EP0432568A2 - X ray tube anode and tube having same - Google Patents

X ray tube anode and tube having same Download PDF

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Publication number
EP0432568A2
EP0432568A2 EP90122630A EP90122630A EP0432568A2 EP 0432568 A2 EP0432568 A2 EP 0432568A2 EP 90122630 A EP90122630 A EP 90122630A EP 90122630 A EP90122630 A EP 90122630A EP 0432568 A2 EP0432568 A2 EP 0432568A2
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EP
European Patent Office
Prior art keywords
anode
layer
tube
ray
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP90122630A
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German (de)
French (fr)
Other versions
EP0432568A3 (en
Inventor
Gregory Alan Mohr
Jerome Johnson Tiemann
Michael Kent Cueman
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General Electric Co
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General Electric Co
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Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of EP0432568A2 publication Critical patent/EP0432568A2/en
Publication of EP0432568A3 publication Critical patent/EP0432568A3/en
Withdrawn legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/16Vessels; Containers; Shields associated therewith
    • H01J35/18Windows
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08Anodes; Anti cathodes
    • H01J35/12Cooling non-rotary anodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00X-ray tubes
    • H01J2235/12Cooling
    • H01J2235/122Cooling of the window
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00X-ray tubes
    • H01J2235/18Windows, e.g. for X-ray transmission
    • H01J2235/183Multi-layer structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08Anodes; Anti cathodes
    • H01J35/112Non-rotating anodes
    • H01J35/116Transmissive anodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/16Vessels; Containers; Shields associated therewith
    • H01J35/18Windows
    • H01J35/186Windows used as targets or X-ray converters

Definitions

  • the present invention relates to X-ray tube anodes, and more particularly, to such anodes that efficiently produce a high output hard X-ray flux without suffering thermal damage.
  • X-ray imaging performance is limited in two fundamental ways by the properties of prior art X-ray tube anodes.
  • the total X-ray flux output is limited by the ability of the anode to dissipate heat, and thus the image signal to raise ratio or contrast may not be as high as desired.
  • the spectrum of the emitted X-rays contains too few of high energy (hard) X-ray photons, which are required for imaging of thick or very dense objects.
  • the first problem is due to the fact that a large fraction (typically over 99%) of the energy in the electron beam in a conventional X-ray tube is converted to heat, and only a small fraction is converted to X-rays.
  • an X-ray tube anode comprising a first means for producing X-rays in response to incident electrons; and a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  • An X-ray tube in accordance with the invention comprises an envelope having first and second ends, an anode disposed proximate said second end, said anode having a first means for producing X-rays in response to incident electrons; and a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  • Figure 1 is a cross-sectional view of an X-ray tube having an anode in accordance with the invention.
  • Figures 2(a) and 2(b) are graphs of heat and X-ray production, respectively, as a function of anode thickness.
  • the Figure shows a microfocus X-ray tube, generally designated 10, having an envelope 12, typically made of grounded electrically conductive metal with sufficient strength and thickness to withstand a vacuum on the inside thereof and ambient pressure on the outside thereof.
  • envelope 12 typically made of grounded electrically conductive metal with sufficient strength and thickness to withstand a vacuum on the inside thereof and ambient pressure on the outside thereof.
  • a grounded envelope or coating is used to provide a return path for stray electrons and for safety.
  • Disposed at a first end 14 of envelope 12 is a cathode 16 coupled to an AC source 18, which typically supplies two to three volts at about one ampere to heat filament cathode 16 so that it will emit electrons.
  • a DC supply could also be used for source 18.
  • the leads connecting cathode 16 to source 18 are insulated from envelope 12 to prevent a short circuit, as are all other leads extending completely through envelope 12.
  • the emitted electrons are provided by a DC source 20 having its positive lead grounded and its negative terminal connected to one of the leads of cathode 16.
  • Source 20 typically provides about 100 at about 1 ma.
  • cathode 16 is shown as a directly heated cathode, an indirectly heated one can be used; however, the electrons emitted from a directly heated cathode can be more tightly focused.
  • the electron beam 20 emitted from cathode 16 passes through an aperture 22 of a control grid 24 disposed proximate cathode 16 and coupled to the negative terminal of DC source 26 having a grounded positive terminal.
  • Source 26 provides about two to three KV and is adjustable so as to provide control of the anode-cathode current and thus the amount of X-rays.
  • the electron beam goes through a focusing means or electron lens, e.g., a solenoidal coil 27, coupled to a DC lens power supply 28 that provides current to coil 27.
  • the amount of current is determined by potentiometer 30, which therefore controls the focusing and spot size on the anode.
  • an electromagnetic focusing means has been shown and described, an electrostatic focusing means can be used.
  • Electron beam 20 finally impinges (is incident) upon a grounded electrically conducting first layer 31a of an anode 32 (described in detail below), which is disposed proximate a second end 33 of envelope 12.
  • anode 32 further comprises a second layer 31b that contacts and supports first layer 31a and also conducts heat away therefrom.
  • Second layer 31b also contacts a heat sink 38 that conducts heat away from layer 31a and dissipates it.
  • Heat sink 38 has a void 39 in communication with second layer 31b.
  • a portion of the kinetic energy of beam 20 is converted into X-rays 34a and 34b at layer 31a.
  • X-rays 34a exit tube 10 by way of a normal mode X-ray window 36a disposed in envelope 12 proximate layer 31a.
  • X-rays 34b also go through second layer 31b of anode 32 and then pass through a transmission mode X-ray window 36b disposed in heat sink 38 opposing second layer 31b.
  • Windows 36 are typically made of Be, Al, etc.
  • Some of the electrons in beam 20 do not have their kinetic energy converted to heat, light or X-ray photons.
  • these uncoverted electrons 40 are trapped in a beam dump 42 with the aid of a magnetic field. If no dump 42 is used, then they will be collected by window 36b and the upper interior surface of heat sink 38.
  • X-rays 34 are then incident upon objects (not shown) to be imaged.
  • An X-ray detector (not shown), e.g., scintillator material coupled to a linear photodiode array, detects the X-rays that are transmitted through the object and provides a signal to a computer (not shown) to perform tomography.
  • a fluoroscope or X-ray sensitive film can be used.
  • first layer 31a comprises a high atomic number and high density material, e.g., Nb, Hf, Ta, Re, Os, Ir, Pt, Au, W, Mo, U, etc., so that a high cross-section is presented to the incident electrons 20.
  • a high atomic number and high density material e.g., Nb, Hf, Ta, Re, Os, Ir, Pt, Au, W, Mo, U, etc.
  • the thickness of layer 31a is less than to the stopping distance of the electrons 20 in layer 31a, which distance will vary with the material used in layer 31a and the kinetic energy of electrons 20.
  • a typical value for the thickness of layer 31a is between about 1 to 15 ⁇ m.
  • first layer 31a results in a greater hard X-ray generation efficiency, and also results in the production of less waste heat.
  • second layer 31b is preferably made of a low density, low atomic number, and high thermal conductivity material, e.g., Be, Al, and preferably diamond, the latter either polycrystalline or monocrystalline, so that heat is conducted away from the very small impact area of beam 20 on first layer 31a to heat sink 38.
  • the low density and low atomic number results in layer 31b efficiently transmitting X-rays 34b.
  • second layer 31b has a typical stopping distance of 45 ⁇ m for 100 KEV electrons. This is a typical maximum thickness for layer 31b in order to avoid excessive heat generation therein due to the kinetic energy of the unconverted electrons 40 passing therethrough, although greater thicknesses can be used.
  • Second layer 31b if made of diamond, can be formed on first layer 31a by chemical vapor deposition. Other materials can be deposited by such known techniques as electroplating, sputtering or electroless deposition. If it is not desired to use transmission mode X-rays 34b for imaging, then second layer 31b need not have a low density or a low atomic number. In such a case, other high thermal conductivity materials, e.g., Cu and Ag, can be added to the list of materials used for second layer 31b.
  • high thermal conductivity materials e.g., Cu and Ag
  • This anode design offers enhanced performance because it operates in the most favorable portions of the heat production and X-ray production as a function of the thickness of layer 31a relationships. These relationships are respectively illustrated in Figures 2(a) and 2(b).
  • X-rays are most efficiently generated by a monochromic electron beam 20 of high energy. This is the characteristic of the tube's electron beam 20 when it first contacts the X-ray generating anode layer 31a. As electron beam 20 penetrates into the material of layer 31a, scattering and absorption processes lower the average energy of beam 20 and change it from a monoenergetic beam to a spectrum of electron energies, all lower than the incident energy at the lower surface of layer 31a as viewed in Figure 1. This less energetic beam is a less efficient generator of X-rays. Thus, the largest quantity of useful, hard X-rays are generated near the lower surface of layer 31a.
  • the loss of average beam 20 energy with thickness of layer 31a has a similar effect on heat production.
  • many electrons penetrate the anode layer 31a without scattering.
  • the probability of stopping and depositing all of its remaining energy increases.
  • the heat production as a function of the thickness of layer 31a reaches a maximum 48 above the lower surface of the anode layer 31a.
  • This invention preferably uses anode layers 31a which are thin compared to the average stopping distance of the electron beam in the material of the anode layer 31a.
  • These thin film anodes illustrated as the dotted lines 50 in Figures 2(a) and 2(b), interact with the electron beam 20 only in the region where the best achievable X-ray output to heat production ratio is in effect. This accounts for the performance advantage of this design.
  • the present invention can also be used with a conventional (non-microfocus) X-ray tube.
  • it can be used with a rotating anode X-ray tube, wherein the rotating anode comprises a heat sink made of, e.g., Cu, with bevelled edges.
  • Anode 32 is normally disposed only on the bevelled edges.

Abstract

An X-ray tube anode (32) has a thin metal film first layer (31a), e.g. W, for producing hard X-rays. A diamond (31b) second layer supports the first layer, conducts heat away from it, and transmits X-rays (34a, 34b). The layers usually have a maximum thickness of about the stopping distance of incident electrons. An X-ray tube has such an anode and a heat sink (38) in contact with the layers. The sink can have a beam dump (42) and a transmission mode X-ray window (36b). A normal mode X-ray window (36a) is in the tube envelope near the anode.

Description

  • The present invention relates to X-ray tube anodes, and more particularly, to such anodes that efficiently produce a high output hard X-ray flux without suffering thermal damage.
  • X-ray imaging performance is limited in two fundamental ways by the properties of prior art X-ray tube anodes. First, the total X-ray flux output is limited by the ability of the anode to dissipate heat, and thus the image signal to raise ratio or contrast may not be as high as desired. Second, the spectrum of the emitted X-rays contains too few of high energy (hard) X-ray photons, which are required for imaging of thick or very dense objects. The first problem is due to the fact that a large fraction (typically over 99%) of the energy in the electron beam in a conventional X-ray tube is converted to heat, and only a small fraction is converted to X-rays. This presents a particularly acute problem in microfocus X-ray tubes, which simulate a point source of x-rays (to provide a sharp image) by focusing their electron beam on a very small area of the anode. Thus, the heated area of the anode is essentially only in the very small area, and, therefore, a better means of cooling the operating surface of the anode is required if greater X-ray fluxes are to be obtained. The second problem is caused by the dominant mechanism for converting the energy of an electron beam to X-rays, which is scattering of electrons by the nuclei of atoms in the anode of a X-ray tube. A broad "bremsstrahlung" spectrum results. Electrons which scatter hard in a single collision give up their energy to produce a single, very energetic X-ray photon. Electrons which scatter more gently off several atoms produce numerous softer X-rays.
  • It is therefore an object of the present invention to provide an anode for an X-ray source that can efficiently provide a hard X-ray flux without suffering thermal damage.
  • It is another object of the present invention to provide an X-ray tube that uses such an anode.
  • Summary of the Invention
  • In brief, these and other objects are achieved by an X-ray tube anode comprising a first means for producing X-rays in response to incident electrons; and a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  • An X-ray tube in accordance with the invention comprises an envelope having first and second ends, an anode disposed proximate said second end, said anode having a first means for producing X-rays in response to incident electrons; and a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  • Brief Description of the Drawing
  • Figure 1 is a cross-sectional view of an X-ray tube having an anode in accordance with the invention; and
  • Figures 2(a) and 2(b) are graphs of heat and X-ray production, respectively, as a function of anode thickness.
  • Detailed Description
  • The Figure shows a microfocus X-ray tube, generally designated 10, having an envelope 12, typically made of grounded electrically conductive metal with sufficient strength and thickness to withstand a vacuum on the inside thereof and ambient pressure on the outside thereof. A high temperature glass with a grounded conductive interior coating, e.g., Al, can also be used. A grounded envelope or coating is used to provide a return path for stray electrons and for safety. Disposed at a first end 14 of envelope 12 is a cathode 16 coupled to an AC source 18, which typically supplies two to three volts at about one ampere to heat filament cathode 16 so that it will emit electrons. A DC supply could also be used for source 18. It will be understood that the leads connecting cathode 16 to source 18 are insulated from envelope 12 to prevent a short circuit, as are all other leads extending completely through envelope 12. The emitted electrons are provided by a DC source 20 having its positive lead grounded and its negative terminal connected to one of the leads of cathode 16. Source 20 typically provides about 100 at about 1 ma. Although cathode 16 is shown as a directly heated cathode, an indirectly heated one can be used; however, the electrons emitted from a directly heated cathode can be more tightly focused.
  • The electron beam 20 emitted from cathode 16 passes through an aperture 22 of a control grid 24 disposed proximate cathode 16 and coupled to the negative terminal of DC source 26 having a grounded positive terminal. Source 26 provides about two to three KV and is adjustable so as to provide control of the anode-cathode current and thus the amount of X-rays. Next the electron beam goes through a focusing means or electron lens, e.g., a solenoidal coil 27, coupled to a DC lens power supply 28 that provides current to coil 27. The amount of current is determined by potentiometer 30, which therefore controls the focusing and spot size on the anode. Although an electromagnetic focusing means has been shown and described, an electrostatic focusing means can be used.
  • Electron beam 20 finally impinges (is incident) upon a grounded electrically conducting first layer 31a of an anode 32 (described in detail below), which is disposed proximate a second end 33 of envelope 12. It will be appreciated that cathode 16 and the negative terminal of the source 20 can be grounded and the positive terminal of source 20 can be coupled to anode 32 without being grounded. However, the grounded anode configuration, as shown in the drawing and described above, allows for easier replacement of anode 32. Anode 32 further comprises a second layer 31b that contacts and supports first layer 31a and also conducts heat away therefrom. Second layer 31b also contacts a heat sink 38 that conducts heat away from layer 31a and dissipates it. Heat sink 38 has a void 39 in communication with second layer 31b.
  • A portion of the kinetic energy of beam 20 is converted into X-rays 34a and 34b at layer 31a. X-rays 34a exit tube 10 by way of a normal mode X-ray window 36a disposed in envelope 12 proximate layer 31a. X-rays 34b also go through second layer 31b of anode 32 and then pass through a transmission mode X-ray window 36b disposed in heat sink 38 opposing second layer 31b. Windows 36 are typically made of Be, Al, etc. Some of the electrons in beam 20 do not have their kinetic energy converted to heat, light or X-ray photons. Optionally, these uncoverted electrons 40 are trapped in a beam dump 42 with the aid of a magnetic field. If no dump 42 is used, then they will be collected by window 36b and the upper interior surface of heat sink 38.
  • X-rays 34 are then incident upon objects (not shown) to be imaged. An X-ray detector (not shown), e.g., scintillator material coupled to a linear photodiode array, detects the X-rays that are transmitted through the object and provides a signal to a computer (not shown) to perform tomography. Instead of using a photodiode array and a computer, a fluoroscope or X-ray sensitive film can be used.
  • In accordance with one aspect of the invention, first layer 31a comprises a high atomic number and high density material, e.g., Nb, Hf, Ta, Re, Os, Ir, Pt, Au, W, Mo, U, etc., so that a high cross-section is presented to the incident electrons 20. This results in a large X-ray flux. Preferably, the thickness of layer 31a is less than to the stopping distance of the electrons 20 in layer 31a, which distance will vary with the material used in layer 31a and the kinetic energy of electrons 20. A typical value for the thickness of layer 31a is between about 1 to 15 µm. This increases the fraction of high energy (hard) X-rays, since lower energy (soft) X-rays are produced in thicker layers by electrons that have been scattered and slowed down by their penetration of such a thick layer. Such slower electrons also produce a greater percentage of their kinetic energy as heat. Thus the thinness of first layer 31a results in a greater hard X-ray generation efficiency, and also results in the production of less waste heat.
  • In accordance with another aspect of the invention, second layer 31b is preferably made of a low density, low atomic number, and high thermal conductivity material, e.g., Be, Al, and preferably diamond, the latter either polycrystalline or monocrystalline, so that heat is conducted away from the very small impact area of beam 20 on first layer 31a to heat sink 38. The low density and low atomic number results in layer 31b efficiently transmitting X-rays 34b. If made of diamond, second layer 31b has a typical stopping distance of 45 µm for 100 KEV electrons. This is a typical maximum thickness for layer 31b in order to avoid excessive heat generation therein due to the kinetic energy of the unconverted electrons 40 passing therethrough, although greater thicknesses can be used. Second layer 31b, if made of diamond, can be formed on first layer 31a by chemical vapor deposition. Other materials can be deposited by such known techniques as electroplating, sputtering or electroless deposition. If it is not desired to use transmission mode X-rays 34b for imaging, then second layer 31b need not have a low density or a low atomic number. In such a case, other high thermal conductivity materials, e.g., Cu and Ag, can be added to the list of materials used for second layer 31b.
  • This anode design offers enhanced performance because it operates in the most favorable portions of the heat production and X-ray production as a function of the thickness of layer 31a relationships. These relationships are respectively illustrated in Figures 2(a) and 2(b).
  • As shown in Figure 2(b), X-rays are most efficiently generated by a monochromic electron beam 20 of high energy. This is the characteristic of the tube's electron beam 20 when it first contacts the X-ray generating anode layer 31a. As electron beam 20 penetrates into the material of layer 31a, scattering and absorption processes lower the average energy of beam 20 and change it from a monoenergetic beam to a spectrum of electron energies, all lower than the incident energy at the lower surface of layer 31a as viewed in Figure 1. This less energetic beam is a less efficient generator of X-rays. Thus, the largest quantity of useful, hard X-rays are generated near the lower surface of layer 31a.
  • As shown in Figure 2(a), the loss of average beam 20 energy with thickness of layer 31a has a similar effect on heat production. At the lower surface of layer 31a, many electrons penetrate the anode layer 31a without scattering. As the beam 20 goes deeper in the anode layer 31a and reaches a lower average energy, the probability of stopping and depositing all of its remaining energy increases. Thus the heat production as a function of the thickness of layer 31a reaches a maximum 48 above the lower surface of the anode layer 31a.
  • This invention preferably uses anode layers 31a which are thin compared to the average stopping distance of the electron beam in the material of the anode layer 31a. These thin film anodes, illustrated as the dotted lines 50 in Figures 2(a) and 2(b), interact with the electron beam 20 only in the region where the best achievable X-ray output to heat production ratio is in effect. This accounts for the performance advantage of this design.
  • It will be appreciated that the present invention can also be used with a conventional (non-microfocus) X-ray tube. In particular, it can be used with a rotating anode X-ray tube, wherein the rotating anode comprises a heat sink made of, e.g., Cu, with bevelled edges. Anode 32 is normally disposed only on the bevelled edges.

Claims (21)

  1. An X-ray tube anode comprising:
    a first means for producing X-rays in response to incident electrons; and
    a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  2. The X-ray tube anode of claim 1 wherein said first means comprises a high atomic number and high density first layer disposed on said first layer.
  3. The anode of claim 2 wherein said first layer comprises an element selected from the group consisting of Nb, Mo, Hf, Ta, W, Re, Os, Ir, Pt, Au, or U.
  4. The anode of claim 3 wherein said element comprises W.
  5. The anode of claim 2 wherein said first layer has a maximum thickness less than or about equal to the stopping distance of said incident electrons in said first layer.
  6. The anode of claim 2 wherein said first layer has a thickness between about 1 to 15 µm.
  7. The X-ray tube anode of claim 1 wherein said second means comprises a high thermal conductivity second layer.
  8. The anode of claim 7 wherein said second layer comprises an element selected from the group consisting of Be, Al, Cu, Ag, or diamond.
  9. The anode of claim 8 wherein said element comprises diamond.
  10. The anode of claim 9 wherein said diamond is monocrystalline.
  11. The anode of claim 9 wherein said diamond is polycrystalline.
  12. The anode of claim 7 wherein said second layer has a maximum thickness of about 45 µm.
  13. The anode of claim 7 wherein said second layer has a maximum thickness about equal to the stopping distance of said incident electrons. 14. The anode of claim 7 wherein said second layer comprises a low atomic number and low density material.
  14. An X-ray tube comprising an envelope having first and second ends, an anode disposed proximate said second end, said anode comprising:
    a first means for producing X-rays in response to incident electrons; and
    a second means, contacting said first means, for supporting said first means and conducting heat away from said first means.
  15. The tube of claim 15 wherein said tube is a microfocus tube comprising an electron beam focusing means.
  16. The tube of claim 16 wherein said focusing means comprises an electromagnetic focusing means.
  17. The tube of claim 15 further comprising a heat sink disposed in contact with said second means.
  18. The tube of claim 18 wherein said heat sink comprises a beam dump.
  19. The tube of claim 15 wherein said heat sink comprises a transmission mode X-ray window disposed opposing said second means.
  20. The tube of claim 15 wherein said envelope has a normal mode X-ray window disposed adjacent said first means.
  21. The tube of claim 15 further comprising a cathode disposed proximate said first end, and a control grid disposed adjacent said cathode.
EP19900122630 1989-12-11 1990-11-27 X ray tube anode and tube having same Withdrawn EP0432568A3 (en)

Applications Claiming Priority (2)

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US44838489A 1989-12-11 1989-12-11
US448384 1989-12-11

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EP0432568A2 true EP0432568A2 (en) 1991-06-19
EP0432568A3 EP0432568A3 (en) 1991-08-28

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Cited By (76)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0553912A1 (en) * 1992-01-27 1993-08-04 Koninklijke Philips Electronics N.V. X-ray tube with improved temperature control
EP0584871A1 (en) * 1992-08-27 1994-03-02 Dagang Dr. Tan X-ray tube with anode in transmission mode
WO1995006952A1 (en) * 1993-09-02 1995-03-09 Medical Research Council X-ray tubes
EP0777255A1 (en) * 1995-11-28 1997-06-04 Philips Patentverwaltung GmbH X-ray tube, in particular microfocus X-ray tube
EP0788136A1 (en) * 1996-01-31 1997-08-06 Physical Electronics, Inc. Anode assembly for generating x-rays and instrument with such anode assembly
US5657365A (en) * 1994-08-20 1997-08-12 Sumitomo Electric Industries, Ltd. X-ray generation apparatus
US5878110A (en) * 1994-08-20 1999-03-02 Sumitomo Electric Industries, Ltd. X-ray generation apparatus
EP0974149A1 (en) * 1997-04-08 2000-01-26 X-Ray Technologies Pty Ltd High resolution x-ray imaging of very small objects
WO2000057449A1 (en) * 1999-03-23 2000-09-28 Medtronic Ave Inc. X-ray device and process for manufacture
WO2001008195A1 (en) * 1999-07-26 2001-02-01 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. X-ray anode and method for the production thereof
WO2004053919A2 (en) * 2002-12-11 2004-06-24 Koninklijke Philips Electronics N.V. X-ray source for generating monochromatic x-rays
WO2004097886A2 (en) * 2003-04-25 2004-11-11 Cxr Limited X-ray tubes
EP1727185A1 (en) * 2005-05-26 2006-11-29 Panalytical B.V. X-Ray anode
US7186022B2 (en) * 2002-01-31 2007-03-06 The Johns Hopkins University X-ray source and method for more efficiently producing selectable x-ray frequencies
US7298826B2 (en) 2002-05-09 2007-11-20 Hamamatsu Photonics K.K. X-ray generator
US7349525B2 (en) 2003-04-25 2008-03-25 Rapiscan Systems, Inc. X-ray sources
US7471769B2 (en) 2001-06-21 2008-12-30 Koninklijke Philips Electronics N.V. X-ray source provided with a liquid metal target
US7512215B2 (en) 2003-04-25 2009-03-31 Rapiscan Systems, Inc. X-ray tube electron sources
GB2453570A (en) * 2007-10-11 2009-04-15 Kratos Analytical Ltd Electrode for x-ray apparatus
US7564939B2 (en) 2003-04-25 2009-07-21 Rapiscan Systems, Inc. Control means for heat load in X-ray scanning apparatus
DE102008007413A1 (en) 2008-02-04 2009-08-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. X-ray target
EP2239757A1 (en) * 2008-01-17 2010-10-13 Kabushiki Kaisha Toshiba X-ray tube
US7929663B2 (en) 2003-04-25 2011-04-19 Rapiscan Systems, Inc. X-ray monitoring
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US8085897B2 (en) 2003-04-25 2011-12-27 Rapiscan Systems, Inc. X-ray scanning system
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US8135110B2 (en) 2005-12-16 2012-03-13 Rapiscan Systems, Inc. X-ray tomography inspection systems
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
WO2013007484A1 (en) * 2011-07-14 2013-01-17 Siemens Aktiengesellschaft Monochromatic x-ray source
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
CN103293174A (en) * 2012-03-01 2013-09-11 纳优科技(北京)有限公司 X ray fluorescence spectrophotometer for multi-detectors and multi-light pipes and X ray fluorescence spectrum detection method for large-volume sample
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US8824637B2 (en) 2008-09-13 2014-09-02 Rapiscan Systems, Inc. X-ray tubes
US20150110252A1 (en) * 2013-09-19 2015-04-23 Wenbing Yun X-ray sources using linear accumulation
US9052403B2 (en) 2002-07-23 2015-06-09 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
US9223050B2 (en) 2005-04-15 2015-12-29 Rapiscan Systems, Inc. X-ray imaging system having improved mobility
US9223052B2 (en) 2008-02-28 2015-12-29 Rapiscan Systems, Inc. Scanning systems
US9223049B2 (en) 2002-07-23 2015-12-29 Rapiscan Systems, Inc. Cargo scanning system with boom structure
US9263225B2 (en) 2008-07-15 2016-02-16 Rapiscan Systems, Inc. X-ray tube anode comprising a coolant tube
US9332624B2 (en) 2008-05-20 2016-05-03 Rapiscan Systems, Inc. Gantry scanner systems
US9420677B2 (en) 2009-01-28 2016-08-16 Rapiscan Systems, Inc. X-ray tube electron sources
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9675306B2 (en) 2003-04-25 2017-06-13 Rapiscan Systems, Inc. X-ray scanning system
US9726619B2 (en) 2005-10-25 2017-08-08 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
US9791590B2 (en) 2013-01-31 2017-10-17 Rapiscan Systems, Inc. Portable security inspection system
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US10349908B2 (en) 2013-10-31 2019-07-16 Sigray, Inc. X-ray interferometric imaging system
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
US10585206B2 (en) 2017-09-06 2020-03-10 Rapiscan Systems, Inc. Method and system for a multi-view scanner
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
US10847336B2 (en) 2017-08-17 2020-11-24 Bruker AXS, GmbH Analytical X-ray tube with high thermal performance
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
CN114501758A (en) * 2022-01-11 2022-05-13 长春理工大学 High flux X ray source
US11551903B2 (en) 2020-06-25 2023-01-10 American Science And Engineering, Inc. Devices and methods for dissipating heat from an anode of an x-ray tube assembly

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3191554B2 (en) * 1994-03-18 2001-07-23 株式会社日立製作所 X-ray imaging device
US6928141B2 (en) 2003-06-20 2005-08-09 Rapiscan, Inc. Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers
GB0803641D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
JP5153388B2 (en) * 2008-03-06 2013-02-27 株式会社リガク X-ray generator, X-ray analyzer, X-ray transmission image measuring device, and X-ray interferometer
JP2012256443A (en) * 2011-06-07 2012-12-27 Canon Inc X-ray emission target and x-ray emission device
JP5812700B2 (en) * 2011-06-07 2015-11-17 キヤノン株式会社 X-ray emission target, X-ray generator tube and X-ray generator
DE102013208103A1 (en) * 2013-05-03 2014-11-06 Siemens Aktiengesellschaft X-ray source and imaging system
JP6326758B2 (en) 2013-10-16 2018-05-23 株式会社島津製作所 X-ray generator
JP6849518B2 (en) 2017-04-28 2021-03-24 浜松ホトニクス株式会社 X-ray tube and X-ray generator
WO2024029474A1 (en) * 2022-08-05 2024-02-08 株式会社島津製作所 X-ray imaging device and x-ray tubes

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3239706A (en) * 1961-04-17 1966-03-08 High Voltage Engineering Corp X-ray target
GB1249341A (en) * 1968-10-08 1971-10-13 Rigaku Denki Company Ltd Improvements in or relating to x-ray tubes
US3867637A (en) * 1973-09-04 1975-02-18 Raytheon Co Extended monochromatic x-ray source
FR2271659A1 (en) * 1974-05-15 1975-12-12 Philips Nv
EP0275592A1 (en) * 1986-12-23 1988-07-27 Koninklijke Philips Electronics N.V. X-ray tube comprising an annular focus
EP0292055A2 (en) * 1987-05-18 1988-11-23 Philips Patentverwaltung GmbH Radiation source for the generation of essentially monochromatic X-rays
EP0319912A2 (en) * 1987-12-07 1989-06-14 Nanodynamics, Incorporated Method and apparatus for investigating materials with X-rays

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3239706A (en) * 1961-04-17 1966-03-08 High Voltage Engineering Corp X-ray target
GB1249341A (en) * 1968-10-08 1971-10-13 Rigaku Denki Company Ltd Improvements in or relating to x-ray tubes
US3867637A (en) * 1973-09-04 1975-02-18 Raytheon Co Extended monochromatic x-ray source
FR2271659A1 (en) * 1974-05-15 1975-12-12 Philips Nv
EP0275592A1 (en) * 1986-12-23 1988-07-27 Koninklijke Philips Electronics N.V. X-ray tube comprising an annular focus
EP0292055A2 (en) * 1987-05-18 1988-11-23 Philips Patentverwaltung GmbH Radiation source for the generation of essentially monochromatic X-rays
EP0319912A2 (en) * 1987-12-07 1989-06-14 Nanodynamics, Incorporated Method and apparatus for investigating materials with X-rays

Cited By (119)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0553912A1 (en) * 1992-01-27 1993-08-04 Koninklijke Philips Electronics N.V. X-ray tube with improved temperature control
EP0584871A1 (en) * 1992-08-27 1994-03-02 Dagang Dr. Tan X-ray tube with anode in transmission mode
WO1995006952A1 (en) * 1993-09-02 1995-03-09 Medical Research Council X-ray tubes
US5878110A (en) * 1994-08-20 1999-03-02 Sumitomo Electric Industries, Ltd. X-ray generation apparatus
US5657365A (en) * 1994-08-20 1997-08-12 Sumitomo Electric Industries, Ltd. X-ray generation apparatus
EP0777255A1 (en) * 1995-11-28 1997-06-04 Philips Patentverwaltung GmbH X-ray tube, in particular microfocus X-ray tube
EP0788136A1 (en) * 1996-01-31 1997-08-06 Physical Electronics, Inc. Anode assembly for generating x-rays and instrument with such anode assembly
EP0974149A1 (en) * 1997-04-08 2000-01-26 X-Ray Technologies Pty Ltd High resolution x-ray imaging of very small objects
EP0974149A4 (en) * 1997-04-08 2004-05-26 X Ray Technologies Pty Ltd High resolution x-ray imaging of very small objects
WO2000057449A1 (en) * 1999-03-23 2000-09-28 Medtronic Ave Inc. X-ray device and process for manufacture
DE19934987A1 (en) * 1999-07-26 2001-05-03 Fraunhofer Ges Forschung X-ray anode and process for its manufacture
WO2001008195A1 (en) * 1999-07-26 2001-02-01 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. X-ray anode and method for the production thereof
DE19934987B4 (en) * 1999-07-26 2004-11-11 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. X-ray anode and its use
US6850598B1 (en) 1999-07-26 2005-02-01 Fraunhofer Gesellschaft zur Förderung der angewandten Forschung e.V. X-ray anode and process for its manufacture
US7471769B2 (en) 2001-06-21 2008-12-30 Koninklijke Philips Electronics N.V. X-ray source provided with a liquid metal target
US7186022B2 (en) * 2002-01-31 2007-03-06 The Johns Hopkins University X-ray source and method for more efficiently producing selectable x-ray frequencies
US7298826B2 (en) 2002-05-09 2007-11-20 Hamamatsu Photonics K.K. X-ray generator
US10007019B2 (en) 2002-07-23 2018-06-26 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US9223049B2 (en) 2002-07-23 2015-12-29 Rapiscan Systems, Inc. Cargo scanning system with boom structure
US9052403B2 (en) 2002-07-23 2015-06-09 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US10670769B2 (en) 2002-07-23 2020-06-02 Rapiscan Systems, Inc. Compact mobile cargo scanning system
WO2004053919A3 (en) * 2002-12-11 2004-12-29 Koninkl Philips Electronics Nv X-ray source for generating monochromatic x-rays
WO2004053919A2 (en) * 2002-12-11 2004-06-24 Koninklijke Philips Electronics N.V. X-ray source for generating monochromatic x-rays
US7436931B2 (en) 2002-12-11 2008-10-14 Koninklijke Philips Electronics N.V. X-ray source for generating monochromatic x-rays
US9020095B2 (en) 2003-04-25 2015-04-28 Rapiscan Systems, Inc. X-ray scanners
WO2004097886A3 (en) * 2003-04-25 2005-07-28 Cxr Ltd X-ray tubes
US7512215B2 (en) 2003-04-25 2009-03-31 Rapiscan Systems, Inc. X-ray tube electron sources
US9675306B2 (en) 2003-04-25 2017-06-13 Rapiscan Systems, Inc. X-ray scanning system
US7564939B2 (en) 2003-04-25 2009-07-21 Rapiscan Systems, Inc. Control means for heat load in X-ray scanning apparatus
US9747705B2 (en) 2003-04-25 2017-08-29 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US7664230B2 (en) 2003-04-25 2010-02-16 Rapiscan Systems, Inc. X-ray tubes
US9442082B2 (en) 2003-04-25 2016-09-13 Rapiscan Systems, Inc. X-ray inspection system and method
US7903789B2 (en) 2003-04-25 2011-03-08 Rapiscan Systems, Inc. X-ray tube electron sources
US7929663B2 (en) 2003-04-25 2011-04-19 Rapiscan Systems, Inc. X-ray monitoring
WO2004097886A2 (en) * 2003-04-25 2004-11-11 Cxr Limited X-ray tubes
US10175381B2 (en) 2003-04-25 2019-01-08 Rapiscan Systems, Inc. X-ray scanners having source points with less than a predefined variation in brightness
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8085897B2 (en) 2003-04-25 2011-12-27 Rapiscan Systems, Inc. X-ray scanning system
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US9113839B2 (en) 2003-04-25 2015-08-25 Rapiscon Systems, Inc. X-ray inspection system and method
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US11796711B2 (en) 2003-04-25 2023-10-24 Rapiscan Systems, Inc. Modular CT scanning system
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
GB2417822A (en) * 2003-04-25 2006-03-08 Cxr Ltd X-ray tubes
US7505563B2 (en) 2003-04-25 2009-03-17 Rapiscan Systems, Inc. X-ray sources
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US10901112B2 (en) 2003-04-25 2021-01-26 Rapiscan Systems, Inc. X-ray scanning system with stationary x-ray sources
US8885794B2 (en) 2003-04-25 2014-11-11 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US10591424B2 (en) 2003-04-25 2020-03-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US7349525B2 (en) 2003-04-25 2008-03-25 Rapiscan Systems, Inc. X-ray sources
US9618648B2 (en) 2003-04-25 2017-04-11 Rapiscan Systems, Inc. X-ray scanners
US9183647B2 (en) 2003-04-25 2015-11-10 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US9223050B2 (en) 2005-04-15 2015-12-29 Rapiscan Systems, Inc. X-ray imaging system having improved mobility
EP1727185A1 (en) * 2005-05-26 2006-11-29 Panalytical B.V. X-Ray anode
US9726619B2 (en) 2005-10-25 2017-08-08 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US10295483B2 (en) 2005-12-16 2019-05-21 Rapiscan Systems, Inc. Data collection, processing and storage systems for X-ray tomographic images
US8625735B2 (en) 2005-12-16 2014-01-07 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US10976271B2 (en) 2005-12-16 2021-04-13 Rapiscan Systems, Inc. Stationary tomographic X-ray imaging systems for automatically sorting objects based on generated tomographic images
US8135110B2 (en) 2005-12-16 2012-03-13 Rapiscan Systems, Inc. X-ray tomography inspection systems
US8958526B2 (en) 2005-12-16 2015-02-17 Rapiscan Systems, Inc. Data collection, processing and storage systems for X-ray tomographic images
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US9048061B2 (en) 2005-12-16 2015-06-02 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US9638646B2 (en) 2005-12-16 2017-05-02 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
GB2453570A (en) * 2007-10-11 2009-04-15 Kratos Analytical Ltd Electrode for x-ray apparatus
US8031839B2 (en) 2008-01-17 2011-10-04 Kabushik Kaisha Toshiba X-ray tube
EP2239757A4 (en) * 2008-01-17 2011-06-08 Toshiba Kk X-ray tube
EP2239757A1 (en) * 2008-01-17 2010-10-13 Kabushiki Kaisha Toshiba X-ray tube
DE102008007413A1 (en) 2008-02-04 2009-08-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. X-ray target
US9223052B2 (en) 2008-02-28 2015-12-29 Rapiscan Systems, Inc. Scanning systems
US11768313B2 (en) 2008-02-28 2023-09-26 Rapiscan Systems, Inc. Multi-scanner networked systems for performing material discrimination processes on scanned objects
US10585207B2 (en) 2008-02-28 2020-03-10 Rapiscan Systems, Inc. Scanning systems
US11275194B2 (en) 2008-02-28 2022-03-15 Rapiscan Systems, Inc. Scanning systems
US10098214B2 (en) 2008-05-20 2018-10-09 Rapiscan Systems, Inc. Detector support structures for gantry scanner systems
US9332624B2 (en) 2008-05-20 2016-05-03 Rapiscan Systems, Inc. Gantry scanner systems
US9263225B2 (en) 2008-07-15 2016-02-16 Rapiscan Systems, Inc. X-ray tube anode comprising a coolant tube
US8824637B2 (en) 2008-09-13 2014-09-02 Rapiscan Systems, Inc. X-ray tubes
US9420677B2 (en) 2009-01-28 2016-08-16 Rapiscan Systems, Inc. X-ray tube electron sources
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
WO2013007484A1 (en) * 2011-07-14 2013-01-17 Siemens Aktiengesellschaft Monochromatic x-ray source
CN103293174A (en) * 2012-03-01 2013-09-11 纳优科技(北京)有限公司 X ray fluorescence spectrophotometer for multi-detectors and multi-light pipes and X ray fluorescence spectrum detection method for large-volume sample
US10317566B2 (en) 2013-01-31 2019-06-11 Rapiscan Systems, Inc. Portable security inspection system
US9791590B2 (en) 2013-01-31 2017-10-17 Rapiscan Systems, Inc. Portable security inspection system
US11550077B2 (en) 2013-01-31 2023-01-10 Rapiscan Systems, Inc. Portable vehicle inspection portal with accompanying workstation
US10976273B2 (en) 2013-09-19 2021-04-13 Sigray, Inc. X-ray spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US9390881B2 (en) * 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
US20150110252A1 (en) * 2013-09-19 2015-04-23 Wenbing Yun X-ray sources using linear accumulation
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10653376B2 (en) 2013-10-31 2020-05-19 Sigray, Inc. X-ray imaging system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10349908B2 (en) 2013-10-31 2019-07-16 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10466185B2 (en) 2016-12-03 2019-11-05 Sigray, Inc. X-ray interrogation system using multiple x-ray beams
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
US10847336B2 (en) 2017-08-17 2020-11-24 Bruker AXS, GmbH Analytical X-ray tube with high thermal performance
US10585206B2 (en) 2017-09-06 2020-03-10 Rapiscan Systems, Inc. Method and system for a multi-view scanner
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
US10989822B2 (en) 2018-06-04 2021-04-27 Sigray, Inc. Wavelength dispersive x-ray spectrometer
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
US10991538B2 (en) 2018-07-26 2021-04-27 Sigray, Inc. High brightness x-ray reflection source
US10658145B2 (en) 2018-07-26 2020-05-19 Sigray, Inc. High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
US11551903B2 (en) 2020-06-25 2023-01-10 American Science And Engineering, Inc. Devices and methods for dissipating heat from an anode of an x-ray tube assembly
CN114501758A (en) * 2022-01-11 2022-05-13 长春理工大学 High flux X ray source

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