US7701493B2 - Imager row-wise noise correction - Google Patents
Imager row-wise noise correction Download PDFInfo
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- US7701493B2 US7701493B2 US11/066,781 US6678105A US7701493B2 US 7701493 B2 US7701493 B2 US 7701493B2 US 6678105 A US6678105 A US 6678105A US 7701493 B2 US7701493 B2 US 7701493B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
Abstract
Description
Claims (26)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/066,781 US7701493B2 (en) | 2005-02-28 | 2005-02-28 | Imager row-wise noise correction |
US12/573,985 US7852385B2 (en) | 2005-02-28 | 2009-10-06 | Imager row-wise noise correction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/066,781 US7701493B2 (en) | 2005-02-28 | 2005-02-28 | Imager row-wise noise correction |
Related Child Applications (1)
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US12/573,985 Division US7852385B2 (en) | 2005-02-28 | 2009-10-06 | Imager row-wise noise correction |
Publications (2)
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US20060192864A1 US20060192864A1 (en) | 2006-08-31 |
US7701493B2 true US7701493B2 (en) | 2010-04-20 |
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US12/573,985 Active US7852385B2 (en) | 2005-02-28 | 2009-10-06 | Imager row-wise noise correction |
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US12/573,985 Active US7852385B2 (en) | 2005-02-28 | 2009-10-06 | Imager row-wise noise correction |
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US20080239124A1 (en) * | 2007-03-30 | 2008-10-02 | Sony Corporation | Solid-state imaging device, signal processing method of solid-state imaging device and imaging apparatus |
US20090109314A1 (en) * | 2005-03-18 | 2009-04-30 | Canon Kabushiki Kaisha | Solid state image pickup device and camera |
US20090273691A1 (en) * | 2008-05-02 | 2009-11-05 | Yaowu Mo | Method and apparatus providing analog row noise correction and hot pixel filtering |
US20100079632A1 (en) * | 2008-09-26 | 2010-04-01 | Tom Walschap | Correlated double sampling pixel |
US20110205405A1 (en) * | 2004-06-30 | 2011-08-25 | Ilia Ovsiannikov | Shielding black reference pixels in image sensors |
US20110317055A1 (en) * | 2010-06-29 | 2011-12-29 | Kabushiki Kaisha Toshiba | Solid-state imaging device, camera module, and imaging method |
US20120312967A1 (en) * | 2011-06-10 | 2012-12-13 | Yannick De Wit | Pixel and method |
US8946783B2 (en) | 2012-06-18 | 2015-02-03 | Samsung Electronics Co., Ltd. | Image sensors having reduced dark level differences |
US20150042847A1 (en) * | 2012-04-20 | 2015-02-12 | Daisuke HOHJOH | Imaging device and image processing method |
US9362326B2 (en) * | 2012-08-22 | 2016-06-07 | Canon Kabushiki Kaisha | Image capturing apparatus and control method therefor |
US10645348B2 (en) | 2018-07-07 | 2020-05-05 | Sensors Unlimited, Inc. | Data communication between image sensors and image displays |
US10742913B2 (en) | 2018-08-08 | 2020-08-11 | N2 Imaging Systems, LLC | Shutterless calibration |
US10753709B2 (en) | 2018-05-17 | 2020-08-25 | Sensors Unlimited, Inc. | Tactical rails, tactical rail systems, and firearm assemblies having tactical rails |
US10796860B2 (en) | 2018-12-12 | 2020-10-06 | N2 Imaging Systems, LLC | Hermetically sealed over-molded button assembly |
US10801813B2 (en) | 2018-11-07 | 2020-10-13 | N2 Imaging Systems, LLC | Adjustable-power data rail on a digital weapon sight |
US10921578B2 (en) | 2018-09-07 | 2021-02-16 | Sensors Unlimited, Inc. | Eyecups for optics |
US11079202B2 (en) | 2018-07-07 | 2021-08-03 | Sensors Unlimited, Inc. | Boresighting peripherals to digital weapon sights |
US11122698B2 (en) | 2018-11-06 | 2021-09-14 | N2 Imaging Systems, LLC | Low stress electronic board retainers and assemblies |
US11143838B2 (en) | 2019-01-08 | 2021-10-12 | N2 Imaging Systems, LLC | Optical element retainers |
US11162763B2 (en) | 2015-11-03 | 2021-11-02 | N2 Imaging Systems, LLC | Non-contact optical connections for firearm accessories |
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US7564489B1 (en) | 2005-02-18 | 2009-07-21 | Crosstek Capital, LLC | Method for reducing row noise with dark pixel data |
US7508430B1 (en) * | 2005-02-18 | 2009-03-24 | Magnachip Semiconductor, Ltd. | Method for locally reducing row noise |
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US20070236590A1 (en) * | 2006-03-31 | 2007-10-11 | Cypress Semiconductor Corporation | Output auto-zero for CMOS active pixel sensors |
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US7545418B2 (en) * | 2006-07-17 | 2009-06-09 | Jeffery Steven Beck | Image sensor device having improved noise suppression capability and a method for supressing noise in an image sensor device |
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KR100784387B1 (en) * | 2006-11-06 | 2007-12-11 | 삼성전자주식회사 | Image sensor and method for forming the same |
US20080170228A1 (en) * | 2007-01-17 | 2008-07-17 | Micron Technology, Inc. | Method and apparatus for wafer level calibration of imaging sensors |
US20080239111A1 (en) * | 2007-03-26 | 2008-10-02 | Micron Technology, Inc. | Method and appratus for dark current compensation of imaging sensors |
US8310569B2 (en) * | 2007-05-21 | 2012-11-13 | Aptina Imaging Corporation | Suppression of row-wise noise in CMOS image sensors |
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US20090040351A1 (en) * | 2007-08-09 | 2009-02-12 | Micron Technology, Inc. | Method and apparatus for reducing noise in a pixel array |
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US7924330B2 (en) * | 2007-12-20 | 2011-04-12 | Aptina Imaging Corporation | Methods and apparatuses for double sided dark reference pixel row-wise dark level non-uniformity compensation in image signals |
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US8130289B2 (en) * | 2008-09-25 | 2012-03-06 | Aptima Imaging Corporation | System, method, and apparatus for correction of dark current error in semiconductor imaging devices |
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US10154213B2 (en) | 2016-09-28 | 2018-12-11 | Semiconductor Components Industries, Llc | Image sensors having dark pixels |
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Cited By (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110205405A1 (en) * | 2004-06-30 | 2011-08-25 | Ilia Ovsiannikov | Shielding black reference pixels in image sensors |
US8411174B2 (en) * | 2004-06-30 | 2013-04-02 | Micron Technology, Inc. | Shielding black reference pixels in image sensors |
US8749675B2 (en) | 2005-03-18 | 2014-06-10 | Canon Kabushiki Kaisha | Solid state image pickup device and camera which can prevent color mixture |
US20090109314A1 (en) * | 2005-03-18 | 2009-04-30 | Canon Kabushiki Kaisha | Solid state image pickup device and camera |
US8896029B2 (en) | 2005-03-18 | 2014-11-25 | Canon Kabushiki Kaisha | Solid state image pickup device and camera |
US8390708B2 (en) * | 2005-03-18 | 2013-03-05 | Canon Kabushiki Kaisha | Solid state image pickup device and camera utilizing carrier holding unit and floating diffusion region |
US20080239124A1 (en) * | 2007-03-30 | 2008-10-02 | Sony Corporation | Solid-state imaging device, signal processing method of solid-state imaging device and imaging apparatus |
US8264580B2 (en) * | 2007-03-30 | 2012-09-11 | Sony Corporation | Solid state imaging device, signal processing method of solid-state imaging device and imaging apparatus capable of removing vertical smears |
US20090273691A1 (en) * | 2008-05-02 | 2009-11-05 | Yaowu Mo | Method and apparatus providing analog row noise correction and hot pixel filtering |
US8077227B2 (en) * | 2008-05-02 | 2011-12-13 | Aptina Imaging Corporation | Method and apparatus providing analog row noise correction and hot pixel filtering |
US20100079632A1 (en) * | 2008-09-26 | 2010-04-01 | Tom Walschap | Correlated double sampling pixel |
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US20110317055A1 (en) * | 2010-06-29 | 2011-12-29 | Kabushiki Kaisha Toshiba | Solid-state imaging device, camera module, and imaging method |
US8451350B2 (en) * | 2010-06-29 | 2013-05-28 | Kabushiki Kaisha Toshiba | Solid-state imaging device, camera module, and imaging method |
US20120312967A1 (en) * | 2011-06-10 | 2012-12-13 | Yannick De Wit | Pixel and method |
US8987646B2 (en) * | 2011-06-10 | 2015-03-24 | Semiconductor Components Industries, Llc | Pixel and method |
US20150042847A1 (en) * | 2012-04-20 | 2015-02-12 | Daisuke HOHJOH | Imaging device and image processing method |
US9444979B2 (en) * | 2012-04-20 | 2016-09-13 | Ricoh Company, Ltd. | Imaging device and image processing method |
US8946783B2 (en) | 2012-06-18 | 2015-02-03 | Samsung Electronics Co., Ltd. | Image sensors having reduced dark level differences |
US9362326B2 (en) * | 2012-08-22 | 2016-06-07 | Canon Kabushiki Kaisha | Image capturing apparatus and control method therefor |
US11162763B2 (en) | 2015-11-03 | 2021-11-02 | N2 Imaging Systems, LLC | Non-contact optical connections for firearm accessories |
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US11079202B2 (en) | 2018-07-07 | 2021-08-03 | Sensors Unlimited, Inc. | Boresighting peripherals to digital weapon sights |
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US7852385B2 (en) | 2010-12-14 |
US20060192864A1 (en) | 2006-08-31 |
US20100020213A1 (en) | 2010-01-28 |
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