US20170086293A1 - Package carrier and manufacturing method thereof - Google Patents

Package carrier and manufacturing method thereof Download PDF

Info

Publication number
US20170086293A1
US20170086293A1 US14/932,974 US201514932974A US2017086293A1 US 20170086293 A1 US20170086293 A1 US 20170086293A1 US 201514932974 A US201514932974 A US 201514932974A US 2017086293 A1 US2017086293 A1 US 2017086293A1
Authority
US
United States
Prior art keywords
layer
patterned circuit
hole
substrate
circuit layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US14/932,974
Inventor
Chih-Hsien Cheng
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Subtron Technology Co Ltd
Original Assignee
Subtron Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Subtron Technology Co Ltd filed Critical Subtron Technology Co Ltd
Assigned to SUBTRON TECHNOLOGY CO., LTD. reassignment SUBTRON TECHNOLOGY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHENG, CHIH-HSIEN
Publication of US20170086293A1 publication Critical patent/US20170086293A1/en
Priority to US15/723,206 priority Critical patent/US10297517B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • H05K1/115Via connections; Lands around holes or via connections
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3677Wire-like or pin-like cooling fins or heat sinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49822Multilayer substrates
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0201Thermal arrangements, e.g. for cooling, heating or preventing overheating
    • H05K1/0203Cooling of mounted components
    • H05K1/0204Cooling of mounted components using means for thermal conduction connection in the thickness direction of the substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/0026Etching of the substrate by chemical or physical means by laser ablation
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0047Drilling of holes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0094Filling or covering plated through-holes or blind plated vias, e.g. for masking or for mechanical reinforcement
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections
    • H05K3/425Plated through-holes or plated via connections characterised by the sequence of steps for plating the through-holes or via connections in relation to the conductive pattern
    • H05K3/427Plated through-holes or plated via connections characterised by the sequence of steps for plating the through-holes or via connections in relation to the conductive pattern initial plating of through-holes in metal-clad substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227Other objects, e.g. metallic pieces
    • H05K2201/10416Metallic blocks or heatsinks completely inserted in a PCB
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0191Using tape or non-metallic foil in a process, e.g. during filling of a hole with conductive paste
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/022Processes for manufacturing precursors of printed circuits, i.e. copper-clad substrates

Definitions

  • the present invention relates to a package structure and a method for manufacturing the same, and particularly relates to a package carrier and a method for manufacturing the same.
  • the heat conducting slug is embedded inside the package carrier in order to effectively enhance the heat conducting effect of the package carrier.
  • the hole used to embed the heat conducting slug of the package carrier is manufactured by mechanical routing process or laser routing process, and therefore the profile of the hole from top view is easily formed as a rounded rectangular.
  • the heat conducting slug is manufactured by etching process and laser cutting process, and therefore the profile of the heat conducting slug from top view is a right angle rectangular. Hence, stress is concentrated at the sharp corner of the heat conducting slug or the sharp corner of the heat conducting slug leans against the rounded corner of the hole so that the heat conducting slug cannot be positioned inside the hole.
  • the production process of the heat conducting slug is also long because of etching process, and simultaneously the disadvantage that the cutting quality is inconsistent is generated because of laser cutting process.
  • the gap between the hole and the heat conducting slug needs being greater than 200 micrometers, so as to affect the circuit layout of the package carrier. Therefore, how to narrow the gap between the hole and the heat conducting slug and to increase the density of the circuit layout is an urgent issue that needs being solved.
  • the invention provides a package carrier having a higher density circuit layout and a better structural reliability.
  • the invention also provides a manufacturing method of the package carrier, which is adapted to manufacture the above-mentioned package carrier.
  • the invention provides the manufacturing method of the package carrier, which includes following steps.
  • a substrate having a through hole is provided, wherein a profile of the through hole from top view is a first rounded rectangular.
  • a heat conducting slug is disposed inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular.
  • the through hole of the substrate is filled with an insulating material so as to fix the heat conducting slug in the through hole via the insulating material.
  • a conductive through hole structure, a first patterned circuit layer and a second patterned circuit layer are for' red.
  • the first patterned circuit layer and the second patterned circuit layer are respectively formed on two opposite sides of the substrate and expose a portion of the substrate.
  • the conductive through hole structure penetrates the substrate and connects a portion of the first patterned circuit layer and a portion of the second patterned circuit layer.
  • a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
  • the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of a rounded corner of the second rounded rectangular is from 50 micrometers to 500 micrometers.
  • the radius of the curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
  • the manufacturing method of the package carrier further comprises: a grinding process is performed to remove a portion of the substrate, a portion of the insulating material, and a portion of the heat conducting slug after filling the through hole of the substrate with the insulating material and before forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer, so that a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
  • the steps forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer comprise: a first metal layer and a second metal layer are formed, wherein the first metal layer covers the upper surface of the substrate, the first surface of the insulating material, and the top surface of the heat conducting slug, and the second metal layer covers the lower surface of the substrate, the second surface of the insulating material, and the bottom surface of the heat conducting slug.
  • a passing hole is formed, which penetrates through the first metal layer, the substrate, and the second metal layer. Forming a seed layer on the first metal layer, an inner wall of the passing hole, and the second metal layer.
  • the passing hole is filled with a filling material to form the conductive through hole structure, wherein the seed layer is located between the filling material and the inner wall of the passing hole, and a third surface and a fourth surface opposite to each other of the filling material are substantially coplanar with a fifth surface and a sixth surface opposite to each other of the seed layer respectively.
  • a third metal layer and a fourth metal layer are formed, wherein the third metal layer covers the fifth surface of the seed layer and the third surface of the filling material, and the fourth metal layer covers the sixth surface of the seed layer and the fourth surface of the filling material.
  • a patterning process is performed to pattern the third metal layer, the seed layer, and the first metal layer so as to form the first patterned circuit layer, and to pattern the fourth metal layer, the seed layer, and the second metal layer so as to form the second patterned circuit layer.
  • the manufacturing method of the package carrier further comprises: a first solder mask layer and a second solder mask layer are formed after forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer.
  • the first solder mask layer is disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer
  • the second solder mask layer is disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer.
  • a first surface treatment layer and a second surface treatment layer are formed. The first surface treatment layer is disposed on the first patterned circuit layer exposed by the first solder mask layer, and the second surface treatment layer is disposed on the second patterned circuit layer exposed by the second solder mask layer.
  • the package carrier of the invention includes a substrate, a heat conducting slug, an insulating material, a first patterned circuit layer, a second patterned circuit layer, and a conductive through hole structure.
  • the substrate has a through hole, wherein a profile of the through hole from top view is a first rounded rectangular.
  • the heat conducting slug is disposed inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular.
  • the insulating material is disposed inside the through hole of the substrate so as to fix the heat conducting slug in the through hole via the insulating material.
  • the first patterned circuit layer is disposed on one side of the substrate.
  • the second patterned circuit layer is disposed on another side of the substrate.
  • the conductive through hole structure penetrates the substrate and connects a portion of the first patterned circuit layer and a portion of the second patterned circuit layer
  • a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
  • the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of a rounded corner of the second rounded rectangular is from 50 micrometers to 500 micrometers.
  • the radius of the curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
  • a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
  • the package carrier further includes a first solder mask layer and a second solder mask layer.
  • the first solder mask layer is disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer.
  • the second solder mask layer is disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer.
  • the package carrier further includes a first surface treatment layer and a second surface treatment layer.
  • the first surface treatment layer is disposed on the first patterned circuit layer exposed by the first solder mask layer.
  • the second surface treatment layer is disposed on the second patterned circuit layer exposed by the second solder mask layer.
  • the profile of the heat conducting slug of the invention from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug, and to improve the structural reliability of the package carrier.
  • the profiles of the heat conducting slug and the through hole of the substrate from top view are the same (the rounded rectangular), and therefore the heat conducting slug does not generate structural interference when positioning inside the through hole of the substrate, so that the heat conducting slug can be accurately positioned inside the through hole to improve the structural reliability of the package carrier.
  • FIG. 1A to FIG. 1M are cross-sectional schematic views depicting a manufacturing method of a package carrier of one embodiment of the invention.
  • FIG. 2 is a partial schematic top view depicting a heat conducting element disposed inside a through hole of a substrate corresponding to FIG. 1D .
  • FIG. 3 is a partial schematic top view depicting an insulating material disposed inside a through hole of a substrate corresponding to FIG. 1E .
  • FIG. 4 is a cross-sectional schematic view depicting the package carrier carrying a heat generating element corresponding to FIG. 1M .
  • FIG. 1A to FIG. 1M are cross-sectional schematic views depicting a manufacturing method of a package carrier of one embodiment of the invention.
  • FIG. 2 is a partial schematic top view depicting a heat conducting element disposed inside a through hole of a substrate corresponding to FIG. 1D .
  • FIG. 3 is a partial schematic top view depicting an insulating material disposed inside a through hole of a substrate corresponding to FIG. 1E .
  • the manufacturing method of the package carrier firstly, referring to FIG. 1A , providing a substrate 110 ′.
  • the substrate 110 ′ of the present embodiment can be, for example, a single layer circuit board, a double layer circuit board, or a multi-layer circuit board.
  • the substrate 110 ′ is a double layer circuit board which is constructed by a dielectric layer 112 and circuit layers 114 ′, 116 ′ located at two opposite sides of the dielectric layer 112 , but the invention is not limited thereto.
  • a through hole 118 which penetrates through the dielectric layer 112 and the circuit layers 114 ′, 116 ′ of the substrate 110 ′, wherein a profile of the through hole 118 from top view is a first rounded rectangular 118 a.
  • the method for forming the through hole 118 is, for example, punching, routing, mechanical drilling, laser drilling, or other appropriate methods, which are not limited by the invention.
  • the radius of the curvature of the first rounded rectangular 118 a is, for example, greater than or equal to 1 times of the gap L, or the radius of the curvature can be, for example, from 1.5 times to 15 times of the gap L, but the invention is not limited thereto.
  • the radius of the curvature of the first rounded rectangular 118 a is from 100 micrometers to 500 micrometers.
  • the gap L is, for example, from 50 micrometers to 500 micrometers. The above-mentioned scope is used for description and the invention is not limited thereto.
  • an adhesive layer AD is disposed on one side of the substrate 110 ′, wherein the adhesive layer AD and the through hole 118 of the substrate 110 ′ define an accommodating space S. It should be noted here, the adhesive layer AD is only adhered to one side of the substrate 110 ′ temporarily to serve as a supporting element for a subsequent heat conducting element 120 ′.
  • a heat conducting slug 120 ′ inside the through hole 118 of the substrate 110 ′ and in the accommodating space S, wherein a gap L is in between the heat conducting slug 120 ′ and the inner wall of the through hole 118 , and a profile of the heat conducting slug 120 ′ from top view is a second rounded rectangular 120 a.
  • the heat conducting slug 120 ′ of the present embodiment is formed by a punch-pressing process, and therefore the peripheral corners of the heat conducting slug 120 ′ are all rounded corners, so as to prevent the conventional problem that stress concentration is generated at the right angle corners of the heat conducting slug.
  • the heat conducting slug 120 ′ in the present embodiment is formed by the punch-pressing process, therefore, the production is at a fast rate and the process stability is high, so as to prevent the product quality from being varied, and to improve the product yield.
  • the radius of the curvature of the rounded corner of the second rounded rectangular 120 a is from 50 micrometers to 500 micrometers, herein, the material of the heat conducting slug 120 ′ is, for example, metal such as copper, copper alloys, aluminum, aluminum alloys, titanium, titanium alloys, etc., but it is not limited thereto.
  • the method for filling the through hole 118 of the substrate 110 ′ with the insulating material is, for example, vacuum screen printing, but not be limited thereto.
  • the material of the insulating material is, for example, resin or glue, but not be limited thereto.
  • removing the adhesive layer AD (referring to FIG. 1D ), so as to expose the heat conducting slug 120 ′ and the circuit layer 116 ′.
  • the method for removing the adhesive layer AD is a mechanical stripping method.
  • a grinding process is performed to remove a portion of the substrate 110 ′, a portion of the insulating material, and a portion of the heat conducting slug 120 ′, so as to form the insulating material 130 , the heat conducting slug 120 , and the substrate 110 having the circuit layers 114 , 116 , and the dielectric layer 112 .
  • a top surface 122 and a bottom surface 124 opposite to each other of the heat conducting slug 120 are substantially coplanar with a first surface 132 and a second surface 134 opposite to each other of the insulating material 130 respectively, and substantially coplanar with an upper surface 111 and a lower surface 113 opposite to each other of the substrate 110 respectively.
  • first metal layer 142 and a second metal layer 144 wherein the first metal layer 142 covers the upper surface 111 of the substrate 110 , the first surface 132 of the insulating material 130 , and the top surface 122 of the heat conducting slug 120 , and the second metal layer 144 covers the lower surface 113 of the substrate 110 , the second surface 134 of the insulating material 130 , and the bottom surface 124 of the heat conducting slug 120 .
  • the material of the first metal layer 142 and the second metal layer 144 is, for example, copper, copper alloys, aluminum, aluminum alloys, titanium, titanium alloys, etc., but it is not limited thereto.
  • the method for forming the passing hole H is, for example, punching, routing, mechanical drilling, laser drilling, or other appropriate methods, which are not limited by the invention.
  • the material of the seed layer 150 is, for example, copper, or conductive materials such as conducting polymer, which are not limited by the invention.
  • the seed layer 150 is located between the filling material 155 and the inner wall of the through hole 118 , and a third surface 157 and a fourth surface 159 opposite to each other of the filling material 155 are substantially coplanar with a fifth surface 152 and a sixth surface 154 opposite to each other of the seed layer 150 respectively.
  • the conductive through hole structure T is constructed by the seed layer 150 and the filling material 155 .
  • the material of the filling material 155 is, for example, resin or glue.
  • a third metal layer 162 and a fourth metal layer 164 wherein the third metal layer 162 covers the fifth surface 152 of the seed layer 150 and the third surface 157 of the filling material 155 , and the fourth metal layer 164 covers the sixth surface 154 of the seed layer 150 and the fourth surface 159 of the filling material 155 .
  • the material of the third metal layer 162 and the fourth metal layer 164 is, for example, copper, etc.
  • the first patterned circuit layer 172 and the second patterned circuit layer 174 are respectively formed on two opposite sides of the substrate 110 and expose a portion of the substrate 110 , and the conductive through hole structure T penetrates the substrate 110 and connects a portion of the first patterned circuit layer 172 and a portion of the second patterned circuit layer 174 .
  • first solder mask layer 182 and a second solder mask layer 184 optionally forming a first solder mask layer 182 and a second solder mask layer 184 , wherein the first solder mask layer 182 is disposed on the first patterned circuit layer 172 and exposes a portion of the first patterned circuit layer 172 , and the second solder mask layer 184 is disposed on the second patterned circuit layer 174 and exposes a portion of the second patterned circuit layer 174 .
  • first surface treatment layer 192 and a second surface treatment layer 194 in order to maintain the structural properties of the exposed first patterned circuit layer 172 and the exposed second patterned circuit layer 174 , forming a first surface treatment layer 192 and a second surface treatment layer 194 , wherein the first surface treatment layer 192 is disposed on the first patterned circuit layer 172 exposed by the first solder mask layer 182 , and the second surface treatment layer 194 is disposed on the second patterned circuit layer 174 exposed by the second solder mask layer 184 .
  • the material of the first surface treatment layer 192 and the second surface treatment layer 194 in the present embodiment is, for example, nickel, palladium, gold, or alloys of the said materials, so as to prevent the first patterned circuit layer 172 and the second patterned circuit layer 174 from being oxidized or being subject to the external contamination. So far, the package carrier 100 is completely manufactured.
  • the package carrier 100 of the present embodiment includes the substrate 110 , the heat conducting slug 120 , the insulating material 130 , the first patterned circuit layer 172 , the second patterned circuit layer 174 , and the conductive through hole structure T.
  • the substrate 110 has a through hole 118 , wherein a profile of the through hole 118 from top view is a first rounded rectangular 118 a (as shown in FIG. 2 ), preferably, the radius of the curvature of the rounded corner of the first rounded rectangular 118 a is from 100 micrometers to 500 micrometers.
  • the heat conducting slug 120 is disposed inside the through hole 118 of the substrate 110 , wherein the heat conducting slug 120 and the inner wall of the through hole 118 are separated with a gap L (referring to FIG. 2 ), and the profile of the heat conducting slug 120 from top view is a second rounded rectangular 120 a.
  • the radius of the curvature of the first rounded rectangular 118 is greater than or equal to 1 times of the gap L.
  • the heat conducting slug 120 is formed by a punch-pressing process, and the radius of the curvature of the second rounded rectangular 120 a is from 50 micrometers to 500 micrometers.
  • the insulating material 130 is disposed inside the through hole 118 of the substrate 110 so as to fix the heat conducting slug 120 in the through hole 118 via the insulating material 130 .
  • the top surface 122 and the bottom surface 124 opposite to each other of the heat conducting slug 120 are substantially coplanar with the first surface 132 and the second surface 134 opposite to each other of the insulating material 130 respectively, and substantially coplanar with the upper surface 111 and the lower surface 113 opposite to each other of the substrate 110 respectively.
  • the first patterned circuit layer 172 is disposed on one side of the substrate 110
  • the second patterned circuit layer 174 is disposed on another side of the substrate 110 .
  • the conductive through hole structure T penetrates the substrate 110 and connects a portion of the first patterned circuit layer 172 and a portion of the second patterned circuit layer 174 .
  • the package carrier 100 in the present embodiment can optionally include the first solder mask layer 182 , the second solder mask layer 184 , the first surface treatment layer 192 , and the second surface treatment layer 194 .
  • the first solder mask layer 182 is disposed on the first patterned circuit layer 172 and exposes a portion of the first patterned circuit layer 172
  • the second solder mask layer 184 is disposed on the second patterned circuit layer 174 and exposes a portion of the second patterned circuit layer 174
  • the first surface treatment layer 192 is disposed on the first patterned circuit layer 172 exposed by the first solder mask layer 182
  • the second surface treatment layer 194 is disposed on the second patterned circuit layer 174 exposed by the second solder mask layer 184 .
  • the profile of the heat conducting slug 120 of the present embodiment from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug 120 , and to improve the structural reliability of the package carrier 100 . Furthermore, the profiles of the heat conducting slug 120 and the through hole 118 of the substrate 110 from top view are the same (the rounded rectangular), and therefore the heat conducting slug 120 does not generate structural interference when positioning inside the through hole 118 of the substrate 110 , so that the heat conducting slug can be accurately positioned inside the through hole, so as to improve the structural reliability of the package carrier 100 . Otherwise, in the subsequent application, referring to FIG.
  • a heat generating element 200 can be disposed on the package carrier 100 and correspondingly configured above the heat conducting slug 120 , and the heat generating element 200 is electrically connected to the package carrier 100 by using a joining or a wire bonding method, such as bonding a plurality of wires 210 .
  • the heat generated by the heat generating element 200 transfers rapidly and directly from the first surface treatment layer 192 , the first patterned circuit layer 172 , the heat conducting slug 120 , the second patterned circuit layer 174 , and the second surface treatment layer 194 to the external environment, so that the package carrier 100 in the present embodiment can have a better heat conducting effect.
  • the profile of the heat conducting slug of the invention from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug, and to improve the structural reliability of the package carrier.
  • the profiles of the heat conducting slug and the through hole of the substrate from top view are the same (the rounded rectangular), and therefore the structural interference that the heat conducting slug cannot be positioned inside the through hole is not generated when the heat conducting slug is positioned inside the through hole of the substrate, so that the heat conducting slug can be accurately positioned inside the through hole to improve the structural reliability and the product yield of the package carrier.

Abstract

A manufacturing method of a package carrier is provided. A substrate having a through hole is provided, wherein a profile of the through hole from top view is a first rounded rectangular. A heat conducting slug is disposed inside the through hole, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular. An insulating material is filled in the through hole so as to fix the heat conducting slug in the through hole. A conductive through hole structure, a first and a second patterned circuit layers are formed. The first and the second patterned circuit layers are respectively formed on two opposite sides of the substrate. The conductive through hole structure penetrates the substrate and connects portions of the first and the second patterned circuit layers.

Description

    CROSS-REFERENCE TO RELATED APPLICATION
  • This application claims the priority benefit of Taiwan application serial no. 104130925, filed on Sep. 18, 2015. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of this specification.
  • BACKGROUND OF THE INVENTION
  • Field of the Invention
  • The present invention relates to a package structure and a method for manufacturing the same, and particularly relates to a package carrier and a method for manufacturing the same.
  • Description of Related Art
  • In general, the heat conducting slug is embedded inside the package carrier in order to effectively enhance the heat conducting effect of the package carrier. Herein, the hole used to embed the heat conducting slug of the package carrier is manufactured by mechanical routing process or laser routing process, and therefore the profile of the hole from top view is easily formed as a rounded rectangular. The heat conducting slug is manufactured by etching process and laser cutting process, and therefore the profile of the heat conducting slug from top view is a right angle rectangular. Hence, stress is concentrated at the sharp corner of the heat conducting slug or the sharp corner of the heat conducting slug leans against the rounded corner of the hole so that the heat conducting slug cannot be positioned inside the hole. Furthermore, the production process of the heat conducting slug is also long because of etching process, and simultaneously the disadvantage that the cutting quality is inconsistent is generated because of laser cutting process. In addition, when the heat conducting slug is embedded inside the package carrier, in order to prevent the hole used to embed the heat conducting slug of the package carrier from interfering with the heat conducting slug, the gap between the hole and the heat conducting slug needs being greater than 200 micrometers, so as to affect the circuit layout of the package carrier. Therefore, how to narrow the gap between the hole and the heat conducting slug and to increase the density of the circuit layout is an urgent issue that needs being solved.
  • SUMMARY OF THE INVENTION
  • The invention provides a package carrier having a higher density circuit layout and a better structural reliability.
  • The invention also provides a manufacturing method of the package carrier, which is adapted to manufacture the above-mentioned package carrier.
  • The invention provides the manufacturing method of the package carrier, which includes following steps. A substrate having a through hole is provided, wherein a profile of the through hole from top view is a first rounded rectangular. A heat conducting slug is disposed inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular. The through hole of the substrate is filled with an insulating material so as to fix the heat conducting slug in the through hole via the insulating material. A conductive through hole structure, a first patterned circuit layer and a second patterned circuit layer are for' red. The first patterned circuit layer and the second patterned circuit layer are respectively formed on two opposite sides of the substrate and expose a portion of the substrate. The conductive through hole structure penetrates the substrate and connects a portion of the first patterned circuit layer and a portion of the second patterned circuit layer.
  • In one embodiment of the invention, a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
  • In one embodiment of the invention, the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of a rounded corner of the second rounded rectangular is from 50 micrometers to 500 micrometers.
  • In one embodiment of the invention, the radius of the curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
  • In one embodiment of the invention, the manufacturing method of the package carrier further comprises: a grinding process is performed to remove a portion of the substrate, a portion of the insulating material, and a portion of the heat conducting slug after filling the through hole of the substrate with the insulating material and before forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer, so that a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
  • In one embodiment of the invention, the steps forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer comprise: a first metal layer and a second metal layer are formed, wherein the first metal layer covers the upper surface of the substrate, the first surface of the insulating material, and the top surface of the heat conducting slug, and the second metal layer covers the lower surface of the substrate, the second surface of the insulating material, and the bottom surface of the heat conducting slug. A passing hole is formed, which penetrates through the first metal layer, the substrate, and the second metal layer. Forming a seed layer on the first metal layer, an inner wall of the passing hole, and the second metal layer. The passing hole is filled with a filling material to form the conductive through hole structure, wherein the seed layer is located between the filling material and the inner wall of the passing hole, and a third surface and a fourth surface opposite to each other of the filling material are substantially coplanar with a fifth surface and a sixth surface opposite to each other of the seed layer respectively. A third metal layer and a fourth metal layer are formed, wherein the third metal layer covers the fifth surface of the seed layer and the third surface of the filling material, and the fourth metal layer covers the sixth surface of the seed layer and the fourth surface of the filling material. A patterning process is performed to pattern the third metal layer, the seed layer, and the first metal layer so as to form the first patterned circuit layer, and to pattern the fourth metal layer, the seed layer, and the second metal layer so as to form the second patterned circuit layer.
  • In one embodiment of the invention, the manufacturing method of the package carrier further comprises: a first solder mask layer and a second solder mask layer are formed after forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer. The first solder mask layer is disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer, and the second solder mask layer is disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer. A first surface treatment layer and a second surface treatment layer are formed. The first surface treatment layer is disposed on the first patterned circuit layer exposed by the first solder mask layer, and the second surface treatment layer is disposed on the second patterned circuit layer exposed by the second solder mask layer.
  • The package carrier of the invention includes a substrate, a heat conducting slug, an insulating material, a first patterned circuit layer, a second patterned circuit layer, and a conductive through hole structure. The substrate has a through hole, wherein a profile of the through hole from top view is a first rounded rectangular. The heat conducting slug is disposed inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular. The insulating material is disposed inside the through hole of the substrate so as to fix the heat conducting slug in the through hole via the insulating material. The first patterned circuit layer is disposed on one side of the substrate. The second patterned circuit layer is disposed on another side of the substrate. The conductive through hole structure penetrates the substrate and connects a portion of the first patterned circuit layer and a portion of the second patterned circuit layer.
  • In one embodiment of the invention, a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
  • In one embodiment of the invention, the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of a rounded corner of the second rounded rectangular is from 50 micrometers to 500 micrometers.
  • In one embodiment of the invention, the radius of the curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
  • In one embodiment of the invention, a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
  • In an embodiment of the invention, the package carrier further includes a first solder mask layer and a second solder mask layer. The first solder mask layer is disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer. The second solder mask layer is disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer.
  • In an embodiment of the invention, the package carrier further includes a first surface treatment layer and a second surface treatment layer. The first surface treatment layer is disposed on the first patterned circuit layer exposed by the first solder mask layer. The second surface treatment layer is disposed on the second patterned circuit layer exposed by the second solder mask layer.
  • Based on the above, the profile of the heat conducting slug of the invention from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug, and to improve the structural reliability of the package carrier. In addition, the profiles of the heat conducting slug and the through hole of the substrate from top view are the same (the rounded rectangular), and therefore the heat conducting slug does not generate structural interference when positioning inside the through hole of the substrate, so that the heat conducting slug can be accurately positioned inside the through hole to improve the structural reliability of the package carrier.
  • In order to make the aforementioned and other features and advantages of the invention more comprehensible, embodiments accompanying figures are described in detail belows.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The accompanying drawings are included to provide further understanding, and are incorporated in and constitute a part of this specification. The drawings illustrate exemplary embodiments and, together with the description, serve to explain the principles of the invention.
  • FIG. 1A to FIG. 1M are cross-sectional schematic views depicting a manufacturing method of a package carrier of one embodiment of the invention.
  • FIG. 2 is a partial schematic top view depicting a heat conducting element disposed inside a through hole of a substrate corresponding to FIG. 1D.
  • FIG. 3 is a partial schematic top view depicting an insulating material disposed inside a through hole of a substrate corresponding to FIG. 1E.
  • FIG. 4 is a cross-sectional schematic view depicting the package carrier carrying a heat generating element corresponding to FIG. 1M.
  • DESCRIPTION OF THE EMBODIMENTS
  • FIG. 1A to FIG. 1M are cross-sectional schematic views depicting a manufacturing method of a package carrier of one embodiment of the invention. FIG. 2 is a partial schematic top view depicting a heat conducting element disposed inside a through hole of a substrate corresponding to FIG. 1D. FIG. 3 is a partial schematic top view depicting an insulating material disposed inside a through hole of a substrate corresponding to FIG. 1E. According to the manufacturing method of the package carrier, firstly, referring to FIG. 1A, providing a substrate 110′. The substrate 110′ of the present embodiment can be, for example, a single layer circuit board, a double layer circuit board, or a multi-layer circuit board. Herein, as shown in FIG. 1A, the substrate 110′ is a double layer circuit board which is constructed by a dielectric layer 112 and circuit layers 114′, 116′ located at two opposite sides of the dielectric layer 112, but the invention is not limited thereto.
  • Subsequently, referring to the FIG. 1B and FIG. 2 simultaneously, forming a through hole 118 which penetrates through the dielectric layer 112 and the circuit layers 114′, 116′ of the substrate 110′, wherein a profile of the through hole 118 from top view is a first rounded rectangular 118 a. Herein, the method for forming the through hole 118 is, for example, punching, routing, mechanical drilling, laser drilling, or other appropriate methods, which are not limited by the invention. The radius of the curvature of the first rounded rectangular 118 a is, for example, greater than or equal to 1 times of the gap L, or the radius of the curvature can be, for example, from 1.5 times to 15 times of the gap L, but the invention is not limited thereto. Preferably, the radius of the curvature of the first rounded rectangular 118 a is from 100 micrometers to 500 micrometers. The gap L is, for example, from 50 micrometers to 500 micrometers. The above-mentioned scope is used for description and the invention is not limited thereto.
  • Subsequently, referring to FIG. 1C, an adhesive layer AD is disposed on one side of the substrate 110′, wherein the adhesive layer AD and the through hole 118 of the substrate 110′ define an accommodating space S. It should be noted here, the adhesive layer AD is only adhered to one side of the substrate 110′ temporarily to serve as a supporting element for a subsequent heat conducting element 120′.
  • Subsequently, referring to FIG. 1D and FIG. 2, disposing a heat conducting slug 120′ inside the through hole 118 of the substrate 110′ and in the accommodating space S, wherein a gap L is in between the heat conducting slug 120′ and the inner wall of the through hole 118, and a profile of the heat conducting slug 120′ from top view is a second rounded rectangular 120 a. The heat conducting slug 120′ of the present embodiment is formed by a punch-pressing process, and therefore the peripheral corners of the heat conducting slug 120′ are all rounded corners, so as to prevent the conventional problem that stress concentration is generated at the right angle corners of the heat conducting slug. After that, the heat conducting slug 120′ in the present embodiment is formed by the punch-pressing process, therefore, the production is at a fast rate and the process stability is high, so as to prevent the product quality from being varied, and to improve the product yield. Preferably, the radius of the curvature of the rounded corner of the second rounded rectangular 120 a is from 50 micrometers to 500 micrometers, herein, the material of the heat conducting slug 120′ is, for example, metal such as copper, copper alloys, aluminum, aluminum alloys, titanium, titanium alloys, etc., but it is not limited thereto.
  • Subsequently, filling the through hole 118 of the substrate 110′ with an insulating material (not shown) so as to fix the heat conducting slug 120′ in the through hole 118 of the substrate 110′ via the insulating material. At this time, the heights of the thickness of the insulating material and the thickness of the heat conducting slug 120′ are all higher than the surface of the circuit layer 114′, and the accommodating space S is filled up with the insulating material and the heat conducting slug 120′. Herein, the method for filling the through hole 118 of the substrate 110′ with the insulating material is, for example, vacuum screen printing, but not be limited thereto.
  • In addition, the material of the insulating material is, for example, resin or glue, but not be limited thereto. Subsequently, removing the adhesive layer AD (referring to FIG. 1D), so as to expose the heat conducting slug 120′ and the circuit layer 116′. Herein, the method for removing the adhesive layer AD is a mechanical stripping method.
  • Subsequently, Referring to the FIG. 1E, FIG. 1F, and FIG. 3 simultaneously, in order to have a better surface flatness, a grinding process is performed to remove a portion of the substrate 110′, a portion of the insulating material, and a portion of the heat conducting slug 120′, so as to form the insulating material 130, the heat conducting slug 120, and the substrate 110 having the circuit layers 114, 116, and the dielectric layer 112. At this time, a top surface 122 and a bottom surface 124 opposite to each other of the heat conducting slug 120 are substantially coplanar with a first surface 132 and a second surface 134 opposite to each other of the insulating material 130 respectively, and substantially coplanar with an upper surface 111 and a lower surface 113 opposite to each other of the substrate 110 respectively.
  • Subsequently, referring to FIG. 1F, forming a first metal layer 142 and a second metal layer 144, wherein the first metal layer 142 covers the upper surface 111 of the substrate 110, the first surface 132 of the insulating material 130, and the top surface 122 of the heat conducting slug 120, and the second metal layer 144 covers the lower surface 113 of the substrate 110, the second surface 134 of the insulating material 130, and the bottom surface 124 of the heat conducting slug 120. Herein, the material of the first metal layer 142 and the second metal layer 144 is, for example, copper, copper alloys, aluminum, aluminum alloys, titanium, titanium alloys, etc., but it is not limited thereto.
  • Subsequently, referring to FIG. 1G, forming a passing hole H, wherein the passing hole H penetrates through the first metal layer 142, the substrate 110, and the second metal layer 144. Herein, the method for forming the passing hole H is, for example, punching, routing, mechanical drilling, laser drilling, or other appropriate methods, which are not limited by the invention.
  • Subsequently, referring to FIG. 1H, forming a seed layer 150 on the first metal layer 142, an inner wall of the passing hole H, and the second metal layer 144. Herein, the material of the seed layer 150 is, for example, copper, or conductive materials such as conducting polymer, which are not limited by the invention.
  • Subsequently, referring to FIG. 1I, filling the passing hole H with a filling material 155 to form a conductive through hole structure T. At this time, the seed layer 150 is located between the filling material 155 and the inner wall of the through hole 118, and a third surface 157 and a fourth surface 159 opposite to each other of the filling material 155 are substantially coplanar with a fifth surface 152 and a sixth surface 154 opposite to each other of the seed layer 150 respectively. In addition, the conductive through hole structure T is constructed by the seed layer 150 and the filling material 155. Herein, the material of the filling material 155 is, for example, resin or glue.
  • Subsequently, referring to FIG. 1J, &liming a third metal layer 162 and a fourth metal layer 164, wherein the third metal layer 162 covers the fifth surface 152 of the seed layer 150 and the third surface 157 of the filling material 155, and the fourth metal layer 164 covers the sixth surface 154 of the seed layer 150 and the fourth surface 159 of the filling material 155. Herein, the material of the third metal layer 162 and the fourth metal layer 164 is, for example, copper, etc.
  • Subsequently, referring to FIG. 1K, performing a patterning process to pattern the third metal layer 162, the seed layer 150, the first metal layer 142 and a portion of the substrate 110 (the circuit layer 114) so as to form the first patterned circuit layer 172, and to pattern the fourth metal layer 164, the seed layer 150, the second metal layer 144, and a portion of the substrate 110 (the circuit layer 116) so as to form the second patterned circuit layer 174. At this time, as shown in FIG. 1K, the first patterned circuit layer 172 and the second patterned circuit layer 174 are respectively formed on two opposite sides of the substrate 110 and expose a portion of the substrate 110, and the conductive through hole structure T penetrates the substrate 110 and connects a portion of the first patterned circuit layer 172 and a portion of the second patterned circuit layer 174.
  • After that, referring to FIG. 1L, optionally forming a first solder mask layer 182 and a second solder mask layer 184, wherein the first solder mask layer 182 is disposed on the first patterned circuit layer 172 and exposes a portion of the first patterned circuit layer 172, and the second solder mask layer 184 is disposed on the second patterned circuit layer 174 and exposes a portion of the second patterned circuit layer 174.
  • After that, referring to FIG. 1M, in order to maintain the structural properties of the exposed first patterned circuit layer 172 and the exposed second patterned circuit layer 174, forming a first surface treatment layer 192 and a second surface treatment layer 194, wherein the first surface treatment layer 192 is disposed on the first patterned circuit layer 172 exposed by the first solder mask layer 182, and the second surface treatment layer 194 is disposed on the second patterned circuit layer 174 exposed by the second solder mask layer 184. The material of the first surface treatment layer 192 and the second surface treatment layer 194 in the present embodiment is, for example, nickel, palladium, gold, or alloys of the said materials, so as to prevent the first patterned circuit layer 172 and the second patterned circuit layer 174 from being oxidized or being subject to the external contamination. So far, the package carrier 100 is completely manufactured.
  • In above structure, referring to FIG. 1M, the package carrier 100 of the present embodiment includes the substrate 110, the heat conducting slug 120, the insulating material 130, the first patterned circuit layer 172, the second patterned circuit layer 174, and the conductive through hole structure T. The substrate 110 has a through hole 118, wherein a profile of the through hole 118 from top view is a first rounded rectangular 118 a (as shown in FIG. 2), preferably, the radius of the curvature of the rounded corner of the first rounded rectangular 118 a is from 100 micrometers to 500 micrometers. The heat conducting slug 120 is disposed inside the through hole 118 of the substrate 110, wherein the heat conducting slug 120 and the inner wall of the through hole 118 are separated with a gap L (referring to FIG. 2), and the profile of the heat conducting slug 120 from top view is a second rounded rectangular 120 a. In one embodiment of the invention, the radius of the curvature of the first rounded rectangular 118 is greater than or equal to 1 times of the gap L. Preferably, the heat conducting slug 120 is formed by a punch-pressing process, and the radius of the curvature of the second rounded rectangular 120 a is from 50 micrometers to 500 micrometers. The insulating material 130 is disposed inside the through hole 118 of the substrate 110 so as to fix the heat conducting slug 120 in the through hole 118 via the insulating material 130. At this time, the top surface 122 and the bottom surface 124 opposite to each other of the heat conducting slug 120 are substantially coplanar with the first surface 132 and the second surface 134 opposite to each other of the insulating material 130 respectively, and substantially coplanar with the upper surface 111 and the lower surface 113 opposite to each other of the substrate 110 respectively. The first patterned circuit layer 172 is disposed on one side of the substrate 110, and the second patterned circuit layer 174 is disposed on another side of the substrate 110. The conductive through hole structure T penetrates the substrate 110 and connects a portion of the first patterned circuit layer 172 and a portion of the second patterned circuit layer 174.
  • In addition, the package carrier 100 in the present embodiment can optionally include the first solder mask layer 182, the second solder mask layer 184, the first surface treatment layer 192, and the second surface treatment layer 194. The first solder mask layer 182 is disposed on the first patterned circuit layer 172 and exposes a portion of the first patterned circuit layer 172, and the second solder mask layer 184 is disposed on the second patterned circuit layer 174 and exposes a portion of the second patterned circuit layer 174. The first surface treatment layer 192 is disposed on the first patterned circuit layer 172 exposed by the first solder mask layer 182, and the second surface treatment layer 194 is disposed on the second patterned circuit layer 174 exposed by the second solder mask layer 184.
  • The profile of the heat conducting slug 120 of the present embodiment from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug 120, and to improve the structural reliability of the package carrier 100. Furthermore, the profiles of the heat conducting slug 120 and the through hole 118 of the substrate 110 from top view are the same (the rounded rectangular), and therefore the heat conducting slug 120 does not generate structural interference when positioning inside the through hole 118 of the substrate 110, so that the heat conducting slug can be accurately positioned inside the through hole, so as to improve the structural reliability of the package carrier 100. Otherwise, in the subsequent application, referring to FIG. 4, a heat generating element 200 can be disposed on the package carrier 100 and correspondingly configured above the heat conducting slug 120, and the heat generating element 200 is electrically connected to the package carrier 100 by using a joining or a wire bonding method, such as bonding a plurality of wires 210. As a result, the heat generated by the heat generating element 200 transfers rapidly and directly from the first surface treatment layer 192, the first patterned circuit layer 172, the heat conducting slug 120, the second patterned circuit layer 174, and the second surface treatment layer 194 to the external environment, so that the package carrier 100 in the present embodiment can have a better heat conducting effect.
  • In summary, the profile of the heat conducting slug of the invention from top view is the rounded rectangular, so as to prevent the problem that stress concentration is generated at the corners of the heat conducting slug, and to improve the structural reliability of the package carrier. In addition, the profiles of the heat conducting slug and the through hole of the substrate from top view are the same (the rounded rectangular), and therefore the structural interference that the heat conducting slug cannot be positioned inside the through hole is not generated when the heat conducting slug is positioned inside the through hole of the substrate, so that the heat conducting slug can be accurately positioned inside the through hole to improve the structural reliability and the product yield of the package carrier.
  • Although the present invention has been described with reference to the above embodiments, it will be apparent to one of the ordinary skill in the art that modifications to the described embodiments may be made without departing from the spirit of the invention. Accordingly, the scope of the invention is defined by the attached claims not by the above detailed descriptions.

Claims (14)

What is claimed is:
1. A manufacturing method of a package carrier, comprising:
providing a substrate having a through hole, wherein a profile of the through hole from top view is a first rounded rectangular;
disposing a heat conducting slug inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular;
filling the through hole of the substrate with an insulating material so as to fix the heat conducting slug in the through hole via the insulating material; and
forming a conductive through hole structure, a first patterned circuit layer and a second patterned circuit layer, wherein the first patterned circuit layer and the second patterned circuit layer are respectively formed on two opposite sides of the substrate and expose a portion of the substrate, the conductive through hole structure penetrates the substrate and connects a portion of the first patterned circuit layer and a portion of the second patterned circuit layer.
2. The manufacturing method of the package carrier as recited in claim 1, wherein a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
3. The manufacturing method of the package carrier as recited in claim 1, wherein the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of the second rounded rectangular is from 50 micrometers to 500 micrometers.
4. The manufacturing method of the package carrier as recited in claim 1,
wherein a radius of a curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
5. The manufacturing method of the package carrier as recited in claim 1, further comprising:
performing a grinding process to remove a portion of the substrate, a portion of the insulating material, and a portion of the heat conducting slug after filling the through hole of the substrate with the insulating material and before forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer, so that a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
6. The manufacturing method of the package carrier as recited in claim 5, wherein steps forming the conductive through hole structure, the first patterned circuit layer and the second patterned circuit layer comprise:
forming a first metal layer and a second metal layer, wherein the first metal layer covers the upper surface of the substrate, the first surface of the insulating material, and the top surface of the heat conducting slug, and the second metal layer covers the lower surface of the substrate, the second surface of the insulating material, and the bottom surface of the heat conducting slug;
forming a passing hole, penetrating through the first metal layer, the substrate, and the second metal layer;
forming a seed layer on the first metal layer, an inner wall of the passing hole, and the second metal layer;
filling the passing hole with a filling material to form the conductive through hole structure, wherein the seed layer is located between the filling material and the inner wall of the passing hole, and a third surface and a fourth surface opposite to each other of the filling material are substantially coplanar with a fifth surface and a sixth surface opposite to each other of the seed layer respectively;
forming a third metal layer and a fourth metal layer, wherein the third metal layer covers the fifth surface of the seed layer and the third surface of the filling material, and the fourth metal layer covers the sixth surface of the seed layer and the fourth surface of the filling material; and
performing a patterning process to pattern the third metal layer, the seed layer, and the first metal layer so as to form the first patterned circuit layer, and to pattern the fourth metal layer, the seed layer, and the second metal layer so as to form the second patterned circuit layer.
7. The manufacturing method of the package carrier as recited in claim 1, further comprising:
forming a first solder mask layer and a second solder mask layer after forming the conductive through hole structure, the first patterned circuit layer, and the second patterned circuit layer, wherein the first solder mask layer is disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer, and the second solder mask layer is disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer; and
forming a first surface treatment layer and a second surface treatment layer, wherein the first surface treatment layer is disposed on the first patterned circuit layer exposed by the first solder mask layer, and the second surface treatment layer is disposed on the second patterned circuit layer exposed by the second solder mask layer.
8. A package carrier, comprising:
a substrate, having a through hole, wherein a profile of the through hole from top view is a first rounded rectangular;
a heat conducting slug, disposed inside the through hole of the substrate, wherein the heat conducting slug and an inner wall of the through hole are separated with a gap, and a profile of the heat conducting slug from top view is a second rounded rectangular;
an insulating material, disposed inside the through hole of the substrate so as to fix the heat conducting slug in the through hole via the insulating material;
a first patterned circuit layer, disposed on one side of the substrate;
a second patterned circuit layer, disposed on another side of the substrate; and
a conductive through hole structure, penetrating the substrate and connecting a portion of the first patterned circuit layer and a portion of the second patterned circuit layer.
9. The package carrier as recited in claim 8, wherein a radius of a curvature of the first rounded rectangular is greater than or equal to 1 times of the gap.
10. The package carrier as recited in claim 8, wherein the heat conducting slug is formed by a punch-pressing process, and a radius of a curvature of the second rounded rectangular is from 50 micrometers to 500 micrometers.
11. The package carrier as recited in claim 8, wherein a radius of a curvature of the first rounded rectangular is from 100 micrometers to 500 micrometers.
12. The package carrier as recited in claim 8, wherein a top surface and a bottom surface opposite to each other of the heat conducting slug are substantially coplanar with a first surface and a second surface opposite to each other of the insulating material respectively, and substantially coplanar with an upper surface and a lower surface opposite to each other of the substrate respectively.
13. The package carrier as recited in claim 8, further comprising:
a first solder mask layer, disposed on the first patterned circuit layer and exposes a portion of the first patterned circuit layer; and
a second solder mask layer, disposed on the second patterned circuit layer and exposes a portion of the second patterned circuit layer.
14. The package carrier as recited in claim 13, further comprising:
a first surface treatment layer, disposed on the first patterned circuit layer exposed by the first solder mask layer; and
a second surface treatment layer, disposed on the second patterned circuit layer exposed by the second solder mask layer.
US14/932,974 2015-09-18 2015-11-05 Package carrier and manufacturing method thereof Abandoned US20170086293A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/723,206 US10297517B2 (en) 2015-09-18 2017-10-03 Manufacturing method of package carrier

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW104130925A TWI578416B (en) 2015-09-18 2015-09-18 Package carrier and manufacturing method thereof
TW104130925 2015-09-18

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US15/723,206 Division US10297517B2 (en) 2015-09-18 2017-10-03 Manufacturing method of package carrier

Publications (1)

Publication Number Publication Date
US20170086293A1 true US20170086293A1 (en) 2017-03-23

Family

ID=58283918

Family Applications (2)

Application Number Title Priority Date Filing Date
US14/932,974 Abandoned US20170086293A1 (en) 2015-09-18 2015-11-05 Package carrier and manufacturing method thereof
US15/723,206 Active 2035-11-13 US10297517B2 (en) 2015-09-18 2017-10-03 Manufacturing method of package carrier

Family Applications After (1)

Application Number Title Priority Date Filing Date
US15/723,206 Active 2035-11-13 US10297517B2 (en) 2015-09-18 2017-10-03 Manufacturing method of package carrier

Country Status (3)

Country Link
US (2) US20170086293A1 (en)
JP (1) JP6255427B2 (en)
TW (1) TWI578416B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112040631A (en) * 2020-08-05 2020-12-04 景旺电子科技(珠海)有限公司 Copper block embedding method and tool for circuit board
EP3840547A1 (en) * 2019-12-20 2021-06-23 AT & S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with embedded magnetic inlay and integrated coil structure
US11114359B2 (en) * 2018-09-13 2021-09-07 Dialog Semiconductor (Uk) Limited Wafer level chip scale package structure
CN114725014A (en) * 2022-04-12 2022-07-08 业成科技(成都)有限公司 Conductive structure and manufacturing method thereof
CN115884526A (en) * 2022-09-06 2023-03-31 珠海越亚半导体股份有限公司 Manufacturing method of high-heat-dissipation hybrid substrate and semiconductor structure

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10854550B2 (en) * 2017-09-28 2020-12-01 Advanced Semiconductor Engineering, Inc. Semiconductor package and method of manufacturing the same
TWI692846B (en) 2019-03-21 2020-05-01 旭德科技股份有限公司 Heat dissipation substrate and fabricating method thereof
JP7249907B2 (en) * 2019-08-08 2023-03-31 新光電気工業株式会社 Wiring board manufacturing method and laminated structure
CN111642059A (en) * 2020-05-09 2020-09-08 昆山沪利微电有限公司 Heat dissipation PCB and manufacturing method thereof
CN111817000B (en) * 2020-07-07 2023-06-16 西安朗普达通信科技有限公司 Method for improving coupling performance of multi-antenna system by adopting radiating hole structure
CN114698255A (en) * 2020-12-25 2022-07-01 华中科技大学 Printed circuit board and preparation method
US11412618B2 (en) 2020-12-29 2022-08-09 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier and method of manufacturing the same
US11439018B2 (en) 2020-12-29 2022-09-06 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier and method of manufacturing the same
WO2023127202A1 (en) * 2021-12-27 2023-07-06 株式会社ダイワ工業 Method for manufacturing wiring board or wiring board material

Citations (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334395A (en) * 1962-11-26 1967-08-08 Northrop Corp Method of making a metal printed circuit board
US3385732A (en) * 1962-05-21 1968-05-28 First Safe Deposit Nat Bank Of Electric circuit structure
US3691632A (en) * 1969-06-13 1972-09-19 Microponent Dev Ltd Method of making multi layer circuit boards
US3895435A (en) * 1974-01-23 1975-07-22 Raytheon Co Method for electrically interconnecting multilevel stripline circuitry
US5500785A (en) * 1993-02-24 1996-03-19 Fuji Xerox Co., Ltd. Circuit board having improved thermal radiation
US5991155A (en) * 1996-12-13 1999-11-23 Mitsubishi Denki Kabushiki Kaisha Heat sink assembly including flexible heat spreader sheet
US6121553A (en) * 1997-03-03 2000-09-19 Hitachi Chemical Company, Ltd. Circuit boards using heat resistant resin for adhesive layers
US6242079B1 (en) * 1997-07-08 2001-06-05 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20040026781A1 (en) * 2001-09-28 2004-02-12 Toru Nakai Printed wiring board and production method for printed wiring board
US20040055782A1 (en) * 2002-09-24 2004-03-25 Alps Electric Co., Ltd. Surface-mounting type electronic circuit unit having no melting of solder attaching electric part thereto
US6889432B2 (en) * 2002-02-06 2005-05-10 Nitto Denko Corporation Method of manufacturing double-sided circuit board
US6938336B2 (en) * 2001-10-22 2005-09-06 Nec Toppan Circuit Solutions, Inc. Methods of manufacturing board having throughholes filled with resin and multi-layered printed wiring board using the board
US20060049913A1 (en) * 2004-09-01 2006-03-09 Samsung Electro-Mechanics Co., Ltd. Printed circuit board including embedded resistor and method of fabricating the same
US20060127652A1 (en) * 2004-12-10 2006-06-15 Yasuhiko Kanaya Multi-layered circuit board and manufacturing method of multi-layered circuit board
US7250576B2 (en) * 2005-05-19 2007-07-31 International Business Machines Corporation Chip package having chip extension and method
US7345246B2 (en) * 2005-02-09 2008-03-18 Ngk Spark Plug Co., Ltd. Wiring board and capacitor to be built into wiring board
US20090294165A1 (en) * 2008-05-30 2009-12-03 Delphi Technologies, Inc. Method of manufacturing a printed circuit board
US20100013068A1 (en) * 2008-07-17 2010-01-21 Unimicron Technology Corp. Chip package carrier and fabrication method thereof
US20100096163A1 (en) * 2008-10-21 2010-04-22 Shinko Electric Industries Co., Ltd. Wiring board and method of manufacturing the same
US20100212947A1 (en) * 2009-02-25 2010-08-26 Kyocera Corporation Circuit Board and Structure Using the Same
US20110061901A1 (en) * 2009-09-15 2011-03-17 Chang Hyun Lim Heat-dissipating substrate and fabricating method thereof
US20110114372A1 (en) * 2009-10-30 2011-05-19 Ibiden Co., Ltd. Printed wiring board
JP2012151253A (en) * 2011-01-18 2012-08-09 Ngk Spark Plug Co Ltd Wiring board with built-in component
US8545051B2 (en) * 2008-05-30 2013-10-01 Toshiba Lighting & Technology Corporation Lighting apparatus with heat conductive substrate
US20130269986A1 (en) * 2012-04-13 2013-10-17 Subtron Technology Co., Ltd. Package carrier and manufacturing method thereof
US20140144677A1 (en) * 2012-11-23 2014-05-29 Subtron Technology Co., Ltd. Package carrier
US8785791B2 (en) * 2009-07-06 2014-07-22 Fujikura Ltd. Through wiring substrate and manufacturing method thereof
US20150036305A1 (en) * 2013-08-05 2015-02-05 Fujikura Ltd. Electronic component built-in multi-layer wiring board and method of manufacturing the same
US20150107882A1 (en) * 2012-06-14 2015-04-23 Osram Gmbh Circuit board, electronic module and illuminating device having the circuit board, and method for manufacturing the circuit board
US9041166B2 (en) * 2011-05-04 2015-05-26 Subtron Technology Co., Ltd. Manufacturing method of circuit structure
US20150237734A1 (en) * 2012-09-26 2015-08-20 Meiko Electronics Co., Ltd. Manufacturing method for component incorporated substrate and component incorporated substrate manufactured using the method
US20150296613A1 (en) * 2012-11-28 2015-10-15 Kyocera Corporation Wiring board and mounting structure including the same
US20150327362A1 (en) * 2012-12-12 2015-11-12 Ngk Spark Plug Co., Ltd. Multilayer wiring substrate and production method therefor
US9236364B2 (en) * 2013-09-27 2016-01-12 Subtron Technology Co., Ltd. Package carrier and manufacturing method thereof
US20160183383A1 (en) * 2013-07-04 2016-06-23 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Method for Contacting and Rewiring an Electronic Component Embedded into a Printed Circuit Board
US9418931B2 (en) * 2014-12-02 2016-08-16 Subtron Technology Co., Ltd. Package structure and manufacturing method thereof
US20160366757A1 (en) * 2015-06-11 2016-12-15 Omron Automotive Electronics Co., Ltd. Printed circuit board and electronic device

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8601746D0 (en) * 1986-01-24 1986-02-26 British Telecomm Heat sink
JP3174393B2 (en) * 1992-04-24 2001-06-11 シチズン時計株式会社 Manufacturing method of electronic component mounting board
JPH05326736A (en) * 1992-05-19 1993-12-10 Fujitsu Ltd Semiconductor device
US5617294A (en) * 1995-09-29 1997-04-01 Intel Corporation Apparatus for removing heat from an integrated circuit package that is attached to a printed circuit board
JP4654133B2 (en) * 2005-02-09 2011-03-16 日本特殊陶業株式会社 Wiring board
TWI468098B (en) * 2009-04-16 2015-01-01 Asia Vital Components Co Ltd Improvement of heat radiating plate and its manufacturing method
JP2010263003A (en) * 2009-04-30 2010-11-18 Nippon Dourooingu:Kk Heat-conducting structure of printed board
TWM369542U (en) * 2009-07-03 2009-11-21 Ankuo Ind Inc Chip heat sink
TWI408837B (en) * 2011-02-08 2013-09-11 Subtron Technology Co Ltd Package carrier and manufacturing method thereof
TWI437930B (en) * 2011-05-03 2014-05-11 Subtron Technology Co Ltd Package carrier and manufacturing method thereof
JP5987314B2 (en) * 2011-12-27 2016-09-07 イビデン株式会社 Printed wiring board
JP5971333B2 (en) * 2012-04-02 2016-08-17 富士電機株式会社 Power converter
WO2014199456A1 (en) * 2013-06-12 2014-12-18 株式会社メイコー Manufacturing method for heat-dissipating substrate

Patent Citations (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3385732A (en) * 1962-05-21 1968-05-28 First Safe Deposit Nat Bank Of Electric circuit structure
US3334395A (en) * 1962-11-26 1967-08-08 Northrop Corp Method of making a metal printed circuit board
US3691632A (en) * 1969-06-13 1972-09-19 Microponent Dev Ltd Method of making multi layer circuit boards
US3895435A (en) * 1974-01-23 1975-07-22 Raytheon Co Method for electrically interconnecting multilevel stripline circuitry
US5500785A (en) * 1993-02-24 1996-03-19 Fuji Xerox Co., Ltd. Circuit board having improved thermal radiation
US5991155A (en) * 1996-12-13 1999-11-23 Mitsubishi Denki Kabushiki Kaisha Heat sink assembly including flexible heat spreader sheet
US6121553A (en) * 1997-03-03 2000-09-19 Hitachi Chemical Company, Ltd. Circuit boards using heat resistant resin for adhesive layers
US6242079B1 (en) * 1997-07-08 2001-06-05 Ibiden Co., Ltd. Printed wiring board and method for manufacturing the same
US20040026781A1 (en) * 2001-09-28 2004-02-12 Toru Nakai Printed wiring board and production method for printed wiring board
US6938336B2 (en) * 2001-10-22 2005-09-06 Nec Toppan Circuit Solutions, Inc. Methods of manufacturing board having throughholes filled with resin and multi-layered printed wiring board using the board
US6889432B2 (en) * 2002-02-06 2005-05-10 Nitto Denko Corporation Method of manufacturing double-sided circuit board
US20040055782A1 (en) * 2002-09-24 2004-03-25 Alps Electric Co., Ltd. Surface-mounting type electronic circuit unit having no melting of solder attaching electric part thereto
US20060049913A1 (en) * 2004-09-01 2006-03-09 Samsung Electro-Mechanics Co., Ltd. Printed circuit board including embedded resistor and method of fabricating the same
US20060127652A1 (en) * 2004-12-10 2006-06-15 Yasuhiko Kanaya Multi-layered circuit board and manufacturing method of multi-layered circuit board
US7973245B2 (en) * 2005-02-09 2011-07-05 Ngk Spark Plug Co., Ltd. Wiring board and capacitor to be built into wiring board
US7345246B2 (en) * 2005-02-09 2008-03-18 Ngk Spark Plug Co., Ltd. Wiring board and capacitor to be built into wiring board
US7250576B2 (en) * 2005-05-19 2007-07-31 International Business Machines Corporation Chip package having chip extension and method
US20090294165A1 (en) * 2008-05-30 2009-12-03 Delphi Technologies, Inc. Method of manufacturing a printed circuit board
US8545051B2 (en) * 2008-05-30 2013-10-01 Toshiba Lighting & Technology Corporation Lighting apparatus with heat conductive substrate
US20100013068A1 (en) * 2008-07-17 2010-01-21 Unimicron Technology Corp. Chip package carrier and fabrication method thereof
US20100096163A1 (en) * 2008-10-21 2010-04-22 Shinko Electric Industries Co., Ltd. Wiring board and method of manufacturing the same
US20100212947A1 (en) * 2009-02-25 2010-08-26 Kyocera Corporation Circuit Board and Structure Using the Same
US8785791B2 (en) * 2009-07-06 2014-07-22 Fujikura Ltd. Through wiring substrate and manufacturing method thereof
US20110061901A1 (en) * 2009-09-15 2011-03-17 Chang Hyun Lim Heat-dissipating substrate and fabricating method thereof
US20110114372A1 (en) * 2009-10-30 2011-05-19 Ibiden Co., Ltd. Printed wiring board
JP2012151253A (en) * 2011-01-18 2012-08-09 Ngk Spark Plug Co Ltd Wiring board with built-in component
US20130285204A1 (en) * 2011-01-18 2013-10-31 Ngk Spark Plug Co., Ltd. Component-built-in wiring board
US9041166B2 (en) * 2011-05-04 2015-05-26 Subtron Technology Co., Ltd. Manufacturing method of circuit structure
US20130269986A1 (en) * 2012-04-13 2013-10-17 Subtron Technology Co., Ltd. Package carrier and manufacturing method thereof
US20150107882A1 (en) * 2012-06-14 2015-04-23 Osram Gmbh Circuit board, electronic module and illuminating device having the circuit board, and method for manufacturing the circuit board
US20150237734A1 (en) * 2012-09-26 2015-08-20 Meiko Electronics Co., Ltd. Manufacturing method for component incorporated substrate and component incorporated substrate manufactured using the method
US20140144677A1 (en) * 2012-11-23 2014-05-29 Subtron Technology Co., Ltd. Package carrier
US20150296613A1 (en) * 2012-11-28 2015-10-15 Kyocera Corporation Wiring board and mounting structure including the same
US20150327362A1 (en) * 2012-12-12 2015-11-12 Ngk Spark Plug Co., Ltd. Multilayer wiring substrate and production method therefor
US20160183383A1 (en) * 2013-07-04 2016-06-23 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Method for Contacting and Rewiring an Electronic Component Embedded into a Printed Circuit Board
US20150036305A1 (en) * 2013-08-05 2015-02-05 Fujikura Ltd. Electronic component built-in multi-layer wiring board and method of manufacturing the same
US9236364B2 (en) * 2013-09-27 2016-01-12 Subtron Technology Co., Ltd. Package carrier and manufacturing method thereof
US9418931B2 (en) * 2014-12-02 2016-08-16 Subtron Technology Co., Ltd. Package structure and manufacturing method thereof
US20160366757A1 (en) * 2015-06-11 2016-12-15 Omron Automotive Electronics Co., Ltd. Printed circuit board and electronic device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11114359B2 (en) * 2018-09-13 2021-09-07 Dialog Semiconductor (Uk) Limited Wafer level chip scale package structure
EP3840547A1 (en) * 2019-12-20 2021-06-23 AT & S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with embedded magnetic inlay and integrated coil structure
US11792932B2 (en) 2019-12-20 2023-10-17 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component carrier with embedded magnetic inlay and integrated coil structure
CN112040631A (en) * 2020-08-05 2020-12-04 景旺电子科技(珠海)有限公司 Copper block embedding method and tool for circuit board
CN112040631B (en) * 2020-08-05 2021-04-27 景旺电子科技(珠海)有限公司 Copper block embedding method and tool for circuit board
CN114725014A (en) * 2022-04-12 2022-07-08 业成科技(成都)有限公司 Conductive structure and manufacturing method thereof
CN115884526A (en) * 2022-09-06 2023-03-31 珠海越亚半导体股份有限公司 Manufacturing method of high-heat-dissipation hybrid substrate and semiconductor structure

Also Published As

Publication number Publication date
US10297517B2 (en) 2019-05-21
TW201712766A (en) 2017-04-01
TWI578416B (en) 2017-04-11
JP2017059804A (en) 2017-03-23
US20180025956A1 (en) 2018-01-25
JP6255427B2 (en) 2017-12-27

Similar Documents

Publication Publication Date Title
US10297517B2 (en) Manufacturing method of package carrier
US9646852B2 (en) Manufacturing process for substrate structure having component-disposing area
US9418931B2 (en) Package structure and manufacturing method thereof
US9899235B2 (en) Fabrication method of packaging substrate
US9362248B2 (en) Coreless package structure and method for manufacturing same
JP2007095927A (en) Wiring board and its production method
US10123413B2 (en) Package substrate and manufacturing method thereof
US20180139840A1 (en) Fabrication method of substrate structure
JP2016127148A (en) Wiring board manufacturing method
US9458540B2 (en) Package substrate and manufacturing method thereof
US9629250B2 (en) Method of manufacturing glass component, glass component, and glass interposer
US9538647B2 (en) Substrate structure and manufacturing method thereof
JP6258810B2 (en) Wiring board manufacturing method
US11037869B2 (en) Package structure and preparation method thereof
TWI572258B (en) Manufacturing method of embedded component package structure
US20160081186A1 (en) Substrate structure and method of fabricating the same
US9775249B2 (en) Flexible circuit board combined with carrier board and manufacturing method thereof
TWI554175B (en) Manufacturing method of copper clad laminate
JP2004356661A (en) Wiring circuit board
JP2009224570A (en) Tab tape and method for producing the same

Legal Events

Date Code Title Description
AS Assignment

Owner name: SUBTRON TECHNOLOGY CO., LTD., TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:CHENG, CHIH-HSIEN;REEL/FRAME:036997/0238

Effective date: 20151028

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION