US7911063B2 - Semiconductor device - Google Patents
Semiconductor device Download PDFInfo
- Publication number
- US7911063B2 US7911063B2 US12/327,344 US32734408A US7911063B2 US 7911063 B2 US7911063 B2 US 7911063B2 US 32734408 A US32734408 A US 32734408A US 7911063 B2 US7911063 B2 US 7911063B2
- Authority
- US
- United States
- Prior art keywords
- layer
- interconnection
- interconnection layer
- semiconductor device
- bonding pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Geometry or layout of the interconnection structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Geometry or layout of the interconnection structure
- H01L23/5286—Arrangements of power or ground buses
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/0212—Auxiliary members for bonding areas, e.g. spacers
- H01L2224/02122—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
- H01L2224/02163—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
- H01L2224/02165—Reinforcing structures
- H01L2224/02166—Collar structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05073—Single internal layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/05001—Internal layers
- H01L2224/05075—Plural internal layers
- H01L2224/0508—Plural internal layers being stacked
- H01L2224/05085—Plural internal layers being stacked with additional elements, e.g. vias arrays, interposed between the stacked layers
- H01L2224/05089—Disposition of the additional element
- H01L2224/05093—Disposition of the additional element of a plurality of vias
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05554—Shape in top view being square
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05617—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/05624—Aluminium [Al] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
- H01L2224/056—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/05638—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/05647—Copper [Cu] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01021—Scandium [Sc]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01038—Strontium [Sr]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01074—Tungsten [W]
Definitions
- the present invention relates to a structure of a semiconductor device having a bonding pad, particularly to a structure of a semiconductor device for increasing strength against a stress applied to the bonding pad in probing and wire bonding.
- a mechanical stress is applied to a bonding pad formed on a top surface of a semiconductor chip during probing in an electric test of a semiconductor chip or during wire bonding in assembling a semiconductor device.
- the stress applied to the bonding pad possibly causes generation of a crack in an interlayer insulator below the bonding pad or generation of peel-off of the bonding pad during wire bonding.
- a crack is generated in the interlayer insulator below the bonding pad by the stress applied from outside to the bonding pad.
- the crack reaches a lower-layer interconnection, deterioration occurs to a metal migration-resistant property of the interconnection.
- strength thereof is relatively weak and a crack is easily generated. Therefore, disposition of an active element tends to be avoided. Accordingly, in order to prevent generation of a crack, desirably the interconnection and the active element do not carelessly pass below the bonding pad.
- WO2005/083767 discloses a structure of a semiconductor device in which strength against a stress applied from outside to a bonding pad is enhanced while achieving high integration of the semiconductor device.
- the structure of the semiconductor device disclosed in WO2005/083767 adopts a configuration in which at least five interconnection layers are provided below the bonding pad in a case where an interconnection and an active element are provided below the bonding pad (see FIGS. 44 and 45 of WO2005/083767).
- the stress applied from outside to the bonding pad is dispersed by adopting the structure, and stress concentration on a particular point is relieved to restrain deterioration in semiconductor device strength to a minimum, thereby allowing the high integration of the semiconductor device.
- the problem to be solved by the invention is that the production cost of the semiconductor device is increased when the stress concentration applied from outside on the particular point of the bonding pad of the semiconductor device is relieved to restrain the deterioration in semiconductor device strength to a minimum.
- a first interconnection layer that includes a bonding pad exposed from an opening provided in a surface protective film, a first via layer that is provided below the first interconnection layer, a second interconnection layer that is provided below the first via layer, a second via layer that is provided below the second interconnection layer, a third interconnection layer that is provided below the second via layer and disposed in a stripe shape, a third via layer that is provided below the third interconnection layer, a fourth interconnection layer that is provided below the third via layer and disposed in a stripe shape, a fourth via layer that is provided below the fourth interconnection layer, and a semiconductor layer that is provided below the fourth via layer, and a direction in which the third interconnection layer is extended is orthogonal to a direction in which the fourth interconnection layer is extended.
- the direction in which the fourth metal interconnection layer located on the semiconductor layer is extended is orthogonal to the direction in which the third interconnection layer located on the fourth interconnection layer is extended. Therefore, even in a case where a stress is applied from outside to the bonding pad located thereabove, the stress is wholly dispersed by the third interconnection layer and fourth interconnection layer which are laminated to intersect with each other, and stress concentration on the particular point can be relieved to restrain deterioration in semiconductor device strength to a minimum.
- an active element can be disposed below the interconnection layers of the four-layer structure, so that the high integration of the semiconductor device can be achieved. Because an additional step is not required in a production process, a production cost of the semiconductor device is not increased.
- FIG. 1 is a circuit diagram showing an input and output unit of a semiconductor device according to a first embodiment of the present invention.
- FIG. 2 is a layout chart showing a first metal interconnection layer and a bonding pad opening of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 3 is a layout chart showing a first via layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 4 is a layout chart showing a second metal interconnection layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 5 is a layout chart showing a second via layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 6 is a layout chart showing a third metal interconnection layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 7 is a layout chart showing a third via layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 8 is a layout chart showing a fourth metal interconnection layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 9 is a layout chart showing a fourth via layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 10 is a layout chart showing an active region and a polysilicon electrode layer of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 11 is a sectional view (taken on a line A-A and seen along an arrow) showing the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 12 is a sectional view (taken on a line B-B and seen along an arrow) showing the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 13 is a layout chart showing an interconnection of the input and output unit in the semiconductor device according to the first embodiment of the present invention.
- FIG. 14 is a layout chart showing an interconnection of a semiconductor chip according to the first embodiment of the present invention.
- FIG. 15 is a layout chart showing an interconnection of an input and output unit in a semiconductor device according to a second embodiment of the present invention.
- FIG. 16 is a sectional view (taken on a line A-A and seen along an arrow) showing the input and output unit in the semiconductor device according to the second embodiment of the present invention.
- FIG. 17 is a sectional view (taken on a line B-B and seen along an arrow) showing the input and output unit in the semiconductor device according to the second embodiment of the present invention.
- FIG. 18 is a layout chart showing an interconnection of an input and output unit in a semiconductor device according to a third embodiment of the present invention.
- FIG. 19 is a sectional view (taken on a line A-A and seen along an arrow) showing the input and output unit in the semiconductor device according to the third embodiment of the present invention.
- FIG. 20 is a sectional view (taken on a line B-B and seen along an arrow) showing the input and output unit in the semiconductor device according to the third embodiment of the present invention.
- FIG. 21 is a layout chart showing an interconnection of an input and output unit in a semiconductor device according to a fourth embodiment of the present invention.
- FIG. 22 is a sectional view (taken on a line A-A and seen along an arrow) showing the input and output unit in the semiconductor device according to the fourth embodiment of the present invention.
- FIG. 23 is a sectional view (taken on a line B-B and seen along an arrow) showing the input and output unit in the semiconductor device according to the fourth embodiment of the present invention.
- FIG. 1 to 14 a structure of a semiconductor device according to a first embodiment of the invention will be described.
- a region below a bonding pad is effectively utilized in order to achieve the high integration, and a specific layout of a structure below the bonding pad will be described.
- FIG. 1 is a circuit diagram showing an input and output unit in the semiconductor device of the first embodiment.
- a Vcc (power supply potential) interconnection is provided outside a Grid (reference potential) interconnection along an outer edge of a semiconductor chip CP (see FIG. 14 ), and the Gnd interconnection is provided inside the Vcc interconnection along the outer edge of the semiconductor chip CP.
- the Vcc (power supply potential) interconnection and Grid (reference potential) interconnection are shown by broken lines in FIG. 1 for the purpose of easy understanding of a structure of a transistor formed in a layer below the interconnections.
- Plural bonding pads BP 1 are disposed at predetermined intervals along an interconnection direction above a direction in which the Vcc (power supply potential) interconnections are laminated, and plural bonding pads BP 2 are disposed at predetermined intervals along the interconnection direction above a direction in which the Gnd (reference potential) interconnections are laminated.
- a circuit that is formed by a PMOS transistor pTr in a semiconductor layer below the Vcc (power supply potential) interconnection and a circuit that is formed by a NMOS transistor nTr in a semiconductor layer below the Gnd (reference potential) interconnection are connected between bonding pad BP 1 and bonding pad BP 2 and an internal circuit IC.
- bonding pads BP 1 and bonding pads BP 2 are arranged in a zigzag manner in a planar view along the direction in which the Vcc (power supply potential) interconnection and the Gnd (reference potential) interconnection are extended, thereby allowing the semiconductor device to be further integrated. This point is described in detail later.
- An output inverter INV surrounded by an alternate long and dash line of FIG. 1 includes two PMOS transistors pTr and two NMOS transistors nTr. Bonding pad BP 2 is disposed on two NMOS transistor nTr of an n-th output inverter INV, bonding pad BP 1 is disposed on two PMOS transistor pTr of an (n+1)-th output inverter INV, bonding pad BP 2 is disposed on two NMOS transistor nTr of an (n+2)-th output inverter INV, and the configurations are repeated to an (n+k)-th output inverter (n and k are integers).
- Bonding pads BP 1 located on two PMOS transistors pTr and bonding pads BP 2 located on two NMOS transistors nTr are repeatedly arranged in output inverters INV. Therefore, plural output inverters INV can easily be arranged in a small area, and the layout also becomes simplified.
- FIGS. 2 to 12 are views showing a configuration of the input and output unit in the semiconductor device of the first embodiment.
- FIGS. 2 to 10 are layout charts showing an interconnection layer and a via layer of the input and output unit
- FIGS. 11 and 12 are sectional views showing the input and output unit. Referring to FIG. 2 to 12 , the structure of the semiconductor device of the first embodiment will be described.
- FIG. 11 is a sectional view taken on a line A-A and seen along an arrow that is shown in the layout charts of FIGS. 2 to 10
- FIG. 12 is a sectional view taken on a line B-B and seen along an arrow that is shown in the layout charts of FIGS. 2 to 10 .
- FIG. 2 shows a layout of first metal interconnection layers ML 10 , ML 11 , ML 12 , and ML 15 on an interlayer insulator ID 10 and an opening BPO of a passivation film PV 10 with which interlayer insulator ID 10 is covered.
- FIG. 3 shows a layout of first via layers VL 10 , VL 11 , VL 12 , and VL 15 in interlayer insulator ID 10 with which a second metal interconnection layer is covered.
- FIG. 4 shows a layout of second metal interconnection layers ML 20 , ML 21 , ML 22 , and ML 25 on an interlayer insulator ID 20 .
- FIG. 5 shows a layout of second via layers VL 21 , VL 22 , and VL 25 in interlayer insulator ID 20 with which a third metal interconnection layer is covered.
- FIG. 6 shows a layout of third metal interconnection layers ML 30 , ML 31 , ML 32 , ML 35 , and ML 37 on an interlayer insulator ID 30 .
- FIG. 7 shows a layout of third via layers VL 30 , VL 31 , and VL 37 in interlayer insulator ID 30 with which a fourth metal interconnection layer is covered.
- FIG. 8 shows a layout of fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 on an interlayer insulator ID 40 .
- FIG. 9 shows a layout of fourth via layers VL 40 , VL 41 , VL 42 , VL 45 , VL 46 , and VL 47 in interlayer insulator ID 40 with which a semiconductor layer SC shown in FIGS. 11 and 12 is covered.
- FIG. 10 shows a layout of active regions SR and DR provided in semiconductor layer SC and polysilicon electrode layers GE 1 and GE 2 provided on semiconductor layer SC.
- FIGS. 2 to 10 although the left portion of the layout chart is a region where internal circuit IC is formed, the specific layout chart of the region is not shown for the sake of convenience.
- the sectional views of FIGS. 11 and 12 the section on the Vcc (power supply potential) interconnection side is shown while the section on the Gnd (reference potential) interconnection side is neglected.
- a general interconnection material can be used as a material for each metal interconnection layer.
- Aluminum, copper, and alloys thereof (such as Al—Si—Cu and Al—Cu) can be cited as an example of the material for each metal interconnection layer.
- a general via material can be used as a material for each via layer. Tungsten, copper, and alloys thereof can be cited as an example of the material for each via layer.
- the metal interconnection and the via of FIGS. 2 to 12 are shown by hatching which classified into functions thereof. Specifically, the metal interconnection and the via are classified into a power supply node, a ground (reference potential) node, an output node of an output buffer, and an input node of the output buffer. In FIGS. 2 to 12 , the same component is designated by the same numeral.
- first metal interconnection layers ML 10 and M 11 are set at the output node of the output buffer, first metal interconnection layer ML 12 is set at the power supply node, and first metal interconnection layer ML 15 is set at the ground node.
- first via layer VL 10 is set at the output node of the output buffer
- first via layer VL 11 is set at the output node of the output buffer
- first via layer VL 12 is set at the power supply node
- first via layer VL 15 is set at the ground node.
- first via layers VL 10 have a stripe shape.
- First via layer VL 10 is provided in a direction in which first via layer VL 10 is extended in parallel with the outer peripheral edge of semiconductor chip CP (see FIGS. 13 and 14 ).
- First via layer VL 10 has a line width (L) of about 0.28 ⁇ m, and an interval (S) between first via layers VL 10 becomes about 0.64 ⁇ m.
- second metal interconnection layers ML 20 and M 21 are set at the output node of the output buffer, second metal interconnection layer ML 22 is set at power supply node, and second metal interconnection layer ML 25 is set at the ground node.
- second via layer VL 21 is set at the output node of the output buffer, second via layer VL 22 is set at the power supply node, and second via layer VL 25 is set at the ground node.
- third metal interconnection layer ML 30 is set at the power supply node
- third metal interconnection layer ML 31 is set at the output node of the output buffer
- third metal interconnection layer ML 32 is set at the power supply node
- third metal interconnection layers ML 35 and ML 37 are set at the ground node. Because plural third metal interconnection layers ML 30 are arranged in a line, third metal interconnection layers ML 30 have a stripe shape. Third metal interconnection layer ML 30 is provided in a direction in which third metal interconnection layer ML 30 is extended in parallel with the outer peripheral edge of semiconductor chip CP.
- third metal interconnection layer ML 30 has the line width (L) of about 0.32 ⁇ m
- the interval (S) between third metal interconnection layers ML 30 becomes about 0.26 ⁇ m.
- the interval (S) between third metal interconnection layers ML 30 becomes about 1.05 ⁇ m. The same holds true for the line (L)/space (S) of third metal interconnection layer ML 37 .
- third via layer VL 30 is set at the power supply node
- third via layer VL 31 is set at the output node of the output buffer
- third via layer VL 37 is set at the ground node.
- fourth metal interconnection layer ML 40 is set at the output node of the output buffer
- fourth metal interconnection layer ML 41 is set at the input node of the output buffer
- fourth metal interconnection layer ML 42 is set at the power supply node
- fourth metal interconnection layer ML 43 is set at the ground node. Because fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are arranged in a line, fourth metal interconnection layers ML 40 , 41 , 42 , and 43 have the stripe shape.
- fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are provided along a direction intersecting the outer peripheral edge of semiconductor chip CP, the direction in which third metal interconnection layer ML 30 is extended is orthogonal to the direction in which fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are extended. Only fourth metal interconnection layer ML 41 is provided into a circular shape so as to surround fourth metal interconnection layers ML 41 , ML 42 , and ML 43 .
- Fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 have the line width (L) of about 2.3 ⁇ m, and the interval (S) becomes about 1.05 ⁇ m for each of fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 .
- Fourth metal interconnection layer ML 40 (output node of the output buffer) is divided into two across center fourth metal interconnection layer ML 42 (power supply node). This is because the crack generation is increased in a case where fourth metal interconnection layer ML 40 is formed only by one interconnection. That is, fourth metal interconnection layer ML 40 is divided into two from the standpoint of preventing the crack generation. Accordingly, when needed, fourth metal interconnection layer ML 40 can be divided into at least three to effectively prevent the crack generation.
- fourth via layer VL 40 is set at the output node of the output buffer
- fourth via layer VL 41 is set at the power supply node
- fourth via layer VL 42 is set at the input node of the output buffer
- fourth via layer VL 45 is set at the output node of the output buffer
- fourth via layer VL 46 is set at the input node of the output buffer
- fourth via layer VL 47 is set at the ground node.
- a P-type active region DR drain
- a P-type active region SR source: Vcc
- Gate electrode layers GE 1 and GE 2 made of polysilicon are provided in a direction intersecting the outer peripheral edge of semiconductor chip CP. Therefore, the direction in which gate electrode layers GE 1 and GE 2 are extended is parallel to the direction in which fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are extended.
- an N-type active region DR drain
- an N-type active region SR source: Vcc
- Gate electrode layers GE 11 and GE 12 made of polysilicon are provided in the direction intersecting the outer peripheral edge of semiconductor chip CP. Therefore, the direction in which gate electrode layers GE 11 and GE 12 are extended is parallel to the direction in which fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are extended.
- FIG. 13 is a view showing an interconnection layout of a four-layer interconnection structure in the outer peripheral edge of semiconductor chip CP of the semiconductor device having the above-described configuration.
- first, second, and third metal interconnections ML 12 , ML 22 , and ML 32 having Vcc (power supply potential) are disposed in the outermost region
- third metal interconnection ML 30 having Vcc (power supply potential) is disposed in the region inside first, second, and third metal interconnections ML 12 , ML 22 , and ML 32
- third metal interconnection ML 37 having Gnd (reference potential) is disposed in the region inside third metal interconnection ML 30
- Gnd (reference potential) of first, second, and third metal interconnections ML 15 , ML 25 , and ML 35 having Gnd (reference potential) are disposed inside third metal interconnection ML 37 .
- the direction in which fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 located on semiconductor layer SC are extended is orthogonal to the direction in which third interconnection layers ML 30 and ML 37 located on fourth metal interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 are extended.
- the stress transferred to the lower portion is wholly dispersed by third interconnection layers ML 30 and ML 37 and fourth interconnection layers ML 40 , ML 41 , ML 42 , and ML 43 which are laminated to intersect with each other, so that the stress concentration on a particular point can be relieved to restrain the deterioration in semiconductor device strength to a minimum.
- the active elements such as the PMOS transistor forming region and the NMOS transistor forming region are disposed below the four-layer-structure interconnection layer, so that the high integration of the semiconductor device can be achieved. Because an additional step is not required in the production process, the production cost of the semiconductor device is not increased.
- a lower-layer metal interconnection width (L) is larger than an upper-layer metal interconnection width (L).
- a deflection amount caused by the stress applied from the bonding pad is largely set on the upper-layer side by narrowing the upper-layer-side metal interconnection width, thereby allowing the stress to be absorbed at an early stage on the upper-layer side way from the active elements.
- circular power supply potential interconnection Vcc disposed along the direction in which the outer peripheral edge of semiconductor chip CP is extended and circular reference potential interconnection Gnd disposed inside power supply potential interconnection Vcc are provided to define the circuit in which third metal interconnection layer ML 30 is used as power supply potential interconnection Vcc and the circuit in which third metal interconnection layer ML 37 is used as reference potential interconnection Gnd.
- an arrangement pitch of bonding pads BP 1 arranged above the direction in which power supply potential interconnections Vcc are laminated can be determined based on a size of bonding pad BP 1 .
- An arrangement pitch of bonding pads BP 2 arranged above the direction in which reference potential interconnection Gnd are laminated can also be determined based on a size of bonding pad BP 2 .
- bonding pads BP 1 and BP 2 can be arranged in the zigzag manner in the planar view along the direction in which the Vcc (power supply potential) interconnection and the Gnd (reference potential) interconnection are extended. Therefore, the semiconductor device can further be integrated.
- the fourth metal interconnection layer is orthogonal to the third metal interconnection layer. Therefore, the circuit used as power supply potential interconnection Vcc and the circuit used as the reference potential interconnection Gnd can be directly connected in the region below the bonding pad without drawing power supply potential interconnection Vcc and reference potential interconnection Gnd to a surrounding area of the bonding pad.
- the high integration of the semiconductor device can also be achieved from this point of view.
- the metal interconnection layer (fourth metal interconnection layer of the first embodiment) immediately above the semiconductor layer in which the active element is formed and the metal interconnection layer (third metal interconnection layer of the third embodiment) located above the metal interconnection layer (fourth metal interconnection layer of the first embodiment) are provided so as to be orthogonal to each other.
- the stress transferred to the lower portion is wholly dispersed by the upper-side interconnection layers and the lower-side interconnection layers which are laminated to intersect with each other, so that the stress concentration on a particular point can be relieved to restrain the deterioration in semiconductor device strength to a minimum.
- FIG. 15 to 17 a structure of a semiconductor device according to a second embodiment of the invention will be described.
- the region below the bonding pad is effectively utilized in order to achieve the high integration, and a specific layout of a structure below the bonding pad will be described.
- the same component as the first embodiment is designated by the same numeral, the overlapping description is neglected, and only a characteristic configuration of the semiconductor device of the second embodiment will be described in detail.
- FIG. 15 is a layout chart showing an interconnection layer and a via layer of the input and output unit in a planar view
- FIG. 16 is a sectional view taken on a line A-A and seen along an arrow that is shown in the layout chart of FIG. 15
- FIG. 17 is a sectional view taken on a line B-B and seen along an arrow that is shown in the layout chart of FIG. 15 .
- a support pad WP 10 is provided between first metal interconnection layer ML 10 constituting bonding pad BP 1 and first via layer VL 10 .
- Support pad WP 10 has an area larger than that of opening BPO provided in passivation film PV 10 , and support pad WP 10 has hardness larger than that of first metal interconnection layer ML 10 .
- aluminum, copper, and alloys thereof such as Al—Si—Cu and Al—Cu
- tungsten whose hardness is larger than those of the materials is used as the specific material for support pad WP 10 .
- support pad WP 10 In a case where support pad WP 10 is provided as described above, when the stress is applied to bonding pad BP 1 from outside, the stress is received by support pad WP 10 to substantially disperse the force in a whole of support pad WP 10 , and the force is further dispersed in first via layer VL 10 and the like located below support pad WP 10 . As a result, the stress is wholly dispersed more effectively, and the stress concentration on the particular point can be relieved to restrain the deterioration in semiconductor device strength to a minimum.
- the structure in which support pad WP 10 is provided is applied to the four-layer interconnection structure of the first embodiment, that is, “configuration in which the metal interconnection layer (fourth metal interconnection layer) immediately above the semiconductor layer is orthogonal to the metal interconnection layer (third metal interconnection layer) above the metal interconnection layer (fourth metal interconnection layer)”.
- the structure in which support pad WP 10 is provided is not limited to the four-layer interconnection structure of the first embodiment.
- support pad WP 10 is provided between first metal interconnection layer ML 10 constituting bonding pad BP 1 and first via layer VL 10 .
- Support pad WP 10 has the area larger than that of opening BPO provided in passivation film PV 10 , and support pad WP 10 has the hardness larger than that of first metal interconnection layer ML 10 . Therefore, the stress applied to bonding pad BP 1 is dispersed to relieve the stress concentration on the particular point, and it can be expected that the deterioration in semiconductor device strength is restrained.
- support pad WP 10 is provided in bonding pad BP 1 . Additionally, when the bonding pad is provided in bonding pad BP 2 , the same effect can be obtained.
- FIG. 18 to 20 a structure of a semiconductor device according to a third embodiment of the invention will be described.
- the region below the bonding pad is effectively utilized in order to achieve the high integration, and a specific layout of a structure below the bonding pad will be described.
- the same component as the first embodiment is designated by the same numeral, the overlapping description is neglected, and only a characteristic configuration of the semiconductor device of the third embodiment will be described in detail.
- FIG. 18 is a layout chart showing an interconnection layer and a via layer of the input and output unit the input and output unit in a planar view
- FIG. 19 is a sectional view taken on a line A-A and seen along an arrow that is shown in the layout chart of FIG. 18
- FIG. 20 is a sectional view taken on a line B-B and seen along an arrow that is shown in the layout chart of FIG. 18 .
- columnar support structures CL-VIA are provided between bonding pad BP 1 and semiconductor layer SC.
- columnar support structures CL-VIA support a gap between first metal interconnection layer ML 10 and second metal interconnection layer ML 20 , a gap between second interconnection layer ML 20 and third interconnection layer ML 30 , a gap between third interconnection layer ML 30 and fourth interconnection layer ML 40 , and a gap between fourth interconnection layer ML 40 and gate electrode layer GE 1 .
- a columnar support CL 10 is disposed between first metal interconnection layer ML 10 and second metal interconnection layer ML 20 , and columnar support CL 10 is formed in the production process same as the first via layer.
- a base BL 10 formed in the production process same as third metal interconnection layer ML 30 is provided, and a columnar support CL 20 formed in the production process same as the second via layer is provided between the base BL 10 and second metal interconnection layer ML 20 .
- a base BL 20 formed in the production process same as fourth metal interconnection layer ML 40 is provided, and a columnar support CL 30 formed in the production process same as the third via layer is provided between the base BL 20 and third metal interconnection layer ML 30 .
- a base BL 30 formed in the production process same as gate electrode layer GE 1 is provided, and a columnar support CL 40 formed in the production process same as the fourth via layer is provided between the base BL 30 and fourth metal interconnection layer ML 40 .
- columnar support structures CL-VIA having the above-described configurations are disposed in regions near four corners of bonding pad BP 1 .
- Columnar support CL 30 located on semiconductor layer SC is provided so as to be located on an isolation region STI provided on semiconductor layer SC.
- the structure in which columnar support structures CL-VIA are provided is applied to the four-layer interconnection structure of the first embodiment, that is, “configuration in which the metal interconnection layer (fourth metal interconnection layer) immediately above the semiconductor layer is orthogonal to the metal interconnection layer (third metal interconnection layer) above the metal interconnection layer (fourth metal interconnection layer)”.
- the structure in which columnar support structures CL-VIA are provided is not limited to the four-layer interconnection structure of the first embodiment.
- columnar support structure CL-VIA is provided between bonding pad BP 1 and semiconductor layer SC. Therefore, the stress applied to bonding pad BP 1 is dispersed to relieve the stress concentration on the particular point, and it can be expected that the deterioration in semiconductor device strength is restrained.
- columnar support structures CL-VIA are provided at for corners of bonding pad BP 1 .
- the columnar support structure can be provided in at least one point to transfer the force applied to bonding pad BP 1 to semiconductor layer SC.
- base BL 10 and base BL 20 are separately provided for columnar support structure CL-VIA. This is because the structure of the third embodiment is adopted based on the relationship with the metal interconnection pattern. In a case where the metal interconnection is located below columnar support structure CL-VIA (second metal interconnection ML 20 in FIG. 19 ), the metal interconnection can directly be used as the base.
- columnar support structure CL-VIA is disposed on isolation region STI. However, in a case where a layout restriction exists, columnar support structure CL-VIA may be provided on isolation region STI.
- FIG. 21 to 23 a structure of a semiconductor device according to a fourth embodiment of the invention will be described. Similarly to the first embodiment, in the semiconductor device of the fourth embodiment, the region below the bonding pad is effectively utilized in order to achieve the high integration, and a specific layout of a structure below the bonding pad will be described.
- the configuration of the second embodiment in which support pad WP 10 is provided and the configuration of the third embodiment in which columnar support structure CL-VIA is provided are combined in the semiconductor device of the fourth embodiment. Accordingly, the same component as those of the first to third embodiments is designated by the same numeral, the overlapping description is neglected, and only a characteristic configuration of the semiconductor device of the fourth embodiment will be described in detail.
- FIG. 21 is a layout chart showing an interconnection layer and a via layer of the input and output unit the input and output unit in a planar view
- FIG. 22 is a sectional view taken on a line A-A and seen along an arrow that is shown in the layout chart of FIG. 21
- FIG. 23 is a sectional view taken on a line B-B and seen along an arrow that is shown in the layout chart of FIG. 21 .
- columnar support structures CL-VIA are provided between support pad WP 10 and semiconductor layer SC.
- the stress is applied to bonding pad BP 1 from outside, the force is received by support pad WP 10 , the force is dispersed from support pad WP 10 to columnar support structure CL-VIA, and the force can be transferred into lower-layer semiconductor layer SC.
- the stress is dispersed more effectively, and the stress concentration on the particular point can be relieved to restrain the deterioration in semiconductor device strength to a minimum.
- the structure in which columnar support structures CL-VIA are provided is applied to the four-layer interconnection structure of the first embodiment, that is, “configuration in which the metal interconnection layer (fourth metal interconnection layer) immediately above the semiconductor layer is orthogonal to the metal interconnection layer (third metal interconnection layer) above the metal interconnection layer (fourth metal interconnection layer)”.
- the structure in which columnar support structures CL-VIA are provided is not limited to the four-layer interconnection structure of the first embodiment.
- columnar support structure CL-VIA is provided between bonding pad BP 1 and semiconductor layer SC. Therefore, the stress applied to bonding pad BP 1 is dispersed to relieve the stress concentration on the particular point, and it can be expected that the deterioration in semiconductor device strength is restrained.
- columnar support structures CL-VIA are provided at for corners of bonding pad BP 1 .
- the columnar support structure can be provided in at least one point to transfer the force applied to support pad WP 10 to semiconductor layer SC.
- base BL 10 and base BL 20 are separately provided for columnar support structure CL-VIA. This is because the structure of the fourth embodiment is adopted based on the relationship with the metal interconnection pattern. In a case where the metal interconnection is located below columnar support structure CL-VIA (second metal interconnection ML 20 in FIG. 19 ), the metal interconnection can directly be used as the base.
- columnar support structure CL-VIA is disposed on isolation region STI. However, in a case where the layout restriction exists, columnar support structure CL-VIA may be provided on isolation region STI.
- the invention can widely be applied to the semiconductor device including the bonding pad, and the invention can restrain the deterioration in semiconductor device strength and the high integration of the semiconductor device.
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007314914A JP2009141064A (en) | 2007-12-05 | 2007-12-05 | Semiconductor device |
JP2007-314914 | 2007-12-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20090146313A1 US20090146313A1 (en) | 2009-06-11 |
US7911063B2 true US7911063B2 (en) | 2011-03-22 |
Family
ID=40720795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/327,344 Active US7911063B2 (en) | 2007-12-05 | 2008-12-03 | Semiconductor device |
Country Status (2)
Country | Link |
---|---|
US (1) | US7911063B2 (en) |
JP (1) | JP2009141064A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130140687A1 (en) * | 2011-12-06 | 2013-06-06 | Kabushiki Kaisha Toshiba | Semiconductor device |
US8779592B2 (en) * | 2012-05-01 | 2014-07-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Via-free interconnect structure with self-aligned metal line interconnections |
US10867917B1 (en) * | 2019-06-14 | 2020-12-15 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device, associated method and layout |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101585491B1 (en) * | 2009-10-29 | 2016-01-15 | 삼성전자주식회사 | Electrical pattern structure and method of manufacturing the same |
JP2012039001A (en) * | 2010-08-10 | 2012-02-23 | Renesas Electronics Corp | Semiconductor device |
KR101881861B1 (en) * | 2011-05-02 | 2018-07-25 | 삼성전자주식회사 | Electrical pattern structure and method of manufacturing the same |
KR101923120B1 (en) * | 2012-03-21 | 2018-11-28 | 삼성전자 주식회사 | Semiconductor device and method for fabricating the same |
WO2014097524A1 (en) * | 2012-12-21 | 2014-06-26 | パナソニック株式会社 | Semiconductor device |
TWI676279B (en) * | 2013-10-04 | 2019-11-01 | 新力股份有限公司 | Semiconductor device and solid-state imaging device |
WO2020039574A1 (en) * | 2018-08-24 | 2020-02-27 | キオクシア株式会社 | Semiconductor device and method for manufacturing same |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6577017B1 (en) * | 1994-12-07 | 2003-06-10 | Quick Logic Corporation | Bond pad having vias usable with antifuse process technology |
US6707156B2 (en) * | 2002-05-20 | 2004-03-16 | Fujitsu Limited | Semiconductor device with multilevel wiring layers |
JP2004095916A (en) | 2002-08-30 | 2004-03-25 | Fujitsu Ltd | Semiconductor device and its manufacturing method |
JP2004119969A (en) | 2002-09-03 | 2004-04-15 | Toshiba Corp | Semiconductor device |
US20050146041A1 (en) | 2002-08-30 | 2005-07-07 | Fujitsu Limited | Semiconductor device and method for manufacturing the same |
JP2005235809A (en) | 2004-02-17 | 2005-09-02 | Renesas Technology Corp | Ic chip |
WO2005083767A1 (en) | 2004-02-26 | 2005-09-09 | Renesas Technology Corp. | Semiconductor device |
JP2005285971A (en) | 2004-03-29 | 2005-10-13 | Nec Electronics Corp | Semiconductor device |
US6958542B2 (en) | 2002-09-03 | 2005-10-25 | Kabushiki Kaisha Toshiba | Semiconductor device |
US7049701B2 (en) * | 2003-10-15 | 2006-05-23 | Kabushiki Kaisha Toshiba | Semiconductor device using insulating film of low dielectric constant as interlayer insulating film |
JP2006196487A (en) | 2005-01-11 | 2006-07-27 | Seiko Epson Corp | Semiconductor device |
JP2006339406A (en) | 2005-06-02 | 2006-12-14 | Renesas Technology Corp | Semiconductor device |
US20070052068A1 (en) | 2005-09-02 | 2007-03-08 | Koji Takemura | Semiconductor device |
US20070120258A1 (en) | 2005-11-30 | 2007-05-31 | Renesas Technology Corp. | Semiconductor device |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004153015A (en) * | 2002-10-30 | 2004-05-27 | Fujitsu Ltd | Semiconductor device and its manufacturing method |
JP2005142553A (en) * | 2003-10-15 | 2005-06-02 | Toshiba Corp | Semiconductor device |
KR101015444B1 (en) * | 2005-08-17 | 2011-02-18 | 후지쯔 가부시끼가이샤 | Semiconductor device and method for manufacturing the same |
JP2007081044A (en) * | 2005-09-13 | 2007-03-29 | Renesas Technology Corp | Semiconductor device |
-
2007
- 2007-12-05 JP JP2007314914A patent/JP2009141064A/en active Pending
-
2008
- 2008-12-03 US US12/327,344 patent/US7911063B2/en active Active
Patent Citations (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6577017B1 (en) * | 1994-12-07 | 2003-06-10 | Quick Logic Corporation | Bond pad having vias usable with antifuse process technology |
US6707156B2 (en) * | 2002-05-20 | 2004-03-16 | Fujitsu Limited | Semiconductor device with multilevel wiring layers |
US20050146041A1 (en) | 2002-08-30 | 2005-07-07 | Fujitsu Limited | Semiconductor device and method for manufacturing the same |
JP2004095916A (en) | 2002-08-30 | 2004-03-25 | Fujitsu Ltd | Semiconductor device and its manufacturing method |
US6958542B2 (en) | 2002-09-03 | 2005-10-25 | Kabushiki Kaisha Toshiba | Semiconductor device |
JP2004119969A (en) | 2002-09-03 | 2004-04-15 | Toshiba Corp | Semiconductor device |
US7180192B2 (en) | 2002-09-03 | 2007-02-20 | Kabushiki Kaisha Toshiba | Semiconductor device |
US7301240B2 (en) | 2002-09-03 | 2007-11-27 | Kabushiki Kaisha Toshiba | Semiconductor device |
US7049701B2 (en) * | 2003-10-15 | 2006-05-23 | Kabushiki Kaisha Toshiba | Semiconductor device using insulating film of low dielectric constant as interlayer insulating film |
JP2005235809A (en) | 2004-02-17 | 2005-09-02 | Renesas Technology Corp | Ic chip |
US20070182001A1 (en) | 2004-02-26 | 2007-08-09 | Renesas Technology Corp. | Semiconductor device |
WO2005083767A1 (en) | 2004-02-26 | 2005-09-09 | Renesas Technology Corp. | Semiconductor device |
JP2005285971A (en) | 2004-03-29 | 2005-10-13 | Nec Electronics Corp | Semiconductor device |
US7335992B2 (en) | 2004-03-29 | 2008-02-26 | Nec Electronics Corporation | Semiconductor apparatus with improved yield |
JP2006196487A (en) | 2005-01-11 | 2006-07-27 | Seiko Epson Corp | Semiconductor device |
JP2006339406A (en) | 2005-06-02 | 2006-12-14 | Renesas Technology Corp | Semiconductor device |
JP2007067332A (en) | 2005-09-02 | 2007-03-15 | Matsushita Electric Ind Co Ltd | Semiconductor device |
US20070052068A1 (en) | 2005-09-02 | 2007-03-08 | Koji Takemura | Semiconductor device |
US20070120258A1 (en) | 2005-11-30 | 2007-05-31 | Renesas Technology Corp. | Semiconductor device |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130140687A1 (en) * | 2011-12-06 | 2013-06-06 | Kabushiki Kaisha Toshiba | Semiconductor device |
US8558390B2 (en) * | 2011-12-06 | 2013-10-15 | Kabushiki Kaisha Toshiba | Semiconductor device |
US8779592B2 (en) * | 2012-05-01 | 2014-07-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Via-free interconnect structure with self-aligned metal line interconnections |
US9716032B2 (en) | 2012-05-01 | 2017-07-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Via-free interconnect structure with self-aligned metal line interconnections |
US10867917B1 (en) * | 2019-06-14 | 2020-12-15 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device, associated method and layout |
US20200395298A1 (en) * | 2019-06-14 | 2020-12-17 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor device, associated method and layout |
US20210091000A1 (en) * | 2019-06-14 | 2021-03-25 | Taiwan Semiconductor Manufacturing Company Ltd. | Method of manufacturing semiconductor device |
US11569167B2 (en) * | 2019-06-14 | 2023-01-31 | Taiwan Semiconductor Manufacturing Company Ltd. | Method of manufacturing semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JP2009141064A (en) | 2009-06-25 |
US20090146313A1 (en) | 2009-06-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7911063B2 (en) | Semiconductor device | |
US8102056B2 (en) | Semiconductor device having pads and which minimizes defects due to bonding and probing processes | |
TWI496225B (en) | Semiconductor integrated circuit device | |
TWI545725B (en) | Semiconductor device, semiconductor device design method, semiconductor device design apparatus, and program | |
CN109564893B (en) | Semiconductor chip | |
JP2010141187A (en) | Semiconductor integrated circuit device | |
US9478525B2 (en) | Semiconductor device | |
JP6121677B2 (en) | Semiconductor device | |
WO2020066797A1 (en) | Semiconductor integrated circuit device and semiconductor package structure | |
JP2009177139A (en) | Semiconductor integrated circuit | |
JP6342165B2 (en) | Semiconductor device and IO cell | |
WO2020170715A1 (en) | Semiconductor integrated circuit device | |
JP2006049846A (en) | Semiconductor apparatus | |
JP2004172583A (en) | Semiconductor device | |
WO2021090688A1 (en) | Semiconductor integrated circuit device | |
JP7032668B2 (en) | Semiconductor integrated circuit equipment | |
US7595561B2 (en) | Semiconductor device including multiple rows of peripheral circuit units | |
JP5896682B2 (en) | Semiconductor integrated circuit device | |
CN1274020C (en) | Semiconductor integrated circuit device | |
KR20040028518A (en) | A semiconductor integrated circuit device | |
JP3962441B2 (en) | Semiconductor device | |
JP2018164055A (en) | Semiconductor device | |
JP6483309B2 (en) | Semiconductor device and IO cell | |
JP2693920B2 (en) | Semiconductor integrated circuit device | |
JP2020155487A (en) | Semiconductor storage and manufacturing method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: RENESAS TECHNOLOGY CORP., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:TERAZONO, SHINICHI;AKAO, KATSUHIKO;REEL/FRAME:021921/0596 Effective date: 20081120 |
|
AS | Assignment |
Owner name: RENESAS ELECTRONICS CORPORATION, JAPAN Free format text: CHANGE OF NAME;ASSIGNOR:RENESAS TECHNOLOGY CORP.;REEL/FRAME:024973/0001 Effective date: 20100401 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
AS | Assignment |
Owner name: RENESAS ELECTRONICS CORPORATION, JAPAN Free format text: CHANGE OF ADDRESS;ASSIGNOR:RENESAS ELECTRONICS CORPORATION;REEL/FRAME:044928/0001 Effective date: 20150806 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 8 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 12TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1553); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 12 |