US20050218517A1 - Semiconductor flip-chip package and method for the fabrication thereof - Google Patents
Semiconductor flip-chip package and method for the fabrication thereof Download PDFInfo
- Publication number
- US20050218517A1 US20050218517A1 US10/855,708 US85570804A US2005218517A1 US 20050218517 A1 US20050218517 A1 US 20050218517A1 US 85570804 A US85570804 A US 85570804A US 2005218517 A1 US2005218517 A1 US 2005218517A1
- Authority
- US
- United States
- Prior art keywords
- distinct
- chip
- encapsulant
- solder
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- ZOXCDFBNPMAXDS-BWQVVBFJSA-N C=CC(=O)OCCN1C(=O)N(/C=C\OC(=O)CC)C(=O)/N(=C/C(=O)OCCC)C1=O.C=CCN1C(=O)N(CC=C)C(=O)N(CC=C)C1=O Chemical compound C=CC(=O)OCCN1C(=O)N(/C=C\OC(=O)CC)C(=O)/N(=C/C(=O)OCCC)C1=O.C=CCN1C(=O)N(CC=C)C(=O)N(CC=C)C1=O ZOXCDFBNPMAXDS-BWQVVBFJSA-N 0.000 description 1
- FSZLCZUNQLCWNX-UHFFFAOYSA-N CC=CC(C)=O.O=C1C=CC(=O)O1 Chemical compound CC=CC(C)=O.O=C1C=CC(=O)O1 FSZLCZUNQLCWNX-UHFFFAOYSA-N 0.000 description 1
- PQZTVWVYCLIIJY-UHFFFAOYSA-N CCCN(CC)CC Chemical compound CCCN(CC)CC PQZTVWVYCLIIJY-UHFFFAOYSA-N 0.000 description 1
- ISXFNLZMHVZQAZ-UHFFFAOYSA-O C[NH+](C)C.C[NH+](C)C1CO1OCC=CC(=O)([O-])[N+]1(C2CO2OCC=CC(=O)[O-])(C2CO2OCC=CC(=O)O)CCO12=C(=CC(=O)O)=CO2 Chemical compound C[NH+](C)C.C[NH+](C)C1CO1OCC=CC(=O)([O-])[N+]1(C2CO2OCC=CC(=O)[O-])(C2CO2OCC=CC(=O)O)CCO12=C(=CC(=O)O)=CO2 ISXFNLZMHVZQAZ-UHFFFAOYSA-O 0.000 description 1
- AIOWKPDHXDIENZ-UHFFFAOYSA-N O=C1C=CC(=O)O1.OCC(O)C(O)CO.[H]C(OC(=O)C=CC(=O)O)C([H])(OC(=O)C=CC(=O)O)C([H])(OC(=O)C=CC(=O)O)C([H])OC(=O)C=CC(=O)O Chemical compound O=C1C=CC(=O)O1.OCC(O)C(O)CO.[H]C(OC(=O)C=CC(=O)O)C([H])(OC(=O)C=CC(=O)O)C([H])(OC(=O)C=CC(=O)O)C([H])OC(=O)C=CC(=O)O AIOWKPDHXDIENZ-UHFFFAOYSA-N 0.000 description 1
- 0 [7*]C(=O)O[H] Chemical compound [7*]C(=O)O[H] 0.000 description 1
- ANZVNOLZRZBIQI-UHFFFAOYSA-N [H]C1(COC(=O)C=CC(=O)O)(OCOC=CC(=O)O)CO1C(=O)C=CC(=O)O Chemical compound [H]C1(COC(=O)C=CC(=O)O)(OCOC=CC(=O)O)CO1C(=O)C=CC(=O)O ANZVNOLZRZBIQI-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
- B23K35/025—Pastes, creams, slurries
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/36—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest
- B23K35/3612—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest with organic compounds as principal constituents
- B23K35/3613—Polymers, e.g. resins
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/36—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest
- B23K35/3612—Selection of non-metallic compositions, e.g. coatings, fluxes; Selection of soldering or welding materials, conjoint with selection of non-metallic compositions, both selections being of interest with organic compounds as principal constituents
- B23K35/3618—Carboxylic acids or salts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/04—Interconnection of layers
- B32B7/12—Interconnection of layers using interposed adhesives or interposed materials with bonding properties
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J4/00—Adhesives based on organic non-macromolecular compounds having at least one polymerisable carbon-to-carbon unsaturated bond ; adhesives, based on monomers of macromolecular compounds of groups C09J183/00 - C09J183/16
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/563—Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49883—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials the conductive materials containing organic materials or pastes, e.g. for thick films
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/023—Redistribution layers [RDL] for bonding areas
- H01L2224/0237—Disposition of the redistribution layers
- H01L2224/02379—Fan-out arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/06102—Disposition the bonding areas being at different heights
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/1147—Manufacturing methods using a lift-off mask
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/1147—Manufacturing methods using a lift-off mask
- H01L2224/1148—Permanent masks, i.e. masks left in the finished device, e.g. passivation layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/11—Manufacturing methods
- H01L2224/118—Post-treatment of the bump connector
- H01L2224/1182—Applying permanent coating, e.g. in-situ coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/13111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/14—Structure, shape, material or disposition of the bump connectors prior to the connecting process of a plurality of bump connectors
- H01L2224/1401—Structure
- H01L2224/1403—Bump connectors having different sizes, e.g. different diameters, heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16104—Disposition relative to the bonding area, e.g. bond pad
- H01L2224/16105—Disposition relative to the bonding area, e.g. bond pad the bump connector connecting bonding areas being not aligned with respect to each other
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16108—Disposition the bump connector not being orthogonal to the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/274—Manufacturing methods by blanket deposition of the material of the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/274—Manufacturing methods by blanket deposition of the material of the layer connector
- H01L2224/2743—Manufacturing methods by blanket deposition of the material of the layer connector in solid form
- H01L2224/27436—Lamination of a preform, e.g. foil, sheet or layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/276—Manufacturing methods by patterning a pre-deposited material
- H01L2224/27602—Mechanical treatment, e.g. polishing, grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/276—Manufacturing methods by patterning a pre-deposited material
- H01L2224/2761—Physical or chemical etching
- H01L2224/27614—Physical or chemical etching by chemical means only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/276—Manufacturing methods by patterning a pre-deposited material
- H01L2224/27618—Manufacturing methods by patterning a pre-deposited material with selective exposure, development and removal of a photosensitive layer material, e.g. of a photosensitive conductive resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29075—Plural core members
- H01L2224/2908—Plural core members being stacked
- H01L2224/29082—Two-layer arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29101—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
- H01L2224/29111—Tin [Sn] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/2919—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/2929—Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/2954—Coating
- H01L2224/2956—Disposition
- H01L2224/29562—On the entire exposed surface of the core
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/2954—Coating
- H01L2224/29599—Material
- H01L2224/2969—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/731—Location prior to the connecting process
- H01L2224/73101—Location prior to the connecting process on the same surface
- H01L2224/73103—Bump and layer connectors
- H01L2224/73104—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/81009—Pre-treatment of the bump connector or the bonding area
- H01L2224/8101—Cleaning the bump connector, e.g. oxide removal step, desmearing
- H01L2224/81011—Chemical cleaning, e.g. etching, flux
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/81009—Pre-treatment of the bump connector or the bonding area
- H01L2224/81024—Applying flux to the bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/812—Applying energy for connecting
- H01L2224/8121—Applying energy for connecting using a reflow oven
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/81—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
- H01L2224/818—Bonding techniques
- H01L2224/81801—Soldering or alloying
- H01L2224/81815—Reflow soldering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/831—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
- H01L2224/83101—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus as prepeg comprising a layer connector, e.g. provided in an insulating plate member
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83191—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83192—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed only on another item or body to be connected to the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8319—Arrangement of the layer connectors prior to mounting
- H01L2224/83193—Arrangement of the layer connectors prior to mounting wherein the layer connectors are disposed on both the semiconductor or solid-state body and another item or body to be connected to the semiconductor or solid-state body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
- H01L2224/83855—Hardening the adhesive by curing, i.e. thermosetting
- H01L2224/83856—Pre-cured adhesive, i.e. B-stage adhesive
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00013—Fully indexed content
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01015—Phosphorus [P]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01018—Argon [Ar]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0102—Calcium [Ca]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01025—Manganese [Mn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01027—Cobalt [Co]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01029—Copper [Cu]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0103—Zinc [Zn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01042—Molybdenum [Mo]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01045—Rhodium [Rh]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01049—Indium [In]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0105—Tin [Sn]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01051—Antimony [Sb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01327—Intermediate phases, i.e. intermetallics compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/0665—Epoxy resin
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/10251—Elemental semiconductors, i.e. Group IV
- H01L2924/10253—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12042—LASER
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/156—Material
- H01L2924/1579—Material with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
- H05K1/095—Dispersed materials, e.g. conductive pastes or inks for polymer thick films, i.e. having a permanent organic polymeric binder
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/321—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
Definitions
- This invention relates generally to semiconductor chips electrically and mechanically connected to a substrate, particularly to flip-chip configurations.
- a semiconductor chip having solder bumps formed on the active side of the semi-conductor chip is inverted and bonded to a substrate through the solder bumps by reflowing the solder.
- Structural solder joints are formed between the semi-conductor chip and the substrate to form the mechanical and electrical connections between the chip and substrate.
- a narrow gap is left between the semi-conductor chip and the substrate.
- the underfill material is typically dispensed around two adjacent sides of the semiconductor chip, then the underfill material slowly flows by capillary action to fill the gap between the chip and the substrate.
- the underfill material is then hardened by baking for an extended period.
- the underfill encapsulant it is important that it adhere well to the chip and the substrate to improve the solder joint integrity. Underfilling the chip with a subsequently cured encapsulant has been shown to reduce solder joint-cracking caused by thermal expansion mismatch between the chip and the substrate. The cured encapsulant reduces the stresses, induced by differential expansion and contraction, on the solder joints.
- underfill encapsulation of the chip After reflow, underfill encapsulation of the chip generally follows.
- the polymers of choice for the underfill encapsulation have been epoxies, the coefficient of thermal expansion and moduli of the epoxies being adjusted with the addition of inorganic fillers.
- a coefficient of thermal expansion in the vicinity of 25 ppm/° C. is preferred and a modulus of 4 GPa or more. Since the preferred epoxies have coefficient of thermal expansions exceeding 80 ppm/° C. and moduli of less than 4 GPa, the inorganic fillers selected generally have much lower coefficient of thermal expansions and much higher moduli so that in the aggregate, the epoxy-inorganic mixture is within the desired range.
- the reflowing of the solder bump and then underfilling and curing the encapsulant is a multi-step process that results in reduced production efficiency
- underfiring the chip 100 with a subsequently hardened encapsulant 102 has been shown to reduce solder joint cracking caused by thermal expansion mismatch between the chip and the substrate 104 .
- the hardened encapsulant 102 transfers the stresses, induced by differential expansion and contraction, from the solder joints 106 to deformation of the chip 100 and substrate 104 as shown in FIG. 1 for expansion-induced strain at elevated temperatures and FIG. 2 for contraction-induced strain at reduced temperatures.
- the main effect of the hardened encapsulant during thermal expansion or contraction is to effectively force the chip and the substrate to take up the stress caused by the coefficients of thermal expansion mismatch by bending and bulging the chip and substrate. This bending and bulging reduces the stress on the solder joints and virtually eliminates solder fatigue failure.
- the effect of the encapsulant bending the substrate and the chip causes its own new set of problems.
- One such problem is that the bending makes the chips susceptible to cracking.
- Another such problem is that the degree of stress relief is highly dependent on the flexibility of the under-lying substrate and is thus an unpredictable function of the design of the printed circuit.
- Another limitation is that relying on such bending for stress relief on the solder joints prevents the placement of flip chips directly opposite one another on a double-sided printed circuit.
- solder bumps have been applied to chips by one of several methods. Coating the solder on the chip bumps by evaporation of solder metals through a mask is one such method. This method suffers from 1) long deposition times, 2) limitations on the compositions of solder that can be applied to those metals that can be readily evaporated, and 3) evaporating the metals over large areas where the solder is ultimately not wanted. Also, since most solders contain lead, a toxic metal, evaporation involves removal and disposal of excess coated lead from equipment and masks. Another common method in the prior art is electroplating of the solder onto the chip pads through a temporary sacrificial mask.
- Electroplating is a slow and expensive process that also deposits the solder over large areas where the solder is ultimately not wanted.
- Another method is to screen print solder paste on the chips pad through a stencil, then reflowing the solder to form a ball or bump on the pad. This technique is limited to bump dimensions that can be readily stencil printed, so it is not practical in bump pitches of 25 microns or less.
- a chip with underfilling encapsulant and separate discrete solder bumps pre-coated and pre-assembled on the chip for assembly to a substrate This configuration provides a simple, cost-effective assembly procedure wherein the chip/encapsulant/discrete solder bump combination is placed on the substrate and subsequently heat is applied so that the solder is reflowed while simultaneously the encapsulant hardens, without the labor intensive underfill steps of the prior art.
- a chip precoated with underfilling encapsulant having holes therein which expose metallized contact pads on the active surface of the chip.
- the holes are subsequently filled with molten solder which is then cooled and hardened to create the chip/encapsulant/discrete solder bump assembly.
- the assembly can be placed on a substrate and subsequently, the solder is reflowed while simultaneously the encapsulant hardens, eliminating the labor intensive underfill steps of the prior art.
- the chip/encapsulant/discrete solder bump assembly is coated with a thin layer of a flux adhesive and, subsequently, the solder is reflowed while simultaneously the flux adhesive and encapsulant harden.
- a chip precoated with underfilling encapsulant having holes therein which expose metallized contact pads on the active surface of the chip.
- the holes are subsequently filled with an electrically conductive adhesive to create a chip/encapsulant/conductive adhesive bump assembly.
- the assembly can be placed on the substrate and subsequently the encapsulant and conductive adhesive are simultaneously hardened, without the labor intensive underfill steps of the prior art.
- the present invention also provides a substrate precoated with the encapsulant having holes therein which expose the metallized solder pads on the substrate.
- the holes are subsequently filled with molten solder or electrically conductive adhesive which is then cooled and hardened prior to attachment of the chip to the substrate by reflow.
- the substrate has encapsulant and separate discrete solder columns pre-assembled thereon.
- a first portion of an underfilling encapsulant and separate discrete solder bumps pre-coated and pre-assembled on a chip for assembly to a substrate The first portion of encapsulant can be either a solid or a thick liquid, partially or fully uncured.
- a second portion of the encapsulant is applied to the substrate.
- the first portion of the encapsulant is filled, preferably highly filled, with a filler material to produce a reduced coefficient of thermal expansion and increased modulus.
- the second portion of the encapsulant is either lightly filled or completely devoid of filler material.
- At least the second portion of the encapsulant comprises an adhesive material with solder fluxing properties, for example, an adhesive flux.
- the first portion of the encapsulant can comprise a similar material or a conventional epoxy.
- the first portion is filled with a filler having a lower coefficient of thermal expansion and higher modulus than the encapsulant material without filler to increase the encapsulant's modulus and reduce its coefficient of thermal expansion.
- the invention provides a simple, cost-effective assembly procedure wherein the chip/first portion of encapsulant/discrete solder bump combination is placed on the substrate/second portion of encapsulant combination and subsequently heat is applied so that the solder is reflowed while simultaneously the encapsulant cures, without the labor intensive, time-consuming underfill steps of the prior art.
- the second portion constitutes a relatively thin layer in the overall encapsulant structure which somewhat intermixes with the first portion during cure and has minimal effect on the reliability of the flip-chip structure, despite the second portion having generally a lower modulus and higher coefficient of thermal expansion than the first portion.
- An advantage of the present invention is that the lower viscosity of the unfilled or lightly filled second portion during the reflow process allows the solder to flow without impediment from the thick viscosity of the first portion of the encapsulant.
- the present invention provides a low coefficient of thermal expansion and high modulus in the first portion of the encapsulant while at the same time achieving good solder wetting and chip self aligning in the second portion of the encapsulant.
- the chip/first portion of encapsulant/discrete solder bump assembly described above is coated with a thin layer of the second portion of the encapsulant which is either lightly filled or completely devoid of filler material. Placement of the chip, solder reflow and adhesive cure follows as described above.
- a method for placing a flip-chip onto a substrate that avoids entrapment of gas bubbles or creation of voids.
- the chip having the first portion of encapsulant thereon, is oriented at an angle to the substrate having the second portion thereon, then pivoted about the first point of contact until the solder bumps on the chip are in contact with the solder pads on the substrate, creating an underfill of encapsulant material as the chip is pivoted while expelling the gas from between the chip and substrate.
- Another aspect of the present invention provides a chip with underfilling encapsulant pre-coated and pre-assembled on the chip for assembly to a substrate, wherein the encapsulant consists of more than one layer, each layer performing one or more distinct functions such as attachment, stress distribution, electrical redistribution, reworkability, adhesion, or other functions.
- the bulk of the encapsulant, consisting of one or more layers, is applied and partially or fully hardened prior to assembly of the chip on the substrate. Holes therein which expose metallized contact pads on the active surface of the chip are subsequently filled with solder or an electrically conductive adhesive as previously described to create an encapsulated subassembly. Then a flux adhesive is applied between the chip/encapsulant/solder bump combination and the substrate which can be fully hardened after or when the chip/encapsulant/solder bump combination is placed on the substrate and the solder is reflowed.
- Removal of the chip from the substrate is made possible by incorporating in the pre-coated multi-layer encapsulant a polymer layer that can be remelted even after the chip has been assembled to the substrate. Remelting the solder and the polymer encapsulant layer allows removal of the chip for repair or replacement after assembly or for test and burn-in of the chip prior to final assembly. Thus the chip can be disassembled from the substrate without damage to either chip or substrate.
- a redistribution of the chip's electrical interconnection pads by incorporating in the precoated multilayer encapsulant an electrical redistribution layer comprising a thin printed circuit layer with electrical circuitry thereon.
- the interconnect pads on the chip are attached by solder bumps, conductive adhesive or wire bonds to the redistribution layer.
- the redistribution layer is subsequently encapsulated. Holes in the encapsulant expose metallized contact pads on the active surface of the redistribution layer. The holes are subsequently filled with solder as previously described.
- a flux adhesive layer is applied between the chip/encapsulant/redistribution layer subassembly and the substrate. The flux adhesive is applied remaining unhardened until the subassembly is placed on the substrate and the solder is reflowed.
- Another aspect of the present invention also provides within the precoated encapsulant a novel compliant flexible structure wherein the solder and encapsulant expand or contract laterally without cracking or delaminating upon heating or cooling of the chip and substrate.
- the novel encapsulant mainly provides the adhesive mechanical bond required to hold the chip on the substrate while the solder mainly provides the electrical interconnection required between the chip and the substrate.
- the compliant solder and flexible encapsulant of the present invention absorb the stress caused by the mismatched coefficients of thermal expansion without relying on bending of the chip and substrate. Since the mechanical adhesion of the chip to the substrate relies primarily on the encapsulant, a relatively soft, fatigue-less, highly pliable solder is used for the solder bumps to provide the electrical interconnection of the chip with the substrate.
- the compliant solder may have relatively weak mechanical properties on its own, therefore the encapsulant provides the mechanical strength. Relieving the solder of its mechanical tasks allows the use of soft, ductile and fluid-like solders that deform laterally with the expansion and contraction of the structure without the fatigue cracking normally experienced by conventional solders.
- Another embodiment of the present invention also provides within the novel compliant encapsulant previously described a compliant conductive adhesive which expands or contracts laterally upon heating or cooling to absorb the stresses created by the mismatch in the coefficients of thermal expansion and prevent bending of the chip and substrate.
- a compliant conductive adhesive which expands or contracts laterally upon heating or cooling to absorb the stresses created by the mismatch in the coefficients of thermal expansion and prevent bending of the chip and substrate.
- the structural properties of the novel encapsulant provides the mechanical connection required in the structure while the electrical properties of the compliant conductive adhesive provides the required electrical connection between the chip and the substrate.
- the semiconductor chip package structures of the present invention provide, among other advantages, simple chip placement followed by reflow without labor intensive underfill steps; a solder bumped or conductive adhesive bumped chip or substrate with an encapsulant pre-attached, with the encapsulant performing a mechanical function and the solder or conductive adhesive performing an electrical function; a pre-coated chip encapsulant of two or more layers, each layer performing a distinct function of attachment or reworkability; a reworkable flip chip assembly by means of a remeltable polymer in the encapsulant; an electrical redistribution layer within the encapsulant; a low-cost method for applying the solder bumps to a flip chip or flip chip substrate by creating holes in a pre-coated encapsulant; and a low-cost method for applying the conductive adhesive bumps to a flip chip or substrate by creating holes in a pre-coated encapsulant; and a compliant chip understructure that includes a fatigue-less solder or conductive adhesive.
- FIG. 1 is a diagrammatic representation of a prior art underfilled flip-chip structure under expansion-induced strain at elevated temperatures.
- FIG. 2 is a diagrammatic representation of a prior art underfilled flip-chip structure under contraction-induced strain at reduced temperatures.
- FIG. 3 is an assembled flip-chip structure in accordance with one embodiment of the present invention.
- FIG. 4 is a diagrammatic representation of one embodiment for forming a flip-chip structure.
- FIGS. 5-7 are diagrammatic representations of another embodiment for forming a flip-chip structure.
- FIGS. 8 and 9 are diagrammatic representations of another embodiment for forming a flip-chip structure.
- FIG. 10 is a diagrammatic representation of a flip-chip structure wherein the first portion of the encapsulant material is applied to the bumped chip and the second portion is applied to the substrate.
- FIG. 11 is a diagrammatic representation of the flip-chip structure of FIG. 10 after assembly.
- FIG. 12 is a diagrammatic representation of a flip-chip structure wherein the first portion of the encapsulant material is applied to the bumped chip and the second portion is applied over the first portion.
- FIGS. 13 and 14 illustrate a method for placing a flip-chip onto a printed circuit board that avoids entrapment of gas bubbles or formation of voids in the encapsulant.
- FIG. 15 is a diagrammatic representation of a compliant flip-chip structure in accordance with the present invention.
- FIG. 16 is a diagrammatic representation of the compliant flip-chip structure of FIG. 15 under expansion-induced strain at elevated temperatures.
- FIG. 17 is a diagrammatic representation of the compliant flip-chip structure of FIG. 15 under contraction-induced strain at reduced temperatures.
- FIGS. 18 and 19 are diagrammatic representations of yet another embodiment for forming a flip-chip structure.
- FIG. 20 is a diagrammatic representation of the reworkability of the flip-chip structure of FIGS. 18 and 19 .
- FIGS. 21 and 22 are diagrammatic representations of still another embodiment of a flip-chip structure.
- an integrated circuit chip 10 is shown mounted on a substrate 20 .
- a plurality of solder pads 12 on top surface 26 of the substrate 20 are arranged to receive corresponding solder bumps 14 connected to the contact pads 24 of the chip 10 .
- Each of the solder pads 12 is metallized so as to become solderable and electrically conductive to provide an electrical interconnection between the chip 10 and the substrate 20 .
- a gap 18 is formed around the solder bumps 14 between the top surface 26 of the substrate 20 and the bottom surface 16 of the chip 10 .
- the gap 18 typically varies from 2 to 6 mils.
- the gap 18 is completely filled with an encapsulant material 22 .
- the encapsulant material 22 is a compliant polymer composition.
- One preferred compliant composition which is not meant to limit the invention but only by way of example, is a compliant polyimide-siloxane co-polymer such as SumiOxy® 2421-A6-SP available from Oxychem, Grand Island, N.Y.
- the encapsulant material 22 is a rigid polymer composition.
- One preferred composition which is not meant to limit the invention but only by way of example, is an anhydride-cured epoxy resin. Other types of encapsulants known to those skilled in the art are possible.
- the encapsulant material 22 is applied to the chip in either liquid or adhesive tape form, then hardened.
- the chip 10 having separate discrete solder bumps 14 pre-assembled thereon is precoated with the encapsulant material 22 prior to assembly to the substrate 20 ( FIG. 4 ) to alleviate the underfill problems of the prior art processes and to overcome the performance limitations of substrates which are pre-coated with a homogeneous combination of adhesive material, fluxing agent and curing agent or chips which are pre-coated with a homogeneous combination of adhesive material, fluxing agent, curing agent and metal particles.
- the separate discrete solder bumps with encapsulant material therearound provide superior electrical performance compared to a distribution of metal particles spread throughout an encapsulating material.
- the encapsulating material 22 is uniformly spread across the surface 16 of the chip 10 between the solder bumps 14 covering the remainder of the chip 10 .
- the chip 10 is then positioned so that the solder bumps 14 are facing the substrate 20 and aligned with the solder pads 12 of the substrate.
- the solder bumps 14 protrude beyond the encapsulant after the encapsulant coating step.
- the solder bumps 14 are covered by the encapsulant 22 wherein the encapsulant is ground, melted away, shaved off or otherwise removed to expose the solder bumps prior to attachment to the substrate.
- the encapsulant 22 and solder bumps 14 are moved into intimate contact with the substrate 20 and solder pads 12 , respectively.
- the assembly is heated to cure the encapsulant 22 and reflow the solder using infrared reflow technology, preferably in a nitrogen blanket to attach the solder bumps 14 to the contact pads 12 of the substrate 20 .
- infrared reflow technology preferably in a nitrogen blanket to attach the solder bumps 14 to the contact pads 12 of the substrate 20 .
- Other heating and reflow techniques known to those skilled in the art, are possible.
- the encapsulant 22 provides a continuous seal between the chip 10 and the substrate 20 .
- the circuitry on the bottom surface 16 of the chip 10 is coated with the encapsulant 22 then the contact pads 24 are exposed by making vias 28 through the encapsulant 22 (e.g., either with a laser, plasma, chemical etching, a drill or by photo-imaging and development or any other method known to one skilled in the art) ( FIG. 6 ).
- the vias 28 within the encapsulant 22 are then filled with solder 30 ( FIG. 7 ) or a conductive adhesive as described in U.S. Pat. No. 5,376,403 which is forced into the holes by solder injection molding, solder jetting, screen printing, or other methods known to those skilled in the art.
- the solder 30 is reflowed to form the electrical connection between the chip and the substrate while the encapsulant 22 bonds to the substrate 20 and the chip 10 to form the structural connection.
- any of the above-described embodiments can be modified by precoating the substrate 20 (rather than the chip) with the encapsulant 22 or encapsulant 22 and solder 30 combination as shown in FIGS. 8 and 9 , respectively.
- an integrated circuit chip 10 is shown mounted on a substrate 20 in accordance with another embodiment of the present invention.
- a plurality of solder pads 12 on top surface 26 of the substrate 20 are arranged to receive corresponding solder bumps 14 connected to the contact pads (not shown in this embodiment) of the chip 10 .
- Each of the solder pads 12 is metallized so as to become solderable and electrically, conductive to provide an electrical interconnection between the chip 10 and the substrate 20 .
- a gap 18 is formed around the solder bumps 14 between the top surface 26 of the substrate 20 and the bottom surface 16 of the chip 10 .
- the gap 18 is completely filled with an encapsulant material 22 .
- the gap 18 typically varies from 2 to 6 mils.
- FIG. 11 illustrates one embodiment for forming the flip-chip package illustrated in FIG. 10 using two pre-coated portions of encapsulant.
- the chip 10 having separate discrete solder bumps 14 pre-assembled thereon is pre-coated with the first portion 37 of an encapsulant material 22 ( FIG. 10 ) prior to assembly to the substrate 20 .
- the first portion 37 contains a filler material, preferably highly filled, to reduce its coefficient of thermal expansion and increase its modulus relative to the encapsulant material not having any filler.
- the substrate 20 having a pattern of separate discrete solderable metal pads 12 thereon, is pre-coated with the second portion 39 of the encapsulant material prior to assembly with the chip 10 .
- the second portion 39 of the encapsulant material contains little or no filler material.
- the two-layer configuration alleviates the underfill problems of the prior art processes and overcomes the performance limitations of substrates which are pre-coated with a homogeneous combination of adhesive material, fluxing agent and curing agent or chips which are pre-coated with a homogeneous combination of adhesive material, fluxing agent, curing agent and metal filler particles.
- the first portion 37 which makes up part of the encapsulating material 22 ( FIG. 10 ) is uniformly spread across the surface 16 of the chip 10 between the solder bumps 14 to cover the remainder of the chip surface.
- the second portion 39 which makes up part of the encapsulating material 22 ( FIG. 10 ) is uniformly spread across the surface 26 of the substrate 20 over the solderable metal pads 12 covering the chip region of the substrate 20 .
- the chip 10 is then positioned so that the solder bumps 14 are facing the substrate 20 and aligned with the solder pads 12 of the substrate 20 .
- the solder bumps 14 can protrude beyond the first portion 37 (as shown in FIG.
- the encapsulant portion 37 and solder bumps 14 are moved into intimate contact with the encapsulant portion 39 and solder pads 12 , respectively.
- the combination of portions 37 and 39 forms the encapsulant 22 ( FIG. 10 ).
- the assembly is heated to cure the encapsulant 22 and reflow the solder using infrared reflow technology, preferably in a nitrogen blanket to attach the solder bumps 14 to the contact pads 12 of the substrate 20 .
- Other heating and reflow techniques known to those skilled in the art, can be used in the present invention.
- the encapsulant 22 provides a continuous seal between the chip 10 and the substrate 20 .
- FIG. 12 illustrates another embodiment for forming the flip-chip package illustrated in FIG. 10 using two pre-coated discrete portions of encapsulant.
- the chip 10 having separate discrete solder bumps 14 pre-assembled thereon is pre-coated with the first portion 37 of an encapsulant material 22 ( FIG. 10 ) prior to assembly to the substrate 20 .
- the first portion 37 contains a filler material, preferably highly filled, to reduce its coefficient of thermal expansion and increase its modulus.
- the first portion 37 is then pre-coated with the second portion 39 of the encapsulant material prior to assembly with the substrate 20 .
- the second portion 39 of the encapsulant material contains little or no filler material.
- the first portion 37 ( FIG. 12 ) which makes up part of the encapsulating material 22 ( FIG.
- the chip 10 is then positioned so that the solder bumps 14 are facing the substrate 20 and aligned with the solder pads 12 of the substrate 20 as described before.
- the encapsulant portions 37 and 39 and solder bumps 14 are moved into intimate contact with the substrate 20 and solder pads 12 .
- the combination of portions 37 and 39 forms the encapsulant 22 ( FIG. 10 ).
- The. assembly is heated to cure the encapsulant 22 and reflow the solder as described before to attach the solder bumps 14 to the contact pads 12 of the substrate 20 .
- FIGS. 13 and 14 illustrate an alternate embodiment for attachment of portion 37 and solder bumps 14 with the portion 39 and solder pads 12 , respectively. This method is described with respect to the embodiment shown in FIG. 11 , but is equally applicable to the embodiment shown in FIG. 12 .
- the chip 10 is initially oriented at an angle to the substrate 20 . As the encapsulant portion 37 and the solder bump on the end of the chip 10 are moved into intimate contact with the portion 39 and solder pad 12 , the chip is pivoted about the first point of contact until all of the solder bumps 14 are in contact with the solder pads 12 . In this manner, any gas that could possibly be entrapped between the first portion 37 and the second portion 39 is expelled as indicated by arrow 41 in FIG. 14 to prevent formation of voids in the encapsulant.
- the chip 10 is passivated with a thin layer of either silicon nitride, polyimide, or benzocyclobutene.
- a chip bonding layer may incorporate a coupling agent (not shown) such as a silane.
- the coupling agent provides a chemically compatible moiety for bonding.
- the preferred moieties can be epoxides, anhydrides, hydroxyls, or other moiety that readily bonds to the encapsulant 22 .
- the adhesive of the first portion 37 can be either an adhesive flux or a compatible non-fluxing adhesive.
- the significant properties of the first portion 37 are:
- the most distinguishing feature of the first portion 37 of the present invention is that it is filled with a high concentration of a powdered filler having a lower coefficient of thermal expansion and higher modulus, generally an inorganic material, and most preferably silica.
- the filler having a higher modulus and lower coefficient of thermal expansion than the adhesive alone produces an adhesive-filler aggregate having desired properties.
- Examples of such adhesives are Araldite CW1195US with cureer HW1196US available from Ciba Geigy Corporation and Hysol® FP4527 and Hysol® FP4511 available from the Dexter Corporation of Industry, California.
- the adhesive of the first portion 37 is preferably an adhesive flux.
- the significant property of the preferred first portion is that, in addition to the properties listed above, the preferred first portion adhesive does not diminish the flow of the solder during the solder reflowing operation. Many non-fluxing adhesives tend to either cure too quickly or react with the second portion adhesive in ways that decrease the wetting and spread of the solder during reflow.
- Using an adhesive flux highly filled with a powder filler that imparts the required coefficient of thermal expansion and modulus to the adhesive flux provides a first portion 37 that has little or no effect on the spread of the solder.
- FIG. 15 is a multi-layer compliant understructure configuration having two discrete bonding layers 32 and 34 in combination with any of the above-described embodiments for the encapsulant and solder.
- Chip bonding layer 32 is a thin polymer, or coupling agent, with high adhesion to the chip passivation layer (not shown) on the face of the chip 10 .
- the chip bonding layer 32 is a thin interfacial layer adhering the encapsulant material 22 to the chip 10 .
- the substrate bonding layer 34 is a thin, adhesive flux layer adhering the encapsulant 22 to the substrate 30 .
- the chip bonding layer 32 has the following properties:
- the chip 10 is passivated with a thin layer of either silicon nitride, polyimide, or benzocyclobutene.
- the chip bonding layer 32 may incorporate a coupling agent (not shown) such as a silane.
- the coupling agent provides a chemically compatible moiety for bonding.
- the preferred moieties can be epoxides, anhydrides, hydroxyls, or other moiety that readily bonds to the encapsulant 22 .
- the substrate bonding layer or adhesive flux 34 is a composition with the following properties:
- the substrate bonding layer or adhesive flux 34 comprises a liquid or solid composition which acts as both a primary fluxing agent and a crosslinking monomer or polymer. More specifically, the adhesive fluxes comprise the following:
- compositions are known in the prior art comprising these features, such as described in U.S. Pat. Nos. 5,376,403, 5,088,189, 5,136,365 and 5,128,746.
- a preferred composition is directed to fluxing adhesive compositions that include a fluxing agent comprising a single active component which is capable of functioning as both a primary fluxing agent and a crosslinking monomer.
- the inventive thermally curable adhesive composition comprises (a) a fluxing agent having a carboxylic acid group and one or more carbon-carbon double bonds, (b) optionally, a crosslinkable diluent, (c) optionally, a free-radical initiator, and (d) optionally, a resin.
- thermally curable adhesive composition may include a solvent for adjusting the viscosity.
- Other viscosity modifiers, thickeners and thixotropic agents may also be added.
- Fillers, such as silica powder, can be employed for increased modulus and lower thermal coefficient of expansion.
- the preferred fluxing agent has the structure RCOOH, wherein R comprises a moiety which include two or more carbon-carbon double bonds.
- the preferred fluxing agent is a carboxylic acid that is selected from the group consisting of compounds represented by Formulae I, II, III, and IV and mixtures thereof, HOOCCH ⁇ CH(O)COR 18 OC(O)CH ⁇ CHCOOH (I) R 2 H 2 C(HCOR n ) n CH 2 OR 3 (II) [X 1 X 2 X 3 X 4 ]C (III) R 17 COOH (IV) wherein R 18 is an alkyl having 1 to 16 carbons, preferably 1 to 9 carbons, and more preferably 1 to 3 carbons, wherein n is an integer from 1 to 16 preferably an integer from 1 to 9, and more preferably an integer from 1 to 3, wherein each of R 1 , R 2 , .
- the fluxingagent typically comprises about 0.01%-100%, preferably about 5%-80%, and more preferably about 10%-70% by volume of the thermally curable adhesive composition.
- a particularly preferred fluxing agent which has low-viscosity and high flux activity is tris (maleic acid) glycerol monoester which is described in Example 1.
- the fluxing agents of the preferred flux exhibit flux activities that are superior to that of prior art polymer-fluxing agent mixtures. Since the inventive fluxing agents are intrinsically self-crosslinking, the preferred thermally curable adhesive composition does not require the use of epoxy resins for crosslinking. As a corollary, the shelf life or pot life of the preferred composition is long and its flux activity high relative to conventional polymer-fluxing mixtures that include epoxy resins.
- the adhesion properties, mechanical integrity, and corrosion resistance achieved with the fluxing agents are superior to those achieved with prior art polymer fluxing agents because there is no need to add aggressive fluxing activators.
- the inventive fluxing agents are fully cross-linked and all components thereof are chemically immobilized upon curing. Even the reaction by-products of flux deoxidization of the metals may be chemically bound in the polymer matrix.
- Carboxylic acids function well as fluxing agents to remove oxides from metals.
- carboxylic acids are also very effective crosslinking moieties when present in their reactive form in a fluxing composition containing a suitable thermosetting resin, such as an epoxy.
- a suitable thermosetting resin such as an epoxy.
- chemical protection of the carboxylic acid was essential to achieving stability and preventing premature reactions. Protection was achieved by binding the fluxing agent with a chemically- or thermally-triggered species so that it becomes reactive only at or near the time that the solder melts.
- no such protection is necessary because the compositions can be formulated without any components that can crosslink with the carboxylic acid moiety.
- the principal crosslinking mechanism occurs at the carbon-carbon double bonds existing in the fluxing agent molecule and not at the carboxylic acid groups.
- the carboxylic acids do not react with the double bonds, therefore on its own, in the absence of other molecules that can react with the carboxylic acid, the fluxing agent does not polymerize at ambient temperatures. It is at elevated temperatures that the double bonds begin to open and react with other opened double bonds to crosslink. Since each fluxing agent molecule contains at least two double bonds, the molecules crosslink into polymeric networks.
- the flux activity can be kept very high without concern about pre-maturely cross-linking the thermosetting resin.
- an adhesive having a higher glass transition temperature and lower coefficient of thermal expansion can be created without sacrificing fluxing activity.
- a preferred embodiment of the fluxing agent has an amine moiety that is incorporated into the fluxing agent molecule itself.
- the generalized structure for carboxylic acids containing two or more carbon-carbon double bonds and also containing an amine is: in which R 7 comprises at least one amine group and two carbon-carbon double bonds.
- the presently preferred carboxylic acids containing double carbon-carbon bonds has the general structure: where R 3 , R 4 , and R 5 are either —H or —OCCH ⁇ CHCOOH.
- a particularly preferred amine containing fluxing agent is tris (maleic acid) triethanolamine monoester which is described in Example 2.
- the fluxing agent molecules having an amine moiety can moderate each other without the addition of a separate component, as illustrated here:
- Fluxing agents that do not contain nitrogen typically are liquid at ambient temperatures ( ⁇ 23° C.). Therefore, no solvent is required.
- amine containing fluxing agents are solid or semi-solid at ambient temperatures and form gels. with the addition of water or other solvent.
- thermally curable adhesive compositions can be formulated to be in the liquid, gel, or solid state.
- Preferred diluents include, for example, (a) penta erythritol tetraacrylate, C(CH 2 OOCCH ⁇ CH 2 ) 4 , (b) triallyl-1,3,5-triazine-2,4,6 (1H,3H,5H)-trione, (c) tris[2-(acryloxy)ethyl]isocyanurate, and mixtures thereof.
- Diluents (b) and (c) have the following structures: Other double bond compounds, many of which are commercially available, including, for example, diallyl phthalate and divinyl benzene can also be used.
- Hydrophobic diluents as described are preferred but hydrophilic diluents can also be employed when appropriate.
- the diluent when employed typically can comprise up to about 90%, preferably between about 5%-80%, and more preferably between about 50%-80% by volume of the thermally curable adhesive composition.
- hydrophobic diluents One benefit of employing hydrophobic diluents is that their presence tends to reduce the amount of water which the cured adhesive composition will absorb. The reason is that the fluxing agent, when crosslinked, will have active carboxylic groups that can attract water, even though these carboxylic groups, being part of a network, are immobile. Water acts as a plasticizer which softens the cured adhesive composition.
- the use of hydrophobic diluents which are crosslinked to the fluxing agent will counteract the hydrophilic effects of the carboxylic acid groups. Indeed, the cured adhesive compositions containing hydrophobic diluents can have less than 2% (wt) moisture when exposed to ambient conditions.
- Free Radical Initiators While the preferred thermally curable adhesive flux composition can be cured using heat alone, the cross linking reaction can be initiated and facilitated by the presence of free-radicals, including, for example, those generated by benzoyl peroxide, butyl hydroperoxide, 2,2′-azobisisobutyronitrile, and mixtures thereof. These free radical initiators or sources are commercially available.
- Free-radicals can be created in-situ by exposure of the free-radical initiator to heat, radiation, or other conventional energizing sources. Introduction of an appropriate free-radical initiator can accelerate the onset of crosslinking to the desired moment in a solder reflow operation. The presence of a small amount of free-radical crosslinking initiator in the fluxing agent can be used to control the rate and the temperature of crosslinking of the fluxing agent, ensuring effective fluxing action and strong adhesion of the fluxing agent to the substrates upon curing.
- the free radical initiator when employed typically comprises up to about 5%, preferably between about 0%-3%, and more preferably about 0.3%-1% by weight of the thermally curable adhesive composition.
- the preferred thermally curable adhesive flux composition does not require resins; further, compositions that do not include resins tend to have longer pot lives and lower viscosities during solder reflow.
- a resin can be employed and it functions to increase the adhesion of the cured composition to the substrate and to increase the cohesive strength and glass transition temperature of the cured composition.
- the resin may be any suitable resin that is compatible (i.e., blendable) with the preferred fluxing agent.
- the resins do not have to be chemically bonded to the fluxing agent and/or diluent, however, preferred resins can crosslink with the carboxylic acid groups in the fluxing agent or by other reactive moieties, such as optional —OH groups, in the diluent.
- Resins which meet these requirements include, but are not limited to, epoxies, phenolics, novalacs (both phenolic and cresolic), polyurethanes, polyimides, bismaleimides, maleimides, cyanate esters, polyvinyl alcohols, polyesters, and polyureas.
- Suitable compounds can also be modified to form resins that are blendable with the diluent and/or the carboxylic acid fluxing agent.
- examples of such compounds are acrylics, rubbers (butyl, nitrile, etc.), polyamides, polyacrylates, polyethers, polysulfones, polyethylenes, polypropylenes, polysiloxanes, polyvinyl acetates/polyvinyl esters, polyolefins, cyanoacrylates, and polystyrenes.
- any compound can function as a resin if it can be modified to contain at least one of the following illustrative functional groups that act as reactive sites for polymerization: anhydrides, carboxylic acids, amides, amines, alcohols/phenols, nitrites, carbamates, isocyanates, sulfonamides, semicarbazones, oximes, hydrazones, cyanohydrins, ureas, phosphoric esters/acids, thiophosphoric esters/acids, phosphonic esters/acids, phosphites, phosphonamides, and sulfonic esters/acids.
- anhydrides carboxylic acids, amides, amines, alcohols/phenols, nitrites, carbamates, isocyanates, sulfonamides, semicarbazones, oximes, hydrazones, cyanohydrins, ureas, phosphoric esters/acids
- a polyolefin which has no reactive sites for binding and has poor adhesive properties is typically not a suitable resin, however, a carboxylated polyolefin functions well when matched with a suitable cross-linking agent.
- a combination of these and other resins, such as non-cross-linkable thermoplastic resins, may also be used as resins.
- Resins when employed can comprise up to about 80%, preferably between about 10%-80%, and more preferably about 60%-70% by volume of the thermally curable adhesive composition.
- the proportions of the four components may be varied over a considerable range and still yield acceptable fluxing activity as well as good post cured material properties.
- the fluxing composition employed does not produce gaseous byproducts that can result in the formation of bubbles in the final cured composition. This can be achieved with thermally curable adhesive compositions preferably formulated as follows:
- Fluxing agent comprising about 5%-80% (vol) of the composition
- Free radical initiator comprising about 0%-3% (wt) of the composition
- Resin comprising about 0%-80% (vol) of the composition.
- thermally curable adhesive compositions within these ranges may exhibit undesirably high moisture absorption, low glass transition temperatures, or high coefficients of thermal expansions after cured, but they remain useful as fluxing compositions in applications where these characteristics are not critical.
- the thermally curable adhesive composition after being cured has a coefficient of thermal expansion of about 25 ppm/° C., a glass transition temperature in excess of 150° C. and moisture content of less than 2%.
- thermally curable adhesive compositions preferably formulated without any free radical initiator or resin but comprising about 10%-70% (vol) fluxing agent and about 20%-80% (vol) diluent.
- the thermally curable adhesive composition In order for the thermally curable adhesive composition to achieve the largest spreading and wetting by the solder, it must achieve and maintain low viscosity up to the temperature at which the solder melts and wets the metallizations. If the composition becomes too thick before the solder has melted, it will impede the flow of the solder melt and reduce the degree of metal soldering. For this reason, the curing of the composition must occur slowly relative to the time required to reach the melting point of the solder. This can be achieved by selection of the components with appropriate crosslinking temperatures and formulating the appropriate proportions by use of a differential scanning calorimeter to control reaction rates and times.
- the thermally curable adhesive composition can also be used as a fluxing adhesive for use in sinterable conductive ink compositions that comprises:
- a high melting point metal or metal alloy powder typically comprising Cu powder, however, other metals such as, for example, Ag, Au, Pt, Pd Be, Rh, Ni, Co, Fe, Mo, and high-melting point alloys thereof;
- a low melting point metal or metal alloy powder typically comprising Sn, Bi, Pb, Cd, Zn, Ga, In, Hg, Sb, or an alloy thereof or other metal having a melting point that is lower than that of the high melting metal powder in part (a); and
- thermally curable adhesive flux composition that also serves a flux composition and as an adhesive.
- the conductive ink composition comprises 13% to 65% (wt) of the high melting point metal, 6% to 29% (wt) of the low melting point metal, and/or 5% to 35% (wt) of the thermally curable adhesive flux composition.
- the inventive thermally curable composition exhibit the following features:
- This fluxing agent is also characterized by its low viscosity and high flux activity.
- the embodiment of FIG. 15 of a compliant multilayer encapsulating structure comprises a soft solder that is more compliant than conventional tin-lead eutectic solder or the 95% lead-5% tin solder used often for flip chip solder. bumps .
- One method comprises a tin-lead solder that has been modified with a small concentration, generally less than 1%, of an additive or additives.
- One. such additive, described in U.S. Pat. No. 5,308,578, is a small concentration of cadmium, indium, antimony, or combination thereof which is known to increase the fatigue life of the solder by up to twenty fold.
- Another method involves incorporating a small concentration of tin-copper or tin-nickel intermetallic which is known to decrease fatigue-induced microstructural coarsening leading to fatigue failure in tin-lead solder.
- solder Another method for increasing the compliance of solder in the present invention involves using a low-melting point solder. It is well known in the art that solders become more compliant as the temperature is elevated to approach their melting temperatures. In the instant invention, the preferred solder has a melting point near the highest operating temperature of the flip chip. Near such a melting point, the solder provides little mechanical resistance to the compliance of the chip-to-substrate interconnection and will readily conform to the stress induced by expansion or contraction of the interconnect during temperature excursions with little fatigue.
- Another method for increasing the compliance of solder in the present invention involves using a non-eutectic solder operating between the liquids and solidus temperatures. It is well established that in non-eutectic solders, there exist a temperature region in which the solder is neither fully solid nor fully liquid, but instead is a mixture of both phases, i.e., the plastic range. In the plastic range, the solder does not flow as liquid, yet it has very little mechanical integrity or structural strength. Under stress in the plastic range, the solder will flow readily, conforming to the applied stress without cracks or fatigue, provided the solder is not allowed to leak out of the solder bump by the encapsulating polymer.
- solder alloy can be selected that will be plastic over most of the temperature range experienced by the chip interconnect.
- solders may contain, but are not limited to, alloys of tin, lead, bismuth, indium, cadmium, gallium, zinc, antimony, and other metals known to the art of soldering.
- the complaint solder 14 and flexible encapsulant material 22 deform by expanding with the substrate 20 to absorb the strain without causing bending of the chip and substrate ( FIG. 16 ).
- the complaint solder 14 and flexible encapsulant 22 contract with the substrate 20 to absorb the strain ( FIG. 17 ).
- a chip 10 having solder bumps 14 pre-assembled thereon and being pre-coated with a multi-layer encapsulant material 36 prior to assembly to the substrate 20 ( FIG. 18 ).
- the multi-layer encapsulant material 36 is uniform across the surface of the chip 10 between the solder bumps 14 .
- Each layer of the multi-layer encapsulant material 36 perform distinct functions.
- Layers 38 and 40 are attachment and stress distribution layers.
- Layer 42 is the reworkability layer.
- Layers 38 and 40 are generally stiffer than layer 42 .
- Layers 38 and 40 are generally polymers or polymers filled with inorganic materials so as to have a high modulus and a low coefficient of thermal expansion such as polyimide.
- Layer 42 is generally a meltable polymer such as a thermoplastic, for example a polyimide-siloxane co-polymer.
- the layers can be comprised of coated tape, such as SumiOxy® ITA-5120 or ITA-5315 available from Oxychem, Grand Island, N.Y.
- a flux adhesive 34 as described previously is applied between the chip/encapsulant/solder bump combination and the substrate. The solder is reflowed and the flux adhesive 34 is hardened. Rework is made possible by the layer 42 . The layer 42 and solder bumps 14 are remelted and the chip 10 is pulled away from the substrate 20 ( FIG. 20 ).
- the flux adhesive 34 firmly retains the layer 40 and part of the solder bumps 14 on the substrate 20 while the chip bonding layer 38 firmly retains the other part of the solder bumps 14 on the chip 10 as the reworkable layer 42 separates without damage to the chip 10 or the substrate 20 .
- a multi-layer encapsulant material 44 attached to a chip 10 ( FIG. 21 ).
- the insulating layer 50 such as a polymer, encapsulate the solder bumps 52 and 54 .
- Solder bump 52 is connected to the chip 10 in a conventional manner.
- Solder bumps 54 are attached to the closely spaced contact pads 24 by the electrically conductive traces 48 of the redistribution layer 46 .
- Flux adhesive 34 as described previously retains the chip/multi-layer encapsulant/solder bump combination on the substrate 20 ( FIG. 22 ).
Abstract
A simplified process for flip-chip attachment of a chip to a substrate is provided by pre-coating the chip with an encapsulant underfill material having separate discrete solder columns therein to eliminate the conventional capillary flow underfill process. Such a structure permits incorporation of remeltable layers for rework, test, or repair. It also allows incorporation of electrical redistribution layers. In one aspect, the chip and pre-coated encapsulant are placed at an angle to the substrate and brought into contact with the pre-coated substrate, then the chip and precoated encapsulant are pivoted about the first point of contact, expelling any gas therebetween until the solder bumps on the chip are fully in contact with the substrate. There is also provided a flip-chip configuration having a complaint solder/flexible encapsulant understructure that deforms generally laterally with the substrate as the substrate undergoes expansion or contraction. With this configuration, the complaint solder/flexible encapsulant understructure absorbs the strain caused by the difference in the thermal coefficients of expansion between the chip and the substrate without bending the chip and substrate.
Description
- This application claims the benefit of U.S. Provisional Application Nos. 60/053,407, filed Jul. 21, 1997, and 60/056,043, filed Sep. 2, 1997, and incorporates herein the disclosures of those applications in their entirety.
- The U.S. Government has a paid-up license in this invention and the right in limited circumstances to require the patent owner to license others on reasonable terms as provided for by the terms of contract no. N00164-96-C-0089 awarded by Defense Advanced Research Projects Agency.
- This invention relates generally to semiconductor chips electrically and mechanically connected to a substrate, particularly to flip-chip configurations.
- Flip-chip technology is well known in the art. A semiconductor chip having solder bumps formed on the active side of the semi-conductor chip is inverted and bonded to a substrate through the solder bumps by reflowing the solder. Structural solder joints are formed between the semi-conductor chip and the substrate to form the mechanical and electrical connections between the chip and substrate. A narrow gap is left between the semi-conductor chip and the substrate.
- One obstacle to flip-chip technology when applied to polymer printed circuits is the unacceptably poor reliability of the solder joints due to the mismatch of the coefficients of thermal expansion between the chip, having a coefficient of thermal expansion of about 3 ppm/° C., and the polymer substrate, e.g. epoxy-glass having a coefficient of thermal expansion of about 16 to 26 ppm/° C., which causes stress build up in the solder joints. Because the structural solder joints are small, they are thus subject to failures. In the past, the solder joint integrity of flip-chip interconnects to a substrate has been enhanced by underfilling the volume between the chip and the substrate with an underfill encapsulant material comprised of a suitable polymer. The underfill material is typically dispensed around two adjacent sides of the semiconductor chip, then the underfill material slowly flows by capillary action to fill the gap between the chip and the substrate. The underfill material is then hardened by baking for an extended period. For the underfill encapsulant to be effective, it is important that it adhere well to the chip and the substrate to improve the solder joint integrity. Underfilling the chip with a subsequently cured encapsulant has been shown to reduce solder joint-cracking caused by thermal expansion mismatch between the chip and the substrate. The cured encapsulant reduces the stresses, induced by differential expansion and contraction, on the solder joints.
- The underfill process, however, makes the assembly of encapsulated flip-chip printed wire boards (PWB) a time consuming, labor intensive and expensive process with a number of uncertainties. To join the integrated circuit to the substrate, a flux, generally a no-clean, low residue flux, is placed on the chip or substrate. Then the integrated circuit is placed on the substrate. The assembly is subjected to a solder reflowing thermal cycle, soldering the chip to the substrate. The surface tension of the solder aids to self align the chip to the substrate terminals. After reflow, due to the close proximity of the chip to the substrate, removing flux residues from under the chip is such a difficult operation that it is generally not done. Therefore the flux residues are generally left in the space between the chip and the substrate. These residues are known to reduce the reliability and integrity of the encapsulant.
- After reflow, underfill encapsulation of the chip generally follows. In the prior art, the polymers of choice for the underfill encapsulation have been epoxies, the coefficient of thermal expansion and moduli of the epoxies being adjusted with the addition of inorganic fillers. To achieve optimum reliability, a coefficient of thermal expansion in the vicinity of 25 ppm/° C. is preferred and a modulus of 4 GPa or more. Since the preferred epoxies have coefficient of thermal expansions exceeding 80 ppm/° C. and moduli of less than 4 GPa, the inorganic fillers selected generally have much lower coefficient of thermal expansions and much higher moduli so that in the aggregate, the epoxy-inorganic mixture is within the desired range.
- The underfill encapsulation technique of the prior art has four principal disadvantages:
- 1. The reflowing of the solder bump and then underfilling and curing the encapsulant is a multi-step process that results in reduced production efficiency;
- 2. To underfill a flip-chip assembly takes too long because the material must flow through the tiny gap between the chip and the substrate;
- 3. The flux residues remaining in the gap reduce the adhesive and cohesive strengths of the underfill encapsulating adhesive, affecting the reliability of the assembly; and
- 4. As the size of chips increase, the limiting effect of capillary action becomes more critical and makes the encapsulation procedure more time consuming, more susceptible to void formation and to the separation of the polymer from the fillers during application.
- Clearly, many improvements to this process are feasible to increase reliability, reduce the time required and decrease the likelihood of producing a void in the encapsulant while providing the required low coefficient of thermal expansion and high modulus.
- Other prior art methods of encapsulating the chip have attempted to overcome the above limitations by applying the encapsulating resin through a hole in the substrate located near the center of the chip. After the soldering and cleaning operations, the. encapsulating resin is forced through the hole and around the periphery of the chip to ensure complete coverage of the chip surface. This method suffers from the need to reserve an area in the center of the substrate that is free of circuitry in order to provide an unused space for the hole. It also does not eliminate the problems of entrapped air bubbles.
- Another prior art method in U.S. Pat. No. 5,128,746 (Pennisi) teaches a method wherein an adhesive material including a fluxing agent is applied to the chip or substrate. The chip is positioned on the substrate and the solder bumps are reflowed. During the reflow step, the fluxing agent promotes wetting of the solder to the substrate metallization pattern and the adhesive material is cured, mechanically interconnecting and encapsulating the substrate to the component. The limitation of this technique is that in order for the molten solder to readily wet the substrate metallization and also to allow the solder, through surface tension, to self-align the chip bumps to the substrate metallization pattern, the material must maintain very low viscosity during the reflow step. But the viscosity of these materials is severely increased by the presence of the required inorganic fillers. As a result, this approach has failed to produce a material that can serve as both the flux and the encapsulant with the required low coefficient of thermal expansion and high modulus for optimum reliability.
- Referring to
FIGS. 1 and 2 , underfiring thechip 100 with a subsequently hardenedencapsulant 102 has been shown to reduce solder joint cracking caused by thermal expansion mismatch between the chip and thesubstrate 104. The hardenedencapsulant 102 transfers the stresses, induced by differential expansion and contraction, from thesolder joints 106 to deformation of thechip 100 andsubstrate 104 as shown inFIG. 1 for expansion-induced strain at elevated temperatures andFIG. 2 for contraction-induced strain at reduced temperatures. In other words, the main effect of the hardened encapsulant during thermal expansion or contraction is to effectively force the chip and the substrate to take up the stress caused by the coefficients of thermal expansion mismatch by bending and bulging the chip and substrate. This bending and bulging reduces the stress on the solder joints and virtually eliminates solder fatigue failure. - Unfortunately, the effect of the encapsulant bending the substrate and the chip causes its own new set of problems. One such problem is that the bending makes the chips susceptible to cracking. Another such problem is that the degree of stress relief is highly dependent on the flexibility of the under-lying substrate and is thus an unpredictable function of the design of the printed circuit. Another limitation is that relying on such bending for stress relief on the solder joints prevents the placement of flip chips directly opposite one another on a double-sided printed circuit.
- Another limitation of prior art flip-chip attachment is the difficulty of performing rework. Chip removal, once underfill has been performed, is very destructive to both the printed circuit board and the chip. Rework is almost impossible with prior art materials and processes. For example, the prior art procedure for removing an encapsulated die from a printed wire board is to grind it off manually.
- Another limitation of the prior art is the expense of applying solder bumps to a chip. The solder bumps have been applied to chips by one of several methods. Coating the solder on the chip bumps by evaporation of solder metals through a mask is one such method. This method suffers from 1) long deposition times, 2) limitations on the compositions of solder that can be applied to those metals that can be readily evaporated, and 3) evaporating the metals over large areas where the solder is ultimately not wanted. Also, since most solders contain lead, a toxic metal, evaporation involves removal and disposal of excess coated lead from equipment and masks. Another common method in the prior art is electroplating of the solder onto the chip pads through a temporary sacrificial mask. Electroplating is a slow and expensive process that also deposits the solder over large areas where the solder is ultimately not wanted. Another method is to screen print solder paste on the chips pad through a stencil, then reflowing the solder to form a ball or bump on the pad. This technique is limited to bump dimensions that can be readily stencil printed, so it is not practical in bump pitches of 25 microns or less.
- Another limitation of the prior art is the difficulty in distributing electrical signals from the small dimension of the chip to the large dimensions of the substrates. Most chips are manufactured with the electrical interconnection pads around their periphery with a pad pitch of 0.25 mm or less. On the other hand, printed circuits are manufactured with pad pitches of 0.25 mm and larger. This discrepancy in dimensions requires that the chip-to-substrate interconnection provide some method of redistributing the chip pad locations over a larger area so that they can match the dimensions of the printed circuit. Today, this discrepancy is bridged by creating expensive redistribution layers on the printed circuit. Few manufacturers are able to produce printed circuits at the tight dimensional tolerances required for redistribution, but those who are capable of doing so achieve this with significant production yield penalties. Another method to bridge the dimension discrepancy involves complete redesign of the chip to redistribute the electrical pads over the entire area of the chip, an expensive procedure that chip manufacturers generally want to avoid.
- In one aspect of the present invention there is provided a chip with underfilling encapsulant and separate discrete solder bumps pre-coated and pre-assembled on the chip for assembly to a substrate. This configuration provides a simple, cost-effective assembly procedure wherein the chip/encapsulant/discrete solder bump combination is placed on the substrate and subsequently heat is applied so that the solder is reflowed while simultaneously the encapsulant hardens, without the labor intensive underfill steps of the prior art.
- In another aspect of the present invention there is provided a chip precoated with underfilling encapsulant having holes therein which expose metallized contact pads on the active surface of the chip. The holes are subsequently filled with molten solder which is then cooled and hardened to create the chip/encapsulant/discrete solder bump assembly. The assembly can be placed on a substrate and subsequently, the solder is reflowed while simultaneously the encapsulant hardens, eliminating the labor intensive underfill steps of the prior art. Alternatively, the chip/encapsulant/discrete solder bump assembly is coated with a thin layer of a flux adhesive and, subsequently, the solder is reflowed while simultaneously the flux adhesive and encapsulant harden.
- In another aspect of the present invention there is provided a chip precoated with underfilling encapsulant having holes therein which expose metallized contact pads on the active surface of the chip. The holes are subsequently filled with an electrically conductive adhesive to create a chip/encapsulant/conductive adhesive bump assembly. The assembly can be placed on the substrate and subsequently the encapsulant and conductive adhesive are simultaneously hardened, without the labor intensive underfill steps of the prior art.
- The present invention also provides a substrate precoated with the encapsulant having holes therein which expose the metallized solder pads on the substrate. The holes are subsequently filled with molten solder or electrically conductive adhesive which is then cooled and hardened prior to attachment of the chip to the substrate by reflow. In another embodiment, the substrate has encapsulant and separate discrete solder columns pre-assembled thereon.
- In one aspect of the present invention, there is provided a first portion of an underfilling encapsulant and separate discrete solder bumps pre-coated and pre-assembled on a chip for assembly to a substrate. The first portion of encapsulant can be either a solid or a thick liquid, partially or fully uncured. A second portion of the encapsulant is applied to the substrate. The first portion of the encapsulant is filled, preferably highly filled, with a filler material to produce a reduced coefficient of thermal expansion and increased modulus. The second portion of the encapsulant is either lightly filled or completely devoid of filler material. At least the second portion of the encapsulant comprises an adhesive material with solder fluxing properties, for example, an adhesive flux. The first portion of the encapsulant can comprise a similar material or a conventional epoxy. The first portion is filled with a filler having a lower coefficient of thermal expansion and higher modulus than the encapsulant material without filler to increase the encapsulant's modulus and reduce its coefficient of thermal expansion. The invention provides a simple, cost-effective assembly procedure wherein the chip/first portion of encapsulant/discrete solder bump combination is placed on the substrate/second portion of encapsulant combination and subsequently heat is applied so that the solder is reflowed while simultaneously the encapsulant cures, without the labor intensive, time-consuming underfill steps of the prior art. Preferably, the second portion constitutes a relatively thin layer in the overall encapsulant structure which somewhat intermixes with the first portion during cure and has minimal effect on the reliability of the flip-chip structure, despite the second portion having generally a lower modulus and higher coefficient of thermal expansion than the first portion. An advantage of the present invention is that the lower viscosity of the unfilled or lightly filled second portion during the reflow process allows the solder to flow without impediment from the thick viscosity of the first portion of the encapsulant. The present invention provides a low coefficient of thermal expansion and high modulus in the first portion of the encapsulant while at the same time achieving good solder wetting and chip self aligning in the second portion of the encapsulant.
- In another aspect of the present invention, the chip/first portion of encapsulant/discrete solder bump assembly described above is coated with a thin layer of the second portion of the encapsulant which is either lightly filled or completely devoid of filler material. Placement of the chip, solder reflow and adhesive cure follows as described above.
- In another aspect of the present invention, there is provided a method for placing a flip-chip onto a substrate that avoids entrapment of gas bubbles or creation of voids. The chip, having the first portion of encapsulant thereon, is oriented at an angle to the substrate having the second portion thereon, then pivoted about the first point of contact until the solder bumps on the chip are in contact with the solder pads on the substrate, creating an underfill of encapsulant material as the chip is pivoted while expelling the gas from between the chip and substrate.
- Another aspect of the present invention provides a chip with underfilling encapsulant pre-coated and pre-assembled on the chip for assembly to a substrate, wherein the encapsulant consists of more than one layer, each layer performing one or more distinct functions such as attachment, stress distribution, electrical redistribution, reworkability, adhesion, or other functions. The bulk of the encapsulant, consisting of one or more layers, is applied and partially or fully hardened prior to assembly of the chip on the substrate. Holes therein which expose metallized contact pads on the active surface of the chip are subsequently filled with solder or an electrically conductive adhesive as previously described to create an encapsulated subassembly. Then a flux adhesive is applied between the chip/encapsulant/solder bump combination and the substrate which can be fully hardened after or when the chip/encapsulant/solder bump combination is placed on the substrate and the solder is reflowed.
- Removal of the chip from the substrate is made possible by incorporating in the pre-coated multi-layer encapsulant a polymer layer that can be remelted even after the chip has been assembled to the substrate. Remelting the solder and the polymer encapsulant layer allows removal of the chip for repair or replacement after assembly or for test and burn-in of the chip prior to final assembly. Thus the chip can be disassembled from the substrate without damage to either chip or substrate.
- In another aspect of the present invention there is provided a redistribution of the chip's electrical interconnection pads by incorporating in the precoated multilayer encapsulant an electrical redistribution layer comprising a thin printed circuit layer with electrical circuitry thereon. The interconnect pads on the chip are attached by solder bumps, conductive adhesive or wire bonds to the redistribution layer. The redistribution layer is subsequently encapsulated. Holes in the encapsulant expose metallized contact pads on the active surface of the redistribution layer. The holes are subsequently filled with solder as previously described. Then a flux adhesive layer is applied between the chip/encapsulant/redistribution layer subassembly and the substrate. The flux adhesive is applied remaining unhardened until the subassembly is placed on the substrate and the solder is reflowed.
- Another aspect of the present invention also provides within the precoated encapsulant a novel compliant flexible structure wherein the solder and encapsulant expand or contract laterally without cracking or delaminating upon heating or cooling of the chip and substrate. The novel encapsulant mainly provides the adhesive mechanical bond required to hold the chip on the substrate while the solder mainly provides the electrical interconnection required between the chip and the substrate.
- The compliant solder and flexible encapsulant of the present invention absorb the stress caused by the mismatched coefficients of thermal expansion without relying on bending of the chip and substrate. Since the mechanical adhesion of the chip to the substrate relies primarily on the encapsulant, a relatively soft, fatigue-less, highly pliable solder is used for the solder bumps to provide the electrical interconnection of the chip with the substrate. The compliant solder may have relatively weak mechanical properties on its own, therefore the encapsulant provides the mechanical strength. Relieving the solder of its mechanical tasks allows the use of soft, ductile and fluid-like solders that deform laterally with the expansion and contraction of the structure without the fatigue cracking normally experienced by conventional solders.
- Another embodiment of the present invention also provides within the novel compliant encapsulant previously described a compliant conductive adhesive which expands or contracts laterally upon heating or cooling to absorb the stresses created by the mismatch in the coefficients of thermal expansion and prevent bending of the chip and substrate. Independent of each other, the structural properties of the novel encapsulant provides the mechanical connection required in the structure while the electrical properties of the compliant conductive adhesive provides the required electrical connection between the chip and the substrate.
- The semiconductor chip package structures of the present invention provide, among other advantages, simple chip placement followed by reflow without labor intensive underfill steps; a solder bumped or conductive adhesive bumped chip or substrate with an encapsulant pre-attached, with the encapsulant performing a mechanical function and the solder or conductive adhesive performing an electrical function; a pre-coated chip encapsulant of two or more layers, each layer performing a distinct function of attachment or reworkability; a reworkable flip chip assembly by means of a remeltable polymer in the encapsulant; an electrical redistribution layer within the encapsulant; a low-cost method for applying the solder bumps to a flip chip or flip chip substrate by creating holes in a pre-coated encapsulant; and a low-cost method for applying the conductive adhesive bumps to a flip chip or substrate by creating holes in a pre-coated encapsulant; and a compliant chip understructure that includes a fatigue-less solder or conductive adhesive.
-
FIG. 1 is a diagrammatic representation of a prior art underfilled flip-chip structure under expansion-induced strain at elevated temperatures. -
FIG. 2 is a diagrammatic representation of a prior art underfilled flip-chip structure under contraction-induced strain at reduced temperatures. -
FIG. 3 is an assembled flip-chip structure in accordance with one embodiment of the present invention. -
FIG. 4 is a diagrammatic representation of one embodiment for forming a flip-chip structure. -
FIGS. 5-7 are diagrammatic representations of another embodiment for forming a flip-chip structure. -
FIGS. 8 and 9 are diagrammatic representations of another embodiment for forming a flip-chip structure. -
FIG. 10 is a diagrammatic representation of a flip-chip structure wherein the first portion of the encapsulant material is applied to the bumped chip and the second portion is applied to the substrate. -
FIG. 11 is a diagrammatic representation of the flip-chip structure ofFIG. 10 after assembly. -
FIG. 12 is a diagrammatic representation of a flip-chip structure wherein the first portion of the encapsulant material is applied to the bumped chip and the second portion is applied over the first portion. -
FIGS. 13 and 14 illustrate a method for placing a flip-chip onto a printed circuit board that avoids entrapment of gas bubbles or formation of voids in the encapsulant. -
FIG. 15 is a diagrammatic representation of a compliant flip-chip structure in accordance with the present invention. -
FIG. 16 is a diagrammatic representation of the compliant flip-chip structure ofFIG. 15 under expansion-induced strain at elevated temperatures. -
FIG. 17 is a diagrammatic representation of the compliant flip-chip structure ofFIG. 15 under contraction-induced strain at reduced temperatures. -
FIGS. 18 and 19 are diagrammatic representations of yet another embodiment for forming a flip-chip structure. -
FIG. 20 is a diagrammatic representation of the reworkability of the flip-chip structure ofFIGS. 18 and 19 . -
FIGS. 21 and 22 are diagrammatic representations of still another embodiment of a flip-chip structure. - Referring to
FIG. 3 , anintegrated circuit chip 10 is shown mounted on asubstrate 20. A plurality ofsolder pads 12 ontop surface 26 of thesubstrate 20 are arranged to receive corresponding solder bumps 14 connected to thecontact pads 24 of thechip 10. Each of thesolder pads 12 is metallized so as to become solderable and electrically conductive to provide an electrical interconnection between thechip 10 and thesubstrate 20. With this flip-chip mounting arrangement, agap 18 is formed around the solder bumps 14 between thetop surface 26 of thesubstrate 20 and thebottom surface 16 of thechip 10. Thegap 18 typically varies from 2 to 6 mils. Thegap 18 is completely filled with anencapsulant material 22. In one embodiment of the invention, theencapsulant material 22 is a compliant polymer composition. One preferred compliant composition, which is not meant to limit the invention but only by way of example, is a compliant polyimide-siloxane co-polymer such as SumiOxy® 2421-A6-SP available from Oxychem, Grand Island, N.Y. Alternatively, in another embodiment of the instant invention, theencapsulant material 22 is a rigid polymer composition. One preferred composition, which is not meant to limit the invention but only by way of example, is an anhydride-cured epoxy resin. Other types of encapsulants known to those skilled in the art are possible. Theencapsulant material 22 is applied to the chip in either liquid or adhesive tape form, then hardened. - In another embodiment, the
chip 10 having separate discrete solder bumps 14 pre-assembled thereon is precoated with theencapsulant material 22 prior to assembly to the substrate 20 (FIG. 4 ) to alleviate the underfill problems of the prior art processes and to overcome the performance limitations of substrates which are pre-coated with a homogeneous combination of adhesive material, fluxing agent and curing agent or chips which are pre-coated with a homogeneous combination of adhesive material, fluxing agent, curing agent and metal particles. The separate discrete solder bumps with encapsulant material therearound provide superior electrical performance compared to a distribution of metal particles spread throughout an encapsulating material. The encapsulatingmaterial 22 is uniformly spread across thesurface 16 of thechip 10 between the solder bumps 14 covering the remainder of thechip 10. Thechip 10 is then positioned so that the solder bumps 14 are facing thesubstrate 20 and aligned with thesolder pads 12 of the substrate. In one embodiment, the solder bumps 14 protrude beyond the encapsulant after the encapsulant coating step. In an alternate embodiment, the solder bumps 14 are covered by theencapsulant 22 wherein the encapsulant is ground, melted away, shaved off or otherwise removed to expose the solder bumps prior to attachment to the substrate. Theencapsulant 22 and solder bumps 14 are moved into intimate contact with thesubstrate 20 andsolder pads 12, respectively. The assembly is heated to cure theencapsulant 22 and reflow the solder using infrared reflow technology, preferably in a nitrogen blanket to attach the solder bumps 14 to thecontact pads 12 of thesubstrate 20. Other heating and reflow techniques, known to those skilled in the art, are possible. Theencapsulant 22 provides a continuous seal between thechip 10 and thesubstrate 20. - In yet another embodiment (
FIG. 5 ), the circuitry on thebottom surface 16 of thechip 10 is coated with theencapsulant 22 then thecontact pads 24 are exposed by makingvias 28 through the encapsulant 22 (e.g., either with a laser, plasma, chemical etching, a drill or by photo-imaging and development or any other method known to one skilled in the art) (FIG. 6 ). Thevias 28 within theencapsulant 22 are then filled with solder 30 (FIG. 7 ) or a conductive adhesive as described in U.S. Pat. No. 5,376,403 which is forced into the holes by solder injection molding, solder jetting, screen printing, or other methods known to those skilled in the art. With any of these embodiments, thesolder 30 is reflowed to form the electrical connection between the chip and the substrate while theencapsulant 22 bonds to thesubstrate 20 and thechip 10 to form the structural connection. As can be easily appreciated by one of ordinary skill in the art, any of the above-described embodiments can be modified by precoating the substrate 20 (rather than the chip) with theencapsulant 22 orencapsulant 22 andsolder 30 combination as shown inFIGS. 8 and 9 , respectively. - Referring to
FIG. 10 , anintegrated circuit chip 10 is shown mounted on asubstrate 20 in accordance with another embodiment of the present invention. A plurality ofsolder pads 12 ontop surface 26 of thesubstrate 20 are arranged to receive corresponding solder bumps 14 connected to the contact pads (not shown in this embodiment) of thechip 10. Each of thesolder pads 12 is metallized so as to become solderable and electrically, conductive to provide an electrical interconnection between thechip 10 and thesubstrate 20. With this flip-chip mounting arrangement, agap 18 is formed around the solder bumps 14 between thetop surface 26 of thesubstrate 20 and thebottom surface 16 of thechip 10. Thegap 18 is completely filled with anencapsulant material 22. Thegap 18 typically varies from 2 to 6 mils. -
FIG. 11 illustrates one embodiment for forming the flip-chip package illustrated inFIG. 10 using two pre-coated portions of encapsulant. Thechip 10 having separate discrete solder bumps 14 pre-assembled thereon is pre-coated with thefirst portion 37 of an encapsulant material 22 (FIG. 10 ) prior to assembly to thesubstrate 20. Thefirst portion 37 contains a filler material, preferably highly filled, to reduce its coefficient of thermal expansion and increase its modulus relative to the encapsulant material not having any filler. Thesubstrate 20, having a pattern of separate discretesolderable metal pads 12 thereon, is pre-coated with thesecond portion 39 of the encapsulant material prior to assembly with thechip 10. Thesecond portion 39 of the encapsulant material contains little or no filler material. The two-layer configuration alleviates the underfill problems of the prior art processes and overcomes the performance limitations of substrates which are pre-coated with a homogeneous combination of adhesive material, fluxing agent and curing agent or chips which are pre-coated with a homogeneous combination of adhesive material, fluxing agent, curing agent and metal filler particles. - The first portion 37 (
FIG. 11 ) which makes up part of the encapsulating material 22 (FIG. 10 ) is uniformly spread across thesurface 16 of thechip 10 between the solder bumps 14 to cover the remainder of the chip surface. The second portion 39 (FIG. 11 ) which makes up part of the encapsulating material 22 (FIG. 10 ) is uniformly spread across thesurface 26 of thesubstrate 20 over thesolderable metal pads 12 covering the chip region of thesubstrate 20. Thechip 10 is then positioned so that the solder bumps 14 are facing thesubstrate 20 and aligned with thesolder pads 12 of thesubstrate 20. The solder bumps 14 can protrude beyond the first portion 37 (as shown inFIG. 11 ) of the encapsulant after the encapsulant coating step of thechip 10. Theencapsulant portion 37 and solder bumps 14 are moved into intimate contact with theencapsulant portion 39 andsolder pads 12, respectively. The combination ofportions FIG. 10 ). The assembly is heated to cure theencapsulant 22 and reflow the solder using infrared reflow technology, preferably in a nitrogen blanket to attach the solder bumps 14 to thecontact pads 12 of thesubstrate 20. Other heating and reflow techniques, known to those skilled in the art, can be used in the present invention. Theencapsulant 22 provides a continuous seal between thechip 10 and thesubstrate 20. -
FIG. 12 illustrates another embodiment for forming the flip-chip package illustrated inFIG. 10 using two pre-coated discrete portions of encapsulant. Thechip 10 having separate discrete solder bumps 14 pre-assembled thereon is pre-coated with thefirst portion 37 of an encapsulant material 22 (FIG. 10 ) prior to assembly to thesubstrate 20. Thefirst portion 37 contains a filler material, preferably highly filled, to reduce its coefficient of thermal expansion and increase its modulus. Thefirst portion 37 is then pre-coated with thesecond portion 39 of the encapsulant material prior to assembly with thesubstrate 20. Thesecond portion 39 of the encapsulant material contains little or no filler material. The first portion 37 (FIG. 12 ) which makes up part of the encapsulating material 22 (FIG. 10 ) is uniformly spread across thesurface 16 of thechip 10 between the solder bumps 14 to cover the remainder of the chip surface. The second portion. 39 (FIG. 12 ) which makes up part of the encapsulating material 22 (FIG. 10 ) is uniformly spread over the prior appliedfirst portion 37. Thechip 10 is then positioned so that the solder bumps 14 are facing thesubstrate 20 and aligned with thesolder pads 12 of thesubstrate 20 as described before. Theencapsulant portions substrate 20 andsolder pads 12. The combination ofportions FIG. 10 ). The. assembly is heated to cure theencapsulant 22 and reflow the solder as described before to attach the solder bumps 14 to thecontact pads 12 of thesubstrate 20. -
FIGS. 13 and 14 illustrate an alternate embodiment for attachment ofportion 37 and solder bumps 14 with theportion 39 andsolder pads 12, respectively. this method is described with respect to the embodiment shown inFIG. 11 , but is equally applicable to the embodiment shown inFIG. 12 . Thechip 10 is initially oriented at an angle to thesubstrate 20. As theencapsulant portion 37 and the solder bump on the end of thechip 10 are moved into intimate contact with theportion 39 andsolder pad 12, the chip is pivoted about the first point of contact until all of the solder bumps 14 are in contact with thesolder pads 12. In this manner, any gas that could possibly be entrapped between thefirst portion 37 and thesecond portion 39 is expelled as indicated byarrow 41 inFIG. 14 to prevent formation of voids in the encapsulant. - Generally, the
chip 10 is passivated with a thin layer of either silicon nitride, polyimide, or benzocyclobutene. To adhere well to the passivation layer (not shown) on thechip 10, a chip bonding layer (not shown in this embodiment) may incorporate a coupling agent (not shown) such as a silane. To adhere well to theencapsulant 22, the coupling agent (not shown) provides a chemically compatible moiety for bonding. For example, the preferred moieties can be epoxides, anhydrides, hydroxyls, or other moiety that readily bonds to theencapsulant 22. - The adhesive of the
first portion 37 can be either an adhesive flux or a compatible non-fluxing adhesive. The significant properties of thefirst portion 37 are: - 1. After cure, a coefficient of thermal expansion in the vicinity of 25 ppm/° C.;
- 2. After cure, a Tg above 120° C.;
- 3. After cure, a modulus greater than 0.1 GPa, preferably greater than 4 GPa;
- 4. After cure, high adhesion to the chips passivation layer that usually consists of silicon nitride, polyimide, or benzocyclobutene;
- 5. Solventless;
- 6. A chemical composition such that it does not interfere or adversely affect the properties of the
second portion 39 of the encapsulant to which it will be mated; and - 7. After cure, high adhesion to the
second portion 39 of the encapsulant. - Since the intrinsic coefficient of thermal expansion and moduli of most polymeric adhesives do not satisfy the first or third properties above, the most distinguishing feature of the
first portion 37 of the present invention is that it is filled with a high concentration of a powdered filler having a lower coefficient of thermal expansion and higher modulus, generally an inorganic material, and most preferably silica. The filler having a higher modulus and lower coefficient of thermal expansion than the adhesive alone produces an adhesive-filler aggregate having desired properties. Examples of such adhesives are Araldite CW1195US with cureer HW1196US available from Ciba Geigy Corporation and Hysol® FP4527 and Hysol® FP4511 available from the Dexter Corporation of Industry, California. - Preferably, the adhesive of the
first portion 37 is preferably an adhesive flux. The significant property of the preferred first portion is that, in addition to the properties listed above, the preferred first portion adhesive does not diminish the flow of the solder during the solder reflowing operation. Many non-fluxing adhesives tend to either cure too quickly or react with the second portion adhesive in ways that decrease the wetting and spread of the solder during reflow. Using an adhesive flux highly filled with a powder filler that imparts the required coefficient of thermal expansion and modulus to the adhesive flux provides afirst portion 37 that has little or no effect on the spread of the solder. - The embodiment of
FIG. 15 is a multi-layer compliant understructure configuration having two discrete bonding layers 32 and 34 in combination with any of the above-described embodiments for the encapsulant and solder.Chip bonding layer 32 is a thin polymer, or coupling agent, with high adhesion to the chip passivation layer (not shown) on the face of thechip 10. Thechip bonding layer 32 is a thin interfacial layer adhering theencapsulant material 22 to thechip 10. Thesubstrate bonding layer 34 is a thin, adhesive flux layer adhering theencapsulant 22 to thesubstrate 30. - The
chip bonding layer 32 has the following properties: - 1) chemically bonds to the
encapsulant 22 to provide high adhesive strength to the encapsulant; and - 2) chemically bonds to the passivation layer on the
chip 10 to provide high adhesive strength to the chip. - Generally, the
chip 10 is passivated with a thin layer of either silicon nitride, polyimide, or benzocyclobutene. To adhere well to the passivation layer (not shown) on thechip 10, thechip bonding layer 32 may incorporate a coupling agent (not shown) such as a silane. To adhere well to theencapsulant 22, the coupling agent (not shown) provides a chemically compatible moiety for bonding. For example, the preferred moieties can be epoxides, anhydrides, hydroxyls, or other moiety that readily bonds to theencapsulant 22. - The substrate bonding layer or
adhesive flux 34 is a composition with the following properties: - 1) a strong fluxing agent that removes oxides from the metal surfaces to be soldered and promotes wetting of the metal pads to be soldered;
- 2) crosslinks into an adhesive polymer during the soldering operation, chemically immobilizing the fluxing agent and the flux reaction byproducts;
- 3) has a sufficiently low viscosity during the soldering operation that it does not impede the flow of the molten solder;
- 4) after curing, no cleaning or washing for flux removal is required;
- 5) high adhesive strength after cure;
- 6) corrosion resistance and resistance to degradation at soldering temperatures; and
- 7) does not evolve any gases that can cause voids or bubbles in the adhesive during curing.
- In general terms, the substrate bonding layer or
adhesive flux 34 comprises a liquid or solid composition which acts as both a primary fluxing agent and a crosslinking monomer or polymer. More specifically, the adhesive fluxes comprise the following: - 1) chemical components with carboxylic acid moieties for fluxing;
- 2) chemical components with polymerizable moieties for crosslinking the composition;
- 3) a chemical or mechanical mechanism for impeding or preventing the onset of polymerization of the composition until the solder has melted and wetted all the surfaces to be soldered; and
- 4) optional solvents, fillers, moderating agents, surfactants, modifiers, resins and other additives performing desirable functions and generally known to those skilled in the art.
- A number of compositions are known in the prior art comprising these features, such as described in U.S. Pat. Nos. 5,376,403, 5,088,189, 5,136,365 and 5,128,746. A preferred composition is directed to fluxing adhesive compositions that include a fluxing agent comprising a single active component which is capable of functioning as both a primary fluxing agent and a crosslinking monomer. Generally, depending upon the intended end use, the inventive thermally curable adhesive composition comprises (a) a fluxing agent having a carboxylic acid group and one or more carbon-carbon double bonds, (b) optionally, a crosslinkable diluent, (c) optionally, a free-radical initiator, and (d) optionally, a resin.
- In addition the thermally curable adhesive composition may include a solvent for adjusting the viscosity. Other viscosity modifiers, thickeners and thixotropic agents may also be added. Fillers, such as silica powder, can be employed for increased modulus and lower thermal coefficient of expansion.
- 1. Fluxing Agents. The preferred fluxing agent has the structure RCOOH, wherein R comprises a moiety which include two or more carbon-carbon double bonds.
- For high flux activity due to the presence of multiple carboxylic acids, the preferred fluxing agent is a carboxylic acid that is selected from the group consisting of compounds represented by Formulae I, II, III, and IV and mixtures thereof,
HOOCCH═CH(O)COR18OC(O)CH═CHCOOH (I)
R2H2C(HCORn)nCH2OR3 (II)
[X1X2X3X4]C (III)
R17COOH (IV)
wherein R18 is an alkyl having 1 to 16 carbons, preferably 1 to 9 carbons, and more preferably 1 to 3 carbons, wherein n is an integer from 1 to 16 preferably an integer from 1 to 9, and more preferably an integer from 1 to 3, wherein each of R1, R2, . . . Rn, is independently selected from —C(O)CH═CHCOOH, and H, wherein X1, X2, X3, and X4, are each independently selected from —CH2OH and —CH2OC(O)CH═CHCOOH, and wherein R17 is a moiety having two or more carbon-carbon double bonds and an amine moiety. The fluxingagent typically comprises about 0.01%-100%, preferably about 5%-80%, and more preferably about 10%-70% by volume of the thermally curable adhesive composition. A particularly preferred fluxing agent which has low-viscosity and high flux activity is tris (maleic acid) glycerol monoester which is described in Example 1. - The fluxing agents of the preferred flux exhibit flux activities that are superior to that of prior art polymer-fluxing agent mixtures. Since the inventive fluxing agents are intrinsically self-crosslinking, the preferred thermally curable adhesive composition does not require the use of epoxy resins for crosslinking. As a corollary, the shelf life or pot life of the preferred composition is long and its flux activity high relative to conventional polymer-fluxing mixtures that include epoxy resins.
- Further, the adhesion properties, mechanical integrity, and corrosion resistance achieved with the fluxing agents are superior to those achieved with prior art polymer fluxing agents because there is no need to add aggressive fluxing activators. The inventive fluxing agents are fully cross-linked and all components thereof are chemically immobilized upon curing. Even the reaction by-products of flux deoxidization of the metals may be chemically bound in the polymer matrix.
- Carboxylic acids function well as fluxing agents to remove oxides from metals. In addition, carboxylic acids are also very effective crosslinking moieties when present in their reactive form in a fluxing composition containing a suitable thermosetting resin, such as an epoxy. For this reason, in the prior art, chemical protection of the carboxylic acid was essential to achieving stability and preventing premature reactions. Protection was achieved by binding the fluxing agent with a chemically- or thermally-triggered species so that it becomes reactive only at or near the time that the solder melts. However, with the present invention, no such protection is necessary because the compositions can be formulated without any components that can crosslink with the carboxylic acid moiety. This results in a fluxing agent that can function at its full strength with the metal oxides to produce fluxing that is superior to any heretofore polymerizable fluxing agent. The flux activity of the inventive fluxing agent in some applications may be too high thereby requiring dilution of the fluxing agent to prevent formation of undesirable gaseous by-products.
- With the inventive fluxing agent, the principal crosslinking mechanism occurs at the carbon-carbon double bonds existing in the fluxing agent molecule and not at the carboxylic acid groups. The carboxylic acids do not react with the double bonds, therefore on its own, in the absence of other molecules that can react with the carboxylic acid, the fluxing agent does not polymerize at ambient temperatures. It is at elevated temperatures that the double bonds begin to open and react with other opened double bonds to crosslink. Since each fluxing agent molecule contains at least two double bonds, the molecules crosslink into polymeric networks.
- By eliminating the need for a separate thermosetting resin in the flux composition, as is required in the prior art, the flux activity can be kept very high without concern about pre-maturely cross-linking the thermosetting resin. By crosslinking the fluxing agent itself, an adhesive having a higher glass transition temperature and lower coefficient of thermal expansion can be created without sacrificing fluxing activity.
- A preferred embodiment of the fluxing agent has an amine moiety that is incorporated into the fluxing agent molecule itself. The generalized structure for carboxylic acids containing two or more carbon-carbon double bonds and also containing an amine is:
in which R7 comprises at least one amine group and two carbon-carbon double bonds. For high flux activity due to the presence of multiple carboxylic acids, the presently preferred carboxylic acids containing double carbon-carbon bonds has the general structure:
where R3, R4, and R5 are either —H or —OCCH═CHCOOH. For its low viscosity and high flux activity, a particularly preferred amine containing fluxing agent is tris (maleic acid) triethanolamine monoester which is described in Example 2. - The fluxing agent molecules having an amine moiety can moderate each other without the addition of a separate component, as illustrated here:
- The net result of this moderating mechanism is to cause the fluxing agent to gel at room temperature. Yet, as the temperature is elevated above approximately 50-100° C., these materials will liquefy readily to a low viscosity liquid, indicating the
thermal disassociation of these ionic bonds. Thus the carboxylic acid moiety is then fully discharged to flux the oxidized metal surfaces at temperatures above 50-100° C. - Fluxing agents that do not contain nitrogen (e.g., amine) as represented, for example, by Formulae I, II, III, and IV, typically are liquid at ambient temperatures (˜23° C.). Therefore, no solvent is required. In contrast, amine containing fluxing agents are solid or semi-solid at ambient temperatures and form gels. with the addition of water or other solvent. Thus, by employing both amine and non-nitrogen containing fluxing agents and optionally including a solvent, a thermally curable adhesive composition having the consistency of a tacky gel mixture can be formulated. With the present invention, thermally curable adhesive compositions can be formulated to be in the liquid, gel, or solid state.
- 2. Diluents. The presence of carbon-carbon double bond(s) in the preferred fluxing agent molecule allows much flexibility in the formulation of a flux composition with exceptional thermomechanical properties. This is achieved by the addition of double bond containing diluents that can also crosslink with the preferred flux to create a superior adhesive. This technique permits the design of fluxing adhesive compositions that can attain high crosslink densities, which are desirable for good thermomechanical properties and good adhesion. Moreover, this is accomplished without the concern of premature crosslinking and reduced pot life associated with the prior art. Preferred diluents include, for example, (a) penta erythritol tetraacrylate, C(CH2OOCCH═CH2)4, (b) triallyl-1,3,5-triazine-2,4,6 (1H,3H,5H)-trione, (c) tris[2-(acryloxy)ethyl]isocyanurate, and mixtures thereof. Diluents (b) and (c) have the following structures:
Other double bond compounds, many of which are commercially available, including, for example, diallyl phthalate and divinyl benzene can also be used. Hydrophobic diluents as described are preferred but hydrophilic diluents can also be employed when appropriate. The diluent when employed typically can comprise up to about 90%, preferably between about 5%-80%, and more preferably between about 50%-80% by volume of the thermally curable adhesive composition. - One benefit of employing hydrophobic diluents is that their presence tends to reduce the amount of water which the cured adhesive composition will absorb. The reason is that the fluxing agent, when crosslinked, will have active carboxylic groups that can attract water, even though these carboxylic groups, being part of a network, are immobile. Water acts as a plasticizer which softens the cured adhesive composition. The use of hydrophobic diluents which are crosslinked to the fluxing agent will counteract the hydrophilic effects of the carboxylic acid groups. Indeed, the cured adhesive compositions containing hydrophobic diluents can have less than 2% (wt) moisture when exposed to ambient conditions.
- 3. Free Radical Initiators. While the preferred thermally curable adhesive flux composition can be cured using heat alone, the cross linking reaction can be initiated and facilitated by the presence of free-radicals, including, for example, those generated by benzoyl peroxide, butyl hydroperoxide, 2,2′-azobisisobutyronitrile, and mixtures thereof. These free radical initiators or sources are commercially available.
- Free-radicals can be created in-situ by exposure of the free-radical initiator to heat, radiation, or other conventional energizing sources. Introduction of an appropriate free-radical initiator can accelerate the onset of crosslinking to the desired moment in a solder reflow operation. The presence of a small amount of free-radical crosslinking initiator in the fluxing agent can be used to control the rate and the temperature of crosslinking of the fluxing agent, ensuring effective fluxing action and strong adhesion of the fluxing agent to the substrates upon curing.
- The free radical initiator when employed typically comprises up to about 5%, preferably between about 0%-3%, and more preferably about 0.3%-1% by weight of the thermally curable adhesive composition.
- 4. Resins. The preferred thermally curable adhesive flux composition does not require resins; further, compositions that do not include resins tend to have longer pot lives and lower viscosities during solder reflow. However, as an option, a resin can be employed and it functions to increase the adhesion of the cured composition to the substrate and to increase the cohesive strength and glass transition temperature of the cured composition. The resin may be any suitable resin that is compatible (i.e., blendable) with the preferred fluxing agent. By blendable is meant that the resins do not have to be chemically bonded to the fluxing agent and/or diluent, however, preferred resins can crosslink with the carboxylic acid groups in the fluxing agent or by other reactive moieties, such as optional —OH groups, in the diluent. Resins which meet these requirements include, but are not limited to, epoxies, phenolics, novalacs (both phenolic and cresolic), polyurethanes, polyimides, bismaleimides, maleimides, cyanate esters, polyvinyl alcohols, polyesters, and polyureas.
Preferred resins 1,4-cyclohexanedimethanol diglycidyl ether, 3,4-epoxycyclohexylmethyl 3,4-epoxycyclohexanecarboxylate, N,N-diglycidyl-4-glycidyl-oxyanilline, bisphenol A based epoxy resins, and mixtures thereof. These are commercially available. - Suitable compounds (including polymers) can also be modified to form resins that are blendable with the diluent and/or the carboxylic acid fluxing agent. Examples of such compounds are acrylics, rubbers (butyl, nitrile, etc.), polyamides, polyacrylates, polyethers, polysulfones, polyethylenes, polypropylenes, polysiloxanes, polyvinyl acetates/polyvinyl esters, polyolefins, cyanoacrylates, and polystyrenes. Generally, any compound can function as a resin if it can be modified to contain at least one of the following illustrative functional groups that act as reactive sites for polymerization: anhydrides, carboxylic acids, amides, amines, alcohols/phenols, nitrites, carbamates, isocyanates, sulfonamides, semicarbazones, oximes, hydrazones, cyanohydrins, ureas, phosphoric esters/acids, thiophosphoric esters/acids, phosphonic esters/acids, phosphites, phosphonamides, and sulfonic esters/acids. For example, a polyolefin which has no reactive sites for binding and has poor adhesive properties is typically not a suitable resin, however, a carboxylated polyolefin functions well when matched with a suitable cross-linking agent. A combination of these and other resins, such as non-cross-linkable thermoplastic resins, may also be used as resins. Resins when employed can comprise up to about 80%, preferably between about 10%-80%, and more preferably about 60%-70% by volume of the thermally curable adhesive composition.
- In preparing the preferred fluxing composition, the proportions of the four components may be varied over a considerable range and still yield acceptable fluxing activity as well as good post cured material properties. Preferably, the fluxing composition employed does not produce gaseous byproducts that can result in the formation of bubbles in the final cured composition. This can be achieved with thermally curable adhesive compositions preferably formulated as follows:
- a) Fluxing agent comprising about 5%-80% (vol) of the composition;
- b) Diluent comprising about 5%-80% (vol) of the composition;
- c) Free radical initiator comprising about 0%-3% (wt) of the composition; and
- d) Resin comprising about 0%-80% (vol) of the composition.
- Some of the thermally curable adhesive compositions within these ranges may exhibit undesirably high moisture absorption, low glass transition temperatures, or high coefficients of thermal expansions after cured, but they remain useful as fluxing compositions in applications where these characteristics are not critical.
- Most preferably, the thermally curable adhesive composition after being cured has a coefficient of thermal expansion of about 25 ppm/° C., a glass transition temperature in excess of 150° C. and moisture content of less than 2%. These characteristics can be achieved with thermally curable adhesive compositions preferably formulated without any free radical initiator or resin but comprising about 10%-70% (vol) fluxing agent and about 20%-80% (vol) diluent.
- While, again, some of the fluxing agents within these ranges may exhibit high coefficient of thermal expansion or low glass transition temperature when cured, they remain useful as fluxes in applications where these characteristics are not critical.
- In order for the thermally curable adhesive composition to achieve the largest spreading and wetting by the solder, it must achieve and maintain low viscosity up to the temperature at which the solder melts and wets the metallizations. If the composition becomes too thick before the solder has melted, it will impede the flow of the solder melt and reduce the degree of metal soldering. For this reason, the curing of the composition must occur slowly relative to the time required to reach the melting point of the solder. This can be achieved by selection of the components with appropriate crosslinking temperatures and formulating the appropriate proportions by use of a differential scanning calorimeter to control reaction rates and times.
- The thermally curable adhesive composition can also be used as a fluxing adhesive for use in sinterable conductive ink compositions that comprises:
- a) 1% to 65% (wt) of a high melting point metal or metal alloy powder, typically comprising Cu powder, however, other metals such as, for example, Ag, Au, Pt, Pd Be, Rh, Ni, Co, Fe, Mo, and high-melting point alloys thereof;
- b) 6% to 65% (wt) of a low melting point metal or metal alloy powder (solder), typically comprising Sn, Bi, Pb, Cd, Zn, Ga, In, Hg, Sb, or an alloy thereof or other metal having a melting point that is lower than that of the high melting metal powder in part (a); and
- c) 5% to 50% (wt) of the thermally curable adhesive flux composition that also serves a flux composition and as an adhesive.
- Preferably the conductive ink composition comprises 13% to 65% (wt) of the high melting point metal, 6% to 29% (wt) of the low melting point metal, and/or 5% to 35% (wt) of the thermally curable adhesive flux composition.
- Techniques for employing electrically conductive ink compositions are described in U.S. Pat. Nos. 5,376,403, 5,538,789, and 5,565,267 which are incorporated herein. During the curing process of the sinterable conductive ink compositions, in order for the solder alloy to readily wet the other powder and sinter, the principal requirement of the thermally curable adhesive composition is that the polymers not harden before melting of the solder powder is achieved. Additionally, after curing, the composition must act as an adhesive that strongly binds the cured ink composition to the printed circuit board substrate. The flux compositions of the instant invention are particularly suited for these applications.
- The inventive thermally curable composition exhibit the following features:
- a) provides sufficient flux activity to promote the solder bump to readily wet the metallization on the substrate during solder reflow, without the presence of corrosive flux activators that can contaminate the silicon chip;
- b) promotes solder wetting and self-alignment of the chip to the pads on the substrate by action of the wetting force of the molten solder, during the solder reflow cycle, no curing of the flux composition occurs until the solder bump has been melted;
- c) reduces or eliminates gaseous evolution during the reflow cycle that would otherwise create voids;
- d) cures quickly and soon after solder bump melts;
- e) demonstrates little shrinkage of the composition during curing to maximize the stress resulting from the curing process and subsequent cooling; and
- f) forms strong adhesion of the cured composition to the chip, substrate and solder joints.
-
- Three moles of maleic anhydride (294 grams) were heated in a flask at 80° C. until fully melted at which time one mole of glycerol (92 grams) was slowly added thereto. The composition was constantly stirred and maintained at 80° C. for three hours. The temperature was then raised to 110° C. for one hour to complete the reaction. Thereafter the product was allowed to cool to room temperature. The reactants were kept in a nitrogen atmosphere throughout. Monitoring the reaction on a Fourier-transform infrared spectrometer, the OH vibrational band at 3,400-3,500 cm−1 of the glycerol was observed to become minimized while an ester vibration band at 1,710-1,740 cm−1 appeared and maximized, indicating complete reaction of the glycerol and the anhydride. This fluxing agent is characterized by its low viscosity and high flux activity.
-
- Three moles of maleic anhydride (294 grams) were heated in a flask at 80° C. until fully melted at which time one mole of triethanolamine (149 grams) was slowly added thereto over the course of one hour, so that gelation did not occur. The composition was constantly stirred and maintained at 80° C. To ensure that the reaction went to completion, the product was maintained at 80° C. with constant stirring for an additional hour. The reactants were kept in a nitrogen atmosphere throughout. Then the product was allowed to cool to room temperature. Monitoring the reaction on a Fourier-transform infrared spectrometer, the OH vibrational band at 3,400-3,500 cm−1 of the triethanolamine was observed to become minimized while an ester vibration band at 1,710-1,740 cm−1 appeared and maximized, indicating complete reaction of the triethanolamine and the anhydride.
- This fluxing agent is also characterized by its low viscosity and high flux activity.
-
-
- 49 g maleic anhydride was heated to 80° C. until all the maleic anhydride was melted before 15.2 g of adonitol was added under mechanical stirring. The temperature was then increased to 120° C. for 30 minutes followed by cooling down to 80° C. The reactants were stirred at 80° C. for 3 hours to finish the reaction. The reaction is:
- The embodiment of
FIG. 15 of a compliant multilayer encapsulating structure comprises a soft solder that is more compliant than conventional tin-lead eutectic solder or the 95% lead-5% tin solder used often for flip chip solder. bumps . There are at least two methods for accomplishing this, and other methods will be known to those skilled in the art. One method comprises a tin-lead solder that has been modified with a small concentration, generally less than 1%, of an additive or additives. One. such additive, described in U.S. Pat. No. 5,308,578, is a small concentration of cadmium, indium, antimony, or combination thereof which is known to increase the fatigue life of the solder by up to twenty fold. Another method involves incorporating a small concentration of tin-copper or tin-nickel intermetallic which is known to decrease fatigue-induced microstructural coarsening leading to fatigue failure in tin-lead solder. - Another method for increasing the compliance of solder in the present invention involves using a low-melting point solder. It is well known in the art that solders become more compliant as the temperature is elevated to approach their melting temperatures. In the instant invention, the preferred solder has a melting point near the highest operating temperature of the flip chip. Near such a melting point, the solder provides little mechanical resistance to the compliance of the chip-to-substrate interconnection and will readily conform to the stress induced by expansion or contraction of the interconnect during temperature excursions with little fatigue.
- Another method for increasing the compliance of solder in the present invention involves using a non-eutectic solder operating between the liquids and solidus temperatures. It is well established that in non-eutectic solders, there exist a temperature region in which the solder is neither fully solid nor fully liquid, but instead is a mixture of both phases, i.e., the plastic range. In the plastic range, the solder does not flow as liquid, yet it has very little mechanical integrity or structural strength. Under stress in the plastic range, the solder will flow readily, conforming to the applied stress without cracks or fatigue, provided the solder is not allowed to leak out of the solder bump by the encapsulating polymer. For this reason, a non-eutectic solder alloy can be selected that will be plastic over most of the temperature range experienced by the chip interconnect. Such solders may contain, but are not limited to, alloys of tin, lead, bismuth, indium, cadmium, gallium, zinc, antimony, and other metals known to the art of soldering.
- With the present invention illustrated in
FIG. 15 , as the flip-chip configuration is heated causing thesubstrate 20 to laterally expand greater than thechip 10 because of the mismatch in the thermal coefficients of expansion between the chip and substrate, thecomplaint solder 14 andflexible encapsulant material 22 deform by expanding with thesubstrate 20 to absorb the strain without causing bending of the chip and substrate (FIG. 16 ). Likewise, as the flip-chip configuration is cooled below ambient temperature, thecomplaint solder 14 andflexible encapsulant 22 contract with thesubstrate 20 to absorb the strain (FIG. 17 ). - In another embodiment of the invention, there is a
chip 10 having solder bumps 14 pre-assembled thereon and being pre-coated with amulti-layer encapsulant material 36 prior to assembly to the substrate 20 (FIG. 18 ). Themulti-layer encapsulant material 36 is uniform across the surface of thechip 10 between the solder bumps 14. Each layer of themulti-layer encapsulant material 36 perform distinct functions.Layers Layer 42 is the reworkability layer.Layers layer 42.Layers Layer 42 is generally a meltable polymer such as a thermoplastic, for example a polyimide-siloxane co-polymer. The layers can be comprised of coated tape, such as SumiOxy® ITA-5120 or ITA-5315 available from Oxychem, Grand Island, N.Y. A flux adhesive 34 as described previously is applied between the chip/encapsulant/solder bump combination and the substrate. The solder is reflowed and theflux adhesive 34 is hardened. Rework is made possible by thelayer 42. Thelayer 42 and solder bumps 14 are remelted and thechip 10 is pulled away from the substrate 20 (FIG. 20 ). The flux adhesive 34 firmly retains thelayer 40 and part of the solder bumps 14 on thesubstrate 20 while thechip bonding layer 38 firmly retains the other part of the solder bumps 14 on thechip 10 as thereworkable layer 42 separates without damage to thechip 10 or thesubstrate 20. - In another embodiment of the present invention, there is provided a
multi-layer encapsulant material 44 attached to a chip 10 (FIG. 21 ). Within themulti-layer encapsulant 44 is anelectrical redistribution layer 46 of electrically conductive traces 48 on an insulatinglayer 50. The insulatinglayer 50, such as a polymer, encapsulate the solder bumps 52 and 54.Solder bump 52 is connected to thechip 10 in a conventional manner. Solder bumps 54 are attached to the closely spacedcontact pads 24 by the electrically conductive traces 48 of theredistribution layer 46. Flux adhesive 34 as described previously retains the chip/multi-layer encapsulant/solder bump combination on the substrate 20 (FIG. 22 ). - It will now be apparent to those skilled in the art that various modifications, variations, substitutions, and equivalents exist for various elements of the invention but which do not materially depart from the spirit and scope of the invention. Accordingly, it is expressly intended that all such modifications, variations, substitutions and equivalents which fall within the spirit and scope of the invention as defined by the appended claims be embraced thereby.
Claims (63)
1.-52. (canceled)
53. An encapsulated semiconductor chip comprising an active surface with an encapsulant composition deposited on said active surface, said encapsulant composition comprising at least two distinct portions:
a) a distinct first portion having a thermally curable composition comprising an inorganic filler; and
b) a distinct second portion having a thermally curable composition without an inorganic filler.
54. The encapsulated semiconductor chip of claim 53 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
55. The encapsulated semiconductor chip of claim 53 wherein the inorganic filler material comprises silica.
56. The encapsulated semiconductor chip of claim 53 wherein said encapsulant composition is a solid.
57. The encapsulated semiconductor chip of claim 53 wherein said encapsulant composition is a viscous liquid.
58. The encapsulated semiconductor chip of claim 53 wherein the semiconductor chip further comprises solder bumps.
59. The encapsulated semiconductor chip of claim 53 wherein the thermally curable composition of the distinct second portion has fluxing properties.
60. The encapsulated semiconductor chip of claim 53 wherein the thermally curable composition of the distinct first portion is uncured.
61. The encapsulated semiconductor chip of claim 53 wherein the thermally curable composition of the distinct second portion is uncured.
62. A method for manufacturing an encapsulated semiconductor chip comprising the steps of:
a) providing a chip with solder bumps on an active surface thereof;
b) depositing a distinct first portion of an encapsulant composition on said active surface, said distinct first portion having a having a thermally curable composition comprising an inorganic filler;
c) providing a substrate having a pattern of separate discrete solderable metal pads thereon, at least one of said pads corresponding to at least one of said solder bumps;
d) depositing a distinct second portion of said encapsulant composition on said substrate surface, said distinct second portion having a thermally curable composition without an inorganic filler and wherein said first distinct portion has a large amount of inorganic filler with respect to the amount of inorganic filler in said second distinct portion; and
e) attaching the chip to the substrate to form said encapsulated semiconductor chip wherein the solder bumps are facing the substrate and aligned with the solder pads.
63. The method according to claim 62 further comprising the step of heating the encapsulated semiconductor chip to cure said encapsulant composition and reflow the solder, said heating being done after the step of attachment.
64. The method according to claim 63 wherein the step of heating is accomplished using solder reflow technology.
65. The method of claim 62 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
66. The method of claim 62 wherein the inorganic filler material comprises silica.
67. The method of claim 62 wherein said encapsulant composition is a solid.
68. The method of claim 62 wherein said encapsulant composition is a viscous liquid.
69. The method of claim 62 wherein the thermally curable composition of the distinct second portion has fluxing properties.
70. The method of claim 62 wherein the thermally curable composition of the distinct first portion is uncured.
71. The method of claim 62 wherein the thermally curable composition of the distinct second portion is uncured.
72. A method for manufacturing an encapsulated semiconductor chip comprising the steps of:
a) providing a chip with solder bumps on an active surface thereof;
b) depositing a distinct first portion of an encapsulant composition on said active surface, said distinct first portion having a having a thermally curable composition comprising an inorganic filler;
c) depositing a distinct second portion of said encapsulant composition on said distinct first portion, said distinct second portion having a thermally curable composition without an inorganic filler and wherein said first distinct portion has a large amount of inorganic filler with respect to the amount of inorganic filler in said second distinct portion;
d) providing a substrate having a pattern of separate discrete solderable metal pads thereon, at least one of said pads corresponding to at least one of said solder bumps; and
e) attaching the chip to the substrate to form said encapsulated semiconductor chip wherein the solder bumps are facing the substrate and aligned with the solder pads.
73. The method according to claim 72 further comprising the step of heating the encapsulated semiconductor chip to cure said encapsulant composition and reflow the solder, said heating being done after the step of attachment.
74. The method according to claim 73 wherein the step of heating is accomplished using solder reflow technology.
75. The method of claim 72 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
76. The method of claim 72 wherein the inorganic filler material comprises silica.
77. The method of claim 72 wherein said encapsulant composition is a solid.
78. The method of claim 72 wherein said encapsulant composition is a viscous liquid.
79. The method of claim 72 wherein the semiconductor chip further comprises solder bumps.
80. The method of claim 72 wherein the thermally curable composition of the distinct second portion has fluxing properties.
81. The method of claim 72 wherein the thermally curable composition of the distinct first portion is uncured.
82. The method of claim 72 wherein the thermally curable composition of the distinct second portion is uncured.
83. An encapsulated semiconductor chip comprising an active surface with an encapsulant composition deposited on said active surface, said encapsulant composition comprising at least two distinct portions:
a) a distinct first portion having a thermally curable composition comprising an inorganic filler; and
b) a distinct second portion having a thermally curable composition comprising an inorganic filler;
wherein said first distinct portion has a large concentration of inorganic filler with respect to the concentration of inorganic filler in said second distinct portion.
84. The encapsulated semiconductor chip of claim 83 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
85. The encapsulated semiconductor chip of claim 83 wherein the inorganic filler material comprises silica.
86. The encapsulated semiconductor chip of claim 83 wherein said encapsulant composition is a solid.
87. The encapsulated semiconductor chip of claim 83 wherein said encapsulant composition is a viscous liquid.
88. The encapsulated semiconductor chip of claim 83 wherein the semiconductor chip further comprises solder bumps.
89. The encapsulated semiconductor chip of claim 83 wherein the thermally curable composition of the distinct second portion has fluxing properties.
90. The encapsulated semiconductor chip of claim 83 wherein the thermally curable composition of the distinct first portion is uncured.
91. The encapsulated semiconductor chip of claim 83 wherein the thermally curable composition of the distinct second portion is uncured.
92. A method for manufacturing an encapsulated semiconductor chip comprising the steps of:
a) providing a chip with solder bumps on an active surface thereof;
b) depositing an encapsulant on said active surface, said encapsulant comprising:
(1) a distinct first portion thermally curable composition comprising an inorganic filler;
(2) a distinct second portion thermally curable composition without an inorganic filler;
d) providing a substrate having a pattern of separate discrete solderable metal pads thereon, at least one of said pads corresponding to at least one of said solder bumps; and
e) attaching the chip to the substrate to form said encapsulated semiconductor chip wherein the solder bumps are facing the substrate and aligned with the solder pads.
93. The method according to claim 92 further comprising the step of heating the encapsulated semiconductor chip to cure said encapsulant composition and reflow the solder, said heating being done after the step of attachment.
94. The method according to claim 93 wherein the step of heating is accomplished using solder reflow technology.
95. The method of claim 92 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
96. The method of claim 92 wherein the inorganic filler material comprises silica.
97. The method of claim 92 wherein said encapsulant composition is a solid.
98. The method of claim 92 wherein said encapsulant composition is a viscous liquid.
99. The method of claim 92 wherein the semiconductor chip further comprises solder bumps.
100. The method of claim 92 wherein the thermally curable composition of the distinct second portion has fluxing properties.
101. The method of claim 92 wherein the thermally curable composition of the distinct first portion is uncured.
102. The method of claim 92 wherein the thermally curable composition of the distinct second portion is uncured.
103. The method of claim 92 wherein said first distinct portion has a large amount of inorganic filler with respect to the amount of inorganic filler in said second distinct portion.
104. A method for manufacturing an encapsulated semiconductor chip comprising the steps of:
a) providing a chip with solder bumps on an active surface thereof;
b) depositing an encapsulant on said active surface, said encapsulant comprising:
(1) a distinct first portion having a thermally curable composition comprising an inorganic filler; and;
(2) a distinct second portion having a thermally curable composition comprising an inorganic filler, wherein said first distinct portion has a large concentration of inorganic filler with respect to the concentration of inorganic filler in said second distinct portion.
d) providing a substrate having a pattern of separate discrete solderable metal pads thereon, at least one of said pads corresponding to at least one of said solder bumps; and
e) attaching the chip to the substrate to form said encapsulated semiconductor chip wherein the solder bumps are facing the substrate and aligned with the solder pads.
105. The method according to claim 104 further comprising the step of heating the encapsulated semiconductor chip to cure said encapsulant composition and reflow the solder, said heating being done after the step of attachment.
106. The method according to claim 105 wherein the step of heating is accomplished using solder reflow technology.
107. The method of claim 104 wherein the thermally curable composition of the distinct first portion further comprises an epoxy resin.
108. The method of claim 104 wherein the inorganic filler material comprises silica.
109. The method of claim 104 wherein said encapsulant composition is a solid.
110. The method of claim 104 wherein said encapsulant composition is a viscous liquid.
111. The method of claim 104 wherein the semiconductor chip further comprises solder bumps.
112. The method of claim 104 wherein the thermally curable composition of the distinct second portion has fluxing properties.
113. The method of claim 104 wherein the thermally curable composition of the distinct first portion is uncured.
114. The method of claim 104 wherein the thermally curable composition of the distinct second portion is uncured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/855,708 US20050218517A1 (en) | 1997-07-21 | 2004-05-28 | Semiconductor flip-chip package and method for the fabrication thereof |
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US5340797P | 1997-07-21 | 1997-07-21 | |
US5604397P | 1997-09-02 | 1997-09-02 | |
US09/120,172 US6121689A (en) | 1997-07-21 | 1998-07-21 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/662,642 US6566234B1 (en) | 1997-07-21 | 2000-09-15 | Semiconductor flip-chip package and method for the fabrication thereof |
US10/390,603 US6774493B2 (en) | 1997-07-21 | 2003-03-19 | Semiconductor flip-chip package and method for the fabrication thereof |
US10/855,708 US20050218517A1 (en) | 1997-07-21 | 2004-05-28 | Semiconductor flip-chip package and method for the fabrication thereof |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/390,603 Continuation US6774493B2 (en) | 1997-07-21 | 2003-03-19 | Semiconductor flip-chip package and method for the fabrication thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
US20050218517A1 true US20050218517A1 (en) | 2005-10-06 |
Family
ID=26731833
Family Applications (7)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/120,172 Expired - Lifetime US6121689A (en) | 1996-10-31 | 1998-07-21 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/137,971 Expired - Lifetime US6297560B1 (en) | 1996-10-31 | 1998-08-21 | Semiconductor flip-chip assembly with pre-applied encapsulating layers |
US09/662,642 Expired - Lifetime US6566234B1 (en) | 1997-07-21 | 2000-09-15 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/662,641 Expired - Lifetime US6518677B1 (en) | 1997-07-21 | 2000-09-15 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/935,432 Abandoned US20020014703A1 (en) | 1997-07-21 | 2001-08-20 | Semiconductor flip-chip package and method for the fabrication thereof |
US10/390,603 Expired - Lifetime US6774493B2 (en) | 1997-07-21 | 2003-03-19 | Semiconductor flip-chip package and method for the fabrication thereof |
US10/855,708 Abandoned US20050218517A1 (en) | 1997-07-21 | 2004-05-28 | Semiconductor flip-chip package and method for the fabrication thereof |
Family Applications Before (6)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/120,172 Expired - Lifetime US6121689A (en) | 1996-10-31 | 1998-07-21 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/137,971 Expired - Lifetime US6297560B1 (en) | 1996-10-31 | 1998-08-21 | Semiconductor flip-chip assembly with pre-applied encapsulating layers |
US09/662,642 Expired - Lifetime US6566234B1 (en) | 1997-07-21 | 2000-09-15 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/662,641 Expired - Lifetime US6518677B1 (en) | 1997-07-21 | 2000-09-15 | Semiconductor flip-chip package and method for the fabrication thereof |
US09/935,432 Abandoned US20020014703A1 (en) | 1997-07-21 | 2001-08-20 | Semiconductor flip-chip package and method for the fabrication thereof |
US10/390,603 Expired - Lifetime US6774493B2 (en) | 1997-07-21 | 2003-03-19 | Semiconductor flip-chip package and method for the fabrication thereof |
Country Status (6)
Country | Link |
---|---|
US (7) | US6121689A (en) |
EP (1) | EP1025587A4 (en) |
JP (1) | JP2001510944A (en) |
AU (1) | AU8502798A (en) |
DE (1) | DE1025587T1 (en) |
WO (1) | WO1999004430A1 (en) |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050082670A1 (en) * | 2003-09-11 | 2005-04-21 | Nordson Corporation | Method for preapplying a viscous material to strengthen solder connections in microelectronic packaging and microelectronic packages formed thereby |
US20050196959A1 (en) * | 2002-04-26 | 2005-09-08 | Kazuykoshi Ueno | Semiconductor device and manufacturing process therefor as well as plating solution |
US20060040567A1 (en) * | 2004-08-20 | 2006-02-23 | International Business Machines Corporation | Compressible films surrounding solder connectors |
US20060043603A1 (en) * | 2004-08-31 | 2006-03-02 | Lsi Logic Corporation | Low temperature PB-free processing for semiconductor devices |
US20060128067A1 (en) * | 2002-10-04 | 2006-06-15 | International Rectifier Corporation | Semiconductor device package |
US20070004091A1 (en) * | 2005-06-30 | 2007-01-04 | Fujitsu Limited | Semiconductor device and manufacturing method thereof |
US20070190772A1 (en) * | 2004-09-29 | 2007-08-16 | Intel Corporation | Stress-relief layers and stress-compensation collars with low-temperature solders for board-level joints, and processes of making same |
US20070284758A1 (en) * | 2006-05-22 | 2007-12-13 | General Electric Company | Electronics package and associated method |
US20080274589A1 (en) * | 2007-05-04 | 2008-11-06 | Chien-Hsiun Lee | Wafer-level flip-chip assembly methods |
US20090291314A1 (en) * | 2006-09-15 | 2009-11-26 | Matsushita Electric Industrial Co., Ltd. | Electronic components mounting adhesive and electronic components mounting structure |
US20090301760A1 (en) * | 2005-06-16 | 2009-12-10 | Masato Shimamura | Method of Soldering a Module Board |
US20100003786A1 (en) * | 2008-07-01 | 2010-01-07 | International Business Machines Corporation | Chip-level underfill process and structures thereof |
US20100007035A1 (en) * | 2008-07-09 | 2010-01-14 | Nec Electronics Corporation | Semiconductor device and method of manufacturing the same |
US20100148362A1 (en) * | 2008-10-23 | 2010-06-17 | Panasonic Corparation | Semiconductor device and method for fabricating the same |
US20100187774A1 (en) * | 2009-01-26 | 2010-07-29 | Commissariat A L'energie Atomique | Seal barrier for a micro component and method for producing such a barrier |
EP2426707A1 (en) * | 2010-09-06 | 2012-03-07 | Nitto Denko Corporation | Method for Manufacturing Electronic Parts Device and Resin Composition for Electronic Parts Encapsulation |
CN103515447A (en) * | 2012-06-19 | 2014-01-15 | Nxp股份有限公司 | Electronic device and method of manufacturing such device |
US8993379B2 (en) * | 2013-01-21 | 2015-03-31 | International Business Machines Corporation | Chip stack with electrically insulating walls |
Families Citing this family (356)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6097098A (en) | 1997-02-14 | 2000-08-01 | Micron Technology, Inc. | Die interconnections using intermediate connection elements secured to the die face |
US6074895A (en) * | 1997-09-23 | 2000-06-13 | International Business Machines Corporation | Method of forming a flip chip assembly |
US6495083B2 (en) | 1997-10-29 | 2002-12-17 | Hestia Technologies, Inc. | Method of underfilling an integrated circuit chip |
US6324069B1 (en) | 1997-10-29 | 2001-11-27 | Hestia Technologies, Inc. | Chip package with molded underfill |
JP3625646B2 (en) | 1998-03-23 | 2005-03-02 | 東レエンジニアリング株式会社 | Flip chip mounting method |
US6265776B1 (en) | 1998-04-27 | 2001-07-24 | Fry's Metals, Inc. | Flip chip with integrated flux and underfill |
US6228678B1 (en) | 1998-04-27 | 2001-05-08 | Fry's Metals, Inc. | Flip chip with integrated mask and underfill |
US6323062B1 (en) * | 1998-04-27 | 2001-11-27 | Alpha Metals, Inc. | Wafer coating method for flip chips |
AU5283399A (en) * | 1998-07-15 | 2000-02-07 | Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. | Method for transferring solder to a device and/or testing the device |
DE19839760A1 (en) * | 1998-09-01 | 2000-03-02 | Bosch Gmbh Robert | Method for connecting electronic components to a carrier substrate and method for checking such a connection |
US6189208B1 (en) | 1998-09-11 | 2001-02-20 | Polymer Flip Chip Corp. | Flip chip mounting technique |
US6329832B1 (en) * | 1998-10-05 | 2001-12-11 | Micron Technology, Inc. | Method for in-line testing of flip-chip semiconductor assemblies |
US6331450B1 (en) | 1998-12-22 | 2001-12-18 | Toyoda Gosei Co., Ltd. | Method of manufacturing semiconductor device using group III nitride compound |
JP4036555B2 (en) | 1999-01-14 | 2008-01-23 | 松下電器産業株式会社 | Mounting structure manufacturing method and mounting structure |
US6190940B1 (en) * | 1999-01-21 | 2001-02-20 | Lucent Technologies Inc. | Flip chip assembly of semiconductor IC chips |
KR100502222B1 (en) * | 1999-01-29 | 2005-07-18 | 마츠시타 덴끼 산교 가부시키가이샤 | Electronic parts mounting method and device therefor |
JP3346320B2 (en) * | 1999-02-03 | 2002-11-18 | カシオ計算機株式会社 | Semiconductor device and manufacturing method thereof |
US6228681B1 (en) * | 1999-03-10 | 2001-05-08 | Fry's Metals, Inc. | Flip chip having integral mask and underfill providing two-stage bump formation |
US6194788B1 (en) * | 1999-03-10 | 2001-02-27 | Alpha Metals, Inc. | Flip chip with integrated flux and underfill |
US6248614B1 (en) * | 1999-03-19 | 2001-06-19 | International Business Machines Corporation | Flip-chip package with optimized encapsulant adhesion and method |
US6410415B1 (en) | 1999-03-23 | 2002-06-25 | Polymer Flip Chip Corporation | Flip chip mounting technique |
JP3423245B2 (en) * | 1999-04-09 | 2003-07-07 | 沖電気工業株式会社 | Semiconductor device and mounting method thereof |
US6341418B1 (en) | 1999-04-29 | 2002-01-29 | International Business Machines Corporation | Method for direct chip attach by solder bumps and an underfill layer |
US6333209B1 (en) * | 1999-04-29 | 2001-12-25 | International Business Machines Corporation | One step method for curing and joining BGA solder balls |
FR2792861B1 (en) * | 1999-04-30 | 2001-07-06 | Eric Pilat | PROCESS FOR PRODUCING WELDING PLOTS ON A SUBSTRATE AND GUIDE FOR IMPLEMENTING THE PROCESS |
US6352881B1 (en) * | 1999-07-22 | 2002-03-05 | National Semiconductor Corporation | Method and apparatus for forming an underfill adhesive layer |
US6245595B1 (en) * | 1999-07-22 | 2001-06-12 | National Semiconductor Corporation | Techniques for wafer level molding of underfill encapsulant |
US6756253B1 (en) * | 1999-08-27 | 2004-06-29 | Micron Technology, Inc. | Method for fabricating a semiconductor component with external contact polymer support layer |
US6492738B2 (en) * | 1999-09-02 | 2002-12-10 | Micron Technology, Inc. | Apparatus and methods of testing and assembling bumped devices using an anisotropically conductive layer |
JP3334693B2 (en) * | 1999-10-08 | 2002-10-15 | 日本電気株式会社 | Method for manufacturing semiconductor device |
WO2001029895A1 (en) * | 1999-10-19 | 2001-04-26 | Motorola Inc. | Method of forming a microelectronic assembly |
US6475828B1 (en) * | 1999-11-10 | 2002-11-05 | Lsi Logic Corporation | Method of using both a non-filled flux underfill and a filled flux underfill to manufacture a flip-chip |
US6373142B1 (en) * | 1999-11-15 | 2002-04-16 | Lsi Logic Corporation | Method of adding filler into a non-filled underfill system by using a highly filled fillet |
US6613605B2 (en) * | 1999-12-15 | 2003-09-02 | Benedict G Pace | Interconnection method entailing protuberances formed by melting metal over contact areas |
US6962437B1 (en) * | 1999-12-16 | 2005-11-08 | Lsi Logic Corporation | Method and apparatus for thermal profiling of flip-chip packages |
US6796481B2 (en) * | 2000-01-14 | 2004-09-28 | Toray Engineering Co., Ltd. | Chip mounting method |
US6710454B1 (en) * | 2000-02-16 | 2004-03-23 | Micron Technology, Inc. | Adhesive layer for an electronic apparatus having multiple semiconductor devices |
JP3625268B2 (en) * | 2000-02-23 | 2005-03-02 | 富士通株式会社 | Mounting method of semiconductor device |
US10388626B2 (en) * | 2000-03-10 | 2019-08-20 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming flipchip interconnect structure |
WO2001068311A1 (en) | 2000-03-10 | 2001-09-20 | Chippac, Inc. | Flip chip interconnection structure |
KR100865424B1 (en) * | 2000-03-10 | 2008-10-24 | 스태츠 칩팩, 엘티디. | Packaging structure and method |
US6633078B2 (en) * | 2000-03-21 | 2003-10-14 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device, method for manufacturing an electronic equipment, electronic equipment and portable information terminal |
US7547579B1 (en) * | 2000-04-06 | 2009-06-16 | Micron Technology, Inc. | Underfill process |
JP3597754B2 (en) | 2000-04-24 | 2004-12-08 | Necエレクトロニクス株式会社 | Semiconductor device and manufacturing method thereof |
US6281046B1 (en) * | 2000-04-25 | 2001-08-28 | Atmel Corporation | Method of forming an integrated circuit package at a wafer level |
JP3265301B2 (en) * | 2000-06-05 | 2002-03-11 | 株式会社東芝 | Semiconductor device and manufacturing method thereof |
US6569753B1 (en) * | 2000-06-08 | 2003-05-27 | Micron Technology, Inc. | Collar positionable about a periphery of a contact pad and around a conductive structure secured to the contact pads, semiconductor device components including same, and methods for fabricating same |
US6680436B2 (en) | 2000-07-12 | 2004-01-20 | Seagate Technology Llc | Reflow encapsulant |
DE10046296C2 (en) * | 2000-07-17 | 2002-10-10 | Infineon Technologies Ag | Electronic chip component with an integrated circuit and method for its production |
JP2002289768A (en) * | 2000-07-17 | 2002-10-04 | Rohm Co Ltd | Semiconductor device and its manufacturing method |
JP4609617B2 (en) * | 2000-08-01 | 2011-01-12 | 日本電気株式会社 | Semiconductor device mounting method and mounting structure |
WO2002017392A2 (en) * | 2000-08-24 | 2002-02-28 | Polymer Flip Chip Corporation | Polymer redistribution of flip chip bond pads |
GB0021596D0 (en) * | 2000-09-02 | 2000-10-18 | Vlsi Vision Ltd | Mounting electronic components |
US6578755B1 (en) * | 2000-09-22 | 2003-06-17 | Flip Chip Technologies, L.L.C. | Polymer collar for solder bumps |
TW469609B (en) * | 2000-10-11 | 2001-12-21 | Ultratera Corp | Chipless package semiconductor device and its manufacturing method |
EP1334513A2 (en) * | 2000-11-14 | 2003-08-13 | Henkel Loctite Corporation | Wafer applied fluxing and underfill material, and layered electronic assemblies manufactured therewith |
US6713880B2 (en) | 2001-02-07 | 2004-03-30 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method for producing the same, and method for mounting semiconductor device |
US6924171B2 (en) * | 2001-02-13 | 2005-08-02 | International Business Machines Corporation | Bilayer wafer-level underfill |
US6780682B2 (en) * | 2001-02-27 | 2004-08-24 | Chippac, Inc. | Process for precise encapsulation of flip chip interconnects |
US6648213B1 (en) * | 2001-03-05 | 2003-11-18 | Saturn Electronics & Engineering, Inc. | Manufacturing method for attaching components to a substrate |
US6495397B2 (en) * | 2001-03-28 | 2002-12-17 | Intel Corporation | Fluxless flip chip interconnection |
US6713318B2 (en) | 2001-03-28 | 2004-03-30 | Intel Corporation | Flip chip interconnection using no-clean flux |
KR100384834B1 (en) * | 2001-03-30 | 2003-05-23 | 주식회사 하이닉스반도체 | Semiconductor device fabricated on mutiple substrate and method for fabricating the same |
JP5280597B2 (en) * | 2001-03-30 | 2013-09-04 | サンスター技研株式会社 | One-component thermosetting epoxy resin composition and underfill material for semiconductor mounting |
US6586825B1 (en) * | 2001-04-26 | 2003-07-01 | Lsi Logic Corporation | Dual chip in package with a wire bonded die mounted to a substrate |
DE10120928C1 (en) * | 2001-04-30 | 2002-10-31 | Infineon Technologies Ag | Production of contact joint between semiconductor chip and substrate comprises applying hardenable conducting adhesive on contact surfaces of substrate and chip, joining, and hardening adhesive to form contact joint |
US6686664B2 (en) * | 2001-04-30 | 2004-02-03 | International Business Machines Corporation | Structure to accommodate increase in volume expansion during solder reflow |
US7115986B2 (en) * | 2001-05-02 | 2006-10-03 | Micron Technology, Inc. | Flexible ball grid array chip scale packages |
US6674172B2 (en) * | 2001-05-08 | 2004-01-06 | International Business Machines Corporation | Flip-chip package with underfill having low density filler |
US7007835B2 (en) * | 2001-05-21 | 2006-03-07 | Jds Uniphase Corporation | Solder bonding technique for assembling a tilted chip or substrate |
US6603916B1 (en) | 2001-07-26 | 2003-08-05 | Lightwave Microsystems Corporation | Lightwave circuit assembly having low deformation balanced sandwich substrate |
SG122743A1 (en) | 2001-08-21 | 2006-06-29 | Micron Technology Inc | Microelectronic devices and methods of manufacture |
US6551863B2 (en) * | 2001-08-30 | 2003-04-22 | Micron Technology, Inc. | Flip chip dip coating encapsulant |
US20030111519A1 (en) * | 2001-09-04 | 2003-06-19 | 3M Innovative Properties Company | Fluxing compositions |
US6491205B1 (en) * | 2001-09-21 | 2002-12-10 | International Business Machines Corporation | Assembly of multi-chip modules using eutectic solders |
US6974765B2 (en) * | 2001-09-27 | 2005-12-13 | Intel Corporation | Encapsulation of pin solder for maintaining accuracy in pin position |
JP3723483B2 (en) * | 2001-10-16 | 2005-12-07 | 日本電気株式会社 | Electronic component equipment |
US7323360B2 (en) | 2001-10-26 | 2008-01-29 | Intel Corporation | Electronic assemblies with filled no-flow underfill |
US6677179B2 (en) * | 2001-11-16 | 2004-01-13 | Indium Corporation Of America | Method of applying no-flow underfill |
US6610559B2 (en) | 2001-11-16 | 2003-08-26 | Indium Corporation Of America | Integrated void-free process for assembling a solder bumped chip |
US6815831B2 (en) * | 2001-12-12 | 2004-11-09 | Intel Corporation | Flip-chip device with multi-layered underfill having graded coefficient of thermal expansion |
US6833629B2 (en) * | 2001-12-14 | 2004-12-21 | National Starch And Chemical Investment Holding Corporation | Dual cure B-stageable underfill for wafer level |
US6884663B2 (en) * | 2002-01-07 | 2005-04-26 | Delphon Industries, Llc | Method for reconstructing an integrated circuit package using lapping |
SG104293A1 (en) * | 2002-01-09 | 2004-06-21 | Micron Technology Inc | Elimination of rdl using tape base flip chip on flex for die stacking |
US20030132513A1 (en) * | 2002-01-11 | 2003-07-17 | Motorola, Inc. | Semiconductor package device and method |
DE10209915A1 (en) * | 2002-01-11 | 2003-07-24 | Hesse & Knipps Gmbh | Method for flip chip bonding |
EP1328015A3 (en) | 2002-01-11 | 2003-12-03 | Hesse & Knipps GmbH | Method of bonding a flip chip |
US6802446B2 (en) * | 2002-02-01 | 2004-10-12 | Delphi Technologies, Inc. | Conductive adhesive material with metallurgically-bonded conductive particles |
US6854633B1 (en) * | 2002-02-05 | 2005-02-15 | Micron Technology, Inc. | System with polymer masking flux for fabricating external contacts on semiconductor components |
US20060194064A1 (en) * | 2002-03-01 | 2006-08-31 | Xiao Allison Y | Underfill encapsulant for wafer packaging and method for its application |
US7037399B2 (en) | 2002-03-01 | 2006-05-02 | National Starch And Chemical Investment Holding Corporation | Underfill encapsulant for wafer packaging and method for its application |
US20030164555A1 (en) * | 2002-03-01 | 2003-09-04 | Tong Quinn K. | B-stageable underfill encapsulant and method for its application |
SG111935A1 (en) | 2002-03-04 | 2005-06-29 | Micron Technology Inc | Interposer configured to reduce the profiles of semiconductor device assemblies and packages including the same and methods |
SG115456A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Semiconductor die packages with recessed interconnecting structures and methods for assembling the same |
SG115455A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Methods for assembly and packaging of flip chip configured dice with interposer |
SG115459A1 (en) * | 2002-03-04 | 2005-10-28 | Micron Technology Inc | Flip chip packaging using recessed interposer terminals |
US6975035B2 (en) * | 2002-03-04 | 2005-12-13 | Micron Technology, Inc. | Method and apparatus for dielectric filling of flip chip on interposer assembly |
SG121707A1 (en) * | 2002-03-04 | 2006-05-26 | Micron Technology Inc | Method and apparatus for flip-chip packaging providing testing capability |
US20030170450A1 (en) * | 2002-03-05 | 2003-09-11 | Stewart Steven L. | Attachment of surface mount devices to printed circuit boards using a thermoplastic adhesive |
US6906425B2 (en) * | 2002-03-05 | 2005-06-14 | Resolution Performance Products Llc | Attachment of surface mount devices to printed circuit boards using a thermoplastic adhesive |
US6940176B2 (en) * | 2002-05-21 | 2005-09-06 | United Microelectronics Corp. | Solder pads for improving reliability of a package |
KR100481216B1 (en) * | 2002-06-07 | 2005-04-08 | 엘지전자 주식회사 | Ball Grid Array Package And Method Of Fabricating The Same |
US7262074B2 (en) * | 2002-07-08 | 2007-08-28 | Micron Technology, Inc. | Methods of fabricating underfilled, encapsulated semiconductor die assemblies |
US6747331B2 (en) * | 2002-07-17 | 2004-06-08 | International Business Machines Corporation | Method and packaging structure for optimizing warpage of flip chip organic packages |
US7182241B2 (en) * | 2002-08-09 | 2007-02-27 | Micron Technology, Inc. | Multi-functional solder and articles made therewith, such as microelectronic components |
US6649833B1 (en) * | 2002-08-09 | 2003-11-18 | International Business Machines Corporation | Negative volume expansion lead-free electrical connection |
US7423337B1 (en) | 2002-08-19 | 2008-09-09 | National Semiconductor Corporation | Integrated circuit device package having a support coating for improved reliability during temperature cycling |
US20040036170A1 (en) * | 2002-08-20 | 2004-02-26 | Lee Teck Kheng | Double bumping of flexible substrate for first and second level interconnects |
US6845901B2 (en) * | 2002-08-22 | 2005-01-25 | Micron Technology, Inc. | Apparatus and method for depositing and reflowing solder paste on a microelectronic workpiece |
US6969914B2 (en) * | 2002-08-29 | 2005-11-29 | Micron Technology, Inc. | Electronic device package |
US6798806B1 (en) * | 2002-09-03 | 2004-09-28 | Finisar Corporation | Hybrid mirror VCSELs |
US6649445B1 (en) * | 2002-09-11 | 2003-11-18 | Motorola, Inc. | Wafer coating and singulation method |
KR100484889B1 (en) * | 2002-09-19 | 2005-04-28 | 재단법인서울대학교산학협력재단 | Solderfill for semiconductor package assembly and manufacturing method the same |
US6949398B2 (en) * | 2002-10-31 | 2005-09-27 | Freescale Semiconductor, Inc. | Low cost fabrication and assembly of lid for semiconductor devices |
US7022410B2 (en) * | 2003-12-16 | 2006-04-04 | General Electric Company | Combinations of resin compositions and methods of use thereof |
US20060147719A1 (en) * | 2002-11-22 | 2006-07-06 | Slawomir Rubinsztajn | Curable composition, underfill, and method |
US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
TW582077B (en) * | 2002-12-18 | 2004-04-01 | Advanced Semiconductor Eng | Flip-chip substrate and the flip-chip bonding process thereof |
US20040119151A1 (en) * | 2002-12-20 | 2004-06-24 | Intel Corporation | Pre-applied underfill |
US20040239006A1 (en) * | 2003-01-22 | 2004-12-02 | Microfabrica Inc. | Silicone compositions, methods of making, and uses thereof |
US6720246B1 (en) * | 2003-01-23 | 2004-04-13 | Silicon Integrated Systems Corp. | Flip chip assembly process for forming an underfill encapsulant |
US20040155358A1 (en) * | 2003-02-07 | 2004-08-12 | Toshitsune Iijima | First and second level packaging assemblies and method of assembling package |
US7301222B1 (en) | 2003-02-12 | 2007-11-27 | National Semiconductor Corporation | Apparatus for forming a pre-applied underfill adhesive layer for semiconductor wafer level chip-scale packages |
US6821878B2 (en) * | 2003-02-27 | 2004-11-23 | Freescale Semiconductor, Inc. | Area-array device assembly with pre-applied underfill layers on printed wiring board |
JP2004281491A (en) * | 2003-03-13 | 2004-10-07 | Toshiba Corp | Semiconductor device and manufacturing method thereof |
US6943058B2 (en) * | 2003-03-18 | 2005-09-13 | Delphi Technologies, Inc. | No-flow underfill process and material therefor |
US6987058B2 (en) * | 2003-03-18 | 2006-01-17 | Micron Technology, Inc. | Methods for underfilling and encapsulating semiconductor device assemblies with a single dielectric material |
JP4123998B2 (en) * | 2003-03-24 | 2008-07-23 | 松下電器産業株式会社 | Electronic circuit device and manufacturing method thereof |
JP4096774B2 (en) * | 2003-03-24 | 2008-06-04 | セイコーエプソン株式会社 | SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, ELECTRONIC DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE MANUFACTURING METHOD |
US20050014313A1 (en) * | 2003-03-26 | 2005-01-20 | Workman Derek B. | Underfill method |
US6774497B1 (en) | 2003-03-28 | 2004-08-10 | Freescale Semiconductor, Inc. | Flip-chip assembly with thin underfill and thick solder mask |
JP4389471B2 (en) * | 2003-05-19 | 2009-12-24 | パナソニック株式会社 | Electronic circuit connection structure and connection method |
US6825560B1 (en) * | 2003-05-22 | 2004-11-30 | Rf Micro Devices, Inc. | Solder filler |
US20040238925A1 (en) * | 2003-05-23 | 2004-12-02 | Paul Morganelli | Pre-applied thermoplastic reinforcement for electronic components |
US20040232530A1 (en) * | 2003-05-23 | 2004-11-25 | Paul Morganelli | Pre-applied thermoplastic reinforcement for electronic components |
US7047633B2 (en) * | 2003-05-23 | 2006-05-23 | National Starch And Chemical Investment Holding, Corporation | Method of using pre-applied underfill encapsulant |
US6978540B2 (en) * | 2003-05-23 | 2005-12-27 | National Starch And Chemical Investment Holding Corporation | Method for pre-applied thermoplastic reinforcement of electronic components |
US20060142424A1 (en) * | 2003-05-23 | 2006-06-29 | Jayesh Shah | Foamable underfill encapsulant |
US20040235996A1 (en) * | 2003-05-23 | 2004-11-25 | Jayesh Shah | Foamable underfill encapsulant |
US7004375B2 (en) * | 2003-05-23 | 2006-02-28 | National Starch And Chemical Investment Holding Corporation | Pre-applied fluxing underfill composition having pressure sensitive adhesive properties |
US20040245611A1 (en) * | 2003-05-23 | 2004-12-09 | Paul Morganelli | Pre-applied thermoplastic reinforcement for electronic components |
US6946384B2 (en) * | 2003-06-06 | 2005-09-20 | Intel Corporation | Stacked device underfill and a method of fabrication |
US7166491B2 (en) * | 2003-06-11 | 2007-01-23 | Fry's Metals, Inc. | Thermoplastic fluxing underfill composition and method |
US7320928B2 (en) * | 2003-06-20 | 2008-01-22 | Intel Corporation | Method of forming a stacked device filler |
JP4263953B2 (en) * | 2003-06-23 | 2009-05-13 | 三洋電機株式会社 | Semiconductor device and manufacturing method thereof |
TWI245597B (en) * | 2003-06-30 | 2005-12-11 | Siliconware Precision Industries Co Ltd | Printed circuit boards and method for fabricating the same |
US7026376B2 (en) * | 2003-06-30 | 2006-04-11 | Intel Corporation | Fluxing agent for underfill materials |
US20050028361A1 (en) * | 2003-08-07 | 2005-02-10 | Indium Corporation Of America | Integrated underfill process for bumped chip assembly |
US20050056946A1 (en) * | 2003-09-16 | 2005-03-17 | Cookson Electronics, Inc. | Electrical circuit assembly with improved shock resistance |
US20050196907A1 (en) * | 2003-09-19 | 2005-09-08 | Glenn Ratificar | Underfill system for die-over-die arrangements |
US7239016B2 (en) * | 2003-10-09 | 2007-07-03 | Denso Corporation | Semiconductor device having heat radiation plate and bonding member |
KR100659527B1 (en) * | 2003-10-22 | 2006-12-20 | 삼성전자주식회사 | Semiconductor chip having three dimension type ubm for flip chip bonding and mounting structure thereof |
TWI358776B (en) * | 2003-11-08 | 2012-02-21 | Chippac Inc | Flip chip interconnection pad layout |
US8853001B2 (en) * | 2003-11-08 | 2014-10-07 | Stats Chippac, Ltd. | Semiconductor device and method of forming pad layout for flipchip semiconductor die |
USRE47600E1 (en) | 2003-11-10 | 2019-09-10 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming electrical interconnect with stress relief void |
TWI534915B (en) * | 2003-11-10 | 2016-05-21 | 恰巴克有限公司 | Bump-on-lead flip chip interconnection |
US8129841B2 (en) | 2006-12-14 | 2012-03-06 | Stats Chippac, Ltd. | Solder joint flip chip interconnection |
US8026128B2 (en) | 2004-11-10 | 2011-09-27 | Stats Chippac, Ltd. | Semiconductor device and method of self-confinement of conductive bump material during reflow without solder mask |
US9029196B2 (en) | 2003-11-10 | 2015-05-12 | Stats Chippac, Ltd. | Semiconductor device and method of self-confinement of conductive bump material during reflow without solder mask |
US8216930B2 (en) * | 2006-12-14 | 2012-07-10 | Stats Chippac, Ltd. | Solder joint flip chip interconnection having relief structure |
US8574959B2 (en) * | 2003-11-10 | 2013-11-05 | Stats Chippac, Ltd. | Semiconductor device and method of forming bump-on-lead interconnection |
US20070105277A1 (en) | 2004-11-10 | 2007-05-10 | Stats Chippac Ltd. | Solder joint flip chip interconnection |
US7659633B2 (en) | 2004-11-10 | 2010-02-09 | Stats Chippac, Ltd. | Solder joint flip chip interconnection having relief structure |
US8076232B2 (en) | 2008-04-03 | 2011-12-13 | Stats Chippac, Ltd. | Semiconductor device and method of forming composite bump-on-lead interconnection |
US8350384B2 (en) * | 2009-11-24 | 2013-01-08 | Stats Chippac, Ltd. | Semiconductor device and method of forming electrical interconnect with stress relief void |
USRE44500E1 (en) | 2003-11-10 | 2013-09-17 | Stats Chippac, Ltd. | Semiconductor device and method of forming composite bump-on-lead interconnection |
US20050121496A1 (en) * | 2003-12-05 | 2005-06-09 | Farrell Kevin C. | Apparatus for immobilizing a solid solder element to a contact surface of interest |
US7045904B2 (en) * | 2003-12-10 | 2006-05-16 | Texas Instruments Incorporated | Patterned plasma treatment to improve distribution of underfill material |
KR100568006B1 (en) * | 2003-12-12 | 2006-04-07 | 삼성전자주식회사 | Forming Method for Concave Solder Bump Structure of Flip Chip Package |
US7012519B2 (en) * | 2004-02-27 | 2006-03-14 | Red Fox & Company, Llc | Emergency shutoff system for power machinery, wireless monitoring systems, and emergency shutoff methods |
US7244634B2 (en) * | 2004-03-31 | 2007-07-17 | Intel Corporation | Stress-relief layer and stress-compensation collar in contact arrays, and processes of making same |
US7213739B2 (en) * | 2004-04-02 | 2007-05-08 | Fry's Metals, Inc. | Underfill fluxing curative |
TWI240399B (en) * | 2004-04-06 | 2005-09-21 | Advanced Semiconductor Eng | Chip package structure and process for fabricating the same |
US7282375B1 (en) | 2004-04-14 | 2007-10-16 | National Semiconductor Corporation | Wafer level package design that facilitates trimming and testing |
DE102004021633B4 (en) * | 2004-05-03 | 2006-04-06 | Infineon Technologies Ag | Method for connecting a semiconductor chip to a chip carrier and arrangement with a semiconductor chip and a chip carrier |
US7253089B2 (en) * | 2004-06-14 | 2007-08-07 | Micron Technology, Inc. | Microfeature devices and methods for manufacturing microfeature devices |
US7205177B2 (en) | 2004-07-01 | 2007-04-17 | Interuniversitair Microelektronica Centrum (Imec) | Methods of bonding two semiconductor devices |
US7378297B2 (en) | 2004-07-01 | 2008-05-27 | Interuniversitair Microelektronica Centrum (Imec) | Methods of bonding two semiconductor devices |
JP4511266B2 (en) * | 2004-07-05 | 2010-07-28 | パナソニック株式会社 | Semiconductor device and manufacturing method thereof |
TWI237370B (en) * | 2004-07-30 | 2005-08-01 | Advanced Semiconductor Eng | Chip package structure and process for fabricating the same |
US7247683B2 (en) | 2004-08-05 | 2007-07-24 | Fry's Metals, Inc. | Low voiding no flow fluxing underfill for electronic devices |
US7875686B2 (en) * | 2004-08-18 | 2011-01-25 | Promerus Llc | Polycycloolefin polymeric compositions for semiconductor applications |
US7033864B2 (en) * | 2004-09-03 | 2006-04-25 | Texas Instruments Incorporated | Grooved substrates for uniform underfilling solder ball assembled electronic devices |
US7218007B2 (en) * | 2004-09-28 | 2007-05-15 | Intel Corporation | Underfill material to reduce ball limiting metallurgy delamination and cracking potential in semiconductor devices |
DE102004050178B3 (en) * | 2004-10-14 | 2006-05-04 | Infineon Technologies Ag | Flip-chip device |
TWI236048B (en) * | 2004-10-21 | 2005-07-11 | Advanced Semiconductor Eng | Method for flip chip bonding by utilizing an interposer with embeded bumps |
JP2006128567A (en) * | 2004-11-01 | 2006-05-18 | Three M Innovative Properties Co | Method of connecting semiconductor package to printed wiring board |
KR100601762B1 (en) * | 2004-11-09 | 2006-07-19 | 삼성전자주식회사 | flip chip bonding fabrication method using non-conductive adhesive |
US7629674B1 (en) * | 2004-11-17 | 2009-12-08 | Amkor Technology, Inc. | Shielded package having shield fence |
US7442579B2 (en) * | 2004-11-22 | 2008-10-28 | International Business Machines Corporation | Methods to achieve precision alignment for wafer scale packages |
DE102004056534A1 (en) * | 2004-11-23 | 2006-06-01 | Infineon Technologies Ag | Semiconductor component with a semiconductor chip and with external contacts and method for producing the same |
DE102004062212A1 (en) * | 2004-12-23 | 2006-07-13 | Texas Instruments Deutschland Gmbh | Electronic device, chip contacting method and contacting device |
US20060177966A1 (en) * | 2005-02-09 | 2006-08-10 | Jayesh Shah | Package or pre-applied foamable underfill for lead-free process |
US7413110B2 (en) * | 2005-02-16 | 2008-08-19 | Motorola, Inc. | Method for reducing stress between substrates of differing materials |
US8841779B2 (en) | 2005-03-25 | 2014-09-23 | Stats Chippac, Ltd. | Semiconductor device and method of forming high routing density BOL BONL and BONP interconnect sites on substrate |
KR20070107154A (en) * | 2005-03-25 | 2007-11-06 | 스태츠 칩팩, 엘티디. | Flip chip interconnection having narrow interconnection sites on the substrate |
JP4534062B2 (en) | 2005-04-19 | 2010-09-01 | ルネサスエレクトロニクス株式会社 | Semiconductor device |
US20060255473A1 (en) * | 2005-05-16 | 2006-11-16 | Stats Chippac Ltd. | Flip chip interconnect solder mask |
US9258904B2 (en) * | 2005-05-16 | 2016-02-09 | Stats Chippac, Ltd. | Semiconductor device and method of forming narrow interconnect sites on substrate with elongated mask openings |
US7319591B2 (en) * | 2005-05-26 | 2008-01-15 | International Business Machines Corporation | Optimized thermally conductive plate and attachment method for enhanced thermal performance and reliability of flip chip organic packages |
US20060273717A1 (en) * | 2005-06-03 | 2006-12-07 | Jian Wang | Electronic device including workpieces and a conductive member therebetween |
EP1732116B1 (en) | 2005-06-08 | 2017-02-01 | Imec | Methods for bonding and micro-electronic devices produced according to such methods |
US20070026575A1 (en) * | 2005-06-24 | 2007-02-01 | Subramanian Sankara J | No flow underfill device and method |
KR100684169B1 (en) * | 2005-08-11 | 2007-02-20 | 삼성전자주식회사 | Adhesive film having dual filler distribution, forming method thereof, chip stack package using the adhesive film, and manufacturing method thereof |
JP4137112B2 (en) * | 2005-10-20 | 2008-08-20 | 日本テキサス・インスツルメンツ株式会社 | Manufacturing method of electronic parts |
KR100652440B1 (en) * | 2005-10-27 | 2006-12-01 | 삼성전자주식회사 | Semiconductor package, stack package using the same package and method of fabricating the same stack package |
KR100699874B1 (en) * | 2005-11-08 | 2007-03-28 | 삼성전자주식회사 | BGA package having embedded solder ball and method ofthe same and board mounted the same |
JP4650220B2 (en) * | 2005-11-10 | 2011-03-16 | パナソニック株式会社 | Electronic component soldering method and electronic component soldering structure |
US20090242023A1 (en) * | 2005-11-25 | 2009-10-01 | Israel Aircraft Industries Ltd. | System and method for producing a solar cell array |
US7416923B2 (en) * | 2005-12-09 | 2008-08-26 | International Business Machines Corporation | Underfill film having thermally conductive sheet |
DE102006006561B4 (en) * | 2006-02-13 | 2009-03-05 | Htc Beteiligungs Gmbh | Flip-chip module and method for exchanging a semiconductor chip of a flip-chip module |
US7385299B2 (en) * | 2006-02-25 | 2008-06-10 | Stats Chippac Ltd. | Stackable integrated circuit package system with multiple interconnect interface |
US20070200234A1 (en) * | 2006-02-28 | 2007-08-30 | Texas Instruments Incorporated | Flip-Chip Device Having Underfill in Controlled Gap |
US7656042B2 (en) * | 2006-03-29 | 2010-02-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | Stratified underfill in an IC package |
US20070226995A1 (en) * | 2006-03-30 | 2007-10-04 | Gregory Alan Bone | System and method for adhering large semiconductor applications to pcb |
JP4294722B2 (en) * | 2006-04-27 | 2009-07-15 | パナソニック株式会社 | Connection structure and manufacturing method thereof |
US20080003804A1 (en) * | 2006-06-29 | 2008-01-03 | Ravi Nalla | Method of providing solder bumps of mixed sizes on a substrate using solder transfer in two stages |
JP2008042077A (en) * | 2006-08-09 | 2008-02-21 | Renesas Technology Corp | Semiconductor device and production method therefor |
KR100780956B1 (en) * | 2006-08-17 | 2007-12-03 | 삼성전자주식회사 | Semiconductor package having binary underfill and method of manufacturing the same |
US8159825B1 (en) * | 2006-08-25 | 2012-04-17 | Hypres Inc. | Method for fabrication of electrical contacts to superconducting circuits |
JP2008071812A (en) * | 2006-09-12 | 2008-03-27 | Fujikura Ltd | Board connection structure |
US7713782B2 (en) * | 2006-09-22 | 2010-05-11 | Stats Chippac, Inc. | Fusible I/O interconnection systems and methods for flip-chip packaging involving substrate-mounted stud-bumps |
JP5085081B2 (en) * | 2006-09-22 | 2012-11-28 | パナソニック株式会社 | Electronic component mounting structure |
US9847309B2 (en) | 2006-09-22 | 2017-12-19 | STATS ChipPAC Pte. Ltd. | Semiconductor device and method of forming vertical interconnect structure between semiconductor die and substrate |
TWI473245B (en) * | 2006-10-31 | 2015-02-11 | Sumitomo Bakelite Co | Semiconductor electronic component and semiconductor device using the same |
US7948090B2 (en) * | 2006-12-20 | 2011-05-24 | Intel Corporation | Capillary-flow underfill compositions, packages containing same, and systems containing same |
US8343383B2 (en) | 2007-03-12 | 2013-01-01 | Senju Metal Industry Co., Ltd. | Anisotropic conductive material |
WO2008112883A2 (en) * | 2007-03-13 | 2008-09-18 | Lord Corporation | Die attachment method with a covex surface underfill |
US20080230901A1 (en) * | 2007-03-20 | 2008-09-25 | International Business Machines Corporation | Structure for controlled collapse chip connection with displaced captured pads |
US7786001B2 (en) * | 2007-04-11 | 2010-08-31 | International Business Machines Corporation | Electrical interconnect structure and method |
KR101623597B1 (en) * | 2007-04-25 | 2016-05-23 | 헤레우스 프레셔스 메탈즈 노스 아메리카 콘쇼호켄 엘엘씨 | Thick film conductor formulations comprising silver and nickel or silver and nickel alloys and solar cells made therefrom |
US20080284045A1 (en) * | 2007-05-18 | 2008-11-20 | Texas Instruments Incorporated | Method for Fabricating Array-Molded Package-On-Package |
US20080308932A1 (en) * | 2007-06-12 | 2008-12-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor package structures |
US7648858B2 (en) * | 2007-06-19 | 2010-01-19 | Freescale Semiconductor, Inc. | Methods and apparatus for EMI shielding in multi-chip modules |
US9953910B2 (en) | 2007-06-21 | 2018-04-24 | General Electric Company | Demountable interconnect structure |
US9610758B2 (en) * | 2007-06-21 | 2017-04-04 | General Electric Company | Method of making demountable interconnect structure |
US7944034B2 (en) * | 2007-06-22 | 2011-05-17 | Texas Instruments Incorporated | Array molded package-on-package having redistribution lines |
US7772047B2 (en) * | 2007-06-28 | 2010-08-10 | Sandisk Corporation | Method of fabricating a semiconductor die having a redistribution layer |
US7763980B2 (en) * | 2007-06-28 | 2010-07-27 | Sandisk Corporation | Semiconductor die having a distribution layer |
GB0714723D0 (en) | 2007-07-30 | 2007-09-12 | Pilkington Automotive D Gmbh | Improved electrical connector |
US7745264B2 (en) * | 2007-09-04 | 2010-06-29 | Advanced Micro Devices, Inc. | Semiconductor chip with stratified underfill |
US8148255B2 (en) * | 2007-09-18 | 2012-04-03 | International Business Machines Corporation | Techniques for forming solder bump interconnects |
US20090108442A1 (en) * | 2007-10-25 | 2009-04-30 | International Business Machines Corporation | Self-assembled stress relief interface |
JP5353153B2 (en) * | 2007-11-09 | 2013-11-27 | パナソニック株式会社 | Mounting structure |
US20090127718A1 (en) * | 2007-11-15 | 2009-05-21 | Chen Singjang | Flip chip wafer, flip chip die and manufacturing processes thereof |
US8487428B2 (en) * | 2007-11-20 | 2013-07-16 | Fujitsu Limited | Method and system for providing a reliable semiconductor assembly |
KR101408743B1 (en) * | 2007-12-11 | 2014-06-18 | 삼성전자주식회사 | Semiconductor package and method of manufacturing a semiconductor package |
US8349721B2 (en) | 2008-03-19 | 2013-01-08 | Stats Chippac, Ltd. | Semiconductor device and method of forming insulating layer on conductive traces for electrical isolation in fine pitch bonding |
US9345148B2 (en) | 2008-03-25 | 2016-05-17 | Stats Chippac, Ltd. | Semiconductor device and method of forming flipchip interconnection structure with bump on partial pad |
US7759137B2 (en) * | 2008-03-25 | 2010-07-20 | Stats Chippac, Ltd. | Flip chip interconnection structure with bump on partial pad and method thereof |
US7773220B2 (en) * | 2008-04-02 | 2010-08-10 | International Business Machines Corporation | Method and system for collecting alignment data from coated chips or wafers |
US20090250814A1 (en) * | 2008-04-03 | 2009-10-08 | Stats Chippac, Ltd. | Flip Chip Interconnection Structure Having Void-Free Fine Pitch and Method Thereof |
US20090266480A1 (en) * | 2008-04-29 | 2009-10-29 | International Business Machines Corporation | Process for Preparing a Solder Stand-Off |
US8563357B2 (en) * | 2008-06-26 | 2013-10-22 | Infineon Technologies Ag | Method of packaging a die |
US8159067B2 (en) | 2008-08-13 | 2012-04-17 | International Business Machines Corporation | Underfill flow guide structures |
US7897502B2 (en) * | 2008-09-10 | 2011-03-01 | Stats Chippac, Ltd. | Method of forming vertically offset bond on trace interconnects on recessed and raised bond fingers |
JP5113793B2 (en) * | 2008-10-23 | 2013-01-09 | パナソニック株式会社 | Semiconductor device and manufacturing method thereof |
EP2352168A1 (en) * | 2008-11-25 | 2011-08-03 | Sumitomo Bakelite Co., Ltd. | Electronic component package and electronic component package manufacturing method |
CN102224583B (en) * | 2008-11-25 | 2014-09-10 | 洛德公司 | Methods for protecting a die surface with photocurable materials |
US9093448B2 (en) | 2008-11-25 | 2015-07-28 | Lord Corporation | Methods for protecting a die surface with photocurable materials |
JP4724222B2 (en) * | 2008-12-12 | 2011-07-13 | 株式会社東芝 | Method for manufacturing light emitting device |
US8659172B2 (en) | 2008-12-31 | 2014-02-25 | Stats Chippac, Ltd. | Semiconductor device and method of confining conductive bump material with solder mask patch |
US8198186B2 (en) | 2008-12-31 | 2012-06-12 | Stats Chippac, Ltd. | Semiconductor device and method of confining conductive bump material during reflow with solder mask patch |
US20100237500A1 (en) * | 2009-03-20 | 2010-09-23 | Stats Chippac, Ltd. | Semiconductor Substrate and Method of Forming Conformal Solder Wet-Enhancement Layer on Bump-on-Lead Site |
FR2943849B1 (en) * | 2009-03-31 | 2011-08-26 | St Microelectronics Grenoble 2 | METHOD FOR PRODUCING SEMICONDUCTOR HOUSINGS AND SEMICONDUCTOR HOUSING |
US8080446B2 (en) | 2009-05-27 | 2011-12-20 | Stats Chippac Ltd. | Integrated circuit packaging system with interposer interconnections and method of manufacture thereof |
US8689437B2 (en) * | 2009-06-24 | 2014-04-08 | International Business Machines Corporation | Method for forming integrated circuit assembly |
TWI478257B (en) * | 2009-08-06 | 2015-03-21 | Htc Corp | Package structure and package process |
JP5532744B2 (en) * | 2009-08-20 | 2014-06-25 | 富士通株式会社 | Multi-chip module and method for manufacturing multi-chip module |
US8507325B2 (en) | 2010-01-28 | 2013-08-13 | International Business Machines Corporation | Co-axial restraint for connectors within flip-chip packages |
US8574960B2 (en) | 2010-02-03 | 2013-11-05 | Stats Chippac, Ltd. | Semiconductor device and method of forming cavity adjacent to sensitive region of semiconductor die using wafer-level underfill material |
US8039384B2 (en) | 2010-03-09 | 2011-10-18 | Stats Chippac, Ltd. | Semiconductor device and method of forming vertically offset bond on trace interconnects on different height traces |
JP5418367B2 (en) * | 2010-03-30 | 2014-02-19 | 富士通株式会社 | Printed wiring board unit and electronic device |
US20110318882A1 (en) * | 2010-06-24 | 2011-12-29 | Xiaoming Wu | Method of restricting chip movement upon bonding to rigid substrate using spray coatable adhesive |
US8409978B2 (en) | 2010-06-24 | 2013-04-02 | Stats Chippac, Ltd. | Semiconductor device and method of forming vertically offset bond on trace interconnect structure on leadframe |
US8642461B2 (en) * | 2010-08-09 | 2014-02-04 | Maxim Integrated Products, Inc. | Side wettable plating for semiconductor chip package |
US8492197B2 (en) | 2010-08-17 | 2013-07-23 | Stats Chippac, Ltd. | Semiconductor device and method of forming vertically offset conductive pillars over first substrate aligned to vertically offset BOT interconnect sites formed over second substrate |
JP2012049175A (en) * | 2010-08-24 | 2012-03-08 | Toshiba Corp | Method of manufacturing semiconductor device |
CN102386088B (en) * | 2010-09-03 | 2014-06-25 | 中芯国际集成电路制造(上海)有限公司 | Method for removing photoinduced resist layer on semiconductor device structure |
US8435834B2 (en) | 2010-09-13 | 2013-05-07 | Stats Chippac, Ltd. | Semiconductor device and method of forming bond-on-lead interconnection for mounting semiconductor die in FO-WLCSP |
US20120085575A1 (en) * | 2010-10-08 | 2012-04-12 | Nobuhiro Yamamoto | Electronic Apparatus Manufacturing Method, Electronic Component, and Electronic Apparatus |
KR20120040536A (en) * | 2010-10-19 | 2012-04-27 | 삼성전자주식회사 | Semiconductor packages and methods of fabricating the same |
TWI430426B (en) * | 2010-10-19 | 2014-03-11 | Univ Nat Chiao Tung | Chip-to-chip multi-signaling communication system with common conduction layer |
US9828324B2 (en) | 2010-10-20 | 2017-11-28 | Sirrus, Inc. | Methylene beta-diketone monomers, methods for making methylene beta-diketone monomers, polymerizable compositions and products formed therefrom |
US9249265B1 (en) | 2014-09-08 | 2016-02-02 | Sirrus, Inc. | Emulsion polymers including one or more 1,1-disubstituted alkene compounds, emulsion methods, and polymer compositions |
US10414839B2 (en) | 2010-10-20 | 2019-09-17 | Sirrus, Inc. | Polymers including a methylene beta-ketoester and products formed therefrom |
US9279022B1 (en) | 2014-09-08 | 2016-03-08 | Sirrus, Inc. | Solution polymers including one or more 1,1-disubstituted alkene compounds, solution polymerization methods, and polymer compositions |
US8299596B2 (en) * | 2010-12-14 | 2012-10-30 | Stats Chippac Ltd. | Integrated circuit packaging system with bump conductors and method of manufacture thereof |
DE102011002539A1 (en) * | 2011-01-11 | 2012-07-12 | Innovent E.V. | Method for applying solder bumps on contacting surface of e.g. wafer to produce wafer level package, involves spraying solder paste portions on pads by jet printing process, and melting portions to solder bumps in nitrogen atmosphere |
US8162203B1 (en) * | 2011-02-18 | 2012-04-24 | International Business Machines Corporation | Spherical solder reflow method |
KR101210586B1 (en) * | 2011-04-20 | 2012-12-11 | 한국생산기술연구원 | Flip Chip Package Using Adhesive Containing Volume Expansion Additives and Its Joining Method |
US8642382B2 (en) | 2011-06-20 | 2014-02-04 | Stats Chippac Ltd. | Integrated circuit packaging system with support structure and method of manufacture thereof |
US8963340B2 (en) * | 2011-09-13 | 2015-02-24 | International Business Machines Corporation | No flow underfill or wafer level underfill and solder columns |
US9218989B2 (en) * | 2011-09-23 | 2015-12-22 | Raytheon Company | Aerogel dielectric layer |
EP3517523A1 (en) | 2011-10-19 | 2019-07-31 | Sirrus, Inc. | Multifunctional monomers and methods for making them |
TWI476841B (en) * | 2012-03-03 | 2015-03-11 | 矽品精密工業股份有限公司 | Semiconductor package and fabrication method thereof |
JP5965185B2 (en) * | 2012-03-30 | 2016-08-03 | デクセリアルズ株式会社 | Circuit connection material and method of manufacturing semiconductor device using the same |
JP6345644B2 (en) | 2012-03-30 | 2018-06-20 | シラス・インコーポレイテッド | Ink formulations and coating formulations and polymerizable systems for making them |
EP2831124B1 (en) | 2012-03-30 | 2016-10-05 | Sirrus, Inc. | Composite and laminate articles and polymerizable systems for producing the same |
US9064820B2 (en) * | 2012-04-05 | 2015-06-23 | Mekiec Manufacturing Corporation (Thailand) Ltd | Method and encapsulant for flip-chip assembly |
US9202714B2 (en) | 2012-04-24 | 2015-12-01 | Micron Technology, Inc. | Methods for forming semiconductor device packages |
US9362143B2 (en) | 2012-05-14 | 2016-06-07 | Micron Technology, Inc. | Methods for forming semiconductor device packages with photoimageable dielectric adhesive material, and related semiconductor device packages |
US10047192B2 (en) | 2012-06-01 | 2018-08-14 | Sirrus, Inc. | Optical material and articles formed therefrom |
EP2669936B1 (en) | 2012-06-01 | 2018-02-14 | Nexperia B.V. | Discrete semiconductor device package and manufacturing method |
JP5564151B1 (en) * | 2012-08-06 | 2014-07-30 | 積水化学工業株式会社 | Manufacturing method of semiconductor device and adhesive for flip chip mounting |
JP2014060211A (en) * | 2012-09-14 | 2014-04-03 | Omron Corp | Substrate structure, semiconductor chip mounting method and solid state relay |
US20140131897A1 (en) * | 2012-11-15 | 2014-05-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Warpage Control for Flexible Substrates |
CN105008438B (en) | 2012-11-16 | 2019-10-22 | 拜奥福米克斯公司 | Plastics bonding system and method |
US10607910B2 (en) | 2012-11-30 | 2020-03-31 | Sirrus, Inc. | Composite compositions for electronics applications |
US9330993B2 (en) * | 2012-12-20 | 2016-05-03 | Intel Corporation | Methods of promoting adhesion between underfill and conductive bumps and structures formed thereby |
US9245770B2 (en) * | 2012-12-20 | 2016-01-26 | Stats Chippac, Ltd. | Semiconductor device and method of simultaneous molding and thermalcompression bonding |
US9064880B2 (en) * | 2012-12-28 | 2015-06-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Zero stand-off bonding system and method |
EP2943462B1 (en) | 2013-01-11 | 2018-06-27 | Sirrus, Inc. | Method to obtain methylene malonate via bis(hydroxymethyl) malonate pathway |
US8877558B2 (en) * | 2013-02-07 | 2014-11-04 | Harris Corporation | Method for making electronic device with liquid crystal polymer and related devices |
TWI591783B (en) * | 2013-04-12 | 2017-07-11 | 精材科技股份有限公司 | Chip package and method for fabricating the same |
US20140335635A1 (en) * | 2013-05-10 | 2014-11-13 | Osram Sylvania Inc. | Electronic assemblies including a subassembly film and methods of producing the same |
US9293438B2 (en) * | 2013-07-03 | 2016-03-22 | Harris Corporation | Method for making electronic device with cover layer with openings and related devices |
US20150064851A1 (en) * | 2013-09-03 | 2015-03-05 | Rohm And Haas Electronic Materials Llc | Pre-applied underfill |
DE102013220880B4 (en) * | 2013-10-15 | 2016-08-18 | Infineon Technologies Ag | An electronic semiconductor package having an electrically insulating, thermal interface structure on a discontinuity of an encapsulation structure, and a manufacturing method therefor, and an electronic device having the same |
US20170216947A1 (en) * | 2014-07-28 | 2017-08-03 | Xin Yang | Systems and methods for reinforced adhesive bonding |
US9315597B2 (en) | 2014-09-08 | 2016-04-19 | Sirrus, Inc. | Compositions containing 1,1-disubstituted alkene compounds for preparing polymers having enhanced glass transition temperatures |
US9416091B1 (en) | 2015-02-04 | 2016-08-16 | Sirrus, Inc. | Catalytic transesterification of ester compounds with groups reactive under transesterification conditions |
US9682533B1 (en) * | 2014-09-09 | 2017-06-20 | Hrl Laboratories, Llc | Methods to form electrical-mechanical connections between two surfaces, and systems and compositions suitable for such methods |
CN105522248B (en) * | 2014-09-30 | 2018-04-27 | 苏州沃特维自动化系统有限公司 | A kind of wire-moving device |
JP5967629B2 (en) * | 2014-11-17 | 2016-08-10 | インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation | Circuit module and manufacturing method thereof |
US10501400B2 (en) | 2015-02-04 | 2019-12-10 | Sirrus, Inc. | Heterogeneous catalytic transesterification of ester compounds with groups reactive under transesterification conditions |
JP6438790B2 (en) * | 2015-02-06 | 2018-12-19 | デクセリアルズ株式会社 | Semiconductor device manufacturing method and underfill film |
JP2016149384A (en) * | 2015-02-10 | 2016-08-18 | パナソニックIpマネジメント株式会社 | Component mounting apparatus, component mounting method and component mounting line |
JP2016149383A (en) * | 2015-02-10 | 2016-08-18 | パナソニックIpマネジメント株式会社 | Component mounting apparatus, component mounting method and component mounting line |
SG11201708601UA (en) | 2015-04-20 | 2017-11-29 | Agency Science Tech & Res | Conductive polymer composite as plastic solder |
US9334430B1 (en) | 2015-05-29 | 2016-05-10 | Sirrus, Inc. | Encapsulated polymerization initiators, polymerization systems and methods using the same |
US9217098B1 (en) | 2015-06-01 | 2015-12-22 | Sirrus, Inc. | Electroinitiated polymerization of compositions having a 1,1-disubstituted alkene compound |
US9706662B2 (en) * | 2015-06-30 | 2017-07-11 | Raytheon Company | Adaptive interposer and electronic apparatus |
KR102464324B1 (en) * | 2015-10-27 | 2022-11-09 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | Light emitting device package, manufacturing method thereof and light system having the same |
US9518001B1 (en) | 2016-05-13 | 2016-12-13 | Sirrus, Inc. | High purity 1,1-dicarbonyl substituted-1-alkenes and methods for their preparation |
US10428177B2 (en) | 2016-06-03 | 2019-10-01 | Sirrus, Inc. | Water absorbing or water soluble polymers, intermediate compounds, and methods thereof |
US9617377B1 (en) | 2016-06-03 | 2017-04-11 | Sirrus, Inc. | Polyester macromers containing 1,1-dicarbonyl-substituted 1 alkenes |
US10196481B2 (en) | 2016-06-03 | 2019-02-05 | Sirrus, Inc. | Polymer and other compounds functionalized with terminal 1,1-disubstituted alkene monomer(s) and methods thereof |
US9567475B1 (en) | 2016-06-03 | 2017-02-14 | Sirrus, Inc. | Coatings containing polyester macromers containing 1,1-dicarbonyl-substituted 1 alkenes |
US9892985B2 (en) * | 2016-07-18 | 2018-02-13 | Nanya Technology Corporation | Semiconductor device and method for manufacturing the same |
KR20180014903A (en) * | 2016-08-01 | 2018-02-12 | 삼성디스플레이 주식회사 | Electronic device, mounting method of the same, and method of manufacturing display apparatus having the same |
US10160066B2 (en) * | 2016-11-01 | 2018-12-25 | GM Global Technology Operations LLC | Methods and systems for reinforced adhesive bonding using solder elements and flux |
US10593565B2 (en) * | 2017-01-31 | 2020-03-17 | Skyworks Solutions, Inc. | Control of under-fill with a packaging substrate having an integrated trench for a dual-sided ball grid array package |
US10551261B2 (en) * | 2017-02-28 | 2020-02-04 | Rosemount Inc. | Joint for brittle materials |
US10881007B2 (en) * | 2017-10-04 | 2020-12-29 | International Business Machines Corporation | Recondition process for BGA using flux |
US11039531B1 (en) | 2018-02-05 | 2021-06-15 | Flex Ltd. | System and method for in-molded electronic unit using stretchable substrates to create deep drawn cavities and features |
CN110557937B (en) | 2018-05-31 | 2021-08-06 | 铟泰公司 | Flux effective to inhibit non-wetting opening in BGA assemblies |
US11508648B2 (en) * | 2018-06-29 | 2022-11-22 | Intel Corporation | Coupling mechanisms for substrates, semiconductor packages, and/or printed circuit boards |
US10964660B1 (en) * | 2018-11-20 | 2021-03-30 | Flex Ltd. | Use of adhesive films for 3D pick and place assembly of electronic components |
US10896877B1 (en) | 2018-12-14 | 2021-01-19 | Flex Ltd. | System in package with double side mounted board |
US10568215B1 (en) | 2019-05-20 | 2020-02-18 | Flex Ltd. | PCBA encapsulation by thermoforming |
CN111586990B (en) * | 2020-05-07 | 2023-03-31 | 中国航空无线电电子研究所 | Protection processing method for ceramic column grid array device of printed circuit board |
KR20220001311A (en) * | 2020-06-29 | 2022-01-05 | 삼성전자주식회사 | Semiconductor package-and-package on package having the same |
CN115602555A (en) * | 2021-07-09 | 2023-01-13 | 长鑫存储技术有限公司(Cn) | Packaging method and packaging structure thereof |
CN113923865B (en) * | 2021-09-13 | 2023-08-22 | 华为技术有限公司 | Electronic component and electronic equipment |
CN115206817A (en) * | 2022-09-16 | 2022-10-18 | 江苏长电科技股份有限公司 | Method for improving welding quality of flip structure |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5629566A (en) * | 1994-08-15 | 1997-05-13 | Kabushiki Kaisha Toshiba | Flip-chip semiconductor devices having two encapsulants |
US5641997A (en) * | 1993-09-14 | 1997-06-24 | Kabushiki Kaisha Toshiba | Plastic-encapsulated semiconductor device |
US5880530A (en) * | 1996-03-29 | 1999-03-09 | Intel Corporation | Multiregion solder interconnection structure |
US5907190A (en) * | 1994-11-24 | 1999-05-25 | Dow Corning Toray Silicone Co., Ltd. | Semiconductor device having a cured silicone coating with non uniformly dispersed filler |
US5959362A (en) * | 1996-06-13 | 1999-09-28 | Nec Corporation | Device mounting a semiconductor element on a wiring substrate including an adhesive material having first and second adhesive components with different cure characteristics |
Family Cites Families (56)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61271319A (en) * | 1985-05-24 | 1986-12-01 | Shin Etsu Chem Co Ltd | Epoxy resin composition for semiconductor sealing |
US4745215A (en) * | 1987-04-03 | 1988-05-17 | International Business Machines Corporation | Fluorine containing dicyanate resins |
EP0368262B1 (en) * | 1988-11-09 | 2001-02-14 | Nitto Denko Corporation | Wiring substrate, film carrier, semiconductor device made by using the film carrier, and mounting structure comprising the semiconductor device |
US5001542A (en) * | 1988-12-05 | 1991-03-19 | Hitachi Chemical Company | Composition for circuit connection, method for connection using the same, and connected structure of semiconductor chips |
JPH0793342B2 (en) * | 1988-12-29 | 1995-10-09 | シャープ株式会社 | Method of forming electrodes |
US5024372A (en) * | 1989-01-03 | 1991-06-18 | Motorola, Inc. | Method of making high density solder bumps and a substrate socket for high density solder bumps |
US5468681A (en) * | 1989-08-28 | 1995-11-21 | Lsi Logic Corporation | Process for interconnecting conductive substrates using an interposer having conductive plastic filled vias |
US5834799A (en) * | 1989-08-28 | 1998-11-10 | Lsi Logic | Optically transmissive preformed planar structures |
US5074947A (en) * | 1989-12-18 | 1991-12-24 | Epoxy Technology, Inc. | Flip chip technology using electrically conductive polymers and dielectrics |
US4999699A (en) * | 1990-03-14 | 1991-03-12 | International Business Machines Corporation | Solder interconnection structure and process for making |
JP2547895B2 (en) * | 1990-03-20 | 1996-10-23 | シャープ株式会社 | Semiconductor device mounting method |
US5060844A (en) * | 1990-07-18 | 1991-10-29 | International Business Machines Corporation | Interconnection structure and test method |
US5086558A (en) * | 1990-09-13 | 1992-02-11 | International Business Machines Corporation | Direct attachment of semiconductor chips to a substrate with a substrate with a thermoplastic interposer |
US5128746A (en) * | 1990-09-27 | 1992-07-07 | Motorola, Inc. | Adhesive and encapsulant material with fluxing properties |
JP2940269B2 (en) * | 1990-12-26 | 1999-08-25 | 日本電気株式会社 | Connecting method of integrated circuit element |
JP2655768B2 (en) * | 1991-08-05 | 1997-09-24 | ローム株式会社 | Adhesive and mounting structure using the same |
US5203075A (en) * | 1991-08-12 | 1993-04-20 | Inernational Business Machines | Method of bonding flexible circuit to cicuitized substrate to provide electrical connection therebetween using different solders |
KR940008327B1 (en) * | 1991-10-10 | 1994-09-12 | 삼성전자 주식회사 | Semiconductor package and mounting method thereof |
JP2927081B2 (en) * | 1991-10-30 | 1999-07-28 | 株式会社デンソー | Resin-sealed semiconductor device |
JPH05175280A (en) * | 1991-12-20 | 1993-07-13 | Rohm Co Ltd | Packaging structure of semiconductor device and method of packaging |
JPH06103707B2 (en) * | 1991-12-26 | 1994-12-14 | インターナショナル・ビジネス・マシーンズ・コーポレイション | How to replace semiconductor chip |
US5524422A (en) * | 1992-02-28 | 1996-06-11 | Johnson Matthey Inc. | Materials with low moisture outgassing properties and method of reducing moisture content of hermetic packages containing semiconductor devices |
WO1993019487A1 (en) * | 1992-03-24 | 1993-09-30 | Unisys Corporation | Integrated circuit module having microscopic self-alignment features |
US5246880A (en) * | 1992-04-27 | 1993-09-21 | Eastman Kodak Company | Method for creating substrate electrodes for flip chip and other applications |
US5324569A (en) * | 1993-02-26 | 1994-06-28 | Hewlett-Packard Company | Composite transversely plastic interconnect for microchip carrier |
US5445308A (en) * | 1993-03-29 | 1995-08-29 | Nelson; Richard D. | Thermally conductive connection with matrix material and randomly dispersed filler containing liquid metal |
JPH06334035A (en) * | 1993-05-24 | 1994-12-02 | Kawasaki Steel Corp | Dicing method for wafer |
US5386624A (en) * | 1993-07-06 | 1995-02-07 | Motorola, Inc. | Method for underencapsulating components on circuit supporting substrates |
US5474458A (en) * | 1993-07-13 | 1995-12-12 | Fujitsu Limited | Interconnect carriers having high-density vertical connectors and methods for making the same |
US5371328A (en) * | 1993-08-20 | 1994-12-06 | International Business Machines Corporation | Component rework |
US5543585A (en) * | 1994-02-02 | 1996-08-06 | International Business Machines Corporation | Direct chip attachment (DCA) with electrically conductive adhesives |
US5391397A (en) * | 1994-04-05 | 1995-02-21 | Motorola, Inc. | Method of adhesion to a polyimide surface by formation of covalent bonds |
US5861323A (en) * | 1994-06-06 | 1999-01-19 | Microfab Technologies, Inc. | Process for manufacturing metal ball electrodes for a semiconductor device |
CA2157259C (en) * | 1994-08-31 | 2000-08-29 | Koetsu Tamura | Electronic device assembly and a manufacturing method of the same |
US5497938A (en) * | 1994-09-01 | 1996-03-12 | Intel Corporation | Tape with solder forms and methods for transferring solder to chip assemblies |
US5579573A (en) * | 1994-10-11 | 1996-12-03 | Ford Motor Company | Method for fabricating an undercoated chip electrically interconnected to a substrate |
US5530288A (en) * | 1994-10-12 | 1996-06-25 | International Business Machines Corporation | Passive interposer including at least one passive electronic component |
FR2728392A1 (en) * | 1994-12-16 | 1996-06-21 | Bull Sa | METHOD AND SUPPORT FOR CONNECTING AN INTEGRATED CIRCUIT TO ANOTHER SUPPORT THROUGH BALLS |
US5616958A (en) * | 1995-01-25 | 1997-04-01 | International Business Machines Corporation | Electronic package |
US5742100A (en) * | 1995-03-27 | 1998-04-21 | Motorola, Inc. | Structure having flip-chip connected substrates |
US5587342A (en) * | 1995-04-03 | 1996-12-24 | Motorola, Inc. | Method of forming an electrical interconnect |
US5710071A (en) * | 1995-12-04 | 1998-01-20 | Motorola, Inc. | Process for underfilling a flip-chip semiconductor device |
US5861661A (en) * | 1995-12-27 | 1999-01-19 | Industrial Technology Research Institute | Composite bump tape automated bonded structure |
JPH09232372A (en) * | 1996-02-26 | 1997-09-05 | Toshiba Microelectron Corp | Manufacture of semiconductor device |
US5801072A (en) * | 1996-03-14 | 1998-09-01 | Lsi Logic Corporation | Method of packaging integrated circuits |
US5704116A (en) * | 1996-05-03 | 1998-01-06 | Motorola, Inc. | Method of holding a component using an anhydride fluxing agent |
JPH09321212A (en) | 1996-05-30 | 1997-12-12 | Nec Kyushu Ltd | Semiconductor device and its manufacture |
US5891753A (en) * | 1997-01-24 | 1999-04-06 | Micron Technology, Inc. | Method and apparatus for packaging flip chip bare die on printed circuit boards |
US5891754A (en) * | 1997-02-11 | 1999-04-06 | Delco Electronics Corp. | Method of inspecting integrated circuit solder joints with x-ray detectable encapsulant |
US5975408A (en) * | 1997-10-23 | 1999-11-02 | Lucent Technologies Inc. | Solder bonding of electrical components |
US6228678B1 (en) | 1998-04-27 | 2001-05-08 | Fry's Metals, Inc. | Flip chip with integrated mask and underfill |
US6265776B1 (en) | 1998-04-27 | 2001-07-24 | Fry's Metals, Inc. | Flip chip with integrated flux and underfill |
US6323062B1 (en) | 1998-04-27 | 2001-11-27 | Alpha Metals, Inc. | Wafer coating method for flip chips |
US6194788B1 (en) | 1999-03-10 | 2001-02-27 | Alpha Metals, Inc. | Flip chip with integrated flux and underfill |
EP1334513A2 (en) * | 2000-11-14 | 2003-08-13 | Henkel Loctite Corporation | Wafer applied fluxing and underfill material, and layered electronic assemblies manufactured therewith |
US6660560B2 (en) * | 2001-09-10 | 2003-12-09 | Delphi Technologies, Inc. | No-flow underfill material and underfill method for flip chip devices |
-
1998
- 1998-07-21 US US09/120,172 patent/US6121689A/en not_active Expired - Lifetime
- 1998-07-21 EP EP98935858A patent/EP1025587A4/en not_active Withdrawn
- 1998-07-21 JP JP2000503554A patent/JP2001510944A/en not_active Ceased
- 1998-07-21 DE DE1025587T patent/DE1025587T1/en active Pending
- 1998-07-21 AU AU85027/98A patent/AU8502798A/en not_active Abandoned
- 1998-07-21 WO PCT/US1998/015034 patent/WO1999004430A1/en not_active Application Discontinuation
- 1998-08-21 US US09/137,971 patent/US6297560B1/en not_active Expired - Lifetime
-
2000
- 2000-09-15 US US09/662,642 patent/US6566234B1/en not_active Expired - Lifetime
- 2000-09-15 US US09/662,641 patent/US6518677B1/en not_active Expired - Lifetime
-
2001
- 2001-08-20 US US09/935,432 patent/US20020014703A1/en not_active Abandoned
-
2003
- 2003-03-19 US US10/390,603 patent/US6774493B2/en not_active Expired - Lifetime
-
2004
- 2004-05-28 US US10/855,708 patent/US20050218517A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5641997A (en) * | 1993-09-14 | 1997-06-24 | Kabushiki Kaisha Toshiba | Plastic-encapsulated semiconductor device |
US5629566A (en) * | 1994-08-15 | 1997-05-13 | Kabushiki Kaisha Toshiba | Flip-chip semiconductor devices having two encapsulants |
US5907190A (en) * | 1994-11-24 | 1999-05-25 | Dow Corning Toray Silicone Co., Ltd. | Semiconductor device having a cured silicone coating with non uniformly dispersed filler |
US5880530A (en) * | 1996-03-29 | 1999-03-09 | Intel Corporation | Multiregion solder interconnection structure |
US5959362A (en) * | 1996-06-13 | 1999-09-28 | Nec Corporation | Device mounting a semiconductor element on a wiring substrate including an adhesive material having first and second adhesive components with different cure characteristics |
Cited By (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050196959A1 (en) * | 2002-04-26 | 2005-09-08 | Kazuykoshi Ueno | Semiconductor device and manufacturing process therefor as well as plating solution |
US7821135B2 (en) * | 2002-04-26 | 2010-10-26 | Nec Electronics Corporation | Semiconductor device with improved stress migration resistance and manufacturing process therefor |
US20060128067A1 (en) * | 2002-10-04 | 2006-06-15 | International Rectifier Corporation | Semiconductor device package |
US7364949B2 (en) * | 2002-10-04 | 2008-04-29 | International Rectifier Corporation | Semiconductor device package |
US20050082670A1 (en) * | 2003-09-11 | 2005-04-21 | Nordson Corporation | Method for preapplying a viscous material to strengthen solder connections in microelectronic packaging and microelectronic packages formed thereby |
US20080009101A1 (en) * | 2004-08-20 | 2008-01-10 | Bernier William E | Compressible films surrounding solder connectors |
US20060040567A1 (en) * | 2004-08-20 | 2006-02-23 | International Business Machines Corporation | Compressible films surrounding solder connectors |
US7566649B2 (en) | 2004-08-20 | 2009-07-28 | International Business Machines Corporation | Compressible films surrounding solder connectors |
US7332821B2 (en) * | 2004-08-20 | 2008-02-19 | International Business Machines Corporation | Compressible films surrounding solder connectors |
US20060043603A1 (en) * | 2004-08-31 | 2006-03-02 | Lsi Logic Corporation | Low temperature PB-free processing for semiconductor devices |
US7291548B2 (en) * | 2004-09-29 | 2007-11-06 | Intel Corporation | Stress-relief layers and stress-compensation collars with low-temperature solders for board-level joints, and processes of making same |
US20070190772A1 (en) * | 2004-09-29 | 2007-08-16 | Intel Corporation | Stress-relief layers and stress-compensation collars with low-temperature solders for board-level joints, and processes of making same |
US20090301760A1 (en) * | 2005-06-16 | 2009-12-10 | Masato Shimamura | Method of Soldering a Module Board |
US20070004091A1 (en) * | 2005-06-30 | 2007-01-04 | Fujitsu Limited | Semiconductor device and manufacturing method thereof |
US20070284758A1 (en) * | 2006-05-22 | 2007-12-13 | General Electric Company | Electronics package and associated method |
US20090291314A1 (en) * | 2006-09-15 | 2009-11-26 | Matsushita Electric Industrial Co., Ltd. | Electronic components mounting adhesive and electronic components mounting structure |
US8034447B2 (en) | 2006-09-15 | 2011-10-11 | Panasonic Corporation | Electronic components mounting adhesive and electronic components mounting structure |
US7977155B2 (en) * | 2007-05-04 | 2011-07-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer-level flip-chip assembly methods |
US20080274589A1 (en) * | 2007-05-04 | 2008-11-06 | Chien-Hsiun Lee | Wafer-level flip-chip assembly methods |
US7951648B2 (en) * | 2008-07-01 | 2011-05-31 | International Business Machines Corporation | Chip-level underfill method of manufacture |
US20100003786A1 (en) * | 2008-07-01 | 2010-01-07 | International Business Machines Corporation | Chip-level underfill process and structures thereof |
US8274166B2 (en) * | 2008-07-09 | 2012-09-25 | Renesas Electronics Corporation | Semiconductor device and method of manufacturing the same |
US20100007035A1 (en) * | 2008-07-09 | 2010-01-14 | Nec Electronics Corporation | Semiconductor device and method of manufacturing the same |
US20100148362A1 (en) * | 2008-10-23 | 2010-06-17 | Panasonic Corparation | Semiconductor device and method for fabricating the same |
US8450848B2 (en) | 2008-10-23 | 2013-05-28 | Panasonic Corporation | Semiconductor device and method for fabricating the same |
US20100187774A1 (en) * | 2009-01-26 | 2010-07-29 | Commissariat A L'energie Atomique | Seal barrier for a micro component and method for producing such a barrier |
FR2941563A1 (en) * | 2009-01-26 | 2010-07-30 | Commissariat Energie Atomique | SEALED BARRIER FOR MICROCOMPONENT AND METHOD FOR MANUFACTURING SUCH BARRIER. |
EP2211382A3 (en) * | 2009-01-26 | 2011-03-09 | Commissariat à l'Énergie Atomique et aux Énergies Alternatives | Watertight barrier for a microcomponent and method for manufacturing such a barrier |
EP2426707A1 (en) * | 2010-09-06 | 2012-03-07 | Nitto Denko Corporation | Method for Manufacturing Electronic Parts Device and Resin Composition for Electronic Parts Encapsulation |
CN102386111A (en) * | 2010-09-06 | 2012-03-21 | 日东电工株式会社 | Method for manufacturing electronic parts device and resin composition for electronic parts encapsulation |
US8938878B2 (en) | 2010-09-06 | 2015-01-27 | Nitto Denko Corporation | Method for manufacturing electronic parts device and resin composition for electronic parts encapsulation |
CN103515447A (en) * | 2012-06-19 | 2014-01-15 | Nxp股份有限公司 | Electronic device and method of manufacturing such device |
US8993379B2 (en) * | 2013-01-21 | 2015-03-31 | International Business Machines Corporation | Chip stack with electrically insulating walls |
US9093446B2 (en) * | 2013-01-21 | 2015-07-28 | International Business Machines Corporation | Chip stack with electrically insulating walls |
US9418976B2 (en) | 2013-01-21 | 2016-08-16 | International Business Machines Corporation | Chip stack with electrically insulating walls |
Also Published As
Publication number | Publication date |
---|---|
AU8502798A (en) | 1999-02-10 |
US20020014703A1 (en) | 2002-02-07 |
US6297560B1 (en) | 2001-10-02 |
US20030218261A1 (en) | 2003-11-27 |
US6774493B2 (en) | 2004-08-10 |
JP2001510944A (en) | 2001-08-07 |
DE1025587T1 (en) | 2001-02-08 |
US6121689A (en) | 2000-09-19 |
US6566234B1 (en) | 2003-05-20 |
US6518677B1 (en) | 2003-02-11 |
WO1999004430A1 (en) | 1999-01-28 |
EP1025587A1 (en) | 2000-08-09 |
EP1025587A4 (en) | 2000-10-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6566234B1 (en) | Semiconductor flip-chip package and method for the fabrication thereof | |
US6132646A (en) | Polmerizable fluxing agents and fluxing adhesive compositions therefrom | |
US5985456A (en) | Carboxyl-containing polyunsaturated fluxing adhesive for attaching integrated circuits | |
US6335571B1 (en) | Semiconductor flip-chip package and method for the fabrication thereof | |
US6399426B1 (en) | Semiconductor flip-chip package and method for the fabrication thereof | |
US6873056B2 (en) | Electrode-to-electrode bond structure | |
US6017634A (en) | Carboxyl-containing polyunsaturated fluxing agent and carboxyl-reactive neutralizing agent as adhesive | |
US6610559B2 (en) | Integrated void-free process for assembling a solder bumped chip | |
JP3329276B2 (en) | Interconnect structure with conductive adhesive | |
US5814401A (en) | Selectively filled adhesive film containing a fluxing agent | |
US20020089067A1 (en) | Wafer applied fluxing and underfill material, and layered electronic assemblies manufactured therewith | |
US20010000929A1 (en) | Flip chip with integrated flux and underfill | |
WO2006030674A1 (en) | Flip chip mounting method and flip chip mounting element | |
WO2004086845A2 (en) | Flip-chip assembley with thin underfill and thick solder mask | |
JP2002151170A (en) | Method for using conductive material | |
EP1627424A2 (en) | Method of using pre-applied underfill encapsulant | |
WO2002087297A1 (en) | Electronic apparatus | |
US7279359B2 (en) | High performance amine based no-flow underfill materials for flip chip applications | |
WO2010084858A1 (en) | Surface mounting method for component to be mounted, structure with mounted component obtained by the method, and liquid epoxy resin composition for underfill used in the method | |
JPWO2004070826A1 (en) | Method for forming interelectrode connection structure and interelectrode connection structure | |
Capote et al. | Reflow-curable polymer fluxes for flip chip encapsulation | |
JP3204142B2 (en) | Semiconductor device manufacturing method and lead frame | |
JP2004172238A (en) | Method of manufacturing semiconductor device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |