DE69410959D1 - Festkörperstrahlungsdetektortafel mit matrixförmig angeordneten, lichtempfindlichen Detektoren, so angeordnet, dass Kanteneffekte zwischen den Elementen minimiert werden - Google Patents

Festkörperstrahlungsdetektortafel mit matrixförmig angeordneten, lichtempfindlichen Detektoren, so angeordnet, dass Kanteneffekte zwischen den Elementen minimiert werden

Info

Publication number
DE69410959D1
DE69410959D1 DE69410959T DE69410959T DE69410959D1 DE 69410959 D1 DE69410959 D1 DE 69410959D1 DE 69410959 T DE69410959 T DE 69410959T DE 69410959 T DE69410959 T DE 69410959T DE 69410959 D1 DE69410959 D1 DE 69410959D1
Authority
DE
Germany
Prior art keywords
minimized
matrix
solid
elements
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69410959T
Other languages
English (en)
Other versions
DE69410959T2 (de
Inventor
Nang T Tran
Joseph Y Pai
Choon-Woo Kim
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GlassBridge Enterprises Inc
Original Assignee
Imation Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imation Corp filed Critical Imation Corp
Application granted granted Critical
Publication of DE69410959D1 publication Critical patent/DE69410959D1/de
Publication of DE69410959T2 publication Critical patent/DE69410959T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • G01T1/2019—Shielding against direct hits
DE69410959T 1993-12-06 1994-12-02 Festkörperstrahlungsdetektortafel mit matrixförmig angeordneten, lichtempfindlichen Detektoren, so angeordnet, dass Kanteneffekte zwischen den Elementen minimiert werden Expired - Fee Related DE69410959T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/163,147 US5436458A (en) 1993-12-06 1993-12-06 Solid state radiation detection panel having tiled photosensitive detectors arranged to minimize edge effects between tiles

Publications (2)

Publication Number Publication Date
DE69410959D1 true DE69410959D1 (de) 1998-07-16
DE69410959T2 DE69410959T2 (de) 1999-01-14

Family

ID=22588691

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69410959T Expired - Fee Related DE69410959T2 (de) 1993-12-06 1994-12-02 Festkörperstrahlungsdetektortafel mit matrixförmig angeordneten, lichtempfindlichen Detektoren, so angeordnet, dass Kanteneffekte zwischen den Elementen minimiert werden

Country Status (5)

Country Link
US (2) US5436458A (de)
EP (1) EP0657938B1 (de)
JP (1) JPH07209430A (de)
CA (1) CA2135363A1 (de)
DE (1) DE69410959T2 (de)

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WO2004029657A1 (ja) * 2002-09-26 2004-04-08 Kabushiki Kaisha Toshiba 放射線検出器用蛍光体シートおよびそれを用いた放射線検出器と放射線検査装置
AU2003288652A1 (en) * 2003-01-06 2004-07-29 Koninklijke Philips Electronics N.V. Radiation detector with shielded electronics for computed tomography
JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
JP4541299B2 (ja) * 2003-05-23 2010-09-08 浜松ホトニクス株式会社 光検出装置
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US8586932B2 (en) 2004-11-09 2013-11-19 Spectrum Dynamics Llc System and method for radioactive emission measurement
US9470801B2 (en) 2004-01-13 2016-10-18 Spectrum Dynamics Llc Gating with anatomically varying durations
US8571881B2 (en) 2004-11-09 2013-10-29 Spectrum Dynamics, Llc Radiopharmaceutical dispensing, administration, and imaging
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EP1778957A4 (de) 2004-06-01 2015-12-23 Biosensors Int Group Ltd Optimierung der messung radioaktiver strahlung an besonderen körperstrukturen
EP1815270A2 (de) * 2004-07-14 2007-08-08 Orbotech Medical Solutions Ltd. Strahlungsdetektor-kopf
US8000773B2 (en) 2004-11-09 2011-08-16 Spectrum Dynamics Llc Radioimaging
US8615405B2 (en) 2004-11-09 2013-12-24 Biosensors International Group, Ltd. Imaging system customization using data from radiopharmaceutical-associated data carrier
US9316743B2 (en) 2004-11-09 2016-04-19 Biosensors International Group, Ltd. System and method for radioactive emission measurement
US9943274B2 (en) 2004-11-09 2018-04-17 Spectrum Dynamics Medical Limited Radioimaging using low dose isotope
EP1827505A4 (de) 2004-11-09 2017-07-12 Biosensors International Group, Ltd. Radiodarstellung
US8837793B2 (en) 2005-07-19 2014-09-16 Biosensors International Group, Ltd. Reconstruction stabilizer and active vision
US8644910B2 (en) 2005-07-19 2014-02-04 Biosensors International Group, Ltd. Imaging protocols
US7745798B2 (en) * 2005-11-15 2010-06-29 Fujifilm Corporation Dual-phosphor flat panel radiation detector
US8894974B2 (en) 2006-05-11 2014-11-25 Spectrum Dynamics Llc Radiopharmaceuticals for diagnosis and therapy
US8492762B2 (en) 2006-06-27 2013-07-23 General Electric Company Electrical interface for a sensor array
US8610075B2 (en) 2006-11-13 2013-12-17 Biosensors International Group Ltd. Radioimaging applications of and novel formulations of teboroxime
WO2008075362A2 (en) 2006-12-20 2008-06-26 Spectrum Dynamics Llc A method, a system, and an apparatus for using and processing multidimensional data
US8521253B2 (en) 2007-10-29 2013-08-27 Spectrum Dynamics Llc Prostate imaging
JP5101402B2 (ja) 2008-06-18 2012-12-19 浜松ホトニクス株式会社 固体撮像装置
JP5376897B2 (ja) * 2008-10-24 2013-12-25 富士フイルム株式会社 放射線画像撮影装置
RU2510520C2 (ru) * 2008-11-21 2014-03-27 Трикселль Способ сборки ячеистого радиационного детектора
US8117741B2 (en) 2009-04-07 2012-02-21 Oy Ajat Ltd Method for manufacturing a radiation imaging panel comprising imaging tiles
US8338788B2 (en) 2009-07-29 2012-12-25 Spectrum Dynamics Llc Method and system of optimized volumetric imaging
EP2700094B1 (de) * 2011-04-19 2017-06-07 Teledyne Rad-icon Imaging Corp. Verfahren für direktes silicium-tiling einer unterteilten bildsensoranordnung
JP6305710B2 (ja) * 2013-08-30 2018-04-04 キヤノンメディカルシステムズ株式会社 検出器モジュール製造方法
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Also Published As

Publication number Publication date
DE69410959T2 (de) 1999-01-14
CA2135363A1 (en) 1995-06-07
EP0657938A1 (de) 1995-06-14
JPH07209430A (ja) 1995-08-11
US5436458A (en) 1995-07-25
US5545899A (en) 1996-08-13
EP0657938B1 (de) 1998-06-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee