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Publication numberUSD331665 S
Publication typeGrant
Application number07/773,397
Publication date15 Dec 1992
Filing date2 Oct 1992
Inventors
Kimberly K. Underhill
Original Assignee
Kimberly-Clark Corporation
U.S. Classification
D05/53
References
External Links
USPTO
USPTO Assignment
Espacenet
Embossed tissue
US D331665 S
Claims

  1. The ornamental design for an embossed tissue, as shown and described.

Description

The single FIGURE is a top plan view of an embossed tissue showing my new design. A unit of repeat is shown within the broken lines.

Referenced by
Citing PatentFiling datePublication dateApplicantTitle
US61939189 Apr 199927 Feb 2001The Procter & Gamble CompanyHigh speed embossing and adhesive printing process and apparatus
US625120724 Mar 199926 Jun 2001Kimberly-Clark Worldwide, Inc.Embossing and laminating irregular bonding patterns
US625496521 Jun 19993 Jul 2001The Procter & Gamble CompanyThree-dimensional nesting-resistant sheet materials and method and apparatus for making
US64210529 Apr 199916 Jul 2002The Procter & Gamble CompanyMethod of seaming and expanding amorphous patterns
US654109822 Dec 20001 Apr 2003Avery Dennison CorporationThree-dimensional flexible adhesive film structures
US658963413 Mar 20018 Jul 2003Kimberly-Clark Worldwide, Inc.Embossing and laminating irregular bonding patterns
US660245411 Jan 20015 Aug 2003The Procter & Gamble CompanyHigh speed embossing and adhesive printing process and apparatus
US677364710 Jan 200210 Aug 2004The Procter & Gamble CompanyHigh speed embossing and adhesive printing process and apparatus
US687234231 May 200229 Mar 2005The Procter & Gamble CompanyEmbossing and adhesive printing process
US688147125 Oct 200119 Apr 2005The Procter & Gamble CompanyHigh speed embossing and adhesive printing process and apparatus
US76128475 Sep 20023 Nov 2009Nec CorporationGeneration of pattern data with no overlapping or excessive distance between adjacent patterns
US77870797 Aug 200931 Aug 2010Nec CorporationGeneration of pattern data with no overlapping or excessive distance between adjacent dot patterns
US78557662 Apr 200921 Dec 2010Nec Lcd Technologies, LtdGeneration of pattern data with no overlapping or excessive distance between adjacent patterns