DE69713855D1 - Integrierte Halbleiterspeicheranordnung und Kommunikationsverfahren dafür - Google Patents

Integrierte Halbleiterspeicheranordnung und Kommunikationsverfahren dafür

Info

Publication number
DE69713855D1
DE69713855D1 DE69713855T DE69713855T DE69713855D1 DE 69713855 D1 DE69713855 D1 DE 69713855D1 DE 69713855 T DE69713855 T DE 69713855T DE 69713855 T DE69713855 T DE 69713855T DE 69713855 D1 DE69713855 D1 DE 69713855D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
communication method
method therefor
integrated semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69713855T
Other languages
English (en)
Inventor
Robert Warren
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Ltd Great Britain
Original Assignee
STMicroelectronics Ltd Great Britain
SGS Thomson Microelectronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Ltd Great Britain, SGS Thomson Microelectronics Ltd filed Critical STMicroelectronics Ltd Great Britain
Application granted granted Critical
Publication of DE69713855D1 publication Critical patent/DE69713855D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/362Software debugging
    • G06F11/3648Software debugging using additional hardware
    • G06F11/3656Software debugging using additional hardware using a specific debug interface
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3185Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572Input/Output interfaces
DE69713855T 1996-10-31 1997-10-20 Integrierte Halbleiterspeicheranordnung und Kommunikationsverfahren dafür Expired - Lifetime DE69713855D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9622682.4A GB9622682D0 (en) 1996-10-31 1996-10-31 An integrated circuit device and method of communication therewith

Publications (1)

Publication Number Publication Date
DE69713855D1 true DE69713855D1 (de) 2002-08-14

Family

ID=10802225

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69713855T Expired - Lifetime DE69713855D1 (de) 1996-10-31 1997-10-20 Integrierte Halbleiterspeicheranordnung und Kommunikationsverfahren dafür

Country Status (5)

Country Link
US (1) US6125416A (de)
EP (1) EP0840219B1 (de)
JP (1) JP3929573B2 (de)
DE (1) DE69713855D1 (de)
GB (1) GB9622682D0 (de)

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US8069405B1 (en) 2001-11-19 2011-11-29 Cypress Semiconductor Corporation User interface for efficiently browsing an electronic document using data-driven tabs
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US20030158934A1 (en) * 2002-02-05 2003-08-21 Ben Chang Condition monitor and controller for a server system
US8103497B1 (en) 2002-03-28 2012-01-24 Cypress Semiconductor Corporation External interface for event architecture
US7308608B1 (en) 2002-05-01 2007-12-11 Cypress Semiconductor Corporation Reconfigurable testing system and method
US7761845B1 (en) 2002-09-09 2010-07-20 Cypress Semiconductor Corporation Method for parameterizing a user module
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US7295049B1 (en) 2004-03-25 2007-11-13 Cypress Semiconductor Corporation Method and circuit for rapid alignment of signals
US8286125B2 (en) 2004-08-13 2012-10-09 Cypress Semiconductor Corporation Model for a hardware device-independent method of defining embedded firmware for programmable systems
US8069436B2 (en) 2004-08-13 2011-11-29 Cypress Semiconductor Corporation Providing hardware independence to automate code generation of processing device firmware
US7332976B1 (en) 2005-02-04 2008-02-19 Cypress Semiconductor Corporation Poly-phase frequency synthesis oscillator
US7400183B1 (en) 2005-05-05 2008-07-15 Cypress Semiconductor Corporation Voltage controlled oscillator delay cell and method
US8089461B2 (en) 2005-06-23 2012-01-03 Cypress Semiconductor Corporation Touch wake for electronic devices
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US8085067B1 (en) 2005-12-21 2011-12-27 Cypress Semiconductor Corporation Differential-to-single ended signal converter circuit and method
US8067948B2 (en) 2006-03-27 2011-11-29 Cypress Semiconductor Corporation Input/output multiplexer bus
US8092083B2 (en) 2007-04-17 2012-01-10 Cypress Semiconductor Corporation Temperature sensor with digital bandgap
US7737724B2 (en) 2007-04-17 2010-06-15 Cypress Semiconductor Corporation Universal digital block interconnection and channel routing
US8516025B2 (en) 2007-04-17 2013-08-20 Cypress Semiconductor Corporation Clock driven dynamic datapath chaining
US8026739B2 (en) 2007-04-17 2011-09-27 Cypress Semiconductor Corporation System level interconnect with programmable switching
US8130025B2 (en) 2007-04-17 2012-03-06 Cypress Semiconductor Corporation Numerical band gap
US8040266B2 (en) 2007-04-17 2011-10-18 Cypress Semiconductor Corporation Programmable sigma-delta analog-to-digital converter
US9564902B2 (en) 2007-04-17 2017-02-07 Cypress Semiconductor Corporation Dynamically configurable and re-configurable data path
US8266575B1 (en) 2007-04-25 2012-09-11 Cypress Semiconductor Corporation Systems and methods for dynamically reconfiguring a programmable system on a chip
US9720805B1 (en) 2007-04-25 2017-08-01 Cypress Semiconductor Corporation System and method for controlling a target device
US8065653B1 (en) 2007-04-25 2011-11-22 Cypress Semiconductor Corporation Configuration of programmable IC design elements
US8049569B1 (en) 2007-09-05 2011-11-01 Cypress Semiconductor Corporation Circuit and method for improving the accuracy of a crystal-less oscillator having dual-frequency modes
US9448964B2 (en) 2009-05-04 2016-09-20 Cypress Semiconductor Corporation Autonomous control in a programmable system
CN109783419A (zh) * 2018-12-29 2019-05-21 安徽皖兴通信息技术有限公司 一种通信设备背板控制总线的方法
US11138134B2 (en) * 2019-05-22 2021-10-05 Nxp Usa, Inc. Non-intrusive semihosting solution for debug using direct memory access implementation-based library
CN110958224A (zh) * 2019-11-05 2020-04-03 郑州信大捷安信息技术股份有限公司 远程串口调试系统及方法
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Also Published As

Publication number Publication date
EP0840219A1 (de) 1998-05-06
GB9622682D0 (en) 1997-01-08
JPH10207732A (ja) 1998-08-07
EP0840219B1 (de) 2002-07-10
US6125416A (en) 2000-09-26
JP3929573B2 (ja) 2007-06-13

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