EP1102965A4 - Apparatus and method for measurement of a liquid droplet - Google Patents
Apparatus and method for measurement of a liquid dropletInfo
- Publication number
- EP1102965A4 EP1102965A4 EP99939664A EP99939664A EP1102965A4 EP 1102965 A4 EP1102965 A4 EP 1102965A4 EP 99939664 A EP99939664 A EP 99939664A EP 99939664 A EP99939664 A EP 99939664A EP 1102965 A4 EP1102965 A4 EP 1102965A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- measurement
- liquid droplet
- droplet
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N2015/0023—Investigating dispersion of liquids
- G01N2015/0026—Investigating dispersion of liquids in gas, e.g. fog
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US9533398P | 1998-08-04 | 1998-08-04 | |
US95333P | 1998-08-04 | ||
US215018 | 1998-12-17 | ||
US09/215,018 US6305777B1 (en) | 1998-08-04 | 1998-12-17 | Apparatus and method for measurement of a liquid droplet |
PCT/US1999/017446 WO2000008419A1 (en) | 1998-08-04 | 1999-08-04 | Apparatus and method for measurement of a liquid droplet |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1102965A1 EP1102965A1 (en) | 2001-05-30 |
EP1102965A4 true EP1102965A4 (en) | 2001-11-14 |
EP1102965B1 EP1102965B1 (en) | 2003-03-26 |
Family
ID=26790106
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99939664A Expired - Lifetime EP1102965B1 (en) | 1998-08-04 | 1999-08-04 | Apparatus and method for measurement of a liquid droplet |
Country Status (6)
Country | Link |
---|---|
US (1) | US6305777B1 (en) |
EP (1) | EP1102965B1 (en) |
JP (1) | JP2002522755A (en) |
AU (1) | AU5391499A (en) |
DE (1) | DE69906310T2 (en) |
WO (1) | WO2000008419A1 (en) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1127694B1 (en) * | 2000-02-23 | 2006-05-03 | Seiko Epson Corporation | Detection of non-operating nozzle by light beam passing through aperture |
US6641246B2 (en) * | 2000-02-23 | 2003-11-04 | Seiko Epson Corporation | Detection of non-operating nozzle by light beam passing through aperture |
US6897466B2 (en) * | 2001-07-19 | 2005-05-24 | Seiko Epson Corporation | Instrument and method for measuring ejection velocity of liquid |
US6858860B2 (en) * | 2001-07-24 | 2005-02-22 | Seiko Epson Corporation | Apparatus and method for measuring natural period of liquid |
DE10163463B9 (en) * | 2001-12-21 | 2008-07-17 | Osram Opto Semiconductors Gmbh | Apparatus and method for in situ measurement of polymer amounts printed on supports |
JP4474870B2 (en) * | 2003-08-27 | 2010-06-09 | セイコーエプソン株式会社 | Droplet visual recognition method, droplet discharge head inspection device, and droplet discharge device |
JP4673051B2 (en) * | 2004-12-14 | 2011-04-20 | キヤノン株式会社 | Ink jet recording apparatus and ejection state detection method |
JP2006175775A (en) * | 2004-12-24 | 2006-07-06 | Seiko Epson Corp | Measurement device, liquid droplet jet device, method of aligning nozzle to measurement device, method of calibrating measurement device, and method of measurement |
KR100668325B1 (en) * | 2005-01-21 | 2007-01-12 | 삼성전자주식회사 | Apparatus and method for maunfacturing color filter |
EP1875404B1 (en) * | 2005-04-25 | 2013-06-12 | Ulvac, Inc. | Drop analysis system |
JP4955713B2 (en) * | 2009-01-16 | 2012-06-20 | リコーエレメックス株式会社 | Droplet detection device and inkjet printer |
GB0915346D0 (en) * | 2009-09-03 | 2009-10-07 | Billericay Farm Services Ltd | Droplet counting and measurement device |
US20120287198A1 (en) * | 2011-05-11 | 2012-11-15 | Fujifilm Dimatix, Inc. | Imaging Jetted Ink |
WO2013042002A1 (en) | 2011-09-19 | 2013-03-28 | Koninklijke Philips Electronics N.V. | Analysis and control of aerosol output |
JP2013121663A (en) * | 2011-12-09 | 2013-06-20 | Ricoh Co Ltd | Liquid discharge state detection device and image forming apparatus |
CN111070891A (en) * | 2020-01-10 | 2020-04-28 | 浙江工业大学 | Ink drop detection device for ink jet print head |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0324413A2 (en) * | 1988-01-15 | 1989-07-19 | Pacific Scientific Company | Optical instrument for measuring particle sizes |
US5092675A (en) * | 1989-11-14 | 1992-03-03 | Pacific Scientific Company | Vacuum line particle detector with slab laser |
US5426501A (en) * | 1993-01-06 | 1995-06-20 | Laser Sensor Technology, Inc. | Apparatus and method for particle analysis |
US5430306A (en) * | 1994-01-03 | 1995-07-04 | Hewlett-Packard Company | Optoelectronic detector with high, uniform sensitivity and large field of view, for thermal-inkjet inkdrops |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4429995A (en) * | 1980-07-21 | 1984-02-07 | National Research Development Corporation | Two dimensinal flow analyzer |
US4751517A (en) * | 1987-02-02 | 1988-06-14 | Xerox Corporation | Two-dimensional ink droplet sensors for ink jet printers |
US5637881A (en) * | 1993-04-01 | 1997-06-10 | High Yield Technology, Inc. | Method to detect non-spherical particles using orthogonally polarized light |
-
1998
- 1998-12-17 US US09/215,018 patent/US6305777B1/en not_active Expired - Fee Related
-
1999
- 1999-08-04 AU AU53914/99A patent/AU5391499A/en not_active Abandoned
- 1999-08-04 WO PCT/US1999/017446 patent/WO2000008419A1/en active IP Right Grant
- 1999-08-04 JP JP2000564008A patent/JP2002522755A/en active Pending
- 1999-08-04 DE DE69906310T patent/DE69906310T2/en not_active Expired - Fee Related
- 1999-08-04 EP EP99939664A patent/EP1102965B1/en not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0324413A2 (en) * | 1988-01-15 | 1989-07-19 | Pacific Scientific Company | Optical instrument for measuring particle sizes |
US5092675A (en) * | 1989-11-14 | 1992-03-03 | Pacific Scientific Company | Vacuum line particle detector with slab laser |
US5426501A (en) * | 1993-01-06 | 1995-06-20 | Laser Sensor Technology, Inc. | Apparatus and method for particle analysis |
US5430306A (en) * | 1994-01-03 | 1995-07-04 | Hewlett-Packard Company | Optoelectronic detector with high, uniform sensitivity and large field of view, for thermal-inkjet inkdrops |
Non-Patent Citations (1)
Title |
---|
See also references of WO0008419A1 * |
Also Published As
Publication number | Publication date |
---|---|
EP1102965A1 (en) | 2001-05-30 |
US6305777B1 (en) | 2001-10-23 |
EP1102965B1 (en) | 2003-03-26 |
AU5391499A (en) | 2000-02-28 |
DE69906310D1 (en) | 2003-04-30 |
JP2002522755A (en) | 2002-07-23 |
DE69906310T2 (en) | 2003-12-11 |
WO2000008419A1 (en) | 2000-02-17 |
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