EP0903792B1 - Procédé pour la réalisation d'une pluralité de lasers semi-conducteurs - Google Patents
Procédé pour la réalisation d'une pluralité de lasers semi-conducteurs Download PDFInfo
- Publication number
- EP0903792B1 EP0903792B1 EP98117796A EP98117796A EP0903792B1 EP 0903792 B1 EP0903792 B1 EP 0903792B1 EP 98117796 A EP98117796 A EP 98117796A EP 98117796 A EP98117796 A EP 98117796A EP 0903792 B1 EP0903792 B1 EP 0903792B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- semiconductor
- mask layer
- windows
- layer
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0201—Separation of the wafer into individual elements, e.g. by dicing, cleaving, etching or directly during growth
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
- H01L33/007—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
- Drying Of Semiconductors (AREA)
- Physical Vapour Deposition (AREA)
- Weting (AREA)
Claims (9)
- Procédé de fabrication d'une pluralité de puces laser en semiconducteur (200) à émission par la tranche, selon lequel :- une couche de masque (4) est appliquée sur une galette substrat (19),- la couche de masque (4) est munie d'une pluralité de fenêtres (10) dans lesquelles est dégagée la surface principale (9) de la galette substrat (19),- une série de couches en semiconducteur (18) à base de Ga(Al, In)N est déposée sur la surface principale (9) de la galette substrat (19) dégagée par les fenêtres (10) de manière à produire dans les fenêtres (10) des structures laser à émission par la tranche identiques, et- la galette (24) ainsi produite étant divisée en puces laser en semiconducteur (200) à émission par la tranche individuelles par sectionnement entre les structures laser à émission par la tranche,la couche de masque (4) présentant au moins une épaisseur qui correspond à la zone de passage de la lumière des structures laser à émission par la tranche, de sorte que les surfaces miroirs à laser (8) des structures laser à émission par la tranche sont à chaque fois définies par deux surfaces latérales (7) opposées l'une à l'autre et à faces planes et parallèles de la fenêtre (10).
- Procédé selon la revendication 1, selon lequel la couche de masque (4) utilisée est une couche de SiO2 ou de SixN1-x.
- Procédé selon l'une des revendications 1 ou 2, selon lequel la galette substrat (19) présente au moins une couche en semiconducteur (6) appliquée par épitaxie sur laquelle la série de couches en semiconducteur (18) est déposée dans les fenêtres (10).
- Procédé selon la revendication 3, selon lequel la couche en semiconducteur (6) se compose pour l'essentiel de GaxAl1-xN (0 ≤ x ≤ 1).
- Procédé selon l'une des revendications 1 à 4, selon lequel la série de couches en semiconducteur présente au moins une couche en semiconducteur en Ga1-x-yInxAlyN, avec 0 ≤ x < 1, 0 ≤ y < 1 et x+y < 1.
- Procédé selon l'une des revendications 1 à 5, selon lequel un procédé de gravure anisotrope à sec est utilisé pour former les fenêtres (10).
- Procédé selon l'une des revendications 1 à 6, selon lequel la couche de masque (4) est retirée avant de sectionner la galette (24).
- Procédé selon la revendication 7, selon lequel la couche de masque (4) est retirée après la déposition des structures en semiconducteur (2) au moyen d'une étape de gravure (14) sélective pour les structures en semiconducteur (2).
- Procédé selon la revendication 8, selon lequel un procédé de gravure isotrope chimique mouillé est utilisé pour retirer la couche de masque (4) après la déposition des structures en semiconducteur (2).
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE1997141442 DE19741442A1 (de) | 1997-09-19 | 1997-09-19 | Verfahren zum Herstellen einer Halbleitervorrichtung |
DE19741442 | 1997-09-19 | ||
DE1998138810 DE19838810B4 (de) | 1998-08-26 | 1998-08-26 | Verfahren zum Herstellen einer Mehrzahl von Ga(In,Al)N-Leuchtdiodenchips |
DE19838810 | 1998-08-26 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP0903792A2 EP0903792A2 (fr) | 1999-03-24 |
EP0903792A3 EP0903792A3 (fr) | 2000-03-22 |
EP0903792B1 true EP0903792B1 (fr) | 2010-11-03 |
Family
ID=26040146
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP98117796A Expired - Lifetime EP0903792B1 (fr) | 1997-09-19 | 1998-09-18 | Procédé pour la réalisation d'une pluralité de lasers semi-conducteurs |
Country Status (6)
Country | Link |
---|---|
US (1) | US6100104A (fr) |
EP (1) | EP0903792B1 (fr) |
JP (1) | JPH11154648A (fr) |
CN (1) | CN1218997A (fr) |
DE (1) | DE59814474D1 (fr) |
TW (1) | TW393785B (fr) |
Families Citing this family (65)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19838810B4 (de) * | 1998-08-26 | 2006-02-09 | Osram Opto Semiconductors Gmbh | Verfahren zum Herstellen einer Mehrzahl von Ga(In,Al)N-Leuchtdiodenchips |
FR2769924B1 (fr) | 1997-10-20 | 2000-03-10 | Centre Nat Rech Scient | Procede de realisation d'une couche epitaxiale de nitrure de gallium, couche epitaxiale de nitrure de gallium et composant optoelectronique muni d'une telle couche |
US6051849A (en) | 1998-02-27 | 2000-04-18 | North Carolina State University | Gallium nitride semiconductor structures including a lateral gallium nitride layer that extends from an underlying gallium nitride layer |
US6608327B1 (en) | 1998-02-27 | 2003-08-19 | North Carolina State University | Gallium nitride semiconductor structure including laterally offset patterned layers |
US6265289B1 (en) * | 1998-06-10 | 2001-07-24 | North Carolina State University | Methods of fabricating gallium nitride semiconductor layers by lateral growth from sidewalls into trenches, and gallium nitride semiconductor structures fabricated thereby |
US6177688B1 (en) | 1998-11-24 | 2001-01-23 | North Carolina State University | Pendeoepitaxial gallium nitride semiconductor layers on silcon carbide substrates |
US6255198B1 (en) | 1998-11-24 | 2001-07-03 | North Carolina State University | Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed thereby |
US20010042866A1 (en) * | 1999-02-05 | 2001-11-22 | Carrie Carter Coman | Inxalygazn optical emitters fabricated via substrate removal |
US7004644B1 (en) * | 1999-06-29 | 2006-02-28 | Finisar Corporation | Hermetic chip-scale package for photonic devices |
US6265322B1 (en) * | 1999-09-21 | 2001-07-24 | Agere Systems Guardian Corp. | Selective growth process for group III-nitride-based semiconductors |
US6521514B1 (en) | 1999-11-17 | 2003-02-18 | North Carolina State University | Pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on sapphire substrates |
US6380108B1 (en) | 1999-12-21 | 2002-04-30 | North Carolina State University | Pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on weak posts, and gallium nitride semiconductor structures fabricated thereby |
US6403451B1 (en) | 2000-02-09 | 2002-06-11 | Noerh Carolina State University | Methods of fabricating gallium nitride semiconductor layers on substrates including non-gallium nitride posts |
US6261929B1 (en) * | 2000-02-24 | 2001-07-17 | North Carolina State University | Methods of forming a plurality of semiconductor layers using spaced trench arrays |
JP2001303020A (ja) * | 2000-04-24 | 2001-10-31 | Sunstar Inc | 透明液状組成物 |
JP5523277B2 (ja) * | 2000-04-26 | 2014-06-18 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング | 発光半導体素子並びに発光性半導体素子の製造方法 |
DE10051465A1 (de) * | 2000-10-17 | 2002-05-02 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines Halbleiterbauelements auf GaN-Basis |
EP2270875B1 (fr) * | 2000-04-26 | 2018-01-10 | OSRAM Opto Semiconductors GmbH | Dispositf à semiconducteur émetteur de lumière et son procédé de fabrication |
JP2003533030A (ja) * | 2000-04-26 | 2003-11-05 | オスラム オプト セミコンダクターズ ゲゼルシャフト ミット ベシュレンクテル ハフツング | GaNをベースとする発光ダイオードチップおよび発光ダイオード構造素子の製造法 |
TWI292227B (en) | 2000-05-26 | 2008-01-01 | Osram Opto Semiconductors Gmbh | Light-emitting-dioed-chip with a light-emitting-epitaxy-layer-series based on gan |
US6867539B1 (en) * | 2000-07-12 | 2005-03-15 | 3M Innovative Properties Company | Encapsulated organic electronic devices and method for making same |
JP3906653B2 (ja) | 2000-07-18 | 2007-04-18 | ソニー株式会社 | 画像表示装置及びその製造方法 |
US6334971B1 (en) * | 2000-07-20 | 2002-01-01 | Wen-Ping Huang | Manufacturing method for diode group processed by injection molding on the surface |
US6518079B2 (en) * | 2000-12-20 | 2003-02-11 | Lumileds Lighting, U.S., Llc | Separation method for gallium nitride devices on lattice-mismatched substrates |
JP2002261327A (ja) | 2001-03-06 | 2002-09-13 | Sony Corp | 半導体発光素子及び半導体発光素子の製造方法 |
US6610554B2 (en) * | 2001-04-18 | 2003-08-26 | Hyung Se Kim | Method of fabricating organic electroluminescent display |
US20040029365A1 (en) * | 2001-05-07 | 2004-02-12 | Linthicum Kevin J. | Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed thereby |
US20030189215A1 (en) | 2002-04-09 | 2003-10-09 | Jong-Lam Lee | Method of fabricating vertical structure leds |
US8294172B2 (en) * | 2002-04-09 | 2012-10-23 | Lg Electronics Inc. | Method of fabricating vertical devices using a metal support film |
US6841802B2 (en) | 2002-06-26 | 2005-01-11 | Oriol, Inc. | Thin film light emitting diode |
US6750071B2 (en) * | 2002-07-06 | 2004-06-15 | Optical Communication Products, Inc. | Method of self-aligning an oxide aperture with an annular intra-cavity contact in a long wavelength VCSEL |
KR100495215B1 (ko) * | 2002-12-27 | 2005-06-14 | 삼성전기주식회사 | 수직구조 갈륨나이트라이드 발광다이오드 및 그 제조방법 |
KR100483049B1 (ko) * | 2003-06-03 | 2005-04-15 | 삼성전기주식회사 | 수직구조 질화갈륨계 발광다이오드의 제조방법 |
DE10335080A1 (de) * | 2003-07-31 | 2005-03-03 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung einer Vielzahl von optoelektronischen Halbleiterchips und optoelektronischer Halbleiterchip |
DE10335081A1 (de) * | 2003-07-31 | 2005-03-03 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung einer Vielzahl von optoelektronischen Halbleiterchips und optoeleketronischer Halbleiterchip |
JP4049723B2 (ja) * | 2003-09-04 | 2008-02-20 | 沖電気工業株式会社 | 窒化物半導体素子の製造方法及び窒化物半導体素子の製造装置 |
US7355284B2 (en) * | 2004-03-29 | 2008-04-08 | Cree, Inc. | Semiconductor light emitting devices including flexible film having therein an optical element |
US7259402B2 (en) * | 2004-09-22 | 2007-08-21 | Cree, Inc. | High efficiency group III nitride-silicon carbide light emitting diode |
US8174037B2 (en) * | 2004-09-22 | 2012-05-08 | Cree, Inc. | High efficiency group III nitride LED with lenticular surface |
US8513686B2 (en) * | 2004-09-22 | 2013-08-20 | Cree, Inc. | High output small area group III nitride LEDs |
US7737459B2 (en) * | 2004-09-22 | 2010-06-15 | Cree, Inc. | High output group III nitride light emitting diodes |
US8288942B2 (en) | 2004-12-28 | 2012-10-16 | Cree, Inc. | High efficacy white LED |
US8901699B2 (en) | 2005-05-11 | 2014-12-02 | Cree, Inc. | Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection |
JP2006339418A (ja) * | 2005-06-02 | 2006-12-14 | Seiko Epson Corp | 光素子及びその製造方法 |
US8168000B2 (en) * | 2005-06-15 | 2012-05-01 | International Rectifier Corporation | III-nitride semiconductor device fabrication |
US20070049048A1 (en) * | 2005-08-31 | 2007-03-01 | Shahid Rauf | Method and apparatus for improving nitrogen profile during plasma nitridation |
EP1925039A4 (fr) * | 2005-09-16 | 2012-07-04 | Showa Denko Kk | Procede de fabrication d'un dispositif lumineux a semi-conducteur nitrure |
KR20140116536A (ko) | 2006-05-31 | 2014-10-02 | 크리, 인코포레이티드 | 조명 장치 및 조명 방법 |
JP4997502B2 (ja) * | 2006-09-20 | 2012-08-08 | 国立大学法人東北大学 | 半導体素子の製造方法 |
WO2008051503A2 (fr) * | 2006-10-19 | 2008-05-02 | Amberwave Systems Corporation | Dispositifs base sur une source de lumière munie de structures semi-conductrices a désaccord de réseau |
JP2009032971A (ja) * | 2007-07-27 | 2009-02-12 | Rohm Co Ltd | 窒化物半導体素子の製造方法 |
CN101465319B (zh) * | 2007-12-17 | 2010-11-03 | 洲磊曜富科技股份有限公司 | 形成发光二极管元件的方法 |
DE102009024311A1 (de) * | 2009-06-05 | 2011-01-05 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Halbleiterbauelement und Verfahren zu seiner Herstellung |
DE102009035429A1 (de) * | 2009-07-31 | 2011-02-03 | Osram Opto Semiconductors Gmbh | Leuchtdiodenchip |
DE102010012423A1 (de) * | 2009-12-21 | 2011-06-22 | OSRAM Opto Semiconductors GmbH, 93055 | Lumineszenzdiodenanordnung, Hinterleuchtungsvorrichtung und Anzeigevorrichtung |
CN101950783A (zh) * | 2010-08-23 | 2011-01-19 | 厦门市三安光电科技有限公司 | 氮化镓基高亮度发光二极管芯片的制作工艺 |
CN102456788B (zh) * | 2010-10-20 | 2014-08-27 | 展晶科技(深圳)有限公司 | 发光二极管及其制造方法 |
CN102456778B (zh) * | 2010-10-26 | 2014-11-05 | 展晶科技(深圳)有限公司 | 发光二极管芯片制造方法 |
CN102130230A (zh) * | 2010-12-28 | 2011-07-20 | 中国科学院半导体研究所 | 发光二极管的制备方法 |
CN105720136B (zh) * | 2014-12-02 | 2019-04-05 | 无锡极目科技有限公司 | 在复合玻璃基板上制造视频显示板用多色led的方法 |
US10186833B2 (en) * | 2015-02-18 | 2019-01-22 | Ii-Vi Incorporated | Densely-spaced laser diode configurations |
TW201933625A (zh) * | 2018-01-19 | 2019-08-16 | 晶元光電股份有限公司 | 發光元件及其製造方法 |
CN111326948B (zh) * | 2018-12-15 | 2023-04-07 | 深圳市中光工业技术研究院 | 激光器芯片的制备方法 |
CN110690106A (zh) * | 2019-10-22 | 2020-01-14 | 北京大学东莞光电研究院 | 一种单晶金刚石芯片的制备方法 |
CN114373835A (zh) * | 2021-12-24 | 2022-04-19 | 季华实验室 | 微显示芯片阵列的制作方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02260416A (ja) * | 1989-03-31 | 1990-10-23 | Toshiba Corp | 半導体装置の製造方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5013682A (en) * | 1986-10-22 | 1991-05-07 | Texas Instruments Incorporated | Method for selective epitaxy using a WSI mask |
JP2943510B2 (ja) * | 1991-08-09 | 1999-08-30 | 日本電気株式会社 | 可変波長半導体レーザ装置 |
JPH05251738A (ja) * | 1992-03-05 | 1993-09-28 | Fujitsu Ltd | 半導体光素子アレイの作製方法 |
US5578839A (en) * | 1992-11-20 | 1996-11-26 | Nichia Chemical Industries, Ltd. | Light-emitting gallium nitride-based compound semiconductor device |
DE69324445T2 (de) * | 1992-11-27 | 1999-09-30 | Denso Corp | Tragbares elektronisches Gerät |
JP2748354B2 (ja) * | 1993-10-21 | 1998-05-06 | 日亜化学工業株式会社 | 窒化ガリウム系化合物半導体チップの製造方法 |
US5478774A (en) * | 1994-06-15 | 1995-12-26 | Motorola | Method of fabricating patterned-mirror VCSELs using selective growth |
JP3246207B2 (ja) * | 1994-08-04 | 2002-01-15 | 松下電器産業株式会社 | 半導体レーザの製造方法 |
JPH08316582A (ja) * | 1995-05-19 | 1996-11-29 | Nec Corp | 半導体レーザ |
JPH0945987A (ja) * | 1995-07-31 | 1997-02-14 | Hitachi Ltd | 半導体レーザ素子 |
-
1998
- 1998-09-15 TW TW087115349A patent/TW393785B/zh not_active IP Right Cessation
- 1998-09-18 DE DE59814474T patent/DE59814474D1/de not_active Expired - Lifetime
- 1998-09-18 EP EP98117796A patent/EP0903792B1/fr not_active Expired - Lifetime
- 1998-09-19 CN CN98124519.6A patent/CN1218997A/zh active Pending
- 1998-09-21 JP JP26681998A patent/JPH11154648A/ja active Pending
- 1998-09-21 US US09/157,649 patent/US6100104A/en not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02260416A (ja) * | 1989-03-31 | 1990-10-23 | Toshiba Corp | 半導体装置の製造方法 |
Non-Patent Citations (2)
Title |
---|
NAGAHARA M ET AL: "SELECTIVE GROWTH OF CUBIC GAN IN SMALL AREAS ON PATTERNED GAAS(100)SUBSTRATES BY METALORGANIC VAPOR PHASE EPITAXY", 1 January 1994, JAPANESE JOURNAL OF APPLIED PHYSICS, JAPAN SOCIETY OF APPLIED PHYSICS, TOKYO,JP, PAGE(S) 694 - 697, ISSN: 0021-4922, XP000596419 * |
ORENSTEIN M ET AL: "TRANSVERSE MODES AND LASING CHARACTERISTICS OF SELECTIVELY GROWN VERICAL CAVITY SEMICONDUCTOR LASERS", 23 September 1996, APPLIED PHYSICS LETTERS, AIP, AMERICAN INSTITUTE OF PHYSICS, MELVILLE, NY, US, PAGE(S) 1840 - 1842, ISSN: 0003-6951, XP000628919 * |
Also Published As
Publication number | Publication date |
---|---|
DE59814474D1 (de) | 2010-12-16 |
US6100104A (en) | 2000-08-08 |
TW393785B (en) | 2000-06-11 |
EP0903792A3 (fr) | 2000-03-22 |
CN1218997A (zh) | 1999-06-09 |
JPH11154648A (ja) | 1999-06-08 |
EP0903792A2 (fr) | 1999-03-24 |
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