DE69121633T2 - Verfahren und Apparat zur Messung spektraler Absorption in undurchsichtigem Material und Verfahren und Apparat zur Messung einer Verteilung mikroskopischer Absorption - Google Patents

Verfahren und Apparat zur Messung spektraler Absorption in undurchsichtigem Material und Verfahren und Apparat zur Messung einer Verteilung mikroskopischer Absorption

Info

Publication number
DE69121633T2
DE69121633T2 DE69121633T DE69121633T DE69121633T2 DE 69121633 T2 DE69121633 T2 DE 69121633T2 DE 69121633 T DE69121633 T DE 69121633T DE 69121633 T DE69121633 T DE 69121633T DE 69121633 T2 DE69121633 T2 DE 69121633T2
Authority
DE
Germany
Prior art keywords
measuring
absorption
distribution
opaque material
microscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69121633T
Other languages
English (en)
Other versions
DE69121633D1 (de
Inventor
Tsutomu Ichimura
Fumio Inaba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
Original Assignee
Research Development Corp of Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2133067A external-priority patent/JPH0721451B2/ja
Priority claimed from JP2133066A external-priority patent/JPH0721452B2/ja
Application filed by Research Development Corp of Japan filed Critical Research Development Corp of Japan
Publication of DE69121633D1 publication Critical patent/DE69121633D1/de
Application granted granted Critical
Publication of DE69121633T2 publication Critical patent/DE69121633T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1738—Optionally different kinds of measurements; Method being valid for different kinds of measurement
    • G01N2021/1742—Optionally different kinds of measurements; Method being valid for different kinds of measurement either absorption or reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
    • G01N2021/451—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods for determining the optical absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4707—Forward scatter; Low angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
DE69121633T 1990-05-22 1991-05-21 Verfahren und Apparat zur Messung spektraler Absorption in undurchsichtigem Material und Verfahren und Apparat zur Messung einer Verteilung mikroskopischer Absorption Expired - Fee Related DE69121633T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2133067A JPH0721451B2 (ja) 1990-05-22 1990-05-22 不透明試料の顕微吸収分布測定装置
JP2133066A JPH0721452B2 (ja) 1990-05-22 1990-05-22 不透明試料の分光吸収測定装置

Publications (2)

Publication Number Publication Date
DE69121633D1 DE69121633D1 (de) 1996-10-02
DE69121633T2 true DE69121633T2 (de) 1997-01-16

Family

ID=26467506

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69121633T Expired - Fee Related DE69121633T2 (de) 1990-05-22 1991-05-21 Verfahren und Apparat zur Messung spektraler Absorption in undurchsichtigem Material und Verfahren und Apparat zur Messung einer Verteilung mikroskopischer Absorption

Country Status (3)

Country Link
US (1) US5345306A (de)
EP (1) EP0458601B1 (de)
DE (1) DE69121633T2 (de)

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DE69333642T2 (de) * 1992-07-31 2005-10-06 Fuji Photo Film Co., Ltd., Minami-Ashigara Verfahren und Vorrichtung zur Gewinnung dreidimensionaler Information von Proben
US5416582A (en) * 1993-02-11 1995-05-16 The United States Of America As Represented By The Department Of Health And Human Services Method and apparatus for localization and spectroscopy of objects using optical frequency modulation of diffusion waves
US6104945A (en) * 1995-08-01 2000-08-15 Medispectra, Inc. Spectral volume microprobe arrays
US5713364A (en) * 1995-08-01 1998-02-03 Medispectra, Inc. Spectral volume microprobe analysis of materials
US5813987A (en) * 1995-08-01 1998-09-29 Medispectra, Inc. Spectral volume microprobe for analysis of materials
DE19548036C2 (de) * 1995-12-21 1999-09-09 Wagner Gmbh J Verfahren und Vorrichtung zum zerstörungsfreien Prüfen von Werkstücken
AU5547798A (en) * 1996-11-15 1998-06-10 Optosens Optische Spektroskopie Und Sensortechnik Gmbh Method and device for combined absorption and reflectance spectroscopy
US6826422B1 (en) 1997-01-13 2004-11-30 Medispectra, Inc. Spectral volume microprobe arrays
US6091984A (en) 1997-10-10 2000-07-18 Massachusetts Institute Of Technology Measuring tissue morphology
JP4438111B2 (ja) * 1998-07-02 2010-03-24 ソニー株式会社 計測装置及び計測方法
FI982005A (fi) * 1998-09-17 2000-03-18 Wallac Oy Näytteiden kuvantamislaite
CA2356623C (en) 1998-12-23 2005-10-18 Medispectra, Inc. Systems and methods for optical examination of samples
US6404497B1 (en) 1999-01-25 2002-06-11 Massachusetts Institute Of Technology Polarized light scattering spectroscopy of tissue
US6902935B2 (en) 1999-12-15 2005-06-07 Medispectra, Inc. Methods of monitoring effects of chemical agents on a sample
DE10056382B4 (de) * 2000-11-14 2004-07-01 Leica Microsystems Heidelberg Gmbh Scanmikroskop
US6839661B2 (en) 2000-12-15 2005-01-04 Medispectra, Inc. System for normalizing spectra
US7116862B1 (en) * 2000-12-22 2006-10-03 Cheetah Omni, Llc Apparatus and method for providing gain equalization
US7145704B1 (en) 2003-11-25 2006-12-05 Cheetah Omni, Llc Optical logic gate based optical router
EP1245946B1 (de) * 2001-03-28 2004-09-29 Agilent Technologies Inc. a Delaware Corporation Verbesserte Vorrichtung und Verfahren für Extinktionsbestimmungen
SE0200782D0 (sv) 2002-03-14 2002-03-14 Astrazeneca Ab Method of analysing a pharmaceutical sample
US6818903B2 (en) 2002-07-09 2004-11-16 Medispectra, Inc. Method and apparatus for identifying spectral artifacts
US7103401B2 (en) 2002-07-10 2006-09-05 Medispectra, Inc. Colonic polyp discrimination by tissue fluorescence and fiberoptic probe
US6768918B2 (en) 2002-07-10 2004-07-27 Medispectra, Inc. Fluorescent fiberoptic probe for tissue health discrimination and method of use thereof
US8634067B2 (en) * 2004-05-12 2014-01-21 Beth Israel Deaconess Medical Center, Inc. Method and apparatus for detecting microscopic objects
DE602005021857D1 (de) * 2005-04-20 2010-07-29 Honeywell Analytics Ag Verfahren und Vorrichtung zur Detektion von Gas
WO2010008789A2 (en) * 2008-06-23 2010-01-21 University Of South Florida Interferometric chemical sensor array
CN102499647B (zh) * 2011-11-14 2013-11-27 重庆大学 一种多模式低相干散射光谱仪
US9291500B2 (en) * 2014-01-29 2016-03-22 Raytheon Company Configurable combination spectrometer and polarizer
US9295420B2 (en) * 2014-01-29 2016-03-29 Hong Kong Applied Science and Technology Research Institute Company Limited Transmission-reflectance swappable Raman probe for physiological detections
US9335265B2 (en) * 2014-02-07 2016-05-10 Agilent Technologies, Inc. Spectrographic system utilizing a chirped, pulsed optical source
GB201612010D0 (en) * 2016-07-11 2016-08-24 Ge Healthcare A method and a measuring device for measuring the absorbance of a substance in a solution
EP3333567A1 (de) * 2016-12-07 2018-06-13 Institut National Polytechnique de Toulouse Verfahren und vorrichtung zur messung der kollimierten transmittanz eines halbtransparenten körpers
EP3421974A1 (de) * 2017-06-29 2019-01-02 Siemens Aktiengesellschaft Vorrichtung und verfahren zur detektion von partikeln
CN108318890A (zh) * 2018-01-04 2018-07-24 西安理工大学 一种采用白光led作光源的气溶胶探测雷达系统
US10976236B2 (en) * 2019-03-21 2021-04-13 Becton, Dickinson And Company Light detection systems and methods of use thereof
CN110044415B (zh) * 2019-04-19 2020-12-11 北京理工大学 错位差动共焦干涉元件多参数测量方法与装置
CN110044414B (zh) * 2019-04-19 2020-12-11 北京理工大学 横向相减差动共焦干涉元件多参数测量方法与装置
CN109991191B (zh) * 2019-04-19 2020-12-11 北京理工大学 双边错位差动共焦透镜折射率测量方法
CN109991190B (zh) * 2019-04-19 2020-08-11 北京理工大学 横向相减差动共焦透镜折射率测量方法
EP3825678A1 (de) * 2019-11-22 2021-05-26 Ams Ag Vorrichtung und verfahren zur detektion von objekten
CN114280694B (zh) * 2021-12-17 2023-05-05 南京信息工程大学 一种基于气象卫星光谱成像仪的快速辐射传输方法及系统

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GB1383639A (en) * 1970-10-27 1974-02-12 Beckman Riic Ltd Interference spectoscopy
JPS60258513A (ja) * 1984-06-05 1985-12-20 Olympus Optical Co Ltd 測光顕微鏡システム
US4652755A (en) * 1985-01-10 1987-03-24 Advanced Fuel Research, Inc. Method and apparatus for analyzing particle-containing gaseous suspensions
GB2191855A (en) * 1986-05-07 1987-12-23 Univ London Method and apparatus for detecting reflection sites
FR2617601B1 (fr) * 1987-07-03 1989-10-20 Thomson Csf Systeme d'imagerie par transillumination utilisant les proprietes d'antenne de la detection heterodyne
ATE158659T1 (de) * 1988-07-13 1997-10-15 Optiscan Pty Ltd Confokales abtast-endoskop

Also Published As

Publication number Publication date
DE69121633D1 (de) 1996-10-02
EP0458601A1 (de) 1991-11-27
US5345306A (en) 1994-09-06
EP0458601B1 (de) 1996-08-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: JAPAN SCIENCE AND TECHNOLOGY CORP., KAWAGUCHI, SAI

8327 Change in the person/name/address of the patent owner

Owner name: JAPAN SCIENCE AND TECHNOLOGY CORP., KAWAGUCHI, SAI

8328 Change in the person/name/address of the agent

Representative=s name: KUECHLER, S., DIPL.-ING.UNIV., PAT.-ANW., 90411 NUERNBERG

8339 Ceased/non-payment of the annual fee