WO1987004861A1 - Light detector - Google Patents
Light detector Download PDFInfo
- Publication number
- WO1987004861A1 WO1987004861A1 PCT/GB1987/000060 GB8700060W WO8704861A1 WO 1987004861 A1 WO1987004861 A1 WO 1987004861A1 GB 8700060 W GB8700060 W GB 8700060W WO 8704861 A1 WO8704861 A1 WO 8704861A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- detector
- light
- incident
- incidence
- angle
- Prior art date
Links
- 230000004888 barrier function Effects 0.000 claims abstract description 24
- 239000006185 dispersion Substances 0.000 claims abstract description 12
- 238000005316 response function Methods 0.000 claims abstract description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 229910052710 silicon Inorganic materials 0.000 claims description 5
- 239000010703 silicon Substances 0.000 claims description 5
- 239000000758 substrate Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 claims 2
- 238000010276 construction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000002301 combined effect Effects 0.000 description 1
- 206010053219 non-alcoholic steatohepatitis Diseases 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by at least one potential-jump barrier or surface barrier, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/102—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier
- H01L31/108—Devices sensitive to infrared, visible or ultraviolet radiation characterised by only one potential barrier or surface barrier the potential barrier being of the Schottky type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02363—Special surface textures of the semiconductor body itself, e.g. textured active layers
Definitions
- This invention concerns light detectors and is particularly concerned with the design of a wideband detector capable of responding to light over a range of wavelengths.
- a preferred form of photodetector is a Schottky barrier device. It is known to profile the surface of such devices with the result that the device exhibits a peak response as a function of the angle of incidence and wavelength of the incident light.
- the advantage of a Schottky barrier detector having a profiled surface is the high speed of response, combi ned with the ease of fabrication.
- the response bandwidth for a given angle of incidence is very narrow typically 5-50 nm, and it is an object of the present invention to provide a design of such a device which posseses a greater response bandwidth.
- a photodetector comprises :
- a blazed diffraction grating which will efficiently diffract the first diffracted order of light incident thereon, and whose dispersion is chosen to compensate for the variation in angle of incidence with wavelength of the response peak of the detector
- the resulting combination of blazed diffraction grating and Schottky barrier detector will have a high response to any input light where wavelengh is within the range of compensation provided by the dispersion of the grating. By careful choice of the dispersion, so the bandwidth of the combination can be controlled.
- Figure 1 shows a typical profiled Schottky barrier detector construction, with light incident thereon
- Figure 2 is a graphical representation of the response of such a device to change of wavelength and angle of incidence
- Figure 3 shows diagrammatically an arrangement of grating and detector in accordance with the invention.
- Figure 2 shows the detector response against changing wavelength for two different angles of incidence A1 and A2.
- the curve 16 shows the response for the angle of incidence A1 and curve 18 that of an angle of incidence A2.
- Figure 3 shows an arrangement of blazed grating 20 and detector 22 (which typically comprises a silicon substrate having a profiled upper surface which is coated by a thin metal layer, as shown in Figure 1.
- the dispersion characteristic of the blazed grating is such that first order diffracted light is efficiently diffracted towards the detector at varying angles so that the angle of incidence, according to wavelength, is such as is necessary to produce a peak response in the detector, for each wavelength concerned, so a range of wavelengths of light incident on the grating 20 wil l produce peak responses in the detector 22.
- two components 24, 26 of light of wavelength L1 and L2 are shown arriving in parallel at the grating 20 and thereafter are seen to diverge at 28 and 30 respectively to be incident on the detector 22 at different angles of incidence A1 and A2 respectively. Where there are the correct angles of incidence for those wavelengths, a peak response is obtained from the detector for both.
- the blazed grating will treat all wavelengths intermediate L1 and L2 in a similar manner, and cause differing divergencies and therefore differing angles of incidence in the detector, so a peak level of response can be obtained for all the wavelengths concerned.
- a photodetector which comprises a surface-profiled Schottky barrier detector (22) having a peak response which is function of wavelength and of angle of incidence, and a blazed diffraction grating (20) positioned in front of the barri detector and having its dispersion selected so that its first order of diffracted light is incident on the barrier detector wit an angle of incidence (Al, A2) which so varies as substantially to compensate for the peak response function of the barri detector, thereby to produce a peak response from the barrier detector throughout a range of wavelengths. In this way, t bandwidth of the photodector can be controlled.
- This invention concerns light detectors and is particularly concerned with the design of a wideband detector capable of responding to light over a range of wavelengths.
- a preferred form of photodetector is a Schottky barrier device. It is known to profile the surface of such devices with the result that the device exhibits a peak response as a function of the angle of incidence and wavelength of the incident light.
- the advantage of a Schottky barrier detector having a profiled surface is the high speed of response, combined with the ease of fabrication.
- the response bandwidth for a given angle of incidence is very narrow - typically 5-50 nm, and it is an object of the present invention to provide a design of such a device which posseses a greater response bandwidth.
- a photodetector comprises:
- a blazed diffraction grating which will efficiently diffract the first diffracted order of light incident thereon, and whose dispersion is chosen to compensate for the variation in angle of incidence with wavelength of the response peak of the detector
- the resulting combination of blazed diffraction grating and Schottky barrier detector will have a high response to any input light where wavelengh is within the range of compensation provided by the dispersion of the grating. By careful choice of the dispersion, so the bandwidth of the combination can be controlled.
- Figure 1 shows a typical profiled Schottky barrier detector construction, with light incident thereon
- Figure 2 is a graphical representation of the response of such a device to change of wavelength and angle of incidence
- Figure 3 shows diagrammatically an arrangement of grating and detector in accordance with the invention.
- Figure 2 shows the detector response against changing wavelength for two different angles of incidence A1 and A2.
- the curve 16 shows the response for the angle of incidence A1 and curve 18 that of an angle of incidence A2.
- Figure 3 shows an arrangement of blazed grating 20 and detector 22 (which typically comprises a silicon substrate having a profiled upper surface which is coated by a thin metal layer, as shown in Figure 1.
- detector 22 which typically comprises a silicon substrate having a profiled upper surface which is coated by a thin metal layer, as shown in Figure 1.
- two components 24, 26 of light of wavelength L1 and L2 are shown arriving in parallel at the grating 20 and thereafter are seen to diverge at 28 and 30 respectively to be incident on the detector 22 at different angles of incidence A1 and A2 respectively. Where there are the correct angles of incidence for those wavelengths, a peak response. is obtained from the detector for both.
- the blazed grating will treat all wavelengths intermediate L1 and L2 in a similar manner, and cause differing divergencies and therefore differing angles of incidence in the detector, so a peak level of response can be obtained for all the wavelengths concerned.
Abstract
Description
Claims
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB8602525 | 1986-02-01 | ||
GB08602525A GB2186074A (en) | 1986-02-01 | 1986-02-01 | Photodetector with associated diffraction grating |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1987004861A1 true WO1987004861A1 (en) | 1987-08-13 |
Family
ID=10592389
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/GB1987/000060 WO1987004861A1 (en) | 1986-02-01 | 1987-01-29 | Light detector |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0256074A1 (en) |
JP (1) | JPS63502631A (en) |
GB (1) | GB2186074A (en) |
WO (1) | WO1987004861A1 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5080725A (en) * | 1987-12-17 | 1992-01-14 | Unisearch Limited | Optical properties of solar cells using tilted geometrical features |
US6076565A (en) * | 1997-08-08 | 2000-06-20 | Theodore Sweeney & Company | Adhesive fastener and method |
US6012888A (en) * | 1997-08-08 | 2000-01-11 | Theodore Sweeney & Co. | Adhesive fastener and method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4343532A (en) * | 1980-06-16 | 1982-08-10 | General Dynamics, Pomona Division | Dual directional wavelength demultiplexer |
GB2131229A (en) * | 1982-11-30 | 1984-06-13 | Western Electric Co | Photodetector |
-
1986
- 1986-02-01 GB GB08602525A patent/GB2186074A/en not_active Withdrawn
-
1987
- 1987-01-29 JP JP62500985A patent/JPS63502631A/en active Pending
- 1987-01-29 EP EP87901071A patent/EP0256074A1/en not_active Withdrawn
- 1987-01-29 WO PCT/GB1987/000060 patent/WO1987004861A1/en not_active Application Discontinuation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4343532A (en) * | 1980-06-16 | 1982-08-10 | General Dynamics, Pomona Division | Dual directional wavelength demultiplexer |
GB2131229A (en) * | 1982-11-30 | 1984-06-13 | Western Electric Co | Photodetector |
Non-Patent Citations (2)
Title |
---|
Applied Physics Letters, Volume 46, No. 10, 15 May 1985 (Woodbury, N.Y., US), S.R.J. BRUECK et al.: "Enhanced Quantum Efficiency Internal Photoemission Detectors by Grating Coupling to Surface Plasma Waves", pages 915-917 see the whole document * |
Electronics Letters, Volume 17, No. 20, October 1981, (London, GB), H. SAKAKI et al.: "New Optical Heterodyne Detector with Integrated Diffraction Grating", see pages 727-729 * |
Also Published As
Publication number | Publication date |
---|---|
EP0256074A1 (en) | 1988-02-24 |
JPS63502631A (en) | 1988-09-29 |
GB8602525D0 (en) | 1986-03-05 |
GB2186074A (en) | 1987-08-05 |
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