US7923365B2 - Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon - Google Patents
Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon Download PDFInfo
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- US7923365B2 US7923365B2 US11/874,118 US87411807A US7923365B2 US 7923365 B2 US7923365 B2 US 7923365B2 US 87411807 A US87411807 A US 87411807A US 7923365 B2 US7923365 B2 US 7923365B2
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- sacrificial spacer
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- 125000006850 spacer group Chemical group 0.000 title claims abstract description 73
- 238000000034 method Methods 0.000 title claims abstract description 36
- 230000005669 field effect Effects 0.000 title claims abstract description 26
- 230000001939 inductive effect Effects 0.000 title claims abstract description 17
- 239000004065 semiconductor Substances 0.000 claims description 60
- 239000000758 substrate Substances 0.000 claims description 53
- 229910021332 silicide Inorganic materials 0.000 claims description 40
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims description 40
- 238000005530 etching Methods 0.000 claims description 25
- 229910052751 metal Inorganic materials 0.000 claims description 23
- 239000002184 metal Substances 0.000 claims description 23
- 238000000151 deposition Methods 0.000 claims description 10
- 150000004767 nitrides Chemical class 0.000 claims description 5
- 229920002120 photoresistant polymer Polymers 0.000 claims description 4
- 238000001312 dry etching Methods 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 2
- 238000002513 implantation Methods 0.000 abstract description 2
- 230000001965 increasing effect Effects 0.000 description 7
- 239000012535 impurity Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000002955 isolation Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000010354 integration Effects 0.000 description 2
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 206010010144 Completed suicide Diseases 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 229910003070 TaOx Inorganic materials 0.000 description 1
- 229910003087 TiOx Inorganic materials 0.000 description 1
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical compound [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- HLLICFJUWSZHRJ-UHFFFAOYSA-N tioxidazole Chemical compound CCCOC1=CC=C2N=C(NC(=O)OC)SC2=C1 HLLICFJUWSZHRJ-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7833—Field effect transistors with field effect produced by an insulated gate with lightly doped drain or source extension, e.g. LDD MOSFET's; DDD MOSFET's
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/6653—Unipolar field-effect transistors with an insulated gate, i.e. MISFET using the removal of at least part of spacer, e.g. disposable spacer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7842—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate
- H01L29/7843—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate the means being an applied insulating layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/665—Unipolar field-effect transistors with an insulated gate, i.e. MISFET using self aligned silicidation, i.e. salicide
Definitions
- the present invention relates to methods of forming integrated circuit devices and, more particularly, to methods of forming field effect transistors and transistors formed thereby.
- a metal oxide semiconductor field effect transistor includes a gate electrode, which is formed on a semiconductor substrate and insulated by a thin gate insulating film, and source/drain regions formed on both sides of the gate electrode.
- a gate electrode which is formed on a semiconductor substrate and insulated by a thin gate insulating film, and source/drain regions formed on both sides of the gate electrode.
- a channel region is formed under the gate insulating film. That is, the channel region may be formed by appropriately controlling the bias voltage applied to the gate electrode of the MOSFET.
- One of the methods of increasing mobility of electrons or holes is to apply physical stress to a channel region and thus modify the structure of an energy band of the channel region. For example, if tensile stress is applied to a channel region of an N-type transistor, the performance of the N-type transistor is enhanced. Also, the performance of a P-type transistor can be enhanced by applying compressive stress to its channel region.
- Methods of forming integrated circuit devices include forming a field effect transistor having a gate electrode, a sacrificial spacer on a sidewall of the gate electrode and silicided source/drain regions.
- the sacrificial spacer is used as an implantation mask when forming highly doped portions of the source/drain regions.
- the sacrificial spacer is then removed from the sidewall of the gate electrode.
- a stress-inducing electrically insulating layer which is configured to induce a net tensile stress (for NMOS transistors) or compressive stress (for PMOS transistors) in a channel region of the field effect transistor, is then formed on the sidewall of the gate electrode. This stress-inducing electrically insulating layer operates to increase a mobility of charge carriers in the channel region.
- the silicided source/drain regions include a source region having a first metal silicide layer thereon that is self-aligned to the sacrificial spacer.
- the removing of the sacrificial spacer includes forming a mask layer on the field effect transistor and partially etching back the mask layer to expose the sacrificial spacer. The exposed sacrificial spacer is then selectively etched using the mask layer to protect the first metal silicide layer from etching damage.
- the mask layer may be a photoresist layer and the sacrificial spacer may include a nitride insulating material.
- the field effect transistor may also include a second metal silicide layer on the gate electrode and the partially etching may include partially etching back the mask layer to expose the sacrificial spacer and the second metal silicide layer.
- the selectively etching includes exposing the second metal silicide layer to a wet and/or dry etchant.
- the partially etched-back mask layer may also be removed and the step of forming a stress-inducing electrically insulating layer includes depositing a stress-inducing electrically insulating layer on the second metal silicide layer.
- Methods of forming integrated circuit devices may also include forming a field effect transistor having a gate electrode, a sacrificial spacer on a sidewall of the gate electrode and LDD source/drain regions, on a semiconductor substrate. Then, during subsequent processing, the sacrificial spacer is replaced with a stress-inducing electrically insulating layer that is configured to induce a net tensile or compressive stress in a channel region of the field effect transistor.
- the LDD source/drain regions may have silicided layers thereon and replacing the sacrificial spacer may include selectively etching the sacrificial spacer using a mask layer to protect the silicided layers from etching damage.
- FIGS. 1 through 10 are cross-sectional views of intermediate structures that illustrate methods of fabricating semiconductor integrated circuit devices according to embodiments of the present invention.
- a device isolation region 102 defining an active region is formed on a semiconductor substrate 100 .
- the semiconductor substrate 100 may be a silicon substrate, silicon on insulator (SOI) substrate, a gallium arsenide substrate, a silicon germanium substrate, a ceramic substrate, a quartz substrate or a display glass substrate, for example.
- the semiconductor substrate 100 may be a P-type substrate or an N-type substrate. In many cases, a P-type substrate is used as the semiconductor substrate 100 .
- a P-type epitaxial layer may be grown on the semiconductor substrate 100 .
- the semiconductor substrate 100 may include a P-type well doped with p-type impurities or an N-type well doped with n-type impurities.
- the device isolation region 102 which defines the active region and an inactive region, may be shallow trench isolation (STI) region or a field oxide (FOX) region.
- a gate insulating film 110 and a gate electrode 120 are formed on the active region of the semiconductor substrate 100 .
- an insulating film for a gate insulating film and a conductive film for a gate electrode are sequentially deposited on the semiconductor substrate 100 and then patterned to form the gate insulating film 110 and the gate electrode 120 .
- the gate insulating film 110 may be formed of SiOx, SiON, TiOx, TaOx, or the like.
- the gate insulating film 110 may be formed by chemical vapor deposition (CVD) or sputtering, for example.
- the gate electrode 120 is a conductor and may have a structure in which one or more of polysilicon, metal, metal silicide and metal nitride films doped with n-type or p-type impurities are stacked.
- the gate electrode 120 may also include a metal such as W, Co, Ni, Ti, Ta or the like.
- a first spacer 130 is formed on side surfaces of the gate insulating film 110 and the gate electrode 120 .
- the first spacer 130 may be formed by performing an oxidation process on the semiconductor substrate 100 .
- the oxide film may extend along the side surfaces of the gate insulating film 110 and the gate electrode 120 and a top surface of the semiconductor substrate 100 , as illustrated.
- the oxide film formed on the side surfaces of the gate insulating film 110 and the gate electrode 120 is the first spacer 130 and protects the side surface of the gate electrode 120 . While the oxidation process for forming the first spacer 130 is performed, defects in the semiconductor substrate 100 can be reduced. Consequently, the reliability of a semiconductor device to be formed can be enhanced.
- a second spacer 140 is formed on a side surface of the first spacer 130 , and a source/drain region 150 aligned with the gate electrode 120 is formed.
- the source/drain region 150 may have a double diffused drain (DDD) structure or a lightly doped drain (LDD) structure.
- DDD double diffused drain
- LDD lightly doped drain
- a insulating film (not shown) is conformally formed on a front surface of the semiconductor substrate 100 .
- the insulating film may be, for example, a nitride film.
- the insulating film may be conformally formed on the front surface of the semiconductor substrate 100 by, for example, CVD. Next, the insulating film is anisotropically etched to form the second spacer 140 on the side surface of the first spacer 130 . Then, high-concentration impurities are injected into the semiconductor substrate 100 using the second spacer 140 as a mask, thereby completing the self-aligned source/drain region 150 .
- MOS metal oxide semiconductor
- arsenic (As) or phosphorus (P) ions can be ion-implanted using several tens of keV of energy in order to form the source/drain region 150 .
- B, BF 2 or BF 3 or In is heavily ion-implanted using several tens of keV of energy in order to form the source/drain region 150 .
- silicide layers 162 and 164 are formed on the source/drain region 150 and a top surface of the gate electrode 120 in a silicide process.
- a metal layer (not shown) is formed on the front surface of the semiconductor substrate 100 .
- the metal layer may be formed of Ti, Pt, Pd, Co, Ni, or W by sputtering.
- an annealing process for thermally treating the semiconductor substrate 100 under certain processing conditions is performed as part of the suicide process.
- a silicide reaction occurs wherever the metal layer contacts silicon. Consequently, the silicide layers 162 and 164 are formed. Unreacted portions of the metal layer are removed through an etching or cleaning process.
- a mask layer 320 is formed to completely cover the second spacer 140 and the silicide layers 162 and 164 .
- the mask layer 320 may be formed of a material, such as photoresist, which can protect the semiconductor substrate 100 when the second spacer 140 is removed in a subsequent process.
- the mask layer 320 is partially removed in order to expose an upper portion of the second spacer 140 .
- the mask layer 320 may be partially removed in an etch-back process in order to expose the upper portion of the second spacer 140 .
- the mask layer 320 is partially removed so that the semiconductor substrate 100 is not exposed.
- the second spacer 140 is removed.
- the second spacer 140 may be removed by dry etching such as reactive ion etching (RIE).
- RIE reactive ion etching
- the second spacer 140 may be dry-etched using an etch gas which has a higher etch rate than that of the mask layer 320 .
- the second spacer 140 may be removed by wet etching.
- the second spacer 140 may be wet-etched using an etching solution, which has a higher etch rate than that of the mask layer 320 .
- the semiconductor substrate 100 is not damaged. That is, the semiconductor substrate 100 and the silicide layer 164 formed on the source/drain region 150 of the semiconductor substrate 100 can be protected while the second spacer 140 is removed. Therefore, the surface damage of the silicide layer 164 on the source/drain region 150 is less than that of the silicide layer 162 on the top surface of the gate electrode 120 .
- the surface damage includes physical damage to surface, increased resistance, generation of leakage current, and increased hot carrier, which are caused by physical and chemical impacts due to the etching process. If the second spacer 140 is removed, the distance between a stress layer and a channel region is reduced. Therefore, when the stress layer that is to be formed in a subsequent process applies stress, the stress can be more effectively delivered to the channel region.
- the mask layer 320 is removed.
- the mask layer 320 may be, for example, wet-etched. Since the mask layer 320 is formed of a material such as photoresist, it can be easily removed. Therefore, the semiconductor substrate 100 is not greatly damaged when the mask layer 320 is removed.
- a stress layer 210 is formed to cover the gate electrode 120 and the semiconductor substrate 100 .
- the stress layer 210 may be formed of a nitride film such as SiN.
- the stress layer 210 may be a tensile stress layer or a compressive stress layer.
- the tensile stress layer may be formed by, for example, low pressure CVD (LPCVD).
- the compressive stress layer may be formed by, for example, plasma enhanced CVD (PECVD).
- PECVD plasma enhanced CVD
- the tensile stress layer or the compressive stress layer may be formed in appropriate consideration of deposition conditions such as pressure and temperature.
- An N-type transistor or a P-type transistor may be formed on the semiconductor substrate 100 . If the N-type transistor is formed on the semiconductor substrate 100 , the stress layer 210 may be the tensile stress layer. If the P-type transistor is formed on the semiconductor substrate 100 , the stress layer 210 may be the compressive stress layer.
- the stress layer 210 applies stress to the channel region, thereby improving characteristics of the semiconductor device. That is, if the tensile stress layer is formed on the N-type transistor, the mobility of electrons is increased. If the compressive stress layer is formed on the P-type transistor, the mobility of holes is increased. Consequently, the characteristics of the semiconductor device can be improved.
- the second spacer 140 is removed, thereby reducing the distance between the stress layer 210 and the channel region. Therefore, the stress layer 210 can more effectively apply stress to the channel region.
- the mask layer 320 blocks the top surface of the semiconductor substrate 100 and thus protects the silicide layer 164 on the source/drain region 150 . Therefore, an increase in the resistance of the silicide layer 164 on the source/drain region 150 and an increase in leakage current caused by the damage to the silicide layer 164 can be prevented and the reliability of the semiconductor integrated circuit device can be enhanced.
- the semiconductor integrated circuit device includes the gate insulating film 110 , the gate electrode 120 , the source/drain region 150 , the silicide layers 162 and 164 , the first spacer 130 , and the stress layer 210 .
- the gate insulating film 110 is formed on the semiconductor substrate 100
- the gate electrode 120 is formed on the gate insulating film 110 .
- the source/drain region 150 is aligned with the gate electrode 120
- the silicide layers 162 and 164 are formed on the source/drain region and the top surface of the gate electrode 120 .
- the first spacer 130 extends from and along a side surface of the gate electrode 120 to a portion of the top surface of the semiconductor substrate 100 on which the silicide layers 162 and 164 are not formed.
- the stress layer 210 covers the gate electrode 120 and the semiconductor substrate 100 .
- the surface of the silicide layer 164 on the source/drain region 150 is less damaged than that of the silicide layer 162 on a top surface of the gate electrode 120 .
- the silicide layer 164 on the source/drain region 150 is separated a predetermined distance away from the gate electrode 120 .
- the first spacer 130 extending from the side surface of the gate electrode 120 is formed in a region of the semiconductor substrate 100 between the gate electrode 120 and the silicide layer 164 .
- the first spacer 130 may be an oxide film.
- the first spacer 130 may have a thickness similar to or less than that of the gate insulating film 110 .
- the stress layer 210 may be a tensile stress layer or a compressive stress layer. In particular, if the N-type transistor is formed on the semiconductor substrate 100 , the stress layer 210 may be the tensile stress layer. If the P-type transistor is formed on the semiconductor substrate 100 , the stress layer 210 may be the compressive stress layer.
- the semiconductor integrated circuit device of the present embodiment since no spacer is formed on a low-concentration region of the source/drain region 150 , the distance between the stress layer 210 and the channel region is reduced. Therefore, the stress layer 210 can more effectively apply stress to the channel region.
- the damage to the silicide layer 164 on the source/drain region 150 can be minimized during the processing processes. Therefore, the surface of the silicide layer 164 formed on the source/drain region 150 is less damaged than that of the silicide layer 162 formed on the gate electrode 120 . Since an increase in leakage current and silicide resistance due to the damage to the silicide layer 164 on the source/drain region 150 is prevented, the semiconductor integrated circuit device with enhanced reliability can be provided.
Abstract
Description
Claims (15)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/874,118 US7923365B2 (en) | 2007-10-17 | 2007-10-17 | Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon |
KR1020080032663A KR101405311B1 (en) | 2007-10-17 | 2008-04-08 | Method of fabricating semiconductor integrated circuit device and semiconductor integrated circuit device by the same |
SG200807581-4A SG152165A1 (en) | 2007-10-17 | 2008-10-10 | Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon and devices formed thereby |
US13/043,059 US20110156110A1 (en) | 2007-10-17 | 2011-03-08 | Field Effect Transistors Having Gate Electrode Silicide Layers with Reduced Surface Damage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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US11/874,118 US7923365B2 (en) | 2007-10-17 | 2007-10-17 | Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
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US13/043,059 Division US20110156110A1 (en) | 2007-10-17 | 2011-03-08 | Field Effect Transistors Having Gate Electrode Silicide Layers with Reduced Surface Damage |
Publications (2)
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US20090101979A1 US20090101979A1 (en) | 2009-04-23 |
US7923365B2 true US7923365B2 (en) | 2011-04-12 |
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Application Number | Title | Priority Date | Filing Date |
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US11/874,118 Active 2029-02-20 US7923365B2 (en) | 2007-10-17 | 2007-10-17 | Methods of forming field effect transistors having stress-inducing sidewall insulating spacers thereon |
US13/043,059 Abandoned US20110156110A1 (en) | 2007-10-17 | 2011-03-08 | Field Effect Transistors Having Gate Electrode Silicide Layers with Reduced Surface Damage |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
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US13/043,059 Abandoned US20110156110A1 (en) | 2007-10-17 | 2011-03-08 | Field Effect Transistors Having Gate Electrode Silicide Layers with Reduced Surface Damage |
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US (2) | US7923365B2 (en) |
KR (1) | KR101405311B1 (en) |
SG (1) | SG152165A1 (en) |
Cited By (2)
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US20090130851A1 (en) * | 2007-11-21 | 2009-05-21 | Makoto Hasegawa | Method for manufacturing semiconductor device |
US20110115000A1 (en) * | 2009-11-19 | 2011-05-19 | Qualcomm Incorporated | Semiconductor Device having Strain Material |
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CN102569301A (en) * | 2012-03-01 | 2012-07-11 | 上海宏力半导体制造有限公司 | SRAM (static random access memory) and forming method thereof |
JP2020155562A (en) * | 2019-03-20 | 2020-09-24 | ソニーセミコンダクタソリューションズ株式会社 | Semiconductor device and manufacturing method thereof |
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US20090101979A1 (en) | 2009-04-23 |
US20110156110A1 (en) | 2011-06-30 |
KR20090039584A (en) | 2009-04-22 |
KR101405311B1 (en) | 2014-06-13 |
SG152165A1 (en) | 2009-05-29 |
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