DE69838116D1 - Verfahren zur Behandlung einer Substratoberfläche und Behandlungsmittel hierfür - Google Patents
Verfahren zur Behandlung einer Substratoberfläche und Behandlungsmittel hierfürInfo
- Publication number
- DE69838116D1 DE69838116D1 DE69838116T DE69838116T DE69838116D1 DE 69838116 D1 DE69838116 D1 DE 69838116D1 DE 69838116 T DE69838116 T DE 69838116T DE 69838116 T DE69838116 T DE 69838116T DE 69838116 D1 DE69838116 D1 DE 69838116D1
- Authority
- DE
- Germany
- Prior art keywords
- treating
- substrate surface
- agent therefor
- treating agent
- therefor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/33—Amino carboxylic acids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/34—Organic compounds containing sulfur
- C11D3/349—Organic compounds containing sulfur additionally containing nitrogen atoms, e.g. nitro, nitroso, amino, imino, nitrilo, nitrile groups containing compounds or their derivatives or thio urea
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/36—Organic compounds containing phosphorus
- C11D3/364—Organic compounds containing phosphorus containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/36—Organic compounds containing phosphorus
- C11D3/365—Organic compounds containing phosphorus containing carboxyl groups
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23G—CLEANING OR DE-GREASING OF METALLIC MATERIAL BY CHEMICAL METHODS OTHER THAN ELECTROLYSIS
- C23G1/00—Cleaning or pickling metallic material with solutions or molten salts
- C23G1/14—Cleaning or pickling metallic material with solutions or molten salts with alkaline solutions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/34—Organic compounds containing sulfur
- C11D3/3418—Toluene -, xylene -, cumene -, benzene - or naphthalene sulfonates or sulfates
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/34—Organic compounds containing sulfur
- C11D3/3472—Organic compounds containing sulfur additionally containing -COOH groups or derivatives thereof
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1223297 | 1997-01-27 | ||
JP1223297 | 1997-01-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69838116D1 true DE69838116D1 (de) | 2007-09-06 |
DE69838116T2 DE69838116T2 (de) | 2008-04-10 |
Family
ID=11799636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69838116T Expired - Lifetime DE69838116T2 (de) | 1997-01-27 | 1998-01-26 | Verfahren zur Behandlung einer Substratoberfläche und Behandlungsmittel hierfür |
Country Status (5)
Country | Link |
---|---|
US (2) | US6143706A (de) |
EP (1) | EP0858102B1 (de) |
KR (1) | KR100497835B1 (de) |
DE (1) | DE69838116T2 (de) |
TW (1) | TW442864B (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3003684B1 (ja) * | 1998-09-07 | 2000-01-31 | 日本電気株式会社 | 基板洗浄方法および基板洗浄液 |
US6627553B1 (en) * | 1998-11-27 | 2003-09-30 | Showa Denko K.K. | Composition for removing side wall and method of removing side wall |
JP4516176B2 (ja) * | 1999-04-20 | 2010-08-04 | 関東化学株式会社 | 電子材料用基板洗浄液 |
US7456113B2 (en) * | 2000-06-26 | 2008-11-25 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
US6927176B2 (en) * | 2000-06-26 | 2005-08-09 | Applied Materials, Inc. | Cleaning method and solution for cleaning a wafer in a single wafer process |
KR100363092B1 (ko) * | 2000-06-27 | 2002-12-05 | 삼성전자 주식회사 | 강유전체막의 손상층을 제거하기 위한 세정액 및 이를이용한 세정방법 |
TWI276682B (en) * | 2001-11-16 | 2007-03-21 | Mitsubishi Chem Corp | Substrate surface cleaning liquid mediums and cleaning method |
US7481949B2 (en) | 2002-11-08 | 2009-01-27 | Wako Pure Chemical Industries, Ltd | Polishing composition and rinsing composition |
US7442675B2 (en) * | 2003-06-18 | 2008-10-28 | Tokyo Ohka Kogyo Co., Ltd. | Cleaning composition and method of cleaning semiconductor substrate |
US7101832B2 (en) | 2003-06-19 | 2006-09-05 | Johnsondiversey, Inc. | Cleaners containing peroxide bleaching agents for cleaning paper making equipment and method |
JP4471094B2 (ja) * | 2004-05-11 | 2010-06-02 | 三菱瓦斯化学株式会社 | チタンまたはチタン合金のエッチング液 |
US7939482B2 (en) * | 2005-05-25 | 2011-05-10 | Freescale Semiconductor, Inc. | Cleaning solution for a semiconductor wafer |
US7645731B1 (en) * | 2009-01-08 | 2010-01-12 | Ecolab Inc. | Use of aminocarboxylate functionalized catechols for cleaning applications |
US20190032220A1 (en) * | 2017-07-25 | 2019-01-31 | Rohm And Haas Electronic Materials Llc | Chrome-free etch solutions for chemically resistant polymer materials |
DE102021214688A1 (de) | 2021-12-20 | 2023-06-22 | Henkel Ag & Co. Kgaa | Metallkomplexe und Geschirrspülmittel, die sie enthalten |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1159462A (en) * | 1967-06-30 | 1969-07-23 | Chemolimpex | Novel Organic Chelating Compounds |
US4721532A (en) * | 1985-08-05 | 1988-01-26 | W. R. Grace & Co. | Removal of iron fouling in cooling water systems |
US4666528A (en) * | 1985-11-27 | 1987-05-19 | Halliburton Company | Method of removing iron and copper-containing scale from a metal surface |
FR2627772B1 (fr) * | 1988-02-29 | 1990-08-17 | Protex Manuf Prod Chimiq | Nouveau procede de preparation de l'acide ethylene-diamine-n-n(prime)-bis(ortho-hydroxyphenylacetique) et de derives de celui-ci |
DE69231971T2 (de) * | 1991-01-24 | 2002-04-04 | Wako Pure Chem Ind Ltd | Lösungen zur Oberflächenbehandlung von Halbleitern |
JP3075290B2 (ja) * | 1991-02-28 | 2000-08-14 | 三菱瓦斯化学株式会社 | 半導体基板の洗浄液 |
US5183573A (en) * | 1991-07-22 | 1993-02-02 | W. R. Grace & Co.-Conn. | Multipurpose scale preventer/remover |
TW274630B (de) * | 1994-01-28 | 1996-04-21 | Wako Zunyaku Kogyo Kk | |
US5466389A (en) * | 1994-04-20 | 1995-11-14 | J. T. Baker Inc. | PH adjusted nonionic surfactant-containing alkaline cleaner composition for cleaning microelectronics substrates |
US5885362A (en) | 1995-07-27 | 1999-03-23 | Mitsubishi Chemical Corporation | Method for treating surface of substrate |
JP3887846B2 (ja) * | 1996-07-04 | 2007-02-28 | 三菱化学株式会社 | 高純度エチレンジアミンジオルトヒドロキシフェニル酢酸及びそれを用いた表面処理組成物 |
-
1998
- 1998-01-23 KR KR10-1998-0002039A patent/KR100497835B1/ko not_active IP Right Cessation
- 1998-01-23 TW TW087100961A patent/TW442864B/zh not_active IP Right Cessation
- 1998-01-26 DE DE69838116T patent/DE69838116T2/de not_active Expired - Lifetime
- 1998-01-26 EP EP98101323A patent/EP0858102B1/de not_active Expired - Lifetime
- 1998-01-26 US US09/013,066 patent/US6143706A/en not_active Expired - Lifetime
-
2000
- 2000-03-10 US US09/523,144 patent/US6228179B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0858102B1 (de) | 2007-07-25 |
EP0858102A3 (de) | 2000-08-30 |
US6228179B1 (en) | 2001-05-08 |
TW442864B (en) | 2001-06-23 |
US6143706A (en) | 2000-11-07 |
DE69838116T2 (de) | 2008-04-10 |
KR100497835B1 (ko) | 2005-09-08 |
EP0858102A2 (de) | 1998-08-12 |
KR19980070759A (ko) | 1998-10-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |