US20020118457A1 - Wavefront coded imaging systems - Google Patents

Wavefront coded imaging systems Download PDF

Info

Publication number
US20020118457A1
US20020118457A1 US09/747,788 US74778800A US2002118457A1 US 20020118457 A1 US20020118457 A1 US 20020118457A1 US 74778800 A US74778800 A US 74778800A US 2002118457 A1 US2002118457 A1 US 2002118457A1
Authority
US
United States
Prior art keywords
transfer function
wavefront coding
lens
coding element
optical transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US09/747,788
Inventor
Edward Dowski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omnivision CDM Optics Inc
Original Assignee
CDM Optics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CDM Optics Inc filed Critical CDM Optics Inc
Priority to US09/747,788 priority Critical patent/US20020118457A1/en
Assigned to CDM OPTICS, INCORPORATED reassignment CDM OPTICS, INCORPORATED ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DOWSKI, EDWARD RAYMOND JR.
Priority to EP01272457A priority patent/EP1346251A2/en
Priority to PCT/US2001/044159 priority patent/WO2002052331A2/en
Priority to AU2002219861A priority patent/AU2002219861A1/en
Publication of US20020118457A1 publication Critical patent/US20020118457A1/en
Assigned to REGENTS OF THE UNIVERSITY OF COLORADO, THE reassignment REGENTS OF THE UNIVERSITY OF COLORADO, THE QUITCLAIM Assignors: DOWSKI, EDWARD RAYMOND
Priority to US10/407,708 priority patent/US6940649B2/en
Priority to US11/192,572 priority patent/US7106510B2/en
Priority to US11/511,023 priority patent/US7554732B2/en
Priority to US11/511,022 priority patent/US7554731B2/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0012Optical design, e.g. procedures, algorithms, optimisation routines
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46Systems using spatial filters
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses

Definitions

  • This invention relates to apparatus and methods for optical design based on wavefront coding combined with post processing of images.
  • Traditional optical design is based on the premise that the only major components of the imaging system are the optics and detector.
  • the detector can be analog (e.g. film) or a digital (e.g. CCD, CMOS etc.) detector.
  • Traditional image processing techniques performed on an image are performed after the image is formed. Examples of traditional image processing include edge sharpening and color filter array (CFA) color interpolation.
  • Traditional optics are therefore designed to form images at the detector that are sharp and clear over a range of field angles, illumination wavelengths, temperatures, and focus positions. Consequently, a trade off is made between forming good images, which requires optical designs that are larger, heavier, and contain more optical elements than are desirable, and modifying the design in order to reduce size, weight, or the number of optical elements, which results in loss of image quality.
  • Wavefront Coding systems share the task of image formation between optics and digital processing. Instead of the imaging system being primarily composed of optics and the detector, Wavefront Coding imaging systems are composed of optics, detector, and importantly, processing of the detected image.
  • the detector can in general be analog, such as film, or a digital detector. Since processing of the detected image is an integral part of the total system, the optics of Wavefront Coded imaging systems do not need to form sharp and clear images at the plane of the detector. It is only the images after processing that need to be sharp and clear.
  • Wavefront Coding in general, corrects for known or unknown amounts of “misfocus-like” aberrations. These aberrations include misfocus, spherical aberration, petzval curvature, astigmatism, and chromatic aberration. System sensitivities to environmental parameters such as temperature and pressure induced aberrations, and mechanical focus related aberrations related to fabrication error, assembly error, drift, wear, etc., are also reduced with Wavefront Coding. Optical designs based on Wavefront Coding can reduce the effects of these aberrations and result in simpler designs that produce good images.
  • Optical system designs according to the present invention are improved in that they have the characteristic that the transverse ray intercept curves are substantially straight lines.
  • the transverse ray intercept curves for wavefront coded systems need not have a near zero slope; the slope, which indicates misfocus, may be substantial, because wavefront coding allows the effects due to misfocus to be removed.
  • the transverse ray intercept curves should vary mainly in slope over wavelength, field angles, temperature, etc. but need not be exactly straight lines. Some ripple is acceptable. With wavefront coding optical surfaces and post processing, good images can be produced.
  • FIG. 1 shows a single-lens miniature imaging system according to the present invention.
  • FIG. 2 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 1 with wavefront coding removed.
  • FIG. 3 illustrates distortion curves for the system of FIG. 1 with wavefront coding removed.
  • FIG. 4 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding removed.
  • FIG. 5 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding, but without post processing.
  • MTF modulation transfer functions
  • FIG. 6 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding, both before and after filtering.
  • MTF modulation transfer functions
  • FIGS. 7 a and 7 b illustrates sampled point spread functions (PSF) for the system of FIG. 1, with wavefront coding and after filtering, for two object distances.
  • PSF sampled point spread functions
  • FIG. 8 shows a low cost microscope objective according to the present invention.
  • FIG. 9 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 8 with wavefront coding removed.
  • FIG. 10 illustrates modulation transfer functions (MTF) for the system of FIG. 8, without wavefront coding; with wavefront coding; and with both wavefront coding and filtering.
  • MTF modulation transfer functions
  • FIG. 11 shows a passive athermalized IR imaging system according to the present invention.
  • FIG. 12 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 11, without wavefront coding.
  • FIG. 13 illustrates modulation transfer functions (MTF) for the system of FIG. 11, without wavefront coding.
  • FIG. 14 illustrates modulation transfer functions (MTF) for the system of FIG. 11, with wavefront coding, both with and without filtering.
  • MTF modulation transfer functions
  • FIG. 15 a illustrates transverse ray intercept curves as typically implemented in traditional imaging systems.
  • FIG. 15 b shows MTFs for the system of FIG. 15 a.
  • FIG. 16 illustrates an example of a one dimensional separable filter for use as a post processing element in the present invention.
  • FIG. 17 illustrates the magnitude of the transfer function of the filter of FIG. 16.
  • FIG. 1 shows a single-lens miniature imaging system 100 according to the present invention.
  • Lens 102 includes wavefront coding element 104 formed on its second surface.
  • Detector 106 is preceded by an IR filter 108 and cover glass 110 .
  • Post processor 112 performs processing on the images captured by detector 106 .
  • the example single-lens imaging system (singlet) 100 is designed to meet the following specifications:
  • the example singlet 100 without Wavefront Coding 104 , was designed so that the aberrations that are not corrected by the optical surfaces, namely petzval curvature and axial chromatic aberration, are a type of misfocus.
  • petzval curvature is a type of misfocus with field angle
  • axial chromatic aberration is misfocus with illumination wavelength.
  • the effect of these aberrations could hypothetically be corrected within small regions of the image plane by changing the focus position.
  • the resulting modulation transfer functions (MTFs) and point spread functions (PSFs) will be insensitive to the focus-like aberrations.
  • the MTFs and PSFs will not be the same as an ideal in-focus MTF or PSF from a traditional imaging system.
  • Image processing is required to restore the spatial character of the image and produce a sharp and clear image.
  • Wavefront Coding surface is rectangularly separable and allows for fast processing.
  • Other forms of Wavefront Coding surfaces are non-separable, and the sum of rectangularly separable forms.
  • One non-separable form is defined as:
  • Wavefront Coding surface for singlet 100 in this example is placed at the stop surface (surface 104 ) and has the parameterized equation:
  • FIGS. 2 - 4 illustrate the performance of system 100 with wavefront coding element 104 removed, in order to illustrate design requirements and performance.
  • FIG. 5 illustrates the performance of system 100 with wavefront coding element 104 in place, but without post processing filter 112 .
  • FIG. 6 illustrates the performance improvement with post processing 112 .
  • FIGS. 7 a and 7 b shows point spread functions for system 100 with both wavefront coding and post processing.
  • FIG. 2 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 1 with wavefront coding surface 104 removed for illustrative purposes. Curves are shown for system 100 at half field angles of 0°, 10°, 20°, and 25° off axis, and for illumination wavelengths of 450 nm, 550 nm, and 650 nm. A slope of zero indicates an in-focus condition. Thus on-axis rays are nearly in focus. But, for off axis field angles, the slopes of the transverse ray intercept curves increase dramatically.
  • FIG. 15 a illustrates traditional transverse ray plots. These plots are taken from “Practical Computer Aided Lens Design”, Gregory Hallick Smith, William Bell, Inc., Richmond 1998. Note that the plot for near on axis rays do look similar to straight horizontal lines, and thus produce an in focus image. Refer also to FIG. 15 b which shows associated MTFs for this system. The MTFs for near on axis rays are good.
  • the transverse ray intercept curves of FIG. 2 are essentially straight lines, both on and off axis, and this is a deliberate design goal, because the use of wavefront coding 104 and image processing 112 can bring the captured images into focus, so long as the curves without wavefront coding are essentially straight lines through the origin, even if the lines are significantly sloped. The effect of the slope is removed by adding wavefront coding and post processing.
  • the aberration petzval curvature gives rise to transverse ray intercept curves, with slopes that are a function of field angle.
  • Axial chromatic aberration gives rise to ray intercept curves with slopes that are a function of illumination wavelength. From FIG. 2, both of these features are part of the transverse ray intercept curves in this example design.
  • FIG. 3 illustrates distortion curves for system 100 of FIG. 1, with wavefront coding element 104 removed.
  • the distortion is less than 0.2%. If distortion was large enough then additional digital processing might be required to reposition image points into a non-distorted image.
  • Table 1 lists the optical prescription of this lens, again without the Wavefront Coding surface. Units are in mm, and the total length is 4.1 mm. Aspheric terms describe rotationally symmetric forms of r order with order equal to 4, 6, 8, etc.
  • FIG. 4 illustrates modulation transfer functions (MTF) for system 100 of FIG. 1, without wavefront coding element 104 .
  • MTFs correspond to the transverse ray aberration curves of FIG. 2.
  • the MTFs are for half field angles 0, 15, and 25 degrees with wavelengths of 550 nm.
  • the MTFs include the pixel MTF due to the Bayer color filter array detector with six micron pixels and 100% fill factor.
  • the on-axis MTF is essentially diffraction limited.
  • the large drop in MTF off-axis is due to the large amount of petzval curvature that is unavoidable in traditional single lens designs with a large field of view.
  • This singlet without wavefront coding 104 does not meet the MTF specification of greater than 40% modulation at 40 lp/mm for all field angles. But, due to its design for Wavefront Coding, modifying the second surface with a Wavefront Coding surface form 104 will lead to acceptable MTF modulation values when combined with digital processing. By changing the wavefront coding element 104 either more or less sensitivity to misfocus aberrations can be formed.
  • FIG. 5 illustrates modulation transfer functions (MTF) for system 100 of FIG. 1, with wavefront coding element 104 in place, but without post processing 112 .
  • the system is focused at infinity.
  • the half field angles shown are 0, 15, and 25 degrees.
  • the wavelength is 550 nm.
  • These MTFs have very little variation with field angle due to the addition of the Wavefront Coding surface, as compared to FIG. 4.
  • Pixel MTF due to the Bayer CFA has again been included.
  • the Bayer CFA with 6 ⁇ m 100% fill factor pixels has a Nyquist spatial frequency of about 42 lp/mm. Note that there are purposely no zeros in the MTFs below the detector's Nyquist spatial frequency.
  • FIG. 6 illustrates modulation transfer functions (MTF) for system 100 of FIG. 1, with wavefront coding 104 and after processing 112 .
  • MTF modulation transfer functions
  • FIGS. 7 a and 7 b illustrate sampled two-dimensional PSFs for system 100 of FIG. 1, with wavefront coding 104 and after processing 112 .
  • FIG. 7 a shows the processed PSFs when the object is at infinity.
  • FIG. 7 b shows the processed PSFs when the object is at 30 cm. These PSFs are for 550 nm wavelength and half field angles of 0, 15, and 25 degrees. After filtering, these PSFs have nearly ideal shapes. This singlet 100 when combined with wavefront coding and digital filtering thus easily meets the system specifications.
  • processor 112 is a rectangularly separable digital filter. Rectangularly separable filters are more computationally efficient (counting the number of multiply and additions) than full 2D kernel filters. Separable filtering consists of first filtering each row of the image with the 1D row filter and forming an intermediate image. The columns of the intermediate image are then filtered with the 1D column filter to provide the final in-focus image.
  • the separable filter used for this example singlet has the same filters for rows and columns.
  • FIG. 16 illustrates an example of a one dimensional separable filter 112 .
  • Coefficients are represented as real values, but can be quantified into integer values for fixed point computations.
  • the sum of the filter coefficients equals approximately 1.
  • the coefficients were determined with a least squares algorithm by minimizing the squared difference between the filtered wavefront coded OTFs and a desired MTF with a value greater than 40% at 40 lp/mm.
  • the width of the filtered PSFs of FIGS. 7 a and 7 b are also minimized with the least squares algorithm. Changes in the filtered PSFs are minimized in regions away from their central peaks.
  • FIG. 17 illustrates the magnitude of the transfer function of the filter of FIG. 16.
  • the zero spatial frequency value is 1.
  • FIG. 8 shows a low cost microscope objective 800 according to the present invention.
  • Lens 802 is aspheric and has focussing power.
  • Aperture stop 804 includes wavefront coding element 806 . Processing is accomplished by processing block 810 .
  • Wavefront coding microscope objective 800 is designed to meet the following objectives:
  • the depth of field of traditional microscope objectives is described by the numerical aperture (NA) and the imaging wavelength.
  • the wavefront coding objective can have a depth of field that is independent of the NA of the objective.
  • the depth of field can be large enough to introduce prospective distortion to the final images. Regions of the object that are farther from the objective will appear smaller then regions of the object closer to the objective. Both near and far regions can image clearly with a large depth of field. Since the depth of field of traditional objectives is small prospective distortion is not common with traditional objectives, especially with high NA. Prospective distortion can be reduced or eliminating by designing wavefront coding objectives that are telecentric. In telecentric imaging systems the magnification of the object is independent of the distance to the object.
  • FIG. 9 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for system 800 of FIG. 8, with wavefront coding element 806 removed.
  • the ray intercept curves of FIG. 9 describe the performance of the system at wavelengths 450, 550, and 650 nm for the image field heights of on-axis (0.0 mm), 1.2 mm, and 2.8 mm. Full scale is +/ ⁇ 100 microns. Notice that each of these ray intercept curves vary mainly in slope, as required by the present invention. I.e., the shape of the curves are essentially the same when the slope components of the curves are not considered. While these plots are not quite as close to perfectly straight lines as those in FIG. 2, they can still be considered to be sloped substantially straight lines.
  • Wavefront coding element 806 is placed at aperture stop 804 , and is given by the rectangularly separable form of:
  • FIG. 10 illustrates modulation transfer functions (MTF) for system 800 of FIG. 8, without wavefront coding, with wavefront coding, and with both wavefront coding and post processing filtering, for illumination at 450 nm.
  • Image field heights are 0.0 mm, 1.2 mm, and 2.8 mm.
  • FIG. 11 shows a passive athermalized IR imaging system 1100 according to the present invention.
  • Lens 1102 is composed of silicon.
  • Lens 1104 is composed of germanium.
  • Lens 1106 is composed of silicon.
  • the aperture stop 1108 is at the back surface of lens 1106 .
  • Wavefront coding surface 1110 is on the back surface of lens 1106 (at aperture stop 1108 ).
  • Processing block 1112 processes the image.
  • Wavefront Coding surface for IR system 100 of this example has the parameterized equation:
  • FIG. 12 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for system 1100 of FIG. 11, with wavefront coding element 1110 removed.
  • the ray intercept curves of FIG. 11 describe the performance of system 1100 at a wavelength of 10 microns, on axis field points for ambient temperatures of +20° C., ⁇ 20° C., and +70° C. Full scale is +/ ⁇ 100 microns. Again these plots can be considered to be substantially straight lines. While they have more “wiggle” than the plots of FIGS. 2 and 9, in each case, if the plot were fitted to the closest straight line, the wiggles would not stray far from the line.
  • FIG. 13 illustrates on-axis MTF curves for system 1100 without wavefront coding at three temperatures +20° C. ⁇ 20° C., and +70° C.). Performance is nearly diffraction limited at +20°, but drops dramatically with changes in temperature.
  • FIG. 14 illustrates MTFs for system 1100 of FIG. 11, with wavefront coding, both with and without filtering by processing block 1112 .
  • the illumination wavelength is 10 microns.
  • the MTFs without filtering are significantly different from diffraction limited MTFs, but vary little with temperature. Thus, processing block 1112 is able to correct the images.
  • the MTFs after filtering are near diffraction limited for all three temperatures (+20°, ⁇ 20°, and +70°). Filtered MTFs extend only to the Nyquist frequency of the 20 micron detector, or 25 lp/mm.
  • FIG. 10 also illustrates this concept.
  • the MTF curves without wavefront coding do not track each other.
  • the curves with wavefront coding are very close together.
  • the curves with wavefront coding after post processing are very good.
  • transverse ray intercept curves may have noticeable deviations from a straight line (corresponding to the higher spatial frequencies)
  • the transverse ray intercept curves are still “substantially straight lines” according to our definition, because the MTFs with wavefront coding are very close together.
  • the MTFs under consideration are those that correspond to the useful range of the particular system being considered.

Abstract

The present invention provides improved Wavefront Coding imaging apparatus and methods composed of optics, detector, and processing of the detected image. The optics are constructed and arranged to have the characteristic that the transverse ray intercept curves form substantially straight, sloped lines. The wavefront coding corrects for known or unknown amounts of “misfocus-like” aberrations by altering the optical transfer function of the imaging apparatus in such a way that the altered optical transfer function is substantially insensitive to aberrations. Post processing then removes the effect of the coding, except for the invariance with regard to aberrations, producing clear images.

Description

    CROSS-REFERENCE TO RELATED APPLICATIONS
  • U.S. Pat. No. 5,748,371, issued May 5, 1998 and entitled “Extended Depth of Field Optical Systems,” is incorporated herein by reference.[0001]
  • BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0002]
  • This invention relates to apparatus and methods for optical design based on wavefront coding combined with post processing of images. [0003]
  • 2. Description of the Prior Art [0004]
  • Traditional optical design is based on the premise that the only major components of the imaging system are the optics and detector. The detector can be analog (e.g. film) or a digital ( e.g. CCD, CMOS etc.) detector. Traditional image processing techniques performed on an image are performed after the image is formed. Examples of traditional image processing include edge sharpening and color filter array (CFA) color interpolation. Traditional optics are therefore designed to form images at the detector that are sharp and clear over a range of field angles, illumination wavelengths, temperatures, and focus positions. Consequently, a trade off is made between forming good images, which requires optical designs that are larger, heavier, and contain more optical elements than are desirable, and modifying the design in order to reduce size, weight, or the number of optical elements, which results in loss of image quality. [0005]
  • A need remains in the art for improved optical designs which produce good images with systems that are smaller, lighter, and contain fewer elements then those based on traditional optics. [0006]
  • SUMMARY OF THE INVENTION
  • Optical design based on Wavefront Coding enables systems that can be smaller, lighter, and contain fewer optical elements than those based on traditional optics. Wavefront Coding systems share the task of image formation between optics and digital processing. Instead of the imaging system being primarily composed of optics and the detector, Wavefront Coding imaging systems are composed of optics, detector, and importantly, processing of the detected image. The detector can in general be analog, such as film, or a digital detector. Since processing of the detected image is an integral part of the total system, the optics of Wavefront Coded imaging systems do not need to form sharp and clear images at the plane of the detector. It is only the images after processing that need to be sharp and clear. [0007]
  • Wavefront Coding, in general, corrects for known or unknown amounts of “misfocus-like” aberrations. These aberrations include misfocus, spherical aberration, petzval curvature, astigmatism, and chromatic aberration. System sensitivities to environmental parameters such as temperature and pressure induced aberrations, and mechanical focus related aberrations related to fabrication error, assembly error, drift, wear, etc., are also reduced with Wavefront Coding. Optical designs based on Wavefront Coding can reduce the effects of these aberrations and result in simpler designs that produce good images. [0008]
  • Optical system designs according to the present invention are improved in that they have the characteristic that the transverse ray intercept curves are substantially straight lines. Unlike traditional optical designs, the transverse ray intercept curves for wavefront coded systems need not have a near zero slope; the slope, which indicates misfocus, may be substantial, because wavefront coding allows the effects due to misfocus to be removed. In actual systems the transverse ray intercept curves should vary mainly in slope over wavelength, field angles, temperature, etc. but need not be exactly straight lines. Some ripple is acceptable. With wavefront coding optical surfaces and post processing, good images can be produced.[0009]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 shows a single-lens miniature imaging system according to the present invention. [0010]
  • FIG. 2 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 1 with wavefront coding removed. [0011]
  • FIG. 3 illustrates distortion curves for the system of FIG. 1 with wavefront coding removed. [0012]
  • FIG. 4 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding removed. [0013]
  • FIG. 5 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding, but without post processing. [0014]
  • FIG. 6 illustrates modulation transfer functions (MTF) for the system of FIG. 1, with wavefront coding, both before and after filtering. [0015]
  • FIGS. 7[0016] a and 7 b illustrates sampled point spread functions (PSF) for the system of FIG. 1, with wavefront coding and after filtering, for two object distances.
  • FIG. 8 shows a low cost microscope objective according to the present invention. [0017]
  • FIG. 9 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 8 with wavefront coding removed. [0018]
  • FIG. 10 illustrates modulation transfer functions (MTF) for the system of FIG. 8, without wavefront coding; with wavefront coding; and with both wavefront coding and filtering. [0019]
  • FIG. 11 shows a passive athermalized IR imaging system according to the present invention. [0020]
  • FIG. 12 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 11, without wavefront coding. [0021]
  • FIG. 13 illustrates modulation transfer functions (MTF) for the system of FIG. 11, without wavefront coding. [0022]
  • FIG. 14 illustrates modulation transfer functions (MTF) for the system of FIG. 11, with wavefront coding, both with and without filtering. [0023]
  • FIG. 15[0024] a illustrates transverse ray intercept curves as typically implemented in traditional imaging systems.
  • FIG. 15[0025] b shows MTFs for the system of FIG. 15a.
  • FIG. 16 illustrates an example of a one dimensional separable filter for use as a post processing element in the present invention. [0026]
  • FIG. 17 illustrates the magnitude of the transfer function of the filter of FIG. 16. [0027]
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • FIG. 1 shows a single-lens [0028] miniature imaging system 100 according to the present invention. Lens 102 includes wavefront coding element 104 formed on its second surface. Detector 106 is preceded by an IR filter 108 and cover glass 110. Post processor 112 performs processing on the images captured by detector 106.
  • The example single-lens imaging system (singlet) [0029] 100 is designed to meet the following specifications:
  • f=2.5 mm [0030]
  • F/#=2.6 [0031]
  • Length<4.5 mm [0032]
  • Material: PMMA [0033]
  • FOV=50°[0034]
  • Focus: ∞−30 cm [0035]
  • pixel size=6 μm [0036]
  • Bayer CFA/100% fill factor [0037]
  • MTF>40% at 40 lp/mm [0038]
  • The [0039] example singlet 100, without Wavefront Coding 104, was designed so that the aberrations that are not corrected by the optical surfaces, namely petzval curvature and axial chromatic aberration, are a type of misfocus. Specifically, petzval curvature is a type of misfocus with field angle, and axial chromatic aberration is misfocus with illumination wavelength. The effect of these aberrations could hypothetically be corrected within small regions of the image plane by changing the focus position. By adding a Wavefront Coding surface, the resulting modulation transfer functions (MTFs) and point spread functions (PSFs) will be insensitive to the focus-like aberrations. However, the MTFs and PSFs will not be the same as an ideal in-focus MTF or PSF from a traditional imaging system. Image processing is required to restore the spatial character of the image and produce a sharp and clear image.
  • The form of the Wavefront Coding surface used in this example is: [0040]
  • S(x,y)=Σaisign(x)|x/r n| b i+aisign(y)|y/r n| b i
  • where the sum is over the index i. Sign(x)=−1 for x<0, +1 for x≧0. The parameter r[0041] n is a normalized radius value. This particular Wavefront Coding surface is rectangularly separable and allows for fast processing. Other forms of Wavefront Coding surfaces are non-separable, and the sum of rectangularly separable forms. One non-separable form is defined as:
  • S(r,θ)=Σra i cos(b lθ+φi)
  • where the sum is again over the subscript i. [0042]
  • There are an infinite number of Wavefront Coding surface forms. The Wavefront Coding surface for [0043] singlet 100 in this example is placed at the stop surface (surface 104) and has the parameterized equation:
  • S(x,y)=Σa isign(x)|x/r n| b i +a isign(y)|y/r n| b i
  • and the parameter values for i=1,2,3 are: [0044]
  • a[0045] 1=17.4171, b1=2.9911
  • a[0046] 2=10.8895, b2=6
  • a[0047] 3=3.8845, b3=20.1909
  • r[0048] n=0.459
  • FIGS. [0049] 2-4 illustrate the performance of system 100 with wavefront coding element 104 removed, in order to illustrate design requirements and performance. FIG. 5 illustrates the performance of system 100 with wavefront coding element 104 in place, but without post processing filter 112. FIG. 6 illustrates the performance improvement with post processing 112. FIGS. 7a and 7 b shows point spread functions for system 100 with both wavefront coding and post processing.
  • FIG. 2 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for the system of FIG. 1 with [0050] wavefront coding surface 104 removed for illustrative purposes. Curves are shown for system 100 at half field angles of 0°, 10°, 20°, and 25° off axis, and for illumination wavelengths of 450 nm, 550 nm, and 650 nm. A slope of zero indicates an in-focus condition. Thus on-axis rays are nearly in focus. But, for off axis field angles, the slopes of the transverse ray intercept curves increase dramatically.
  • There are numerous traditional methods of designing lenses. Most methods try to balance aberrations in order to improve the off-axis imaging at the expense of on-axis imaging or system simplicity. Traditional design methodologies do not attempt to make the transverse ray intercept curves straight lines. Instead, the traditional goal is to try to minimize the distance of a substantial portion of the transverse ray intercept curves from the horizontal axis. In most traditional systems the ray intercept curves are very different from straight lines, but in general lie closer to the horizontal axis than the off-axis curves shown in FIG. 2. In other words, in traditional systems the variation from a straight horizontal line is mainly in the straightness of the line, rather than in its slope. [0051]
  • FIG. 15[0052] a (prior art) illustrates traditional transverse ray plots. These plots are taken from “Practical Computer Aided Lens Design”, Gregory Hallick Smith, William Bell, Inc., Richmond 1998. Note that the plot for near on axis rays do look similar to straight horizontal lines, and thus produce an in focus image. Refer also to FIG. 15b which shows associated MTFs for this system. The MTFs for near on axis rays are good.
  • But as the rays move further off axis, the plots in FIG. 15[0053] a quickly deviate from being straight lines. Their associated MTFs in 15 b also quickly degrade.
  • The transverse ray intercept curves of FIG. 2 are essentially straight lines, both on and off axis, and this is a deliberate design goal, because the use of [0054] wavefront coding 104 and image processing 112 can bring the captured images into focus, so long as the curves without wavefront coding are essentially straight lines through the origin, even if the lines are significantly sloped. The effect of the slope is removed by adding wavefront coding and post processing.
  • The aberration petzval curvature gives rise to transverse ray intercept curves, with slopes that are a function of field angle. Axial chromatic aberration gives rise to ray intercept curves with slopes that are a function of illumination wavelength. From FIG. 2, both of these features are part of the transverse ray intercept curves in this example design. [0055]
  • FIG. 3 illustrates distortion curves for [0056] system 100 of FIG. 1, with wavefront coding element 104 removed. The distortion is less than 0.2%. If distortion was large enough then additional digital processing might be required to reposition image points into a non-distorted image. Table 1 lists the optical prescription of this lens, again without the Wavefront Coding surface. Units are in mm, and the total length is 4.1 mm. Aspheric terms describe rotationally symmetric forms of rorder with order equal to 4, 6, 8, etc.
    TABLE 1
    Surface Radius Thickness Material Diameter
    Obj Inf Inf 0  
    1 2.077 1.7133 PMMA 2  
    Stop −2.236   0.6498 1.4
    3 Inf 1.1   BK7 3.4
    4 Inf 0.55  BK7 3.4
    Img 0.1   3.4
    Surface Conic 4th Asph. 6th Asph. 8th Asph.
    Obj  0  
    1 −1.299 −.000375 −.010932 −.00603
    Stop −3.140 −.01049 
    3  0  
    4  0  
    Img
  • FIG. 4 illustrates modulation transfer functions (MTF) for [0057] system 100 of FIG. 1, without wavefront coding element 104. These MTFs correspond to the transverse ray aberration curves of FIG. 2. The MTFs are for half field angles 0, 15, and 25 degrees with wavelengths of 550 nm. The MTFs include the pixel MTF due to the Bayer color filter array detector with six micron pixels and 100% fill factor. The on-axis MTF is essentially diffraction limited. The large drop in MTF off-axis is due to the large amount of petzval curvature that is unavoidable in traditional single lens designs with a large field of view. This singlet without wavefront coding 104 does not meet the MTF specification of greater than 40% modulation at 40 lp/mm for all field angles. But, due to its design for Wavefront Coding, modifying the second surface with a Wavefront Coding surface form 104 will lead to acceptable MTF modulation values when combined with digital processing. By changing the wavefront coding element 104 either more or less sensitivity to misfocus aberrations can be formed.
  • FIG. 5 illustrates modulation transfer functions (MTF) for [0058] system 100 of FIG. 1, with wavefront coding element 104 in place, but without post processing 112. The system is focused at infinity. The half field angles shown are 0, 15, and 25 degrees. The wavelength is 550 nm. These MTFs have very little variation with field angle due to the addition of the Wavefront Coding surface, as compared to FIG. 4. Pixel MTF due to the Bayer CFA has again been included. The Bayer CFA with 6 μm 100% fill factor pixels has a Nyquist spatial frequency of about 42 lp/mm. Note that there are purposely no zeros in the MTFs below the detector's Nyquist spatial frequency.
  • Since the MTFs of FIG. 5 do not match a diffraction-limited MTF curve, a blurred image will be directly formed at the detector by this [0059] singlet 102. Post processing is needed to correct this.
  • FIG. 6 illustrates modulation transfer functions (MTF) for [0060] system 100 of FIG. 1, with wavefront coding 104 and after processing 112. Applying a single digital filter in processing block 112 gives the optical/digital MTFs shown in FIG. 6. The MTFs before filtering are as shown in FIG. 5. The MTFs after processing 112 at the spatial frequency of 40 lp/mm are all above 40% as specified by the design specifications. The level of the MTFs after processing could further be increased beyond that of the traditional diffraction-limited case, but possibly at the expense of a lower signal to noise ratio of the final image.
  • FIGS. 7[0061] a and 7 b illustrate sampled two-dimensional PSFs for system 100 of FIG. 1, with wavefront coding 104 and after processing 112. FIG. 7a shows the processed PSFs when the object is at infinity. FIG. 7b shows the processed PSFs when the object is at 30 cm. These PSFs are for 550 nm wavelength and half field angles of 0, 15, and 25 degrees. After filtering, these PSFs have nearly ideal shapes. This singlet 100 when combined with wavefront coding and digital filtering thus easily meets the system specifications.
  • In the preferred embodiment, [0062] processor 112 is a rectangularly separable digital filter. Rectangularly separable filters are more computationally efficient (counting the number of multiply and additions) than full 2D kernel filters. Separable filtering consists of first filtering each row of the image with the 1D row filter and forming an intermediate image. The columns of the intermediate image are then filtered with the 1D column filter to provide the final in-focus image. The separable filter used for this example singlet has the same filters for rows and columns.
  • FIG. 16 illustrates an example of a one dimensional [0063] separable filter 112. Coefficients are represented as real values, but can be quantified into integer values for fixed point computations. The sum of the filter coefficients equals approximately 1. The coefficients were determined with a least squares algorithm by minimizing the squared difference between the filtered wavefront coded OTFs and a desired MTF with a value greater than 40% at 40 lp/mm. The width of the filtered PSFs of FIGS. 7a and 7 b are also minimized with the least squares algorithm. Changes in the filtered PSFs are minimized in regions away from their central peaks. FIG. 17 illustrates the magnitude of the transfer function of the filter of FIG. 16. The zero spatial frequency value is 1.
  • FIG. 8 shows a low [0064] cost microscope objective 800 according to the present invention. The magnification of objective 800 is 10X, with numerical aperture (N.A.)=0.15. Lens 802 is aspheric and has focussing power. Aperture stop 804 includes wavefront coding element 806. Processing is accomplished by processing block 810.
  • Wavefront [0065] coding microscope objective 800 is designed to meet the following objectives:
  • magnification=10X [0066]
  • N.A.=0.15 [0067]
  • Distortion<1% [0068]
  • 7 micron square pixels with 100% fill factor [0069]
  • VGA grayscale detector [0070]
  • Optical material: PMMA [0071]
  • The depth of field of traditional microscope objectives is described by the numerical aperture (NA) and the imaging wavelength. The wavefront coding objective can have a depth of field that is independent of the NA of the objective. The depth of field can be large enough to introduce prospective distortion to the final images. Regions of the object that are farther from the objective will appear smaller then regions of the object closer to the objective. Both near and far regions can image clearly with a large depth of field. Since the depth of field of traditional objectives is small prospective distortion is not common with traditional objectives, especially with high NA. Prospective distortion can be reduced or eliminating by designing wavefront coding objectives that are telecentric. In telecentric imaging systems the magnification of the object is independent of the distance to the object. [0072]
  • FIG. 9 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for [0073] system 800 of FIG. 8, with wavefront coding element 806 removed. The ray intercept curves of FIG. 9 describe the performance of the system at wavelengths 450, 550, and 650 nm for the image field heights of on-axis (0.0 mm), 1.2 mm, and 2.8 mm. Full scale is +/−100 microns. Notice that each of these ray intercept curves vary mainly in slope, as required by the present invention. I.e., the shape of the curves are essentially the same when the slope components of the curves are not considered. While these plots are not quite as close to perfectly straight lines as those in FIG. 2, they can still be considered to be sloped substantially straight lines.
  • The major aberration apparent in this design is axial chromatic aberration, with a smaller amount of petzval curvature and lateral chromatic aberration. Without Wavefront Coding this lens would image poorly in white light, although it might produce a reasonable image in a single color. Tables 2 and 3 give the optical prescription for this system. Table 3 gives rotationally symmetric aspheric terms for the system. [0074]
    TABLE 2
    Radius
    Surface of curv Thickness Material Diameter Conic
    Obj Inf 2.45906 0.6357861 0
    1 1.973107 1.415926 Acrylic 1.2 −1.680295
    2 −2.882275 0.7648311 1.2 −1.029351
    Stop Inf 0.1 Acrylic 0.841 0
    4 Inf 25.83517 0.841 0
    Img 6.173922
  • [0075]
    TABLE 3
    Surface 4th 6th 8th 10th 12th 14th
    1 0.013191 −0.22886 0.139609 −0.250285 −0.18807 0.193763
    2 −0.008797 0.017236 0.007808 −0.223224 0.160689 −0.274339
    Stop −0.018549 −0.010249 −0.303999 1.369745 11.245778 −59.7839958
  • [0076] Wavefront coding element 806 is placed at aperture stop 804, and is given by the rectangularly separable form of:
  • S(x,y)=Σa isign(x)|x/r n| b i +a isign(y)|y/r n| b i
  • and the parameter values for i=1,2 are: [0077]
  • a[0078] 1=1.486852, b1=3.0
  • a[0079] 2=3.221235, b2=10.0
  • r[0080] n=0.419
  • FIG. 10 illustrates modulation transfer functions (MTF) for [0081] system 800 of FIG. 8, without wavefront coding, with wavefront coding, and with both wavefront coding and post processing filtering, for illumination at 450 nm. Image field heights are 0.0 mm, 1.2 mm, and 2.8 mm.
  • FIG. 11 shows a passive athermalized [0082] IR imaging system 1100 according to the present invention. Lens 1102 is composed of silicon. Lens 1104 is composed of germanium. Lens 1106 is composed of silicon. The aperture stop 1108 is at the back surface of lens 1106. Wavefront coding surface 1110 is on the back surface of lens 1106 (at aperture stop 1108). Processing block 1112 processes the image.
  • Design goals are as follows: [0083]
  • F/2 [0084]
  • f=100 mm [0085]
  • 3 deg half field of view [0086]
  • Illumination wavelength=10 microns [0087]
  • 20 micron square pixels, 100% fill factor [0088]
  • Silicon & germanium optics [0089]
  • Aluminum mounts [0090]
  • Temperature range of −20° C. to +70° C. [0091]
  • Combined constraints of low F/#, inexpensive mounting material, and wide operating temperature make this design very difficult for traditional optics. Table 4 gives the optical prescription of [0092] system 1100.
    TABLE 4
    Radius
    Surface of curv. Thickness Material Diameter Conic
    Obj Inf Inf 0.6357861 0
    1 58.6656 5.707297 Silicon 60 0
    2 100.9934 22.39862 57.6 0
    3 447.046 8.000028 Germanium 32.4 0
    4 50.88434 17.54754 32.4 0
    5 455.597 7.999977 Silicon 29.5 0
    Stop −115.6064 57.9967 29.5 0
    Img 6.173922
  • The Wavefront Coding surface for [0093] IR system 100 of this example has the parameterized equation:
  • S(x,y)=Σa isign(x)|x/r n| b i +a isign(y)|y/r n| b i
  • and the parameter values for i=1,2 are: [0094]
  • a[0095] 1=16.196742, b1=3.172720
  • a[0096] 2=−311.005659, b2=20.033486
  • r[0097] n=18.314428
  • FIG. 12 illustrates a series of transverse ray intercept curves illustrating aberrations at various wavelengths, for [0098] system 1100 of FIG. 11, with wavefront coding element 1110 removed. The ray intercept curves of FIG. 11 describe the performance of system 1100 at a wavelength of 10 microns, on axis field points for ambient temperatures of +20° C., −20° C., and +70° C. Full scale is +/−100 microns. Again these plots can be considered to be substantially straight lines. While they have more “wiggle” than the plots of FIGS. 2 and 9, in each case, if the plot were fitted to the closest straight line, the wiggles would not stray far from the line.
  • FIG. 13 illustrates on-axis MTF curves for [0099] system 1100 without wavefront coding at three temperatures +20° C. −20° C., and +70° C.). Performance is nearly diffraction limited at +20°, but drops dramatically with changes in temperature.
  • FIG. 14 illustrates MTFs for [0100] system 1100 of FIG. 11, with wavefront coding, both with and without filtering by processing block 1112. The illumination wavelength is 10 microns. The MTFs without filtering are significantly different from diffraction limited MTFs, but vary little with temperature. Thus, processing block 1112 is able to correct the images. The MTFs after filtering are near diffraction limited for all three temperatures (+20°, −20°, and +70°). Filtered MTFs extend only to the Nyquist frequency of the 20 micron detector, or 25 lp/mm.
  • The best way to define what constitutes a transverse ray intercept curve which is a “substantially straight line” is to look at the MTFs over the entire useful range of the system with wavefront coding applied. These curves must be very close to each other, in order for the post processing to be able to move all the the MTFs to the desired performance level. Compare the MTFs of FIG. 4 (no wavefront coding) to those of FIG. 5 (wavefront coding) The FIG. 5 MTF curves are very close together. In FIG. 6, post processing has moved the MTFs to an acceptable level (more sophisticated post processing could improve the MTFs much further, to nearly diffraction limited performance, so long as the preprocessing curves are close enough together). Post processing could not accomplish this goal with the curves of FIG. 4, because they are not at all close together. [0101]
  • FIG. 10 also illustrates this concept. The MTF curves without wavefront coding do not track each other. The curves with wavefront coding are very close together. Thus, the the curves with wavefront coding after post processing are very good. [0102]
  • Finally, in FIGS. 13 and 14, the MTF curves without wavefront coding are far apart, but the MTF curves with wavefront coding are so close together that the post processing curves are nearly all diffraction limited. [0103]
  • In FIG. 13, it can be seen that the on-axis MTF (at +20° C., meaning essentially no temperature related misfocus) is essentially diffraction limited. This is the best case traditional MTF for this system. The MTFs at other temperatures, though, have greatly reduced performance due to temperature related effects. [0104]
  • Now consider the upper set of MTFs of FIG. 14, with wavefront coding and after processing. The MTFs are nearly identical. Thus the associated transverse ray intercept curves can be considered to be substantially straight lines, since they are close enough to straight to give essentially ideal MTFs. [0105]
  • For other systems, a lower level of performance may be acceptable, and consequently the deviation of the transverse ray intercept curves from a straight line may be larger. Such a situation would result if a fast lens (say F/2) is used with a digital detector, with, say, 10 micron pixels. In 500 nm illumination, the diffraction limited MTF for the optical system would extend to 1000 lp/mm, but the highest spatial frequency that could be measured by the detector would be only 50 lp/mm. Thus, aberrations that alter the highest spatial frequencies of the optics are of no consequence, because they will not be measured by the detector. Note that while the transverse ray intercept curves may have noticeable deviations from a straight line (corresponding to the higher spatial frequencies), the transverse ray intercept curves are still “substantially straight lines” according to our definition, because the MTFs with wavefront coding are very close together. The MTFs under consideration are those that correspond to the useful range of the particular system being considered. [0106]
  • Compare the MTFs of FIGS. 6, 10, and [0107] 14 with wavefront coding (useful range MTFs for embodiments of the present invention) with the MTFs resulting from traditional design of FIG. 15b. These traditional MTFs are quite far apart, so post processing could never give adequate performance. These curves are generally 50% or more apart, whereas the wavefront coding curves in FIGS. 6, 10, and 14, are within an average of 20% of each other over the useful range of the system, and in the case of FIG. 10, are within an average of 10% of each other over the useful range of the system.
  • The major aberration apparent in the design of FIG. 11 is temperature related misfocus. Without Wavefront Coding, this lens would image poorly over a range of temperatures, although it would image well at a single temperature.[0108]

Claims (20)

What is claimed is:
1. Imaging apparatus for imaging an object onto a detector comprising:
a lens structure;
the lens structure constructed and arranged to produce transverse ray intercept curves which are sloped substantially straight lines;
a wavefront coding element positioned between the object and the detector;
the coding element being constructed and arranged to alter the optical transfer function of the imaging apparatus in such a way that the altered optical transfer function is substantially insensitive to focus-related aberrations over a greater range of aberrations than was provided by the unaltered optical transfer function; and
means for post processing;
wherein the coding element affects said alteration to the optical transfer function substantially by affecting the phase of light transmitted by said wavefront coding element.
2. The apparatus of claim 1 wherein the aberrations include one or more of the following:
misfocus;
spherical aberration;
petzval curvature;
astigmatism;
field curvature;
chromatic aberration;
temperature induced misfocus aberration;
pressure induced misfocus aberration;
mechanical induced misfocus aberrations.
3. The apparatus of claim 1 wherein the coding element is formed substantially at an aperture stop of the imaging system.
4. The apparatus of claim 1 wherein the lens structure comprises an IR imaging system.
5. The apparatus of claim 1 wherein the post processing means comprises a digital filter.
6. The apparatus of claim 1 wherein the lens structure comprises a microscope objective.
7. The apparatus of claim 1 wherein the lens structure comprises a single lens.
8. The apparatus of claim 7 wherein the coding element is formed on the single lens.
9. The apparatus of claim 1 wherein the detector is an analog detector.
10. The apparatus of claim 1 wherein the detector is a digital detector.
11. A single lens imaging system for imaging an object onto a detector comprising:
a lens constructed and arranged to produce transverse ray intercept curves which are sloped substantially straight lines;
a wavefront coding element formed on a surface of the lens; the coding element being constructed and arranged to alter the optical transfer function of the imaging system in such a way that the altered optical transfer function is substantially insensitive to focus-related aberrations over a greater range of aberrations than was provided by the unaltered optical transfer function; and
a post processing element;
wherein the coding element affects said alteration to the optical transfer function substantially by affecting the phase of light transmitted by said wavefront coding element.
12. The system of claim 11, wherein the post processing element comprises a digital filter.
13. The system of claim 12, wherein the digital filter comprises a rectangularly separable filter.
14. The system of claim 11, wherein the wavefront coding element is formed on the surface of the lens furthest from the object.
15. The system of claim 11, wherein the lens length is under 10 mm.
16. The system of claim 11, wherein the lens length is under 5 mm.
17. A microscope objective for imaging an object onto a detector comprising:
an element with optical power;
the element with optical power being constructed and arranged to produce transverse ray intercept curves which are sloped substantially straight lines;
a wavefront coding element;
the coding element being constructed and arranged to alter the optical transfer function of the microscope objective in such a way that the altered optical transfer function is substantially insensitive to focus-related aberrations over a greater range of aberrations than was provided by the unaltered optical transfer function; and
a post processing element;
wherein the coding element affects said alteration to the optical transfer function substantially by affecting the phase of light transmitted by said wavefront coding element.
18. The microscope objective of claim 17, wherein the post processing element comprises a digital filter.
19. The microscope objective of claim 17, wherein the element with optical power comprises a single lens.
20. The microscope objective of claim 19, wherein the lens is aspheric.
US09/747,788 1995-02-03 2000-12-22 Wavefront coded imaging systems Abandoned US20020118457A1 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
US09/747,788 US20020118457A1 (en) 2000-12-22 2000-12-22 Wavefront coded imaging systems
EP01272457A EP1346251A2 (en) 2000-12-22 2001-11-14 Wavefront coded imaging systems
PCT/US2001/044159 WO2002052331A2 (en) 2000-12-22 2001-11-14 Wavefront coded imaging systems
AU2002219861A AU2002219861A1 (en) 2000-12-22 2001-11-14 Wavefront coded imaging systems
US10/407,708 US6940649B2 (en) 1995-02-03 2003-04-04 Wavefront coded imaging systems
US11/192,572 US7106510B2 (en) 1995-02-03 2005-07-29 Wavefront coded imaging systems
US11/511,023 US7554732B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems
US11/511,022 US7554731B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/747,788 US20020118457A1 (en) 2000-12-22 2000-12-22 Wavefront coded imaging systems

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US09/070,969 Continuation-In-Part US7218448B1 (en) 1995-02-03 1998-05-01 Extended depth of field optical systems

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/407,708 Continuation US6940649B2 (en) 1995-02-03 2003-04-04 Wavefront coded imaging systems

Publications (1)

Publication Number Publication Date
US20020118457A1 true US20020118457A1 (en) 2002-08-29

Family

ID=25006641

Family Applications (5)

Application Number Title Priority Date Filing Date
US09/747,788 Abandoned US20020118457A1 (en) 1995-02-03 2000-12-22 Wavefront coded imaging systems
US10/407,708 Expired - Lifetime US6940649B2 (en) 1995-02-03 2003-04-04 Wavefront coded imaging systems
US11/192,572 Expired - Lifetime US7106510B2 (en) 1995-02-03 2005-07-29 Wavefront coded imaging systems
US11/511,023 Expired - Lifetime US7554732B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems
US11/511,022 Expired - Lifetime US7554731B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems

Family Applications After (4)

Application Number Title Priority Date Filing Date
US10/407,708 Expired - Lifetime US6940649B2 (en) 1995-02-03 2003-04-04 Wavefront coded imaging systems
US11/192,572 Expired - Lifetime US7106510B2 (en) 1995-02-03 2005-07-29 Wavefront coded imaging systems
US11/511,023 Expired - Lifetime US7554732B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems
US11/511,022 Expired - Lifetime US7554731B2 (en) 1995-02-03 2006-08-28 Wavefront coded imaging systems

Country Status (4)

Country Link
US (5) US20020118457A1 (en)
EP (1) EP1346251A2 (en)
AU (1) AU2002219861A1 (en)
WO (1) WO2002052331A2 (en)

Cited By (59)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030173502A1 (en) * 1995-02-03 2003-09-18 Dowski Edward Raymond Wavefront coding interference contrast imaging systems
US6707603B2 (en) * 2001-06-28 2004-03-16 Raytheon Company Apparatus and method to distort an optical beam to avoid ionization at an intermediate focus
US20040228005A1 (en) * 2003-03-28 2004-11-18 Dowski Edward Raymond Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems
US20050088745A1 (en) * 2002-10-09 2005-04-28 Cathey Wade T.Jr. Methods and systems for reducing depth of field of hybrid imaging systems
WO2005054927A2 (en) * 2003-12-01 2005-06-16 Cdm Optics, Inc. System and method for optimizing optical and digital system designs
US20050204329A1 (en) * 2003-09-16 2005-09-15 Wake Forest University Methods and systems for designing electromagnetic wave filters and electromagnetic wave filters designed using same
EP1672912A2 (en) 2003-01-16 2006-06-21 D-blur Technologies LTD. C/o Yossi Haimov CPA Method for producing an optical system including an electronic image enhancement processor
US7088419B2 (en) 2003-05-30 2006-08-08 Cdm Optics, Inc. Lithographic systems and methods with extended depth of focus
US20060256226A1 (en) * 2003-01-16 2006-11-16 D-Blur Technologies Ltd. Camera with image enhancement functions
EP1726984A1 (en) * 2005-05-25 2006-11-29 OmniVision Technologies, Inc. Multi-matrix depth of field image sensor
US20070002158A1 (en) * 2005-06-17 2007-01-04 Robinson M D End-to-end design of electro-optic imaging systems with constrained digital filters
US20070081224A1 (en) * 2005-10-07 2007-04-12 Robinson M D Joint optics and image processing adjustment of electro-optic imaging systems
US20070236574A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Digital filtering with noise gain limit
US20070236573A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Combined design of optical and image processing elements
US20070239417A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Camera performance simulation
US20070268375A1 (en) * 2006-05-12 2007-11-22 Robinson M D End-to-end design of electro-optic imaging systems with adjustable optical cutoff frequency
WO2007134119A1 (en) * 2006-05-09 2007-11-22 Omnivision Cdm Optics, Inc. Aberration-tolerant far infrared imaging system
US20070268374A1 (en) * 2006-05-12 2007-11-22 Robinson M D End-to-end design of superresolution electro-optic imaging systems
US20070279513A1 (en) * 2006-06-05 2007-12-06 Robinson M Dirk Optical subsystem with descriptors of its image quality
US20080007797A1 (en) * 2006-07-05 2008-01-10 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20080043126A1 (en) * 2006-05-30 2008-02-21 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20080074507A1 (en) * 2006-09-25 2008-03-27 Naoto Ohara Image pickup apparatus and method and apparatus for manufacturing the same
US20080080019A1 (en) * 2006-09-28 2008-04-03 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20080131023A1 (en) * 2002-02-27 2008-06-05 Edward Raymond Dowski Optimized Image Processing For Wavefront Coded Imaging Systems
US20080279542A1 (en) * 2005-08-11 2008-11-13 Global Bionic Optics Ltd Optical Lens Systems
US20080297643A1 (en) * 2007-05-30 2008-12-04 Fujifilm Corporation Image capturing apparatus, image capturing method, and computer readable media
US20090002523A1 (en) * 2007-06-28 2009-01-01 Kyocera Corporation Image processing method and imaging apparatus using the same
US20090066811A1 (en) * 2007-08-30 2009-03-12 Kyocera Corporation Image processing method and imaging apparatus using the same
US20090091797A1 (en) * 2007-10-03 2009-04-09 Ricoh Co., Ltd. Catadioptric Imaging System
US20090109535A1 (en) * 1995-02-03 2009-04-30 Cathey Jr Wade Thomas Extended Depth Of Field Optical Systems
US20090128655A1 (en) * 2007-11-16 2009-05-21 Kazuya Yoneyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, and medical apparatus, and method of manufacturing the imaging system
US20090128665A1 (en) * 2007-11-16 2009-05-21 Kazuya Yoneyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US20090147124A1 (en) * 2007-12-07 2009-06-11 Minoru Taniyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US20090190238A1 (en) * 2003-01-16 2009-07-30 D-Blur Technologies Ltd. Optics for an extended depth of field
US20090245688A1 (en) * 2008-03-26 2009-10-01 Robinson M Dirk Adaptive image acquisition for multiframe reconstruction
US20090321618A1 (en) * 2006-12-27 2009-12-31 Kyocera Corporation Image Pickup Apparatus and Information Code Reader
US20090322898A1 (en) * 2008-06-27 2009-12-31 Kyocera Corporation Image Pickup Apparatus and Electronic Device
US20090322928A1 (en) * 2008-06-27 2009-12-31 Robinson M Dirk Electro-optic imaging system with aberrated triplet lens compensated by digital image processing
US20100001071A1 (en) * 2007-01-30 2010-01-07 Kyocera Corporation Imaging Device, Method of Production of Imaging Device, and Information Code-Reading Device
US20100044555A1 (en) * 2006-08-18 2010-02-25 Kyocera Corporation Image Pickup Apparatus and Method for Manufacturing the Same
US20100053411A1 (en) * 2008-08-26 2010-03-04 Robinson M Dirk Control of Adaptive Optics Based on Post-Processing Metrics
US20100053361A1 (en) * 2008-08-28 2010-03-04 Kyocera Corporation Image Pickup Apparatus Electronic Device and Image Aberration Control Method
US20100079658A1 (en) * 2008-09-29 2010-04-01 Kyocera Corporation Lens unit, image pickup apparatus, electronic device and an image aberration control method
US20100214438A1 (en) * 2005-07-28 2010-08-26 Kyocera Corporation Imaging device and image processing method
US20100272327A1 (en) * 2003-12-01 2010-10-28 Silveira Paulo E X Task-Based Imaging Systems
US20100278390A1 (en) * 2003-12-01 2010-11-04 Silveira Paulo E X Task-based imaging systems
US20100299113A1 (en) * 2009-05-22 2010-11-25 Ricoh Co., Ltd. End-to-End Design of Electro-Optic Imaging Systems Using the Nonequidistant Discrete Fourier Transform
US20110122281A1 (en) * 2008-06-27 2011-05-26 Kyocera Corporation Imaging device
US8077247B2 (en) 2007-12-07 2011-12-13 Fujinon Corporation Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US8149287B2 (en) 2007-11-16 2012-04-03 Fujinon Corporation Imaging system using restoration processing, imaging apparatus, portable terminal apparatus, onboard apparatus and medical apparatus having the imaging system
US8294999B2 (en) 2003-01-16 2012-10-23 DigitalOptics Corporation International Optics for an extended depth of field
US8949078B2 (en) 2011-03-04 2015-02-03 Ricoh Co., Ltd. Filter modules for aperture-coded, multiplexed imaging systems
US9030580B2 (en) 2013-09-28 2015-05-12 Ricoh Company, Ltd. Color filter modules for plenoptic XYZ imaging systems
US9129173B2 (en) 2013-02-27 2015-09-08 Denso Wave Incorporated Device for optically reading information codes
US9219866B2 (en) 2013-01-07 2015-12-22 Ricoh Co., Ltd. Dynamic adjustment of multimode lightfield imaging system using exposure condition and filter position
US9866826B2 (en) 2014-11-25 2018-01-09 Ricoh Company, Ltd. Content-adaptive multi-focal display
US9864205B2 (en) 2014-11-25 2018-01-09 Ricoh Company, Ltd. Multifocal display
US9865043B2 (en) 2008-03-26 2018-01-09 Ricoh Company, Ltd. Adaptive image acquisition and display using multi-focal display
US20190025546A1 (en) * 2017-07-20 2019-01-24 AAC Technologies Pte. Ltd. Camera Optical Lens

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020118457A1 (en) * 2000-12-22 2002-08-29 Dowski Edward Raymond Wavefront coded imaging systems
US6879412B1 (en) * 2000-08-10 2005-04-12 Mustek Systems Inc. Method for optimizing the best resolution of an optical scanning system and apparatus for the same
EP1468314A4 (en) 2001-12-18 2006-12-13 Univ Rochester Imaging using a multifocal aspheric lens to obtain extended depth of field
JP3791777B2 (en) * 2001-12-28 2006-06-28 オリンパス株式会社 Electronic endoscope
US8717456B2 (en) 2002-02-27 2014-05-06 Omnivision Technologies, Inc. Optical imaging systems and methods utilizing nonlinear and/or spatially varying image processing
US7260251B2 (en) * 2003-03-31 2007-08-21 Cdm Optics, Inc. Systems and methods for minimizing aberrating effects in imaging systems
US7652685B2 (en) * 2004-09-13 2010-01-26 Omnivision Cdm Optics, Inc. Iris image capture devices and associated systems
US7336430B2 (en) * 2004-09-03 2008-02-26 Micron Technology, Inc. Extended depth of field using a multi-focal length lens with a controlled range of spherical aberration and a centrally obscured aperture
KR100859036B1 (en) 2004-09-14 2008-09-17 씨디엠 옵틱스 인코퍼레이티드 Imaging system and associated methods
WO2007001025A1 (en) * 2005-06-29 2007-01-04 Kyocera Corporation Biometric recognition system
KR100691268B1 (en) * 2005-08-02 2007-03-12 삼성전기주식회사 Optical System For Processing Image By Using Point Spread Function And Image Processing Method Thereof
EP1954030B1 (en) * 2005-10-18 2012-11-28 Kyocera Corporation Image pickup apparatus and image processing method
US20070093993A1 (en) * 2005-10-20 2007-04-26 Stork David G End-to-end design of electro-optic imaging systems using backwards ray tracing from the detector to the source
US8328731B2 (en) * 2006-01-06 2012-12-11 Phonak Ag Method and system for reconstructing the three-dimensional shape of the surface of at least a portion of an ear canal and/or of a concha
US20100066809A1 (en) * 2006-02-15 2010-03-18 Cdm Optics, Inc. Deployable Image Sensor
CN101449193B (en) * 2006-03-06 2011-05-11 全视Cdm光学有限公司 Zoom lens systems with wavefront coding
ATE512422T1 (en) 2006-04-03 2011-06-15 Omnivision Cdm Optics Inc OPTICAL IMAGING SYSTEMS AND METHODS WITH NON-LINEAR AND/OR SPATIALLY VARYING IMAGE PROCESSING
US8514303B2 (en) * 2006-04-03 2013-08-20 Omnivision Technologies, Inc. Advanced imaging systems and methods utilizing nonlinear and/or spatially varying image processing
US7626708B2 (en) * 2006-04-28 2009-12-01 Chao-Wen Liang Phase shifting grating-slit test for optical surface reconstruction
WO2008087485A2 (en) * 2006-09-14 2008-07-24 Tessera Technologies Hungary Kft. Imaging system with relaxed assembly tolerances and associated methods
WO2008087486A2 (en) * 2006-09-14 2008-07-24 Tessera Technologies Hungary Kft. Imaging system with improved image quality and associated methods
FR2919733B1 (en) * 2007-08-03 2010-04-09 Dxo Labs OPTICAL SYSTEM HAVING A DEVICE FOR INCREASING ITS FIELD DEPTH
JP2009041968A (en) * 2007-08-07 2009-02-26 Fujinon Corp Method and device for evaluating lens on premise of restoration processing, and correction optical system for evaluation
EP2221652A4 (en) * 2007-11-29 2010-12-29 Kyocera Corp Imaging device and electronic apparatus
EP2891918A1 (en) * 2008-02-29 2015-07-08 Global Bionic Optics Pty Ltd. Single-lens extended depth-of-field imaging systems
TWI399524B (en) * 2009-02-20 2013-06-21 Ind Tech Res Inst Method and apparatus for extracting scenery depth imformation
EP2403396B1 (en) * 2009-03-04 2019-08-14 Elie Meimoun Wavefront analysis inspection apparatus and method
EP2228677A1 (en) * 2009-03-09 2010-09-15 Global Bionic Optics Pty Ltd. Extended depth-of-field surveillance imaging system
JP5159715B2 (en) * 2009-06-30 2013-03-13 株式会社東芝 Image processing device
EP2465005A1 (en) 2009-08-14 2012-06-20 Akkolens International B.V. Optics with simultaneous variable correction of aberrations
EP2537061B1 (en) 2010-02-17 2017-12-20 Akkolens International B.V. Adjustable chiral ophthalmic lens
EP2546798A4 (en) * 2010-03-10 2017-08-16 Fujitsu Limited Biometric authentication device and biometric authentication method
WO2011132280A1 (en) * 2010-04-21 2011-10-27 富士通株式会社 Image capture device and image capture method
US8416334B2 (en) 2010-04-27 2013-04-09 Fm-Assets Pty Ltd. Thick single-lens extended depth-of-field imaging systems
US8558873B2 (en) 2010-06-16 2013-10-15 Microsoft Corporation Use of wavefront coding to create a depth image
US8687040B2 (en) 2010-11-01 2014-04-01 Omnivision Technologies, Inc. Optical device with electrically variable extended depth of field
EP2693249A4 (en) * 2011-03-31 2014-06-25 Fujifilm Corp Focus extending optical system and edof imaging system
US9581798B2 (en) 2013-07-22 2017-02-28 Fundacio Institut De Ciencies Fotoniques Light sheet-based imaging device with extended depth of field
CN104352214B (en) * 2014-11-13 2016-03-30 中国科学院光电技术研究所 A kind of wavefront modification details in a play not acted out on stage, but told through dialogues adaptive optical retina imaging instrument
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
US11209633B2 (en) * 2018-02-26 2021-12-28 Fotonation Limited Iris image acquisition system

Family Cites Families (112)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2443351A (en) * 1946-02-23 1948-06-15 Infilce Inc Time duration pulse telemetering system
US2959105A (en) * 1958-07-24 1960-11-08 Canon Camera Co Phase noise filter and its application to photography and photolithography
US3054898A (en) * 1960-03-14 1962-09-18 Servo Corp Of America Infrared ranging system
US3305294A (en) * 1964-12-03 1967-02-21 Optical Res & Dev Corp Two-element variable-power spherical lens
US3583790A (en) * 1968-11-07 1971-06-08 Polaroid Corp Variable power, analytic function, optical component in the form of a pair of laterally adjustable plates having shaped surfaces, and optical systems including such components
US3614310A (en) * 1970-03-02 1971-10-19 Zenith Radio Corp Electrooptical apparatus employing a hollow beam for translating an image of an object
DE2210681C3 (en) * 1972-03-06 1980-09-18 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar Device for non-contact measurement
US3873958A (en) * 1973-12-26 1975-03-25 Us Navy Acoustic beam former
US4178090A (en) * 1974-10-21 1979-12-11 Marks Alvin M 3-Dimensional camera device
US4062619A (en) * 1975-03-25 1977-12-13 Robert Hoffman Variable background intensity apparatus for imaging systems
US4082431A (en) * 1975-04-22 1978-04-04 Minnesota Mining And Manufacturing Company Image processing system using incoherent radiation and spatial filter hologram
US4255014A (en) * 1977-07-20 1981-03-10 Research Corporation Edge enhancement of phase phenomena
US4174885A (en) * 1978-01-16 1979-11-20 General Motors Corporation Filter rotator for coherent optical correlation system
US4276620A (en) * 1978-10-27 1981-06-30 Geosource Inc. Method and apparatus for obtaining a composite field response _to a variable source array using weighting coefficients
US4275454A (en) * 1978-12-01 1981-06-23 Environmental Research Institute Of Michigan Optical system phase error compensator
US4308521A (en) * 1979-02-12 1981-12-29 The United States Of America As Represented By The Secretary Of The Air Force Multiple-invariant space-variant optical processing
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
JPS57119318A (en) * 1981-01-16 1982-07-24 Minolta Camera Co Ltd Filter having special effect
US4466067A (en) * 1981-04-03 1984-08-14 State Of Oregon Multi-detector intensity interferometer and method for processing incoherent radiation signals
EP0064812B1 (en) * 1981-04-29 1985-08-14 Pilkington P.E. Limited Artificial eye lenses
US4589770A (en) * 1982-10-25 1986-05-20 The Boeing Company Electro-optical ranging apparatus having scanning circuitry and servoloop processor for resolving separation of images on photoelectric detector arrays
JPS59182688A (en) * 1983-03-31 1984-10-17 Toshiba Corp Stereoscopic processor
US4580882A (en) * 1983-04-21 1986-04-08 Benjamin Nuchman Continuously variable contact lens
US4650292A (en) * 1983-12-28 1987-03-17 Polaroid Corporation Analytic function optical component
GB8404817D0 (en) * 1984-02-23 1984-03-28 Pilkington Perkin Elmer Ltd Ophthalmic lenses
US4575193A (en) * 1984-04-06 1986-03-11 Eastman Kodak Company Optical spatial frequency filter
DE3418787A1 (en) * 1984-05-19 1985-11-21 Robert Bosch Gmbh, 7000 Stuttgart METHOD FOR INCREASING THE RESOLUTION OF COLOR TELEVISION CAMERAS
JPS60247611A (en) * 1984-05-24 1985-12-07 Toshiba Corp Optical head
DE3676502D1 (en) * 1985-12-20 1991-02-07 Dietmar Steinpichler PATTERN RECOGNITION METHOD.
US4734702A (en) * 1986-02-25 1988-03-29 Litton Systems, Inc. Passive ranging method and apparatus
US4794550A (en) * 1986-10-15 1988-12-27 Eastman Kodak Company Extended-range moire contouring
US4804249A (en) * 1986-12-24 1989-02-14 Honeywell Inc. Optical filter for incoherent imaging systems
US4827125A (en) * 1987-04-29 1989-05-02 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services Confocal scanning laser microscope having no moving parts
US4825263A (en) * 1987-06-02 1989-04-25 University Of Medicine & Dentistry Of New Jersey Optical method and apparatus for determining three-dimensional changes in facial contours
CH671828A5 (en) * 1987-06-26 1989-09-29 Battelle Memorial Institute
US4936661A (en) * 1987-07-23 1990-06-26 Opcon Associates, Inc. Zoom lens with short back focal length
US5161059A (en) * 1987-09-21 1992-11-03 Massachusetts Institute Of Technology High-efficiency, multilevel, diffractive optical elements
CA1313040C (en) * 1988-03-31 1993-01-26 Mitsuaki Uesugi Method and apparatus for measuring a three-dimensional curved surface shape
JPH02151825A (en) * 1988-12-05 1990-06-11 Olympus Optical Co Ltd Differential intereference microscope
US4989959A (en) * 1989-06-12 1991-02-05 Polaroid Corporation Anti-aliasing optical system with pyramidal transparent structure
US5193124A (en) * 1989-06-29 1993-03-09 The Research Foundation Of State University Of New York Computational methods and electronic camera apparatus for determining distance of objects, rapid autofocusing, and obtaining improved focus images
US5270825A (en) * 1989-10-12 1993-12-14 Olympus Optical Co., Ltd. Imaging optical system having a moire elimination effect
US5003166A (en) * 1989-11-07 1991-03-26 Massachusetts Institute Of Technology Multidimensional range mapping with pattern projection and cross correlation
US5128874A (en) * 1990-01-02 1992-07-07 Honeywell Inc. Inertial navigation sensor integrated obstacle detection system
GB9004978D0 (en) * 1990-03-06 1990-05-02 Crosfield Electronics Ltd Image compression
JP2800364B2 (en) * 1990-04-27 1998-09-21 松下電器産業株式会社 Optical low-pass filter
US5076687A (en) * 1990-08-28 1991-12-31 Massachusetts Institute Of Technology Optical ranging apparatus
US5260727A (en) * 1990-10-22 1993-11-09 Oksman Henry C Wide depth of focus intraocular and contact lenses
US5142413A (en) * 1991-01-28 1992-08-25 Kelly Shawn L Optical phase-only spatial filter
KR940004433B1 (en) * 1991-02-26 1994-05-25 삼성전자 주식회사 Method and apparatus for moving picture element by using sample and holding method
US5166818A (en) * 1991-03-11 1992-11-24 Bell Communications Research, Inc. Optical pulse-shaping device and method, and optical communications station and method
JP2921163B2 (en) * 1991-04-08 1999-07-19 キヤノン株式会社 Imaging device having optical low-pass filter
US5465147A (en) * 1991-04-29 1995-11-07 Massachusetts Institute Of Technology Method and apparatus for acquiring images using a ccd detector array and no transverse scanner
WO1993002639A1 (en) * 1991-08-06 1993-02-18 Autogenesis Technologies, Inc. Injectable collagen-based compositions for making intraocular lens
JP2861525B2 (en) 1991-09-10 1999-02-24 松下電器産業株式会社 Wavelength-selective phase grating optical low-pass filter
US5444574A (en) * 1991-09-19 1995-08-22 Olympus Optical Co., Ltd. Electronic image pickup apparatus equipped with means for eliminating moire
US5438187A (en) * 1991-11-01 1995-08-01 Spectra-Physics Scanning Systems, Inc. Multiple focus optical system for data reading applications
US5270861A (en) * 1991-12-13 1993-12-14 Eastman Kodak Company Zoom lens system for use in a compact camera
US5270867A (en) * 1991-12-13 1993-12-14 Eastman Kodak Company Compact zoom lens having a weak front lens group
JP2857273B2 (en) * 1991-12-24 1999-02-17 科学技術振興事業団 Aberration correction method and aberration correction device
US5756981A (en) * 1992-02-27 1998-05-26 Symbol Technologies, Inc. Optical scanner for reading and decoding one- and-two-dimensional symbologies at variable depths of field including memory efficient high speed image processing means and high accuracy image analysis means
US5307175A (en) * 1992-03-27 1994-04-26 Xerox Corporation Optical image defocus correction
US5248876A (en) * 1992-04-21 1993-09-28 International Business Machines Corporation Tandem linear scanning confocal imaging system with focal volumes at different heights
US5317394A (en) * 1992-04-30 1994-05-31 Westinghouse Electric Corp. Distributed aperture imaging and tracking system
US5243351A (en) 1992-06-25 1993-09-07 Hughes Aircraft Company Full aperture image synthesis using rotating strip aperture image measurements
DE69327895T2 (en) * 1992-07-22 2000-10-12 Matsushita Electric Ind Co Ltd IMAGE RECORDING DEVICE WITH INTERPOLATION FUNCTION OF THE HORIZONTAL LINES
US5337181A (en) * 1992-08-27 1994-08-09 Kelly Shawn L Optical spatial filter
JP2987016B2 (en) 1992-08-28 1999-12-06 松下電器産業株式会社 Phase grating optical low-pass filter
EP0618473A3 (en) 1993-03-31 1995-03-15 Kuraray Co Video device utilizing a two-dimensional diffraction grating.
US5438366A (en) * 1993-03-31 1995-08-01 Eastman Kodak Company Aspherical blur filter for reducing artifacts in imaging apparatus
US5299275A (en) * 1993-03-31 1994-03-29 Eastman Kodak Company Optical fiber filter for reducing artifacts in imaging apparatus
JPH06317764A (en) * 1993-04-27 1994-11-15 Olympus Optical Co Ltd Optical low-pass filter
US5521695A (en) * 1993-06-25 1996-05-28 The Regents Of The University Of Colorado Range estimation apparatus and method
JP3463335B2 (en) * 1994-02-17 2003-11-05 株式会社ニコン Projection exposure equipment
JP3656252B2 (en) * 1993-07-15 2005-06-08 株式会社ニコン Differential interference microscope
US5673127A (en) * 1993-12-01 1997-09-30 Matsushita Electric Industrial Co., Ltd. Display panel and display device using a display panel
US5751475A (en) * 1993-12-17 1998-05-12 Olympus Optical Co., Ltd. Phase contrast microscope
US5473473A (en) * 1993-12-20 1995-12-05 Eastman Kodak Company Two element plastic zoom camera lens
US6025873A (en) * 1994-04-07 2000-02-15 Olympus Optical Co., Ltd. Endoscope system provided with low-pass filter for moire removal
US5640206A (en) * 1994-05-31 1997-06-17 Victor Company Of Japan, Ltd. Imaging apparatus including offset pixels for generating vertical high frequency component
KR19980702008A (en) * 1995-02-03 1998-07-15 마이클 지. 가브리지 Method and apparatus for increasing field depth of optical system
US20020195548A1 (en) * 2001-06-06 2002-12-26 Dowski Edward Raymond Wavefront coding interference contrast imaging systems
US20020118457A1 (en) * 2000-12-22 2002-08-29 Dowski Edward Raymond Wavefront coded imaging systems
US7218448B1 (en) * 1997-03-17 2007-05-15 The Regents Of The University Of Colorado Extended depth of field optical systems
US5969855A (en) * 1995-10-13 1999-10-19 Olympus Optical Co., Ltd. Microscope apparatus
US5706139A (en) * 1995-10-17 1998-01-06 Kelly; Shawn L. High fidelity optical system for electronic imaging
US6144493A (en) * 1996-02-23 2000-11-07 Canon Kabushiki Kaisha Optical low-pass filter and optical apparatus having the same
WO1997034171A2 (en) * 1996-02-28 1997-09-18 Johnson Kenneth C Microlens scanner for microlithography and wide-field confocal microscopy
GB9608114D0 (en) * 1996-04-19 1996-06-26 Screen Tech Ltd Liquid crystal display
JP3708246B2 (en) * 1996-09-19 2005-10-19 オリンパス株式会社 Optical microscope having light control member
JP3708260B2 (en) * 1996-12-05 2005-10-19 オリンパス株式会社 Differential interference microscope
US6219113B1 (en) * 1996-12-17 2001-04-17 Matsushita Electric Industrial Co., Ltd. Method and apparatus for driving an active matrix display panel
US6091548A (en) * 1997-10-01 2000-07-18 Raytheon Company Optical system with two-stage aberration correction
JP3199313B2 (en) * 1997-11-10 2001-08-20 キヤノン株式会社 Reflection type liquid crystal display device and projection type liquid crystal display device using the same
US6037579A (en) * 1997-11-13 2000-03-14 Biophotonics Information Laboratories, Ltd. Optical interferometer employing multiple detectors to detect spatially distorted wavefront in imaging of scattering media
US6121603A (en) * 1997-12-01 2000-09-19 Hang; Zhijiang Optical confocal device having a common light directing means
US6021005A (en) * 1998-01-09 2000-02-01 University Technology Corporation Anti-aliasing apparatus and methods for optical imaging
JP3885334B2 (en) * 1998-02-02 2007-02-21 株式会社ニコン Differential interference microscope
KR20010043223A (en) * 1998-05-01 2001-05-25 유니버시티 테크놀러지 코포레이션 Extended depth of field optical systems
US6248988B1 (en) * 1998-05-05 2001-06-19 Kla-Tencor Corporation Conventional and confocal multi-spot scanning optical microscope
US6069738A (en) * 1998-05-27 2000-05-30 University Technology Corporation Apparatus and methods for extending depth of field in image projection systems
US6097856A (en) * 1998-07-10 2000-08-01 Welch Allyn, Inc. Apparatus and method for reducing imaging errors in imaging systems having an extended depth of field
JP2000098301A (en) * 1998-09-21 2000-04-07 Olympus Optical Co Ltd Optical system with enlarged depth of field
US6337472B1 (en) * 1998-10-19 2002-01-08 The University Of Texas System Board Of Regents Light imaging microscope having spatially resolved images
JP3440465B2 (en) * 1998-12-17 2003-08-25 株式会社高岳製作所 Multi-slit scanning imaging device
JP3622557B2 (en) * 1999-02-23 2005-02-23 セイコーエプソン株式会社 Polarization conversion optical system, illumination optical system, and projection display device
JP2000333076A (en) * 1999-05-19 2000-11-30 Asahi Optical Co Ltd Method for eliminating flare component in digital camera
US6172799B1 (en) * 1999-06-30 2001-01-09 Intel Corporation Three channel acousto-optical devices
KR20020033766A (en) * 2000-06-23 2002-05-07 롤페스 요하네스 게라투스 알베르투스 Image sensor signal defect correction
US6536898B1 (en) * 2000-09-15 2003-03-25 The Regents Of The University Of Colorado Extended depth of field optics for human vision
US6873733B2 (en) * 2001-01-19 2005-03-29 The Regents Of The University Of Colorado Combined wavefront coding and amplitude contrast imaging systems
US6525302B2 (en) 2001-06-06 2003-02-25 The Regents Of The University Of Colorado Wavefront coding phase contrast imaging systems

Cited By (116)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7115849B2 (en) 1995-02-03 2006-10-03 The Regents Of The University Of Colorado Wavefront coding interference contrast imaging systems
US7732750B2 (en) 1995-02-03 2010-06-08 The Regents Of The University Of Colorado Wavefront coding interference contrast imaging systems
US8004762B2 (en) 1995-02-03 2011-08-23 The Regents Of The University Of Colorado, A Body Corporate Extended depth of field optical systems
US20090109535A1 (en) * 1995-02-03 2009-04-30 Cathey Jr Wade Thomas Extended Depth Of Field Optical Systems
US20030173502A1 (en) * 1995-02-03 2003-09-18 Dowski Edward Raymond Wavefront coding interference contrast imaging systems
US20070001105A1 (en) * 1995-02-03 2007-01-04 Dowski Edward R Jr Wavefront coding interference contrast imaging systems
US6707603B2 (en) * 2001-06-28 2004-03-16 Raytheon Company Apparatus and method to distort an optical beam to avoid ionization at an intermediate focus
US8111937B2 (en) * 2002-02-27 2012-02-07 Omnivision Technologies, Inc. Optimized image processing for wavefront coded imaging systems
US20080131023A1 (en) * 2002-02-27 2008-06-05 Edward Raymond Dowski Optimized Image Processing For Wavefront Coded Imaging Systems
US20050088745A1 (en) * 2002-10-09 2005-04-28 Cathey Wade T.Jr. Methods and systems for reducing depth of field of hybrid imaging systems
US7031054B2 (en) 2002-10-09 2006-04-18 The Regent Of The University Of Colorado Methods and systems for reducing depth of field of hybrid imaging systems
US8014084B2 (en) 2003-01-16 2011-09-06 DigitalOptics Corporation International Optics for an extended depth of field
US20100141807A1 (en) * 2003-01-16 2010-06-10 Alex Alon Camera with image enhancement functions
US7627193B2 (en) 2003-01-16 2009-12-01 Tessera International, Inc. Camera with image enhancement functions
US20090190238A1 (en) * 2003-01-16 2009-07-30 D-Blur Technologies Ltd. Optics for an extended depth of field
EP1672912A2 (en) 2003-01-16 2006-06-21 D-blur Technologies LTD. C/o Yossi Haimov CPA Method for producing an optical system including an electronic image enhancement processor
US8126287B2 (en) 2003-01-16 2012-02-28 DigitalOptics Corporation International Camera with image enhancement functions
US20060256226A1 (en) * 2003-01-16 2006-11-16 D-Blur Technologies Ltd. Camera with image enhancement functions
US8294999B2 (en) 2003-01-16 2012-10-23 DigitalOptics Corporation International Optics for an extended depth of field
US8611030B2 (en) 2003-01-16 2013-12-17 DigitalOptics Corporation International Optics for an extended depth of field
US7773316B2 (en) 2003-01-16 2010-08-10 Tessera International, Inc. Optics for an extended depth of field
US20100296179A1 (en) * 2003-01-16 2010-11-25 Tessera International, Inc. Optics for an extended depth of field
US7679830B2 (en) 2003-03-28 2010-03-16 The Regents Of The University Of Colorado Optical systems utilizing multiple phase filters to increase misfocus tolerance
US20070127041A1 (en) * 2003-03-28 2007-06-07 Dowski Edward R Jr Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems
US20040228005A1 (en) * 2003-03-28 2004-11-18 Dowski Edward Raymond Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems
US7180673B2 (en) 2003-03-28 2007-02-20 Cdm Optics, Inc. Mechanically-adjustable optical phase filters for modifying depth of field, aberration-tolerance, anti-aliasing in optical systems
US7876417B2 (en) 2003-05-30 2011-01-25 Omnivision Technologies, Inc. Lithographic systems and methods with extended depth of focus
US7088419B2 (en) 2003-05-30 2006-08-08 Cdm Optics, Inc. Lithographic systems and methods with extended depth of focus
US8254714B2 (en) * 2003-09-16 2012-08-28 Wake Forest University Methods and systems for designing electromagnetic wave filters and electromagnetic wave filters designed using same
US20050204329A1 (en) * 2003-09-16 2005-09-15 Wake Forest University Methods and systems for designing electromagnetic wave filters and electromagnetic wave filters designed using same
US7944467B2 (en) 2003-12-01 2011-05-17 Omnivision Technologies, Inc. Task-based imaging systems
US8144208B2 (en) 2003-12-01 2012-03-27 Omnivision Technologies, Inc. Task-based imaging systems
US8760516B2 (en) 2003-12-01 2014-06-24 Omnivision Technologies, Inc. Task-based imaging systems
US20100272327A1 (en) * 2003-12-01 2010-10-28 Silveira Paulo E X Task-Based Imaging Systems
US7469202B2 (en) 2003-12-01 2008-12-23 Omnivision Cdm Optics, Inc. System and method for optimizing optical and digital system designs
WO2005054927A2 (en) * 2003-12-01 2005-06-16 Cdm Optics, Inc. System and method for optimizing optical and digital system designs
US20100278390A1 (en) * 2003-12-01 2010-11-04 Silveira Paulo E X Task-based imaging systems
US20110176708A1 (en) * 2003-12-01 2011-07-21 Omnivision Technologies, Inc. Task-Based Imaging Systems
US7860699B2 (en) 2003-12-01 2010-12-28 Omnivision Technologies, Inc. System and method for optimizing optical and digital system designs
WO2005054927A3 (en) * 2003-12-01 2005-10-13 Cdm Optics Inc System and method for optimizing optical and digital system designs
US20050197809A1 (en) * 2003-12-01 2005-09-08 Dowski Edward R.Jr. System and method for optimizing optical and digital system designs
US20060269150A1 (en) * 2005-05-25 2006-11-30 Omnivision Technologies, Inc. Multi-matrix depth of field image sensor
EP1726984A1 (en) * 2005-05-25 2006-11-29 OmniVision Technologies, Inc. Multi-matrix depth of field image sensor
US20070002158A1 (en) * 2005-06-17 2007-01-04 Robinson M D End-to-end design of electro-optic imaging systems with constrained digital filters
US7616841B2 (en) 2005-06-17 2009-11-10 Ricoh Co., Ltd. End-to-end design of electro-optic imaging systems
US7616842B2 (en) 2005-06-17 2009-11-10 Ricoh Co., Ltd. End-to-end design of electro-optic imaging systems with constrained digital filters
US20100214438A1 (en) * 2005-07-28 2010-08-26 Kyocera Corporation Imaging device and image processing method
US20080279542A1 (en) * 2005-08-11 2008-11-13 Global Bionic Optics Ltd Optical Lens Systems
US8355211B2 (en) 2005-08-11 2013-01-15 FM-Assets Pty Ltd Optical lens systems
US20070081224A1 (en) * 2005-10-07 2007-04-12 Robinson M D Joint optics and image processing adjustment of electro-optic imaging systems
US20070239417A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Camera performance simulation
US20070236573A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Combined design of optical and image processing elements
US20070236574A1 (en) * 2006-03-31 2007-10-11 D-Blur Technologies Ltd. Digital filtering with noise gain limit
WO2007134119A1 (en) * 2006-05-09 2007-11-22 Omnivision Cdm Optics, Inc. Aberration-tolerant far infrared imaging system
US20070268374A1 (en) * 2006-05-12 2007-11-22 Robinson M D End-to-end design of superresolution electro-optic imaging systems
US7692709B2 (en) 2006-05-12 2010-04-06 Ricoh Co., Ltd. End-to-end design of electro-optic imaging systems with adjustable optical cutoff frequency
US7889264B2 (en) 2006-05-12 2011-02-15 Ricoh Co., Ltd. End-to-end design of superresolution electro-optic imaging systems
US20070268375A1 (en) * 2006-05-12 2007-11-22 Robinson M D End-to-end design of electro-optic imaging systems with adjustable optical cutoff frequency
US7944490B2 (en) 2006-05-30 2011-05-17 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20080043126A1 (en) * 2006-05-30 2008-02-21 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US7924341B2 (en) 2006-06-05 2011-04-12 Ricoh Co., Ltd. Optical subsystem with descriptors of its image quality
US20070279513A1 (en) * 2006-06-05 2007-12-06 Robinson M Dirk Optical subsystem with descriptors of its image quality
US7916194B2 (en) * 2006-07-05 2011-03-29 Kyocera Corporation Image pickup apparatus
US20080007797A1 (en) * 2006-07-05 2008-01-10 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20100044555A1 (en) * 2006-08-18 2010-02-25 Kyocera Corporation Image Pickup Apparatus and Method for Manufacturing the Same
US8044331B2 (en) 2006-08-18 2011-10-25 Kyocera Corporation Image pickup apparatus and method for manufacturing the same
US20080074507A1 (en) * 2006-09-25 2008-03-27 Naoto Ohara Image pickup apparatus and method and apparatus for manufacturing the same
US8059955B2 (en) * 2006-09-25 2011-11-15 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US20080080019A1 (en) * 2006-09-28 2008-04-03 Kyocera Corporation Image pickup apparatus and method and apparatus for manufacturing the same
US8334500B2 (en) 2006-12-27 2012-12-18 Kyocera Corporation System for reducing defocusing of an object image due to temperature changes
US20090321618A1 (en) * 2006-12-27 2009-12-31 Kyocera Corporation Image Pickup Apparatus and Information Code Reader
US8567678B2 (en) 2007-01-30 2013-10-29 Kyocera Corporation Imaging device, method of production of imaging device, and information code-reading device
US20100001071A1 (en) * 2007-01-30 2010-01-07 Kyocera Corporation Imaging Device, Method of Production of Imaging Device, and Information Code-Reading Device
US20080297643A1 (en) * 2007-05-30 2008-12-04 Fujifilm Corporation Image capturing apparatus, image capturing method, and computer readable media
US8199246B2 (en) 2007-05-30 2012-06-12 Fujifilm Corporation Image capturing apparatus, image capturing method, and computer readable media
US20090002523A1 (en) * 2007-06-28 2009-01-01 Kyocera Corporation Image processing method and imaging apparatus using the same
US8125537B2 (en) 2007-06-28 2012-02-28 Kyocera Corporation Image processing method and imaging apparatus using the same
US20090066811A1 (en) * 2007-08-30 2009-03-12 Kyocera Corporation Image processing method and imaging apparatus using the same
US20090091797A1 (en) * 2007-10-03 2009-04-09 Ricoh Co., Ltd. Catadioptric Imaging System
US8077401B2 (en) 2007-10-03 2011-12-13 Ricoh Co., Ltd. Catadioptric imaging system
US8149287B2 (en) 2007-11-16 2012-04-03 Fujinon Corporation Imaging system using restoration processing, imaging apparatus, portable terminal apparatus, onboard apparatus and medical apparatus having the imaging system
US8094207B2 (en) * 2007-11-16 2012-01-10 Fujifilm Corporation Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, and medical apparatus, and method of manufacturing the imaging system
US20090128655A1 (en) * 2007-11-16 2009-05-21 Kazuya Yoneyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, and medical apparatus, and method of manufacturing the imaging system
US8134609B2 (en) * 2007-11-16 2012-03-13 Fujinon Corporation Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US20090128665A1 (en) * 2007-11-16 2009-05-21 Kazuya Yoneyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US8077247B2 (en) 2007-12-07 2011-12-13 Fujinon Corporation Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US8111318B2 (en) 2007-12-07 2012-02-07 Fujinon Corporation Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US20090147124A1 (en) * 2007-12-07 2009-06-11 Minoru Taniyama Imaging system, imaging apparatus, portable terminal apparatus, onboard apparatus, medical apparatus and method of manufacturing the imaging system
US9865043B2 (en) 2008-03-26 2018-01-09 Ricoh Company, Ltd. Adaptive image acquisition and display using multi-focal display
US20090245688A1 (en) * 2008-03-26 2009-10-01 Robinson M Dirk Adaptive image acquisition for multiframe reconstruction
US9438816B2 (en) 2008-03-26 2016-09-06 Ricoh Company, Ltd. Adaptive image acquisition for multiframe reconstruction
US8897595B2 (en) 2008-03-26 2014-11-25 Ricoh Co., Ltd. Adaptive image acquisition for multiframe reconstruction
US8363129B2 (en) 2008-06-27 2013-01-29 Kyocera Corporation Imaging device with aberration control and method therefor
US8149298B2 (en) 2008-06-27 2012-04-03 Kyocera Corporation Imaging device and method
US20090322898A1 (en) * 2008-06-27 2009-12-31 Kyocera Corporation Image Pickup Apparatus and Electronic Device
US20090322928A1 (en) * 2008-06-27 2009-12-31 Robinson M Dirk Electro-optic imaging system with aberrated triplet lens compensated by digital image processing
US20110122281A1 (en) * 2008-06-27 2011-05-26 Kyocera Corporation Imaging device
US7948550B2 (en) 2008-06-27 2011-05-24 Ricoh Co., Ltd. Electro-optic imaging system with aberrated triplet lens compensated by digital image processing
US20100053411A1 (en) * 2008-08-26 2010-03-04 Robinson M Dirk Control of Adaptive Optics Based on Post-Processing Metrics
US8248684B2 (en) 2008-08-26 2012-08-21 Ricoh Co., Ltd. Control of adaptive optics based on post-processing metrics
US20100053361A1 (en) * 2008-08-28 2010-03-04 Kyocera Corporation Image Pickup Apparatus Electronic Device and Image Aberration Control Method
US8773778B2 (en) 2008-08-28 2014-07-08 Kyocera Corporation Image pickup apparatus electronic device and image aberration control method
US8502877B2 (en) 2008-08-28 2013-08-06 Kyocera Corporation Image pickup apparatus electronic device and image aberration control method
US20100079658A1 (en) * 2008-09-29 2010-04-01 Kyocera Corporation Lens unit, image pickup apparatus, electronic device and an image aberration control method
US8310583B2 (en) 2008-09-29 2012-11-13 Kyocera Corporation Lens unit, image pickup apparatus, electronic device and an image aberration control method
US8121439B2 (en) 2009-05-22 2012-02-21 Ricoh Co., Ltd. End-to-end design of electro-optic imaging systems using the nonequidistant discrete Fourier transform
US20100299113A1 (en) * 2009-05-22 2010-11-25 Ricoh Co., Ltd. End-to-End Design of Electro-Optic Imaging Systems Using the Nonequidistant Discrete Fourier Transform
US9519737B2 (en) 2011-03-04 2016-12-13 Ricoh Company, Ltd. Filter modules for aperture-coded, multiplexed imaging systems
US8949078B2 (en) 2011-03-04 2015-02-03 Ricoh Co., Ltd. Filter modules for aperture-coded, multiplexed imaging systems
US9219866B2 (en) 2013-01-07 2015-12-22 Ricoh Co., Ltd. Dynamic adjustment of multimode lightfield imaging system using exposure condition and filter position
US9129173B2 (en) 2013-02-27 2015-09-08 Denso Wave Incorporated Device for optically reading information codes
US9030580B2 (en) 2013-09-28 2015-05-12 Ricoh Company, Ltd. Color filter modules for plenoptic XYZ imaging systems
US9866826B2 (en) 2014-11-25 2018-01-09 Ricoh Company, Ltd. Content-adaptive multi-focal display
US9864205B2 (en) 2014-11-25 2018-01-09 Ricoh Company, Ltd. Multifocal display
US20190025546A1 (en) * 2017-07-20 2019-01-24 AAC Technologies Pte. Ltd. Camera Optical Lens
US10739558B2 (en) * 2017-07-20 2020-08-11 Aac Optics Solutions Pte. Ltd. Camera optical lens

Also Published As

Publication number Publication date
US20060291058A1 (en) 2006-12-28
WO2002052331A3 (en) 2002-10-10
US20040004766A1 (en) 2004-01-08
US20050264886A1 (en) 2005-12-01
US20070076296A1 (en) 2007-04-05
US7554731B2 (en) 2009-06-30
AU2002219861A1 (en) 2002-07-08
WO2002052331A2 (en) 2002-07-04
US7554732B2 (en) 2009-06-30
US7106510B2 (en) 2006-09-12
EP1346251A2 (en) 2003-09-24
US6940649B2 (en) 2005-09-06

Similar Documents

Publication Publication Date Title
US6940649B2 (en) Wavefront coded imaging systems
CN106483633B (en) Optical imaging system
CN106483632B (en) Optical imaging system
CN106168702B (en) Optical imaging system
US8563913B2 (en) Imaging systems having ray corrector, and associated methods
US6911638B2 (en) Wavefront coding zoom lens imaging systems
US20030057353A1 (en) Wavefront coding zoom lens imaging systems
CN106443963B (en) Optical imaging system
CN106291870B (en) Optical imaging system
KR100506516B1 (en) Lenses for electronic imaging systems
CN110488456B (en) Optical lens system and imaging system
CN107085286B (en) Optical imaging system
CN106249381B (en) Optical imaging system
CN107632367B (en) Optical imaging system
CN108919464A (en) Optical imagery eyeglass group
US20020195538A1 (en) Wavefront coding phase contrast imaging systems
CN208705549U (en) Optical imagery eyeglass group
CN107085279B (en) Optical imaging system
CN107436485A (en) Optical imaging system
CN108267841A (en) Optical imaging system
CN113917659B (en) Optical imaging lens
US20200073090A1 (en) Wide-angle imaging lens
CN107179598B (en) Optical imaging system
CN108020905A (en) Optical imaging system
CN209102996U (en) Optical imaging system

Legal Events

Date Code Title Description
AS Assignment

Owner name: CDM OPTICS, INCORPORATED, COLORADO

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:DOWSKI, EDWARD RAYMOND JR.;REEL/FRAME:011424/0892

Effective date: 20001221

AS Assignment

Owner name: REGENTS OF THE UNIVERSITY OF COLORADO, THE, COLORA

Free format text: QUITCLAIM;ASSIGNOR:DOWSKI, EDWARD RAYMOND;REEL/FRAME:013711/0752

Effective date: 20021210

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION