US6069507A - Circuit and method for reducing delay line length in delay-locked loops - Google Patents
Circuit and method for reducing delay line length in delay-locked loops Download PDFInfo
- Publication number
- US6069507A US6069507A US09/083,790 US8379098A US6069507A US 6069507 A US6069507 A US 6069507A US 8379098 A US8379098 A US 8379098A US 6069507 A US6069507 A US 6069507A
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- Prior art keywords
- clock signal
- phase difference
- input clock
- detector
- dll
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/087—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using at least two phase detectors or a frequency and phase detector in the loop
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
- H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
- H03L7/0814—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used the phase shifting device being digitally controlled
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
- H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
- H03L7/0816—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used the controlled phase shifter and the frequency- or phase-detection arrangement being connected to a common input
Definitions
- the present invention relates to delay-locked loops (DLLs) and more particularly to reducing delay line length in DLLs.
- DLLs delay-locked loops
- Delay locked loop circuitry typically provides clock deskew functionality in computer processing environments. More recently, DLLs have found application in memory devices, such as SDRAM (synchronous dynanic access memory). In order to achieve sufficient coverage of frequency ranges and guarantee desired resolution, DLLs generally require long delay lines.
- SDRAM synchronous dynanic access memory
- FIG. 1 A diagram of a typical digital DLL is illustrated by FIG. 1.
- An input clock signal, CLKIN is received via a buffer 10.
- the buffer 10 provides a buffered clock signal CKI and is coupled to a phase detector 12, a shift register 14, and a delay line 16.
- the delay line 16 is further coupled to a buffer 18 through which an output clock signal, CLKOUT, is produced.
- the CLKOUT signal is buffered through a buffer 20 to produce a feedback clock signal, CKF, to the phase detector 12.
- the phase detector 12 determines if a phase difference exists between the buffered input and feedback clock signals, CKI and CKF.
- the phase difference determines an appropriate shift in the buffered input clock signal via adjustment of the shift register 14 to select sufficient delay via the delay line 16, as is well understood by those skilled in the art.
- the delay cells in the delay line 16 and associated register cells in shift register 14 increase in number. For example, typically 20-30 serially coupled buffers for delay line 16 are needed for 200 MHz (megahertz) clock signals.
- the expansion in length of the delay line leads to larger silicon area requirements and higher power consumption.
- Other problems with increased delay line length include a longer lock-in time and larger high frequency signal distortion.
- a digital delay lock loop (DLL) circuit for clock signals with reduced delay line length includes a first phase difference detector for detecting a first phase difference, and a second phase difference detector for detecting a second phase difference.
- the circuit further includes an inverter coupled to the second phase difference detector for inverting an input clock signal, and a switch controlled by the second phase difference detector for switching between the input clock signal and the inverted input clock signal in accordance with the second phase difference to provide a clock signal to the first phase difference detector.
- a method for reducing delay line length in a digital delay locked loop includes determining a phase difference between an input clock signal and a feedback clock signal, and maintaining the phase difference between the input clock signal and the feedback clock signal within approximately 180°. The method also includes delaying the input clock signal to compensate for the phase difference, wherein a number of delay cells utilized is reduced by approximately one-half.
- FIG. 1 illustrates a diagram of a typical digital DLL.
- FIG. 2 illustrates a diagram of a digital DLL in accordance with the present invention.
- FIG. 3 illustrates a control mechanism utilized with phase detector 30 of FIG. 2 in accordance with the present invention.
- the present invention relates to reducing delay line lengths in DLLs.
- the following description is presented to enable one of ordinary skill in the art to make and use the invention and is provided in the context of a patent application and its requirements.
- Various modifications to the preferred embodiment and the generic principles and features described herein will be readily apparent to those skilled in the art. Accordingly, it should be appreciated that although the following is described with reference to a digital DLL, the principles of the technique of the present invention are equally applicable to analog DLL circuits, as well. Further, preferred embodiments with specific logic components are described. However, other arrangements of components to achieve the benefits of the present invention may be used according to specific design reeds without departing from the spirit and scope of the present invention.
- FIG. 2 illustrates a digital DLL 24 in accordance with the present invention. Like components to those shown in FIG. 1 have been numbered similarly.
- the input clock signal CLKIN is received via a buffer 10.
- the output clock signal CLKOUT is output from the DLL via buffer 18.
- the phase detector 12 receives a feedback clock signal CKF via buffer 20.
- the DLL 24 further includes an inverter 26, a switch (e.g., a transistor) 28, and a second phase detector 30.
- the second phase detector 30 preferably controls the course of the buffered input clock signal CKI by controlling the selection of the switch 28.
- the second phase detector 30 determines that the feedback clock signal CKF from the DLL 24 is behind the buffered input clock CKI within a 180° phase difference
- the second phase detector 30 controls the switch 28 to be at position (1).
- the inverter 26 is thus bypassed, and the operation of DLL 24 proceeds in a typical manner as described with reference to FIG. 1.
- the delay line 16' is required to compensate for a less than 180° phase difference after the DLL 24 gets locked by the feedback through phase detector 12.
- the second phase detector 30 determines that CKF is more than 180° behind CKI
- the second phase detector 30 controls switch 28 to be at position (2).
- the inverted buffered clock signal is thus selected, so that the input clock signal CKI is reversed by 180°
- the phase difference needing to be compensated by the delay line 16' is made less than 180° and within the normal operation capabilities of the phase adjusting loop formed by phase detector 12, shift register 14' and delay line 16'.
- the delay line 16' requires approximately one-half the length that a typical DLL would require for comparable clock deskewing needs. For example, for a 200 MHz clock, the typical DLL would require approximately 20-30 delay cells/buffers. In contrast, with the present invention, only approximately 10 delay cells are needed. Correspondingly, only approximately 10 register cells would be needed in shift register 14' in this example embodiment of DLL 24. Regardless of the number of register cells, suitably the shift register 14' starts at a point close to the beginning of delay line 16' with shifting starting to the right.
- Second phase detector 30 is preferably provided as a low resolution detector to avoid possible improper phase jumping when the phase difference is substantially close to 0° or 180° and with a resolution lower than that of phase detector 12 (e.g., a 500 picosecond resolution for phase detector 30 and a 200 picosecond resolution for phase detector 12).
- FIG. 3 illustrates a representation of buffered input clock signal CKI.
- the detection period is approximately 20% less than the minimum clock period in normal operation, thus leaving a time separation between the edge of shaded portion 32 and the edges of CKI, referenced in FIG. 3 as dT 2 .
- a shorter delay line in a DLL is effectively achieved in a direct and uncomplicated manner.
- the reduction in delay line length produces a reduction in the number of register cells, which further results in lower power consumption and required silicon area for the DLL circuitry.
- Such reductions in power consumption and required silicon area are of particular benefit in critical applications, including SDRAMs.
- the shorter delay line provided through the present invention enhances performance by reducing high frequency distortion in the DLL.
Abstract
Description
Claims (16)
Priority Applications (1)
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US09/083,790 US6069507A (en) | 1998-05-22 | 1998-05-22 | Circuit and method for reducing delay line length in delay-locked loops |
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US09/083,790 US6069507A (en) | 1998-05-22 | 1998-05-22 | Circuit and method for reducing delay line length in delay-locked loops |
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Cited By (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6252443B1 (en) * | 1999-04-20 | 2001-06-26 | Infineon Technologies North America, Corp. | Delay element using a delay locked loop |
US6252419B1 (en) * | 1999-01-08 | 2001-06-26 | Altera Corporation | LVDS interface incorporating phase-locked loop circuitry for use in programmable logic device |
US6323705B1 (en) * | 2000-04-25 | 2001-11-27 | Winbond Electronics Corporation | Double cycle lock approach in delay lock loop circuit |
US6392458B1 (en) * | 1998-07-06 | 2002-05-21 | Micron Technology, Inc. | Method and apparatus for digital delay locked loop circuits |
US6448756B1 (en) * | 2000-08-30 | 2002-09-10 | Micron Technology, Inc. | Delay line tap setting override for delay locked loop (DLL) testability |
US6518807B1 (en) | 2001-09-20 | 2003-02-11 | Hynix Semiconductor Inc. | Mixed delay locked loop circuit |
US6696872B1 (en) * | 2002-09-23 | 2004-02-24 | Infineon Technologies Ag | Delay locked loop compensating for effective loads of off-chip drivers and methods for locking a delay loop |
US20040088058A1 (en) * | 2002-10-25 | 2004-05-06 | Lahoucine Ettaleb | Diagnostic for poorly tuned control loops |
US20040100313A1 (en) * | 2002-11-27 | 2004-05-27 | Seong-Ik Cho | Delay locked loop having low jitter in semiconductor device |
US6806755B1 (en) * | 2001-04-23 | 2004-10-19 | Quantum 3D | Technique for glitchless switching of asynchronous clocks |
US6832173B1 (en) | 2002-07-30 | 2004-12-14 | Altera Corporation | Testing circuit and method for phase-locked loop |
US20050024108A1 (en) * | 2001-08-03 | 2005-02-03 | Micron Technology, Inc. | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US20050052208A1 (en) * | 2003-09-05 | 2005-03-10 | Altera Corporation, A Corporation Of Delaware | Dual-gain loop circuitry for programmable logic device |
US6867616B1 (en) | 2003-06-04 | 2005-03-15 | Altera Corporation | Programmable logic device serial interface having dual-use phase-locked loop circuitry |
US20050141334A1 (en) * | 2003-12-24 | 2005-06-30 | Byung-Hoon Jeong | Circuit and method for controlling inversion of delay locked loop and delay locked loop and synchronous semiconductor memory device using the same |
US6924678B2 (en) | 2003-10-21 | 2005-08-02 | Altera Corporation | Programmable phase-locked loop circuitry for programmable logic device |
US20050189175A1 (en) * | 2004-02-26 | 2005-09-01 | Gardner Richard J. | Ladder support apparatus and methods |
US20060017479A1 (en) * | 2004-07-20 | 2006-01-26 | Kim Kang Y | Method and apparatus for digital phase generation at high frequencies |
US20060055440A1 (en) * | 2004-09-10 | 2006-03-16 | Jui-Hsing Tseng | Jitter-resistive delay lock loop circuit for locking delayed clock and method thereof |
US7075365B1 (en) | 2004-04-22 | 2006-07-11 | Altera Corporation | Configurable clock network for programmable logic device |
US7091760B1 (en) | 2004-02-25 | 2006-08-15 | Altera Corporation | DLL with adjustable phase shift using processed control signal |
US20060268655A1 (en) * | 2005-05-26 | 2006-11-30 | Micron Technology, Inc. | Method and system for improved efficiency of synchronous mirror delays and delay locked loops |
US20070046355A1 (en) * | 2005-09-01 | 2007-03-01 | Johnson Gary M | Method and apparatus for digital phase generation for high frequency clock applications |
US20070096785A1 (en) * | 2005-10-27 | 2007-05-03 | Nec Electronics Corporation | DLL circuit and test method thereof |
US7230495B2 (en) | 2004-04-28 | 2007-06-12 | Micron Technology, Inc. | Phase-locked loop circuits with reduced lock time |
US7277357B1 (en) | 2006-06-05 | 2007-10-02 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US7436228B1 (en) | 2005-12-22 | 2008-10-14 | Altera Corporation | Variable-bandwidth loop filter methods and apparatus |
US8120429B1 (en) | 2006-05-19 | 2012-02-21 | Altera Corporation | Voltage-controlled oscillator methods and apparatus |
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US5544203A (en) * | 1993-02-17 | 1996-08-06 | Texas Instruments Incorporated | Fine resolution digital delay line with coarse and fine adjustment stages |
US5629651A (en) * | 1994-08-12 | 1997-05-13 | Nec Corporation | Phase lock loop having a reduced synchronization transfer period |
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Cited By (75)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6392458B1 (en) * | 1998-07-06 | 2002-05-21 | Micron Technology, Inc. | Method and apparatus for digital delay locked loop circuits |
US6252419B1 (en) * | 1999-01-08 | 2001-06-26 | Altera Corporation | LVDS interface incorporating phase-locked loop circuitry for use in programmable logic device |
US6373278B1 (en) | 1999-01-08 | 2002-04-16 | Altera Corporation | LVDS interface incorporating phase-locked loop circuitry for use in programmable logic device |
US6252443B1 (en) * | 1999-04-20 | 2001-06-26 | Infineon Technologies North America, Corp. | Delay element using a delay locked loop |
US6323705B1 (en) * | 2000-04-25 | 2001-11-27 | Winbond Electronics Corporation | Double cycle lock approach in delay lock loop circuit |
US6448756B1 (en) * | 2000-08-30 | 2002-09-10 | Micron Technology, Inc. | Delay line tap setting override for delay locked loop (DLL) testability |
US6806755B1 (en) * | 2001-04-23 | 2004-10-19 | Quantum 3D | Technique for glitchless switching of asynchronous clocks |
US8212595B2 (en) | 2001-08-03 | 2012-07-03 | Round Rock Research, Llc | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US7446580B2 (en) | 2001-08-03 | 2008-11-04 | Micron Technology, Inc. | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US20050024108A1 (en) * | 2001-08-03 | 2005-02-03 | Micron Technology, Inc. | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US7605620B2 (en) * | 2001-08-03 | 2009-10-20 | Micron Technology, Inc. | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US20050140407A1 (en) * | 2001-08-03 | 2005-06-30 | Micron Technology, Inc. | System and method to improve the efficiency of synchronous mirror delays and delay locked loops |
US20100026351A1 (en) * | 2001-08-03 | 2010-02-04 | Feng Lin | System and Method to Improve the Efficiency of Synchronous Mirror Delays and Delay Locked Loops |
US6518807B1 (en) | 2001-09-20 | 2003-02-11 | Hynix Semiconductor Inc. | Mixed delay locked loop circuit |
US6832173B1 (en) | 2002-07-30 | 2004-12-14 | Altera Corporation | Testing circuit and method for phase-locked loop |
US6696872B1 (en) * | 2002-09-23 | 2004-02-24 | Infineon Technologies Ag | Delay locked loop compensating for effective loads of off-chip drivers and methods for locking a delay loop |
US20040088058A1 (en) * | 2002-10-25 | 2004-05-06 | Lahoucine Ettaleb | Diagnostic for poorly tuned control loops |
US6917229B2 (en) * | 2002-11-27 | 2005-07-12 | Hynix Semiconductor Inc. | Delay locked loop having low jitter in semiconductor device |
US20040100313A1 (en) * | 2002-11-27 | 2004-05-27 | Seong-Ik Cho | Delay locked loop having low jitter in semiconductor device |
US6867616B1 (en) | 2003-06-04 | 2005-03-15 | Altera Corporation | Programmable logic device serial interface having dual-use phase-locked loop circuitry |
US20050052208A1 (en) * | 2003-09-05 | 2005-03-10 | Altera Corporation, A Corporation Of Delaware | Dual-gain loop circuitry for programmable logic device |
US7019570B2 (en) | 2003-09-05 | 2006-03-28 | Altera Corporation | Dual-gain loop circuitry for programmable logic device |
US20050206415A1 (en) * | 2003-10-21 | 2005-09-22 | Altera Corporation, A Corporation Of Delaware | Programmable phase-locked loop circuitry for programmable logic device |
US7071743B2 (en) | 2003-10-21 | 2006-07-04 | Altera Corporation | Programmable phase-locked loop circuitry for programmable logic device |
US20060158233A1 (en) * | 2003-10-21 | 2006-07-20 | Gregory Starr | Programmable phase-locked loop circuitry for programmable logic device |
US7307459B2 (en) | 2003-10-21 | 2007-12-11 | Altera Corporation | Programmable phase-locked loop circuitry for programmable logic device |
US6924678B2 (en) | 2003-10-21 | 2005-08-02 | Altera Corporation | Programmable phase-locked loop circuitry for programmable logic device |
US20070195638A1 (en) * | 2003-12-04 | 2007-08-23 | Byung-Hoon Jeong | Delay-locked loop, integrated circuit having the same, and method of driving the same |
US7336559B2 (en) | 2003-12-24 | 2008-02-26 | Samsung Electronics Co., Ltd. | Delay-locked loop, integrated circuit having the same, and method of driving the same |
US7215596B2 (en) | 2003-12-24 | 2007-05-08 | Samsung Electronics Co., Ltd. | Circuit and method for controlling inversion of delay locked loop and delay locked loop and synchronous semiconductor memory device using the same |
US20050141334A1 (en) * | 2003-12-24 | 2005-06-30 | Byung-Hoon Jeong | Circuit and method for controlling inversion of delay locked loop and delay locked loop and synchronous semiconductor memory device using the same |
US7212054B1 (en) | 2004-02-25 | 2007-05-01 | Altera Corporation | DLL with adjustable phase shift using processed control signal |
US7091760B1 (en) | 2004-02-25 | 2006-08-15 | Altera Corporation | DLL with adjustable phase shift using processed control signal |
US20050189175A1 (en) * | 2004-02-26 | 2005-09-01 | Gardner Richard J. | Ladder support apparatus and methods |
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US7230495B2 (en) | 2004-04-28 | 2007-06-12 | Micron Technology, Inc. | Phase-locked loop circuits with reduced lock time |
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US20060017479A1 (en) * | 2004-07-20 | 2006-01-26 | Kim Kang Y | Method and apparatus for digital phase generation at high frequencies |
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US7119589B2 (en) | 2004-09-10 | 2006-10-10 | Mediatek Incorporation | Jitter-resistive delay lock loop circuit for locking delayed clock and method thereof |
US20060290394A1 (en) * | 2004-09-10 | 2006-12-28 | Jui-Hsing Tseng | Jitter-resistive delay lock loop circuit for locking delayed clock and method thereof |
US20060055440A1 (en) * | 2004-09-10 | 2006-03-16 | Jui-Hsing Tseng | Jitter-resistive delay lock loop circuit for locking delayed clock and method thereof |
US7236027B2 (en) | 2004-09-10 | 2007-06-26 | Mediatek Inc. | Jitter-resistive delay lock loop circuit for locking delayed clock and method thereof |
US20090021290A1 (en) * | 2005-05-26 | 2009-01-22 | Feng Lin | Method and System for Improved Efficiency of Synchronous Mirror Delays and Delay Locked Loops |
US20060268655A1 (en) * | 2005-05-26 | 2006-11-30 | Micron Technology, Inc. | Method and system for improved efficiency of synchronous mirror delays and delay locked loops |
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US7304516B2 (en) | 2005-09-01 | 2007-12-04 | Micron Technology, Inc. | Method and apparatus for digital phase generation for high frequency clock applications |
US20070046355A1 (en) * | 2005-09-01 | 2007-03-01 | Johnson Gary M | Method and apparatus for digital phase generation for high frequency clock applications |
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US7642825B2 (en) * | 2005-10-27 | 2010-01-05 | Nec Electronics Corporation | DLL circuit and test method thereof |
US20070096785A1 (en) * | 2005-10-27 | 2007-05-03 | Nec Electronics Corporation | DLL circuit and test method thereof |
US7436228B1 (en) | 2005-12-22 | 2008-10-14 | Altera Corporation | Variable-bandwidth loop filter methods and apparatus |
US8120429B1 (en) | 2006-05-19 | 2012-02-21 | Altera Corporation | Voltage-controlled oscillator methods and apparatus |
US8134886B2 (en) | 2006-06-05 | 2012-03-13 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US7965580B2 (en) | 2006-06-05 | 2011-06-21 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US20100014377A1 (en) * | 2006-06-05 | 2010-01-21 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US7596052B2 (en) | 2006-06-05 | 2009-09-29 | Micron Technology Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US8462579B2 (en) | 2006-06-05 | 2013-06-11 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US7277357B1 (en) | 2006-06-05 | 2007-10-02 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
US20080042702A1 (en) * | 2006-06-05 | 2008-02-21 | Micron Technology, Inc. | Method and apparatus for reducing oscillation in synchronous circuits |
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