WO1986007149A1 - Optischer sensor zum selektiven nachweis von substanzen und zum nachweis von brechzahländerungen in messubstanzen - Google Patents
Optischer sensor zum selektiven nachweis von substanzen und zum nachweis von brechzahländerungen in messubstanzen Download PDFInfo
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- WO1986007149A1 WO1986007149A1 PCT/CH1986/000072 CH8600072W WO8607149A1 WO 1986007149 A1 WO1986007149 A1 WO 1986007149A1 CH 8600072 W CH8600072 W CH 8600072W WO 8607149 A1 WO8607149 A1 WO 8607149A1
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- optical sensor
- wave
- sensor according
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- refractive index
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
- G01N21/774—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure
- G01N21/7743—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure the reagent-coated grating coupling light in or out of the waveguide
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N21/431—Dip refractometers, e.g. using optical fibres
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/12007—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind forming wavelength selective elements, e.g. multiplexer, demultiplexer
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
- G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
- G02B6/122—Basic optical elements, e.g. light-guiding paths
- G02B6/124—Geodesic lenses or integrated gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N2021/436—Sensing resonant reflection
- G01N2021/437—Sensing resonant reflection with investigation of angle
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/34—Optical coupling means utilising prism or grating
Definitions
- Optical sensor for the selective detection of substances and for the detection of changes in refractive index in measurement substances.
- the present invention relates to an optical sensor according to the preamble of claim 1.
- a known device for detecting changes in refractive index in liquids, solids and porous measuring substances is the refractometer, which determines the total reflection angle between two media, the reference medium consisting of a highly refractive prism, the refractive index of which is known.
- a well-known device for the detection of chemisorbate layers or chemically bound layers on surfaces is the egg lipometer, which shows the state of polarization of the chemisorbate layer. reflected light analyzed (see R. Azzam et al., Physics in Medicine and Biology 22 (1977) 422-430, PA Cuypers et al., Analytical Biochemistry 84 (1978), 56-67).
- the invention solves the problem of creating an optical sensor which has one or more of the following characteristic properties
- FIG. 1 shows a schematic illustration of the basic elements of the invention, a waveguiding structure located on the surface of a substrate, which is shown in the figures as a planar waveguiding film, with a diffraction grating and optionally with a diffraction grating Additional layer is provided,
- FIG. 2 shows a measuring device according to the invention with a
- FIG. 3 shows a measuring device according to the invention with a
- FIG. 4 shows a measuring device according to the invention with a
- FIG. 5 shows an expanded schematic illustration of the basic elements of the invention, the waveguiding structure being covered with a protective layer outside the lattice region,
- FIG. 6 shows an expanded schematic illustration of the basic elements of the invention, a membrane being located between the measuring substance and the wave-guiding structure, with or without an additional layer, which membrane is optionally attached to a cuvette,
- FIG. 7 shows a device according to the invention for indirect measurement of the intensity of the guided light wave, the scattered light generated by the guided light wave being collected with a fiber optic and fed to a detector
- FIG. 8 a device according to the invention for indirect measurement of the intensity of the guided light wave, the intensity one or more non-coupled diffraction orders is measured.
- the basic component of the integrated optics is the wave-guiding structure, in particular the planar waveguide.
- This consists of a thin dielectric layer, which is located on a substrate. Coupled laser light can be guided through total reflection in this thin layer.
- the propagation speed of such a guided light wave (hereinafter referred to as "mode") is c / N, where c is the speed of light in a vacuum and N is the effective refractive index of the mode guided in the waveguide.
- the effective refractive index N is determined on the one hand by the configuration of the waveguide (layer thickness and refractive index of the thin waveguiding layer and refractive index of the substrate) and on the other hand by the refractive index of the medium adjacent to the thin waveguiding layer.
- Optical waveguiding can be effected not only in a thin planar layer but also in other waveguiding structures, in particular in strip waveguides in which the waveguiding structure is in the form of a strip-shaped film.
- a thin additional layer can be applied to the wave-guiding layer (or between it and the substrate) without the wave-guiding properties of the layer system being completely destroyed.
- An essential effect for the mode of operation of the sensor is that a change in the effective refractive index N is caused by a change in the to the wave-guiding layer (with or without an additional layer) adjacent medium and / or by a change in the refractive index (and / or the optical absorption) and / or the thickness of the waveguiding layer itself or an adjoining additional layer, these changes being caused by molecules of the substance to be detected via adsorption, desorption, or Chemisorption processes or chemical reactions are effected.
- the wave-guiding layer which may optionally be covered with an additional layer
- a suitable membrane which prevents impurities, in particular particles, present in the measuring substance from contacting the wave-guiding layer ' come and disturb the measurement.
- the selectivity in the detection of a specific substance contained in a measuring substance is achieved by one of the following two measures or by a combination thereof:
- a suitable choice of the additional layer has the effect that the substance to be detected is preferably physisorbed or chemisorbed inside or on the surface of the additional layer or triggers chemical reactions and / or the desorption of certain parts of the additional layer.
- the principle of the sensor is based on the fact that changes in the effective refractive index can be detected with a diffraction grating serving as a grating coupler or as a grating coupler or as a Bragg reflector.
- a diffraction grating serving as a grating coupler or as a grating coupler or as a Bragg reflector.
- the mode of operation of the grating coupler, the grating coupler and the Bragg reflector is described in more detail with reference to the figures.
- Fig. 1 shows a schematic representation of the basic elements of the invention.
- a thin layer is in the form of a planar waveguiding film 1. on a substrate 2 (for example a Pyrex glass).
- the waveguiding film 1 and the substrate 2 together form the so-called waveguide 1/2.
- the waveguiding film can consist, for example, of an oxide layer (such as SiO 2, TiO 2, SnO 2 or mixtures thereof) or a plastic layer (such as polystyrene, polycarbonate etc.) or a combination of two or more layers one above the other.
- the surface of a substrate can also be treated in such a way that a waveguiding film is formed directly under the surface.
- the refractive index of the wave-guiding film 1 must be greater than that of the neighboring media (ie the substrate 2 and the measuring substance 3).
- the wave-guiding film 1 may also be microporous Have structure, as can be achieved for example in film production with a dip coating process.
- a diffraction grating 4 of the length L On the surface of the waveguiding film 1 facing either the substrate 2 or the measuring substance 3 or also in its volume there is a diffraction grating 4 of the length L.
- Surface relief grating can be produced, for example, by an embossing process, the grating structure of the master either in the substrate 2 or is engraved in the waveguiding film 1. Embossing in plastics and organometallic sol-gel layers is described in the literature (see, for example, R. Ulrich et al., Appl. Phys. Lett. 20 (1972), ' 213-215 and W. Lukosz and K. Tiefenthaler, Optics Letters 8 (1983), 537-539).
- stamping technique even if the stamp has a uniformly modulated master grid, to produce a modulation of the embossed surface relief grid that is position-dependent in the direction perpendicular to the grid lines.
- This can be achieved in particular in that the embossing pressure is location-dependent and the master grating and / or the substrate 2 can be deflected with or without a waveguiding film 1.
- a surface relief grid which consists of two strongly modulated grid areas, which are separated by a less strongly modulated area, can with the mentioned Stamping technology can be produced by pressing the master grating against the substrate 2 with or without a waveguiding film 1 using two spatially separated, parallel cutting edges.
- the diffraction grating 4 serves to either couple an incident laser beam into the wave-guiding film 1 or to decouple a mode already carried out in the wave-guiding film 1 or to pass a guided mode partly in the forward direction and partly to reflect it.
- the wave-guiding film 1 is optionally covered at least in the grating region with an additional layer 5, which enables selective detection of a substance contained in the measuring substance 3.
- the substance 3 to be examined which is also referred to as the “measurement substance”, is applied to the additional layer 5 or to the waveguiding film 1 at least in the lattice region.
- the optical sensor is operated exclusively as an integrated optical (differential) refractometer, ie if refractive index changes are only to be measured in the measuring substance 3, the additional layer 5 is omitted or it is designed in such a way that adsorption of molecules of the measuring substance 3 is prevented .
- no polar substances adsorb on ODS (octadecylsilane) or on surfaces that have any alkyl groups.
- ODS octadecylsilane
- water can be the apolar Do not wet (hydrophobic) alkyl groups. This fact becomes abundant in reversed phase chromatography. Made use of (V .. Meyer, Laboratory Books Chemistry: Practice of high performance liquid chromatography).
- Changes in the refractive index of a liquid measuring substance 3 can occur, for example, as a result of a (bio) chemical reaction taking place in it.
- the measuring substance 3 can also consist of a solid or a porous material.
- the additional layer 5 required for the selective detection or even the wave-guiding structure 1 is designed such that it selectively chemisorbs or chemically binds only a specific substance that is present in the measuring substance 3.
- the chemisorbate forms a further layer 6.
- This principle of selectivity of the optical sensor can be used, among other things, in immunology to identify antigen-antibody couplings. If, for example, the additional layer 5 consists of a specific antigen, then an antigen-antibody coupling takes place precisely when the antibody corresponding to the antigen is present in the measuring substance 3.
- the chemisorbed layer 6 consists of antibodies. The degree of coverage of the chemisorbed layer 6 depends on the concentration of the antibodies in the measuring substance 3 and on the incubation period.
- the present optical sensor can thus be used, for example, to determine antibody Concentrations are used, for example by determining the maximum degree of coverage or the stationary degree of coverage that occurs after a certain time.
- the selective detection among biomolecules using the Schluessel-Schloss principle ensures the organization and regulation of all biological systems and is therefore also used in biosensors.
- Complementarity of biomolecules is found not only in antigens and antibodies, but also, for example, between hapten and antibody, enzyme and enzyme inhibitor, hormone or neurotransmitter and receptor, or between complementary nucleic acids and can therefore also serve as a selectivity principle for the optical sensor, one of which is complementary Biomolecules as an additional layer 5 is immobilized on the waveguiding film 1 and the other biomolecule forms the layer 6.
- the surface coverage ie the thickness of the layer 6, is dependent on the concentration of the specific substance dissolved in the measuring substance 3 in equilibrium. For example, if the concentration of this substance in the measuring substance 3 decreases, molecules of this substance desorb from the surface into the measuring substance 3 until the equilibrium state is reached again. This desorption means that the thickness of the layer 6 decreases.
- the key-lock principle can also be applied in a more complicated way. The so-called sandwich method is known, in which the key-lock principle is practiced several times in succession (example: antibody-antigen-antibody coupling).
- the so-called competition process is also known, in which two different types of biomolecules, mostly of different molecular weights, compete for a common binding site on the receptor, ie on the additional layer 5. If the concentration of one type of molecule in measurement substance 3 increases, the other type of molecule is partially displaced by the binding sites at the receptors (EP 0073980). This desorption leads to a detectable change in the thickness of the layer 6. This in turn is a measure of " the concentration of the one type of molecule, namely the substance to be detected.
- Another way of determining the concentration of a specific substance contained in the measuring substance 3 is to observe the dynamic behavior of the adsorption or binding process.
- the change in the thickness of layer 6 as a function of time or the speed at which layer 6 increases gives information about the concentration of the specific substance to be detected (cf. G. Traexler,technik 99 (1979), 79-84, JC Sternberg, Clin. Chem. 1456 (1-977)).
- the surface of the waveguiding film 1 can before
- Immobilization of the receptor may be precoated.
- a thin polymer film made of polystyrene can be applied to the waveguiding film 1 in order to improve the adhesion of the receptor.
- An oxide layer can also be used instead of the polymer layer. It is preferred to use those materials as oxides which are also used as so-called solid phases in (adsorption) chromatography. With or without chemical activation of the oxide layer, the receptor can then be immobilized in a manner known per se. If the wave-guiding film 1 itself consists of an oxide, the mentioned oxide or polymer coating may not be necessary. There is also the possibility of providing the oxide layer or the waveguiding film 1 with reactive silanes, which enables an even better immobilization.
- Substance can be in the form of an additional layer 5 and / or only in the micropores of the wave-guiding
- Films 1 may be present. • In the latter case, the
- the additional layer 5 can also be designed in such a way that only the substance contained and to be detected in the measuring substance 3 diffuses into the additional layer 5.
- the additional layer 5 then has a high solution capacity for the substance to be detected.
- This type of selectivity generation has been known for a long time and is used in piezoelectric quartz crystal detectors (see USP 3164004).
- hydrocarbons are dissolved in a silicone oil film. When hydrocarbons are adsorbed, the quartz crystal coated with a silicone oil film changes its oscillation frequency (see A. Kindlund and I. Lundstroem, Sensors and Actuators 3 (1982/83), 63-77).
- the additional layer 5 can consist of such a silicone oil film, for example.
- Chemical reactions caused by the substance to be detected in the additional layer 5 or in the • waveguiding film 1 can also lead to a change in the refractive index and / or the light absorption coefficient (imaginary part of the refractive index) and / or the layer thickness of the layer in question (see here EE Hardy et al., Nature 257 (1975), 666-667 and C. Nylander et al., Sensors and Actuators 3 (1982/83), 79-88).
- chemical reactions taking place in the measuring substance 3 can, in addition to a change in the refractive index, also be linked to a change in the light absorption coefficient (eg color change) of the measuring substance 3.
- a laser beam 7 can be coupled into a waveguide 1/2 via a diffraction grating 4 and run along the waveguide 1/2 in the form of a guided light wave 8.
- the laser beam 7 can fall onto the grating 4 from the side of the measurement substance or advantageously from the side of the substrate.
- a helium-neon laser, a continuous or pulsed semiconductor laser diode or light-emitting diode (LED) with appropriate collimation optics can be used as the laser.
- the coupling condition has the character of a resonance condition.
- the effective refractive index N of the excited mode 8 is essentially determined by the refractive indices of the media involved in the waveguide 1/2, the refractive index of the measuring substance 3, the layer thickness of the waveguiding film 1 and the refractive index and layer thickness of the selectively chemisorbing additional layer 5 and the chemisorbate layer 6 determined. If the effective refractive index N of the guided light wave 8 changes due to the action of the measuring substance 3, the coupling angle W1 originally selected is no longer optimal, so that the intensity of the mode 8 changes.
- the change in the effective refractive index N can now be measured in different ways.
- the change in the light intensity of the guided mode 8 can be measured with the aid of a detector D1 and the change in the effective refractive index can thus be inferred with a constant angle of incidence W1 and constant light wavelength.
- This measurement method is suitable for the measurement of effective refractive index changes that are smaller than the half-width of the resonance coupling curve.
- the coupling curve shows a resonance behavior both as a function of the angle of incidence W1 and as a function of the effective refractive index N.
- the half-width of the resonance coupling curve depends on the diffraction L of the grating (see K. Tiefenthaler and W.
- the light intensity of the guided mode 8 is measured and the coupling angle W1 of the laser beam 7 is so adjusted that the light intensity is always maximum or at least always has the same value.
- the change in the angle W1 can be concluded from the change in the effective refractive index.
- Another measurement method takes advantage of the fact that the angle of incidence W1, at which the laser beam 7 is optimally coupled, is dependent on the light wavelength of the laser.
- the measurement method now consists in that, at a constant angle of incidence W1, the light wavelength of a tunable laser is changed in such a way that the guided mode 8, despite the change in the effective refractive index caused by the action of the measurement substance 3, always has maximum or constant intensity. The change in the effective refractive index can be concluded from the change in the light wavelength.
- FIG. 3 shows a measuring device according to the invention with a grating decoupler.
- Waveguide 1/2, diffraction grating 4 and selectively chemisorbing additional layer 5 are described in FIG. 1. If a guided wave 8 falls on the diffraction grating 4, the laser light is partially or completely coupled out.
- the decoupled Laser beam 9 emerges from the waveguide 1/2 at a constant light wavelength of the laser at a certain angle W2, which is determined by the effective refractive index.
- the generation of mode 8 is not shown in FIG. 3.
- the mode can, for example, be stimulated by coupling the end face, coupling in the prism, coupling in the grating, etc. (see T. Tamir, Integrated Optics, Chapter 3).
- a change in the effective refractive index in the grating region caused by the action of the measuring substance 3 results in a change in the coupling-out angle W2.
- This change in angle can be measured, for example, using a diode array or a position-dependent detector D2.
- a change in the intensity of the outcoupled laser beam 9 incident on the detector D2 can also be measured with the aid of a detector D2, the detection area of which is smaller than the beam diameter, since the outcoupled laser beam 9 over the course of the measurement process Detector D2 moved away.
- the change in the effective refractive index can be inferred from the change in angle or the change in intensity.
- a tunable laser it is possible to change the decoupling angle W2 by a suitable choice of the light wavelength, despite the changes in the effective refractive index caused by the action of the measuring substance 3 to keep constant.
- the change in the effective refractive index can in turn be inferred from the change in the light wavelength.
- a so-called Bragg reflector is shown.
- the diffraction gratings used for the grating couplers can also be used as Bragg reflectors.
- a guided light wave 8 is Bragg-reflected at the diffraction grating 4 if the Bragg condition is fulfilled, ie if the glancing angle W3 corresponds to the Bragg angle - (compare W. Lukosz and K. Tiefenthaler, Optics Letters 8 (1983), 537 -539). The same applies to the generation of the guided mode 8 as that stated for FIG. 3.
- the detectors D3 and D4 measure the intensity of a mode 10 reflected on the diffraction grating 4 and / or the intensity of the transmitted mode 11.
- the Bragg angle W3 is determined by the effective refractive index N in the grating region. If the effective refractive index N changes due to the action of the measuring substance 3, the Bragg condition is disturbed. The intensities of the reflected and transmitted fashion change. By measuring the light intensity of the reflected mode 10 and / or the transmitted mode 11 with the detectors D3 and / or D4, it can be concluded that the effective refractive index has changed. There is also the possibility of choosing the angle W3 in such a way that the Bragg condition is currently not fulfilled and thus there is no reflected mode 10. If the effective change in refractive index has reached a desired value, a reflected mode 10 occurs since the Bragg condition is then fulfilled.
- Another measurement method takes advantage of the dependence of the Bragg condition on the light wavelength.
- the Bragg condition can be met by appropriately selecting the light wavelength of the laser.
- the change in the effective refractive index is then determined from the change in the light wavelength.
- the Bragg reflector can in particular also be operated with a glazing angle W3 of 90 degrees.
- the guided mode 8 is then retroreflected. Among other things, this has the advantage that the reflected fashion retains its original width and is not fanned out.
- a strip waveguide can also be used instead of a planar waveguiding film.
- the diffraction grating with location-dependent modulation mentioned in the description of FIG. 1 can be used in particular as the Bragg reflector, in particular a diffraction grating which consists of two strongly modulated grating regions which are separated from one another by a less strongly modulated region.
- the Additional layer 5 may only be located on the weakly modulated lattice area.
- This grating described can be used not only as a Bragg reflector, but also as a grating coupler or grating coupler. When using this grating as a grating decoupler, a strip system occurs on the detector D2 in FIG. 3.
- the wave-guiding film 1 is shown as a planar structure in FIGS. 1-8. However, there are other structures in which optical waveguide can be produced. For example, a strip waveguide can be used instead of the planar waveguiding film 1. The waveguiding film 1 is then only in the form of a strip. The strip can be both on the substrate and embedded in the substrate (but close to the surface).
- the refractive index of the strip is higher than that of the surrounding materials.
- the guided light wave 8 is then guided in both spatial coordinates perpendicular to the direction of propagation by total reflection.
- the fashion can be weakened so much after leaving the grid region that a measurement of the light intensity is no longer possible.
- it is advantageous, as shown in FIG. 5, to cover the waveguiding film 1 outside the lattice region with a protective layer 12.
- This protective layer 12 which must have a sufficiently low refractive index, can for example be an SiO 2 layer.
- the layer thickness of the protective layer 12 must be chosen so large that outside the lattice region of fashion no longer interacts with the measuring substance 3 because its cross-attenuated field has dropped sufficiently.
- the protective layer 12 can also be used to prevent the disturbing influence of the fastening device of a envelope 13 shown in FIG. 6 on the fashion being carried out.
- FIG. 6 shows an arrangement with a membrane 14 which is expanded compared to FIG. 5 and which improves both the selectivity and the stability of the optical sensor.
- the membrane 14 it is achieved that only a "filtered" measuring substance 15 comes into contact with the wave-guiding structure 1 or the additional layer 5, ie in the "filtered” measuring substance 15 only a specific substance should be present in addition to a solvent or a buffer solution be present, which must be proven.
- the measuring substance 3, if necessary membrane 14 carried by a envelope 13 is applied, which allows only the substance to be detected to diffuse out of the measuring substance 3, but which retains the remaining substances not to be detected.
- the additional layer 5 may possibly be omitted. In this case there is an unspecific adsorption or chemisorption on the wave-guiding structure 1.
- Measurement substance 3 and "filtered” measurement substance 15 can be either liquid or gaseous.
- the waveguiding film 1 or the additional layer 5 can be coated directly with a (biological) membrane.
- the receptors can not only be in the form of an additional layer 5, but can also be present as an implant in the membrane itself. If the membrane is sufficiently stable, such as a glass membrane, the membrane can take over the function of the substrate. In this case, the membrane is optionally first coated with an additional layer 5 and then with a waveguiding film 1.
- the measuring substance is now applied to the membrane substrate. 2 and 4, detectors are shown which measure the intensity of the guided waves 8 or 10 and 11 directly.
- first coupling out a guided light wave for example with a second grating, and then the intensity of the coupled laser beam to measure with a detector.
- This intensity is proportional to the intensity - the guided wave.
- Waveguide separates from or in the measurement substance 3
- the decoupling can also be done via a
- FIG. 7 A further detection possibility is described in FIG. 7.
- the intensity of the guided light wave 8 is not measured directly but the scattered light generated by the mode 8 16 is collected with an optical fiber 17 and supplied to the detector D5.
- the intensity of the scattered light 16 is proportional to the intensity of the mode 8.
- the scattered light 16 is always present due to the unavoidable inhomogeneities of the waveguide 1/2.
- the intensity of the scattered light of the reflected mode 10 and / or of the transmitted mode 11 can be measured in the Bragg reflector (FIG. 4) instead of directly measuring the intensity of the guided waves 10 and / or 11. 8 shows a further indirect detection possibility shown.
- the reflected beam 18 means the zeroth reflected diffraction order
- the transmitted beam 19 the zeroth transmitted diffraction order, that is to say the light which is transmitted undeflected.
- the beams 20 and 21 are higher order diffraction orders in reflection and in transmission, respectively.
- the Bragg reflector in addition to modes 10 and 11, other diffraction orders occur under certain conditions, which are radiated freely into the room and whose intensities are therefore easily detectable.
- the sensitivity of the integrated optical sensor is particularly high if the change in the effective refractive index is as large as possible for a given acting measuring substance 3.
- the waveguiding film 1 has a significantly higher refractive index than the substrate 2 and the measuring substance 3, and when the layer thickness of the waveguiding film 1 is chosen to be somewhat greater than the minimum layer thickness.
- a minimum layer thickness (so-called cut-off layer thickness) of the waveguiding film 1 is required to. to be able to stimulate a guided wave at all in wave-guiding film 1 (compare T. Tamir, Integrated Optics, Springer, Berlin 1979, chapter 2).
- the refractive index of the waveguiding film 1 at least 1%, preferably more than 10%, greater than that of the substrate 2 or the measuring substance 3.
- the effective refractive index changes of a guided mode can either be used to determine the state of the adsorption or desorption process, in particular the change in the layer thickness of the chemisorbate layer 6, or the change in the refractive index of the measuring substance 3.
- the effective changes in refractive index of two different guided modes must be measured simultaneously.
- the thickness of the layer 6 must be smaller than the so-called penetration depth so that changes in the refractive index of the measuring substance 3 can be measured.
- the simultaneous measurement of changes in intensity of two different modes can be carried out via non-coupled diffraction orders or via the waves coupled out by a second coupling technique, since the waves which are freely propagating in space and which can be assigned to different modes differ in terms of angle from one another and therefore are separately detectable.
- Simultaneous measurement of effective refractive index changes of two guided modes can also be carried out only with a single incident laser beam, which spectrally consists of two separate (tunable) wavelengths, so that the two different modes, which additionally differ in wavelength, in waveguide 1 / 2 can be stimulated at the same time.
- a single incident laser beam which spectrally consists of two separate (tunable) wavelengths, so that the two different modes, which additionally differ in wavelength, in waveguide 1 / 2 can be stimulated at the same time.
- a good signal-to-noise ratio is required in order to be able to achieve a high measurement accuracy in the intensity measurements. Fluctuations in the laser power impair the measuring accuracy. This noise can be eliminated by reflecting part of the light of the incident laser beam somewhere in front of the diffraction grating 4 via a beam splitter. is fed to a reference detector and then the ratio of the measurement signal is formed by the reference signal. The signal-to-noise ratio can also be improved by using the known lock-in technique. In this, the laser light incident on the diffraction grating 4 is modulated.
- either the light of a CW laser is modulated with a chopper or, for example, a pulsed laser diode or light-emitting diode (LED.) Is used as the light source.
- a chopper or, for example, a pulsed laser diode or light-emitting diode (LED.) Is used as the light source.
- LED light-emitting diode
- the illumination spot on the diffraction grating 4 ie that surface which is illuminated by the laser beam 7 in the case of the grating coupler, for example, remains locally stable. This can be accomplished by using a Laser with the highest possible beam angle stability is selected and this is as close as possible.
- the diffraction grating is moved up or by installing a lens between the laser and diffraction grating 4, which maps the plane of the beam constriction onto the diffraction grating 4.
- the beam angle stability also has a direct influence on the angle of incidence Wl. Lasers with high beam angle stability increase the measuring accuracy of the optical sensor, since the angle of incidence Wl is more precisely defined.
- the optical sensor consists of a few (passive) elements, which are integrated on a substrate, it will be inexpensive to manufacture and can therefore be used as a disposable sensor in biosensors and medical diagnostics, for example.
- optical sensors Another advantage of the optical sensors described is that several of them can be attached to a substrate. These sensors can have different additional layers 5 and / or membranes 14 and can thus be selectively sensitive to different substances to be detected. The different sensors can be scanned by a laser either • simultaneously or one after the other.
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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JP61502845A JPH0627703B2 (ja) | 1985-05-29 | 1986-05-29 | 物質の選択的検出および測定物質内の屈折率変化検知を行なう光学センサ |
DE8686903179T DE3680999D1 (de) | 1985-05-29 | 1986-05-29 | Optischer sensor zum selektiven nachweis von substanzen und zum nachweis von brechzahlaenderungen in messubstanzen. |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH225785A CH669050A5 (de) | 1985-05-29 | 1985-05-29 | Sensor zum nachweis von aenderungen der brechzahl einer festen oder fluessigen messsubstanz. |
CH225685A CH670521A5 (en) | 1985-05-29 | 1985-05-29 | Optical sensor detecting specific substances in material |
CH02257/85-0 | 1985-05-29 | ||
CH02256/85-8 | 1985-05-29 |
Publications (1)
Publication Number | Publication Date |
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WO1986007149A1 true WO1986007149A1 (de) | 1986-12-04 |
Family
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CH1986/000072 WO1986007149A1 (de) | 1985-05-29 | 1986-05-29 | Optischer sensor zum selektiven nachweis von substanzen und zum nachweis von brechzahländerungen in messubstanzen |
Country Status (6)
Country | Link |
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US (2) | US4815843A (de) |
EP (1) | EP0226604B1 (de) |
JP (1) | JPH0627703B2 (de) |
AU (1) | AU5815886A (de) |
DE (1) | DE3680999D1 (de) |
WO (1) | WO1986007149A1 (de) |
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- 1986-05-29 DE DE8686903179T patent/DE3680999D1/de not_active Expired - Lifetime
- 1986-05-29 WO PCT/CH1986/000072 patent/WO1986007149A1/de active IP Right Grant
- 1986-05-29 US US07/019,557 patent/US4815843A/en not_active Expired - Lifetime
- 1986-05-29 AU AU58158/86A patent/AU5815886A/en not_active Abandoned
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Also Published As
Publication number | Publication date |
---|---|
EP0226604A1 (de) | 1987-07-01 |
JPS62503053A (ja) | 1987-12-03 |
AU5815886A (en) | 1986-12-24 |
US5071248A (en) | 1991-12-10 |
EP0226604B1 (de) | 1991-08-21 |
US4815843A (en) | 1989-03-28 |
DE3680999D1 (de) | 1991-09-26 |
JPH0627703B2 (ja) | 1994-04-13 |
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