US20080043909A1 - X-Ray Alignment System For Fabricating Electronic Chips - Google Patents

X-Ray Alignment System For Fabricating Electronic Chips Download PDF

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Publication number
US20080043909A1
US20080043909A1 US11/758,961 US75896107A US2008043909A1 US 20080043909 A1 US20080043909 A1 US 20080043909A1 US 75896107 A US75896107 A US 75896107A US 2008043909 A1 US2008043909 A1 US 2008043909A1
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Prior art keywords
substrate
screen
pads
printing
microns
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Abandoned
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US11/758,961
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Miguel Jimarez
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International Business Machines Corp
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International Business Machines Corp
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Priority to US11/758,961 priority Critical patent/US20080043909A1/en
Publication of US20080043909A1 publication Critical patent/US20080043909A1/en
Abandoned legal-status Critical Current

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41MPRINTING, DUPLICATING, MARKING, OR COPYING PROCESSES; COLOUR PRINTING
    • B41M1/00Inking and printing with a printer's forme
    • B41M1/12Stencil printing; Silk-screen printing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1216Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by screen printing or stencil printing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0306Inorganic insulating substrates, e.g. ceramic, glass
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/166Alignment or registration; Control of registration
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0008Apparatus or processes for manufacturing printed circuits for aligning or positioning of tools relative to the circuit board

Definitions

  • This invention relates to the fabrication of electronic chips and, more particularly, to a system and method for aligning a stencil mask with the bonding pads of an electronic chip.
  • Screen printing entails depositing a circuit pattern corresponding to that of the stencil pattern onto a chip.
  • a chip is placed onto a positionable stage and lifted to a point just below a screen having solder paste thereon.
  • a squeegee then moves horizontally across the screen to push solder paste through the screen to produce a stencil pattern.
  • Chip attachment site fiducials are commonly used for alignment of the stencil mask to the actual chip carrier substrate to be printed. As the density of chips has increased dramatically, so have the chip carrier substrates, and the attachment site fiducials cannot be added to the design because they use up too much surface area on the substrate. Indeed, special technology is needed to increase the density of contacts on the surface of the chip, and space is at a premium.
  • Flip chip interconnects are one way in which the density of chips is maximized.
  • Flip chip technology involves the electrical and metallurgical joining of a chip and a carrier to form a package.
  • the chip, or die has an array of die pads each having a solder bump positioned thereon. These solder bumps are commonly referred to as C4s, an acronym for controlled collapse chip connection.
  • C4s an acronym for controlled collapse chip connection.
  • a chip having an array of die pads and C4 bumps may be flipped over so that the C4s can be die-bonded to the contacts on a chip carrier or substrate, thereby electrically interconnecting the chip and the carrier.
  • optical alignment systems In optical alignment systems, visible light is employed to perform measurements in alignment systems. However, when finer measurements need to be made, x-ray technology can be employed. Because of their smaller wavelengths, x-rays can provide resolution beyond the limits of conventional optical parameters.
  • a method is provided to align a screen printing stencil having very fine pitch dimensions with a chip substrate for the screen printing of solder paste onto chip carrier or substrate.
  • the fine pitch dimensions and low light contrast of ceramics of the gold plated receptor pads on a C4 flip chip substrate prevents the use of fiducials for aligning the printing stencil.
  • the system of the present invention comprises the replacement of a conventional optical alignment system with an x-ray sub-assembly including an x-ray generator positioned either above or below the C4 flip chip substrate and an x-ray detector positioned on the opposite side of the substrate and detector for receiving and interpreting the x-rays and generating a visual image that may be used to properly align the C4 flip chip substrate to the printing stencil.
  • the x-ray sub-assembly is able to align the gold plated receptor pads of low contrast substrates with a screen printing stencil having apertures of less than 125 microns.
  • the method of the present invention comprises the steps of beaming x-rays through a chip carrier substrate and associated stencil, detecting the x-rays passing through the substrate and stencil, forming a visual image of the substrate and stencil, and aligning the printing screen with the receptor pads of the substrate based on the generated image.
  • FIGS. 1 a - 1 c are perspective views of a prior art optical imaging assembly
  • FIG. 2 is a diagram of the operation of a prior art optical imaging assembly
  • FIG. 3 is a diagram of an x-ray imaging system according to the present invention.
  • FIG. 4 is an image according to the present invention of a substrate having pads of 5 microns or less;
  • FIG. 5 is an image according to the present invention of a fine pitch stencil
  • FIG. 6 is an image according to the present invention of the stencil of FIG. 5 aligned with the pads depicted in FIG. 4 .
  • FIG. 7 is a flow chart illustrating the process associated with the present invention.
  • FIG. 1 a conventional optical alignment system 10 , such as Vision Probe system, for aligning a screen printing stencil with a ceramic chip carrier or substrate.
  • Optical alignment system 10 includes illumination sources 12 and 14 positioned upwardly and downwardly, respectively, as well as a vision sensor 16 , such as an optical camera for capturing a visual image of stencil 18 and substrate 22 .
  • vision system 10 is generally positioned in screen printing machine between a stencil 18 having apertures 20 for printing solder paste and a substrate 22 having receptor pads 24 to be stenciled with solder paste.
  • Illumination sources 12 and 14 project visible light onto stencil 18 and substrate 22 , respectively, and sensor 16 detects or images the surface patterns on stencil 18 and substrate 22 , respectively.
  • the images detected by sensor 16 may be electronically stored and/or provided to a display screen (not shown) for manual alignment, or processed by a microprocessor computer for automatic alignment of stencil 18 to substrate 22 using images captured by sensor 16 .
  • Sensor 16 may be positioned on a shaft for rotation between upwardly and downwardly facing positions to image stencil 18 and substrate 22 independently, or system 10 may include a second, opposing sensor 16 to image stencil 18 and substrate 22 simultaneously.
  • the present invention comprises the use of a real-time x-ray system 26 in the related solder plating machine rather than optical camera system 10 .
  • X-ray system 26 generally comprises an x-ray source 28 , a steering element 30 , a motorized stage assembly 32 , a detector 34 , an x-ray sensitive camera 36 , and a display screen 38 .
  • X-ray source 26 is positioned above stage 32 and generates x-rays which projected toward stage 32 and directed by steering element 30 .
  • Stage assembly 32 supports stencil 18 and substrate 22 and includes conventional structure for moving stencil 18 and/or substrate 22 in two to three dimensions (or at least relative to each other), such as microprocessor controlled carriages having side-clamping mechanisms or pins, so that apertures 20 of stencil 18 and receptor pads 24 of substrate 22 may be brought into proper alignment.
  • X-rays from source 28 pass through stencil 18 and substrate 22 and are received by detector 34 and directed to camera 36 .
  • Camera 36 generates a real-time visual image representative of the relative positioning of apertures 20 and receptor pads 24 for display on screen 38 .
  • Stage assembly 32 may then be operated to move stencil 18 and substrate 22 relative to each other until image generated by camera 36 indicates that apertures 20 and receptor pads 24 are properly aligned for screen printing of solder paste onto receptor pads 24 , thereby avoiding the need for visible fiducials.
  • the various components for x-ray system 26 may be adapted from conventional systems used for inspecting semiconductor solder joints, such as the real-time x-ray imaging system manufactured by CR Technologies of Aliso Viejo, Calif.
  • the real-time x-ray system 26 of the present invention is capable of aligning the gold plated receptor pads 24 of five microns or less disposed upon a low light contrast ceramic (9011 alumina) substrate 22 , as seen in FIG. 4 , with a screen printing stencil 18 having very small apertures 20 of less than 125 microns, as seen in FIG. 5 .
  • apertures 20 of stencil 18 have been properly aligned with pads 24 of substrate 20 based on the visual x-ray information provided on display screen 38 so that screen printing of solder paste may commence.
  • the method 40 of proper alignment of stencil 18 and substrate 22 begins with the step 42 of affixing stencil 18 and substrate 22 to stage assembly 32 .
  • X-ray system 26 is then activated 44 , resulting in the generating real-time images of stencil 18 and substrate 22 which may be viewed 46 on screen 38 .
  • decisional block 48 a decision is made whether stencil 18 and substrate 22 are in proper alignment. If not, stage assembly 32 is operated 50 to move stencil 18 relative to substrate 22 and the real-time image on screen 38 is viewed and the alignment checked 48 again. If stencil 18 and substrate 22 are aligned, the screen solder printing process may begin 52 .
  • Decisional block 48 may be implemented manually by a user viewing stencil 18 and substrate 22 by then activating the appropriate moveable carriages of stage assembly 32 .
  • Decisional block 48 may also be implemented automatically by using a microprocessor that is programmed with the image processing software available in conventional visual systems and interconnected to stage assembly 32 to move stencil 18 and substrate 22 into alignment.

Abstract

A system of using x-rays to align screen printing of flip chip using x-ray sub-assembly in a chip fabricating assembly. X-rays are directed onto a substrate having receptor pads and a printing screen having fine apertures. The substrate is aligned with the printing screen based on the detection and analysis of the real-time image generated from the x-rays passing through the substrate and printing screen. The x-ray alignment system is capable of aligning gold plated receptor pads of five microns or less and disposed upon a low light contrast ceramic (e.g., 9011 alumina) substrate with a screen printing stencil having very small apertures of less than 125 microns.

Description

    CROSS-REFERENCE TO RELATED APPLICATION
  • The present application is a continuation of and claims priority to Applicant's co-pending U.S. Non-Provisional patent application Ser. No. 11/124,653, now allowed, which is a continuation-in-part of Applicant's U.S. Non-Provisional patent application Ser. No. 10/217,920, filed on Aug. 13, 2002.
  • BACKGROUND OF THE INVENTION
  • 1. Field of Invention
  • This invention relates to the fabrication of electronic chips and, more particularly, to a system and method for aligning a stencil mask with the bonding pads of an electronic chip.
  • 2. Description of Prior Art
  • The screen printing of solder paste with very fine pitch dimensions for the assembly of electronic (Flip) chips to chip carrier substrates is becoming more common in the art. Screen printing entails depositing a circuit pattern corresponding to that of the stencil pattern onto a chip. A chip is placed onto a positionable stage and lifted to a point just below a screen having solder paste thereon. A squeegee then moves horizontally across the screen to push solder paste through the screen to produce a stencil pattern.
  • Chip attachment site fiducials are commonly used for alignment of the stencil mask to the actual chip carrier substrate to be printed. As the density of chips has increased dramatically, so have the chip carrier substrates, and the attachment site fiducials cannot be added to the design because they use up too much surface area on the substrate. Indeed, special technology is needed to increase the density of contacts on the surface of the chip, and space is at a premium.
  • Flip chip interconnects are one way in which the density of chips is maximized. Flip chip technology involves the electrical and metallurgical joining of a chip and a carrier to form a package. The chip, or die, has an array of die pads each having a solder bump positioned thereon. These solder bumps are commonly referred to as C4s, an acronym for controlled collapse chip connection. A chip having an array of die pads and C4 bumps may be flipped over so that the C4s can be die-bonded to the contacts on a chip carrier or substrate, thereby electrically interconnecting the chip and the carrier.
  • In order to properly align and print C4 solder bumps onto the corresponding die pads, conventional screen printers use a vision camera, such as the Vision Probe system available from Speedline Technologies of Franklin, Mass. (formerly MPM Corporation). Such cameras, however, are limited to approximately twenty microns minimum for feature size due to the resolution of the visual imaging systems. Therefore, pads whose sizes are 5 microns or less cannot be used as alignment targets. This problem is further complicated by the fact that the commonly used ceramic substrates present very little contrast with the pads. Therefore, screen printing is only of use in conjunction with high contrast substrates or large diameter pads
  • In optical alignment systems, visible light is employed to perform measurements in alignment systems. However, when finer measurements need to be made, x-ray technology can be employed. Because of their smaller wavelengths, x-rays can provide resolution beyond the limits of conventional optical parameters.
  • In U.S. Pat. No. 4,016,416 issued to Shepherd et al for “Phase Compensated Zone Plate Photodetector,” a zone plate with a photodetector mounted on the opposite face is illustrated.
  • In U.S. Pat. No. 3,984,680 issued to Smith for “Soft X-Ray Mask Alignment System,” an x-ray mask alignment system is illustrated featuring x-ray fluorescence detectors mounted upon the mask. The x-ray detectors measure the x-ray fluorescent signal, which provides a low intensity output as compared with an electron flux.
  • In U.S. Pat. No. 4,614,433 issued to Feldman for “Mask-to-Wafer Alignment Utilizing Zone Plates,” a mask to-wafer alignment using zone plates illuminated by light during alignment is illustrated.
  • In U.S. Pat. No. 6,272,202 issued to Chiba et al on Aug. 7, 2001 for “Exposure Method and X-Ray Mask Structure for Use with the Same,” an exposure method for printing circuitry onto a silicon wafer is illustrated.
  • In U.S. Pat. No. 6,237,218 issued to Ogawa et al on May 29, 2001 for “Method and Apparatus for Manufacturing, Multilayered Wiring Board and Multi-Layered Wiring Board,” a method of using alignment marks during the lamination steps and a specialized x-ray vision and mechanical alignment machine are illustrated for fabricating printed wire boards.
  • In U.S. Pat. No. 5,168,513 issued to Maldonado et al on Dec. 1, 1992 for “X-Ray Metrology and Alignment Detection System,” a process for aligning an x-ray mask and a work piece with an alignment mark is depicted.
  • In Japanese Disclosure Document No. JP05-315215 issued to Koji in 1993 for “A Semiconductor Manufacturing Apparatus,” an alignment method using x-ray radiation through an aperture is shown.
  • In Japanese Disclosure Document No. JP62144325 issued to Shinichi on Jun. 27, 1987 for “Positioning Method,” the alignment of a wafer is shown using a fluorescent screen and a metal shielding x-ray pattern.
  • OBJECTS AND ADVANTAGES
  • It is a principal object and advantage of the present invention to provide an improved method and apparatus for aligning a low contrast substrate with a fine pitch printing screen having apertures of less than 125 microns.
  • It is another object of this invention to provide an x-ray lithography system for aligning a work piece with a fine pitch mask.
  • Other objects and advantages of the present invention will in part be obvious, and in part appear hereinafter.
  • SUMMARY OF THE INVENTION
  • In accordance with the present invention, a method is provided to align a screen printing stencil having very fine pitch dimensions with a chip substrate for the screen printing of solder paste onto chip carrier or substrate. The fine pitch dimensions and low light contrast of ceramics of the gold plated receptor pads on a C4 flip chip substrate prevents the use of fiducials for aligning the printing stencil. The system of the present invention comprises the replacement of a conventional optical alignment system with an x-ray sub-assembly including an x-ray generator positioned either above or below the C4 flip chip substrate and an x-ray detector positioned on the opposite side of the substrate and detector for receiving and interpreting the x-rays and generating a visual image that may be used to properly align the C4 flip chip substrate to the printing stencil. The x-ray sub-assembly is able to align the gold plated receptor pads of low contrast substrates with a screen printing stencil having apertures of less than 125 microns. The method of the present invention comprises the steps of beaming x-rays through a chip carrier substrate and associated stencil, detecting the x-rays passing through the substrate and stencil, forming a visual image of the substrate and stencil, and aligning the printing screen with the receptor pads of the substrate based on the generated image.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • The present invention will be more fully understood and appreciated by reading the following Detailed Description in conjunction with the accompanying drawings, in which:
  • FIGS. 1 a-1 c are perspective views of a prior art optical imaging assembly;
  • FIG. 2 is a diagram of the operation of a prior art optical imaging assembly;
  • FIG. 3 is a diagram of an x-ray imaging system according to the present invention.
  • FIG. 4 is an image according to the present invention of a substrate having pads of 5 microns or less;
  • FIG. 5 is an image according to the present invention of a fine pitch stencil; and
  • FIG. 6 is an image according to the present invention of the stencil of FIG. 5 aligned with the pads depicted in FIG. 4.
  • FIG. 7 is a flow chart illustrating the process associated with the present invention.
  • DETAILED DESCRIPTION
  • Referring now to the drawing figures, wherein like numerals refer to like parts throughout, there is seen in FIG. 1 a conventional optical alignment system 10, such as Vision Probe system, for aligning a screen printing stencil with a ceramic chip carrier or substrate. Optical alignment system 10 includes illumination sources 12 and 14 positioned upwardly and downwardly, respectively, as well as a vision sensor 16, such as an optical camera for capturing a visual image of stencil 18 and substrate 22.
  • Referring to FIG. 2, vision system 10 is generally positioned in screen printing machine between a stencil 18 having apertures 20 for printing solder paste and a substrate 22 having receptor pads 24 to be stenciled with solder paste. Illumination sources 12 and 14 project visible light onto stencil 18 and substrate 22, respectively, and sensor 16 detects or images the surface patterns on stencil 18 and substrate 22, respectively. The images detected by sensor 16 may be electronically stored and/or provided to a display screen (not shown) for manual alignment, or processed by a microprocessor computer for automatic alignment of stencil 18 to substrate 22 using images captured by sensor 16. Sensor 16 may be positioned on a shaft for rotation between upwardly and downwardly facing positions to image stencil 18 and substrate 22 independently, or system 10 may include a second, opposing sensor 16 to image stencil 18 and substrate 22 simultaneously.
  • Referring to FIG. 3, the present invention comprises the use of a real-time x-ray system 26 in the related solder plating machine rather than optical camera system 10. X-ray system 26 generally comprises an x-ray source 28, a steering element 30, a motorized stage assembly 32, a detector 34, an x-ray sensitive camera 36, and a display screen 38. X-ray source 26 is positioned above stage 32 and generates x-rays which projected toward stage 32 and directed by steering element 30. Stage assembly 32 supports stencil 18 and substrate 22 and includes conventional structure for moving stencil 18 and/or substrate 22 in two to three dimensions (or at least relative to each other), such as microprocessor controlled carriages having side-clamping mechanisms or pins, so that apertures 20 of stencil 18 and receptor pads 24 of substrate 22 may be brought into proper alignment. X-rays from source 28 pass through stencil 18 and substrate 22 and are received by detector 34 and directed to camera 36. Camera 36 generates a real-time visual image representative of the relative positioning of apertures 20 and receptor pads 24 for display on screen 38. Stage assembly 32 may then be operated to move stencil 18 and substrate 22 relative to each other until image generated by camera 36 indicates that apertures 20 and receptor pads 24 are properly aligned for screen printing of solder paste onto receptor pads 24, thereby avoiding the need for visible fiducials. The various components for x-ray system 26 may be adapted from conventional systems used for inspecting semiconductor solder joints, such as the real-time x-ray imaging system manufactured by CR Technologies of Aliso Viejo, Calif.
  • The real-time x-ray system 26 of the present invention is capable of aligning the gold plated receptor pads 24 of five microns or less disposed upon a low light contrast ceramic (9011 alumina) substrate 22, as seen in FIG. 4, with a screen printing stencil 18 having very small apertures 20 of less than 125 microns, as seen in FIG. 5. Referring to FIG. 6, apertures 20 of stencil 18 have been properly aligned with pads 24 of substrate 20 based on the visual x-ray information provided on display screen 38 so that screen printing of solder paste may commence.
  • Referring to FIG. 7, the method 40 of proper alignment of stencil 18 and substrate 22 begins with the step 42 of affixing stencil 18 and substrate 22 to stage assembly 32. X-ray system 26 is then activated 44, resulting in the generating real-time images of stencil 18 and substrate 22 which may be viewed 46 on screen 38. At decisional block 48, a decision is made whether stencil 18 and substrate 22 are in proper alignment. If not, stage assembly 32 is operated 50 to move stencil 18 relative to substrate 22 and the real-time image on screen 38 is viewed and the alignment checked 48 again. If stencil 18 and substrate 22 are aligned, the screen solder printing process may begin 52. Decisional block 48 may be implemented manually by a user viewing stencil 18 and substrate 22 by then activating the appropriate moveable carriages of stage assembly 32. Decisional block 48 may also be implemented automatically by using a microprocessor that is programmed with the image processing software available in conventional visual systems and interconnected to stage assembly 32 to move stencil 18 and substrate 22 into alignment.

Claims (10)

1. A system for aligning a screen having apertures for printing of solder bumps onto the receptor pads of a substrate, comprising:
a stage assembly including means for moving said screen relative to said substrate;
an x-ray generator for beaming x-rays through said screen and said substrate;
a detector for collecting x-rays passing through said screen and said substrate; and
a camera interconnected to said detector for generating a real-time image of said screen and said substrate based on x-rays passing through said screen and said substrate.
2. The system of claim 1, wherein said printing screen is a fine pitch printing screen having apertures of less than approximately 125 microns.
3. The system of claim 1, wherein said receptor pads comprise flip chip pads.
4. The system of claim 1, wherein said receptor pads are gold plated.
5. The system of claim 1, wherein said substrate is low contrast.
6. The system of claim 1, wherein said receptor pads are spaced no more than approximately 5 microns from one another and said screen has a fine pitch of less than approximately 125 microns.
7. The system of claim 6, wherein said receptor pads comprise flip chip pads.
8. The system of claim 6, wherein said receptor pads are gold plated.
9. The system of claim 6, wherein said substrate is low contrast.
10. A system for aligning a screen having apertures for printing of solder bumps onto the receptor pads of a substrate, comprising:
a motorized stage assembly including a carriage having a side clamping mechanism for retaining said screen and said substrate and for moving said screen relative to said substrate;
an x-ray generator for beaming x-rays through said screen and said substrate; a steering element for directing x-rays beamed by said x-ray generator at said screen and said substrate;
a detector for collecting x-rays passing through said screen and said substrate;
a x-ray sensitive camera interconnected to said detector for generating a real-time image of said screen and said substrate based on x-rays passing through said screen and said substrate; and
a display for displaying said images of said screen and said substrate in real-time, wherein said images are displayed at sufficient magnification to enable receptor pads spaced apart by a distance of no more than 5 microns to be distinguishable from apertures of a diameter of no greater than 125 microns formed in said screen.
US11/758,961 2002-08-13 2007-06-06 X-Ray Alignment System For Fabricating Electronic Chips Abandoned US20080043909A1 (en)

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US10/217,920 US20040032931A1 (en) 2002-08-13 2002-08-13 X-ray alignment system for fabricaing electronic chips
US11/124,653 US7270478B2 (en) 2002-08-13 2005-05-09 X-ray alignment system for fabricating electronic chips
US11/758,961 US20080043909A1 (en) 2002-08-13 2007-06-06 X-Ray Alignment System For Fabricating Electronic Chips

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US11/124,653 Expired - Fee Related US7270478B2 (en) 2002-08-13 2005-05-09 X-ray alignment system for fabricating electronic chips
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US8694183B1 (en) 2011-12-06 2014-04-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Partial automated alignment and integration system
US9739727B2 (en) 2015-01-21 2017-08-22 The Boeing Company Systems and methods for aligning an aperture
US20200402871A1 (en) * 2019-06-24 2020-12-24 Magic Leap, Inc. Polymer patterned disk stack manufacturing
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US7270478B2 (en) 2007-09-18
US20040032931A1 (en) 2004-02-19
JP2004078201A (en) 2004-03-11
US20050194427A1 (en) 2005-09-08

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