DE69841484D1 - Verfahren zum digitalen Abtasten eines elektrischen Wellenzuges - Google Patents

Verfahren zum digitalen Abtasten eines elektrischen Wellenzuges

Info

Publication number
DE69841484D1
DE69841484D1 DE69841484T DE69841484T DE69841484D1 DE 69841484 D1 DE69841484 D1 DE 69841484D1 DE 69841484 T DE69841484 T DE 69841484T DE 69841484 T DE69841484 T DE 69841484T DE 69841484 D1 DE69841484 D1 DE 69841484D1
Authority
DE
Germany
Prior art keywords
electric wave
wave train
digitally sampling
digitally
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69841484T
Other languages
English (en)
Inventor
John J Pickerd
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Application granted granted Critical
Publication of DE69841484D1 publication Critical patent/DE69841484D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/029—Software therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0272—Circuits therefor for sampling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/342—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
DE69841484T 1997-04-04 1998-03-17 Verfahren zum digitalen Abtasten eines elektrischen Wellenzuges Expired - Lifetime DE69841484D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/833,150 US5978742A (en) 1997-04-04 1997-04-04 Method and apparatus for digital sampling of electrical waveforms

Publications (1)

Publication Number Publication Date
DE69841484D1 true DE69841484D1 (de) 2010-03-18

Family

ID=25263574

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69841484T Expired - Lifetime DE69841484D1 (de) 1997-04-04 1998-03-17 Verfahren zum digitalen Abtasten eines elektrischen Wellenzuges
DE69837866T Expired - Lifetime DE69837866T2 (de) 1997-04-04 1998-03-17 Verfahren und Vorrichtung zum digitalen Abtasten eines elektrischen Wellenzuges

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE69837866T Expired - Lifetime DE69837866T2 (de) 1997-04-04 1998-03-17 Verfahren und Vorrichtung zum digitalen Abtasten eines elektrischen Wellenzuges

Country Status (6)

Country Link
US (1) US5978742A (de)
EP (2) EP1666892B1 (de)
JP (1) JP3316583B2 (de)
KR (1) KR100518661B1 (de)
CN (1) CN1178114C (de)
DE (2) DE69841484D1 (de)

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US20040123018A1 (en) * 2002-09-30 2004-06-24 Martin Miller Method and apparatus for analyzing serial data streams
US7519874B2 (en) * 2002-09-30 2009-04-14 Lecroy Corporation Method and apparatus for bit error rate analysis
US6934647B2 (en) * 2002-10-22 2005-08-23 Agilent Technologies, Inc. Efficient sampling of digital waveforms for eye diagram analysis
US7219037B2 (en) 2002-10-24 2007-05-15 Lecroy Corporation High bandwidth oscilloscope
US10659071B2 (en) 2002-10-24 2020-05-19 Teledyne Lecroy, Inc. High bandwidth oscilloscope
US7957938B2 (en) * 2002-10-24 2011-06-07 Lecroy Corporation Method and apparatus for a high bandwidth oscilloscope utilizing multiple channel digital bandwidth interleaving
US7711510B2 (en) 2002-10-24 2010-05-04 Lecroy Corporation Method of crossover region phase correction when summing signals in multiple frequency bands
US7496133B2 (en) * 2002-11-01 2009-02-24 Broadcom Corporation Multi-rate on-chip OCN filter for a transceiver system
US6915218B2 (en) * 2003-02-25 2005-07-05 Tektronix, Inc. Method of constraints control for oscilloscope timebase subsection and display parameters
US6819279B2 (en) * 2003-03-05 2004-11-16 Lecroy Corporation Method and apparatus for the recovery of signals acquired by an interleaved system of digitizers with mismatching frequency response characteristics
US20040183518A1 (en) * 2003-03-19 2004-09-23 Weller Dennis J. Apparatus and method for clock recovery and eye diagram generation
CN100378462C (zh) * 2003-09-09 2008-04-02 武汉大学 同步采样的多相数字化光电式电流互感器及其测量方法
US7320014B2 (en) 2003-12-12 2008-01-15 Tektronix, Inc. Method and apparatus for identifying similar events in long data records
US20050246113A1 (en) * 2004-04-30 2005-11-03 Allen Montijo Equivalent time oscilloscope with compensated response
US7110898B2 (en) * 2004-07-26 2006-09-19 Agilent Technologies, Inc. Method for digitally acquiring and compensating signals
US7072804B2 (en) * 2004-09-28 2006-07-04 Agilent Technologies, Inc. Digital trigger filter for a real time digital oscilloscope
US7525302B2 (en) * 2005-01-31 2009-04-28 Formfactor, Inc. Method of estimating channel bandwidth from a time domain reflectometer (TDR) measurement using rise time and maximum slope
US7285946B2 (en) * 2005-02-07 2007-10-23 Lecroy Corporation Pattern trigger in a coherent timebase
US6995553B1 (en) * 2005-02-24 2006-02-07 Agilent Technologies, Inc. User interface for operating upon an eye diagram to find optimum sampling parameters for a receiver
US7206722B2 (en) * 2005-04-01 2007-04-17 Tektronix, Inc. Oscilloscope having an enhancement filter
US7649930B2 (en) * 2005-11-09 2010-01-19 Tektronix, Inc. Filter equalization using magnitude measurement data
US7558936B2 (en) * 2006-03-24 2009-07-07 Tektronix, Inc. Data management in long record length memory
US7610178B2 (en) * 2006-08-02 2009-10-27 Tektronix, Inc. Noise reduction filter for trigger circuit
US7345603B1 (en) * 2006-11-07 2008-03-18 L3 Communications Integrated Systems, L.P. Method and apparatus for compressed sensing using analog projection
US7535394B2 (en) * 2007-07-10 2009-05-19 Lecroy Corporation High speed arbitrary waveform generator
US8494376B2 (en) * 2008-04-14 2013-07-23 Avago Technologies General Ip (Singapore) Pte. Ltd. Method and apparatus for testing transmitters in optical fiber networks
JP5295679B2 (ja) * 2008-08-01 2013-09-18 株式会社キーエンス 波形観測装置
US20100114516A1 (en) * 2008-11-05 2010-05-06 Tektronix, Inc. Method and Apparatus for Time Synchronization of Events for Multiple Instruments
US8488652B2 (en) * 2010-03-11 2013-07-16 Nec Laboratories America, Inc. Systems and methods for blind equalization in a digital receiver
US8788234B2 (en) * 2010-10-15 2014-07-22 Tektronix, Inc. Method of calibrating interleaved digitizer channels
DE102010048810A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg System zur Bedienung mehrerer Plasma- und/oder Induktionserwärmungsprozesse
DE102010048809A1 (de) 2010-10-20 2012-04-26 Hüttinger Elektronik Gmbh + Co. Kg Leistungsversorgungssystem für eine Plasmaanwendung und/oder eine Induktionserwärmungsanwendung
US9568503B2 (en) 2011-05-26 2017-02-14 Tektronix, Inc. Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing
CN103969483B (zh) * 2014-04-24 2017-02-15 中国电子科技集团公司第四十一研究所 一种数字示波器触发系统
CN104280586A (zh) * 2014-09-04 2015-01-14 安徽华盛科技控股股份有限公司 一种具有存储功能的示波器
KR102373270B1 (ko) * 2015-05-22 2022-03-14 삼성디스플레이 주식회사 표시장치 및 그 구동 방법
CN106257300B (zh) * 2015-06-19 2021-08-06 特克特朗尼克公司 一种测试和测量仪器和用于确定补偿值的方法
CN109324225B (zh) * 2018-11-15 2021-05-28 国网山东省电力公司电力科学研究院 一种用于cvt在线监测的高精度电流采样系统
US11798618B2 (en) 2019-11-15 2023-10-24 Rohde & Schwarz Gmbh & Co. Kg Signal analyzer and method of processing data from an input signal
US11402430B2 (en) 2020-01-17 2022-08-02 Rohde & Schwarz Gmbh & Co. Kg Signal analyzer and method of analyzing a signal
CN112925293B (zh) * 2021-01-25 2022-09-06 东风电子科技股份有限公司 实现针对bcm不同负载反馈波形进行检测的方法、系统、装置、处理器及其存储介质

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Also Published As

Publication number Publication date
DE69837866D1 (de) 2007-07-19
EP1666892B1 (de) 2010-01-27
JP3316583B2 (ja) 2002-08-19
EP0869368B1 (de) 2007-06-06
US5978742A (en) 1999-11-02
DE69837866T2 (de) 2008-02-21
CN1201172A (zh) 1998-12-09
KR19980081062A (ko) 1998-11-25
JPH10282153A (ja) 1998-10-23
EP1666892A2 (de) 2006-06-07
EP0869368A2 (de) 1998-10-07
EP1666892A3 (de) 2006-09-06
KR100518661B1 (ko) 2005-12-07
EP0869368A3 (de) 2000-12-20
CN1178114C (zh) 2004-12-01

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