DE69910014D1 - Balkensonde für kraftmikroskop - Google Patents

Balkensonde für kraftmikroskop

Info

Publication number
DE69910014D1
DE69910014D1 DE69910014T DE69910014T DE69910014D1 DE 69910014 D1 DE69910014 D1 DE 69910014D1 DE 69910014 T DE69910014 T DE 69910014T DE 69910014 T DE69910014 T DE 69910014T DE 69910014 D1 DE69910014 D1 DE 69910014D1
Authority
DE
Germany
Prior art keywords
probes
probe
magnetic
film
power microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69910014T
Other languages
English (en)
Other versions
DE69910014T2 (de
Inventor
M Lindsay
Tianwei Jing
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ARIZONA BOARD OF REGENTS TEMPE
Arizona Board of Regents of ASU
Molecular Imaging Corp
Original Assignee
ARIZONA BOARD OF REGENTS TEMPE
Arizona Board of Regents of ASU
Molecular Imaging Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ARIZONA BOARD OF REGENTS TEMPE, Arizona Board of Regents of ASU, Molecular Imaging Corp filed Critical ARIZONA BOARD OF REGENTS TEMPE
Publication of DE69910014D1 publication Critical patent/DE69910014D1/de
Application granted granted Critical
Publication of DE69910014T2 publication Critical patent/DE69910014T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/40—Conductive probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/865—Magnetic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/873—Tip holder
DE69910014T 1998-05-20 1999-05-17 Balkensonde für kraftmikroskop Expired - Lifetime DE69910014T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US82095 1998-05-20
US09/082,095 US6121611A (en) 1998-05-20 1998-05-20 Force sensing probe for scanning probe microscopy
PCT/US1999/010859 WO1999060330A1 (en) 1998-05-20 1999-05-17 Force sensing probe for scanning probe microscopy

Publications (2)

Publication Number Publication Date
DE69910014D1 true DE69910014D1 (de) 2003-09-04
DE69910014T2 DE69910014T2 (de) 2004-04-15

Family

ID=22169036

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69910014T Expired - Lifetime DE69910014T2 (de) 1998-05-20 1999-05-17 Balkensonde für kraftmikroskop

Country Status (6)

Country Link
US (1) US6121611A (de)
EP (1) EP1080340B1 (de)
JP (1) JP2002515592A (de)
AT (1) ATE246340T1 (de)
DE (1) DE69910014T2 (de)
WO (1) WO1999060330A1 (de)

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* Cited by examiner, † Cited by third party
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EP1080340B1 (de) 2003-07-30
US6121611A (en) 2000-09-19
EP1080340A1 (de) 2001-03-07
ATE246340T1 (de) 2003-08-15
JP2002515592A (ja) 2002-05-28
WO1999060330A1 (en) 1999-11-25
DE69910014T2 (de) 2004-04-15

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