USRE46155E1 - Series connected segmented LED - Google Patents

Series connected segmented LED Download PDF

Info

Publication number
USRE46155E1
USRE46155E1 US14/314,987 US201414314987A USRE46155E US RE46155 E1 USRE46155 E1 US RE46155E1 US 201414314987 A US201414314987 A US 201414314987A US RE46155 E USRE46155 E US RE46155E
Authority
US
United States
Prior art keywords
layer
segment
serial connection
connection electrode
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US14/314,987
Inventor
Ghulam Hasnain
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Electronics Co Ltd
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to US14/314,987 priority Critical patent/USRE46155E1/en
Application granted granted Critical
Publication of USRE46155E1 publication Critical patent/USRE46155E1/en
Assigned to TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION reassignment TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KABUSHIKI KAISHA TOSHIBA
Assigned to SAMSUNG ELECTRONICS CO., LTD. reassignment SAMSUNG ELECTRONICS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/15Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission
    • H01L27/153Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission in a repetitive configuration, e.g. LED bars
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/15Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components with at least one potential-jump barrier or surface barrier specially adapted for light emission
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/62Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/38Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
    • H01L33/385Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape the electrode extending at least partially onto a side surface of the semiconductor body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/44Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating

Definitions

  • LEDs Light emitting diodes
  • Improvements in these devices have resulted in their use in light fixtures designed to replace conventional incandescent and fluorescent light sources.
  • the LEDs have significantly longer lifetimes and, in some cases, significantly higher efficiency for converting electric energy to light.
  • an LED can be viewed as having three layers, the active layer sandwiched between two other layers.
  • the active layer emits light when holes and electrons from the outer layers combine in the active layer.
  • the holes and electrons are generated by passing a current through the LED.
  • the LED is powered through an electrode that overlies the top layer and a contact that provides an electrical connection to the bottom layer.
  • the cost of LEDs and the power conversion efficiency are important factors in determining the rate at which this new technology will replace conventional light sources and be utilized in high power applications.
  • the conversion efficiency of an LED is defined to be the ratio of optical power emitted by the LED to the electrical power dissipated. Electrical power that is not converted to light that leaves the LED is converted to heat that raises the temperature of the LED. Heat dissipation often places a limit on the power level at which an LED operates.
  • the efficiency of conversion of electricity to light depends on the quantum efficiency that depends on the material system in which the LED is constructed, and also on the extraneous resistive losses.
  • the p-type layer that overlies the active layer has a very high electrical resistivity. This is also the top layer through which light exits in many designs. Consequently, a transparent conductive layer such as Indium Tin Oxide (ITO) is used to spread the current laterally across the chip and the sheet resistance of this ITO layer is chosen to be comparable to that of the n-type GaN layer underneath the active layers.
  • ITO Indium Tin Oxide
  • metal electrode fingers are used both on the ITO layer as well as in trenches etched down to expose the n-GaN layer.
  • These metal electrodes being opaque must be made as narrow as possible to minimize blockage of light but this increases the resistance per unit length for a given metal thickness.
  • the thickness of the electrode metal must be increased for higher current operation if the voltage drop across the length of the electrodes is to be kept constant and at a minimum.
  • the efficiency with which the active layer converts power to light also decreases with current density beyond some point depending on the specific design and quality of the active region layers. Accordingly, the amount of light per unit area of an LED reaches a practical limit. To provide higher light output once this limit is reached, the area of the LED must be increased. However, to provide adequate current spreading over the top surface of the LED, there is a limit to the size of an LED that can be powered from a single contact on the top surface of the LED.
  • a transparent conducting layer such as ITO
  • this material has significantly less resistivity than the underlying GaN, the resistivity of the layer is still significant.
  • the resistive losses in the ITO layer could be overcome by using thicker layers of ITO; however, ITO is only partially “transparent” with non-negligible absorption in the blue, and hence there is a practical limit to the thickness of the ITO layer.
  • additional metal contacts are provided on the ITO layer to help with the current spreading; however, such contacts are opaque, and hence, reduce the light output.
  • the individual segments are connected in parallel. This leads to a number of problems.
  • the maximum voltage that can be applied to the light source is determined by the maximum voltage a single LED can withstand, typically a few volts.
  • the power supply that powers the light source must provide a very high current at a low voltage. This leads to further power losses in the conductors between the power supply and the light source.
  • the brightness of the individual LEDs can vary over the light source due to processing variations across the die that cause variations in the resistance presented between the two contacts that power each LED.
  • the present invention includes a light source and method for making the same.
  • the light source includes a substrate, and a light emitting structure that is divided into segments.
  • the light emitting structure includes a first layer of semiconductor material of a first conductivity type deposited on the substrate, an active layer overlying the first layer, and a second layer of semiconductor material of an opposite conductivity type from the first conductivity type overlying the active layer.
  • the light emitting structure also includes a barrier that divides the light emitting structure into first and second segments that are electrically isolated from one another.
  • a serial connection electrode connects the first layer in the first segment to the second layer in the second segment.
  • the light source is powered through first and second power contacts.
  • the first power contact is electrically connected to the second layer in the first segment
  • the second power contact is electrically connected to the first layer in the second segment.
  • the first and second segments generate light when a potential difference is created between the first and second power contacts.
  • the barrier includes a trench extending through the light emitting structure.
  • the serial connection electrode includes a layer of electrically conducting material deposited in the trench.
  • the trench has an insulating layer that prevents the layer of electrically conducting material from making direct contact with the first layer or the active layer in the second segment.
  • the insulating layer underlies a portion of the serial connection electrode that overlies the active layer in the second segment.
  • the electrically conducting material includes a metal or ITO.
  • the barrier is transparent to light traveling in the first layer.
  • FIG. 1 is top view of a prior art LED.
  • FIG. 2 is a cross-sectional view of prior art LED 20 through line 2 - 2 shown in FIG. 1 .
  • FIG. 3 is a top view of prior art light source.
  • FIG. 4 is a cross-sectional view of prior art light source 40 through line 4 - 4 shown in FIG. 3 .
  • FIG. 5 is a top view of one embodiment of a light source according to the present invention.
  • FIG. 6 is a cross-sectional view of light source 60 through line 6 - 6 shown in FIG. 5 .
  • FIG. 7 is another cross-sectional view of light source 60 .
  • FIG. 8 illustrates an embodiment of the present invention in which the light loss problem is reduced by using a clear insulator to fill the bottom of the isolation trench.
  • FIGS. 9A-9D illustrate the manner in which a light source that utilizes a metal serial connection electrode is fabricated.
  • FIGS. 10A-10C are cross-sectional views of a portion of a wafer having a light source in which the isolation trench is filled with glass.
  • FIG. 11 is a cross-sectional view of a light source having three segments.
  • FIG. 1 is top view of LED 20
  • FIG. 2 is a cross-sectional view of LED 20 through line 2 - 2 shown in FIG. 1
  • LED 20 is constructed by growing a light emitting structure 21 having three layers on a sapphire substrate 19 .
  • the first layer 22 is an n-type GaN material.
  • the second layer 23 is an active layer that emits light when holes and electrons combine therein.
  • the third layer is a p-type GaN layer 24 .
  • Each of these layers may include a number of sub-layers. Since the functions of these sub-layers are well known in the art and are not central to the present discussion, the details of these sub-layers have been omitted from the drawings and the following discussion.
  • a trench 28 is etched through layers 23 and 24 and a contact 26 is deposited on the bottom surface of the trench 28 to provide an electrical connection to layer 22 .
  • the electrical connection to layer 24 is provided by a transparent electrode 27 that is typically constructed from indium tin oxide (ITO).
  • ITO indium tin oxide
  • Layer 27 is connected to a second contact 25 that provides the electrical connection to the power source. When power is provided to contacts 25 and 26 , light is generated in active layer 23 and extracted from LED 20 through transparent electrode 27 as shown at 29 .
  • the resistivity of p-type GaN is much greater than that of the n-type GaN.
  • the current density across active layer 23 should be uniform. That is, the resistance of paths 31 - 33 should all be the same. In the absence of layer 27 , the resistance of path 31 would be much lower than that of path 33 , and hence, light generation would be concentrated in the active region around path 31 leading to a gradient in intensity across the surface of the LED.
  • the resistivity of ITO is significantly less than that of the p-type GaN, the resistance through the ITO layer is not negligible.
  • the power output of LEDs is increased, the losses in the ITO become significant and a gradient in light intensity results unless the ITO layer is increased in thickness. Unfortunately, as the ITO thickness increases, the amount of light absorbed in the ITO also increases. The light losses from absorption of light in the ITO become significant when the layer is increased to accommodate the current densities required in high power LEDs.
  • FIGS. 3 and 4 illustrate a prior art segmented light source.
  • FIG. 3 is a top view of light source 40
  • FIG. 4 is a cross-sectional view of light source 40 through line 4 - 4 shown in FIG. 3 .
  • light source 40 includes only two segments 51 and 52 ; however, it will be apparent that additional segments could be utilized.
  • Light source 40 is constructed by growing the conventional three-layer structure 42 on a substrate 41 .
  • An ITO layer 44 is deposited over the p-layer.
  • the structure is etched to expose layer 43 of the three-layer structure.
  • An n-contact 46 is then deposited in the etched trench to provide electrical contact to layer 43 .
  • a p-contact 45 is deposited on the segmented ITO layer. The n-contacts in each segment are connected together as shown at 47 . Similarly, the p-contacts in each segment are connected together as shown at 48 .
  • this structure can only be utilized in an arrangement in which the segments are connected in parallel, since the segments share a common n-type layer that remains connected after the trenches are etched.
  • the current that must be carried by conductors 47 and 48 is the sum of the currents needed to power the individual segments.
  • Providing high currents at low voltages presents problems that increase the cost of the light source or decrease the efficiency of light generation.
  • the electrode metal thickness must be increased to lower the metallic resistance, which not only increases chip cost, since the metal is typically gold, but also introduces handling and mechanical issues.
  • FIG. 5 is a top view of light source 60
  • FIG. 6 is a cross-sectional view of light source 60 through line 6 - 6 shown in FIG. 5 .
  • Light source 60 includes two segments 64 and 65 ; however, it will be apparent from the following discussion that light sources having many more segments can be constructed from the teachings of the present invention.
  • Light source 60 is constructed from the same three-layer LED structure in which the layers are grown on a sapphire substrate 51 . The n-layer 52 is grown on substrate 51 , and then the active layer 55 and p-layer 53 are grown over n-layer 52 .
  • Isolation trench 66 includes a plateau 67 that extends only partially into layer 52 .
  • the walls of isolation trench 66 are covered by an insulating layer 57 that includes an open area 58 for making electrical contact to the portion of layer 52 associated with each segment.
  • Insulating layer 57 can be constructed from any material that provides an insulating layer that is free of pinhole defects. For example, SiNx can be used as the insulating material. Other materials can include polyimide, BCB, spin-on-glass and materials that are routinely used in the semiconductor industry for device planarization.
  • a serial connection electrode 59 is deposited in isolation trench 66 such that electrode 59 makes contact with layer 52 through opening 58 in insulating layer 57 . Electrode 59 also makes electrical contact with ITO layer 56 in the adjacent segment. Hence, when power is provided via electrodes 61 and 62 , segments 64 and 65 are connected in series. As a result, light source 60 operates at twice the voltage and half the current as light source 40 discussed above with respect to FIGS. 3 and 4 .
  • insulating layer 57 extends under electrodes 59 and 61 as shown at 57 a in FIG. 6 . Since electrode 59 is opaque, electrode 59 blocks light generated in the portion of active layer 55 immediately underlying electrode 59 .
  • the thickness of the layers shown in the figures is not to scale. In practice, the thickness of layer 53 is much smaller than that of layer 52 , and hence, electrode 59 blocks most of the light that is generated under electrode 59 . Accordingly, current that passes through layer 55 under electrode 59 is substantially wasted, since most of the light generated by that current is lost. The insulating layer extension blocks current from flowing through this wasted area of layer 55 , and hence, improves the overall efficiency of the light source. A similar issue is present under electrode 61 , and hence, the insulating layer is extended under that electrode as well.
  • Serial connection electrode 59 can be constructed by depositing a layer of metal such as copper or aluminum. However, such a layer prevents light from moving between segments 64 and 65 .
  • a significant fraction of the light generated in active layer 55 is trapped within the light source due to internal reflections at the boundaries of the light source such as the boundary between substrate 51 and layer 52 and the boundary between layer 53 and ITO layer 56 .
  • An exemplary trapped ray is shown at 71 .
  • the LED includes some mechanism that randomizes the angles of reflection at one or more of the reflecting surfaces.
  • the upper surface of layer 53 is roughened.
  • the light is either passed through the roughened surface or reflected back at a different angle with respect to the normal to the average surface of layer 53 .
  • some of the light that is reflected at each reflection leaves the surface at an angle that will allow that light to escape the next time the light is reflected upward and encounters surface 72 .
  • electrode 59 is a metal
  • light ray 71 will be intercepted by electrode 59 and will either be reflected back into segment 64 or be lost rather than proceeding into segment 65 and again reaching the portion of surface 72 in segment 65 . If the light is reflected back into segment 64 , some fraction of the light will escape on subsequent encounters with surface 71 .
  • layers of metal deposited on etched surfaces such as the surface of the isolation trench have a reflectivity that is significantly less than 100 percent. In this regard, it should be noted that the various layers in light source 60 are not drawn to scale. In practice, layer 52 is much thicker than the sum of layers 53 and 55 . Hence, a significant fraction of the light that strikes electrode 59 will be lost.
  • this light loss problem is reduced by utilizing a transparent conductor such as ITO for electrode 59 .
  • the transparency of electrode 59 for the purposes of propagating light between the segments is determined by the cross-section of the layer within the isolation trench that extends to substrate 51 , i.e., “t” shown in FIG. 7 .
  • the resistance of electrode 59 is determined by the entire cross-sectional area of electrode 59 , i.e., the dimension “T” shown in FIG. 7 .
  • electrode 59 can be made thick enough to have an acceptable light transmission while still providing a sufficiently low resistance to current flow between the segments.
  • the portion of the insulating layer shown at 57 a in FIG. 6 is not needed if electrode 59 is transparent, since light generated under electrode 59 can escape through electrode 59 .
  • the use of a transparent electrode material for electrode 59 also increases the usable area of segment 65 .
  • FIG. 8 illustrates an embodiment of the present invention in which the light loss problem discussed above is reduced by using a clear insulator to fill the bottom of the isolation trench.
  • light source 80 the portion of the isolation trench that extends to substrate 51 is filled with a clear insulator such as the glass layer shown at 81 .
  • a separate metal electrode 82 is used to make the serial connection between segments 84 and 85 .
  • FIGS. 9A-9D illustrate the manner in which a light source that utilizes a metal serial connection electrode is fabricated.
  • FIGS. 9A-9D are cross-sectional views of a portion of a wafer on which a light source 90 having two segments is shown at various stages in the fabrication process.
  • light source 90 is constructed by depositing GaN layers 52 , 55 , and 53 on a sapphire substrate 51 . This process is conventional in the art, and hence, will not be discussed in detail here. After the layers have been deposited, trenches 92 a- 92 c are etched through layers 53 and 55 and into n-type layer 52 .
  • trenches 92 a- 92 c have been etched, the wafer is masked and trenches 93 a- 93 c are etched down to substrate 51 .
  • Trench 93 b is used to construct the isolation trench discussed above.
  • a patterned insulating layer 94 of SiN is then deposited on the walls of the trenches, and openings 95 are etched in layer 94 to provide electrical access to layer 52 .
  • a patterned ITO layer 96 is deposited over the p-type layer 53 .
  • the top surface of layer 53 is etched to provide the desired scattering features before layer 96 is deposited.
  • a patterned metal layer is then deposited to provide the serial connection electrode 97 and contacts 98 and 99 that are used to power light source 90 .
  • serial connection electrode 97 is constructed from ITO have advantages in terms of light extraction.
  • the serial connection electrode is constructed from ITO or a similar transparent conductor, the serial connection electrode is deposited at the same time as layer 96 .
  • FIGS. 10A-10C are cross-sectional views of a portion of a wafer having a light source 100 in which the isolation trench is filled with glass.
  • FIG. 10A The fabrication process proceeds in the same manner as described above with respect to FIGS. 9A and 9B .
  • the isolation trench is filled with glass as shown at 101 .
  • the glass layer is then partially etched to open a trench down to the plateau in layer 52 leaving a glass wall 102 as shown in FIG. 10B .
  • a patterned layer 103 of SiN is then deposited as shown at 103 .
  • An ITO layer 107 is then deposited over the surface of layer 53 as shown at 107 in FIG. 10C and a patterned metal layer is deposited to form a serial connection electrode 104 and power contacts 105 and 106 .
  • FIG. 11 is a cross-sectional view of a light source having three segments.
  • Light source 150 utilizes segments 151 - 153 that are connected in series with the aid of series connection electrodes 162 and 163 .
  • the light source is powered by applying a potential difference greater than or equal to three times the voltage needed to power each of the individual segments between contacts 161 and 164 .
  • Light sources having even more segments can be constructed by duplicating segment 152 .

Abstract

A light source and method for making the same are disclosed. The light source includes a substrate, and a light emitting structure that is divided into segments. The light emitting structure includes a first layer of semiconductor material of a first conductivity type deposited on the substrate, an active layer overlying the first layer, and a second layer of semiconductor material of an opposite conductivity type from the first conductivity type overlying the active layer. A barrier divides the light emitting structure into first and second segments that are electrically isolated from one another. A serial connection electrode connects the first layer in the first segment to the second layer in the second segment. A power contact is electrically connected to the second layer in the first segment, and a second power contact is electrically connected to the first layer in the second segment.

Description

CROSS REFERENCE TO RELATED APPLICATIONS
This is a reissue of U.S. Pat. No. 8,207,543, issued on Jun. 26, 2012 from U.S. application Ser. No. 13/049,492 filed Mar. 16, 2011, which is a continuation of application Ser. No. 12/208,502 filed on Sep. 11, 2008 now U.S. Pat. No. 7,939,839.
BACKGROUND OF THE INVENTION
Light emitting diodes (LEDs) are an important class of solid-state devices that convert electric energy to light. Improvements in these devices have resulted in their use in light fixtures designed to replace conventional incandescent and fluorescent light sources. The LEDs have significantly longer lifetimes and, in some cases, significantly higher efficiency for converting electric energy to light.
For the purposes of this discussion, an LED can be viewed as having three layers, the active layer sandwiched between two other layers. The active layer emits light when holes and electrons from the outer layers combine in the active layer. The holes and electrons are generated by passing a current through the LED. The LED is powered through an electrode that overlies the top layer and a contact that provides an electrical connection to the bottom layer.
The cost of LEDs and the power conversion efficiency are important factors in determining the rate at which this new technology will replace conventional light sources and be utilized in high power applications. The conversion efficiency of an LED is defined to be the ratio of optical power emitted by the LED to the electrical power dissipated. Electrical power that is not converted to light that leaves the LED is converted to heat that raises the temperature of the LED. Heat dissipation often places a limit on the power level at which an LED operates.
The efficiency of conversion of electricity to light depends on the quantum efficiency that depends on the material system in which the LED is constructed, and also on the extraneous resistive losses. For GaN-based LEDs, the p-type layer that overlies the active layer has a very high electrical resistivity. This is also the top layer through which light exits in many designs. Consequently, a transparent conductive layer such as Indium Tin Oxide (ITO) is used to spread the current laterally across the chip and the sheet resistance of this ITO layer is chosen to be comparable to that of the n-type GaN layer underneath the active layers. For large area power chips, to further reduce the electrical resistance, metal electrode fingers are used both on the ITO layer as well as in trenches etched down to expose the n-GaN layer. These metal electrodes being opaque must be made as narrow as possible to minimize blockage of light but this increases the resistance per unit length for a given metal thickness. Thus for a given electrode width, the thickness of the electrode metal must be increased for higher current operation if the voltage drop across the length of the electrodes is to be kept constant and at a minimum.
In addition, the efficiency with which the active layer converts power to light also decreases with current density beyond some point depending on the specific design and quality of the active region layers. Accordingly, the amount of light per unit area of an LED reaches a practical limit. To provide higher light output once this limit is reached, the area of the LED must be increased. However, to provide adequate current spreading over the top surface of the LED, there is a limit to the size of an LED that can be powered from a single contact on the top surface of the LED. When the light is extracted through the top surface of the LED, a transparent conducting layer (such as ITO) is deposited over the top layer for reasons explained earlier. While this material has significantly less resistivity than the underlying GaN, the resistivity of the layer is still significant. In principle, the resistive losses in the ITO layer could be overcome by using thicker layers of ITO; however, ITO is only partially “transparent” with non-negligible absorption in the blue, and hence there is a practical limit to the thickness of the ITO layer. In practice, additional metal contacts are provided on the ITO layer to help with the current spreading; however, such contacts are opaque, and hence, reduce the light output.
As a result of the various tradeoffs between current spreading and absorption of light in the materials over the p-type layer, there is a practical limit to the size of a single LED. Hence, light sources that require more light output than can be provided by a single LED must be constructed from multiple smaller LEDs. To minimize cost, the multiple LEDs are constructed on the same die and are powered from common terminals on that die. Such light sources are sometimes referred to as segmented LEDs. Each segment, however, can be viewed as a single LED that is connected to the other LEDs on the die.
In prior art light sources of this design, the individual segments are connected in parallel. This leads to a number of problems. First, the maximum voltage that can be applied to the light source is determined by the maximum voltage a single LED can withstand, typically a few volts. As a result, the power supply that powers the light source must provide a very high current at a low voltage. This leads to further power losses in the conductors between the power supply and the light source. In addition, the brightness of the individual LEDs can vary over the light source due to processing variations across the die that cause variations in the resistance presented between the two contacts that power each LED.
SUMMARY OF THE INVENTION
The present invention includes a light source and method for making the same. The light source includes a substrate, and a light emitting structure that is divided into segments. The light emitting structure includes a first layer of semiconductor material of a first conductivity type deposited on the substrate, an active layer overlying the first layer, and a second layer of semiconductor material of an opposite conductivity type from the first conductivity type overlying the active layer. The light emitting structure also includes a barrier that divides the light emitting structure into first and second segments that are electrically isolated from one another. A serial connection electrode connects the first layer in the first segment to the second layer in the second segment. The light source is powered through first and second power contacts. The first power contact is electrically connected to the second layer in the first segment, and the second power contact is electrically connected to the first layer in the second segment. The first and second segments generate light when a potential difference is created between the first and second power contacts.
In one aspect of the invention, the barrier includes a trench extending through the light emitting structure. The serial connection electrode includes a layer of electrically conducting material deposited in the trench. The trench has an insulating layer that prevents the layer of electrically conducting material from making direct contact with the first layer or the active layer in the second segment.
In another aspect of the invention, the insulating layer underlies a portion of the serial connection electrode that overlies the active layer in the second segment.
In yet another aspect of the invention, the electrically conducting material includes a metal or ITO.
In a still further aspect of the invention, the barrier is transparent to light traveling in the first layer.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is top view of a prior art LED.
FIG. 2 is a cross-sectional view of prior art LED 20 through line 2-2 shown in FIG. 1.
FIG. 3 is a top view of prior art light source.
FIG. 4 is a cross-sectional view of prior art light source 40 through line 4-4 shown in FIG. 3.
FIG. 5 is a top view of one embodiment of a light source according to the present invention.
FIG. 6 is a cross-sectional view of light source 60 through line 6-6 shown in FIG. 5.
FIG. 7 is another cross-sectional view of light source 60.
FIG. 8 illustrates an embodiment of the present invention in which the light loss problem is reduced by using a clear insulator to fill the bottom of the isolation trench.
FIGS. 9A-9D illustrate the manner in which a light source that utilizes a metal serial connection electrode is fabricated.
FIGS. 10A-10C are cross-sectional views of a portion of a wafer having a light source in which the isolation trench is filled with glass.
FIG. 11 is a cross-sectional view of a light source having three segments.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS OF THE INVENTION
The manner in which the present invention provides its advantages can be more easily understood with reference to FIGS. 1 and 2, which illustrate a prior art GaN-based LED. FIG. 1 is top view of LED 20, and FIG. 2 is a cross-sectional view of LED 20 through line 2-2 shown in FIG. 1. LED 20 is constructed by growing a light emitting structure 21 having three layers on a sapphire substrate 19. The first layer 22 is an n-type GaN material. The second layer 23 is an active layer that emits light when holes and electrons combine therein. The third layer is a p-type GaN layer 24. Each of these layers may include a number of sub-layers. Since the functions of these sub-layers are well known in the art and are not central to the present discussion, the details of these sub-layers have been omitted from the drawings and the following discussion.
A trench 28 is etched through layers 23 and 24 and a contact 26 is deposited on the bottom surface of the trench 28 to provide an electrical connection to layer 22. The electrical connection to layer 24 is provided by a transparent electrode 27 that is typically constructed from indium tin oxide (ITO). Layer 27 is connected to a second contact 25 that provides the electrical connection to the power source. When power is provided to contacts 25 and 26, light is generated in active layer 23 and extracted from LED 20 through transparent electrode 27 as shown at 29.
The resistivity of p-type GaN is much greater than that of the n-type GaN. To maximize the light generation efficiency of LED 20, the current density across active layer 23 should be uniform. That is, the resistance of paths 31-33 should all be the same. In the absence of layer 27, the resistance of path 31 would be much lower than that of path 33, and hence, light generation would be concentrated in the active region around path 31 leading to a gradient in intensity across the surface of the LED. While the resistivity of ITO is significantly less than that of the p-type GaN, the resistance through the ITO layer is not negligible. As the power output of LEDs is increased, the losses in the ITO become significant and a gradient in light intensity results unless the ITO layer is increased in thickness. Unfortunately, as the ITO thickness increases, the amount of light absorbed in the ITO also increases. The light losses from absorption of light in the ITO become significant when the layer is increased to accommodate the current densities required in high power LEDs.
As noted above, the prior art devices utilize a segmented design to increase the area of the light source that is emitting light, and hence, the total light output. Refer now to FIGS. 3 and 4, which illustrate a prior art segmented light source. FIG. 3 is a top view of light source 40, and FIG. 4 is a cross-sectional view of light source 40 through line 4-4 shown in FIG. 3. To simplify the discussion, light source 40 includes only two segments 51 and 52; however, it will be apparent that additional segments could be utilized. Light source 40 is constructed by growing the conventional three-layer structure 42 on a substrate 41. An ITO layer 44 is deposited over the p-layer. After the layers have been deposited, the structure is etched to expose layer 43 of the three-layer structure. An n-contact 46 is then deposited in the etched trench to provide electrical contact to layer 43. A p-contact 45 is deposited on the segmented ITO layer. The n-contacts in each segment are connected together as shown at 47. Similarly, the p-contacts in each segment are connected together as shown at 48.
It should be noted that this structure can only be utilized in an arrangement in which the segments are connected in parallel, since the segments share a common n-type layer that remains connected after the trenches are etched. Hence, the current that must be carried by conductors 47 and 48 is the sum of the currents needed to power the individual segments. Providing high currents at low voltages presents problems that increase the cost of the light source or decrease the efficiency of light generation. For example, the electrode metal thickness must be increased to lower the metallic resistance, which not only increases chip cost, since the metal is typically gold, but also introduces handling and mechanical issues.
Refer now to FIGS. 5 and 6, which illustrate a segmented LED light source that utilizes one aspect of the present invention. FIG. 5 is a top view of light source 60, and FIG. 6 is a cross-sectional view of light source 60 through line 6-6 shown in FIG. 5. Light source 60 includes two segments 64 and 65; however, it will be apparent from the following discussion that light sources having many more segments can be constructed from the teachings of the present invention. Light source 60 is constructed from the same three-layer LED structure in which the layers are grown on a sapphire substrate 51. The n-layer 52 is grown on substrate 51, and then the active layer 55 and p-layer 53 are grown over n-layer 52.
The segments 64 and 65 are separated by an isolation trench 66 that extends through layer 52 to substrate 51 thereby electrically isolating segments 64 and 65. Isolation trench 66 includes a plateau 67 that extends only partially into layer 52. The walls of isolation trench 66 are covered by an insulating layer 57 that includes an open area 58 for making electrical contact to the portion of layer 52 associated with each segment. Insulating layer 57 can be constructed from any material that provides an insulating layer that is free of pinhole defects. For example, SiNx can be used as the insulating material. Other materials can include polyimide, BCB, spin-on-glass and materials that are routinely used in the semiconductor industry for device planarization.
Similar trenches are provided on the ends of light source 60 as shown at 68 and 69. A serial connection electrode 59 is deposited in isolation trench 66 such that electrode 59 makes contact with layer 52 through opening 58 in insulating layer 57. Electrode 59 also makes electrical contact with ITO layer 56 in the adjacent segment. Hence, when power is provided via electrodes 61 and 62, segments 64 and 65 are connected in series. As a result, light source 60 operates at twice the voltage and half the current as light source 40 discussed above with respect to FIGS. 3 and 4.
In one aspect of the present invention, insulating layer 57 extends under electrodes 59 and 61 as shown at 57a in FIG. 6. Since electrode 59 is opaque, electrode 59 blocks light generated in the portion of active layer 55 immediately underlying electrode 59. In this regard, it should be noted that the thickness of the layers shown in the figures is not to scale. In practice, the thickness of layer 53 is much smaller than that of layer 52, and hence, electrode 59 blocks most of the light that is generated under electrode 59. Accordingly, current that passes through layer 55 under electrode 59 is substantially wasted, since most of the light generated by that current is lost. The insulating layer extension blocks current from flowing through this wasted area of layer 55, and hence, improves the overall efficiency of the light source. A similar issue is present under electrode 61, and hence, the insulating layer is extended under that electrode as well.
Refer now to FIG. 7, which is another cross-sectional view of light source 60. Serial connection electrode 59 can be constructed by depositing a layer of metal such as copper or aluminum. However, such a layer prevents light from moving between segments 64 and 65. In GaN based LEDs, a significant fraction of the light generated in active layer 55 is trapped within the light source due to internal reflections at the boundaries of the light source such as the boundary between substrate 51 and layer 52 and the boundary between layer 53 and ITO layer 56. An exemplary trapped ray is shown at 71.
The trapped light is reflected back and forth between the layers in question until the light is lost due to absorption unless the LED includes some mechanism that randomizes the angles of reflection at one or more of the reflecting surfaces. Typically, the upper surface of layer 53 is roughened. As a result, each time light impinges on boundary 72, the light is either passed through the roughened surface or reflected back at a different angle with respect to the normal to the average surface of layer 53. As a result, some of the light that is reflected at each reflection leaves the surface at an angle that will allow that light to escape the next time the light is reflected upward and encounters surface 72.
If electrode 59 is a metal, light ray 71 will be intercepted by electrode 59 and will either be reflected back into segment 64 or be lost rather than proceeding into segment 65 and again reaching the portion of surface 72 in segment 65. If the light is reflected back into segment 64, some fraction of the light will escape on subsequent encounters with surface 71. Unfortunately, layers of metal deposited on etched surfaces such as the surface of the isolation trench have a reflectivity that is significantly less than 100 percent. In this regard, it should be noted that the various layers in light source 60 are not drawn to scale. In practice, layer 52 is much thicker than the sum of layers 53 and 55. Hence, a significant fraction of the light that strikes electrode 59 will be lost.
In one aspect of the present invention, this light loss problem is reduced by utilizing a transparent conductor such as ITO for electrode 59. The transparency of electrode 59 for the purposes of propagating light between the segments is determined by the cross-section of the layer within the isolation trench that extends to substrate 51, i.e., “t” shown in FIG. 7. The resistance of electrode 59, on the other hand, is determined by the entire cross-sectional area of electrode 59, i.e., the dimension “T” shown in FIG. 7. Hence, electrode 59 can be made thick enough to have an acceptable light transmission while still providing a sufficiently low resistance to current flow between the segments.
It should also be noted that the portion of the insulating layer shown at 57a in FIG. 6 is not needed if electrode 59 is transparent, since light generated under electrode 59 can escape through electrode 59. Hence, the use of a transparent electrode material for electrode 59 also increases the usable area of segment 65.
Refer now to FIG. 8, which illustrates an embodiment of the present invention in which the light loss problem discussed above is reduced by using a clear insulator to fill the bottom of the isolation trench. In light source 80, the portion of the isolation trench that extends to substrate 51 is filled with a clear insulator such as the glass layer shown at 81. A separate metal electrode 82 is used to make the serial connection between segments 84 and 85.
Refer now to FIGS. 9A-9D, which illustrate the manner in which a light source that utilizes a metal serial connection electrode is fabricated. FIGS. 9A-9D are cross-sectional views of a portion of a wafer on which a light source 90 having two segments is shown at various stages in the fabrication process. Referring to FIG. 9A, light source 90 is constructed by depositing GaN layers 52, 55, and 53 on a sapphire substrate 51. This process is conventional in the art, and hence, will not be discussed in detail here. After the layers have been deposited, trenches 92a-92c are etched through layers 53 and 55 and into n-type layer 52.
Refer now to FIG. 9B. After trenches 92a-92c have been etched, the wafer is masked and trenches 93a-93c are etched down to substrate 51. Trench 93b is used to construct the isolation trench discussed above. Referring to FIG. 9c, a patterned insulating layer 94 of SiN is then deposited on the walls of the trenches, and openings 95 are etched in layer 94 to provide electrical access to layer 52.
Refer now to FIG. 9D. Next a patterned ITO layer 96 is deposited over the p-type layer 53. In embodiments in which the layer 53 is roughened to improve light extraction, the top surface of layer 53 is etched to provide the desired scattering features before layer 96 is deposited. A patterned metal layer is then deposited to provide the serial connection electrode 97 and contacts 98 and 99 that are used to power light source 90.
As noted above, embodiments of the present invention in which serial connection electrode 97 is constructed from ITO have advantages in terms of light extraction. In such embodiments, the serial connection electrode is constructed from ITO or a similar transparent conductor, the serial connection electrode is deposited at the same time as layer 96.
The construction of embodiments in which the isolation trench includes a clear insulator are constructed in an analogous manner. Refer now to FIGS. 10A-10C, which are cross-sectional views of a portion of a wafer having a light source 100 in which the isolation trench is filled with glass. Refer now to FIG. 10A. The fabrication process proceeds in the same manner as described above with respect to FIGS. 9A and 9B. After the isolation trench has been opened, the isolation trench is filled with glass as shown at 101. The glass layer is then partially etched to open a trench down to the plateau in layer 52 leaving a glass wall 102 as shown in FIG. 10B. A patterned layer 103 of SiN is then deposited as shown at 103. An ITO layer 107 is then deposited over the surface of layer 53 as shown at 107 in FIG. 10C and a patterned metal layer is deposited to form a serial connection electrode 104 and power contacts 105 and 106.
The above-described embodiments of the present invention have only two segments. However, light sources having more than two segments can be constructed without deviating from the teachings of the present invention. Refer now to FIG. 11, which is a cross-sectional view of a light source having three segments. Light source 150 utilizes segments 151-153 that are connected in series with the aid of series connection electrodes 162 and 163. The light source is powered by applying a potential difference greater than or equal to three times the voltage needed to power each of the individual segments between contacts 161 and 164. Light sources having even more segments can be constructed by duplicating segment 152.
The above-described embodiments of the present invention have been provided to illustrate various aspects of the present invention. However, it is to be understood that different aspects of the present invention that are shown in different specific embodiments can be combined to provide other embodiments of the present invention. In addition, various modifications to the present invention will become apparent to those skilled in the art from the foregoing description and accompanying drawings. Accordingly, the present invention is to be limited solely by the scope of the following claims.

Claims (34)

What is claimed is:
1. A light source comprising:
a substrate;
a light emitting structure comprising:
a first layer of semiconductor material of a first conductivity type deposited on said substrate;
an active layer overlying said first layer; and
a second layer of semiconductor material of an opposite conductivity type from said first conductivity type overlying said active layer;
a transparent conducting layer overlying said second layer of semiconductor material;
a barrier trench that extends through said light emitting structure to said substrate and divides said light emitting structure into first and second segments that are electrically isolated from one another;
a serial connection electrode that connects said first layer in said first segment to said transparent conducting layer in said second segment;
an insulating layer between said second layer and said transparent conducting layer in said second segment, said insulating layer underlying said serial connection electrode such that current flowing from said serial connection electrode is blocked by said insulating layer in a region underlying said serial connection electrode;
a first power contact electrically connected to said second layer in said first segment; and
a second power contact electrically connected to said first layer in said second segment, wherein said first and second segments generate light when a potential difference is created between said first and second power contacts.
2. The light source of claim 1 wherein said barrier comprises a trench extending through said light emitting structure.
3. The light source of claim 2 1 wherein said serial connection electrode comprises a layer of electrically conducting material deposited in said trench, said trench having an insulating layer that prevents said layer of electrically conducting material from making direct contact with said first layer or said active layer in said second segment.
4. The light source of claim 2 1 comprising an insulating layer underlying a portion of said serial connection electrode that overlies said active layer in said second segment.
5. The light source of claim 3 wherein said electrically conducting material comprises a metal.
6. The light source of claim 3 wherein said electrically conducting material comprises ITO.
7. The light source of claim 2 1 wherein said harrier serial connection electrode is transparent to light traveling in said first layer.
8. A method for fabricating a light source, said method comprising:
depositing a light emitting structure on a substrate, said light emitting structure comprising:
a first layer of semiconductor material of a first conductivity type deposited on said substrate;
an active layer overlying said first layer;
a second layer of semiconductor material of an opposite conductivity type from said first conductivity type overlying said active layer;
an insulting insulating pad on said second layer of semiconductor material; and
a transparent conducting layer overlying said second layer of semiconductor material and said insulating pad;
generating a barrier trench that extends through said light emitting structure to said substrate and divides said light emitting structure into first and second segments that are electrically isolated from one another;
depositing a serial connection electrode that connects said first layer in said first segment to said transparent conducting layer in said second segment, said serial connection electrode overlying said insulating pad such that current flowing from said serial connection electrode is blocked by said insulating pad in a region underlying said serial connection electrode;
providing a first power contact electrically connected to said second layer in said first segment; and
providing a second power contact electrically connected to said first layer in said second segment, wherein said first and second segments generate light when a potential difference is created between said first and second power contacts.
9. The method of claim 8 wherein said barrier is generated by etching a trench extending through said light emitting structure to said substrate.
10. The method of claim 9 8 wherein said insulating pad is formed by depositing an insulating material in said trench and on said second layer of semiconductor material, and said depositing said serial connection electrode comprises depositing an insulating layer in said trench, and depositing a layer of electrically conducting material in said trench over said insulating layer pad, said insulating layer pad preventing said layer of electrically conducting material from making direct contact with said first layer or said active layer in said second segment.
11. The method of claim 9 8 wherein said insulating layer pad underlies a portion of said serial connection electrode that overlies said active layer in said second segment.
12. The method of claim 10 wherein said electrically conducting material comprises a metal.
13. The method of claim 10 wherein said electrically conducting material comprises ITO.
14. The method of claim 9 8 wherein said barrier serial connection electrode is transparent to light traveling in said first layer.
15. A light source comprising:
a substrate;
a light emitting structure comprising:
a first layer of semiconductor material of a first conductivity type deposited on said substrate;
an active layer overlying said first layer; and
a second layer of semiconductor material of an opposite conductivity type from said first conductivity type overlying said active layer;
a transparent conducting layer overlying said second layer of semiconductor material;
a barrier that divides said light emitting structure into first and second segments that are isolated from one another;
a serial connection electrode that connects said first layer in said first segment to said transparent conducting layer in said second segment;
an insulating layer between said second layer and said transparent conducting layer in said second segment, said insulating layer underlying said serial connection electrode such that current flowing from said serial connection electrode is blocked by said insulating layer in a region underlying said serial connection electrode; and
an electrode electrically connected to said first layer in said second segment,
wherein said first and second segments generate light when a potential difference is created between said second layer in said first segment and said first layer in said second segment,
wherein a top surface of said serial connection electrode is positioned lower than a top surface of said electrode.
16. The light source of claim 15, wherein said barrier comprises a trench extending through said light emitting structure.
17. The light source of claim 16, wherein said serial connection electrode comprises a layer of electrically conducting material deposited in said trench, said trench having an insulating layer that prevents said layer of electrically conducting material from making direct contact with said first layer or said active layer in said second segment.
18. The light source of claim 17, wherein said electrically conducting material comprises a metal.
19. The light source of claim 17, wherein said electrically conducting material comprises ITO.
20. The light source of claim 16, comprising an insulating layer underlying a portion of said serial connection electrode that overlies said active layer in said second segment.
21. The light source of claim 16, wherein said barrier is transparent to light traveling in said first layer.
22. A method for fabricating a light source, said method comprising:
depositing a light emitting structure on a substrate, said light emitting structure comprising:
a first layer of semiconductor material of a first conductivity type deposited on said substrate;
an active layer overlying said first layer;
a second layer of semiconductor material of an opposite conductivity type from said first conductivity type overlying said active layer;
an insulating layer on said second layer of semiconductor material; and
a transparent conducting layer overlying said second layer of semiconductor material and said insulating layer;
generating a barrier that divides said light emitting structure into first and second segments that are isolated from one another;
depositing a serial connection electrode that connects said first layer in said first segment to said transparent conducting layer in said second segment, said serial connection electrode overlying said insulating layer such that current flowing from said serial connection electrode is blocked by said insulating layer in a region underlying said serial connection electrode; and
providing an electrode electrically connected to said first layer in said second segment,
wherein said first and second segments generate light when a potential difference is created between said second layer in said first segment and said first layer in said second segment, and a top surface of said serial connection electrode is positioned lower than a top surface of said electrode.
23. The method of claim 22, wherein said barrier is generated by etching a trench extending through said light emitting structure to said substrate.
24. The method of claim 23, wherein said insulating layer is formed by depositing an insulating material in said trench and on said second layer of semiconductor material, and said depositing said serial connection electrode comprises depositing a layer of electrically conducting material in said trench over said insulating layer, said insulating layer preventing said layer of electrically conducting material from making direct contact with said first layer or said active layer in said second segment.
25. The method of claim 24, wherein said electrically conducting material comprises a metal.
26. The method of claim 24, wherein said electrically conducting material comprises ITO.
27. The method of claim 23, wherein said insulating layer underlies a portion of said serial connection electrode that overlies said active layer in said second segment.
28. The method of claim 22, wherein said serial connection electrode is transparent to light traveling in said first layer.
29. A light source comprising:
a substrate;
a light emitting structure comprising:
a first layer of semiconductor material of a first conductivity type deposited on said substrate;
an active layer overlying said first layer; and
a second layer of semiconductor material of an opposite conductivity type from said first conductivity type overlying said active layer;
a transparent conducting layer overlying said second layer of semiconductor material;
a trench that extends through said light emitting structure to said substrate and divides said light emitting structure into first and second segments that are isolated from one another;
a serial connection electrode that connects said first layer in said first segment to said transparent conducting layer in said second segment; and
an insulating layer between said second layer and said transparent conducting layer in said second segment, said insulating layer underlying said serial connection electrode such that current flowing from said serial connection electrode is blocked by said insulating layer in a region underlying said serial connection electrode,
wherein said first and second segments generate light when a potential difference is created between said second layer in said first segment and said first layer in said second segment.
30. The light source of claim 29, wherein said serial connection electrode comprises a layer of electrically conducting material deposited in said trench, said trench having an insulating layer that prevents said layer of electrically conducting material from making direct contact with said first layer or said active layer in said second segment.
31. The light source of claim 30, wherein said electrically conducting material comprises a metal.
32. The light source of claim 30, wherein said electrically conducting material comprises ITO.
33. The light source of claim 29, comprising an insulating layer underlying a portion of said serial connection electrode that overlies said active layer in said second segment.
34. The light source of claim 29, wherein said serial connection electrode is transparent to light traveling in said first layer.
US14/314,987 2008-09-11 2014-06-25 Series connected segmented LED Active USRE46155E1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/314,987 USRE46155E1 (en) 2008-09-11 2014-06-25 Series connected segmented LED

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/208,502 US7939839B2 (en) 2008-09-11 2008-09-11 Series connected segmented LED
US13/049,492 US8207543B2 (en) 2008-09-11 2011-03-16 Series connected segmented LED
US14/314,987 USRE46155E1 (en) 2008-09-11 2014-06-25 Series connected segmented LED

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US13/049,492 Reissue US8207543B2 (en) 2008-09-11 2011-03-16 Series connected segmented LED

Publications (1)

Publication Number Publication Date
USRE46155E1 true USRE46155E1 (en) 2016-09-20

Family

ID=41798442

Family Applications (3)

Application Number Title Priority Date Filing Date
US12/208,502 Active 2029-06-12 US7939839B2 (en) 2008-09-11 2008-09-11 Series connected segmented LED
US13/049,492 Ceased US8207543B2 (en) 2008-09-11 2011-03-16 Series connected segmented LED
US14/314,987 Active USRE46155E1 (en) 2008-09-11 2014-06-25 Series connected segmented LED

Family Applications Before (2)

Application Number Title Priority Date Filing Date
US12/208,502 Active 2029-06-12 US7939839B2 (en) 2008-09-11 2008-09-11 Series connected segmented LED
US13/049,492 Ceased US8207543B2 (en) 2008-09-11 2011-03-16 Series connected segmented LED

Country Status (8)

Country Link
US (3) US7939839B2 (en)
EP (1) EP2338183B1 (en)
JP (2) JP2012507134A (en)
KR (1) KR101575922B1 (en)
CN (1) CN102132429B (en)
HK (1) HK1158827A1 (en)
TW (1) TWI462282B (en)
WO (1) WO2010030482A2 (en)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8698184B2 (en) * 2011-01-21 2014-04-15 Cree, Inc. Light emitting diodes with low junction temperature and solid state backlight components including light emitting diodes with low junction temperature
US9443903B2 (en) 2006-06-30 2016-09-13 Cree, Inc. Low temperature high strength metal stack for die attachment
US8368100B2 (en) * 2007-11-14 2013-02-05 Cree, Inc. Semiconductor light emitting diodes having reflective structures and methods of fabricating same
US7939839B2 (en) * 2008-09-11 2011-05-10 Bridgelux, Inc. Series connected segmented LED
TWI418060B (en) * 2008-12-26 2013-12-01 Lextar Electronics Corp Method for fabricating light emitting diode chip
US7982409B2 (en) * 2009-02-26 2011-07-19 Bridgelux, Inc. Light sources utilizing segmented LEDs to compensate for manufacturing variations in the light output of individual segmented LEDs
US8581229B2 (en) * 2009-11-23 2013-11-12 Koninklijke Philips N.V. III-V light emitting device with thin n-type region
KR101081135B1 (en) * 2010-03-15 2011-11-07 엘지이노텍 주식회사 Light emitting device, method for fabricating the light emitting device and light emitting device package
US8084775B2 (en) * 2010-03-16 2011-12-27 Bridgelux, Inc. Light sources with serially connected LED segments including current blocking diodes
JP5637210B2 (en) * 2010-06-25 2014-12-10 豊田合成株式会社 Semiconductor light emitting device
US20120037946A1 (en) * 2010-08-12 2012-02-16 Chi Mei Lighting Technology Corporation Light emitting devices
US10490598B2 (en) 2010-09-13 2019-11-26 Epistar Corporation Light-emitting structure having a plurality of light-emitting structure units
KR101650518B1 (en) 2010-09-13 2016-08-23 에피스타 코포레이션 Light-emitting structure
US9070851B2 (en) 2010-09-24 2015-06-30 Seoul Semiconductor Co., Ltd. Wafer-level light emitting diode package and method of fabricating the same
US8536594B2 (en) * 2011-01-28 2013-09-17 Micron Technology, Inc. Solid state lighting devices with reduced dimensions and methods of manufacturing
JP5541261B2 (en) * 2011-03-23 2014-07-09 豊田合成株式会社 Group III nitride semiconductor light emitting device
US8344392B2 (en) 2011-05-12 2013-01-01 Epistar Corporation Light-emitting element and the manufacturing method thereof
US9337366B2 (en) 2011-07-26 2016-05-10 Micron Technology, Inc. Textured optoelectronic devices and associated methods of manufacture
US8937323B2 (en) * 2011-09-02 2015-01-20 Stanley Electric Co., Ltd. LED array capable of reducing uneven brightness distribution
US8581267B2 (en) 2011-11-09 2013-11-12 Toshiba Techno Center Inc. Series connected segmented LED
TW201347141A (en) * 2012-05-04 2013-11-16 Chi Mei Lighting Tech Corp Light-emitting diode structure and method for manufacturing the same
CN103700682A (en) * 2012-05-04 2014-04-02 奇力光电科技股份有限公司 Light emitting diode structure and manufacturing method thereof
TW201407747A (en) * 2012-08-03 2014-02-16 Chi Mei Lighting Tech Corp Light-emitting diode structure and method for manufacturing the same
US8816383B2 (en) * 2012-07-06 2014-08-26 Invensas Corporation High performance light emitting diode with vias
US10804316B2 (en) * 2012-08-07 2020-10-13 Seoul Viosys Co., Ltd. Wafer level light-emitting diode array
US10388690B2 (en) 2012-08-07 2019-08-20 Seoul Viosys Co., Ltd. Wafer level light-emitting diode array
CN102983147A (en) * 2012-09-24 2013-03-20 杭州士兰明芯科技有限公司 Light emitting diode chip and production method thereof
KR101420789B1 (en) * 2012-12-05 2014-07-18 주식회사 세미콘라이트 Semiconductor light emitting device
KR101420788B1 (en) * 2012-12-05 2014-07-18 주식회사 세미콘라이트 Semiconductor light emitting device
KR20140073351A (en) 2012-12-06 2014-06-16 엘지이노텍 주식회사 Light Emitting Device
US9356212B2 (en) 2012-12-21 2016-05-31 Seoul Viosys Co., Ltd. Light emitting diode and method of fabricating the same
CN104885236B (en) * 2012-12-21 2017-12-19 首尔伟傲世有限公司 Light emitting diode
CN103915463B (en) * 2013-01-09 2016-12-28 新世纪光电股份有限公司 Light-emitting device
WO2014129688A1 (en) * 2013-02-25 2014-08-28 서울바이오시스 주식회사 Light-emitting diode with a plurality of light-emitting elements and method for manufacturing same
US10278243B2 (en) * 2014-03-06 2019-04-30 Seoul Semiconductor Co., Ltd. Backlight module with MJT LED and backlight unit including the same
KR102364160B1 (en) * 2014-03-06 2022-02-21 서울반도체 주식회사 Backlight module with mjt led and backlight unit having the same
US9520537B2 (en) * 2014-06-18 2016-12-13 X-Celeprint Limited Micro assembled LED displays and lighting elements
US9343633B1 (en) 2014-10-31 2016-05-17 Mikro Mesa Technology Co., Ltd. Light-emitting diode lighting device
CN104409605B (en) * 2014-11-28 2017-10-27 杭州士兰明芯科技有限公司 A kind of high-voltage chip LED structure and preparation method thereof
USD826871S1 (en) 2014-12-11 2018-08-28 Cree, Inc. Light emitting diode device
KR102326926B1 (en) * 2014-12-26 2021-11-16 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 Light emitting device, and lighting emitting device package
CN104733487B (en) * 2015-03-20 2018-01-09 厦门乾照光电股份有限公司 A kind of high-voltage LED with stereo luminous structure
JP2017059638A (en) * 2015-09-15 2017-03-23 株式会社東芝 Semiconductor light emitting element
CN205944139U (en) 2016-03-30 2017-02-08 首尔伟傲世有限公司 Ultraviolet ray light -emitting diode spare and contain this emitting diode module
WO2017220454A1 (en) 2016-06-23 2017-12-28 Koninklijke Philips N.V. Optical transmitter, optical receiver and optical link
KR102550005B1 (en) * 2016-07-15 2023-07-03 서울바이오시스 주식회사 Uv light emitting diode
US20210036049A1 (en) * 2019-07-31 2021-02-04 Epistar Corporation Light emitting device and manufacturing method thereof

Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000101136A (en) 1998-09-25 2000-04-07 Toshiba Corp Semiconductor light emitting device and drive method for semiconductor light emitting device
JP2002076437A (en) 2000-08-29 2002-03-15 Kyocera Corp Led array
JP2002359402A (en) 2001-03-29 2002-12-13 Lumileds Lighting Us Llc Monolithic series/parallel led array formed on highly resistive substrate
US20050062049A1 (en) 2003-09-23 2005-03-24 United Epitaxy Co., Ltd. Series connection of two light emitting diodes through semiconductor manufacture process
JP2005136142A (en) 2003-10-30 2005-05-26 Kyocera Corp Light emitting diode array device and light emitting diode printer using it
US20070065962A1 (en) * 2004-03-25 2007-03-22 Nanosolar, Inc. Manufacturing of optoelectronic devices
US20070102693A1 (en) 2003-12-24 2007-05-10 Hideo Nagai Semiconductor light emitting device, lighting module, lighting apparatus, display element, and manufacturing method for semiconductor light emitting device
WO2007081092A1 (en) * 2006-01-09 2007-07-19 Seoul Opto Device Co., Ltd. Del à couche d'ito et son procédé de fabrication
US20070284598A1 (en) 2004-09-02 2007-12-13 Yukio Shakuda Semiconductor Light Emitting Device
WO2008038910A1 (en) 2006-09-25 2008-04-03 Seoul Opto Device Co., Ltd. Light emitting diode having alingap active layer and method of fabricating the same
US20080083929A1 (en) * 2006-10-06 2008-04-10 Iii-N Technology, Inc. Ac/dc light emitting diodes with integrated protection mechanism
US20080211416A1 (en) * 2007-01-22 2008-09-04 Led Lighting Fixtures, Inc. Illumination devices using externally interconnected arrays of light emitting devices, and methods of fabricating same
US20080230765A1 (en) * 2007-03-19 2008-09-25 Seoul Opto Device Co., Ltd. Light emitting diode
US7560738B2 (en) * 2003-07-04 2009-07-14 Epistar Corporation Light-emitting diode array having an adhesive layer
US7880182B2 (en) * 2002-07-15 2011-02-01 Epistar Corporation Light-emitting element array
US7939839B2 (en) * 2008-09-11 2011-05-10 Bridgelux, Inc. Series connected segmented LED
US7982409B2 (en) * 2009-02-26 2011-07-19 Bridgelux, Inc. Light sources utilizing segmented LEDs to compensate for manufacturing variations in the light output of individual segmented LEDs

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4879250A (en) 1988-09-29 1989-11-07 The Boeing Company Method of making a monolithic interleaved LED/PIN photodetector array
US6307218B1 (en) * 1998-11-20 2001-10-23 Lumileds Lighting, U.S., Llc Electrode structures for light emitting devices
US6614056B1 (en) * 1999-12-01 2003-09-02 Cree Lighting Company Scalable led with improved current spreading structures
US6410942B1 (en) * 1999-12-03 2002-06-25 Cree Lighting Company Enhanced light extraction through the use of micro-LED arrays
US6869812B1 (en) * 2003-05-13 2005-03-22 Heng Liu High power AllnGaN based multi-chip light emitting diode
KR100721454B1 (en) * 2005-11-10 2007-05-23 서울옵토디바이스주식회사 Light emitting device for ac power operation having photonic crystal structure and method of fbbricating the same
JP5008911B2 (en) * 2006-07-04 2012-08-22 ローム株式会社 Semiconductor light emitting device and manufacturing method thereof
JP2008060132A (en) * 2006-08-29 2008-03-13 Rohm Co Ltd Semiconductor light emitting element and its fabrication process
CN101257071B (en) * 2007-03-02 2011-09-07 普瑞光电股份有限公司 LED element and method for making LED element

Patent Citations (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000101136A (en) 1998-09-25 2000-04-07 Toshiba Corp Semiconductor light emitting device and drive method for semiconductor light emitting device
JP2002076437A (en) 2000-08-29 2002-03-15 Kyocera Corp Led array
JP2002359402A (en) 2001-03-29 2002-12-13 Lumileds Lighting Us Llc Monolithic series/parallel led array formed on highly resistive substrate
US6547249B2 (en) 2001-03-29 2003-04-15 Lumileds Lighting U.S., Llc Monolithic series/parallel led arrays formed on highly resistive substrates
US7880182B2 (en) * 2002-07-15 2011-02-01 Epistar Corporation Light-emitting element array
US7560738B2 (en) * 2003-07-04 2009-07-14 Epistar Corporation Light-emitting diode array having an adhesive layer
US20050062049A1 (en) 2003-09-23 2005-03-24 United Epitaxy Co., Ltd. Series connection of two light emitting diodes through semiconductor manufacture process
JP2005136142A (en) 2003-10-30 2005-05-26 Kyocera Corp Light emitting diode array device and light emitting diode printer using it
US20070102693A1 (en) 2003-12-24 2007-05-10 Hideo Nagai Semiconductor light emitting device, lighting module, lighting apparatus, display element, and manufacturing method for semiconductor light emitting device
JP2007517378A (en) 2003-12-24 2007-06-28 松下電器産業株式会社 Semiconductor light emitting device, lighting module, lighting device, display element, and method for manufacturing semiconductor light emitting device
US20070065962A1 (en) * 2004-03-25 2007-03-22 Nanosolar, Inc. Manufacturing of optoelectronic devices
US20070284598A1 (en) 2004-09-02 2007-12-13 Yukio Shakuda Semiconductor Light Emitting Device
WO2007081092A1 (en) * 2006-01-09 2007-07-19 Seoul Opto Device Co., Ltd. Del à couche d'ito et son procédé de fabrication
US7700960B2 (en) * 2006-01-09 2010-04-20 Seoul Opto Device Co., Ltd. Light emitting diode with ITO layer and method for fabricating the same
WO2008038910A1 (en) 2006-09-25 2008-04-03 Seoul Opto Device Co., Ltd. Light emitting diode having alingap active layer and method of fabricating the same
US20080083929A1 (en) * 2006-10-06 2008-04-10 Iii-N Technology, Inc. Ac/dc light emitting diodes with integrated protection mechanism
US20080211416A1 (en) * 2007-01-22 2008-09-04 Led Lighting Fixtures, Inc. Illumination devices using externally interconnected arrays of light emitting devices, and methods of fabricating same
US20080230765A1 (en) * 2007-03-19 2008-09-25 Seoul Opto Device Co., Ltd. Light emitting diode
US8896011B2 (en) * 2007-03-19 2014-11-25 Seoul Viosys Co., Ltd. Light emitting diode
US7939839B2 (en) * 2008-09-11 2011-05-10 Bridgelux, Inc. Series connected segmented LED
US7982409B2 (en) * 2009-02-26 2011-07-19 Bridgelux, Inc. Light sources utilizing segmented LEDs to compensate for manufacturing variations in the light output of individual segmented LEDs

Non-Patent Citations (7)

* Cited by examiner, † Cited by third party
Title
Chinese Office Action dated Sep. 9, 2013, corresponding to Chinese Patent Application No. 200980132907.0.
Communication Pursuant to Article 94(3) EPC for European Patent App. No. 09813430.7 (Jun. 16, 2016).
European Search Report dated Feb. 21, 2013 corresponding to Application No. 09 813 430.7.
International Preliminary Report on Patentability, PCT/US2009/054456, Mar. 24, 2011, all pages.
Japanese Office Action dated Oct. 16, 2012, corresponding to Japanese Patent Application No. 2011-526896.
Korean Office Action dated Apr. 21, 2015, corresponding to Korean Application No. 10-2011-7005709.
Notification of Reasons for Refusal dated Oct. 10, 2012 corresponding to Application No. 2011-526896.

Also Published As

Publication number Publication date
CN102132429B (en) 2015-08-26
EP2338183A4 (en) 2013-03-27
WO2010030482A2 (en) 2010-03-18
EP2338183A2 (en) 2011-06-29
WO2010030482A3 (en) 2010-05-27
HK1158827A1 (en) 2012-07-20
JP2013232677A (en) 2013-11-14
US7939839B2 (en) 2011-05-10
TW201027798A (en) 2010-07-16
KR101575922B1 (en) 2015-12-08
US8207543B2 (en) 2012-06-26
US20110163347A1 (en) 2011-07-07
CN102132429A (en) 2011-07-20
US20100059768A1 (en) 2010-03-11
JP2012507134A (en) 2012-03-22
TWI462282B (en) 2014-11-21
EP2338183B1 (en) 2018-01-10
JP5586748B2 (en) 2014-09-10
KR20110057152A (en) 2011-05-31

Similar Documents

Publication Publication Date Title
USRE46155E1 (en) Series connected segmented LED
US8026527B2 (en) LED structure
TWI515919B (en) Improved multi-junction led
CN103400920B (en) Light emitting device, light emitting device manufacturing method, light emitting package, and lighting system
CN109980060A (en) Show equipment
US20220028921A1 (en) Wafer level light-emitting diode array
US11139338B2 (en) Wafer level light-emitting diode array
JP2018529230A (en) Light emitting device and light emitting device package including the same
US20120056193A1 (en) Series Connected Segmented LED
EP2610929A2 (en) Light emitting device
KR102568298B1 (en) Semiconductor device
TWI575783B (en) Optoelectronic semiconductor chip and method for manufacturing optoelectronic semiconductor chip
CN101286541A (en) Semi-conductor illuminating device having fold transparent electrode
KR101893578B1 (en) Light emitting diode array on wafer level
CN109873065A (en) A kind of semiconductor light-emitting elements
US20220326297A1 (en) Method for testing light-emitting devices
KR20130074563A (en) Light emitting device
KR20180012627A (en) Semiconductor device

Legal Events

Date Code Title Description
AS Assignment

Owner name: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION,

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KABUSHIKI KAISHA TOSHIBA;REEL/FRAME:046364/0164

Effective date: 20180611

AS Assignment

Owner name: SAMSUNG ELECTRONICS CO., LTD., KOREA, REPUBLIC OF

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION;REEL/FRAME:046986/0159

Effective date: 20180720

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 8

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 12