DE69125136D1 - Messonde - Google Patents

Messonde

Info

Publication number
DE69125136D1
DE69125136D1 DE69125136T DE69125136T DE69125136D1 DE 69125136 D1 DE69125136 D1 DE 69125136D1 DE 69125136 T DE69125136 T DE 69125136T DE 69125136 T DE69125136 T DE 69125136T DE 69125136 D1 DE69125136 D1 DE 69125136D1
Authority
DE
Germany
Prior art keywords
measuring probe
probe
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69125136T
Other languages
English (en)
Other versions
DE69125136T2 (de
Inventor
Monty Smith
Julie A Campbell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Inc
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Publication of DE69125136D1 publication Critical patent/DE69125136D1/de
Application granted granted Critical
Publication of DE69125136T2 publication Critical patent/DE69125136T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
DE69125136T 1991-01-29 1991-12-06 Messonde Expired - Fee Related DE69125136T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/647,315 US5136237A (en) 1991-01-29 1991-01-29 Double insulated floating high voltage test probe

Publications (2)

Publication Number Publication Date
DE69125136D1 true DE69125136D1 (de) 1997-04-17
DE69125136T2 DE69125136T2 (de) 1997-10-09

Family

ID=24596477

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69125136T Expired - Fee Related DE69125136T2 (de) 1991-01-29 1991-12-06 Messonde

Country Status (4)

Country Link
US (1) US5136237A (de)
EP (1) EP0496984B1 (de)
JP (1) JPH087231B2 (de)
DE (1) DE69125136T2 (de)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5338213A (en) * 1993-02-01 1994-08-16 Hubbell Incorporated Submersible pump pothead test plug
US6028423A (en) * 1997-12-11 2000-02-22 Sanchez; Jorge Isolation instrument for electrical testing
US5729150A (en) 1995-12-01 1998-03-17 Cascade Microtech, Inc. Low-current probe card with reduced triboelectric current generating cables
US5717328A (en) * 1996-07-10 1998-02-10 Hewlett-Packard Company Method and apparatus for using a miniature probe as a hand held probe
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6034533A (en) 1997-06-10 2000-03-07 Tervo; Paul A. Low-current pogo probe card
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
AU2398800A (en) * 1998-12-30 2000-07-31 Proteus Corporation Dual-pin probe for testing circuit boards
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6255834B1 (en) 1999-10-21 2001-07-03 Dell Usa, L.P. Test fixture having a floating self-centering connector
US6466044B1 (en) 1999-10-21 2002-10-15 Dell Products L.P. Through connector circuit test apparatus
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6605934B1 (en) * 2000-07-31 2003-08-12 Lecroy Corporation Cartridge system for a probing head for an electrical test probe
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech Inc Wafersonde
WO2003052435A1 (en) 2001-08-21 2003-06-26 Cascade Microtech, Inc. Membrane probing system
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
KR100449204B1 (ko) * 2002-11-25 2004-09-18 리노공업주식회사 고주파용 프로브의 에어 인터페이스 장치
ATE424640T1 (de) 2003-01-08 2009-03-15 Tecey Software Dev Kg Llc Vorrichtung und verfahren zur messung dynamischer lasersignale
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
JP2007517231A (ja) 2003-12-24 2007-06-28 カスケード マイクロテック インコーポレイテッド アクティブ・ウェハプローブ
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US20060267608A1 (en) * 2005-05-18 2006-11-30 Robert Faust Adaptive test meter probe system and method of operation
JP4231038B2 (ja) * 2005-08-22 2009-02-25 株式会社ケーヒン 高電圧測定装置
US7294995B1 (en) * 2006-05-08 2007-11-13 Tektronix, Inc. Current probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
CN102004173B (zh) * 2009-09-01 2014-02-19 鸿富锦精密工业（深圳）有限公司 探针
US9049351B2 (en) * 2010-05-03 2015-06-02 Inspectron, Inc. Insulator design for video inspection devices
TW201248178A (en) * 2011-05-23 2012-12-01 Hon Hai Prec Ind Co Ltd Apparatus for calibrating probes
TW201248157A (en) * 2011-05-24 2012-12-01 Hon Hai Prec Ind Co Ltd Apparatus for measurement probes
US9575091B2 (en) * 2013-03-15 2017-02-21 Kenneth Mark Reeder, III Testing device for electrical safety using wireless communication
US9188606B2 (en) 2013-04-29 2015-11-17 Keysight Technologies, Inc. Oscilloscope current probe with interchangeable range and sensitivity setting modules
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
DE102019109129A1 (de) * 2019-04-08 2020-10-08 Lisa Dräxlmaier GmbH Kontaktstift für eine Prüfvorrichtung zum Überprüfen eines elektrischen Kontakts und Prüfvorrichtung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4209742A (en) * 1976-10-13 1980-06-24 Tektronix, Inc. Modular probe system
JPS57151114A (en) * 1981-03-12 1982-09-18 Mitsubishi Electric Corp Resistance welding machine
JPS57207865A (en) * 1981-06-17 1982-12-20 Hitachi Ltd Measuring terminal
GB2125236A (en) * 1982-08-11 1984-02-29 Tektronix Inc Stress-isolating electrical connections
US4764722A (en) * 1985-10-28 1988-08-16 International Business Machines Corporation Coaxial probe

Also Published As

Publication number Publication date
EP0496984A3 (en) 1993-06-02
JPH0682480A (ja) 1994-03-22
JPH087231B2 (ja) 1996-01-29
EP0496984A2 (de) 1992-08-05
EP0496984B1 (de) 1997-03-12
DE69125136T2 (de) 1997-10-09
US5136237A (en) 1992-08-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee