US20070091320A1 - Methods and apparatus for inspecting an object - Google Patents
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- US20070091320A1 US20070091320A1 US11/256,866 US25686605A US2007091320A1 US 20070091320 A1 US20070091320 A1 US 20070091320A1 US 25686605 A US25686605 A US 25686605A US 2007091320 A1 US2007091320 A1 US 2007091320A1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
Definitions
- This application relates generally to inspecting objects, and more specifically to methods and apparatus for inspecting objects using a light measurement system.
- Objects are sometimes inspected, for example, to determine a size and/or shape of all or a portion of the object and/or to detect defects in the object.
- some gas turbine engine components such as turbine or compressor blades, are inspected to detect fatigue cracks that may be caused by vibratory, mechanical, and/or thermal stresses induced to the engine.
- some gas turbine engine blades are inspected for deformations such as platform orientation, contour cross-section, bow and twist along a stacking axis, thickness, and/or chord length at given cross-sections.
- deformations such as platform orientation, contour cross-section, bow and twist along a stacking axis, thickness, and/or chord length at given cross-sections.
- continued operation of the object with one or more defects may reduce performance of the object and/or lead to object failures, for example, as cracks propagate through the object. Accordingly, detecting defects of the object as early as possible may facilitate increasing the performance of the object and/or reducing object failures.
- At least some objects are inspected using a light measurement system that projects a structured light pattern onto a surface of the object.
- the light measurement system images the structured light pattern reflected from the surface of the object and then analyzes the deformation of the reflected light pattern to calculate the surface features of the object.
- the object to be inspected is typically coupled to a test fixture and positioned proximate to the light measurement system.
- a light source is then activated such that emitted light illuminates the object to be inspected.
- a resultant image of the object may include noise caused by multiple bounce reflections of the emitted light. Such noise may result in reduced image quality and poor measurement results, possibly leading to an incorrect interpretation of surface features of the object.
- multiple bounce reflections may be caused by inter-reflections between the object and portions of the test fixture illuminated by the light source. For example, multiple bounce reflections may be caused if the test fixture has a shape or finish that casts reflections on the object, and/or if the object has a relatively mirror-like finish that reflects an image of the test fixture.
- a method for inspecting an object.
- the method includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.
- LCD liquid crystal display
- LCOS liquid crystal on silicon
- a method for inspecting an object.
- the method includes emitting a first sinusoidal fringe pattern of light from at least one of a liquid crystal display (LCD) device and liquid crystal on silicon (LCOS) device, emitting a second sinusoidal fringe pattern of light from at least one of the LCD device and the LCOS device, wherein the second sinusoidal fringe pattern is phase-shifted with respect to the first sinusoidal fringe pattern, projecting the first and second sinusoidal fringe patterns onto a surface of the object, receiving light reflected from the object surface using the imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.
- LCD liquid crystal display
- LCOS liquid crystal on silicon
- a structured light measurement system for inspecting an object includes at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device configured to project structured light onto a surface of the object, and a computer operatively connected to the at least one of the LCD device and the LCOS device.
- the computer is configured to phase-shift light emitted from the at least one of the LCD device and the LCOS device.
- the system also includes an imaging sensor configured to receive structured light reflected from the object surface.
- FIG. 1 is a block diagram of an exemplary embodiment of a structured light measurement system.
- FIG. 2 is a side sectional view of an object under inspection, illustrating single and multiple bounce light paths.
- FIG. 3 is a flow chart illustrating an exemplary method for inspecting an object using the structured light measurement system shown in FIG. 1 .
- FIG. 1 is a block diagram of an exemplary embodiment of a structured light measurement system 10 that is used to measure a plurality of surface features of an object 12 .
- system 10 may be used to inspect and determine surfaces of object 12 , wherein the surfaces may include features such as tilts, bends, twists, and/or warps when compared to a model representative of object 12 .
- object 12 is a rotor blade, such as, but not limited to, a compressor or a turbine blade utilized in a turbine engine. Accordingly, and in the exemplary embodiment, object 12 includes an airfoil 14 extending outwardly from a platform 16 . While the following description is directed to inspecting gas turbine engine blades, one skilled in the art will appreciate that inspection system 10 may be utilized to improve structured light imaging for any object.
- System 10 also includes a structured light source 22 that is a liquid crystal display (LCD) projector and/or a liquid crystal on silicon (LCOS) projector. Although other patterns may be used, in some embodiments light source 22 projects a sinusoidal fringe pattern onto object 12 .
- System 10 also includes one or more imaging sensors 24 that receive structured light reflected from object 12 .
- imaging sensor 24 is a camera that receives and creates images using structured light reflected from object 12 , although other imaging sensors 24 may be used.
- One or more computers 26 are operatively connected to imaging sensors 24 to process images received therefrom, and a monitor 28 may be utilized to display information to an operator.
- computer(s) 26 include a device 30 , for example, a floppy disk drive, CD-ROM drive, DVD drive, magnetic optical disk (MOD) device, and/or any other digital device including a network connecting device such as an Ethernet device for reading instructions and/or data from a computer-readable medium 32 , such as a floppy disk, a CD-ROM, a DVD, and/or another digital source such as a network or the Internet, as well as yet to be developed digital means.
- computer(s) 26 execute instructions stored in firmware (not shown).
- Computer(s) 26 are programmed to perform functions described herein, and as used herein, the term computer is not limited to just those integrated circuits referred to in the art as computers, but broadly refers to computers, processors, microcontrollers, microcomputers, programmable logic controllers, application specific integrated circuits, and other programmable circuits, and these terms are used interchangeably herein.
- FIG. 2 is a side sectional view of object 12 .
- an object to be inspected for example object 12
- object 12 is coupled to a test fixture (not shown) and positioned proximate to system 10 .
- object 12 is orientated relative to light source 22 (shown in FIG. 1 ) with an angle ⁇ acute over ( ⁇ ) ⁇ of orientation that enables a view to be presented to imaging sensors 24 (shown in FIG. 1 ) such that a plane ⁇ defined by light source 22 and imaging sensors 24 substantially bisects one or more prismatic features of object 12 .
- airfoil 14 and platform 16 each define a prismatic feature of object 12 .
- Light source 22 is then activated causing emitted light to illuminate object 12 .
- Imaging sensors 24 obtain an image of the emitted light pattern projected onto object 12 .
- a resultant image of object 12 may include noise caused by multiple bounce reflections of the emitted light. Such noise may result in a reduced image quality and poor measurement results, possibly leading to an incorrect interpretation of surface features of object 12 .
- light reflected off of prismatic surfaces (e.g., intersecting surfaces of airfoil 14 and platform 16 ) of object 12 may cause multiple bounce reflections, as illustrated in FIG. 2 .
- Directly reflected light paths, sometimes referred to as single bounce reflections, are indicated as SB in FIG. 2
- multiple bounce reflections are indicated as MB in FIG. 2 .
- multiple bounce reflections MB may be caused by inter-reflections between object 12 and portions of the test fixture illuminated by light source 22 .
- multiple bounce reflections MB may be created if the test fixture has a shape or finish that casts reflections on object 12 , and/or if object 12 has a relatively mirror-like finish that reflects an image of the test fixture.
- computer(s) 26 are operatively connected to light source 22 and configured to phase shift light emitted from light source 22 . More specifically, computer(s) 26 change the initial phase of the pattern of light emitted by light source 22 , and imaging sensor 24 captures the resulting sequential images of different phase.
- Computer(s) 26 then analyzes the light reflected from object 12 to facilitate inspecting object 12 , such as, but not limited to, identifying reflections from single bounce SB light and/or multiple bounce MB light, identifying a surface texture, identifying a surface orientation, identifying a material used in fabricating object 12 , determining a platform orientation, determining a contour cross-section, determining a bow, determining a twist, determining a thickness, determining a chord length, determining a shim, and/or determining an edge of object 12 .
- computer(s) 26 perform phase wrapping and/or unwrapping on light reflected from object 12 and received by imaging sensor 24 to determine a phase map.
- system 10 includes a plurality of imaging sensors 24 , each orientated differently with respect to object 12 , to facilitate receiving light reflected from object 12 at different angles 34 and 36 .
- Each of the plurality of imaging sensors 24 may receive light reflected from object 12 at a different phase shift, or each imaging sensor 24 may receive a sequence of images of different phase simultaneously, to facilitate inspecting object 12 .
- multiple images from different angles may facilitate determining an edge of object 12 using known edge detection methods, such as, but not limited to, edge detecting methods as described in U.S. Pat. No. 6,876,459.
- phase shifting of light emitted from light source 22 is performed by a computer (not shown) that is a component of light source 22 .
- analyzing light received by imaging sensors 24 is performed by a computer (not shown) that is a component of light source 22 .
- FIG. 3 is a flow chart illustrating an exemplary embodiment of a method 38 for inspecting object 12 (shown in FIGS. 1 and 2 ) using structured light measurement system 10 (shown in FIG. 1 ).
- Method 38 includes emitting 40 light from light source 22 and phase-shifting 42 light emitted from light source 22 .
- a first pattern of light is emitted by light source 22
- a series of other patterns of light emitted by light source 22 are phase-shifted with respect to the first pattern and emitted by light source 22 .
- emitting 40 light from light source 22 includes emitting a sinusoidal fringe pattern of light.
- light source 22 (for example using a computer that forms a component of light source 22 ) is used to phase-shift 42 light emitted therefrom.
- the phase-shifted patterns of light are projected 44 onto a surface of object 12 .
- Light reflected from object 12 is received 46 by imaging sensor(s) 24 and images are created 48 therefrom using imaging sensor 24 and/or computer 26 .
- the images are then analyzed 50 to identify 52 single bounce reflections SB, multiple bounce reflections MB, and/or features of object 12 .
- reflections from single bounce SB light, multiple bounce MB light, or other variations are readily identified and selectively extracted from the images using conventional image processing techniques, such as, but not limited to, subtraction or difference imaging between two images, masking of certain areas of an image, as well as correlations of image information.
- image processing techniques such as, but not limited to, subtraction or difference imaging between two images, masking of certain areas of an image, as well as correlations of image information.
- image processing techniques such as, but not limited to, subtraction or difference imaging between two images, masking of certain areas of an image, as well as correlations of image information.
- image processing techniques permit one image to be “subtracted” from the other, so to obtaining a resulting difference image.
- This resulting difference image includes only information on those regions in the field of view which have changed between the first and second images.
- regions in an image known to contain erroneous or irrelevant information may be digitally masked or blocked from further processing. For example, using subtraction techniques, regions of an image containing background can be identified in a difference image, and then utilized to mask out background regions in subsequent or current or subsequent images.
- an image of object 12 undergoing measurement may be correlated or registered to a stored reference image, facilitating identification of differences between object 12 and a representation of object 12 .
- features of object 12 such as, but not limited to, surface texture, surface orientation, and a material used in fabricating object 12 can be readily identified from the image created by light reflected from the object using conventional image processing techniques, such as, but not limited to, phase-shifting techniques.
- identifying features of object 12 includes, but is not limited to, identifying a surface texture, identifying a surface orientation, identifying a material used in fabricating object 12 , determining a platform orientation, determining a contour cross-section, determining a bow, determining a twist, determining a thickness, determining a chord length, determining a shim, and/or determining an edge of object 12 .
- the above-described structured light measurement system 10 may facilitate inspecting object 12 more quickly and efficiently. More specifically, by phase-shifting light projected onto object 12 , multiple images of object 12 can be analyzed to inspect object 12 . Accordingly, multiple bounce reflections MB and/or features of object 12 can be determined using light reflected from object 12 . Moreover, structured light measurement system 10 may facilitate identifying, reducing, and/or eliminating image noise, such as, but not limited to, multiple bounce reflections MB, simultaneously with determining features of object 12 . A technical effect of the methods and systems described and/or illustrated herein includes facilitating identifying, reducing, and/or eliminating image noise, such as, but not limited to, multiple bounce reflections MB, simultaneously with determining features of object 12 .
- the articles “a”, “an”, “the” and “said” are intended to mean that there are one or more of the element(s)/component(s)/etc.
- the terms “comprising”, “including” and “having” are intended to be inclusive and mean that there may be additional element(s)/component(s)/etc. other than the listed element(s)/component(s)/etc.
Abstract
Description
- This application relates generally to inspecting objects, and more specifically to methods and apparatus for inspecting objects using a light measurement system.
- Objects are sometimes inspected, for example, to determine a size and/or shape of all or a portion of the object and/or to detect defects in the object. For example, some gas turbine engine components, such as turbine or compressor blades, are inspected to detect fatigue cracks that may be caused by vibratory, mechanical, and/or thermal stresses induced to the engine. Moreover, and for example, some gas turbine engine blades are inspected for deformations such as platform orientation, contour cross-section, bow and twist along a stacking axis, thickness, and/or chord length at given cross-sections. Over time, continued operation of the object with one or more defects may reduce performance of the object and/or lead to object failures, for example, as cracks propagate through the object. Accordingly, detecting defects of the object as early as possible may facilitate increasing the performance of the object and/or reducing object failures.
- To facilitate inspecting objects, at least some objects are inspected using a light measurement system that projects a structured light pattern onto a surface of the object. The light measurement system images the structured light pattern reflected from the surface of the object and then analyzes the deformation of the reflected light pattern to calculate the surface features of the object. More specifically, during operation, the object to be inspected is typically coupled to a test fixture and positioned proximate to the light measurement system. A light source is then activated such that emitted light illuminates the object to be inspected. However, a resultant image of the object may include noise caused by multiple bounce reflections of the emitted light. Such noise may result in reduced image quality and poor measurement results, possibly leading to an incorrect interpretation of surface features of the object. For example, light reflected off of prismatic surfaces of the object may cause multiple bounce reflections. Moreover, and for example, multiple bounce reflections may be caused by inter-reflections between the object and portions of the test fixture illuminated by the light source. For example, multiple bounce reflections may be caused if the test fixture has a shape or finish that casts reflections on the object, and/or if the object has a relatively mirror-like finish that reflects an image of the test fixture.
- In one aspect, a method is provided for inspecting an object. The method includes emitting light from at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device, phase-shifting light emitted from at least one of the LCD device and the LCOS device, projecting the phase-shifted light onto a surface of an object, receiving light reflected from the object surface with an imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.
- In another aspect, a method is provided for inspecting an object. The method includes emitting a first sinusoidal fringe pattern of light from at least one of a liquid crystal display (LCD) device and liquid crystal on silicon (LCOS) device, emitting a second sinusoidal fringe pattern of light from at least one of the LCD device and the LCOS device, wherein the second sinusoidal fringe pattern is phase-shifted with respect to the first sinusoidal fringe pattern, projecting the first and second sinusoidal fringe patterns onto a surface of the object, receiving light reflected from the object surface using the imaging sensor, and analyzing the light received by the imaging sensor to facilitate inspecting at least a portion of the object.
- In another aspect, a structured light measurement system for inspecting an object includes at least one of a liquid crystal display (LCD) device and a liquid crystal on silicon (LCOS) device configured to project structured light onto a surface of the object, and a computer operatively connected to the at least one of the LCD device and the LCOS device. The computer is configured to phase-shift light emitted from the at least one of the LCD device and the LCOS device. The system also includes an imaging sensor configured to receive structured light reflected from the object surface.
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FIG. 1 is a block diagram of an exemplary embodiment of a structured light measurement system. -
FIG. 2 is a side sectional view of an object under inspection, illustrating single and multiple bounce light paths. -
FIG. 3 is a flow chart illustrating an exemplary method for inspecting an object using the structured light measurement system shown inFIG. 1 . -
FIG. 1 is a block diagram of an exemplary embodiment of a structuredlight measurement system 10 that is used to measure a plurality of surface features of anobject 12. For example,system 10 may be used to inspect and determine surfaces ofobject 12, wherein the surfaces may include features such as tilts, bends, twists, and/or warps when compared to a model representative ofobject 12. - In the exemplary embodiment,
object 12 is a rotor blade, such as, but not limited to, a compressor or a turbine blade utilized in a turbine engine. Accordingly, and in the exemplary embodiment,object 12 includes anairfoil 14 extending outwardly from aplatform 16. While the following description is directed to inspecting gas turbine engine blades, one skilled in the art will appreciate thatinspection system 10 may be utilized to improve structured light imaging for any object. -
System 10 also includes a structuredlight source 22 that is a liquid crystal display (LCD) projector and/or a liquid crystal on silicon (LCOS) projector. Although other patterns may be used, in someembodiments light source 22 projects a sinusoidal fringe pattern ontoobject 12.System 10 also includes one ormore imaging sensors 24 that receive structured light reflected fromobject 12. In the exemplary embodiment,imaging sensor 24 is a camera that receives and creates images using structured light reflected fromobject 12, althoughother imaging sensors 24 may be used. One ormore computers 26 are operatively connected toimaging sensors 24 to process images received therefrom, and amonitor 28 may be utilized to display information to an operator. In one embodiment, computer(s) 26 include adevice 30, for example, a floppy disk drive, CD-ROM drive, DVD drive, magnetic optical disk (MOD) device, and/or any other digital device including a network connecting device such as an Ethernet device for reading instructions and/or data from a computer-readable medium 32, such as a floppy disk, a CD-ROM, a DVD, and/or another digital source such as a network or the Internet, as well as yet to be developed digital means. In another embodiment, computer(s) 26 execute instructions stored in firmware (not shown). Computer(s) 26 are programmed to perform functions described herein, and as used herein, the term computer is not limited to just those integrated circuits referred to in the art as computers, but broadly refers to computers, processors, microcontrollers, microcomputers, programmable logic controllers, application specific integrated circuits, and other programmable circuits, and these terms are used interchangeably herein. -
FIG. 2 is a side sectional view ofobject 12. During operation, an object to be inspected, forexample object 12, is coupled to a test fixture (not shown) and positioned proximate tosystem 10. In some embodiments,object 12 is orientated relative to light source 22 (shown inFIG. 1 ) with an angle {acute over (α)} of orientation that enables a view to be presented to imaging sensors 24 (shown inFIG. 1 ) such that a plane β defined bylight source 22 andimaging sensors 24 substantially bisects one or more prismatic features ofobject 12. For example, in the exemplary embodiment,airfoil 14 andplatform 16 each define a prismatic feature ofobject 12. -
Light source 22 is then activated causing emitted light to illuminateobject 12.Imaging sensors 24 obtain an image of the emitted light pattern projected ontoobject 12. However, a resultant image ofobject 12 may include noise caused by multiple bounce reflections of the emitted light. Such noise may result in a reduced image quality and poor measurement results, possibly leading to an incorrect interpretation of surface features ofobject 12. For example, light reflected off of prismatic surfaces (e.g., intersecting surfaces ofairfoil 14 and platform 16) ofobject 12 may cause multiple bounce reflections, as illustrated inFIG. 2 . Directly reflected light paths, sometimes referred to as single bounce reflections, are indicated as SB inFIG. 2 , and multiple bounce reflections are indicated as MB inFIG. 2 . Moreover, and for example, multiple bounce reflections MB may be caused by inter-reflections betweenobject 12 and portions of the test fixture illuminated bylight source 22. For example, multiple bounce reflections MB may be created if the test fixture has a shape or finish that casts reflections onobject 12, and/or ifobject 12 has a relatively mirror-like finish that reflects an image of the test fixture. - To identify features of
object 12 and/or multiple bounce reflections MB, computer(s) 26 are operatively connected tolight source 22 and configured to phase shift light emitted fromlight source 22. More specifically, computer(s) 26 change the initial phase of the pattern of light emitted bylight source 22, andimaging sensor 24 captures the resulting sequential images of different phase. Computer(s) 26 then analyzes the light reflected fromobject 12 to facilitate inspectingobject 12, such as, but not limited to, identifying reflections from single bounce SB light and/or multiple bounce MB light, identifying a surface texture, identifying a surface orientation, identifying a material used in fabricatingobject 12, determining a platform orientation, determining a contour cross-section, determining a bow, determining a twist, determining a thickness, determining a chord length, determining a shim, and/or determining an edge ofobject 12. In some embodiments, computer(s) 26 perform phase wrapping and/or unwrapping on light reflected fromobject 12 and received byimaging sensor 24 to determine a phase map. Moreover, in some embodiments, computer(s) 26 calculate a three-dimensional shape, sometimes referred to as a three-dimensional point cloud, of at least a portion ofobject 12 using the determined phase map. In some embodiments,system 10 includes a plurality ofimaging sensors 24, each orientated differently with respect toobject 12, to facilitate receiving light reflected fromobject 12 atdifferent angles imaging sensors 24 may receive light reflected fromobject 12 at a different phase shift, or eachimaging sensor 24 may receive a sequence of images of different phase simultaneously, to facilitate inspectingobject 12. For example, multiple images from different angles may facilitate determining an edge ofobject 12 using known edge detection methods, such as, but not limited to, edge detecting methods as described in U.S. Pat. No. 6,876,459. - Although computer(s) 26 are described herein as performing various functions, such as phase-shifting light emitted from
light source 22 and analyzing light received byimaging sensors 24, it should be understood that any of these functions may be performed by other computers. For example, in some embodiments, phase shifting of light emitted fromlight source 22 is performed by a computer (not shown) that is a component oflight source 22. Moreover, and for example, in some embodiments, analyzing light received byimaging sensors 24 is performed by a computer (not shown) that is a component oflight source 22. -
FIG. 3 is a flow chart illustrating an exemplary embodiment of amethod 38 for inspecting object 12 (shown inFIGS. 1 and 2 ) using structured light measurement system 10 (shown inFIG. 1 ).Method 38 includes emitting 40 light fromlight source 22 and phase-shifting 42 light emitted fromlight source 22. For example, in some embodiments a first pattern of light is emitted bylight source 22, and a series of other patterns of light emitted bylight source 22 are phase-shifted with respect to the first pattern and emitted bylight source 22. In some embodiments, emitting 40 light fromlight source 22 includes emitting a sinusoidal fringe pattern of light. Moreover, in some embodiments, light source 22 (for example using a computer that forms a component of light source 22) is used to phase-shift 42 light emitted therefrom. The phase-shifted patterns of light are projected 44 onto a surface ofobject 12. Light reflected fromobject 12 is received 46 by imaging sensor(s) 24 and images are created 48 therefrom usingimaging sensor 24 and/orcomputer 26. The images are then analyzed 50 to identify 52 single bounce reflections SB, multiple bounce reflections MB, and/or features ofobject 12. - For example, reflections from single bounce SB light, multiple bounce MB light, or other variations, are readily identified and selectively extracted from the images using conventional image processing techniques, such as, but not limited to, subtraction or difference imaging between two images, masking of certain areas of an image, as well as correlations of image information. For example, it is known that if two or more. images of
object 12 are obtained and are correlated such that they have common reference points or are from the same position and orientation, digital processing techniques permit one image to be “subtracted” from the other, so to obtaining a resulting difference image. This resulting difference image includes only information on those regions in the field of view which have changed between the first and second images. Moreover, with prior knowledge of the shape or configuration ofobject 12, or two or more images, specific regions in an image known to contain erroneous or irrelevant information may be digitally masked or blocked from further processing. For example, using subtraction techniques, regions of an image containing background can be identified in a difference image, and then utilized to mask out background regions in subsequent or current or subsequent images. Similarly, using known information or multiple images, an image ofobject 12 undergoing measurement may be correlated or registered to a stored reference image, facilitating identification of differences betweenobject 12 and a representation ofobject 12. - Moreover, and for example, features of
object 12, such as, but not limited to, surface texture, surface orientation, and a material used in fabricatingobject 12 can be readily identified from the image created by light reflected from the object using conventional image processing techniques, such as, but not limited to, phase-shifting techniques. In some embodiments, identifying features ofobject 12 includes, but is not limited to, identifying a surface texture, identifying a surface orientation, identifying a material used in fabricatingobject 12, determining a platform orientation, determining a contour cross-section, determining a bow, determining a twist, determining a thickness, determining a chord length, determining a shim, and/or determining an edge ofobject 12. - The above-described structured
light measurement system 10 may facilitate inspectingobject 12 more quickly and efficiently. More specifically, by phase-shifting light projected ontoobject 12, multiple images ofobject 12 can be analyzed to inspectobject 12. Accordingly, multiple bounce reflections MB and/or features ofobject 12 can be determined using light reflected fromobject 12. Moreover, structuredlight measurement system 10 may facilitate identifying, reducing, and/or eliminating image noise, such as, but not limited to, multiple bounce reflections MB, simultaneously with determining features ofobject 12. A technical effect of the methods and systems described and/or illustrated herein includes facilitating identifying, reducing, and/or eliminating image noise, such as, but not limited to, multiple bounce reflections MB, simultaneously with determining features ofobject 12. - Although the systems and methods described and/or illustrated herein are described and/or illustrated with respect to gas turbine engine components, and more specifically an engine blade for a gas turbine engine, practice of the systems and methods described and/or illustrated herein is not limited to gas turbine engine blades, nor gas turbine engine components generally. Rather, the systems and methods described and/or illustrated herein are applicable to any object.
- Exemplary embodiments of systems and methods are described and/or illustrated herein in detail. The systems and methods are not limited to the specific embodiments described herein, but rather, components of each system, as well as steps of each method, may be utilized independently and separately from other components and steps described herein. Each component, and each method step, can also be used in combination with other components and/or method steps.
- When introducing elements/components/etc. of the assemblies and methods described and/or illustrated herein, the articles “a”, “an”, “the” and “said” are intended to mean that there are one or more of the element(s)/component(s)/etc. The terms “comprising”, “including” and “having” are intended to be inclusive and mean that there may be additional element(s)/component(s)/etc. other than the listed element(s)/component(s)/etc.
- While the invention has been described in terms of various specific embodiments, those skilled in the art will recognize that the invention can be practiced with modification within the spirit and scope of the claims.
Claims (20)
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Also Published As
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JP5150085B2 (en) | 2013-02-20 |
JP2007121294A (en) | 2007-05-17 |
US7898651B2 (en) | 2011-03-01 |
EP1777491B1 (en) | 2008-12-24 |
CN1955719A (en) | 2007-05-02 |
CN1955719B (en) | 2011-06-08 |
DE602006004418D1 (en) | 2009-02-05 |
EP1777491A1 (en) | 2007-04-25 |
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