WO1993026042A1 - Verfahren zur herstellung von halbleiterbauelementen in cmos-technik mit 'local interconnects' - Google Patents
Verfahren zur herstellung von halbleiterbauelementen in cmos-technik mit 'local interconnects' Download PDFInfo
- Publication number
- WO1993026042A1 WO1993026042A1 PCT/EP1993/001452 EP9301452W WO9326042A1 WO 1993026042 A1 WO1993026042 A1 WO 1993026042A1 EP 9301452 W EP9301452 W EP 9301452W WO 9326042 A1 WO9326042 A1 WO 9326042A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- metal
- titanium
- silicon
- silicide
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76886—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
- H01L21/76889—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances by forming silicides of refractory metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76895—Local interconnects; Local pads, as exemplified by patent document EP0896365
Definitions
- the invention relates to a method according to the preamble of claim 1.
- local interconnects are used to increase the packing density. This means the introduction of defined interconnects from e.g. Polysilicides after the source-drain implantation and before the deposition of an intermediate oxide layer. This results in buried contacts which enable a direct connection between the polysilicon layer and the active regions without a metal connection.
- the usual method for producing "local interconnects” (hereinafter referred to as LI) initially runs with the usual steps of CMOS production. After the source-drain implantation, thin layers of a heat-resistant metal such as e.g. Titanium and alpha-silicon sputtered in the form of a double layer. The alpha silicon is then appropriately structured in a photoprocess and annealed in a nitrogen atmosphere, so that wherever silicon and metal are in contact, the corresponding silicide is formed.
- a heat-resistant metal such as e.g. Titanium and alpha-silicon sputtered in the form of a double layer.
- the alpha silicon is then appropriately structured in a photoprocess and annealed in a nitrogen atmosphere, so that wherever silicon and metal are in contact, the corresponding silicide is formed.
- the unreacted metal and, in the case of titanium, any titanium nitride which may have formed are then removed by selective etching and the wafers are subjected to a second tempering process in the course of which the original C "'silicide is converted into the lower-resistance C54 silicide.
- the conventional CMOS is then used - Process continued with Silox- BPSG coating.
- the effectiveness of removing the alpha silicon from the gate corners by overetching essentially depends on the shape of the spacers which isolate the edges of the actual polysilicon gate.
- the shape of the spacer, and in particular its slope is generally subject to process fluctuations, so that the reliability of filament removal is not assured.
- Silicide formation during the first annealing is also a sensitive process for the non-LI regions, since it is determined by two competing reactions. If the heat-resistant metal is titanium, titanium nitride forms from the surface and from that
- CMOS process is first carried out until after p + diffusion (Fig. 1).
- the structure obtained in this way shows the substrate 1 with the source / drain regions 31, 32, the field oxide region 2, the gate oxide 22, the polysilicon layer 7 and the spacers 6.
- This structure is now made by a sputtered double layer made of titanium 4 and amorphous Alpha-Silicon 5 covered.
- the photoresist pattern 8 is then produced in a photoprocess, as a result of which the areas of the later "local interconnects" are determined (FIG. 2). Subsequently, the exposed silicon layer 5 is removed to the titanium layer by anisotropic etching (RIE) and then the etching mask (photoresist layer 8) is removed (FIG. 3).
- RIE anisotropic etching
- Annealing forms a layer 10 of titanium silicide at the points where the titanium layer 4 is in contact with silicon.
- the titanium nitride and excess titanium formed as a competitive reaction are selectively removed by etching and the silicide of the C49 configuration is converted into the lower-impedance of the C54 crystal structure in a second tempering process (FIG. 4).
- the standard CMOS process is then continued with the silox-boron-phosphor-silicate glass coating.
- the next step in the process is on the surface only sputtered on a titanium layer 4 (Fig. 6).
- oo Titanium silicide is then produced by annealing at 600-800 C in the areas where the metal is directly on
- a double layer of titanium 41 and amorphous alpha silicon 51 is now sputtered on, which in turn covers the entire surface of the component (FIG. 9).
- the LI areas are determined by means of a photo process, the remaining etching mask
- the reason for this is the desired decoupling of the production of the source / drain / gate silicide and that of the silicide for the LIs, but this is only an apparent disadvantage because one achieves them Way a whole lot of advantages.
- the layer thicknesses of the metal and alpha-silicon layers can be kept much thinner, since only the LI regions are made from them. This results in a significantly higher reliability in the manufacture of the components.
- the separation allows the low sheet resistance to be maintained in the salicide process, which is well known in semiconductor technology.
- the time for overetching the alpha silicon can be extended considerably and is nonetheless critical because the metal is no longer needed outside of the LI areas.
- the strong overetching ensures that the alpha silicon is completely removed, regardless of the shape of the spacers forming the gate edges.
- the metal layer for source / drain / gate silicide formation has to be provided. annealing, not going through other processes. (Photo process, stripping), which can interfere with the actual silicide formation.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93912923A EP0600063B2 (de) | 1992-06-15 | 1993-06-09 | Verfahren zur herstellung von halbleiterbauelementen in cmos-technik mit 'local interconnects' |
DE59307261T DE59307261D1 (de) | 1992-06-15 | 1993-06-09 | Verfahren zur herstellung von halbleiterbauelementen in cmos-technik mit 'local interconnects' |
JP50111194A JP3249524B2 (ja) | 1992-06-15 | 1993-06-09 | 局部相互接続によるcmos技術の半導体装置製造方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4219529A DE4219529C2 (de) | 1992-06-15 | 1992-06-15 | Verfahren zur Herstellung von Halbleiterbauelementen in CMOS-Technik mit "local interconnects" |
DEP4219529.2 | 1992-06-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1993026042A1 true WO1993026042A1 (de) | 1993-12-23 |
Family
ID=6461038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP1993/001452 WO1993026042A1 (de) | 1992-06-15 | 1993-06-09 | Verfahren zur herstellung von halbleiterbauelementen in cmos-technik mit 'local interconnects' |
Country Status (5)
Country | Link |
---|---|
US (1) | US5387535A (de) |
EP (1) | EP0600063B2 (de) |
JP (1) | JP3249524B2 (de) |
DE (2) | DE4219529C2 (de) |
WO (1) | WO1993026042A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19535101A1 (de) * | 1994-11-02 | 1996-05-09 | Mitsubishi Electric Corp | Verfahren zum Bilden einer lokalen Verbindung |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5589417A (en) * | 1993-01-12 | 1996-12-31 | Texas Instruments, Incorporated | TiSi2 /TiN clad interconnect technology |
US5482895A (en) * | 1993-08-26 | 1996-01-09 | Fujitsu Limited | Method of manufacturing semiconductor devices having silicide electrodes |
US5635426A (en) * | 1993-08-26 | 1997-06-03 | Fujitsu Limited | Method of making a semiconductor device having a silicide local interconnect |
JP2677168B2 (ja) * | 1993-09-17 | 1997-11-17 | 日本電気株式会社 | 半導体装置の製造方法 |
US5849634A (en) * | 1994-04-15 | 1998-12-15 | Sharp Kk | Method of forming silicide film on silicon with oxygen concentration below 1018 /cm3 |
JP2630290B2 (ja) * | 1995-01-30 | 1997-07-16 | 日本電気株式会社 | 半導体装置の製造方法 |
KR960042947A (ko) * | 1995-05-09 | 1996-12-21 | 김주용 | 고집적 반도체 소자 및 그 국부 연결 방법 |
US5780362A (en) * | 1996-06-04 | 1998-07-14 | Wang; Qingfeng | CoSi2 salicide method |
US5945350A (en) * | 1996-09-13 | 1999-08-31 | Micron Technology, Inc. | Methods for use in formation of titanium nitride interconnects and interconnects formed using same |
US5830775A (en) * | 1996-11-26 | 1998-11-03 | Sharp Microelectronics Technology, Inc. | Raised silicided source/drain electrode formation with reduced substrate silicon consumption |
JPH10189483A (ja) * | 1996-12-26 | 1998-07-21 | Fujitsu Ltd | 半導体装置の製造方法及び半導体装置 |
KR100440075B1 (ko) * | 1996-12-31 | 2004-10-08 | 주식회사 하이닉스반도체 | 반도체소자의트랜지스터제조방법 |
US6153452A (en) * | 1997-01-07 | 2000-11-28 | Lucent Technologies Inc. | Method of manufacturing semiconductor devices having improved polycide integrity through introduction of a silicon layer within the polycide structure |
US6221766B1 (en) | 1997-01-24 | 2001-04-24 | Steag Rtp Systems, Inc. | Method and apparatus for processing refractory metals on semiconductor substrates |
TW329553B (en) * | 1997-02-04 | 1998-04-11 | Winbond Electronics Corp | The semiconductor manufacturing process for two-step salicide |
US6458711B1 (en) * | 1997-03-20 | 2002-10-01 | Texas Instruments Incorporated | Self-aligned silicide process |
US6562724B1 (en) * | 1997-06-09 | 2003-05-13 | Texas Instruments Incorporated | Self-aligned stack formation |
KR100247933B1 (ko) | 1997-08-22 | 2000-03-15 | 윤종용 | 버티드 콘택을 갖는 반도체 소자 및 그 제조방법 |
US6060404A (en) * | 1997-09-05 | 2000-05-09 | Advanced Micro Devices, Inc. | In-situ deposition of stop layer and dielectric layer during formation of local interconnects |
US6153933A (en) * | 1997-09-05 | 2000-11-28 | Advanced Micro Devices, Inc. | Elimination of residual materials in a multiple-layer interconnect structure |
US6060328A (en) | 1997-09-05 | 2000-05-09 | Advanced Micro Devices, Inc. | Methods and arrangements for determining an endpoint for an in-situ local interconnect etching process |
US5920796A (en) * | 1997-09-05 | 1999-07-06 | Advanced Micro Devices, Inc. | In-situ etch of BARC layer during formation of local interconnects |
US6114235A (en) * | 1997-09-05 | 2000-09-05 | Advanced Micro Devices, Inc. | Multipurpose cap layer dielectric |
TW368731B (en) * | 1997-12-22 | 1999-09-01 | United Microelectronics Corp | Manufacturing method for self-aligned local-interconnect and contact |
US6156615A (en) * | 1998-09-30 | 2000-12-05 | Advanced Micro Devices, Inc. | Method for decreasing the contact resistance of silicide contacts by retrograde implantation of source/drain regions |
US6429124B1 (en) * | 1999-04-14 | 2002-08-06 | Micron Technology, Inc. | Local interconnect structures for integrated circuits and methods for making the same |
US6372668B2 (en) | 2000-01-18 | 2002-04-16 | Advanced Micro Devices, Inc. | Method of forming silicon oxynitride films |
US6365512B1 (en) * | 2000-06-21 | 2002-04-02 | Infineon Technologies Ag | Method and apparatus for a direct buried strap for same level contact interconnections for semiconductor devices |
US6765269B2 (en) * | 2001-01-26 | 2004-07-20 | Integrated Device Technology, Inc. | Conformal surface silicide strap on spacer and method of making same |
KR100465876B1 (ko) * | 2002-07-25 | 2005-01-13 | 삼성전자주식회사 | 반도체 소자 실리사이드 배선 형성방법 |
US20080251878A1 (en) * | 2007-04-13 | 2008-10-16 | International Business Machines Corporation | Structure incorporating semiconductor device structures for use in sram devices |
US20080251934A1 (en) * | 2007-04-13 | 2008-10-16 | Jack Allan Mandelman | Semiconductor Device Structures and Methods of Fabricating Semiconductor Device Structures for Use in SRAM Devices |
CN109980011A (zh) * | 2017-12-28 | 2019-07-05 | 无锡华润上华科技有限公司 | 一种半导体器件及其制作方法 |
CN111092123A (zh) * | 2019-12-10 | 2020-05-01 | 杰华特微电子(杭州)有限公司 | 横向双扩散晶体管及其制造方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0499855A2 (de) * | 1991-02-21 | 1992-08-26 | Texas Instruments Incorporated | Verfahren und Struktur für mikroelektronische Anordnung mit niedrigen Widerstandsbrücken zwischen leitenden Zonen |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4873204A (en) * | 1984-06-15 | 1989-10-10 | Hewlett-Packard Company | Method for making silicide interconnection structures for integrated circuit devices |
US5010032A (en) * | 1985-05-01 | 1991-04-23 | Texas Instruments Incorporated | Process for making CMOS device with both P+ and N+ gates including refractory metal silicide and nitride interconnects |
US4876213A (en) * | 1988-10-31 | 1989-10-24 | Motorola, Inc. | Salicided source/drain structure |
US5023201A (en) * | 1990-08-30 | 1991-06-11 | Cornell Research Foundation, Inc. | Selective deposition of tungsten on TiSi2 |
-
1992
- 1992-06-15 DE DE4219529A patent/DE4219529C2/de not_active Expired - Fee Related
-
1993
- 1993-06-09 JP JP50111194A patent/JP3249524B2/ja not_active Expired - Fee Related
- 1993-06-09 DE DE59307261T patent/DE59307261D1/de not_active Expired - Lifetime
- 1993-06-09 EP EP93912923A patent/EP0600063B2/de not_active Expired - Lifetime
- 1993-06-09 WO PCT/EP1993/001452 patent/WO1993026042A1/de active IP Right Grant
-
1994
- 1994-02-14 US US08/196,060 patent/US5387535A/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0499855A2 (de) * | 1991-02-21 | 1992-08-26 | Texas Instruments Incorporated | Verfahren und Struktur für mikroelektronische Anordnung mit niedrigen Widerstandsbrücken zwischen leitenden Zonen |
Non-Patent Citations (1)
Title |
---|
ESSDERC 1989, BERLIN Seiten 903 - 906 M.G.PITT ET AL. 'ELECTRICAL CHARACTERIZATION OF SUBMICRON TITANIUM SILICON LOCAL INTERCONNECT TECHNOLOGIE' in der Anmeldung erwähnt * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19535101A1 (de) * | 1994-11-02 | 1996-05-09 | Mitsubishi Electric Corp | Verfahren zum Bilden einer lokalen Verbindung |
Also Published As
Publication number | Publication date |
---|---|
JPH07501426A (ja) | 1995-02-09 |
DE4219529C2 (de) | 1994-05-26 |
JP3249524B2 (ja) | 2002-01-21 |
EP0600063B1 (de) | 1997-09-03 |
EP0600063B2 (de) | 2002-07-10 |
EP0600063A1 (de) | 1994-06-08 |
US5387535A (en) | 1995-02-07 |
DE59307261D1 (de) | 1997-10-09 |
DE4219529A1 (de) | 1993-12-16 |
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