US20090028286A1 - Measurement apparatus and a method of using measurement apparatus - Google Patents

Measurement apparatus and a method of using measurement apparatus Download PDF

Info

Publication number
US20090028286A1
US20090028286A1 US12/219,513 US21951308A US2009028286A1 US 20090028286 A1 US20090028286 A1 US 20090028286A1 US 21951308 A US21951308 A US 21951308A US 2009028286 A1 US2009028286 A1 US 2009028286A1
Authority
US
United States
Prior art keywords
measurement probe
usage
measurement
probe system
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US12/219,513
Inventor
Tim Prestidge
Jonathan P. Fuge
Stephen E. Lummes
Stuart K. Campbell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Priority to US12/219,513 priority Critical patent/US20090028286A1/en
Assigned to RENISHAW PLC reassignment RENISHAW PLC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: FUGE, JONATHAN PAUL, LUMMES, STEPHEN EDWARD, CAMPBELL, STUART KERSTEN, PRESTIDGE, TIM
Publication of US20090028286A1 publication Critical patent/US20090028286A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012Contact-making feeler heads therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/58Wireless transmission of information between a sensor or probe and a control or evaluation unit

Definitions

  • the present invention relates to measurement apparatus and to methods of using such measurement apparatus.
  • the invention relates to measurement probes and methods of use thereof.
  • co-ordinate positioning apparatus In the field of industrial metrology, it is known to use co-ordinate positioning apparatus to accurately measure or inspect the dimensions of an object such as a workpiece. To perform such a measurement function, co-ordinate positioning apparatus moves a measurement probe around within the working space of the machine so that the positions of various points on the surface of the object to be measured can be determined.
  • Co-ordinate positioning apparatus includes dedicated co-ordinate measuring machines (CMMs) that perform only a workpiece inspection function.
  • CCMs co-ordinate measuring machines
  • Numerically controlled machine tools e.g. metal cutting machines, lathes, machining centres etc
  • a measurement probe may be loaded into the spindle of a machine tool and used to inspect a workpiece that has been, or is about to be, machined by that machine tool.
  • Providing a measurement probe system for use with such a machine tool thus offers users the opportunity to automate workpiece set-up and/or perform in-process measurements.
  • a wide variety of measurement probes are known, including both contact and non-contact devices.
  • Touch trigger probes are one example of a measurement probe.
  • a touch trigger probe such as the device described in U.S. Pat. No. 4,153,998, typically comprises a kinematic mechanism in which a stylus holder becomes unseated from an associated seat in the probe body when the stylus contacts an object. Unseating of the kinematic mechanism also breaks an electrical circuit allowing a “contact” or trigger signal to be generated.
  • the cost of fitting a measurement probe system is small compared to the overall cost of the machine tool.
  • the financial benefits of increased machine productivity that are gained by including such a measurement probe system are proportionally high. This is, however, not always the case for lower end machine tool systems.
  • the cost of a measurement probe option can be a substantial percentage of the cost of the machine tool. The high relative cost, possibly combined with a machine tool user that has no awareness of the process improvements that typically occur when machine tools are fitted with measurement probe systems, has thus lead to lower take-up of metrology options at the lower end of the machine tool market.
  • a method of measurement using a measurement probe system comprising the steps of; (i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe system being suitable for use with co-ordinate positioning apparatus; and (ii) monitoring usage of the measurement probe system.
  • the present invention has arisen from the recognition that the relatively high upfront cost of providing measurement probe systems, such as measurement probes and associated probe interfaces, is often a substantial disincentive to potential users who are unaware of the benefits of incorporating such apparatus into their production processes. Although it is known to provide hire purchase or loan arrangements that allow the purchase cost to be spread over a longer period, such arrangements do not reduce the total financial commitment that is associated with such purchases but merely reduces the upfront cost.
  • the method according to the first aspect of the invention thus permits a manufacturer to sell a measurement probe system at a lower cost than traditionally possible and to recoup the reduction in upfront income by charging those users that make ongoing use of the measurement system. This recouping of income is achieved through the step of monitoring usage of the measurement probe system.
  • the invention thus extends the market for measurement systems to lower end machine tool users, without the need to reduce the metrology performance of such systems. Furthermore, end users also benefit as they are able to assess the productivity improvements that can be obtained with measurement probe based systems without having to risk substantial sums of upfront capital.
  • the method also comprises the step of prohibiting further usage of the measurement probe system based on the monitored usage of step (ii).
  • the method also comprises the step of prohibiting usage of the measurement probe system when the monitored usage exceeds a first predetermined usage threshold.
  • the usage threshold may be set at an appropriate level that provides enough usage to set-up, test and/or evaluate the measurement probe system. Alternatively, enough usage may be provide to allow measurement operations to be performed for a longer period. The amount of usage provided may vary depending on the upfront fee paid by the user.
  • the method also comprises the step of allowing, on payment of a refresh fee, further usage of the measurement probe system after the first predetermined usage threshold has been exceeded.
  • the method comprises the further step of prohibiting usage of the measurement probe system when the monitored usage exceeds a second predetermined usage threshold.
  • a refresh fee may be paid to allow use of the measurement probe system to be resumed. Resumption may be subject to a second predetermined usage threshold not being exceeded or may be indefinite.
  • the amount of the refresh fee may be related to the amount of further usage that will be provided. For example, a lower refresh fee could be charged for a small amount of additional usage, whilst a much higher fee could be charged to provide continuing, indefinite, usage of the system.
  • the prohibition on further usage of the measurement probe system may be implemented in various ways. For example, a contractual or other suitable obligation may be placed on the user not to exceed the agreed limit.
  • the step of prohibiting further usage of the measurement probe system comprises the step of preventing the collection and/or output of measurement data from the measurement probe system. For example, the measurement probe system may become inoperable to the user after the usage limit has been reached.
  • the method may thus conveniently comprise the step of requiring the user to pay a usage charge based on the monitored usage of step (ii).
  • the charge may be directly proportional to the usage, or a banded scale of charges that vary with usage may be applied.
  • step (ii) comprises at least one of counting the number of measurements acquired by the measurement probe system and measuring the length of time that the measurement probe system is in use.
  • the length of time of use may also be measured in a variety of ways; for example, the amount of operational time or power-up time may be measured.
  • the measurement probe system comprises a probe usage counter (e.g. an electronic counter) for performing step (ii).
  • the measurement probe system may also include a visual indicator to communicate usage information to the user.
  • the co-ordinate positioning apparatus may perform the usage monitoring step (ii).
  • the method may be implemented using any type of contact or non-contact measurement probe.
  • the measurement probe is a touch trigger probe.
  • the touch trigger probe may be arranged to produce a trigger signal when the stylus is deflected relative to the probe body.
  • step (ii) advantageously comprises counting the number of trigger signals produced by the measurement probe.
  • the number of trigger signals typically relates to the number of points measured using the measurement probe (ignoring any false triggers etc).
  • the measurement probe system may include a measurement probe that is linked to a control computer. This control computer may also control, or be interfaced to, the co-ordinate positioning apparatus.
  • a probe interface may also be provided as part of the measurement probe system for receiving data from the measurement probe and passing that data to a control computer.
  • the measurement probe may be hardwired to the probe interface.
  • the measurement probe and the probe interface are in communication via a wireless (e.g. RF or optical) communications link.
  • the measurement system may also comprise additional measurement probes.
  • the measurement system may comprise a spindle mountable measurement probe and a table top (tool setting) measurement probe. These may pass data to the control computer via a common probe interface or separate probe interfaces. The overall usage of such a measurement system may be monitored, or the usage of each measurement probe may be monitored separately.
  • the method of the present invention may also comprise the step of mounting the measurement probe system to any type of co-ordinate positioning apparatus.
  • a step of using the co-ordinate positioning apparatus to acquire measurements using the measurement probe system may also be implemented.
  • step (i) comprises fitting the measurement probe system to a machine tool.
  • a step may comprise loading the measurement probe into the machine tool spindle or placing the measurement probe in an automated tool changer mechanism so that it can be automatically loaded into the machine tool spindle as and when required.
  • the probe interface may also be physically attached to the machine tool in a suitable location and electrically interfaced to the appropriate control computer.
  • the method may also comprise the step of determining co-ordinate position data using the output of the measurement probe and the positional (X,Y,Z) information of the machine tool.
  • a method of measurement using a measurement probe system comprises the steps of; (i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe being suitable for use with co-ordinate positioning apparatus; and (ii) allowing the user to acquire measurements using the measurement probe system, wherein the acquisition of measurements using the measurement probe system is prohibited after a predetermined amount of measurement probe system usage.
  • the invention in the second aspect, thus comprises a method of providing a measurement probe system to a user and prohibiting use of that system after a certain amount of measurement probe usage.
  • the prohibition may arise from an agreement with the user to cap or restrict usage or, as described in more detail below, the measurement probe system may be arranged to prevent further usage once the system has been used for the predetermined amount of measurement probe system usage. This permits lower upfront cost measurement probe systems to be provided to users, with the manufacturer recouping the lost upfront income by requiring further user payments to extend the usage limit or to replace components of the system.
  • the acquisition of measurements using the measurement probe system is prohibited by building a failure mode into the measurement probe such that the acquisition of measurements is prevented after a predetermined amount of measurement probe system usage due to failure of the measurement probe.
  • the failure mode may be a mechanical failure mode; e.g. a weakened component that catastrophically fails after a certain amount of usage.
  • the failure may require all, or some, of the measurement probe system to be replaced.
  • the measurement probe is formed from a first part and a second part, the first part being releasably attachable to the second part to form the measurement probe, wherein the failure mode is built into the first part of the measurement probe.
  • the first, e.g. disposable, part may thus fail after a certain amount of use thereby preventing further usage of the measurement probe system.
  • a user may then purchase a replacement first part that, when combined with the second part, allows resumption of the measuring process.
  • the above described failure mode may also be provided by exhaustion of a power source, such as a battery.
  • a power source such as a battery.
  • the measurement probe may be supplied with batteries having a certain power storage capacity. The power stored in the batteries will be depleted by use of the measurement probe and, once depleted, the user may be prohibited from further use of the measurement probe.
  • the measurement probe may include a battery compartment cover over which a security (e.g. holographic) sticker, seal or tag is placed by the manufacturer. Once the batteries are expended (i.e. after a certain, predetermined, amount of measurement probe usage) a refresh fee becomes payable to permit battery replacement.
  • a security e.g. holographic
  • the acquisition of measurements using the measurement probe system is prevented by powering the measurement probe using a non-replaceable power source (e.g. a battery) such that the acquisition of measurements is prevented once the power source is exhausted.
  • a non-replaceable power source e.g. a battery
  • the measurement probe may be provided in first and second parts as described above, with the non-replaceable power source being included in the first part.
  • the method comprises the step of measuring usage of the measurement probe system.
  • the prohibition on acquiring further measurements using the measurement probe system can be based on a measured usage value.
  • the user is contractually inhibited (e.g. by a suitable agreement or contract) from acquiring measurements using the measurement probe system after reaching an agreed amount of measurement probe system usage.
  • measuring equipment can be broadly categorised into dimensional and non-dimensional apparatus.
  • Dimensional measurement apparatus allows a physical dimension of an object to be measured and may include, for example, measurement probes (such as touch trigger or scanning probes), optical position encoders etc.
  • Non-dimensional measurement apparatus is also known for measuring a property or characteristic of an object other than a dimension; examples of such apparatus may include Raman spectrometers and Fourier transform infrared spectrometers. The method may thus be applied to dimensional and/or non-dimensional apparatus as required.
  • the present invention offers the potential to increase the market for measurement probe systems without having to compromise on the accuracy or quality of such systems. From a user's perspective, the lower upfront cost provided by the method reduces the financial risk associated with the acquisition of measurement probe systems thereby making such systems a more attractive option.
  • FIG. 1 illustrates a measurement probe moved by a machine tool under computer control
  • FIG. 2 illustrates a measurement probe having an in-built trigger counter.
  • a measurement probe 500 is shown mounted to the spindle 502 of a machine tool.
  • the spindle 502 is moveable in three dimensions (X, Y, Z) under the control of a computer controller 504 .
  • the machine tool also comprises, in a known manner, various position encoders that accurately measure the position (in X,Y,Z) of the spindle 502 and pass such position information back to the controller 504 .
  • various alternative types of machine tool are also known.
  • the measurement probe 500 is a touch trigger probe in which the stylus holder is attached to the probe body by a spring-loaded kinematic arrangement of the type originally described in U.S. Pat. No. 4,153,998, the contents of which are hereby incorporated by reference.
  • a workpiece contacting stylus 506 is brought into contact with an object 510 to be measured. Deflection of the stylus 506 unseats the stylus holder from the probe body thereby breaking an electrical circuit.
  • a processor is provided as part of the measurement probe to analyse the resistance of the circuit and to generate a trigger signal whenever the stylus is deflected by contact with an object; this is described in more detail in WO03/021182, the contents of which are hereby incorporated by reference.
  • the measurement probe 500 communicates with a probe interface 508 over a RF wireless link.
  • the wireless link may use a spread spectrum (e.g. frequency hopping) protocol such as, or similar to, that described in more detail in WO2004/057552, the contents of which are hereby incorporated by reference.
  • Other types of wireless link for example an optical link, may alternatively be used.
  • the trigger signal is relayed from the probe 500 to the interface 508 via the wireless link and then passed to the controller 504 .
  • the position of the spindle 502 when the trigger signal is issued is then stored. This allows, assuming the apparatus has been suitably calibrated, the position of a point on the surface of the object 510 to be established. Measuring multiple points in this manner allows various properties or dimensions of the object to be determined.
  • the present inventors have devised a method for overcoming the requirement for a large, upfront, financial commitment. Importantly, this lower cost option does not require any reduction in the accuracy or reliability of the measurement system.
  • usage of the measurement probe system is recorded.
  • the computer control 504 is arranged to record the number of trigger signals that are received from the measurement system (i.e. from the measurement probe 500 via the interface 508 ). This is achieved by running an appropriate monitoring program on the computer control 504 that stores a count value and causes that count value to increment (or decrement) each time a trigger signal is received.
  • the computer control 504 may comprise a numerical controller (NC) interfaced to a separate personal computer or it may comprise a front end computer that provides numerical control of the machine tool and also has sufficient processing power to run additional applications.
  • NC numerical controller
  • the measurement apparatus of FIG. 1 keeps a running total of the number of trigger signals that have been issued by the measurement probe.
  • the user may, on purchasing the equipment, be prohibited from using the measurement system after a certain number of trigger signals have been issued.
  • purchase of the measurement system may be (e.g. contractually) conditional on it being used to provide no more than a certain number, say ten thousand, trigger signals. This may be considered a first usage threshold that limits the number of points that can be measured with the measurement system.
  • the first usage threshold may be increased before it is exceeded, for example by purchasing additional “triggers” from the manufacturer or their authorised agent etc. If the updated first usage threshold is reached or exceeded, further use of the measurement probe system is prohibited. After use has been prohibited, it may be possible to purchase additional “triggers” or counts that allow use of the measurement system to be resumed; for example, until a second usage threshold is reached or exceeded. Third and subsequent usage thresholds may subsequently be set in a similar manner. A complete removal of usage restrictions may also be permitted, for example on payment of a full release or upgrade fee, thereby converting the measurement system into a standard measurement system.
  • the computer 504 is used to monitor measurement probe usage.
  • different methods of monitoring usage may be implemented.
  • such monitoring is performed in an automated, e.g. electronic, manner but it would be possible for an operator to manually monitor usage (e.g. by counting or estimating how many times the probe is triggered).
  • the measurement probe system e.g. the measurement probe or the probe interface
  • a measurement probe 550 is illustrated that includes a trigger counter display 552 .
  • the measurement probe 550 is a touch trigger probe of the type describe above but also includes a suitable trigger counter.
  • the trigger counter (not shown) may be provided as a dedicated trigger counter unit or may be implemented by a processor that also performs other probe functions (e.g. deflection signal analysis or data communications).
  • the count measured by the trigger counter is, in this example, made available to the user via a trigger counter display 552 , such as a liquid crystal display or the like, that is provided on the body of the measurement probe.
  • the measurement probe 550 stores a trigger count of “1798” as it is moved towards an object 554 .
  • the stylus of the measurement probe 550 then contacts a point on the surface of the object thereby deflecting the stylus and generating a trigger signal that is passed to an associated interface over a wireless link.
  • Generation of a trigger signal in this manner also causes the trigger counter to increment to “1799” which is displayed to the user. Each time a measurement point is acquired, the count thus increases by one.
  • the measurement probe may include an LED that illuminates when a measurement usage threshold is approached and/or reached.
  • multiple LEDs may be provided that indicate the number of trigger counts that have been expended or are remaining. For example, consider a touch trigger probe having a usage limit of 10,000 counts. A green LED may be illuminated until 8,000 counts have been expended whereupon an amber LED is illuminated. The amber LED is extinguished and a red LED illuminated when the limit is reached. In this manner, some warning that the usage limit is being approached may be communicated to a user.
  • the trigger count information from the measurement probe may also, or alternatively, be displayed by the probe interface and/or passed to the control computer for display.
  • measuring trigger counts provides a convenient measure of measurement probe usage
  • other measures could also or alternatively be used.
  • the number of parts that have been measured by the measurement system could be counted (e.g. by the computer controller of the machine tool).
  • the number of parts that have been measured and have been found to be within acceptable measurement tolerances could be counted, thereby ignoring any measurements made on workpieces that have to be scrapped.
  • a time based usage system may also be implemented. For example, the amount of time that the measurement system is in use could be measured. This may be a measure of the duration of machine tool, measurement probe and/or probe interface activation.
  • the usage of the measurement probe may also be derived from the combination of two or more measures; for example, the usage may be defined by the number of triggers issued and the amount of time the measurement probe has been active.
  • the measurement system or the machine tool may include a mechanism (e.g. hardware or software based) that prevents the acquisition or use of further measurement data after the threshold is reached.
  • a mechanism e.g. hardware or software based
  • Such hardware/software prevention mechanisms may be used in conjunction with contractual requirements.
  • the measurement probe system monitor usage of the measurement probe system and periodically charge the user a usage based fee.
  • the fee is preferably set upfront and may include a graduate scale of costs in which each measurement becomes cheaper as more measurements are taken. Once a certain amount of usage has occurred and been paid for, further use of the measurement system may not incur any further cost.
  • a usage based charging system does not require a significant upfront financial commitment from a user and still allows the manufacturer to profit if the measurement system is found to be advantageous in the user's particular machining process. This solution therefore also makes measurement systems more attractive propositions, especially to users of lower end machine tools.
  • the above examples that are described with reference to FIGS. 1 and 2 relate to touch trigger probes. It should, however, be noted that the invention is equally applicable to other types of contact and/or non-contact (e.g. optical, capacitive etc) measurement probes.
  • the measurement probe may comprise an analogue or scanning probe in which data relating to stylus deflection is generated.
  • the above examples describe machine tool based systems.
  • the invention can also be applied to dedicated co-ordinate measurement machine (CMMs) or any other type of co-ordinate positioning apparatus.
  • CCMs dedicated co-ordinate measurement machine
  • Embodiments of apparatus comprising a deactivation portion for inhibiting the use of measurement apparatus are described with reference to FIGS. 1 to 11 in Applicant's co-pending European patent application 07252959 (agents' ref: 738EP).
  • Embodiments of modular measurement probe apparatus having a stylus module with an in-built failure mode are described with reference to FIGS. 1 to 3 in Applicant's co-pending European patent application 07253647 (agents' ref: 755EP).

Abstract

A method of measurement using a measurement probe system includes the steps of (i) providing a measurement probe system having a measurement probe to a user, the measurement probe system being suitable for use with co-ordinate positioning apparatus and (ii) monitoring usage of the measurement probe system.

Description

  • This nonprovisional application claims the benefit of U.S. Provisional Application No. 60/996,984, filed Dec. 13, 2007. This application also claims priority from European patent application 07252959.7 filed Jul. 26, 2007 and from European patent application 07252965.4 filed Jul. 26, 2007. The disclosure of each of the provisional application and of the two listed priority European applications is incorporated herein by reference in its entirety.
  • INTRODUCTION
  • The present invention relates to measurement apparatus and to methods of using such measurement apparatus. In particular, the invention relates to measurement probes and methods of use thereof.
  • BACKGROUND OF THE INVENTION
  • In the field of industrial metrology, it is known to use co-ordinate positioning apparatus to accurately measure or inspect the dimensions of an object such as a workpiece. To perform such a measurement function, co-ordinate positioning apparatus moves a measurement probe around within the working space of the machine so that the positions of various points on the surface of the object to be measured can be determined.
  • Co-ordinate positioning apparatus includes dedicated co-ordinate measuring machines (CMMs) that perform only a workpiece inspection function. Numerically controlled machine tools (e.g. metal cutting machines, lathes, machining centres etc) are also one type of co-ordinate positioning apparatus. For example, a measurement probe may be loaded into the spindle of a machine tool and used to inspect a workpiece that has been, or is about to be, machined by that machine tool. Providing a measurement probe system for use with such a machine tool thus offers users the opportunity to automate workpiece set-up and/or perform in-process measurements.
  • A wide variety of measurement probes are known, including both contact and non-contact devices. Touch trigger probes are one example of a measurement probe. A touch trigger probe, such as the device described in U.S. Pat. No. 4,153,998, typically comprises a kinematic mechanism in which a stylus holder becomes unseated from an associated seat in the probe body when the stylus contacts an object. Unseating of the kinematic mechanism also breaks an electrical circuit allowing a “contact” or trigger signal to be generated. As an alternative to such touch trigger probes, it is also known to measure stylus deflection using strain gauges or the like and to either provide a measure of stylus deflection or to issue a trigger signal when a certain amount of stylus deflection has occurred.
  • It is presently common practice for original equipment manufacturers (OEMs) to offer certain metrology options, such as various measurement probe systems, when selling machine tool equipment. There are also various companies that produce measurement probe systems that can simply be added to existing machine tool installations. However, a large amount of research and development activity is required to produce accurate and reliable measurement probe systems and a high level of precision is also required during manufacture to ensure the required measurement accuracy is reliably provided by each device. This leads to the cost of measurement probe systems being, by necessity, not insignificant.
  • For higher end machine tool apparatus, the cost of fitting a measurement probe system is small compared to the overall cost of the machine tool. In addition, the financial benefits of increased machine productivity that are gained by including such a measurement probe system are proportionally high. This is, however, not always the case for lower end machine tool systems. Typically, for such machine tools, the cost of a measurement probe option can be a substantial percentage of the cost of the machine tool. The high relative cost, possibly combined with a machine tool user that has no awareness of the process improvements that typically occur when machine tools are fitted with measurement probe systems, has thus lead to lower take-up of metrology options at the lower end of the machine tool market.
  • SUMMARY OF THE INVENTION
  • According to a first aspect of the invention, a method of measurement using a measurement probe system is provided, the method comprising the steps of; (i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe system being suitable for use with co-ordinate positioning apparatus; and (ii) monitoring usage of the measurement probe system.
  • The present invention has arisen from the recognition that the relatively high upfront cost of providing measurement probe systems, such as measurement probes and associated probe interfaces, is often a substantial disincentive to potential users who are unaware of the benefits of incorporating such apparatus into their production processes. Although it is known to provide hire purchase or loan arrangements that allow the purchase cost to be spread over a longer period, such arrangements do not reduce the total financial commitment that is associated with such purchases but merely reduces the upfront cost. The method according to the first aspect of the invention thus permits a manufacturer to sell a measurement probe system at a lower cost than traditionally possible and to recoup the reduction in upfront income by charging those users that make ongoing use of the measurement system. This recouping of income is achieved through the step of monitoring usage of the measurement probe system. The invention thus extends the market for measurement systems to lower end machine tool users, without the need to reduce the metrology performance of such systems. Furthermore, end users also benefit as they are able to assess the productivity improvements that can be obtained with measurement probe based systems without having to risk substantial sums of upfront capital.
  • Advantageously, the method also comprises the step of prohibiting further usage of the measurement probe system based on the monitored usage of step (ii). Preferably, the method also comprises the step of prohibiting usage of the measurement probe system when the monitored usage exceeds a first predetermined usage threshold. The usage threshold may be set at an appropriate level that provides enough usage to set-up, test and/or evaluate the measurement probe system. Alternatively, enough usage may be provide to allow measurement operations to be performed for a longer period. The amount of usage provided may vary depending on the upfront fee paid by the user.
  • Conveniently, the method also comprises the step of allowing, on payment of a refresh fee, further usage of the measurement probe system after the first predetermined usage threshold has been exceeded. Advantageously, after payment of the refresh fee, the method comprises the further step of prohibiting usage of the measurement probe system when the monitored usage exceeds a second predetermined usage threshold. In other words, a refresh fee may be paid to allow use of the measurement probe system to be resumed. Resumption may be subject to a second predetermined usage threshold not being exceeded or may be indefinite. The amount of the refresh fee may be related to the amount of further usage that will be provided. For example, a lower refresh fee could be charged for a small amount of additional usage, whilst a much higher fee could be charged to provide continuing, indefinite, usage of the system.
  • The prohibition on further usage of the measurement probe system may be implemented in various ways. For example, a contractual or other suitable obligation may be placed on the user not to exceed the agreed limit. Advantageously, the step of prohibiting further usage of the measurement probe system comprises the step of preventing the collection and/or output of measurement data from the measurement probe system. For example, the measurement probe system may become inoperable to the user after the usage limit has been reached.
  • Instead of pre-paying for certain blocks of measurement probe system usage, the amount of usage over a period of time could be measured and the user billed accordingly for such usage. The method may thus conveniently comprise the step of requiring the user to pay a usage charge based on the monitored usage of step (ii). The charge may be directly proportional to the usage, or a banded scale of charges that vary with usage may be applied.
  • A variety of measures of measurement probe system usage are possible. Advantageously, step (ii) comprises at least one of counting the number of measurements acquired by the measurement probe system and measuring the length of time that the measurement probe system is in use. The length of time of use may also be measured in a variety of ways; for example, the amount of operational time or power-up time may be measured.
  • Preferably, the measurement probe system comprises a probe usage counter (e.g. an electronic counter) for performing step (ii). The measurement probe system may also include a visual indicator to communicate usage information to the user. Alternatively, the co-ordinate positioning apparatus may perform the usage monitoring step (ii).
  • The method may be implemented using any type of contact or non-contact measurement probe. Conveniently, the measurement probe is a touch trigger probe. The touch trigger probe may be arranged to produce a trigger signal when the stylus is deflected relative to the probe body. When using such a touch trigger probe, step (ii) advantageously comprises counting the number of trigger signals produced by the measurement probe. In such an example, the number of trigger signals typically relates to the number of points measured using the measurement probe (ignoring any false triggers etc).
  • The measurement probe system may include a measurement probe that is linked to a control computer. This control computer may also control, or be interfaced to, the co-ordinate positioning apparatus. A probe interface may also be provided as part of the measurement probe system for receiving data from the measurement probe and passing that data to a control computer. The measurement probe may be hardwired to the probe interface. Preferably, the measurement probe and the probe interface are in communication via a wireless (e.g. RF or optical) communications link. The measurement system may also comprise additional measurement probes. For example, the measurement system may comprise a spindle mountable measurement probe and a table top (tool setting) measurement probe. These may pass data to the control computer via a common probe interface or separate probe interfaces. The overall usage of such a measurement system may be monitored, or the usage of each measurement probe may be monitored separately.
  • The method of the present invention may also comprise the step of mounting the measurement probe system to any type of co-ordinate positioning apparatus. A step of using the co-ordinate positioning apparatus to acquire measurements using the measurement probe system may also be implemented. Advantageously, step (i) comprises fitting the measurement probe system to a machine tool. For example, such a step may comprise loading the measurement probe into the machine tool spindle or placing the measurement probe in an automated tool changer mechanism so that it can be automatically loaded into the machine tool spindle as and when required. The probe interface may also be physically attached to the machine tool in a suitable location and electrically interfaced to the appropriate control computer. The method may also comprise the step of determining co-ordinate position data using the output of the measurement probe and the positional (X,Y,Z) information of the machine tool.
  • According to a second aspect of the invention, a method of measurement using a measurement probe system comprises the steps of; (i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe being suitable for use with co-ordinate positioning apparatus; and (ii) allowing the user to acquire measurements using the measurement probe system, wherein the acquisition of measurements using the measurement probe system is prohibited after a predetermined amount of measurement probe system usage.
  • The invention, in the second aspect, thus comprises a method of providing a measurement probe system to a user and prohibiting use of that system after a certain amount of measurement probe usage. The prohibition may arise from an agreement with the user to cap or restrict usage or, as described in more detail below, the measurement probe system may be arranged to prevent further usage once the system has been used for the predetermined amount of measurement probe system usage. This permits lower upfront cost measurement probe systems to be provided to users, with the manufacturer recouping the lost upfront income by requiring further user payments to extend the usage limit or to replace components of the system.
  • Advantageously, the acquisition of measurements using the measurement probe system is prohibited by building a failure mode into the measurement probe such that the acquisition of measurements is prevented after a predetermined amount of measurement probe system usage due to failure of the measurement probe. The failure mode may be a mechanical failure mode; e.g. a weakened component that catastrophically fails after a certain amount of usage. The failure may require all, or some, of the measurement probe system to be replaced. Advantageously, the measurement probe is formed from a first part and a second part, the first part being releasably attachable to the second part to form the measurement probe, wherein the failure mode is built into the first part of the measurement probe. The first, e.g. disposable, part may thus fail after a certain amount of use thereby preventing further usage of the measurement probe system. A user may then purchase a replacement first part that, when combined with the second part, allows resumption of the measuring process.
  • The above described failure mode may also be provided by exhaustion of a power source, such as a battery. For example, the measurement probe may be supplied with batteries having a certain power storage capacity. The power stored in the batteries will be depleted by use of the measurement probe and, once depleted, the user may be prohibited from further use of the measurement probe. For example, the measurement probe may include a battery compartment cover over which a security (e.g. holographic) sticker, seal or tag is placed by the manufacturer. Once the batteries are expended (i.e. after a certain, predetermined, amount of measurement probe usage) a refresh fee becomes payable to permit battery replacement.
  • Conveniently, the acquisition of measurements using the measurement probe system is prevented by powering the measurement probe using a non-replaceable power source (e.g. a battery) such that the acquisition of measurements is prevented once the power source is exhausted. The measurement probe may be provided in first and second parts as described above, with the non-replaceable power source being included in the first part.
  • Advantageously, the method comprises the step of measuring usage of the measurement probe system. In this manner, the prohibition on acquiring further measurements using the measurement probe system can be based on a measured usage value. Conveniently, the user is contractually inhibited (e.g. by a suitable agreement or contract) from acquiring measurements using the measurement probe system after reaching an agreed amount of measurement probe system usage.
  • The above method is described in terms of users and manufacturers of measurement probe systems. It should, however, be remembered that it is also common to sell measurement equipment through original equipment manufacturers (OEMs) as optional “add-ons” to other equipment. For example, measurement probe devices and associated control interfaces are often offered by machine tool manufacturers as optional items. The method is thus in no way limited to the method of sale and also encompasses the provision of measuring services through OEMs, distributors, agents etc.
  • Although the method of the present invention is described in terms of measurement probe systems, it should be noted that the method may be applied to other types of measuring equipment. Measuring equipment can be broadly categorised into dimensional and non-dimensional apparatus. Dimensional measurement apparatus allows a physical dimension of an object to be measured and may include, for example, measurement probes (such as touch trigger or scanning probes), optical position encoders etc. Non-dimensional measurement apparatus is also known for measuring a property or characteristic of an object other than a dimension; examples of such apparatus may include Raman spectrometers and Fourier transform infrared spectrometers. The method may thus be applied to dimensional and/or non-dimensional apparatus as required.
  • Further aspects of the invention relating to apparatus comprising a deactivation portion for inhibiting the use of measurement apparatus are described in Applicant's co-pending European patent application 07252959 (agents' ref: 738EP), the disclosure of which is incorporated herein by reference in its entirety. In particular, see pages 1 to 9 thereof.
  • Further aspects of the invention relating to modular measurement probe apparatus having a stylus module with an in-built failure mode are described in Applicant's co-pending European patent application 07253647 (agents' ref: 755EP), the disclosure of which is incorporated herein by reference in its entirety. In particular, see pages 1 to 11 thereof.
  • In summary, the present invention offers the potential to increase the market for measurement probe systems without having to compromise on the accuracy or quality of such systems. From a user's perspective, the lower upfront cost provided by the method reduces the financial risk associated with the acquisition of measurement probe systems thereby making such systems a more attractive option.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The invention will now be described, by way of example only, with reference to the accompanying drawings in which;
  • FIG. 1 illustrates a measurement probe moved by a machine tool under computer control, and
  • FIG. 2 illustrates a measurement probe having an in-built trigger counter.
  • DETAILED DESCRIPTION OF EMBODIMENTS OF THE INVENTION
  • Referring to FIG. 1, a measurement probe 500 is shown mounted to the spindle 502 of a machine tool. The spindle 502 is moveable in three dimensions (X, Y, Z) under the control of a computer controller 504. The machine tool also comprises, in a known manner, various position encoders that accurately measure the position (in X,Y,Z) of the spindle 502 and pass such position information back to the controller 504. Various alternative types of machine tool are also known.
  • The measurement probe 500 is a touch trigger probe in which the stylus holder is attached to the probe body by a spring-loaded kinematic arrangement of the type originally described in U.S. Pat. No. 4,153,998, the contents of which are hereby incorporated by reference. In use, a workpiece contacting stylus 506 is brought into contact with an object 510 to be measured. Deflection of the stylus 506 unseats the stylus holder from the probe body thereby breaking an electrical circuit. A processor is provided as part of the measurement probe to analyse the resistance of the circuit and to generate a trigger signal whenever the stylus is deflected by contact with an object; this is described in more detail in WO03/021182, the contents of which are hereby incorporated by reference.
  • The measurement probe 500 communicates with a probe interface 508 over a RF wireless link. The wireless link may use a spread spectrum (e.g. frequency hopping) protocol such as, or similar to, that described in more detail in WO2004/057552, the contents of which are hereby incorporated by reference. Other types of wireless link, for example an optical link, may alternatively be used. The trigger signal is relayed from the probe 500 to the interface 508 via the wireless link and then passed to the controller 504. The position of the spindle 502 when the trigger signal is issued is then stored. This allows, assuming the apparatus has been suitably calibrated, the position of a point on the surface of the object 510 to be established. Measuring multiple points in this manner allows various properties or dimensions of the object to be determined.
  • The above described operation of a machine tool based measurement probe system is known. However, as explained in more detail in the background section above, end users typically purchase measurement probe systems (e.g. the probe interface 508 and measurement probe 500) with a single upfront payment. However, the relatively high upfront cost of acquiring such a measurement probe system is often a substantial disincentive to machine tool users who are unaware of the potential benefits of incorporating such apparatus into their production processes. In particular, users of lower end machine tools are often unwilling to take the risk of investing in a measurement system when they are uncertain of the scale of the benefits that will be provided. Although it is known to provide hire purchase or loan arrangements that allow the purchase cost to be spread over a longer period, such arrangements do not reduce the total financial commitment that is associated with the purchase (in fact interest charges are likely to increase the total cost) but merely reduce the amount of upfront expenditure.
  • In order to increase the uptake of measurement systems, especially for low end machine tool users, the present inventors have devised a method for overcoming the requirement for a large, upfront, financial commitment. Importantly, this lower cost option does not require any reduction in the accuracy or reliability of the measurement system. In accordance with the present invention, usage of the measurement probe system is recorded. In the embodiment described with reference to FIG. 1, the computer control 504 is arranged to record the number of trigger signals that are received from the measurement system (i.e. from the measurement probe 500 via the interface 508). This is achieved by running an appropriate monitoring program on the computer control 504 that stores a count value and causes that count value to increment (or decrement) each time a trigger signal is received. It should be noted that the computer control 504 may comprise a numerical controller (NC) interfaced to a separate personal computer or it may comprise a front end computer that provides numerical control of the machine tool and also has sufficient processing power to run additional applications.
  • The measurement apparatus of FIG. 1, and in particular the computer controller 504, keeps a running total of the number of trigger signals that have been issued by the measurement probe. The user may, on purchasing the equipment, be prohibited from using the measurement system after a certain number of trigger signals have been issued. For example, purchase of the measurement system may be (e.g. contractually) conditional on it being used to provide no more than a certain number, say ten thousand, trigger signals. This may be considered a first usage threshold that limits the number of points that can be measured with the measurement system.
  • The first usage threshold may be increased before it is exceeded, for example by purchasing additional “triggers” from the manufacturer or their authorised agent etc. If the updated first usage threshold is reached or exceeded, further use of the measurement probe system is prohibited. After use has been prohibited, it may be possible to purchase additional “triggers” or counts that allow use of the measurement system to be resumed; for example, until a second usage threshold is reached or exceeded. Third and subsequent usage thresholds may subsequently be set in a similar manner. A complete removal of usage restrictions may also be permitted, for example on payment of a full release or upgrade fee, thereby converting the measurement system into a standard measurement system.
  • It is important to note that there is no obligation on the user to purchase additional triggers or pay any upgrade fee. This is entirely at the discretion of the user and can be based on an assessment of the value added to the relevant manufacturing process by the measurement system. Provision of such a system thus alters the cost/risk balance and makes the purchase of a measurement system a more attractive option to end users and especially to users of lower end machine tool equipment. The manufacturer also benefits from being able to increase market penetration due to the lower upfront cost whilst being able to recoup the necessary costs from those users who continue to use the measurement system once the benefits of the system in the particular application have become apparent.
  • In the embodiment described with reference to FIG. 1, the computer 504 is used to monitor measurement probe usage. However, different methods of monitoring usage may be implemented. Preferably, such monitoring is performed in an automated, e.g. electronic, manner but it would be possible for an operator to manually monitor usage (e.g. by counting or estimating how many times the probe is triggered). In preferred embodiments, the measurement probe system (e.g. the measurement probe or the probe interface) performs the usage monitoring function.
  • Referring to FIG. 2, a measurement probe 550 is illustrated that includes a trigger counter display 552. The measurement probe 550 is a touch trigger probe of the type describe above but also includes a suitable trigger counter. The trigger counter (not shown) may be provided as a dedicated trigger counter unit or may be implemented by a processor that also performs other probe functions (e.g. deflection signal analysis or data communications). The count measured by the trigger counter is, in this example, made available to the user via a trigger counter display 552, such as a liquid crystal display or the like, that is provided on the body of the measurement probe.
  • As shown in FIG. 2, the measurement probe 550 stores a trigger count of “1798” as it is moved towards an object 554. The stylus of the measurement probe 550 then contacts a point on the surface of the object thereby deflecting the stylus and generating a trigger signal that is passed to an associated interface over a wireless link. Generation of a trigger signal in this manner also causes the trigger counter to increment to “1799” which is displayed to the user. Each time a measurement point is acquired, the count thus increases by one.
  • Although a trigger counter display of the type illustrated in FIG. 2 provides a convenient way to communicate the trigger count to a user, numerous alternatives are possible. For example, the measurement probe may include an LED that illuminates when a measurement usage threshold is approached and/or reached. Alternatively, multiple LEDs may be provided that indicate the number of trigger counts that have been expended or are remaining. For example, consider a touch trigger probe having a usage limit of 10,000 counts. A green LED may be illuminated until 8,000 counts have been expended whereupon an amber LED is illuminated. The amber LED is extinguished and a red LED illuminated when the limit is reached. In this manner, some warning that the usage limit is being approached may be communicated to a user. The trigger count information from the measurement probe may also, or alternatively, be displayed by the probe interface and/or passed to the control computer for display.
  • It should be noted that although measuring trigger counts provides a convenient measure of measurement probe usage, other measures could also or alternatively be used. For example, the number of parts that have been measured by the measurement system could be counted (e.g. by the computer controller of the machine tool). As a variant of this, the number of parts that have been measured and have been found to be within acceptable measurement tolerances could be counted, thereby ignoring any measurements made on workpieces that have to be scrapped. A time based usage system may also be implemented. For example, the amount of time that the measurement system is in use could be measured. This may be a measure of the duration of machine tool, measurement probe and/or probe interface activation. Alternatively, it may be possible to measure for how long the measurement probe has been loaded into spindle and/or moved about by the machine. The usage of the measurement probe may also be derived from the combination of two or more measures; for example, the usage may be defined by the number of triggers issued and the amount of time the measurement probe has been active.
  • The above mentioned prohibition on further use after the usage limit has been reached may rely on the honesty of the user and/or a suitable contractual requirement can be placed on the user. Alternatively, the measurement system or the machine tool may include a mechanism (e.g. hardware or software based) that prevents the acquisition or use of further measurement data after the threshold is reached. A variety of suitable embodiments that prevent normal probe operation after a usage limit has been exceeded are described in more detail below and such devices offer the manufacturer the assurance that unauthorised use of the measurement system can not occur. Such hardware/software prevention mechanisms may be used in conjunction with contractual requirements.
  • Instead of setting a usage limit that is not to be exceeded, it is also possible to monitor usage of the measurement probe system and periodically charge the user a usage based fee. This still permits the upfront cost of the measurement probe system to be reduced and allows usage to be monitored and charged for accordingly. The fee is preferably set upfront and may include a graduate scale of costs in which each measurement becomes cheaper as more measurements are taken. Once a certain amount of usage has occurred and been paid for, further use of the measurement system may not incur any further cost. Again, such a usage based charging system does not require a significant upfront financial commitment from a user and still allows the manufacturer to profit if the measurement system is found to be advantageous in the user's particular machining process. This solution therefore also makes measurement systems more attractive propositions, especially to users of lower end machine tools.
  • The above examples that are described with reference to FIGS. 1 and 2 relate to touch trigger probes. It should, however, be noted that the invention is equally applicable to other types of contact and/or non-contact (e.g. optical, capacitive etc) measurement probes. For example, the measurement probe may comprise an analogue or scanning probe in which data relating to stylus deflection is generated. Similarly, the above examples describe machine tool based systems. The invention can also be applied to dedicated co-ordinate measurement machine (CMMs) or any other type of co-ordinate positioning apparatus.
  • Embodiments of apparatus comprising a deactivation portion for inhibiting the use of measurement apparatus are described with reference to FIGS. 1 to 11 in Applicant's co-pending European patent application 07252959 (agents' ref: 738EP).
  • Embodiments of modular measurement probe apparatus having a stylus module with an in-built failure mode are described with reference to FIGS. 1 to 3 in Applicant's co-pending European patent application 07253647 (agents' ref: 755EP).

Claims (17)

1. A method of using a measurement probe system, comprising the steps of:
(i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe system being suitable for use with co-ordinate positioning apparatus; and
(ii) electronically monitoring usage of the measurement probe system.
2. A method according to claim 1 comprising the step of prohibiting further usage of the measurement probe system based on the monitored usage of step (ii), the prohibiting including disabling the measurement probe.
3. A method according to claim 2 comprising the step of prohibiting usage of the measurement probe system when the monitored usage exceeds a first predetermined usage threshold.
4. A method according to claim 3 comprising the step of allowing, on payment of a refresh fee, further usage of the measurement probe system after the first predetermined usage threshold has been exceeded.
5. A method according to claim 4 wherein, after payment of the refresh fee, the method comprises the further step of prohibiting usage of the measurement probe system when the monitored usage exceeds a second predetermined usage threshold, the further step of prohibiting including further disabling the measurement probe.
6. A method according to claim 2 wherein the disabling comprises the step of preventing the output of measurement data from the measurement probe system.
7. A method according to claim 1 comprising calculating a usage charge based on the monitored usage of step (ii).
8. A method according to claim 1 wherein the electronic monitoring comprises at least one of counting the number of measurements acquired by the measurement probe system and measuring the length of time that the measurement probe system is in use.
9. A method according to claim 1 wherein the measurement probe system comprises a probe usage counter for performing step (ii).
10. A method according to claim 1 wherein the measurement probe comprises a touch trigger probe comprising a probe body and a stylus, the touch trigger probe being arranged to produce a trigger signal when the stylus is deflected relative to the probe body, wherein the electronic monitoring comprises counting the number of trigger signals produced by the measurement probe.
11. A method according to claim 1 wherein the measurement probe system comprises a probe interface, the measurement probe and the probe interface being in communication via a wireless communications link.
12. A method according to claim 1 wherein step (i) comprises fitting the measurement probe system to a machine tool.
13. A method of using a measurement probe system, comprising the steps of:
(i) providing a measurement probe system comprising a measurement probe to a user, the measurement probe being suitable for use with co-ordinate positioning apparatus;
(ii) enabling the measurement probe so that the user can acquire measurements using the measurement probe system; and
disabling the measurement probe system after a predetermined amount of measurement probe system usage.
14. A method according to claim 13 wherein the disabling includes building a failure mode into the measurement probe such that the acquisition of measurements is prevented after a predetermined amount of measurement probe system usage due to failure of the measurement probe.
15. A method according to claim 14 wherein the measurement probe is formed from a first part and a second part, the first part being releasably attached to the second part to form the measurement probe, wherein the failure mode is built into the first part of the measurement probe.
16. A method according to claim 13 wherein the measurement probe includes a non-replaceable power source and the measurement probe is disabled once the power source is exhausted.
17. A method according to claim 13 comprising the step of electronically measuring usage of the measurement probe system.
US12/219,513 2007-07-26 2008-07-23 Measurement apparatus and a method of using measurement apparatus Abandoned US20090028286A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US12/219,513 US20090028286A1 (en) 2007-07-26 2008-07-23 Measurement apparatus and a method of using measurement apparatus

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
EP07252959.7 2007-07-26
EP07252959A EP2028439A1 (en) 2007-07-26 2007-07-26 Deactivatable measurement apparatus
EP07253647.7 2007-09-13
EP07253647A EP2019282A1 (en) 2007-07-26 2007-09-13 Modular measurement probe
US99698407P 2007-12-13 2007-12-13
US12/219,513 US20090028286A1 (en) 2007-07-26 2008-07-23 Measurement apparatus and a method of using measurement apparatus

Publications (1)

Publication Number Publication Date
US20090028286A1 true US20090028286A1 (en) 2009-01-29

Family

ID=38858903

Family Applications (4)

Application Number Title Priority Date Filing Date
US12/216,597 Expired - Fee Related US7676945B2 (en) 2007-07-26 2008-07-08 Modular measurement probe
US12/216,576 Active 2028-10-17 US8437978B2 (en) 2007-07-26 2008-07-08 Deactivatable measurement apparatus
US12/219,513 Abandoned US20090028286A1 (en) 2007-07-26 2008-07-23 Measurement apparatus and a method of using measurement apparatus
US13/767,357 Active US8700351B2 (en) 2007-07-26 2013-02-14 Deactivatable measurement apparatus

Family Applications Before (2)

Application Number Title Priority Date Filing Date
US12/216,597 Expired - Fee Related US7676945B2 (en) 2007-07-26 2008-07-08 Modular measurement probe
US12/216,576 Active 2028-10-17 US8437978B2 (en) 2007-07-26 2008-07-08 Deactivatable measurement apparatus

Family Applications After (1)

Application Number Title Priority Date Filing Date
US13/767,357 Active US8700351B2 (en) 2007-07-26 2013-02-14 Deactivatable measurement apparatus

Country Status (5)

Country Link
US (4) US7676945B2 (en)
EP (4) EP2028439A1 (en)
JP (4) JP5410700B2 (en)
CN (2) CN101352815B (en)
TW (2) TWI453421B (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090049704A1 (en) * 2005-09-06 2009-02-26 Renishaw Plc Signal transmission apparatus for a measurement probe
US20110218677A1 (en) * 2010-03-03 2011-09-08 Terumo Kabushiki Kaisha Medical manipulator system
US20140290307A1 (en) * 2010-12-27 2014-10-02 Technip France Method for producing a methane-rich stream and a c2+ hydrocarbon-rich stream, and associated equipment
US20170363402A1 (en) * 2016-06-15 2017-12-21 Hexagon Metrology, Inc. CMM Apparatus for Identifying and Confirming the Stylus
US20180150049A1 (en) * 2016-11-29 2018-05-31 Mikron Agie Charmilles Ag Kinematic calibration
US20190272569A1 (en) * 2016-11-15 2019-09-05 Dmg Mori Co., Ltd. Machine Tool Management System
US20210212664A1 (en) * 2018-10-11 2021-07-15 Fujifilm Corporation Ultrasound probe
US11209258B2 (en) * 2017-01-18 2021-12-28 Renishaw Plc Machine tool apparatus

Families Citing this family (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7693325B2 (en) 2004-01-14 2010-04-06 Hexagon Metrology, Inc. Transprojection of geometry data
US7525276B2 (en) * 2005-09-13 2009-04-28 Romer, Inc. Vehicle having an articulator
JP2010502953A (en) * 2006-08-31 2010-01-28 ファロ テクノロジーズ インコーポレーテッド Intelligent probe
CA2669878C (en) 2006-11-20 2017-01-03 Hexagon Metrology Ab Coordinate measurement machine with improved joint
DE102006054978A1 (en) * 2006-11-22 2008-05-29 Dr. Johannes Heidenhain Gmbh probe
EP2028439A1 (en) * 2007-07-26 2009-02-25 Renishaw plc Deactivatable measurement apparatus
US20090212938A1 (en) * 2008-02-22 2009-08-27 Agilent Technologies, Inc. Probe device having a clip-on wireless system for extending probe tip functionality
US8122610B2 (en) 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
US7779548B2 (en) 2008-03-28 2010-08-24 Hexagon Metrology, Inc. Coordinate measuring machine with rotatable grip
EP2112461B1 (en) * 2008-04-24 2012-10-24 Hexagon Metrology AB Self-powered measuring probe
US7908757B2 (en) 2008-10-16 2011-03-22 Hexagon Metrology, Inc. Articulating measuring arm with laser scanner
EP2221790B1 (en) * 2009-02-24 2020-11-18 Panasonic Intellectual Property Management Co., Ltd. Wireless communications system for tool
TW201039113A (en) * 2009-04-29 2010-11-01 Prime View Int Co Ltd Digital electronic apparatus
US8104189B2 (en) * 2009-06-30 2012-01-31 Hexagon Metrology Ab Coordinate measurement machine with vibration detection
US20110112786A1 (en) * 2009-11-06 2011-05-12 Hexagon Metrology Ab Cmm with improved sensors
US20110115588A1 (en) * 2009-11-17 2011-05-19 Digirad Corporation Magnetic Attachment of Detector Modules enabling front side removal
US20110213247A1 (en) * 2010-01-08 2011-09-01 Hexagon Metrology, Inc. Articulated arm with imaging device
USD643319S1 (en) 2010-03-29 2011-08-16 Hexagon Metrology Ab Portable coordinate measurement machine
EP2384851B1 (en) * 2010-05-03 2018-01-03 Tesa Sa Coordinate Measuring System with rotatory adapter
US8947796B2 (en) 2010-05-07 2015-02-03 Hewlett-Packard Development Company, L.P. Telecentric optical assembly
GB201013938D0 (en) * 2010-08-20 2010-10-06 Renishaw Plc Method for recalibrating coordinate positioning apparatus
CN101913103B (en) * 2010-08-19 2013-05-22 上海理工大学 Method for measuring angular errors of rotating table of numerical control machine
US8127458B1 (en) 2010-08-31 2012-03-06 Hexagon Metrology, Inc. Mounting apparatus for articulated arm laser scanner
IT1402715B1 (en) * 2010-10-29 2013-09-18 Marposs Spa PROBE PROBE
IT1403845B1 (en) * 2010-10-29 2013-11-08 Marposs Spa PROBE PROBE AND RELATIVE CONTROL METHOD
EP2643658A4 (en) * 2010-11-24 2014-05-21 Hysitron Inc Mechanical testing instruments including onboard data
CN102353311A (en) * 2011-06-23 2012-02-15 奇瑞汽车股份有限公司 Sheet metal flanging aperture height measurement detection apparatus
EP2795244B1 (en) * 2011-12-21 2018-02-07 Carl Zeiss Industrielle Messtechnik GmbH Method for coupling two system components of a measuring device, in particular a co-ordinate measuring device
JP5620414B2 (en) * 2012-01-18 2014-11-05 株式会社スクウェア・エニックス Game device
US8763267B2 (en) 2012-01-20 2014-07-01 Hexagon Technology Center Gmbh Locking counterbalance for a CMM
US8849444B2 (en) * 2012-02-15 2014-09-30 Regina George Slipcover method and system
US20130238272A1 (en) * 2012-03-06 2013-09-12 Shi-Duang Chen Touch trigger probe
JP6165461B2 (en) * 2012-03-13 2017-07-19 東芝機械株式会社 Processing equipment with on-machine measurement function
CN102706315A (en) * 2012-03-20 2012-10-03 深圳市大族激光科技股份有限公司 Measuring device and measuring method for flatness of tabletop of platform
US9069355B2 (en) 2012-06-08 2015-06-30 Hexagon Technology Center Gmbh System and method for a wireless feature pack
US20140028635A1 (en) * 2012-07-27 2014-01-30 Christoph Horst Krah Modular stylus device
US9176604B2 (en) 2012-07-27 2015-11-03 Apple Inc. Stylus device
KR101241969B1 (en) * 2012-08-28 2013-04-03 (주)메리테크 Bump test glass panel type block structure of the probe
US9250722B2 (en) * 2013-01-07 2016-02-02 Disney Enterprises, Inc. Pressure and angle-sensitive stylus device
US9250214B2 (en) 2013-03-12 2016-02-02 Hexagon Metrology, Inc. CMM with flaw detection system
US9009985B2 (en) * 2013-04-30 2015-04-21 Quality Vision International, Inc. Probe deployment mechanism of measuring machine with isolated locator coupling
CN103267513B (en) * 2013-05-22 2015-10-21 河南省计算机应用技术研究所有限公司 Microcontact type muddy water underwater topography instrument
GB201309506D0 (en) * 2013-05-28 2013-07-10 Renishaw Plc Methods of controlling a coordinate positioning machine
JP6208492B2 (en) 2013-08-07 2017-10-04 株式会社ミツトヨ Information processing apparatus, information processing method, program, and information processing system
DE102013016715A1 (en) * 2013-10-09 2015-04-09 M & H Inprocess Messtechnik Gmbh Measuring device for a machine tool
TWI512302B (en) 2013-12-13 2015-12-11 Mpi Corp Detection system and its detection method
US9594250B2 (en) 2013-12-18 2017-03-14 Hexagon Metrology, Inc. Ultra-portable coordinate measurement machine
US9163921B2 (en) 2013-12-18 2015-10-20 Hexagon Metrology, Inc. Ultra-portable articulated arm coordinate measurement machine
EP2887011B1 (en) * 2013-12-20 2017-02-08 Hexagon Technology Center GmbH Coordinate measuring machine with high precision 3D printing functionality
JP6316663B2 (en) * 2014-05-30 2018-04-25 株式会社キーエンス Coordinate measuring device
US9759540B2 (en) 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
US10089439B2 (en) * 2014-10-28 2018-10-02 Stryker Sustainability Solutions, Inc. Medical device with cryptosystem and method of implementing the same
DE102015206308A1 (en) * 2015-04-09 2016-10-13 Carl Zeiss 3D Automation Gmbh stylus holder
US11103212B2 (en) * 2015-11-11 2021-08-31 Koninklijke Philips N.V. Systems and methods for associating and verifying an association of a transducer with an imaging device
CN108713128A (en) * 2016-03-16 2018-10-26 海克斯康测量技术有限公司 Probe clip for coordinate measuring machine
GB201615307D0 (en) * 2016-09-09 2016-10-26 Renishaw Plc Measurement method and apparatus
US10101141B2 (en) * 2016-12-07 2018-10-16 Mitutoyo Corporation Trigger counter for measurement device with count values stored in flash memory
US10663274B2 (en) 2017-01-27 2020-05-26 Faro Technologies, Inc Articulated arm coordinate measuring machine
US9835433B1 (en) 2017-05-09 2017-12-05 Tesa Sa Touch trigger probe
DE102017114551B4 (en) * 2017-06-29 2021-12-23 Carl Zeiss Industrielle Messtechnik Gmbh Rotary swivel mechanism for a coordinate measuring machine
JP6964452B2 (en) * 2017-07-13 2021-11-10 株式会社ミツトヨ Measuring machine management system and program
EP3460384A1 (en) * 2017-09-26 2019-03-27 Renishaw PLC Measurement probe
US10675689B2 (en) * 2017-10-31 2020-06-09 Mackay Manufacturing, Inc. Metal lathe and tooling calibration
US20190149885A1 (en) * 2017-11-13 2019-05-16 Philo, Inc. Thumbnail preview after a seek request within a video
DE102018222464A1 (en) * 2018-12-20 2020-06-25 Robert Bosch Gmbh Process for the communication of machine tools in a network
US11408916B2 (en) 2019-03-08 2022-08-09 National Instruments Corporation Modular probe for automated test applications
CN109916365B (en) * 2019-03-15 2021-01-15 江苏中兴派能电池有限公司 Battery pack bulging protection device, battery pack bulging detection system and battery pack bulging detection method
CN110749271B (en) * 2019-10-11 2021-12-10 成都飞机工业(集团)有限责任公司 Wireless shape and position measuring device
DE102021101749A1 (en) 2021-01-27 2022-07-28 Carl Zeiss Industrielle Messtechnik Gmbh INTERFACE ARRANGEMENT FOR COUPLING SYSTEM COMPONENTS OF A MEASURING DEVICE
CN114396904A (en) * 2021-11-29 2022-04-26 北京银河方圆科技有限公司 Positioning device and positioning system

Citations (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153998A (en) * 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
US4370721A (en) * 1980-09-02 1983-01-25 Cincinnati Milacron Inc. Method for modifying programmed positions by using a programmably controlled surface sensing element
US4536851A (en) * 1982-10-22 1985-08-20 Damon Germanton Electronic thermometer and associated apparatus
US5222304A (en) * 1988-07-05 1993-06-29 British Technology Group Limited Probes
US5949352A (en) * 1995-05-11 1999-09-07 Marposs Societa'per Azioni System and method for the wireless signal transmission between a measuring head and a remote receiver
US6308089B1 (en) * 1999-04-14 2001-10-23 O.B. Scientific, Inc. Limited use medical probe
US20030179097A1 (en) * 2001-02-02 2003-09-25 David Collingwood Machine tool probe
US6631353B1 (en) * 1999-06-10 2003-10-07 Hologic, Inc. Sonometry and densitometry medical diagnostic devices enabled for per-use patient examinations charged via internet connections to financial cards
US20040039502A1 (en) * 2001-06-29 2004-02-26 Wilson Bary W. Diagnostics/prognostics using wireless links
US20040093495A1 (en) * 2002-11-12 2004-05-13 Engel Glenn R. Device authentication using pre-configured security keys
US20050028609A1 (en) * 2003-07-17 2005-02-10 Langemann Peter J. Flow-monitoring method and device
US20060016087A1 (en) * 2004-07-23 2006-01-26 Reinhold Schopf Probe head
US20060265894A1 (en) * 2005-05-11 2006-11-30 Thomas Schroll Probing pin and probe system equipped therewith
US20070033419A1 (en) * 2003-07-07 2007-02-08 Cryptography Research, Inc. Reprogrammable security for controlling piracy and enabling interactive content
US20070038088A1 (en) * 2005-08-04 2007-02-15 Rich Collin A Medical imaging user interface and control scheme
US20070118397A1 (en) * 2003-05-14 2007-05-24 Anthony Williams Monitoring of medical conditions
US20070125348A1 (en) * 2004-01-23 2007-06-07 Keiichiro Aoki Control system for an exhaust gas sensor
US8437978B2 (en) * 2007-07-26 2013-05-07 Renishaw Plc Deactivatable measurement apparatus

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1445977A (en) * 1972-09-21 1976-08-11 Rolls Royce Probes
JPS5754814A (en) * 1980-09-19 1982-04-01 Tokyo Electric Co Ltd Postage scales
US5065035A (en) * 1981-04-30 1991-11-12 Gte Valenite Corporation Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter
US4510693A (en) * 1982-06-14 1985-04-16 Gte Valeron Corporation Probe with stylus adjustment
JPS59104003U (en) * 1982-12-29 1984-07-13 黒田精工株式会社 touch sensor
EP0293036B1 (en) 1983-11-15 1994-04-06 Renishaw plc Coupling for tool change apparatus
GB8330412D0 (en) * 1983-11-15 1983-12-21 Renishaw Plc Tool change apparatus
US4693110A (en) * 1985-06-06 1987-09-15 Gte Valeron Corporation Method and apparatus for testing the operability of a probe
US4625417A (en) * 1985-06-17 1986-12-02 Gte Valeron Corporation Probe with stylus pressure adjustment
JPH0765883B2 (en) * 1986-06-05 1995-07-19 宣夫 福久 Position detection device having wireless transceiver
GB8719107D0 (en) 1987-08-12 1987-09-16 Renishaw Plc Communications adaptor
GB8808613D0 (en) * 1988-04-12 1988-05-11 Renishaw Plc Signal transmission system for machine tools inspection machines &c
JPH0526601A (en) * 1991-06-18 1993-02-02 Nikken Kosakusho:Kk Contact detecting device
JPH05306908A (en) 1992-04-16 1993-11-19 Keyence Corp Speckle length measuring gauge
JPH0651910U (en) 1992-12-21 1994-07-15 株式会社ミツトヨ Measuring device for frequency of use
DE69323289T3 (en) * 1992-12-24 2003-04-24 Renishaw Plc Probe and signal processing circuit therefor
JPH06230885A (en) * 1993-01-28 1994-08-19 Hitachi Ltd Portable information processor
GB9423176D0 (en) * 1994-11-17 1995-01-04 Renishaw Plc Touch probe
US5578996A (en) * 1994-11-23 1996-11-26 Brk Brands, Inc. Long life detector
JP3935943B2 (en) 1996-02-15 2007-06-27 バイオセンス・インコーポレイテッド Catheter calibration system and usage monitoring system
GB9605609D0 (en) * 1996-03-16 1996-05-15 Renishaw Plc Inspection system for coordinate positioning machine
GB9907643D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
JP2001160106A (en) 1999-09-21 2001-06-12 Olympus Optical Co Ltd Method and system for leasing medical treatment equipment, and medical treatment equipment
EP2302476A3 (en) 2000-02-01 2012-10-24 Faro Technologies, Inc. Method, system and storage medium for providing an executable program to a coordinate measurement system
JP2001296120A (en) 2000-04-14 2001-10-26 Canon Inc Spherometer
GB0020370D0 (en) 2000-08-18 2000-10-04 Hewlett Packard Co Trusted device
GB0114765D0 (en) * 2001-06-16 2001-08-08 Renishaw Plc Machine tool probe
DE60235848D1 (en) 2001-09-05 2010-05-12 Renishaw Plc probe control
DE10228103A1 (en) 2002-06-24 2004-01-15 Bayer Cropscience Ag Fungicidal active ingredient combinations
GB0229763D0 (en) 2002-12-23 2003-01-29 Renishaw Plc Signal transmission system for a trigger probe
US6922904B2 (en) * 2003-01-29 2005-08-02 Dr. Johannes Heidenhain Gmbh Method and system for analyzing transmitted signals from a probe system
EP1443300B1 (en) * 2003-01-29 2010-02-24 Tesa SA Steerable feeler head
JP4008828B2 (en) * 2003-01-30 2007-11-14 サンクス株式会社 Contact displacement sensor
WO2004068068A1 (en) * 2003-01-31 2004-08-12 Carl Zeiss Industrielle Messtechnik Gmbh Probe for a coordinate measuring device
JP4184823B2 (en) * 2003-02-07 2008-11-19 フジノン株式会社 Endoscopic treatment tool
GB0308149D0 (en) * 2003-04-09 2003-05-14 Renishaw Plc Probe for sensing the position of an object
JP2006195809A (en) * 2005-01-14 2006-07-27 Hitachi Ltd Measurement system
EP1895898B1 (en) 2005-06-29 2011-02-16 Compumedics Limited Sensor assembly with conductive bridge
GB0518078D0 (en) * 2005-09-06 2005-10-12 Renishaw Plc Signal transmission system
DE102005042558A1 (en) * 2005-09-08 2007-03-15 Dr. Johannes Heidenhain Gmbh probe
JP2009008429A (en) 2007-06-26 2009-01-15 Citizen Seimitsu Co Ltd Apparatus and method of managing length measuring instrument
EP2018934A1 (en) * 2007-07-26 2009-01-28 Renishaw plc Measurement device having authentication module

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153998A (en) * 1972-09-21 1979-05-15 Rolls-Royce (1971) Limited Probes
US4370721A (en) * 1980-09-02 1983-01-25 Cincinnati Milacron Inc. Method for modifying programmed positions by using a programmably controlled surface sensing element
US4536851A (en) * 1982-10-22 1985-08-20 Damon Germanton Electronic thermometer and associated apparatus
US5222304A (en) * 1988-07-05 1993-06-29 British Technology Group Limited Probes
US5949352A (en) * 1995-05-11 1999-09-07 Marposs Societa'per Azioni System and method for the wireless signal transmission between a measuring head and a remote receiver
US7048687B1 (en) * 1999-04-14 2006-05-23 Ob Scientific, Inc. Limited use medical probe
US6308089B1 (en) * 1999-04-14 2001-10-23 O.B. Scientific, Inc. Limited use medical probe
US20060161054A1 (en) * 1999-04-14 2006-07-20 Reuss James L Limited use medical probe
US6631353B1 (en) * 1999-06-10 2003-10-07 Hologic, Inc. Sonometry and densitometry medical diagnostic devices enabled for per-use patient examinations charged via internet connections to financial cards
US20030179097A1 (en) * 2001-02-02 2003-09-25 David Collingwood Machine tool probe
US7145468B2 (en) * 2001-02-02 2006-12-05 Renishaw Plc Machine tool probe
US20060250266A1 (en) * 2001-02-02 2006-11-09 Renishaw Plc Machine tool probe
US20040039502A1 (en) * 2001-06-29 2004-02-26 Wilson Bary W. Diagnostics/prognostics using wireless links
US20040093495A1 (en) * 2002-11-12 2004-05-13 Engel Glenn R. Device authentication using pre-configured security keys
US20070118397A1 (en) * 2003-05-14 2007-05-24 Anthony Williams Monitoring of medical conditions
US20070033419A1 (en) * 2003-07-07 2007-02-08 Cryptography Research, Inc. Reprogrammable security for controlling piracy and enabling interactive content
US20050028609A1 (en) * 2003-07-17 2005-02-10 Langemann Peter J. Flow-monitoring method and device
US20070125348A1 (en) * 2004-01-23 2007-06-07 Keiichiro Aoki Control system for an exhaust gas sensor
US20060016087A1 (en) * 2004-07-23 2006-01-26 Reinhold Schopf Probe head
US20060265894A1 (en) * 2005-05-11 2006-11-30 Thomas Schroll Probing pin and probe system equipped therewith
US20070038088A1 (en) * 2005-08-04 2007-02-15 Rich Collin A Medical imaging user interface and control scheme
US8437978B2 (en) * 2007-07-26 2013-05-07 Renishaw Plc Deactivatable measurement apparatus

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090049704A1 (en) * 2005-09-06 2009-02-26 Renishaw Plc Signal transmission apparatus for a measurement probe
US7665219B2 (en) * 2005-09-06 2010-02-23 Renishaw Plc Signal transmission apparatus for a measurement probe
US20110218677A1 (en) * 2010-03-03 2011-09-08 Terumo Kabushiki Kaisha Medical manipulator system
US20140290307A1 (en) * 2010-12-27 2014-10-02 Technip France Method for producing a methane-rich stream and a c2+ hydrocarbon-rich stream, and associated equipment
US20170363402A1 (en) * 2016-06-15 2017-12-21 Hexagon Metrology, Inc. CMM Apparatus for Identifying and Confirming the Stylus
US10458772B2 (en) * 2016-06-15 2019-10-29 Hexagon Metrology, Inc. CMM apparatus for identifying and confirming the stylus
US20190272569A1 (en) * 2016-11-15 2019-09-05 Dmg Mori Co., Ltd. Machine Tool Management System
US20180150049A1 (en) * 2016-11-29 2018-05-31 Mikron Agie Charmilles Ag Kinematic calibration
US10824131B2 (en) * 2016-11-29 2020-11-03 Gf Machining Solutions Ag Kinematic calibration
US11209258B2 (en) * 2017-01-18 2021-12-28 Renishaw Plc Machine tool apparatus
US11674789B2 (en) 2017-01-18 2023-06-13 Renishaw Plc Machine tool apparatus
US20210212664A1 (en) * 2018-10-11 2021-07-15 Fujifilm Corporation Ultrasound probe
US11717264B2 (en) * 2018-10-11 2023-08-08 Fujifilm Corporation Ultrasound probe

Also Published As

Publication number Publication date
US7676945B2 (en) 2010-03-16
EP2019285A3 (en) 2011-04-20
US8437978B2 (en) 2013-05-07
TWI380025B (en) 2012-12-21
CN101354266B (en) 2010-12-22
EP2019284A2 (en) 2009-01-28
JP2009047689A (en) 2009-03-05
TW200914838A (en) 2009-04-01
TWI453421B (en) 2014-09-21
EP2019284B1 (en) 2018-09-05
JP2009053187A (en) 2009-03-12
US20130152418A1 (en) 2013-06-20
EP2019285A2 (en) 2009-01-28
EP2019284A3 (en) 2011-04-20
JP5214359B2 (en) 2013-06-19
CN101352815B (en) 2011-04-06
CN101352815A (en) 2009-01-28
TW200916789A (en) 2009-04-16
CN101354266A (en) 2009-01-28
US20090034677A1 (en) 2009-02-05
EP2019285B1 (en) 2018-09-05
US8700351B2 (en) 2014-04-15
JP2013076708A (en) 2013-04-25
JP2014074717A (en) 2014-04-24
EP2019282A1 (en) 2009-01-28
EP2028439A1 (en) 2009-02-25
JP5410700B2 (en) 2014-02-05
US20090025243A1 (en) 2009-01-29
JP5992314B2 (en) 2016-09-14

Similar Documents

Publication Publication Date Title
US20090028286A1 (en) Measurement apparatus and a method of using measurement apparatus
CA2508227C (en) Portable electronic measurement
JP6572567B2 (en) Exchange price setting device, exchange price setting method, program, and recording medium
US7200519B2 (en) Analysis system for analyzing the condition of a machine
CA2597619C (en) Embedded warranty management
AU750673B2 (en) Disk brake testing device and system employing the same
US20190272569A1 (en) Machine Tool Management System
CN107430199A (en) Detection and the method for output radiation close rate information
US20050049801A1 (en) Analysis system
JP2007064798A (en) Digital calipers with acceptance determination function
US7054761B2 (en) Analysis system for analyzing the condition of a machine
TWM538181U (en) Monitoring equipment for CNC machining
Fritsch GWP®-the science-based global standard for efficient lifecycle management of weighing instruments
Robins Fixturing PRESENTS QUALITY PRODUCTS
Traylor Probes keep pace with DCC CMMs
JP2002190436A (en) Electrostatic monitoring system
Robins Size Up Gage Calibration Software
Minner Zero in on gage calibration
Wolak CMM Buying Considerations
Bangert Select the right video system
KR20060075305A (en) A concrete operation time measuring unit and method thereof
Williams Make the switch to video
Buck Gage multiplexers

Legal Events

Date Code Title Description
AS Assignment

Owner name: RENISHAW PLC, UNITED KINGDOM

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:PRESTIDGE, TIM;LUMMES, STEPHEN EDWARD;CAMPBELL, STUART KERSTEN;AND OTHERS;REEL/FRAME:021454/0287;SIGNING DATES FROM 20080819 TO 20080821

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION