 2023-03-07 2023-06-16 飞杨电源技术(深圳)有限公司 High-power charger surface defect detection method
CN117722954A (en) * 2024-02-07 2024-03-19 上海强华实业股份有限公司 System and method for detecting morphology and analyzing size of fine-burned product

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4842411A (en) * 1986-02-06 1989-06-27 Vectron, Inc. Method of automatically measuring the shape of a continuous surface
US5654800A (en) * 1994-05-19 1997-08-05 General Scanning Inc, Triangulation-based 3D imaging and processing method and system

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2714277B2 (en) * 1991-07-25 1998-02-16 株式会社東芝 Lead shape measuring device
JP2919284B2 (en) * 1994-02-23 1999-07-12 松下電工株式会社 Object recognition method
US5642293A (en) * 1996-06-03 1997-06-24 Camsys, Inc. Method and apparatus for determining surface profile and/or surface strain
US5862552A (en) * 1996-09-30 1999-01-26 Koelewyn; Robert W. Multi-purpose fishing pliers

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4842411A (en) * 1986-02-06 1989-06-27 Vectron, Inc. Method of automatically measuring the shape of a continuous surface
US5654800A (en) * 1994-05-19 1997-08-05 General Scanning Inc, Triangulation-based 3D imaging and processing method and system

Also Published As

Publication number Publication date
US6064759A (en) 2000-05-16
WO1998022860A2 (en) 1998-05-28
AU5174698A (en) 1998-06-10

Similar Documents

Publication Publication Date Title
WO1998022860A3 (en) Computer aided inspection machine
CA1238974A (en) Process, facility and method for controlling the time history of the feature of a zone or of a whole body
US5016099A (en) Process for determining the optical quality of flat glass or flat glass products
EP0849959A3 (en) Apparatus and method for displaying stereoscopic images
CA2113752A1 (en) Inspection System for Cross-Sectional Imaging
EP0709667A3 (en) Method of calibration for an apparatus for the measurement of cell object features
CA2561923A1 (en) Measuring apparatus and method in a distribution system
CA2579563A1 (en) Method and system for measuring the relief of an object
EP1571414A3 (en) Apparatus and method for surface contour measurement
WO1995015479B1 (en) Vehicle alignment system
CA2520559A1 (en) A method and apparatus for inspecting a tubular
CN106885622A (en) A kind of big visual field multiple spot three-dimensional vibrating measuring method
CN107271445B (en) Defect detection method and device
AU2003290602A1 (en) Method and apparatus for producing an electrical property image of substantially homogenous objects containing inhomogeneities
ATE473429T1 (en) METHOD AND DEVICE FOR ANALYZING THE THREE-DIMENSIONAL DISTRIBUTION OF A COMPONENT IN A PHARMACEUTICAL SAMPLE
CN111272099A (en) Surface structure light precision detection system for three-dimensional surface morphology of aero-engine blade
CN110044266A (en) Digital Photogrammetric System based on speckle projection
KR960011413A (en) Measurement method of light quantity of display pixel and inspection method and display device of display screen
DE69034142D1 (en) METHOD AND DEVICE FOR DETECTING AN OBJECT
EP0222346A2 (en) Method of measuring a sound pressure distribution in a solid body due to a ultrasonic probe by using photoelasticity
Patterson et al. High frequency quantitative photoelasticity applied to jet engine components
ATE187818T1 (en) METHOD FOR CORRELATION OF THREE-DIMENSIONAL MEASUREMENTS EXECUTED BY IMAGE CAPTURE SYSTEMS AND ARRANGEMENT FOR IMPLEMENTING THIS METHOD
JPH1073419A (en) Device for inspecting erroneous and missing parts mounted externally on engine
JPS57196377A (en) Pattern recognizing method
Heimonen et al. Experiments in 3D measurements by using single camera and accurate motion

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AL AM AT AU AZ BB BG BR BY CA CH CN CZ DE DK EE ES FI GB GE HU IL IS JP KE KG KP KR KZ LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK TJ TM TR TT UA UG US UZ VN

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN ML MR NE SN TD TG

DFPE Request for preliminary examination filed prior to expiration of 19th month from priority date (pct application filed before 20040101)
REG Reference to national code

Ref country code: DE

Ref legal event code: 8642

NENP Non-entry into the national phase

Ref country code: CA

AK Designated states

Kind code of ref document: A3

Designated state(s): AL AM AT AU AZ BB BG BR BY CA CH CN CZ DE DK EE ES FI GB GE HU IL IS JP KE KG KP KR KZ LK LR LS LT LU LV MD MG MK MN MW MX NO NZ PL PT RO RU SD SE SG SI SK TJ TM TR TT UA UG US UZ VN

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): AT BE CH DE DK ES FI FR GB GR IE IT LU MC NL PT SE BF BJ CF CG CI CM GA GN ML MR NE SN TD TG

122 Ep: pct application non-entry in european phase