DE69608252D1 - Verfahren zum eichen mehrerer spektrometer - Google Patents

Verfahren zum eichen mehrerer spektrometer

Info

Publication number
DE69608252D1
DE69608252D1 DE69608252T DE69608252T DE69608252D1 DE 69608252 D1 DE69608252 D1 DE 69608252D1 DE 69608252 T DE69608252 T DE 69608252T DE 69608252 T DE69608252 T DE 69608252T DE 69608252 D1 DE69608252 D1 DE 69608252D1
Authority
DE
Germany
Prior art keywords
sample
spectrometer
pct
standardization
pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69608252T
Other languages
English (en)
Other versions
DE69608252T2 (de
Inventor
Hans Villemoes
Lisa Kjaer
Per Waaben
Carsten Ridder
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FOSS ELECTRIC A S HILLEROD
Original Assignee
FOSS ELECTRIC A S HILLEROD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FOSS ELECTRIC A S HILLEROD filed Critical FOSS ELECTRIC A S HILLEROD
Publication of DE69608252D1 publication Critical patent/DE69608252D1/de
Application granted granted Critical
Publication of DE69608252T2 publication Critical patent/DE69608252T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
DE69608252T 1995-02-09 1996-02-09 Verfahren zum eichen mehrerer spektrometer Expired - Lifetime DE69608252T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DK15395 1995-02-09
DK85395 1995-07-21
PCT/DK1996/000068 WO1996024832A1 (en) 1995-02-09 1996-02-09 A method for standardizing a spectrometer

Publications (2)

Publication Number Publication Date
DE69608252D1 true DE69608252D1 (de) 2000-06-15
DE69608252T2 DE69608252T2 (de) 2000-11-02

Family

ID=26063412

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69608252T Expired - Lifetime DE69608252T2 (de) 1995-02-09 1996-02-09 Verfahren zum eichen mehrerer spektrometer

Country Status (13)

Country Link
US (1) US5933792A (de)
EP (1) EP0808450B1 (de)
JP (1) JP3694029B2 (de)
KR (1) KR100358476B1 (de)
AT (1) ATE192850T1 (de)
AU (1) AU709619B2 (de)
CA (1) CA2212358C (de)
DE (1) DE69608252T2 (de)
DK (1) DK0808450T3 (de)
ES (1) ES2145426T3 (de)
NZ (1) NZ300915A (de)
PL (1) PL181965B1 (de)
WO (1) WO1996024832A1 (de)

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Also Published As

Publication number Publication date
CA2212358A1 (en) 1996-08-15
US5933792A (en) 1999-08-03
AU4619696A (en) 1996-08-27
EP0808450A1 (de) 1997-11-26
CA2212358C (en) 2003-05-20
JPH10513560A (ja) 1998-12-22
NZ300915A (en) 1998-12-23
ATE192850T1 (de) 2000-05-15
KR100358476B1 (ko) 2003-04-11
AU709619B2 (en) 1999-09-02
DK0808450T3 (da) 2000-09-25
DE69608252T2 (de) 2000-11-02
EP0808450B1 (de) 2000-05-10
JP3694029B2 (ja) 2005-09-14
PL181965B1 (pl) 2001-10-31
KR19980702083A (ko) 1998-07-15
ES2145426T3 (es) 2000-07-01
WO1996024832A1 (en) 1996-08-15
PL321809A1 (en) 1997-12-22

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