US20050249252A1 - Method and apparatus for digital signal processing enhanced laser performance compensation - Google Patents

Method and apparatus for digital signal processing enhanced laser performance compensation Download PDF

Info

Publication number
US20050249252A1
US20050249252A1 US11/111,335 US11133505A US2005249252A1 US 20050249252 A1 US20050249252 A1 US 20050249252A1 US 11133505 A US11133505 A US 11133505A US 2005249252 A1 US2005249252 A1 US 2005249252A1
Authority
US
United States
Prior art keywords
signal
noise
test signal
laser
level test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/111,335
Inventor
Jorge Sanchez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OL Security LLC
Original Assignee
Ceyx Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ceyx Technology Inc filed Critical Ceyx Technology Inc
Priority to US11/111,335 priority Critical patent/US20050249252A1/en
Assigned to CEYX TECHNOLOGIES, INC. reassignment CEYX TECHNOLOGIES, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SANCHEZ, JORGE
Publication of US20050249252A1 publication Critical patent/US20050249252A1/en
Assigned to SILICON VALLEY BANK reassignment SILICON VALLEY BANK SUPPLEMENT TO SECURITY AGREEMENT Assignors: CEYX TECHNOLOGIES, INC.
Assigned to CEYX TECHNOLOGIES, INC. reassignment CEYX TECHNOLOGIES, INC. RELEASE Assignors: SILICON VALLEY BANK
Assigned to CEYX TECHNOLOGIES, INC. reassignment CEYX TECHNOLOGIES, INC. RELEASE Assignors: SILICON VALLEY BANK
Assigned to TECEY SOFTWARE DEVELOPMENT KG, LLC reassignment TECEY SOFTWARE DEVELOPMENT KG, LLC ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CEYX TECHNOLOGIES, INC.
Abandoned legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/50Transmitters
    • H04B10/564Power control
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/0683Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/06832Stabilising during amplitude modulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/0683Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/06835Stabilising during pulse modulation or generation
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/077Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using a supervisory or additional signal
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/075Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
    • H04B10/079Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
    • H04B10/0795Performance monitoring; Measurement of transmission parameters
    • H04B10/07955Monitoring or measuring power
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/50Transmitters
    • H04B10/501Structural aspects
    • H04B10/503Laser transmitters
    • H04B10/504Laser transmitters using direct modulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/04Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042Electrical excitation ; Circuits therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06808Stabilisation of laser output parameters by monitoring the electrical laser parameters, e.g. voltage or current
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06812Stabilisation of laser output parameters by monitoring or fixing the threshold current or other specific points of the L-I or V-I characteristics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068Stabilisation of laser output parameters
    • H01S5/06825Protecting the laser, e.g. during switch-on/off, detection of malfunctioning or degradation

Definitions

  • the presently disclosed embodiments relate generally to laser control, and more specifically to laser performance compensation for aging and temperature changes.
  • Lasers are increasingly used in systems such as high speed communications links, fiber optic channels and medical diagnostics. Market trends demand increased levels of reliability and performance in laser systems. Lasers having signals with accurate output power and signal amplitude are required to meet these performance demands.
  • output power and temperature must be accurately monitored.
  • the output power of many lasers available today is monitored with photodiodes that are integrated with the laser in a single package.
  • the photodiodes may also be a component of an integrated circuit that is associated with the laser's driver or a Vertical Cavity Surface Emitting Laser (VCSEL) array.
  • VCSEL Vertical Cavity Surface Emitting Laser
  • Photodiodes with frequency responses that are slower than the lasers they monitor can reliably measure the laser's average power output, but pose a problem in determining the amplitude of the optical pulses for transmitting information.
  • the amplitudes of optical pulses cannot be measured because the photodiode will not generate significant output in response to the Alternating Current (AC signal) output representing data transmission.
  • AC signal Alternating Current
  • an input power signal must be maintained at a fixed power level causing the system to produce a constant value of light output, which is always equal to the measurable average power value. Since the slow photodiode can't be relied upon to determine the output power of a high frequency signal, other methods have been employed. For example, one method commonly used consists of applying a signal with known amplitude to the laser transmitter while a measurement is made of the resulting output power with an instrument instead of a photodiode. The measurement instrument used is one that can respond to high frequency of light power transitions. This procedure disrupts the signal transmission preventing the transmitter from sending information over the communications channel while adjustments are carried out. Disruption in communication is contrary to the goals of high reliability and 100% up-time in present systems.
  • an intrusive power adjustment method is an approach that relies on the application of a tone signal to the laser.
  • the tone is recovered by the monitor photodiode and the recovered signal used to determine changes in laser performance.
  • This method is disadvantageous because, again, the tone disrupts the transmitted signal because the magnitude of the tone signal is of similar magnitude to the magnitude of the transmitted signal. Disruption also causes a significant reduction of the noise margin, which renders this approach inaccurate.
  • Temperature sensors are commonly utilized to determine when performance adjustments are appropriate due to changes in temperature. Conventional reliance on temperature sensors is also problematic. Temperature sensors, unlike photodiodes, are not commonly integrated with laser or driver devices. The temperature sensor must be mounted at a location external to the laser itself, producing a measurement that is poorly correlated to the actual operating temperature of the laser. The problem is then compounded when inaccurate temperature measurements are used as indexes to determine power adjustments from equally unreliable look-up tables.
  • Look-up tables are created at the factory for each laser manufactured. Each laser must have its own look-up table because the performance characteristics of each unit differ with variations in constituent parts and manufacture. This method of creating temperature lookup tables requires a costly process on the production line to heat each laser in an environmental chamber at incremental temperatures. Large numbers of test temperature samples produced by small temperature increments, which are necessary for accurate interpolation, increase the production cost. The table is populated with a bias and modulation current for each temperature tested, unique to the particular laser. Even this labor-intensive effort cannot produce an accurate table because the table cannot compensate for aging. Aging cannot be predicted ahead of time with the required level of individual precision to create a table of aging values for a given laser. In some cases, Manufacturers resort to tightening the performance specifications for the laser system so it will still perform adequately after aging degradation. The result of the tightening of the specification is a lower manufacturing yield for the components used in the laser system, which increases costs.
  • Embodiments disclosed herein address the above-stated needs by providing methods and apparatus for implementing mathematical models and digital signal processing algorithms that compensate for aging, temperature linearity, and other performance characteristics without affecting or disrupting the transmitted signal. These embodiments accurately determine laser parameters at any temperature, age, or transmission speed in a non-invasive and non-disruptive manner. Closed loop servos and feedback techniques which rely on signal processing continuously provide Extinction Rate and Optical Modulation Amplitude measurements while data is being transmitted. In addition to space and power savings, temperature sensors and Integrated Circuits for monitoring bias and modulation currents are made obsolete by the present invention.
  • a method for controlling a light emitting device including modulating a light emitting device with a noise-level test signal to produce a modulated signal output, acquiring the modulated signal from the light emitting device, extracting the noise-level test signal from the acquired signal, digitally processing the extracted noise-level test signal to calculate power control adjustments and controlling output power of the light emitting device by applying the calculated power control adjustments to the light emitting device is described.
  • a method for controlling a laser including generating a noise-level test signal having a multitude of characteristics, modulating a laser with the generated noise-level test signal to produce a modulated output signal, acquiring the modulated output signal, extracting a noise-level test signal from the acquired modulated output signal, determining a power characteristic of the extracted noise-level test signal, determining a characteristic slope of the laser from the extracted noise-level test signal, calculating a bias current adjustment from the power characteristic of the extracted noise-level test signal, calculating a modulation current adjustment from a ratio of the characteristic slope of the generated noise-level test signal to the characteristic slope of the extracted noise-level test signal, controlling a laser bias current by applying the calculated bias current adjustment to a laser driver and controlling a laser modulation current by applying the calculated modulation current adjustment to the laser driver is also described.
  • FIG. 1 is a block diagram of a conventional laser control system
  • FIG. 2 illustrates conventional variations in characteristic current with respect to laser light output power at different temperatures in accordance with conventional laser control systems
  • FIG. 3 illustrates reduced output power of transmitted waveforms with variation in temperature in accordance with conventional laser control systems
  • FIG. 4 is a high level step diagram for digital signal processing methods of laser performance compensation in accordance with the present invention.
  • FIG. 5 is a high level apparatus block diagram illustrating digital signal processing methods for laser performance compensation of FIG. 4 embodied in hardware;
  • FIG. 6 is a detailed apparatus block diagram illustrating an exemplary method of phase insensitive signal processing laser performance compensation of FIG. 4 embodied in hardware.
  • FIG. 7 is a high level block diagram illustrating an optical transmission link method for digital signal processing laser performance compensation in accordance with yet another embodiment of the present invention.
  • FIG. 8 describes the mathematics for the signal processing functions.
  • the disclosed embodiments present methods for controlling lasers or other light emitting devices to compensate for performance degradations due to temperature changes and aging without disrupting the transmission of information;
  • the disclosed embodiments describe various methods of applying mathematical models and digital signal processing algorithms to continuously calculate and execute precise output power adjustments.
  • a method for embedding a synthesized test signal in a normal data carrying signal applied to the laser system is described.
  • the magnitude of the test signal is sufficiently small that it is buried in system noise and will not alter the noise margin of the signal or the transmitted data.
  • Recovery and processing of the embedded test signal produces precisely monitored output power and signal amplitude measurements used to accurately adjust performance characteristics regardless of temperature or age.
  • Digital signal processing performance compensation methods of the present invention disclosed herein comprise phase sensitive, phase insensitive and signal sweep algorithms.
  • a digital signal processing enhanced method for optical link transmission performance compensation is also disclosed.
  • the use of fiber optic links for performing adjustments to laser characteristics is further disclosed in U.S. Pat. No. 6,446,867, entitled “ELECTRO-OPTIC INTERFACE SYSTEM AND METHOD OF OPERATION”, which is assigned to the assignee of the present invention and fully incorporated herein by reference.
  • Another method utilizing a high frequency photodiode is also disclosed.
  • Exemplary embodiments may be implemented as electronic hardware, computer software, or combinations of both.
  • the word “exemplary” is used exclusively herein to mean “serving as an example, instance, or illustration.” Any embodiment described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments.
  • FIG. 1 illustrates a conventional laser control system.
  • a typical conventional system includes an analog or mixed analog and digital Controller 113 for controlling a laser Driver 102 .
  • the Driver 102 comprises a Bias Current Generator 103 for generating a Bias Current 108 , and a Modulation Current Generator 106 for generating a Modulation Current 107 .
  • the Controller 113 applies Bias Current Control Signal 104 and Modulation Current Control Signal 105 to the Driver 102 to cause the Bias Current Generator 103 and Modulation Current Generator 106 to produce the appropriate magnitude of Bias Current 108 and Modulation Current 107 respectively.
  • the Bias Current 108 and Modulation Current 107 are applied to Laser Module 109 , which accordingly produces Light Output 110 .
  • a typical conventional Controller 113 relies on externally mounted Temperature Sensor 112 to determine when performance adjustments are appropriate due to changes in temperature, and for generating an index into factory generated lookup tables.
  • the Controller 113 relies on low frequency response Monitor Photodiode 111 to sense the average power of the Laser Module's 109 Light Output 110 .
  • FIG. 2 graphically illustrates variations in characteristic laser current with respect to laser light output power at different temperatures in accordance with conventional laser control systems illustrated by FIG. 1 .
  • Characteristic input current with respect to laser light output power 201 corresponds to a new laser at a first temperature T 1 .
  • Characteristic input current with respect to laser light output power 202 corresponds to an aged laser at a second temperature T 2 .
  • Control of the laser is initially set so that a given amount of light power and signal modulation is obtained with input current characteristic 201 .
  • the initial input current setting produces an incorrect amount of light output power and diminished signal amplitude. Incorrect low levels of light output power reduce the signal strength and signal to noise ratio of the transmitted signal. Incorrect high levels of light output power over drive the laser, shortening its life.
  • FIG. 3 graphically illustrates reduced output power of transmitted waveforms with variation in temperature 300 , in accordance with conventional laser control systems illustrated by FIG. 1 .
  • Characteristic current with respect to light output 201 corresponds to the overall laser response at Temperature T 1 , producing output having an amplitude of Light Output A 310 .
  • Characteristic current with respect to light output 202 corresponds to the overall laser response at Temperature T 2 , producing output having an amplitude of Light Output B 312 .
  • FIG. 3 shows how output amplitudes ( 310 , 312 ) vary directly with changes in the slope of the characteristic current at different temperatures. When the characteristic slope changes, the signal amplitude and average power output are diminished.
  • Threshold current is applied to a laser upon power up.
  • a laser's threshold current is the minimum current required to produce light output. However, lasers are not operated near their thresholds because doing so produces noisy unstable output. Therefore, a margin current is added to the threshold current to produce a total Bias current IB 1 302 .
  • Application of a laser's bias current 302 places the laser in its proper operating range.
  • Modulation current 107 is then added to the bias current to produce light output pulses representing data ( 310 , 312 ).
  • the slope of the current characteristic ( 201 , 202 ) is determined by its threshold and operating range. As the slope of the current characteristic changes with temperature from T 1 to T 2 , the operating range, requiring a different threshold, is also reduced. As the operating range of the laser becomes smaller with temperature drift that shifts the characteristic of the laser's response from characteristic 201 to characteristic 202 , the amplitude of the Light Output A 310 is reduced to the amplitude of Light Output B 312 . This light output reduction occurs even though the applied Modulation current 107 has not been altered.
  • Embodiments of the present invention detailed in FIGS. 4-9 enable the Temperature 1 characteristic 201 , and hence light output-A 310 , to be maintained regardless of changes in temperature or age. Characteristic drift that changes the slope of current characteristics and reduces light output is prevented by continuously and accurately monitoring and adjusting input bias and modulation current using digital signal processing techniques.
  • FIG. 4 is a high level flowchart diagram for novel digital signal processing methods of laser performance compensation 400 in accordance with various embodiments of the present invention.
  • a control path comprising a digital controller, laser driver, laser, monitor photodiode, signal conditioner and optional Analog to Digital (A/D) converter is initially calibrated.
  • Control flows to step 404 .
  • a Digital Signal Processor generates and applies a synthesized sinusoidal noise-level test signal to the laser driver.
  • Noise levels for communication systems are typically in the micro-watt range. However, a test signal of any level commensurate with a system's noise maybe applied without departing from the scope of the present invention.
  • the noise-level test signal becomes embedded in system noise as the driver modulates the bias current with the test signal and transmit data. The driver applies the modulated signal containing data, noise, and embedded test signal to the laser. Control flows to step 406 .
  • a micro-detector implemented in a DSP analyzer function acquires the embedded test signal (i.e. the noise-level test signal buried in system noise).
  • the DSP analyzer utilizes a phase sensitive lock-in detection algorithm to multiply the acquired test signal by a copy of the originally injected sinusoidal test signal.
  • the mathematical operation of multiplying two sinusoids yields a Direct Current (DC) value proportional to the amplitude of the two sinusoids divided by two times a phase factor, plus harmonics.
  • the phase factor is dependent on the phase shift between the applied test signal and the detected signal. This factor may be negligible in many cases. Multiplying the two sinusoidal signals produces the amplitude of the injected test signal, and also shifts the frequencies of the harmonics and noise such that the acquired sinusoidal test signal can be extracted by filtering it from the other unwanted components of the mathematical product.
  • the DSP analyzer functions may be embodied directly in hardware, firmware, software, or in a combination of the above. Control flows to step 408 .
  • step 408 after acquisition of the system test signal embedded in noise, the DSP analyzer applies an ultra low bandwidth low pass filter to eliminate harmonics and noise from the acquired signal.
  • the acquired noise-level test signal is extracted from the system noise and fully recovered.
  • the DSP analyzer acquires the embedded test signal utilizing a phase insensitive quadrature detection algorithm.
  • Quadrature detection advantageously eliminates a phase shift of the acquired test signal with respect to the originally applied test signal created by the sinusoidal multiplication of the previous embodiment.
  • the quadrature detection method splits the acquired signal into two signals. One signal is multiplied by a sine function term and the other signal is multiplied by a cosine function term.
  • a low pass filter is then applied to both signals to filter high frequency harmonics and noise, recovering a sinusoidal and a cosinusoidal test signal. Both signals are then squared, producing a sine squared test signal and a cosine squared test signal. Sine squared and cosine squared signals universally add to one.
  • the sine squared and cosine squared test signals are added, producing the amplitude of the acquired test signal.
  • the amplitude of the acquired test signal is the average power of the recovered test signal.
  • a gradually increasing noise-level saw tooth test signal is applied to the laser driver.
  • This saw tooth test signal incrementally increases the bias current by noise-level amounts over a very narrow region.
  • the recovered test signal is sampled to produce a set of noise-level data points as the bias current incrementally increases by miniscule amounts.
  • a linear regression, or least squares best fit, algorithm is applied to these data points to produce a characteristic line. Control flows to step 410 .
  • step 410 after recovery of the synthesized noise-level test signal, the DSP analyzer function determines the laser's characteristics by processing the recovered test signal. The efficiency slope, and threshold inflection point of the laser characteristic are determined by mathematical process. Output power control parameters are updated for use by servo function in step 414 according to the presently calculated laser characteristics.
  • Control parameters are produced for adjustment of modulation current.
  • the amplitude of the laser's modulation is determined by its characteristic slope (See FIG. 3 ).
  • modulation current adjustment parameters are calculated by determining the ratio of the slope of the originally applied test signal to the slope of the recovered test signal.
  • Control parameters are produced for adjustment of bias current by continuously monitoring the average power output of the test signal. Control flows to step 412 .
  • step 412 the updated modulation and bias current control parameters are passed to respective modulation current and bias current servo control functions.
  • a servo is a functionality used to control and maintain a given variable in a system.
  • a first element of a servo is the output variable.
  • the desired value of the output variable is the Set Point.
  • Another element of the servo is the feedback path, which measures the value of the output variable.
  • Another element of the servo is the Controller.
  • the Controller has a Set Point as an input, which determines the desired value of the output variable.
  • the Controller makes a comparison between the feedback signal and the Set Point and provided the difference to a set of programs, which contain models and algorithms used to manage the rate and characteristic profile by which adjustments of the output variable will occur.
  • the last element of the servo is the forward path, which provides the means by which the output variable can be changed.
  • the output variable is the laser power.
  • the feedback is comprised of components such as sensors (like a photodiode sensor), amplifiers and analog to digital converters.
  • the Controller is a signal-processing program, which may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above.
  • the forward path is comprised of components such as drivers, an Digital to Analog converter, and/or laser diode.
  • control parameters are passed through configuration memory.
  • control parameters are passed via a messaging protocol, and in yet another embodiment control parameters comprise electromagnetic signals.
  • a first servo control function adjusts modulation current as directed by the modulation current control parameters calculated by the DSP analyzer function in step 410 .
  • a second servo control function adjusts the bias current as directed by the bias current control parameters calculated by the DSP analyzer function in step 410 .
  • DSP algorithms of step 408 are used to compensate for operational parameters comprising linearity, aging, temperature, and wavelength tuning detection.
  • FIG. 5 is a high level apparatus block diagram illustrating an exemplary embodiment of the digital signal processing methods for laser performance compensation of FIG. 4 implemented in hardware.
  • DSP 510 in conjunction with Digital Signal Analyzer Function 511 produces a synthesized Test Signal 512 .
  • Digital signal analyzer functionality 511 may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above.
  • a software module may reside in any form of memory medium known in the art.
  • Synthesized Test Signal 512 may be generated as an analog signal, or as a digital signal and then converted to an analog signal by optional Digital to Analog Converter (DAC) 513 .
  • DAC Digital to Analog Converter
  • Adaptive Control System 501 comprises Servo functionality for instructing Driver 502 to set a specified output power level at Laser 504 , determined by Digital Signal Analyzer Functionality 511 in accordance with calculated laser characteristics. Servo functionality may utilize characteristic information stored in a configuration database to correctly determine the correct output power level. Adaptive Control System 501 directs Driver 502 to apply the correct amount of laser input current 503 to Laser 504 in order to produce the desired power level of Light Output 505 . Adaptive Control System 501 may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above.
  • Monitor Photodiode 506 measures average power of Light Output 505 to provide feedback information to Adaptive Control System 501 for maintaining the correct output power level.
  • Signal Conditioner 507 performs coarse filtering of the noise in the signal sampled by Monitor Photodiode 506 to narrow the monitored signals bandwidth and amplify the frequency band of the noise spectrum, isolating the noise and synthesized test signal from the transmitted signal.
  • A/D Converter 508 digitizes the isolated noise signal for input to Value Scaler 509 .
  • Value Scaler 509 is a mechanism by which the magnitude of the values from the recovered noise signal are changed in order to account for variation in components in the control system. Assigning a magnitude to the Value Scaler may be part of a calibration process.
  • Digital Signal Analyzer Function 511 then applies a detection algorithm to the digitized isolated noise signal that recovers the synthesized test signal from the noise.
  • Monitor Photodiode 506 is a high frequency response photo diode capable of following the square waves of modulated data.
  • Digital Signal Analyzer Function 511 performs a peak and valley detection algorithm precisely following the Output Modulation Amplitude (OMA) of the transmitted signal. Characteristic values of the laser slope efficiency and inflection point are determined from the peak and valley signal produced by Digital Signal Analyzer Function 511 , and used to adjust the power level of Light Output 505 as described above.
  • OMA Output Modulation Amplitude
  • FIG. 6 is an exemplary apparatus block diagram illustrating the noise-level test signal quadrature detection disclosed in FIG. 4 embodied directly in hardware.
  • FIG. 8 describes the mathematics for the signal processing functions.
  • Laser Driver 602 applies Modulation Current 628 , Bias Current 630 and a noise-level Test Signal 632 embedded in system noise to Laser 604 .
  • Monitor Photodiode 606 acquires a portion of Laser 604 Light Output signal containing Data 626 and Test Signal 632 .
  • Optional Transimpedance Amplifier 608 amplifies acquired exemplary light output signal: A*Sin(wt+ ⁇ 2 )+noise Where B is the amplitude of the recovered sinusoid,
  • the signal at the output of the transimpedance amplifier is split into two paths.
  • Multiplier 610 multiplies a first half of the acquired signal by sine term: A*Sin(wt+ ⁇ 1 ), generated by function generator 612 .
  • Multiplier 614 multiplies a second half of the acquired signal by cosine term: A*Cos(wt+ ⁇ 1 ), likewise generated by another section of function generator 612 .
  • the product of Multipliers 610 and 614 permit extraction of the original sinusoidal test signal from system noise and harmonics created by the multiplication.
  • Low pass filter 616 filters high frequency harmonics and noise from the sinusoidal product of Multiplier 610 , recovering a sinusoidal test signal.
  • Low pass filter 618 filters high frequency harmonics and noise from the cosinusoidal product of Multiplier 614 , recovering a cosinusoidal test signal.
  • V 3 ⁇ ( A 2 B 2 )/4 ⁇ * ⁇ Cos 2 ( ⁇ 2 ⁇ 1 ) ⁇
  • the amplitude of the recovered test signal, V 7 produced by Summing Function 622 is used to calculate adjustments to laser input bias current 630 .
  • the recovered test signal V 7 is used to calculate adjustments to input modulation current 628 . Any method of the present invention may be similarly embodied in software.
  • FIG. 7 is a high level block diagram illustrating an optical transmission link method for digital signal processing enhanced laser performance compensation in accordance with yet another embodiment of the present invention.
  • Disclosed embodiments of the present invention advantageously compensate for defects and changing characteristics of a fiber optic link while the link is in operation.
  • Referenced U.S. Pat. No. 6,446,867 describes methods of calibrating a fiber optic link for characteristic parameters using a Digital Controller and transceiver having an internal switch for closing a loop in a fiber optic transmission system. This closed loop enables information about the fiber optic link to be recovered in order to perform necessary adjustments to the laser.
  • the present invention allows these link characterizations and adjustments to be carried out in a fiber optic system while data is simultaneously transmitted.
  • a first Transceiver 701 and a Second Transceiver 704 comprise appropriate internal architecture of the digital control as described in U.S. Pat. No. 6,446,867 as well as the digital signal processing features detailed in FIGS. 4 and 5 .
  • the control system of First Transceiver 701 injects a synthesized test signal, embedded in system noise into the light output of First Transceiver 701 .
  • the synthesized test signal travels through optical fiber 702 and is detected by Second Transceiver 704 , where the signal is recovered by an embodiment of the digital signal processing detection and recovery method described above.
  • the Digital Controller in Second Transceiver 704 may detect the received synthesized test signal through a lock-in phase sensitive, quadrature phase insensitive, or linear sweep algorithm used to detect a test signal embedded in system noise as described in FIGS. 4 and 5 .
  • the information regarding the characteristic of the received signal is sent back to the First Transceiver 701 such that the laser in First Transceiver 701 is adjusted to compensate for issues in the fiber optic link 702 , optimizing signal transmission.
  • Second Transceiver 704 may also send information regarding the measurement of the received signal back to the First Transceiver 701 using the same technique.
  • DSP digital signal processor
  • ASIC application specific integrated circuit
  • FPGA field programmable gate array
  • a general purpose processor may be a microprocessor, but in the alternative, the processor may be any digital signal processor, conventional processor, controller, PC, external computer, server, microcontroller, or state machine.
  • a processor may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration.
  • a software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
  • An exemplary storage medium is coupled to the processor such that the processor can read information from, and write information to, the storage medium.
  • the storage medium may be integral to the processor.
  • the processor and the storage medium may reside in an ASIC.
  • the processor and the storage medium may reside as discrete components on a printed circuit board.

Abstract

Methods for controlling lasers or other light emitting devices to compensate for performance degradations due to temperature changes and aging without disrupting the transmission of information are presented. Disclosed embodiments describe various methods of applying mathematical models and digital signal processing algorithms to continuously calculate and execute precise output power adjustments. A synthesized test signal is injected into the normal data stream is applied to the laser system. The magnitude of the test signal is sufficiently small that it is buried in system noise and will not alter the noise margin of the signal or the transmitted data. Micro-detection, recovery and digital signal processing of the embedded test signal produces precisely monitored output power and modulation amplitude measurements used to accurately adjust performance characteristics regardless of temperature or age.

Description

    CROSS-REFERENCE TO RELATED APPLICATION
  • This application is a utility conversion of U.S. Provisional Application No. 60/564,143, filed Apr. 21, 2004, and further is a continuation-in-part of PCT patent application No. PCT/US03/00463 filed Jan. 8, 2003, which was the subject of an international search report and is now pending U.S. patent application Ser. No. 10/513,091, and PCT/US03/01032, filed Jan. 14, 2003, which was the subject of an international search report and is now pending U.S. patent application Ser. No. 10/513,105.
  • BACKGROUND
  • 1. Field
  • The presently disclosed embodiments relate generally to laser control, and more specifically to laser performance compensation for aging and temperature changes.
  • 2. Background
  • Lasers are increasingly used in systems such as high speed communications links, fiber optic channels and medical diagnostics. Market trends demand increased levels of reliability and performance in laser systems. Lasers having signals with accurate output power and signal amplitude are required to meet these performance demands.
  • Individual lasers exhibit significant variations in performance characteristics when they are newly manufactured. Additionally, all lasers substantially degrade in performance with age and changes in temperature. Performance degradation causes a reduction in output power and signal strength, resulting in decreased Signal to Noise Ratios (S/Ns) and Extinction Rates, as well as increased Bit Error Rates (BERs).
  • Communications receivers require that signals maintain acceptable signal strength and reliable operating parameters. In order to generate transmission signals that meet receiver requirements, lasers must be adjusted to compensate for individual variations and performance degradations occurring over time.
  • Various conventional methods are used to compensate for changes in laser performance characteristics. Conventional performance compensation methods have drawbacks such as communication disruption and non-optimal output power adjustments. Non-optimal power adjustments may produce inaccurate output signals that are difficult to receive, and frequently overdrive the laser, reducing its life.
  • Before adjustments can be made for performance degradations caused by aging and temperature changes, output power and temperature must be accurately monitored. The output power of many lasers available today is monitored with photodiodes that are integrated with the laser in a single package. The photodiodes may also be a component of an integrated circuit that is associated with the laser's driver or a Vertical Cavity Surface Emitting Laser (VCSEL) array. For economic reasons, it is common to utilize very slow photodiodes for monitoring the laser output. In some cases the photodiodes exhibit a frequency response that is several orders of magnitude lower than the frequency response of the laser. Photodiodes with frequency responses that are slower than the lasers they monitor can reliably measure the laser's average power output, but pose a problem in determining the amplitude of the optical pulses for transmitting information. The amplitudes of optical pulses cannot be measured because the photodiode will not generate significant output in response to the Alternating Current (AC signal) output representing data transmission.
  • In digital communications, it is necessary to monitor the amplitude of the optical pulses in order to distinguish the transmission of a logical one from the transmission of a logical zero. In both analog and digital communications, the magnitude of the optical signal represents the strength of the signal and has a direct impact on signal to noise ratio and transmission reliability. Because sensing power output with low frequency response photodiodes permits only the average power of the laser, rather than the amplitude of data transmission light pulses to be monitored, accurate power output feedback information is not available to adjust the magnitude of optical pulses representing the data. Without accurate amplitude feedback information, output power cannot be properly controlled, causing the Optical Modulation Amplitude, Extinction Ratio and BER to degrade with temperature changes as well as aging.
  • To perform an accurate power measurement with a slow photodiode, an input power signal must be maintained at a fixed power level causing the system to produce a constant value of light output, which is always equal to the measurable average power value. Since the slow photodiode can't be relied upon to determine the output power of a high frequency signal, other methods have been employed. For example, one method commonly used consists of applying a signal with known amplitude to the laser transmitter while a measurement is made of the resulting output power with an instrument instead of a photodiode. The measurement instrument used is one that can respond to high frequency of light power transitions. This procedure disrupts the signal transmission preventing the transmitter from sending information over the communications channel while adjustments are carried out. Disruption in communication is contrary to the goals of high reliability and 100% up-time in present systems.
  • Another example of an intrusive power adjustment method is an approach that relies on the application of a tone signal to the laser. The tone is recovered by the monitor photodiode and the recovered signal used to determine changes in laser performance. This method is disadvantageous because, again, the tone disrupts the transmitted signal because the magnitude of the tone signal is of similar magnitude to the magnitude of the transmitted signal. Disruption also causes a significant reduction of the noise margin, which renders this approach inaccurate.
  • Temperature sensors are commonly utilized to determine when performance adjustments are appropriate due to changes in temperature. Conventional reliance on temperature sensors is also problematic. Temperature sensors, unlike photodiodes, are not commonly integrated with laser or driver devices. The temperature sensor must be mounted at a location external to the laser itself, producing a measurement that is poorly correlated to the actual operating temperature of the laser. The problem is then compounded when inaccurate temperature measurements are used as indexes to determine power adjustments from equally unreliable look-up tables.
  • Look-up tables are created at the factory for each laser manufactured. Each laser must have its own look-up table because the performance characteristics of each unit differ with variations in constituent parts and manufacture. This method of creating temperature lookup tables requires a costly process on the production line to heat each laser in an environmental chamber at incremental temperatures. Large numbers of test temperature samples produced by small temperature increments, which are necessary for accurate interpolation, increase the production cost. The table is populated with a bias and modulation current for each temperature tested, unique to the particular laser. Even this labor-intensive effort cannot produce an accurate table because the table cannot compensate for aging. Aging cannot be predicted ahead of time with the required level of individual precision to create a table of aging values for a given laser. In some cases, Manufacturers resort to tightening the performance specifications for the laser system so it will still perform adequately after aging degradation. The result of the tightening of the specification is a lower manufacturing yield for the components used in the laser system, which increases costs.
  • Conventional methods of compensating for degradations in laser output power are inadequate because temperature and output power measurement methods rely on external physical devices that produce inaccurate feedback information. Costly labor intensive look-up tables do not produce reliable results because temperature indexes are poorly correlated to actual laser operating temperatures, and the effects of aging cannot be accurately predicted for individual lasers. Thus, there is a need in the art for improved methods of laser performance monitoring and compensation, which do not employ external measurement components and inaccurate lookup tables or disrupt transmitted data throughput.
  • SUMMARY
  • Embodiments disclosed herein address the above-stated needs by providing methods and apparatus for implementing mathematical models and digital signal processing algorithms that compensate for aging, temperature linearity, and other performance characteristics without affecting or disrupting the transmitted signal. These embodiments accurately determine laser parameters at any temperature, age, or transmission speed in a non-invasive and non-disruptive manner. Closed loop servos and feedback techniques which rely on signal processing continuously provide Extinction Rate and Optical Modulation Amplitude measurements while data is being transmitted. In addition to space and power savings, temperature sensors and Integrated Circuits for monitoring bias and modulation currents are made obsolete by the present invention.
  • Methods and circuits are presented, for simplicity, as they apply to lasers. However, similar methods and circuits applying to any type of light emitting device such as LEDs, lamps or fluorescent lights would be readily apparent to one skilled in the art.
  • Accordingly, in one aspect, a method for controlling a light emitting device including modulating a light emitting device with a noise-level test signal to produce a modulated signal output, acquiring the modulated signal from the light emitting device, extracting the noise-level test signal from the acquired signal, digitally processing the extracted noise-level test signal to calculate power control adjustments and controlling output power of the light emitting device by applying the calculated power control adjustments to the light emitting device is described.
  • In another aspect, a method for controlling a laser including generating a noise-level test signal having a multitude of characteristics, modulating a laser with the generated noise-level test signal to produce a modulated output signal, acquiring the modulated output signal, extracting a noise-level test signal from the acquired modulated output signal, determining a power characteristic of the extracted noise-level test signal, determining a characteristic slope of the laser from the extracted noise-level test signal, calculating a bias current adjustment from the power characteristic of the extracted noise-level test signal, calculating a modulation current adjustment from a ratio of the characteristic slope of the generated noise-level test signal to the characteristic slope of the extracted noise-level test signal, controlling a laser bias current by applying the calculated bias current adjustment to a laser driver and controlling a laser modulation current by applying the calculated modulation current adjustment to the laser driver is also described.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a block diagram of a conventional laser control system;
  • FIG. 2 illustrates conventional variations in characteristic current with respect to laser light output power at different temperatures in accordance with conventional laser control systems;
  • FIG. 3 illustrates reduced output power of transmitted waveforms with variation in temperature in accordance with conventional laser control systems;
  • FIG. 4 is a high level step diagram for digital signal processing methods of laser performance compensation in accordance with the present invention;
  • FIG. 5 is a high level apparatus block diagram illustrating digital signal processing methods for laser performance compensation of FIG. 4 embodied in hardware;
  • FIG. 6 is a detailed apparatus block diagram illustrating an exemplary method of phase insensitive signal processing laser performance compensation of FIG. 4 embodied in hardware; and
  • FIG. 7 is a high level block diagram illustrating an optical transmission link method for digital signal processing laser performance compensation in accordance with yet another embodiment of the present invention.
  • FIG. 8 describes the mathematics for the signal processing functions.
  • DETAILED DESCRIPTION
  • The disclosed embodiments present methods for controlling lasers or other light emitting devices to compensate for performance degradations due to temperature changes and aging without disrupting the transmission of information; The disclosed embodiments describe various methods of applying mathematical models and digital signal processing algorithms to continuously calculate and execute precise output power adjustments.
  • A method for embedding a synthesized test signal in a normal data carrying signal applied to the laser system is described. The magnitude of the test signal is sufficiently small that it is buried in system noise and will not alter the noise margin of the signal or the transmitted data. Recovery and processing of the embedded test signal produces precisely monitored output power and signal amplitude measurements used to accurately adjust performance characteristics regardless of temperature or age. Digital signal processing performance compensation methods of the present invention disclosed herein comprise phase sensitive, phase insensitive and signal sweep algorithms.
  • A digital signal processing enhanced method for optical link transmission performance compensation is also disclosed. The use of fiber optic links for performing adjustments to laser characteristics is further disclosed in U.S. Pat. No. 6,446,867, entitled “ELECTRO-OPTIC INTERFACE SYSTEM AND METHOD OF OPERATION”, which is assigned to the assignee of the present invention and fully incorporated herein by reference. Finally, another method utilizing a high frequency photodiode is also disclosed.
  • Exemplary embodiments may be implemented as electronic hardware, computer software, or combinations of both. The word “exemplary” is used exclusively herein to mean “serving as an example, instance, or illustration.” Any embodiment described herein as “exemplary” is not necessarily to be construed as preferred or advantageous over other embodiments.
  • The features, objects, and advantages of the disclosed embodiments will become more apparent from the detailed description set forth below when taken in conjunction with the drawings in which like reference characters identify correspondingly throughout and wherein:
  • FIG. 1 illustrates a conventional laser control system. A typical conventional system includes an analog or mixed analog and digital Controller 113 for controlling a laser Driver 102. The Driver 102 comprises a Bias Current Generator 103 for generating a Bias Current 108, and a Modulation Current Generator 106 for generating a Modulation Current 107. The Controller 113 applies Bias Current Control Signal 104 and Modulation Current Control Signal 105 to the Driver 102 to cause the Bias Current Generator 103 and Modulation Current Generator 106 to produce the appropriate magnitude of Bias Current 108 and Modulation Current 107 respectively. The Bias Current 108 and Modulation Current 107 are applied to Laser Module 109, which accordingly produces Light Output 110.
  • A typical conventional Controller 113 relies on externally mounted Temperature Sensor 112 to determine when performance adjustments are appropriate due to changes in temperature, and for generating an index into factory generated lookup tables. The Controller 113 relies on low frequency response Monitor Photodiode 111 to sense the average power of the Laser Module's 109 Light Output 110.
  • FIG. 2 graphically illustrates variations in characteristic laser current with respect to laser light output power at different temperatures in accordance with conventional laser control systems illustrated by FIG. 1. Characteristic input current with respect to laser light output power 201 corresponds to a new laser at a first temperature T1. Characteristic input current with respect to laser light output power 202 corresponds to an aged laser at a second temperature T2. Control of the laser is initially set so that a given amount of light power and signal modulation is obtained with input current characteristic 201. When the characteristic changes to characteristic 202 with aging and temperature variations, the initial input current setting produces an incorrect amount of light output power and diminished signal amplitude. Incorrect low levels of light output power reduce the signal strength and signal to noise ratio of the transmitted signal. Incorrect high levels of light output power over drive the laser, shortening its life.
  • FIG. 3 graphically illustrates reduced output power of transmitted waveforms with variation in temperature 300, in accordance with conventional laser control systems illustrated by FIG. 1. Characteristic current with respect to light output 201 corresponds to the overall laser response at Temperature T1, producing output having an amplitude of Light Output A 310. Characteristic current with respect to light output 202 corresponds to the overall laser response at Temperature T2, producing output having an amplitude of Light Output B 312. FIG. 3 shows how output amplitudes (310,312) vary directly with changes in the slope of the characteristic current at different temperatures. When the characteristic slope changes, the signal amplitude and average power output are diminished.
  • Threshold current is applied to a laser upon power up. A laser's threshold current is the minimum current required to produce light output. However, lasers are not operated near their thresholds because doing so produces noisy unstable output. Therefore, a margin current is added to the threshold current to produce a total Bias current IB1 302. Application of a laser's bias current 302 places the laser in its proper operating range.
  • Modulation current 107 is then added to the bias current to produce light output pulses representing data (310,312). The slope of the current characteristic (201,202) is determined by its threshold and operating range. As the slope of the current characteristic changes with temperature from T1 to T2, the operating range, requiring a different threshold, is also reduced. As the operating range of the laser becomes smaller with temperature drift that shifts the characteristic of the laser's response from characteristic 201 to characteristic 202, the amplitude of the Light Output A 310 is reduced to the amplitude of Light Output B 312. This light output reduction occurs even though the applied Modulation current 107 has not been altered.
  • Embodiments of the present invention detailed in FIGS. 4-9 enable the Temperature 1 characteristic 201, and hence light output-A 310, to be maintained regardless of changes in temperature or age. Characteristic drift that changes the slope of current characteristics and reduces light output is prevented by continuously and accurately monitoring and adjusting input bias and modulation current using digital signal processing techniques.
  • FIG. 4 is a high level flowchart diagram for novel digital signal processing methods of laser performance compensation 400 in accordance with various embodiments of the present invention. In step 402, a control path comprising a digital controller, laser driver, laser, monitor photodiode, signal conditioner and optional Analog to Digital (A/D) converter is initially calibrated. Control flows to step 404.
  • In step 404, a Digital Signal Processor (DSP) generates and applies a synthesized sinusoidal noise-level test signal to the laser driver. Noise levels for communication systems are typically in the micro-watt range. However, a test signal of any level commensurate with a system's noise maybe applied without departing from the scope of the present invention. The noise-level test signal becomes embedded in system noise as the driver modulates the bias current with the test signal and transmit data. The driver applies the modulated signal containing data, noise, and embedded test signal to the laser. Control flows to step 406.
  • In step 406, a micro-detector implemented in a DSP analyzer function acquires the embedded test signal (i.e. the noise-level test signal buried in system noise). In one embodiment, the DSP analyzer utilizes a phase sensitive lock-in detection algorithm to multiply the acquired test signal by a copy of the originally injected sinusoidal test signal. The mathematical operation of multiplying two sinusoids yields a Direct Current (DC) value proportional to the amplitude of the two sinusoids divided by two times a phase factor, plus harmonics. The phase factor is dependent on the phase shift between the applied test signal and the detected signal. This factor may be negligible in many cases. Multiplying the two sinusoidal signals produces the amplitude of the injected test signal, and also shifts the frequencies of the harmonics and noise such that the acquired sinusoidal test signal can be extracted by filtering it from the other unwanted components of the mathematical product.
  • The DSP analyzer functions may be embodied directly in hardware, firmware, software, or in a combination of the above. Control flows to step 408.
  • In step 408, after acquisition of the system test signal embedded in noise, the DSP analyzer applies an ultra low bandwidth low pass filter to eliminate harmonics and noise from the acquired signal. Thus, the acquired noise-level test signal is extracted from the system noise and fully recovered.
  • In another embodiment of steps 406 and 408, the DSP analyzer acquires the embedded test signal utilizing a phase insensitive quadrature detection algorithm. Quadrature detection advantageously eliminates a phase shift of the acquired test signal with respect to the originally applied test signal created by the sinusoidal multiplication of the previous embodiment.
  • The quadrature detection method splits the acquired signal into two signals. One signal is multiplied by a sine function term and the other signal is multiplied by a cosine function term. A low pass filter is then applied to both signals to filter high frequency harmonics and noise, recovering a sinusoidal and a cosinusoidal test signal. Both signals are then squared, producing a sine squared test signal and a cosine squared test signal. Sine squared and cosine squared signals universally add to one. The sine squared and cosine squared test signals are added, producing the amplitude of the acquired test signal. The amplitude of the acquired test signal is the average power of the recovered test signal.
  • In yet another linear sweep embodiment of steps 406 and 408 advantageous for performance compensation in VCSELS, a gradually increasing noise-level saw tooth test signal, rather than a sinusoid, is applied to the laser driver. This saw tooth test signal incrementally increases the bias current by noise-level amounts over a very narrow region. The recovered test signal is sampled to produce a set of noise-level data points as the bias current incrementally increases by miniscule amounts. A linear regression, or least squares best fit, algorithm is applied to these data points to produce a characteristic line. Control flows to step 410.
  • In step 410, after recovery of the synthesized noise-level test signal, the DSP analyzer function determines the laser's characteristics by processing the recovered test signal. The efficiency slope, and threshold inflection point of the laser characteristic are determined by mathematical process. Output power control parameters are updated for use by servo function in step 414 according to the presently calculated laser characteristics.
  • Control parameters are produced for adjustment of modulation current. The amplitude of the laser's modulation is determined by its characteristic slope (See FIG. 3). Hence, modulation current adjustment parameters are calculated by determining the ratio of the slope of the originally applied test signal to the slope of the recovered test signal.
  • Control parameters are produced for adjustment of bias current by continuously monitoring the average power output of the test signal. Control flows to step 412.
  • In step 412, the updated modulation and bias current control parameters are passed to respective modulation current and bias current servo control functions.
  • A servo is a functionality used to control and maintain a given variable in a system. A first element of a servo is the output variable. The desired value of the output variable is the Set Point. Another element of the servo is the feedback path, which measures the value of the output variable. Another element of the servo is the Controller. The Controller has a Set Point as an input, which determines the desired value of the output variable. The Controller makes a comparison between the feedback signal and the Set Point and provided the difference to a set of programs, which contain models and algorithms used to manage the rate and characteristic profile by which adjustments of the output variable will occur. The last element of the servo is the forward path, which provides the means by which the output variable can be changed.
  • In the case of an optical transceiver, the output variable is the laser power. The feedback is comprised of components such as sensors (like a photodiode sensor), amplifiers and analog to digital converters. The Controller is a signal-processing program, which may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above. The forward path is comprised of components such as drivers, an Digital to Analog converter, and/or laser diode.
  • In one embodiment, control parameters are passed through configuration memory. In another embodiment, control parameters are passed via a messaging protocol, and in yet another embodiment control parameters comprise electromagnetic signals.
  • In step 414, a first servo control function adjusts modulation current as directed by the modulation current control parameters calculated by the DSP analyzer function in step 410. A second servo control function adjusts the bias current as directed by the bias current control parameters calculated by the DSP analyzer function in step 410. Thus, the laser output signal is continuously set to conform to correct signal specifications without interrupting the transmission of data.
  • Using the basic technique of injecting a noise-level synthesized test signal comparable to the magnitude of the system noise opens a multiplicity of options for compensating the performance of a laser system. In other embodiments, DSP algorithms of step 408 are used to compensate for operational parameters comprising linearity, aging, temperature, and wavelength tuning detection.
  • FIG. 5 is a high level apparatus block diagram illustrating an exemplary embodiment of the digital signal processing methods for laser performance compensation of FIG. 4 implemented in hardware.
  • DSP 510 in conjunction with Digital Signal Analyzer Function 511 produces a synthesized Test Signal 512. Digital signal analyzer functionality 511 may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above. A software module may reside in any form of memory medium known in the art. Synthesized Test Signal 512 may be generated as an analog signal, or as a digital signal and then converted to an analog signal by optional Digital to Analog Converter (DAC) 513. Synthesized Test Signal 512 is applied to a Laser 504 by Driver 502.
  • Adaptive Control System 501, comprises Servo functionality for instructing Driver 502 to set a specified output power level at Laser 504, determined by Digital Signal Analyzer Functionality 511 in accordance with calculated laser characteristics. Servo functionality may utilize characteristic information stored in a configuration database to correctly determine the correct output power level. Adaptive Control System 501 directs Driver 502 to apply the correct amount of laser input current 503 to Laser 504 in order to produce the desired power level of Light Output 505. Adaptive Control System 501 may be embodied directly in DSP hardware, firmware, an ASIC, a software module executed by a processor, or in any combination of the above.
  • Monitor Photodiode 506 measures average power of Light Output 505 to provide feedback information to Adaptive Control System 501 for maintaining the correct output power level. Signal Conditioner 507 performs coarse filtering of the noise in the signal sampled by Monitor Photodiode 506 to narrow the monitored signals bandwidth and amplify the frequency band of the noise spectrum, isolating the noise and synthesized test signal from the transmitted signal. A/D Converter 508 digitizes the isolated noise signal for input to Value Scaler 509. Value Scaler 509 is a mechanism by which the magnitude of the values from the recovered noise signal are changed in order to account for variation in components in the control system. Assigning a magnitude to the Value Scaler may be part of a calibration process. Digital Signal Analyzer Function 511 then applies a detection algorithm to the digitized isolated noise signal that recovers the synthesized test signal from the noise.
  • Once the synthesized test signal is recovered, calculations of the slope efficiency of the laser characteristic along with the threshold inflection point are determined by Digital Signal Analyzer Function 511. New characteristic values of the laser slope efficiency and inflection point can be stored in the configuration database, for use by the servo function in adjusting the power level of Light Output 505 to a continuously corrected value.
  • In another embodiment of a digital signal processing enhanced method of performance compensation implemented in hardware, Monitor Photodiode 506 is a high frequency response photo diode capable of following the square waves of modulated data. Digital Signal Analyzer Function 511 performs a peak and valley detection algorithm precisely following the Output Modulation Amplitude (OMA) of the transmitted signal. Characteristic values of the laser slope efficiency and inflection point are determined from the peak and valley signal produced by Digital Signal Analyzer Function 511, and used to adjust the power level of Light Output 505 as described above.
  • FIG. 6 is an exemplary apparatus block diagram illustrating the noise-level test signal quadrature detection disclosed in FIG. 4 embodied directly in hardware. One skilled in the art would readily recognize that any digital signal processing method for detecting, or function for analyzing, a noise-level test signal disclosed herein may be similarly embodied solely in software without departing from the scope of the present invention. FIG. 8 describes the mathematics for the signal processing functions.
  • Laser Driver 602 applies Modulation Current 628, Bias Current 630 and a noise-level Test Signal 632 embedded in system noise to Laser 604. Monitor Photodiode 606 acquires a portion of Laser 604 Light Output signal containing Data 626 and Test Signal 632. Optional Transimpedance Amplifier 608 amplifies acquired exemplary light output signal:
    A*Sin(wt+θ2)+noise
    Where B is the amplitude of the recovered sinusoid,
      • w is the angular frequency
      • θ2 is the angular shift relative to the phase of the applied sinusoid
      • Noise is the amount of noise that the system and the apparatus adds to the signal
  • The signal at the output of the transimpedance amplifier is split into two paths. Multiplier 610 multiplies a first half of the acquired signal by sine term:
    A*Sin(wt+θ1),
    generated by function generator 612. Multiplier 614 multiplies a second half of the acquired signal by cosine term:
    A*Cos(wt+θ1),
    likewise generated by another section of function generator 612. The product of Multipliers 610 and 614 permit extraction of the original sinusoidal test signal from system noise and harmonics created by the multiplication. Low pass filter 616 filters high frequency harmonics and noise from the sinusoidal product of Multiplier 610, recovering a sinusoidal test signal. Low pass filter 618 filters high frequency harmonics and noise from the cosinusoidal product of Multiplier 614, recovering a cosinusoidal test signal.
  • Square Function 620 squares the sinusoidal test signal producing signal:
    V 3={(A 2 B 2)/4}*{Cos22−θ1)}
  • Square Function 624 squares the cosinusoidal test signal producing signal:
    V 6={(A 2 B 2)/4}*{Sin22−θ1)}
    Summing Function 622 adds the sine squared and cosine squared signals, resulting in V7, the amplitude of the recovered test signal. The amplitude of the recovered test signal, V7, produced by Summing Function 622 is used to calculate adjustments to laser input bias current 630. The recovered test signal V7 is used to calculate adjustments to input modulation current 628. Any method of the present invention may be similarly embodied in software.
  • FIG. 7 is a high level block diagram illustrating an optical transmission link method for digital signal processing enhanced laser performance compensation in accordance with yet another embodiment of the present invention. Disclosed embodiments of the present invention advantageously compensate for defects and changing characteristics of a fiber optic link while the link is in operation. Referenced U.S. Pat. No. 6,446,867 describes methods of calibrating a fiber optic link for characteristic parameters using a Digital Controller and transceiver having an internal switch for closing a loop in a fiber optic transmission system. This closed loop enables information about the fiber optic link to be recovered in order to perform necessary adjustments to the laser. The present invention allows these link characterizations and adjustments to be carried out in a fiber optic system while data is simultaneously transmitted.
  • A first Transceiver 701 and a Second Transceiver 704 comprise appropriate internal architecture of the digital control as described in U.S. Pat. No. 6,446,867 as well as the digital signal processing features detailed in FIGS. 4 and 5. The control system of First Transceiver 701 injects a synthesized test signal, embedded in system noise into the light output of First Transceiver 701.
  • The synthesized test signal travels through optical fiber 702 and is detected by Second Transceiver 704, where the signal is recovered by an embodiment of the digital signal processing detection and recovery method described above. The Digital Controller in Second Transceiver 704 may detect the received synthesized test signal through a lock-in phase sensitive, quadrature phase insensitive, or linear sweep algorithm used to detect a test signal embedded in system noise as described in FIGS. 4 and 5.
  • The information regarding the characteristic of the received signal is sent back to the First Transceiver 701 such that the laser in First Transceiver 701 is adjusted to compensate for issues in the fiber optic link 702, optimizing signal transmission. Second Transceiver 704 may also send information regarding the measurement of the received signal back to the First Transceiver 701 using the same technique.
  • One skilled in the art will understand that the ordering of steps illustrated in FIGS. 4 through 7 are not limiting. The methods are readily amended by omission or re-ordering of the steps illustrated without departing from the scope of the disclosed embodiments.
  • Thus, novel and improved methods and apparatus for Digital Signal Processing enhanced laser performance compensation have been described. Those of skill in the art would understand that information and signals may be represented using any of a variety of different technologies and techniques. For example, data, instructions, commands, information, signals, bits, symbols, and chips that may be referenced throughout the above description may be represented by voltages, currents, electromagnetic waves, magnetic fields or particles, optical fields or particles, or any combination thereof.
  • Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
  • The various illustrative logical blocks, modules, and circuits described in connection with the embodiments disclosed herein may be implemented or performed with a general purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination thereof designed to perform the functions described herein. A general purpose processor may be a microprocessor, but in the alternative, the processor may be any digital signal processor, conventional processor, controller, PC, external computer, server, microcontroller, or state machine. A processor may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration.
  • The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in RAM memory, flash memory, ROM memory, EPROM memory, EEPROM memory, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor such that the processor can read information from, and write information to, the storage medium. In the alternative, the storage medium may be integral to the processor. The processor and the storage medium may reside in an ASIC. In another alternative, the processor and the storage medium may reside as discrete components on a printed circuit board.
  • The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (14)

1. A method for controlling a light emitting device during and without disrupting data transmission, comprising:
modulating a light emitting device with a noise-level test signal embedded in a data signal to produce a modulated signal output;
acquiring the modulated signal from the light emitting device;
extracting the noise-level test signal from the acquired signal;
digitally processing the extracted noise-level test signal to calculate power control adjustments; and
controlling output power of the light emitting device by applying the calculated power control adjustments to the light emitting device.
2. A method for controlling a laser during and without disrupting data transmission, comprising:
generating a noise-level test signal having a predetermined characteristic;
generating a data signal having a predetermined characteristic;
modulating a laser with the generated noise-level test signal and the data signal to produce a modulated output signal;
acquiring the modulated output signal;
extracting a noise-level test signal from the acquired modulated output signal;
determining an average value of the extracted noise-level test signal;
determining a characteristic of the extracted noise-level test signal;
calculating a bias current adjustment from the characteristic of the extracted noise-level test signal;
calculating a modulation current adjustment from a ratio of the characteristic of the generated noise-level test signal to the characteristic slope of the extracted noise-level test signal;
controlling a laser bias current by applying the calculated bias current adjustment to a laser driver; and
controlling a laser modulation current by applying the calculated modulation current adjustment to the laser driver.
3. The method of claim 2 wherein the noise-level test signal is a sinusoidal signal.
4. The method of claim 2 wherein the noise-level test signal is a saw tooth signal.
5. The method of claim 2 where the noise-level test signal is a composite signal.
6. The method of claim 2 wherein the noise-level test signal is extracted by applying a digital signal processing lock-in detector algorithm and filtering to the acquired modulated output signal.
7. The method of claim 2 wherein the noise-level test signal is extracted by a applying a digital signal processing quadrature detector algorithm and filtering to the acquired modulated output signal.
8. The method of claim 2 wherein the noise-level test signal is extracted by a applying a digital signal processing regression detector algorithm and filtering to the acquired modulated output signal.
9. An apparatus for controlling a laser during and without disrupting data transmission, comprising:
a laser driver for modulating the laser with a noise-level test signal embedded in a data signal to produce a modulated output signal from the laser;
a monitor photodiode for acquiring the modulated signal from the laser;
a digital signal processor for extracting a noise-level test signal from the acquired signal and digitally processing the extracted noise-level test signal to calculate power control adjustments; and
a servo for controlling output power of the laser by applying the calculated power control adjustments to the laser driver.
10. A method for controlling output power of a laser during and without disrupting data transmission, comprising:
embedding an original test signal in system noise;
modulating the original test signal and system noise;
mathematically extracting the embedded test signal from the modulated system noise;
applying digital signal processing algorithms to the extracted test signal to calculate power control adjustments from differences between the original test signal and the extracted test signal; and
applying the calculated power control adjustments to the laser.
11. An apparatus for controlling a laser during and without disrupting data transmission, comprising:
a laser driver for modulating the laser with data to produce a modulated output signal;
a high frequency monitor photodiode for acquiring the modulated output signal from the laser and following amplitudes of the modulated output signal;
a digital signal processor for performing peak and valley detection of the followed amplitudes of the acquired output signal, and for calculating power control adjustments from the peak and valley detection; and
a servo for controlling output power of the laser by applying the calculated power control adjustments to the laser driver.
12. An method for controlling a laser system during and without disrupting data transmission, comprising:
embedding a noise-level test signal in system noise of a data signal in a first laser transceiver;
transmitting a data signal containing the noise-level test signal embedded in system noise from the first laser transceiver to a second laser transceiver using optical path;
receiving the transmitted signal at the second laser transceiver.
detecting, recovering and digitally processing the noise-level test signal at the second transceiver to determine characteristic information about the first laser transceiver and the optical path;
sending the characteristic information from the second laser transceiver to the first laser transceiver;
receiving the characteristic information at the first transceiver; and
adjusting the output characteristics of the first laser transceiver according to the received characteristic information.
13. A method for extracting a noise-level test signal from a modulated data signal during and without disrupting data transmission, comprising:
modulating a data signal containing an original noise-level test signal to produce a modulated output signal;
acquiring the modulated output signal;
multiplying the acquired modulated output signal by a copy of the original noise-level test signal to shift the frequency of an acquired noise-level test signal within the acquired modulated signal; and
filtering the frequency shifted noise-level test signal from the acquired modulated signal.
14. A method for extracting a noise-level test signal from a modulated data signal during and without disrupting data transmission, comprising:
modulating a data signal containing an original sinusoidal noise-level test signal to produce a modulated output signal;
acquiring the modulated output signal;
splitting the acquired modulated signal into a first half and a second half;
multiplying the first half of the acquired modulated output signal by a sinusoidal copy of the original sinusoidal noise-level test signal to shift the frequency of an acquired noise-level test signal within the acquired modulated signal;
filtering the frequency shifted sinusoidal noise-level test signal from the acquired modulated signal;
squaring the filtered sinusoidal noise-level test signal;
multiplying the second half of the acquired modulated output signal by a cosinusoidal copy of the original sinusoidal noise-level test signal to produce a cosinusoidal noise-level test signal and shift the frequency of the acquired cosinusoidal noise-level test signal within the acquired modulated signal;
filtering the frequency shifted cosinusoidal noise-level test signal from the acquired modulated signal;
squaring the filtered cosinusoidal noise-level test signal; and
adding the squared sinusoidal and cosinusoidal acquired test signals to produce an amplitude of the acquired noise-level test signal.
US11/111,335 2003-01-08 2005-04-21 Method and apparatus for digital signal processing enhanced laser performance compensation Abandoned US20050249252A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/111,335 US20050249252A1 (en) 2003-01-08 2005-04-21 Method and apparatus for digital signal processing enhanced laser performance compensation

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
PCT/US2003/000463 WO2004064210A1 (en) 2003-01-08 2003-01-08 Apparatus and method for measurement of dynamic laser signals
US56414304P 2004-04-21 2004-04-21
US11/111,335 US20050249252A1 (en) 2003-01-08 2005-04-21 Method and apparatus for digital signal processing enhanced laser performance compensation

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/000463 Continuation-In-Part WO2004064210A1 (en) 2002-01-08 2003-01-08 Apparatus and method for measurement of dynamic laser signals

Publications (1)

Publication Number Publication Date
US20050249252A1 true US20050249252A1 (en) 2005-11-10

Family

ID=32710270

Family Applications (4)

Application Number Title Priority Date Filing Date
US10/513,091 Expired - Lifetime US7505498B2 (en) 2002-01-08 2003-01-08 Apparatus and method for measurement for dynamic laser signals
US13/048,743 Expired - Lifetime USRE43685E1 (en) 2002-01-08 2003-01-08 Apparatus and method for measurement for dynamic laser signals
US11/111,335 Abandoned US20050249252A1 (en) 2003-01-08 2005-04-21 Method and apparatus for digital signal processing enhanced laser performance compensation
US12/364,482 Expired - Fee Related US7876797B2 (en) 2003-01-08 2009-02-02 Apparatus and method for measurement of dynamic laser signals

Family Applications Before (2)

Application Number Title Priority Date Filing Date
US10/513,091 Expired - Lifetime US7505498B2 (en) 2002-01-08 2003-01-08 Apparatus and method for measurement for dynamic laser signals
US13/048,743 Expired - Lifetime USRE43685E1 (en) 2002-01-08 2003-01-08 Apparatus and method for measurement for dynamic laser signals

Family Applications After (1)

Application Number Title Priority Date Filing Date
US12/364,482 Expired - Fee Related US7876797B2 (en) 2003-01-08 2009-02-02 Apparatus and method for measurement of dynamic laser signals

Country Status (7)

Country Link
US (4) US7505498B2 (en)
EP (1) EP1529327B1 (en)
AT (1) ATE424640T1 (en)
AU (1) AU2003202238A1 (en)
CA (1) CA2475850A1 (en)
DE (1) DE60326457D1 (en)
WO (1) WO2004064210A1 (en)

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060002711A1 (en) * 2004-07-02 2006-01-05 Finisar Corporation Filtering digital diagnostics information in an optical transceiver prior to reporting to host
US20060002712A1 (en) * 2004-07-02 2006-01-05 Finisar Corporation Calibration of digital diagnostics information in an optical transceiver prior to reporting to host
US7333521B1 (en) * 2003-12-04 2008-02-19 National Semiconductor Corporation Method of sensing VCSEL light output power by monitoring electrical characteristics of the VCSEL
US7369591B1 (en) * 2005-01-14 2008-05-06 National Semiconductor Corporation System for controlling peaking for a driver for a vertical-cavity surface-emitting laser
US20090214198A1 (en) * 2008-02-21 2009-08-27 Fujitsu Limited Optical transmitter
US7630422B1 (en) 2005-01-14 2009-12-08 National Semiconductor Corporation Driver for vertical-cavity surface-emitting laser and method
US7693491B2 (en) * 2004-11-30 2010-04-06 Broadcom Corporation Method and system for transmitter output power compensation
US20150086197A1 (en) * 2012-06-07 2015-03-26 Fujitsu Limited Photodetection device, photodetection method, and optical transmission device
US20160134079A1 (en) * 2013-07-15 2016-05-12 Huawei Technologies Co., Ltd. Wavelength alignment method and apparatus, and optical network system
US20170288770A1 (en) * 2016-03-31 2017-10-05 Mellanox Technologies, Ltd. Electro-optic transceiver module with wavelength compensation
US20180144231A1 (en) * 2013-06-07 2018-05-24 Fisher Controls International Llc Methods and apparatus for rfid communications in a process control system
US20180335509A1 (en) * 2017-05-22 2018-11-22 Analog Devices Global Photo-diode emulator circuit for transimpedance amplifier testing
CN113597716A (en) * 2019-01-15 2021-11-02 ams有限公司 Temperature sensor, laser circuit, light detection and distance measurement system and method
US11327450B2 (en) 2015-04-10 2022-05-10 Fisher Controls International Llc Methods and apparatus for multimode rest communications in process control systems
CN114498293A (en) * 2022-03-30 2022-05-13 成都明夷电子科技有限公司 Optical module adjusting method with temperature compensation
US20220311514A1 (en) * 2021-03-24 2022-09-29 Tektronix, Inc. Optical transceiver tuning using machine learning
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4312573B2 (en) * 2003-10-27 2009-08-12 株式会社リコー Semiconductor laser drive circuit
JP4754170B2 (en) * 2003-12-03 2011-08-24 パナソニック株式会社 Laser drive circuit and optical communication device
US20050191059A1 (en) * 2004-01-12 2005-09-01 Clariphy Use of low-speed components in high-speed optical fiber transceivers
TWI290640B (en) * 2004-06-16 2007-12-01 Mediatek Inc Laser power controller and method for performing an auto power control
US7634197B2 (en) * 2005-01-12 2009-12-15 Finisar Corporation Compensation for temperature and voltage effects when monitoring parameters in a transceiver module
US8036539B2 (en) * 2005-06-28 2011-10-11 Finisar Corporation Gigabit ethernet longwave optical transceiver module having amplified bias current
GB2432037B (en) * 2005-11-01 2011-04-20 Agilent Technologies Inc A method and system for stabilizing operation of laser sources
US20080138080A1 (en) * 2006-12-08 2008-06-12 Alcatel Lucent Controller detection
EP2031744A1 (en) * 2007-08-31 2009-03-04 Bombardier Transportation GmbH Power converter, in particular for railway traction vehicle
US8447570B2 (en) * 2008-05-21 2013-05-21 Infineon Technologies Ag Predictive sensor readout
US9300405B2 (en) * 2011-12-02 2016-03-29 Semtech Corporation Closed loop optical modulation amplitude control
US9450696B2 (en) * 2012-05-23 2016-09-20 Vadum, Inc. Photonic compressive sensing receiver
US8923353B2 (en) * 2012-10-26 2014-12-30 Broadcom Corporation Laser driver modulation and bias control scheme
US9258056B2 (en) * 2013-12-20 2016-02-09 Juniper Networks, Inc. Methods and apparatus for monitoring and controlling the performance of optical communication systems
US9432121B2 (en) * 2014-06-05 2016-08-30 Xilinx, Inc. Optical communication circuits
US20170288369A1 (en) * 2016-04-01 2017-10-05 Macom Technology Solutions Holdings, Inc. Dual closed loop for laser power control
GB2541291B (en) * 2016-07-08 2018-06-20 Hilight Semiconductor Ltd Laser power controller
US9806807B1 (en) * 2016-07-12 2017-10-31 Adtran, Inc. Automatic rogue ONU detection
US10263384B2 (en) * 2016-10-14 2019-04-16 Lumenis Ltd. Laser system having a dual pulse-length regime
US11848653B2 (en) 2018-05-18 2023-12-19 Macom Technology Solutions Holdings, Inc. Method and apparatus to speed convergence and control behavior of digital control loop
US10938365B2 (en) 2018-05-18 2021-03-02 Macom Technology Solutions Holdings, Inc. Variable step size to reduce convergence time of a control loop
US11067672B2 (en) 2018-06-19 2021-07-20 Waymo Llc Shared sample and convert capacitor architecture
US11005573B2 (en) 2018-11-20 2021-05-11 Macom Technology Solutions Holdings, Inc. Optic signal receiver with dynamic control
JP2023506347A (en) 2019-09-19 2023-02-16 メイコム テクノロジー ソリューションズ ホールディングス インコーポレイテッド Using ISI or Q calculations to adapt equalizer settings
FR3101218B1 (en) 2019-09-23 2022-07-01 Macom Tech Solutions Holdings Inc EQUALIZER ADAPTATION BASED ON EYE MONITORING DEVICE MEASUREMENTS
WO2021076800A1 (en) 2019-10-15 2021-04-22 Macom Technology Solutions Holdings, Inc. Finding the eye center with a low-power eye monitor using a 3-dimensional algorithm
CN110954771A (en) * 2019-12-17 2020-04-03 武汉英飞光创科技有限公司 Aging method for COC (chip on chip) of optical module
WO2021142216A1 (en) 2020-01-10 2021-07-15 Macom Technology Solutions Holdings, Inc. Optimal equalization partitioning
US11575437B2 (en) 2020-01-10 2023-02-07 Macom Technology Solutions Holdings, Inc. Optimal equalization partitioning
US11689283B1 (en) * 2020-03-30 2023-06-27 Meta Platforms, Inc. Free-space optical communication system using a backchannel for power optimization
US11658630B2 (en) 2020-12-04 2023-05-23 Macom Technology Solutions Holdings, Inc. Single servo loop controlling an automatic gain control and current sourcing mechanism
US11616529B2 (en) 2021-02-12 2023-03-28 Macom Technology Solutions Holdings, Inc. Adaptive cable equalizer

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4994675A (en) * 1989-04-28 1991-02-19 Rebo Research, Inc. Method and apparatus for checking continuity of optic transmission
US5526164A (en) * 1993-05-19 1996-06-11 U.S. Philips Corporation Optical transmission system comprising a laser diode
US5812572A (en) * 1996-07-01 1998-09-22 Pacific Fiberoptics, Inc. Intelligent fiberoptic transmitters and methods of operating and manufacturing the same
US5889802A (en) * 1994-10-22 1999-03-30 Hewlett-Packard Company Bias controller and method

Family Cites Families (106)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3346811A (en) 1964-02-24 1967-10-10 Allis Chalmers Mfg Co Means for sensing conditions in high potential region and for transmitting such intelligence by light means to low potential regions
US4000397A (en) 1975-03-21 1976-12-28 Spectra-Physics, Inc. Signal processor method and apparatus
US4168398A (en) 1976-11-10 1979-09-18 Nippon Electric Co., Ltd. Initial acquisition signal detection system for TDMA satellite communication
US4164036A (en) 1977-12-07 1979-08-07 Honeywell Inc. Quadrature correlation phase reversal pulse detector
SE413808B (en) 1978-09-22 1980-06-23 Asea Ab METDON FOR TRANSFER OF METSIGNALS THROUGH AN OPTICAL LINK
US4290297A (en) 1979-05-14 1981-09-22 Rousemount Inc. Optically coupled calibrator for transmitters
DE3013533A1 (en) 1980-04-08 1981-10-15 Siemens Ag CIRCUIT ARRANGEMENT WITH A LASER DIODE FOR TRANSMITTING MESSAGE SIGNALS VIA A LIGHT WAVE GUIDE
DE3137497A1 (en) 1981-09-21 1983-04-07 Siemens Ag OPTICAL TRANSMISSION SYSTEM FOR HIGH FREQUENCY DIGITAL SIGNALS
US4558465A (en) 1983-09-19 1985-12-10 Rca Corporation Switched bias scheme for high speed laser transmitter
US4734873A (en) 1984-02-02 1988-03-29 Honeywell Inc. Method of digital process variable transmitter calibration and a process variable transmitter system utilizing the same
US4677536A (en) 1986-03-17 1987-06-30 Tektronix, Inc. AC Current sensing circuit
US4758779A (en) 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
GB2192510A (en) 1986-07-12 1988-01-13 Stc Plc Optical receiver
US4745361A (en) 1987-03-03 1988-05-17 University Of Rochester Electro-optic measurement (network analysis) system
US4910458A (en) 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
US5272434A (en) 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
JP3175935B2 (en) 1987-09-30 2001-06-11 株式会社東芝 Optical fiber sensor
JPH01150879A (en) 1987-12-08 1989-06-13 Nissan Motor Co Ltd Radio type production management information medium
US4796266A (en) 1987-12-21 1989-01-03 Bell Communications Research, Inc. Laser driver circuit with dynamic bias
US4939446A (en) 1988-03-30 1990-07-03 Rogers Wesley A Voltage transmission link for testing EMI susceptibility of a device or circuits
DE3818168A1 (en) 1988-05-26 1990-04-05 Krone Ag RECEIVER PRE-AMPLIFIER FOR AN OPTICAL MESSAGE RANGE
DE3817836A1 (en) 1988-05-26 1989-11-30 Philips Patentverwaltung OPTICAL TRANSMITTER WITH A LASER DIODE
US4875006A (en) 1988-09-01 1989-10-17 Photon Dynamics, Inc. Ultra-high-speed digital test system using electro-optic signal sampling
US5606534A (en) 1989-09-01 1997-02-25 Quantronix, Inc. Laser-based dimensioning system
US4995105A (en) 1989-09-18 1991-02-19 Xerox Corporation Adaptive laser diode driver circuit for laser scanners
FR2653634B1 (en) 1989-10-20 1996-06-28 Sgs Thomson Microelectronics CHIP CARD SYSTEM PROVIDED WITH PORTABLE REMOTE ELECTRONICS.
US5107202A (en) 1989-10-23 1992-04-21 Trustees Of Princeton University Fiber optic current monitor for high-voltage applications
US4996478A (en) 1990-01-05 1991-02-26 Tektronix, Inc. Apparatus for connecting an IC device to a test system
US5181026A (en) 1990-01-12 1993-01-19 Granville Group, Inc., The Power transmission line monitoring system
US5113131A (en) 1990-02-16 1992-05-12 Southern California Edison Company Voltage measuring device having electro-optic sensor and compensator
DE4028966A1 (en) 1990-09-12 1992-03-19 Rudolf Dr Goedecke Data processor integrated circuit memory card interface module - has terminal type(s) allowing transfer of analogue or digital signals
US5019769A (en) 1990-09-14 1991-05-28 Finisar Corporation Semiconductor laser diode controller and laser diode biasing control method
DE69132280T2 (en) 1990-09-17 2001-01-18 Cabletron Systems Inc System and method for modeling a computer network
US5136237A (en) 1991-01-29 1992-08-04 Tektronix, Inc. Double insulated floating high voltage test probe
US5103453A (en) 1991-02-12 1992-04-07 Aerodyne Research, Inc. Method and means for controlling the frequency and power output of a tunable diode laser
DE4106732A1 (en) 1991-03-02 1992-09-03 Porsche Ag FOLDING COVER FOR VEHICLES
JPH04278737A (en) 1991-03-06 1992-10-05 Kokusai Denshin Denwa Co Ltd <Kdd> Coherent optical receiver
US5414345A (en) 1991-04-29 1995-05-09 Electronic Development, Inc. Apparatus and method for low cost electromagnetic field susceptibility testing
JP2546080B2 (en) 1991-05-10 1996-10-23 富士通株式会社 Semiconductor laser control device
DE4123516C1 (en) 1991-07-16 1992-07-09 Mercedes-Benz Aktiengesellschaft, 7000 Stuttgart, De
US5164662A (en) 1991-07-22 1992-11-17 Westinghouse Electric Corp. Detection of radio frequency emissions
US5311116A (en) 1992-04-02 1994-05-10 Electronic Development, Inc. Multi-channel electromagnetically transparent voltage waveform monitor link
US5268916A (en) 1992-06-15 1993-12-07 Alcatel Network Systems, Inc. Laser bias and modulation circuit
US5502298A (en) * 1992-12-21 1996-03-26 Ericsson Raynet Apparatus and method for controlling an extinction ratio of a laser diode over temperature
JPH06222087A (en) 1993-01-27 1994-08-12 Hamamatsu Photonics Kk Voltage detector
DE9303877U1 (en) 1993-03-18 1993-05-19 Schulten, Thomas, 4600 Dortmund, De
US5574273A (en) 1993-06-14 1996-11-12 Hitachi Maxell, Ltd. Non-contact system parallel data transfer system
DE9311798U1 (en) 1993-08-07 1994-12-08 Karmann Gmbh W Retractable folding roof for a convertible vehicle
JPH07140209A (en) 1993-09-20 1995-06-02 Fujitsu Ltd Inspection equipment of circuit wiring board and its inspection method
JPH07181605A (en) 1993-12-22 1995-07-21 Canon Inc Image forming device
US5410145A (en) 1994-02-25 1995-04-25 Coroy; Trenton G. Light detector using reverse biased photodiodes with dark current compensation
US5514864A (en) 1994-03-25 1996-05-07 Umax Data System Inc. Photo electric feedback compensation controlled apparatus
US5500517A (en) 1994-09-02 1996-03-19 Gemplus Card International Apparatus and method for data transfer between stand alone integrated circuit smart card terminal and remote computer of system operator
JPH08172236A (en) 1994-12-15 1996-07-02 Nec Corp Apc circuit
DE19507809C2 (en) 1995-03-06 1998-05-20 Gunter Dipl Ing Langer Measuring method for the detection of pulse-shaped disturbances
JP4046778B2 (en) 1995-04-05 2008-02-13 ソニー株式会社 Optical disk recording / reproducing device
US5923021A (en) 1995-06-19 1999-07-13 Symbol Technologies, Inc. Light collection systems in electro-optical readers
EP0749859B1 (en) 1995-06-22 2000-03-22 Wilhelm Karmann GmbH Softtop for convertible vehicle
US5638390A (en) 1995-07-27 1997-06-10 Methode Electronics, Inc. Optoelectronic transceiver module laser diode stabilizer and bias control method
US5774669A (en) 1995-07-28 1998-06-30 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Scalable hierarchical network management system for displaying network information in three dimensions
JP3583198B2 (en) 1995-08-10 2004-10-27 富士通株式会社 Optical communication module
US5579328A (en) 1995-08-10 1996-11-26 Northern Telecom Limited Digital control of laser diode power levels
JPH10508133A (en) 1995-08-25 1998-08-04 ピーエスシー・インコーポレイテッド Optical reader with integrated CMOS circuit
DE29514423U1 (en) 1995-09-08 1995-11-02 Langer Gunter Dipl Ing EMC compact sensor
US6028423A (en) 1997-12-11 2000-02-22 Sanchez; Jorge Isolation instrument for electrical testing
JPH09181682A (en) 1995-12-26 1997-07-11 Fujitsu Ltd Driving circuit for light modulator, and light transmitter
US5844928A (en) 1996-02-27 1998-12-01 Lucent Technologies, Inc. Laser driver with temperature sensor on an integrated circuit
DE19609736A1 (en) 1996-03-13 1997-09-18 Thomson Brandt Gmbh Detection circuit for pilot tones for tracking control in magnetic tape recordings
NL1003726C2 (en) 1996-08-01 1998-02-05 Micronic B V Test tube with optically readable coding.
DE19635869C1 (en) 1996-09-04 1998-01-22 Daimler Benz Ag Folding roof for vehicles
DE19637005C1 (en) 1996-09-12 1997-12-18 Daimler Benz Ag Plate covering for front area of frame opening of hood box
JP3218999B2 (en) 1996-12-18 2001-10-15 安藤電気株式会社 External cavity type tunable semiconductor laser light source
US5867514A (en) 1997-01-09 1999-02-02 Cymer, Inc. Laser wavelength control circuit having automatic DC offset and gain adjustment
US5875296A (en) 1997-01-28 1999-02-23 International Business Machines Corporation Distributed file system web server user authentication with cookies
US6002099A (en) 1997-04-23 1999-12-14 Technolines, Llc User control interface for laser simulating sandblasting apparatus
US7014336B1 (en) 1999-11-18 2006-03-21 Color Kinetics Incorporated Systems and methods for generating and modulating illumination conditions
JP3290618B2 (en) 1997-11-28 2002-06-10 松下電器産業株式会社 Optical sensor device and signal processing circuit used therefor
US6157950A (en) 1997-12-05 2000-12-05 Encanto Networks, Inc. Methods and apparatus for interfacing a computer or small network to a wide area network such as the internet
JP3782600B2 (en) 1998-03-12 2006-06-07 キヤノン株式会社 Network device management apparatus, network device management method, and recording medium
JP3840794B2 (en) 1998-04-13 2006-11-01 富士ゼロックス株式会社 Laser drive device
US6055252A (en) 1998-09-10 2000-04-25 Photonic Solutions, Inc. Fiberoptic transmitter using thermistor to maintain stable operating conditions over a range of temperature
JP2000147021A (en) 1998-11-11 2000-05-26 Ando Electric Co Ltd Light-receiving circuit for electro-optical sampling oscilloscope
US6574737B1 (en) 1998-12-23 2003-06-03 Symantec Corporation System for penetrating computer or computer network
DE19912893C2 (en) 1999-03-23 2003-02-27 Daimler Chrysler Ag Convertible vehicle with a hood
US6377987B1 (en) 1999-04-30 2002-04-23 Cisco Technology, Inc. Mechanism for determining actual physical topology of network based on gathered configuration information representing true neighboring devices
US6414974B1 (en) * 1999-09-07 2002-07-02 Analog Devices, Inc. Method and a control circuit for controlling the extinction ratio of a laser diode
JP4292354B2 (en) 1999-10-19 2009-07-08 アイシン精機株式会社 Package tray for vehicles
US6490302B1 (en) 1999-10-28 2002-12-03 Matsushita Electric Industrial Co., Ltd. Semiconductor laser control circuit and laser light source
US6396062B1 (en) 1999-12-03 2002-05-28 Cymer, Inc. Portable laser beam monitor
DE19959700C1 (en) 1999-12-10 2001-02-22 Daimler Chrysler Ag Displacement drive for cabriolet vehicle rear cover has locking elements for rear cover fixing hinge controlled by relatively sliding elements of each drive unit
US6580531B1 (en) 1999-12-30 2003-06-17 Sycamore Networks, Inc. Method and apparatus for in circuit biasing and testing of a modulated laser and optical receiver in a wavelength division multiplexing optical transceiver board
EP1136992A3 (en) * 2000-03-24 2006-09-06 Samsung Electronics Co., Ltd. Apparatus and method for controlling auto laser diode power
DE10021340C1 (en) 2000-05-02 2001-08-09 Karmann Gmbh W Cabriolet automobile has movement devices for front and rear roof sections with front and rear carrier elements coupled via coupling rod with intermediate gearings at its ends
DE10029473B4 (en) 2000-06-15 2006-09-07 Wilhelm Karmann Gmbh Convertible car
AU2001296283A1 (en) 2000-09-21 2002-04-02 Gsi Lumonics Corporation Digital control servo system
DE10050286B4 (en) 2000-10-10 2004-08-05 Cts Fahrzeug-Dachsysteme Gmbh Multi-part cover for vehicles
US7224908B2 (en) 2000-10-13 2007-05-29 Kiribati Wireless Ventures, Llc Attenuation and calibration systems and methods for use with a laser detector in an optical communication system
US6947456B2 (en) 2000-12-12 2005-09-20 Agilent Technologies, Inc. Open-loop laser driver having an integrated digital controller
US20040197101A1 (en) 2001-02-05 2004-10-07 Sasser Gary D. Optical transceiver module with host accessible on-board diagnostics
JP3812348B2 (en) 2001-02-26 2006-08-23 ティアック株式会社 Optical disk device
US6774368B2 (en) 2001-03-08 2004-08-10 Baylor University Dispersive near-infrared spectrometer with automatic wavelength calibration
WO2002093695A2 (en) 2001-05-15 2002-11-21 Agility Communications, Inc. Sampled grating distributed bragg reflector laser controller
US6907055B2 (en) 2001-11-13 2005-06-14 Analog Devices, Inc. Method and circuit for measuring the optical modulation amplitude (OMA) in the operating region of a laser diode
US7608806B2 (en) 2004-11-19 2009-10-27 Mindspeed Technologies, Inc. Multiple parameter laser power control with automatic compensation
US7381935B2 (en) 2004-11-19 2008-06-03 Mindspeed Technologies, Inc. Laser power control with automatic power compensation
US7456414B2 (en) 2005-09-28 2008-11-25 Applied Materials, Inc. Beam re-registration system and method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4994675A (en) * 1989-04-28 1991-02-19 Rebo Research, Inc. Method and apparatus for checking continuity of optic transmission
US5526164A (en) * 1993-05-19 1996-06-11 U.S. Philips Corporation Optical transmission system comprising a laser diode
US5889802A (en) * 1994-10-22 1999-03-30 Hewlett-Packard Company Bias controller and method
US5812572A (en) * 1996-07-01 1998-09-22 Pacific Fiberoptics, Inc. Intelligent fiberoptic transmitters and methods of operating and manufacturing the same

Cited By (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7333521B1 (en) * 2003-12-04 2008-02-19 National Semiconductor Corporation Method of sensing VCSEL light output power by monitoring electrical characteristics of the VCSEL
US20060002712A1 (en) * 2004-07-02 2006-01-05 Finisar Corporation Calibration of digital diagnostics information in an optical transceiver prior to reporting to host
US7447438B2 (en) * 2004-07-02 2008-11-04 Finisar Corporation Calibration of digital diagnostics information in an optical transceiver prior to reporting to host
US8639122B2 (en) 2004-07-02 2014-01-28 Finisar Corporation Filtering digital diagnostics information in an optical transceiver prior to reporting to host
US20060002711A1 (en) * 2004-07-02 2006-01-05 Finisar Corporation Filtering digital diagnostics information in an optical transceiver prior to reporting to host
US7693491B2 (en) * 2004-11-30 2010-04-06 Broadcom Corporation Method and system for transmitter output power compensation
US8548390B2 (en) 2004-11-30 2013-10-01 Broadcom Corporation Method and system for transmitter output power compensation
US7369591B1 (en) * 2005-01-14 2008-05-06 National Semiconductor Corporation System for controlling peaking for a driver for a vertical-cavity surface-emitting laser
US7630422B1 (en) 2005-01-14 2009-12-08 National Semiconductor Corporation Driver for vertical-cavity surface-emitting laser and method
US20090214198A1 (en) * 2008-02-21 2009-08-27 Fujitsu Limited Optical transmitter
US9577747B2 (en) * 2012-06-07 2017-02-21 Fujitsu Limited Photodetection device, photodetection method, and optical transmission device
US20150086197A1 (en) * 2012-06-07 2015-03-26 Fujitsu Limited Photodetection device, photodetection method, and optical transmission device
US20180144231A1 (en) * 2013-06-07 2018-05-24 Fisher Controls International Llc Methods and apparatus for rfid communications in a process control system
US10325197B2 (en) * 2013-06-07 2019-06-18 Fisher Controls International Llc Methods and apparatus for RFID communications in a process control system
US11003976B2 (en) 2013-06-07 2021-05-11 Fisher Controls International, Llc Methods and apparatus for RFID communications in a process control system
US20160134079A1 (en) * 2013-07-15 2016-05-12 Huawei Technologies Co., Ltd. Wavelength alignment method and apparatus, and optical network system
US11327450B2 (en) 2015-04-10 2022-05-10 Fisher Controls International Llc Methods and apparatus for multimode rest communications in process control systems
US10177841B2 (en) * 2016-03-31 2019-01-08 Mellanox Technologies, Ltd. Electro-optic transceiver module with wavelength compensation
US20170288770A1 (en) * 2016-03-31 2017-10-05 Mellanox Technologies, Ltd. Electro-optic transceiver module with wavelength compensation
US10481246B2 (en) * 2017-05-22 2019-11-19 Analog Devices Global Unlimited Company Photo-diode emulator circuit for transimpedance amplifier testing
US20180335509A1 (en) * 2017-05-22 2018-11-22 Analog Devices Global Photo-diode emulator circuit for transimpedance amplifier testing
CN113597716A (en) * 2019-01-15 2021-11-02 ams有限公司 Temperature sensor, laser circuit, light detection and distance measurement system and method
US20220311514A1 (en) * 2021-03-24 2022-09-29 Tektronix, Inc. Optical transceiver tuning using machine learning
US11923895B2 (en) 2021-03-24 2024-03-05 Tektronix, Inc. Optical transmitter tuning using machine learning and reference parameters
US11923896B2 (en) * 2021-03-24 2024-03-05 Tektronix, Inc. Optical transceiver tuning using machine learning
US11907090B2 (en) 2021-08-12 2024-02-20 Tektronix, Inc. Machine learning for taps to accelerate TDECQ and other measurements
US11940889B2 (en) 2021-08-12 2024-03-26 Tektronix, Inc. Combined TDECQ measurement and transmitter tuning using machine learning
CN114498293A (en) * 2022-03-30 2022-05-13 成都明夷电子科技有限公司 Optical module adjusting method with temperature compensation

Also Published As

Publication number Publication date
DE60326457D1 (en) 2009-04-16
CA2475850A1 (en) 2003-07-29
ATE424640T1 (en) 2009-03-15
US20060165139A1 (en) 2006-07-27
US7876797B2 (en) 2011-01-25
EP1529327A1 (en) 2005-05-11
EP1529327A4 (en) 2005-08-31
WO2004064210A1 (en) 2004-07-29
US20090225803A1 (en) 2009-09-10
AU2003202238A1 (en) 2004-08-10
EP1529327B1 (en) 2009-03-04
US7505498B2 (en) 2009-03-17
USRE43685E1 (en) 2012-09-25

Similar Documents

Publication Publication Date Title
US20050249252A1 (en) Method and apparatus for digital signal processing enhanced laser performance compensation
US7738796B2 (en) Method and apparatus for digital signal processing enhanced laser performance compensation
US6909731B2 (en) Statistic parameterized control loop for compensating power and extinction ratio of a laser diode
US7336346B2 (en) Distance measuring device and method thereof
US7504610B2 (en) Optical modulation amplitude compensation system having a laser driver with modulation control signals
JP4963339B2 (en) Laser system calibration
US7333736B2 (en) Method and apparatus for controlling modulator phase alignment in a transmitter of an optical communications system
US7512166B2 (en) Apparatus and method for controlling optical power and extinction ratio
US7586613B2 (en) Method for measurement of gas concentration with modulated light at two absorption maxima
US20060153256A1 (en) Laser temperature performance compensation
US20170346570A1 (en) Method of controlling optical transmitter operable for pulse-amplitude modulation signal
US6829267B2 (en) Control loop circuit and method therefor
US20050025018A1 (en) Apparatus and method for automatic power control
US7653102B2 (en) Method and apparatus for controlling output power levels of a laser used for optical data transmission based on data rate-speed optical feedback
US20030118063A1 (en) Light-emitting element controller, optical transmitting apparatus, and method and computer program for determining driving current
US20030007525A1 (en) Modulation current compensation of a laser for fixed extinction ratio using bias shifting
US20050226292A1 (en) Burst signal extinction ratio control circuit, integrated circuit thereof, burst signal extinction ratio control method, computer program, and laser diode drive circuit
JP2004289820A (en) Method and instrument for evaluating performance of optical system
JP2004221591A (en) Method for calibrating laser system
US20050030989A1 (en) Laser driver, optical disk apparatus using the same, and laser control method
US7940822B1 (en) Tracking injection seeding power based on back facet monitoring (BFM) of an injection seeded laser
US6819480B2 (en) Method and apparatus for controlling the extinction ratio of transmitters
US7324760B2 (en) Apparatus and method for phase synchronization control in RZ optical transmitter
US20020163945A1 (en) Modulation current compensation of laser for controlled extinction ratio using dither signal
US20070168142A1 (en) Jitter detection and reduction

Legal Events

Date Code Title Description
AS Assignment

Owner name: CEYX TECHNOLOGIES, INC., CALIFORNIA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:SANCHEZ, JORGE;REEL/FRAME:016501/0213

Effective date: 20050421

AS Assignment

Owner name: SILICON VALLEY BANK, CALIFORNIA

Free format text: SUPPLEMENT TO SECURITY AGREEMENT;ASSIGNOR:CEYX TECHNOLOGIES, INC.;REEL/FRAME:020010/0531

Effective date: 20071001

Owner name: SILICON VALLEY BANK,CALIFORNIA

Free format text: SUPPLEMENT TO SECURITY AGREEMENT;ASSIGNOR:CEYX TECHNOLOGIES, INC.;REEL/FRAME:020010/0531

Effective date: 20071001

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION

AS Assignment

Owner name: CEYX TECHNOLOGIES, INC., CALIFORNIA

Free format text: RELEASE;ASSIGNOR:SILICON VALLEY BANK;REEL/FRAME:021547/0771

Effective date: 20080909

Owner name: CEYX TECHNOLOGIES, INC., CALIFORNIA

Free format text: RELEASE;ASSIGNOR:SILICON VALLEY BANK;REEL/FRAME:021547/0773

Effective date: 20080909

Owner name: CEYX TECHNOLOGIES, INC.,CALIFORNIA

Free format text: RELEASE;ASSIGNOR:SILICON VALLEY BANK;REEL/FRAME:021547/0773

Effective date: 20080909

AS Assignment

Owner name: TECEY SOFTWARE DEVELOPMENT KG, LLC, DELAWARE

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:CEYX TECHNOLOGIES, INC.;REEL/FRAME:021741/0441

Effective date: 20080829