WO1992021204A3 - Customizable timing and control asic for electronic imaging - Google Patents

Customizable timing and control asic for electronic imaging Download PDF

Info

Publication number
WO1992021204A3
WO1992021204A3 PCT/US1992/003745 US9203745W WO9221204A3 WO 1992021204 A3 WO1992021204 A3 WO 1992021204A3 US 9203745 W US9203745 W US 9203745W WO 9221204 A3 WO9221204 A3 WO 9221204A3
Authority
WO
WIPO (PCT)
Prior art keywords
timing
customizable
electronic imaging
control asic
asic
Prior art date
Application number
PCT/US1992/003745
Other languages
French (fr)
Other versions
WO1992021204A2 (en
Inventor
John A Vincent
Luna Lionel J D
William A Cook
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of WO1992021204A2 publication Critical patent/WO1992021204A2/en
Publication of WO1992021204A3 publication Critical patent/WO1992021204A3/en

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/745Circuitry for generating timing or clock signals

Abstract

An application-specific integrated circuit (ASIC) that is programmable for provision of timing and control of imaging signals, including genlock and defect correction functions. These features may be customized by a VIA mask change, thus allowing the basic device architecture to be fabricated in advance.
PCT/US1992/003745 1991-05-10 1992-05-06 Customizable timing and control asic for electronic imaging WO1992021204A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US698,755 1976-06-22
US69875591A 1991-05-10 1991-05-10

Publications (2)

Publication Number Publication Date
WO1992021204A2 WO1992021204A2 (en) 1992-11-26
WO1992021204A3 true WO1992021204A3 (en) 1993-01-07

Family

ID=24806539

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1992/003745 WO1992021204A2 (en) 1991-05-10 1992-05-06 Customizable timing and control asic for electronic imaging

Country Status (4)

Country Link
US (1) US5436659A (en)
EP (1) EP0543980A1 (en)
JP (1) JPH05508529A (en)
WO (1) WO1992021204A2 (en)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR960003298A (en) * 1994-06-02 1996-01-26 이헌조 Method and device for image tube defect compensation of camcorder
US5634044A (en) * 1994-07-29 1997-05-27 Pitney Bowes Inc. Charge coupled device control module
US6509927B1 (en) * 1994-12-16 2003-01-21 Hyundai Electronics America Inc. Programmably addressable image sensor
EP0720125B1 (en) * 1994-12-29 2002-05-08 Koninklijke Philips Electronics N.V. Image forming apparatus and method for correcting optical geometrical distortions in an image
US5990939A (en) * 1995-09-28 1999-11-23 Raytheon Company Video demultiplexing interface for a missile tracking system
JPH09200613A (en) * 1996-01-19 1997-07-31 Sony Corp Defect detector for solid-stage imaging device
JP3785520B2 (en) * 1997-03-19 2006-06-14 コニカミノルタホールディングス株式会社 Electronic camera
US6285399B1 (en) * 1997-07-09 2001-09-04 Flashpoint, Technology, Inc. System and method for generating timing signals in an electronic imaging device
US5973734A (en) 1997-07-09 1999-10-26 Flashpoint Technology, Inc. Method and apparatus for correcting aspect ratio in a camera graphical user interface
US6396539B1 (en) * 1998-02-27 2002-05-28 Intel Corporation CMOS imaging device with integrated defective pixel correction circuitry
US6665009B1 (en) * 1998-05-20 2003-12-16 Omnivision Technologies, Inc. On-chip dead pixel correction in a CMOS imaging sensor
WO2000019712A1 (en) * 1998-09-30 2000-04-06 Infineon Technologies Ag Method and device for correcting defective pixels of an image sensor
US6317141B1 (en) 1998-12-31 2001-11-13 Flashpoint Technology, Inc. Method and apparatus for editing heterogeneous media objects in a digital imaging device
JP3532781B2 (en) * 1999-02-12 2004-05-31 株式会社メガチップス Image processing circuit of image input device
WO2000049812A1 (en) * 1999-02-19 2000-08-24 Sony Corporation Image signal processor, image signal processing method, learning device, learning method, and recorded medium
US6819358B1 (en) * 1999-04-26 2004-11-16 Microsoft Corporation Error calibration for digital image sensors and apparatus using the same
US6693668B1 (en) * 1999-06-04 2004-02-17 Canon Kabushiki Kaisha Self-diagnostic image sensor
US6995794B2 (en) * 1999-06-30 2006-02-07 Logitech Europe S.A. Video camera with major functions implemented in host software
US7126631B1 (en) * 1999-06-30 2006-10-24 Intel Corporation Sensing with defective cell detection
WO2001001675A2 (en) * 1999-06-30 2001-01-04 Logitech, Inc. Video camera with major functions implemented in host software
US7009644B1 (en) 1999-12-15 2006-03-07 Logitech Europe S.A. Dynamic anomalous pixel detection and correction
US7065140B1 (en) * 1999-10-06 2006-06-20 Fairchild Semiconductor Corporation Method and apparatus for receiving video signals from a plurality of video cameras
JP3773773B2 (en) * 1999-10-27 2006-05-10 三洋電機株式会社 Image signal processing apparatus and pixel defect detection method
US6526366B1 (en) * 2000-05-18 2003-02-25 Intel Corporation Imaging sensor defect map storage
US6768512B1 (en) * 2000-07-12 2004-07-27 Vanguard International Semiconductor Corp. Method of bad pixel correction
US7006136B1 (en) * 2000-07-12 2006-02-28 Vanguard International Semiconductor Corp. Method of defective pixel address detection for image sensors
US7224484B1 (en) * 2000-10-04 2007-05-29 Reeves Gerald J Scanner calibration with dead pixel compensation
DE10122876C2 (en) * 2000-11-24 2003-08-21 Siemens Ag Method for operating an image system of an imaging medical examination device and medical examination device
US6741754B2 (en) * 2001-02-19 2004-05-25 Eastman Kodak Company Correcting for defects in a digital image taken by an image sensor caused by pre-existing defects in two pixels in adjacent columns of an image sensor
US6900836B2 (en) 2001-02-19 2005-05-31 Eastman Kodak Company Correcting defects in a digital image caused by a pre-existing defect in a pixel of an image sensor
EP1724837B1 (en) 2005-05-19 2009-09-02 STMicroelectronics (Research & Development) Limited Image sensor
EP1725018B1 (en) 2005-05-19 2013-08-28 STMicroelectronics (Research & Development) Limited Image sensor
US9224145B1 (en) 2006-08-30 2015-12-29 Qurio Holdings, Inc. Venue based digital rights using capture device with digital watermarking capability
JP4909847B2 (en) * 2006-09-29 2012-04-04 株式会社日立製作所 Nuclear medicine diagnostic equipment
US7649555B2 (en) * 2006-10-02 2010-01-19 Mtekvision Co., Ltd. Apparatus for processing dead pixel
US7800661B2 (en) * 2006-12-22 2010-09-21 Qualcomm Incorporated Programmable pattern matching device
US8504865B2 (en) * 2007-04-20 2013-08-06 Easic Corporation Dynamic phase alignment
US7763861B1 (en) * 2007-10-23 2010-07-27 Xilinx, Inc. Determining a characteristic of atomic particles affecting a programmable logic device
KR102575281B1 (en) * 2016-10-14 2023-09-06 한화비전 주식회사 Apparatus for writing information on defect pixels, apparatus for correcting defect pixels, and method thereof
US10582143B2 (en) * 2017-05-29 2020-03-03 Imec Vzw Programmable state machine

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4399464A (en) * 1981-05-04 1983-08-16 General Dynamics, Pomona Division Signal processor for an array of CID radiation detector elements
EP0266065A2 (en) * 1986-09-30 1988-05-04 Texas Instruments Incorporated Programmable sequence generator
US4922137A (en) * 1988-05-17 1990-05-01 Eastman Kodak Company Programmable sequence generator

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6034872B2 (en) * 1977-01-28 1985-08-10 ソニー株式会社 Noise removal circuit for solid-state imaging devices
US4484230A (en) * 1981-02-04 1984-11-20 Crosfield Electronics Limited Image reproduction method and apparatus
US4805023A (en) * 1985-10-15 1989-02-14 Texas Instruments Incorporated Programmable CCD imager defect compensator
JPH072495B2 (en) * 1985-10-25 1995-01-18 株式会社石田衡器製作所 Label sticker
JPH0797838B2 (en) * 1986-09-30 1995-10-18 キヤノン株式会社 Imaging device
DE3636077C2 (en) * 1986-10-23 1993-10-07 Broadcast Television Syst Method for masking errors in a video signal and circuit for carrying out the method
JP2565260B2 (en) * 1987-10-17 1996-12-18 ソニー株式会社 Image defect correction device for solid-state imaging device
US5047863A (en) * 1990-05-24 1991-09-10 Polaroid Corporation Defect correction apparatus for solid state imaging devices including inoperative pixel detection

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4399464A (en) * 1981-05-04 1983-08-16 General Dynamics, Pomona Division Signal processor for an array of CID radiation detector elements
EP0266065A2 (en) * 1986-09-30 1988-05-04 Texas Instruments Incorporated Programmable sequence generator
US4922137A (en) * 1988-05-17 1990-05-01 Eastman Kodak Company Programmable sequence generator

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
ARNOLD R., FLEGEL W., PFERNER D.: "INTEGRIERTE ANSTEUERSCHALTUNG U 2200 PC.", RFE RADIO FERNSEHEN ELEKTRONIK., HUSS MEDIEN GMBH, BERLIN., DE, vol. 39., no. 04., 1 January 1990 (1990-01-01), DE, pages 207 - 211., XP000127900, ISSN: 1436-1574 *
IBM TECHNICAL DISCLOSURE BULLETIN vol. 19, no. 6, November 1976, NEW YORK pages 2144 - 2145 GREENSPAN ET AL 'PROGRAM LOGIC ARRAY WITH METAL LEVEL PERSONALIZATION' *
IEEE PROCEEDINGS OF CICC 84 May 1984, NEW YORK pages 70 - 75 ANDREWS ET AL 'CUSTOM CIRCUITS MINIMIZE CCD CAMERA POWER AND SPACE REQUIREMENTS' *
IEEE PROCEEDINGS OF CICC 88 TECHNICAL DIGEST May 1988, NEW YORK pages 15.6.1 - 15.6.4 BROWN ET AL 'THE EBS-1 AN EPROM BASED-SEQUENCER ASIC' *

Also Published As

Publication number Publication date
JPH05508529A (en) 1993-11-25
US5436659A (en) 1995-07-25
WO1992021204A2 (en) 1992-11-26
EP0543980A1 (en) 1993-06-02

Similar Documents

Publication Publication Date Title
WO1992021204A3 (en) Customizable timing and control asic for electronic imaging
AU7106191A (en) Digital clock buffer circuit providing controllable delay
SG81197A1 (en) An image defect correcting circuit for a solid state imager
JPS5373915A (en) Noise eliminating circuit for solid image pickup unit
EP0540119A3 (en) Monolithic digital phaselock loop circuit
JPS5394117A (en) Noise elimination circuit for solid state pickup device
JPS56112673A (en) Correcting device for display in electronic watch
JPS5388517A (en) Noise eliminating circuit of solid state pickup device
GB2350979A (en) Analog-to-digital converter circuit
JPS5424532A (en) Reception unit for still picture signal
JPS5639525A (en) Exposure control circuit of camera
GB2240907B (en) Digital signal time difference correcting circuit
JPS56137776A (en) Ghost eliminating device
EP0364230A3 (en) A colour video signal processing apparatus
EP0449370A3 (en) Circuit arrangement for steepening signal edges
JPS5522108A (en) Corrector for electronic watch
JPS5472949A (en) Multiplexer circuit
JPS5622261A (en) Correction circuit for position signal
JPS5767391A (en) Solid image pickup device
JPS57107688A (en) Sampling pulse correcting system
JPS5417770A (en) Electronic watch with alarm
JPS5348613A (en) Picture quality control circuit for video signal
JPS5661091A (en) Dc correcting circuit for charge transfer element
JPS5275215A (en) Pick up tube
EP0496277A3 (en) Output stage for a digital circuit

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): JP

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): AT BE CH DE DK ES FR GB GR IT LU MC NL SE

AK Designated states

Kind code of ref document: A3

Designated state(s): JP

AL Designated countries for regional patents

Kind code of ref document: A3

Designated state(s): AT BE CH DE DK ES FR GB GR IT LU MC NL SE

WWE Wipo information: entry into national phase

Ref document number: 1992913038

Country of ref document: EP

WWP Wipo information: published in national office

Ref document number: 1992913038

Country of ref document: EP

WWW Wipo information: withdrawn in national office

Ref document number: 1992913038

Country of ref document: EP