US5765744A - Production of small metal bumps - Google Patents
Production of small metal bumps Download PDFInfo
- Publication number
- US5765744A US5765744A US08/678,474 US67847496A US5765744A US 5765744 A US5765744 A US 5765744A US 67847496 A US67847496 A US 67847496A US 5765744 A US5765744 A US 5765744A
- Authority
- US
- United States
- Prior art keywords
- small metal
- electrodes
- metal balls
- balls
- baseplate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3478—Applying solder preforms; Transferring prefabricated solder patterns
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0607—Solder feeding devices
- B23K3/0623—Solder feeding devices for shaped solder piece feeding, e.g. preforms, bumps, balls, pellets, droplets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4853—Connection or disconnection of other leads to or from a metallisation, e.g. pins, wires, bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/11001—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate
- H01L2224/11003—Involving a temporary auxiliary member not forming part of the manufacturing apparatus, e.g. removable or sacrificial coating, film or substrate for holding or transferring the bump preform
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/113—Manufacturing methods by local deposition of the material of the bump connector
- H01L2224/1133—Manufacturing methods by local deposition of the material of the bump connector in solid form
- H01L2224/11334—Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01019—Potassium [K]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/01—Tools for processing; Objects used during processing
- H05K2203/0104—Tools for processing; Objects used during processing for patterning or coating
- H05K2203/0113—Female die used for patterning or transferring, e.g. temporary substrate having recessed pattern
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0278—Flat pressure, e.g. for connecting terminals with anisotropic conductive adhesive
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0338—Transferring metal or conductive material other than a circuit pattern, e.g. bump, solder, printed component
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/04—Soldering or other types of metallurgic bonding
- H05K2203/041—Solder preforms in the shape of solder balls
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/08—Treatments involving gases
- H05K2203/082—Suction, e.g. for holding solder balls or components
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Mechanical Engineering (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Abstract
Description
Claims (6)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/678,474 US5765744A (en) | 1995-07-11 | 1996-07-09 | Production of small metal bumps |
JP18100396A JP3429953B2 (en) | 1995-07-11 | 1996-07-10 | Method and apparatus for manufacturing fine metal bumps |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17521795 | 1995-07-11 | ||
US08/678,474 US5765744A (en) | 1995-07-11 | 1996-07-09 | Production of small metal bumps |
JP18100396A JP3429953B2 (en) | 1995-07-11 | 1996-07-10 | Method and apparatus for manufacturing fine metal bumps |
Publications (1)
Publication Number | Publication Date |
---|---|
US5765744A true US5765744A (en) | 1998-06-16 |
Family
ID=27324067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US08/678,474 Expired - Lifetime US5765744A (en) | 1995-07-11 | 1996-07-09 | Production of small metal bumps |
Country Status (2)
Country | Link |
---|---|
US (1) | US5765744A (en) |
JP (1) | JP3429953B2 (en) |
Cited By (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5941449A (en) * | 1996-07-23 | 1999-08-24 | International Business Machines Corporation | Method of making an electronic package having spacer elements |
US6056190A (en) * | 1997-02-06 | 2000-05-02 | Speedline Technologies, Inc. | Solder ball placement apparatus |
US6099079A (en) * | 1997-04-28 | 2000-08-08 | Bauer; Heinz | Belt integral seat of a motor vehicle with a retractor for the safety belt and a sensor steering the retractor |
US6156635A (en) * | 1998-02-17 | 2000-12-05 | Mitsubishi Denki Kabushiki Kaisha | Method of correcting solder bumps |
US6170737B1 (en) | 1997-02-06 | 2001-01-09 | Speedline Technologies, Inc. | Solder ball placement method |
US6202918B1 (en) | 1997-01-28 | 2001-03-20 | Eric Hertz | Method and apparatus for placing conductive preforms |
US6230963B1 (en) | 1997-01-28 | 2001-05-15 | Eric L. Hertz | Method and apparatus using colored foils for placing conductive preforms |
US6245595B1 (en) * | 1999-07-22 | 2001-06-12 | National Semiconductor Corporation | Techniques for wafer level molding of underfill encapsulant |
US6352915B1 (en) | 1997-12-30 | 2002-03-05 | Samsung Aerospace Industries, Ltd. | Method for manufacturing semiconductor package containing cylindrical type bump grid array |
US6352878B1 (en) * | 2000-06-19 | 2002-03-05 | National Semiconductor Corporation | Method for molding a bumped wafer |
US6412685B2 (en) | 1997-01-28 | 2002-07-02 | Galahad, Co. | Method and apparatus for release and optional inspection for conductive preforms placement apparatus |
US6641030B1 (en) | 1997-02-06 | 2003-11-04 | Speedline Technologies, Inc. | Method and apparatus for placing solder balls on a substrate |
US20040099962A1 (en) * | 2002-11-22 | 2004-05-27 | Sarathy Rajagopalan | Flip chip electrical test yields by countering substrate die area coplanarity |
US20040109602A1 (en) * | 2002-11-22 | 2004-06-10 | Yusuke Konno | Method and apparatus for inspecting a bump electrode |
US6884708B2 (en) * | 1996-08-27 | 2005-04-26 | Nippon Steel Corporation | Method of partially plating substrate for electronic devices |
NL1024688C2 (en) * | 2003-11-03 | 2005-05-04 | Meco Equip Eng | Soldering method for forming electrical contact devices, comprises engaging solder with heating element in order to heat solder by conduction |
US20050232728A1 (en) * | 2004-03-31 | 2005-10-20 | Rice Michael R | Methods and apparatus for transferring conductive pieces during semiconductor device fabrication |
US20060022690A1 (en) * | 2004-07-28 | 2006-02-02 | K&S Interconnect, Inc. | Method and apparatus for producing co-planar bonding pads on a substrate |
US20130113116A1 (en) * | 2011-11-08 | 2013-05-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Contact and Method of Formation |
US20150008580A1 (en) * | 2013-07-02 | 2015-01-08 | SK Hynix Inc. | Stacked package and method for manufacturing the same |
US20170023617A1 (en) * | 2015-06-10 | 2017-01-26 | Translarity, Inc. | Shaping of contact structures for semiconductor test, and associated systems and methods |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11326379A (en) | 1998-03-12 | 1999-11-26 | Fujitsu Ltd | Contactor for electronic component and manufacturing method thereof and apparatus for manufacturing contactor |
JPH11354561A (en) * | 1998-06-09 | 1999-12-24 | Advantest Corp | Bump and method for forming the same |
KR100397284B1 (en) * | 2000-12-26 | 2003-09-06 | (주) 큐인테크 | Apparatus for preparing of solder ball bumping area |
EP1673944B1 (en) | 2003-10-14 | 2019-09-04 | InterDigital VC Holdings, Inc. | Technique for bit-accurate film grain simulation |
US7056766B2 (en) * | 2003-12-09 | 2006-06-06 | Freescale Semiconductor, Inc. | Method of forming land grid array packaged device |
JP2005286166A (en) * | 2004-03-30 | 2005-10-13 | Nec Electronics Corp | Coining apparatus and method |
JP2006258826A (en) * | 2006-06-20 | 2006-09-28 | Advantest Corp | Bump forming method and bump |
JP5648200B2 (en) * | 2010-12-17 | 2015-01-07 | 株式会社アドウェルズ | Joining method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3589000A (en) * | 1969-01-13 | 1971-06-29 | Du Pont | Method for attaching integrated circuit chips to thick film circuitry |
US5172853A (en) * | 1990-11-30 | 1992-12-22 | Siemens Aktiengesellschaft | Method for applying solder to printed wiring boards and printed wiring board to which solder has been applied |
US5275970A (en) * | 1990-10-17 | 1994-01-04 | Nec Corporation | Method of forming bonding bumps by punching a metal ribbon |
US5289631A (en) * | 1992-03-04 | 1994-03-01 | Mcnc | Method for testing, burn-in, and/or programming of integrated circuit chips |
-
1996
- 1996-07-09 US US08/678,474 patent/US5765744A/en not_active Expired - Lifetime
- 1996-07-10 JP JP18100396A patent/JP3429953B2/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3589000A (en) * | 1969-01-13 | 1971-06-29 | Du Pont | Method for attaching integrated circuit chips to thick film circuitry |
US5275970A (en) * | 1990-10-17 | 1994-01-04 | Nec Corporation | Method of forming bonding bumps by punching a metal ribbon |
US5172853A (en) * | 1990-11-30 | 1992-12-22 | Siemens Aktiengesellschaft | Method for applying solder to printed wiring boards and printed wiring board to which solder has been applied |
US5289631A (en) * | 1992-03-04 | 1994-03-01 | Mcnc | Method for testing, burn-in, and/or programming of integrated circuit chips |
Non-Patent Citations (4)
Title |
---|
"Dimensional Control of Plated Wiring Board Surface Solder Deposits," (Anonymous), Research Disclosure, Jan. 1992, No. 333. |
"Leveling Technique for Pads of Predeposited Solder," IBM Tech. Discl. Bull., vol. 32, No. 1, Jun. 1989, pp. 50-51. |
Dimensional Control of Plated Wiring Board Surface Solder Deposits, (Anonymous), Research Disclosure, Jan. 1992, No. 333. * |
Leveling Technique for Pads of Predeposited Solder, IBM Tech. Discl. Bull., vol. 32, No. 1, Jun. 1989, pp. 50 51. * |
Cited By (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5941449A (en) * | 1996-07-23 | 1999-08-24 | International Business Machines Corporation | Method of making an electronic package having spacer elements |
US6884708B2 (en) * | 1996-08-27 | 2005-04-26 | Nippon Steel Corporation | Method of partially plating substrate for electronic devices |
US6202918B1 (en) | 1997-01-28 | 2001-03-20 | Eric Hertz | Method and apparatus for placing conductive preforms |
US6230963B1 (en) | 1997-01-28 | 2001-05-15 | Eric L. Hertz | Method and apparatus using colored foils for placing conductive preforms |
US6412685B2 (en) | 1997-01-28 | 2002-07-02 | Galahad, Co. | Method and apparatus for release and optional inspection for conductive preforms placement apparatus |
US6641030B1 (en) | 1997-02-06 | 2003-11-04 | Speedline Technologies, Inc. | Method and apparatus for placing solder balls on a substrate |
US6056190A (en) * | 1997-02-06 | 2000-05-02 | Speedline Technologies, Inc. | Solder ball placement apparatus |
US6170737B1 (en) | 1997-02-06 | 2001-01-09 | Speedline Technologies, Inc. | Solder ball placement method |
US6099079A (en) * | 1997-04-28 | 2000-08-08 | Bauer; Heinz | Belt integral seat of a motor vehicle with a retractor for the safety belt and a sensor steering the retractor |
US6352915B1 (en) | 1997-12-30 | 2002-03-05 | Samsung Aerospace Industries, Ltd. | Method for manufacturing semiconductor package containing cylindrical type bump grid array |
US6156635A (en) * | 1998-02-17 | 2000-12-05 | Mitsubishi Denki Kabushiki Kaisha | Method of correcting solder bumps |
US6245595B1 (en) * | 1999-07-22 | 2001-06-12 | National Semiconductor Corporation | Techniques for wafer level molding of underfill encapsulant |
US6352878B1 (en) * | 2000-06-19 | 2002-03-05 | National Semiconductor Corporation | Method for molding a bumped wafer |
US20040099962A1 (en) * | 2002-11-22 | 2004-05-27 | Sarathy Rajagopalan | Flip chip electrical test yields by countering substrate die area coplanarity |
US20040109602A1 (en) * | 2002-11-22 | 2004-06-10 | Yusuke Konno | Method and apparatus for inspecting a bump electrode |
NL1024688C2 (en) * | 2003-11-03 | 2005-05-04 | Meco Equip Eng | Soldering method for forming electrical contact devices, comprises engaging solder with heating element in order to heat solder by conduction |
US20050232728A1 (en) * | 2004-03-31 | 2005-10-20 | Rice Michael R | Methods and apparatus for transferring conductive pieces during semiconductor device fabrication |
WO2005097390A1 (en) * | 2004-03-31 | 2005-10-20 | Applied Materials, Inc. | Methods and apparatus for transferring conductive pieces during semiconductor device fabrication |
US20080283387A1 (en) * | 2004-03-31 | 2008-11-20 | Applied Materials, Inc. | Methods and apparatus for transferring conductive pieces during semiconductor device fabrication |
US7407081B2 (en) | 2004-03-31 | 2008-08-05 | Applied Materials, Inc. | Methods and apparatus for transferring conductive pieces during semiconductor device fabrication |
WO2006014894A3 (en) * | 2004-07-28 | 2006-05-04 | K & S Interconnect Inc | Method and apparatus for producing co-planar bonding pads on a substrate |
US7393773B2 (en) | 2004-07-28 | 2008-07-01 | Sv Probe Pte Ltd. | Method and apparatus for producing co-planar bonding pads on a substrate |
WO2006014894A2 (en) * | 2004-07-28 | 2006-02-09 | Sv Probe Pte Ltd. | Method and apparatus for producing co-planar bonding pads on a substrate |
US20060022690A1 (en) * | 2004-07-28 | 2006-02-02 | K&S Interconnect, Inc. | Method and apparatus for producing co-planar bonding pads on a substrate |
US20130113116A1 (en) * | 2011-11-08 | 2013-05-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Contact and Method of Formation |
US8586408B2 (en) * | 2011-11-08 | 2013-11-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Contact and method of formation |
US9059148B2 (en) | 2011-11-08 | 2015-06-16 | Taiwan Semiconductor Manufacturing Company, Ltd. | Contact structure |
US20150008580A1 (en) * | 2013-07-02 | 2015-01-08 | SK Hynix Inc. | Stacked package and method for manufacturing the same |
US9165899B2 (en) * | 2013-07-02 | 2015-10-20 | SK Hynix Inc. | Stacked package and method for manufacturing the same |
US20170023617A1 (en) * | 2015-06-10 | 2017-01-26 | Translarity, Inc. | Shaping of contact structures for semiconductor test, and associated systems and methods |
Also Published As
Publication number | Publication date |
---|---|
JPH0982718A (en) | 1997-03-28 |
JP3429953B2 (en) | 2003-07-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5765744A (en) | Production of small metal bumps | |
EP0320244B1 (en) | Electrical contact bump and a package provided with the same | |
US5118370A (en) | LSI chip and method of producing same | |
US5813115A (en) | Method of mounting a semiconductor chip on a wiring substrate | |
US5650667A (en) | Process of forming conductive bumps on the electrodes of semiconductor chips using lapping and the bumps thereby created | |
KR960006967B1 (en) | Method for bonding lead with electrode of electronic device | |
US5960262A (en) | Stitch bond enhancement for hard-to-bond materials | |
Zama et al. | Flip chip interconnect systems using copper wire stud bump and lead free solder | |
JPH0555635A (en) | Flip chip connection structure of electronic part | |
US6404063B2 (en) | Die-to-insert permanent connection and method of forming | |
US20020182778A1 (en) | Flexible package fabrication method | |
JPH0799202A (en) | Capillary for wire bonding device and method for forming electric connection bump using the same | |
US5899376A (en) | Transfer of flux onto electrodes and production of bumps on electrodes | |
JPH02312240A (en) | Formation of bump | |
US20030159274A1 (en) | Bump forming system employing attracting and compressing device | |
JP2888036B2 (en) | Method for manufacturing semiconductor device | |
KR100196349B1 (en) | Manufacture of small type metal bump | |
JP3540864B2 (en) | Method of forming fine bumps | |
JP3553246B2 (en) | Method of manufacturing IC module for IC card and method of manufacturing IC module | |
JPH08186117A (en) | Method for capillary and bump forming of wire bonding apparatus | |
JPH0671034B2 (en) | Method and jig for forming metal projection | |
JP3550946B2 (en) | TAB type semiconductor device | |
JP2751726B2 (en) | Method for manufacturing film carrier semiconductor device | |
JP2553810B2 (en) | Bonding device | |
JP3766362B2 (en) | Manufacturing method of semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: NIPPON STEEL CORPORATION, JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:TATUMI, KOUHEI;SHIMOKAWA, KENJI;HASHINO, EIJI;REEL/FRAME:008227/0032 Effective date: 19960619 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
CC | Certificate of correction | ||
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
AS | Assignment |
Owner name: NIPPON STEEL MATERIALS CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:NIPPON STEEL CORPORATION;REEL/FRAME:021985/0745 Effective date: 20081121 |
|
FPAY | Fee payment |
Year of fee payment: 12 |
|
AS | Assignment |
Owner name: NIPPON VENTURE BUSINESS CAPITAL CO., LTD., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:NIPPON STEEL & SUMIKIN MATERIALS CO., LTD.;REEL/FRAME:037844/0972 Effective date: 20160210 Owner name: NIPPON STEEL & SUMIKIN MATERIALS CO., LTD., JAPAN Free format text: CHANGE OF NAME;ASSIGNOR:NIPPON STEEL MATERIALS CO., LTD.;REEL/FRAME:037973/0178 Effective date: 20121001 |