DE69904854D1 - Testmodule für automatische testanordnung - Google Patents

Testmodule für automatische testanordnung

Info

Publication number
DE69904854D1
DE69904854D1 DE69904854T DE69904854T DE69904854D1 DE 69904854 D1 DE69904854 D1 DE 69904854D1 DE 69904854 T DE69904854 T DE 69904854T DE 69904854 T DE69904854 T DE 69904854T DE 69904854 D1 DE69904854 D1 DE 69904854D1
Authority
DE
Germany
Prior art keywords
test
modules
arrangement
automatic
automatic test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69904854T
Other languages
English (en)
Other versions
DE69904854T2 (de
Inventor
Jonathan Fuller
Charles Crapuchettes
Stuart Nelson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of DE69904854D1 publication Critical patent/DE69904854D1/de
Application granted granted Critical
Publication of DE69904854T2 publication Critical patent/DE69904854T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31724—Test controller, e.g. BIST state machine
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration
DE69904854T 1998-10-23 1999-10-21 Testmodule für automatische testanordnung Expired - Lifetime DE69904854T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/178,257 US6275962B1 (en) 1998-10-23 1998-10-23 Remote test module for automatic test equipment
PCT/US1999/024704 WO2000025144A1 (en) 1998-10-23 1999-10-21 Remote test module for automatic test equipment

Publications (2)

Publication Number Publication Date
DE69904854D1 true DE69904854D1 (de) 2003-02-13
DE69904854T2 DE69904854T2 (de) 2003-11-20

Family

ID=22651840

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69904854T Expired - Lifetime DE69904854T2 (de) 1998-10-23 1999-10-21 Testmodule für automatische testanordnung

Country Status (7)

Country Link
US (1) US6275962B1 (de)
EP (1) EP1123514B1 (de)
JP (1) JP4708566B2 (de)
KR (1) KR100649648B1 (de)
DE (1) DE69904854T2 (de)
TW (1) TW523605B (de)
WO (1) WO2000025144A1 (de)

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CN101968527B (zh) * 2009-07-27 2013-06-19 智邦科技股份有限公司 系统级封装的装置批次测试方法及其装置批次测试系统
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TWI569028B (zh) * 2014-05-02 2017-02-01 塞拉有限公司 除錯系統
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CN110208680A (zh) * 2019-06-26 2019-09-06 长电科技（滁州）有限公司 一种芯片测试系统及方法
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Also Published As

Publication number Publication date
KR20010080184A (ko) 2001-08-22
EP1123514B1 (de) 2003-01-08
JP2002528726A (ja) 2002-09-03
EP1123514A1 (de) 2001-08-16
TW523605B (en) 2003-03-11
WO2000025144A1 (en) 2000-05-04
JP4708566B2 (ja) 2011-06-22
KR100649648B1 (ko) 2006-11-24
US6275962B1 (en) 2001-08-14
DE69904854T2 (de) 2003-11-20

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