DE69903005D1 - Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen - Google Patents
Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungenInfo
- Publication number
- DE69903005D1 DE69903005D1 DE69903005T DE69903005T DE69903005D1 DE 69903005 D1 DE69903005 D1 DE 69903005D1 DE 69903005 T DE69903005 T DE 69903005T DE 69903005 T DE69903005 T DE 69903005T DE 69903005 D1 DE69903005 D1 DE 69903005D1
- Authority
- DE
- Germany
- Prior art keywords
- integrated circuit
- speed
- circuit
- caracterizing
- integrated circuits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/006—Identification
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/44—Indication or identification of errors, e.g. for repair
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/036,700 US6212482B1 (en) | 1998-03-06 | 1998-03-06 | Circuit and method for specifying performance parameters in integrated circuits |
PCT/US1999/004903 WO1999044752A2 (en) | 1998-03-06 | 1999-03-05 | Circuit and method for specifying performance parameters in integrated circuits |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69903005D1 true DE69903005D1 (de) | 2002-10-24 |
DE69903005T2 DE69903005T2 (de) | 2003-04-17 |
Family
ID=21890124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69903005T Expired - Lifetime DE69903005T2 (de) | 1998-03-06 | 1999-03-05 | Schaltung und vorrichtung zur karakterisierung der leistungskennwerte von integrierten schaltungen |
Country Status (8)
Country | Link |
---|---|
US (2) | US6212482B1 (de) |
EP (1) | EP1060027B1 (de) |
JP (1) | JP3823026B2 (de) |
KR (1) | KR100597826B1 (de) |
AT (1) | ATE224242T1 (de) |
AU (1) | AU2986499A (de) |
DE (1) | DE69903005T2 (de) |
WO (1) | WO1999044752A2 (de) |
Families Citing this family (12)
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US8505108B2 (en) * | 1993-11-18 | 2013-08-06 | Digimarc Corporation | Authentication using a digital watermark |
FR2800168B1 (fr) * | 1999-10-21 | 2001-12-14 | Softlink | Procede de test de composants electroniques |
TW522297B (en) * | 2000-03-17 | 2003-03-01 | Micro Star Int Co Ltd | Automatic over-clock method for CPU |
WO2001096893A1 (en) * | 2000-06-16 | 2001-12-20 | Transmeta Corporation | Apparatus for controlling semiconductor chip characteristics |
US7089441B2 (en) * | 2001-02-27 | 2006-08-08 | Intel Corporation | Clock multiplier selection for a microprocessor with multiple system bus clocking frequencies |
DE10135582C1 (de) * | 2001-07-20 | 2003-01-16 | Infineon Technologies Ag | Justierschaltung und Verfahren zum Abstimmen eines Taktsignals |
US7522091B2 (en) * | 2002-07-15 | 2009-04-21 | Automotive Systems Laboratory, Inc. | Road curvature estimation system |
JP4367225B2 (ja) | 2004-05-11 | 2009-11-18 | ソニー株式会社 | 半導体集積回路 |
BRPI0510494B8 (pt) * | 2004-07-12 | 2022-06-28 | Kk Toshiba Toshiba Corporation | Dispositivo de armazenagem e aparelho hospedeiro |
US7292019B1 (en) | 2005-10-03 | 2007-11-06 | Zilker Labs, Inc. | Method for accurately setting parameters inside integrated circuits using inaccurate external components |
US8059547B2 (en) * | 2008-12-08 | 2011-11-15 | Advantest Corporation | Test apparatus and test method |
GB201321717D0 (en) * | 2013-12-09 | 2014-01-22 | Pharmachemie Bv | Inhalable Medicaments |
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DE4345604B3 (de) | 1992-03-06 | 2012-07-12 | Rambus Inc. | Vorrichtung zur Kommunikation mit einem DRAM |
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FR2697673B1 (fr) | 1992-10-29 | 1994-12-16 | Gemplus Card Int | Circuit à fusible, pour circuit intégré. |
FR2698222B1 (fr) | 1992-11-18 | 1994-12-16 | Gemplus Card Int | Procédé et circuit de claquage de fusible dans un circuit intégré. |
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JP3293935B2 (ja) | 1993-03-12 | 2002-06-17 | 株式会社東芝 | 並列ビットテストモード内蔵半導体メモリ |
US5488321A (en) | 1993-04-07 | 1996-01-30 | Rambus, Inc. | Static high speed comparator |
JP2727921B2 (ja) | 1993-08-13 | 1998-03-18 | 日本電気株式会社 | 半導体集積回路装置 |
US5491664A (en) | 1993-09-27 | 1996-02-13 | Cypress Semiconductor Corporation | Flexibilitiy for column redundancy in a divided array architecture |
US5451898A (en) | 1993-11-12 | 1995-09-19 | Rambus, Inc. | Bias circuit and differential amplifier having stabilized output swing |
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US5625805A (en) | 1994-06-30 | 1997-04-29 | Digital Equipment Corporation | Clock architecture for synchronous system bus which regulates and adjusts clock skew |
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TW418329B (en) | 1994-08-24 | 2001-01-11 | Ibm | Integrated circuit clocking technique and circuit therefor |
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US5732207A (en) * | 1995-02-28 | 1998-03-24 | Intel Corporation | Microprocessor having single poly-silicon EPROM memory for programmably controlling optional features |
US5901105A (en) * | 1995-04-05 | 1999-05-04 | Ong; Adrian E | Dynamic random access memory having decoding circuitry for partial memory blocks |
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DE19548629C1 (de) | 1995-12-23 | 1997-07-24 | Itt Ind Gmbh Deutsche | Komplementäres Taktsystem |
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US5748020A (en) | 1996-02-02 | 1998-05-05 | Lsi Logic Corporation | High speed capture latch |
US5781486A (en) | 1996-04-16 | 1998-07-14 | Micron Technology Corporation | Apparatus for testing redundant elements in a packaged semiconductor memory device |
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US5850150A (en) | 1996-05-01 | 1998-12-15 | Sun Microsystems, Inc. | Final stage clock buffer in a clock distribution network |
US5734617A (en) | 1996-08-01 | 1998-03-31 | Micron Technology Corporation | Shared pull-up and selection circuitry for programmable cells such as antifuse cells |
JP3175603B2 (ja) * | 1996-09-20 | 2001-06-11 | 日本電気株式会社 | 半導体集積回路装置 |
US5757705A (en) * | 1997-01-22 | 1998-05-26 | Micron Technology, Inc. | SDRAM clocking test mode |
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US6104209A (en) | 1998-08-27 | 2000-08-15 | Micron Technology, Inc. | Low skew differential receiver with disable feature |
US5852378A (en) | 1997-02-11 | 1998-12-22 | Micron Technology, Inc. | Low-skew differential signal converter |
US5898297A (en) | 1997-03-31 | 1999-04-27 | Sun Microsystems, Inc. | Differential high speed driver for low voltage operation |
US5898287A (en) | 1997-07-23 | 1999-04-27 | Technicore, Inc. | Slip controlled induction motor using variable frequency transducer and method for controlling slip |
-
1998
- 1998-03-06 US US09/036,700 patent/US6212482B1/en not_active Expired - Lifetime
-
1999
- 1999-03-05 AU AU29864/99A patent/AU2986499A/en not_active Abandoned
- 1999-03-05 WO PCT/US1999/004903 patent/WO1999044752A2/en active IP Right Grant
- 1999-03-05 EP EP99911154A patent/EP1060027B1/de not_active Expired - Lifetime
- 1999-03-05 KR KR1020007009891A patent/KR100597826B1/ko not_active IP Right Cessation
- 1999-03-05 DE DE69903005T patent/DE69903005T2/de not_active Expired - Lifetime
- 1999-03-05 AT AT99911154T patent/ATE224242T1/de not_active IP Right Cessation
- 1999-03-05 JP JP2000534342A patent/JP3823026B2/ja not_active Expired - Fee Related
-
2001
- 2001-01-16 US US09/764,535 patent/US6393378B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1060027A2 (de) | 2000-12-20 |
KR20010041678A (ko) | 2001-05-25 |
US20010002461A1 (en) | 2001-05-31 |
JP3823026B2 (ja) | 2006-09-20 |
AU2986499A (en) | 1999-09-20 |
US6212482B1 (en) | 2001-04-03 |
DE69903005T2 (de) | 2003-04-17 |
WO1999044752A3 (en) | 1999-10-21 |
JP2002505497A (ja) | 2002-02-19 |
KR100597826B1 (ko) | 2006-07-10 |
US6393378B2 (en) | 2002-05-21 |
EP1060027B1 (de) | 2002-09-18 |
ATE224242T1 (de) | 2002-10-15 |
WO1999044752A2 (en) | 1999-09-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |