DE69906310T2 - Verfahren und vorrichtung zur messung eines flüssigkeitströpfchen - Google Patents

Verfahren und vorrichtung zur messung eines flüssigkeitströpfchen

Info

Publication number: DE69906310T2
Authority: DE; Germany
Prior art keywords: measuring; liquid drop; drop; liquid
Prior art date: 1998-08-04
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE69906310T

Other languages

English (en)

Other versions

DE69906310D1 (de

Inventor

Tzong-Shyng Leu

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Sarnoff Corp

Original Assignee

Sarnoff Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1998-08-04

Filing date

1999-08-04

Publication date

2003-12-11

1999-08-04 Application filed by Sarnoff Corp filed Critical Sarnoff Corp

2003-04-30 Application granted granted Critical

2003-04-30 Publication of DE69906310D1 publication Critical patent/DE69906310D1/de

2003-12-11 Publication of DE69906310T2 publication Critical patent/DE69906310T2/de

2019-08-05 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means, e.g. by light scattering, diffraction, holography or imaging
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N2015/0023—Investigating dispersion of liquids
- G01N2015/0026—Investigating dispersion of liquids in gas, e.g. fog

DE69906310T 1998-08-04 1999-08-04 Verfahren und vorrichtung zur messung eines flüssigkeitströpfchen Expired - Fee Related DE69906310T2 (de)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
US9533398P	1998-08-04	1998-08-04
US09/215,018 US6305777B1 (en)	1998-08-04	1998-12-17	Apparatus and method for measurement of a liquid droplet
PCT/US1999/017446 WO2000008419A1 (en)	1998-08-04	1999-08-04	Apparatus and method for measurement of a liquid droplet

Publications (2)

Publication Number	Publication Date
DE69906310D1 DE69906310D1 (de)	2003-04-30
DE69906310T2 true DE69906310T2 (de)	2003-12-11

Family

ID=26790106

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE69906310T Expired - Fee Related DE69906310T2 (de)	1998-08-04	1999-08-04	Verfahren und vorrichtung zur messung eines flüssigkeitströpfchen

Country Status (6)

Country	Link
US (1)	US6305777B1 (de)
EP (1)	EP1102965B1 (de)
JP (1)	JP2002522755A (de)
AU (1)	AU5391499A (de)
DE (1)	DE69906310T2 (de)
WO (1)	WO2000008419A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
EP1127694B1 (de) *	2000-02-23	2006-05-03	Seiko Epson Corporation	Detektion einer nicht funktionierenden Düse mittels eines Lichtstrahles durch eine Öffnung
US6641246B2 (en) *	2000-02-23	2003-11-04	Seiko Epson Corporation	Detection of non-operating nozzle by light beam passing through aperture
US6897466B2 (en) *	2001-07-19	2005-05-24	Seiko Epson Corporation	Instrument and method for measuring ejection velocity of liquid
US6858860B2 (en) *	2001-07-24	2005-02-22	Seiko Epson Corporation	Apparatus and method for measuring natural period of liquid
DE10163463B9 (de) *	2001-12-21	2008-07-17	Osram Opto Semiconductors Gmbh	Vorrichtung und Verfahren zu in-situ-Messung von auf Trägern aufgedruckten Polymermengen
JP4474870B2 (ja) *	2003-08-27	2010-06-09	セイコーエプソン株式会社	液滴視認方法、液滴吐出ヘッド検査装置および液滴吐出装置
JP4673051B2 (ja) *	2004-12-14	2011-04-20	キヤノン株式会社	インクジェット記録装置及び吐出状態検出方法
JP2006175775A (ja) *	2004-12-24	2006-07-06	Seiko Epson Corp	計測装置、液滴吐出装置、計測装置とノズルとの位置合せ方法、計測装置のキャリブレーション方法、および計測方法
KR100668325B1 (ko) *	2005-01-21	2007-01-12	삼성전자주식회사	컬러 필터의 제조장치 및 제조방법
JP4905998B2 (ja) *	2005-04-25	2012-03-28	株式会社アルバック	液滴分析システム
JP4955713B2 (ja) *	2009-01-16	2012-06-20	リコーエレメックス株式会社	液滴検知装置およびインクジェットプリンタ
GB0915346D0 (en) *	2009-09-03	2009-10-07	Billericay Farm Services Ltd	Droplet counting and measurement device
US20120287198A1 (en) *	2011-05-11	2012-11-15	Fujifilm Dimatix, Inc.	Imaging Jetted Ink
JP6085608B2 (ja) *	2011-09-19	2017-02-22	コーニンクレッカフィリップスエヌヴェＫｏｎｉｎｋｌｉｊｋｅＰｈｉｌｉｐｓＮ．Ｖ．	エアロゾルの出力の分析及び制御
JP2013121663A (ja) *	2011-12-09	2013-06-20	Ricoh Co Ltd	液吐出状態検出装置及び画像形成装置
CN111070891A (zh) *	2020-01-10	2020-04-28	浙江工业大学	喷墨打印头的墨滴检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4429995A (en) *	1980-07-21	1984-02-07	National Research Development Corporation	Two dimensinal flow analyzer
US4751517A (en) *	1987-02-02	1988-06-14	Xerox Corporation	Two-dimensional ink droplet sensors for ink jet printers
US4842406A (en) *	1988-01-15	1989-06-27	Pacific Scientific Company	Optical instruments for measuring particle sizes
US5092675A (en) *	1989-11-14	1992-03-03	Pacific Scientific Company	Vacuum line particle detector with slab laser
US5426501A (en) *	1993-01-06	1995-06-20	Laser Sensor Technology, Inc.	Apparatus and method for particle analysis
US5637881A (en) *	1993-04-01	1997-06-10	High Yield Technology, Inc.	Method to detect non-spherical particles using orthogonally polarized light
US5430306A (en) *	1994-01-03	1995-07-04	Hewlett-Packard Company	Optoelectronic detector with high, uniform sensitivity and large field of view, for thermal-inkjet inkdrops

1998
- 1998-12-17 US US09/215,018 patent/US6305777B1/en not_active Expired - Fee Related
1999
- 1999-08-04 JP JP2000564008A patent/JP2002522755A/ja active Pending
- 1999-08-04 EP EP99939664A patent/EP1102965B1/de not_active Expired - Lifetime
- 1999-08-04 AU AU53914/99A patent/AU5391499A/en not_active Abandoned
- 1999-08-04 WO PCT/US1999/017446 patent/WO2000008419A1/en active IP Right Grant
- 1999-08-04 DE DE69906310T patent/DE69906310T2/de not_active Expired - Fee Related

Also Published As

Publication number	Publication date
JP2002522755A (ja)	2002-07-23
AU5391499A (en)	2000-02-28
EP1102965A1 (de)	2001-05-30
EP1102965B1 (de)	2003-03-26
DE69906310D1 (de)	2003-04-30
WO2000008419A1 (en)	2000-02-17
EP1102965A4 (de)	2001-11-14
US6305777B1 (en)	2001-10-23

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Legal Events

Date	Code	Title	Description
2004-04-22	8364	No opposition during term of opposition
2006-06-14	8339	Ceased/non-payment of the annual fee