DE69120931T2 - Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf - Google Patents

Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf

Info

Publication number
DE69120931T2
DE69120931T2 DE69120931T DE69120931T DE69120931T2 DE 69120931 T2 DE69120931 T2 DE 69120931T2 DE 69120931 T DE69120931 T DE 69120931T DE 69120931 T DE69120931 T DE 69120931T DE 69120931 T2 DE69120931 T2 DE 69120931T2
Authority
DE
Germany
Prior art keywords
circuit
redundancy
examination
series circuit
vlsi design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69120931T
Other languages
English (en)
Other versions
DE69120931D1 (de
Inventor
Chen Wang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Samsung Semiconductor Inc
Original Assignee
Samsung Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Semiconductor Inc filed Critical Samsung Semiconductor Inc
Publication of DE69120931D1 publication Critical patent/DE69120931D1/de
Application granted granted Critical
Publication of DE69120931T2 publication Critical patent/DE69120931T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/74—Testing of fuses
DE69120931T 1990-09-13 1991-05-16 Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf Expired - Fee Related DE69120931T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/582,455 US5051691A (en) 1990-09-13 1990-09-13 Zero power dissipation laser fuse signature circuit for redundancy in vlsi design
PCT/US1991/003435 WO1992005452A1 (en) 1990-09-13 1991-05-16 A zero power dissipation laser fuse signature circuit for redundancy in vlsi design

Publications (2)

Publication Number Publication Date
DE69120931D1 DE69120931D1 (de) 1996-08-22
DE69120931T2 true DE69120931T2 (de) 1997-02-13

Family

ID=24329223

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69120931T Expired - Fee Related DE69120931T2 (de) 1990-09-13 1991-05-16 Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf

Country Status (7)

Country Link
US (1) US5051691A (de)
EP (1) EP0505511B1 (de)
JP (1) JP2527871B2 (de)
KR (1) KR970010627B1 (de)
AT (1) ATE140543T1 (de)
DE (1) DE69120931T2 (de)
WO (1) WO1992005452A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5506499A (en) * 1995-06-05 1996-04-09 Neomagic Corp. Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad
KR0149259B1 (ko) * 1995-06-30 1998-10-15 김광호 반도체 메모리 장치의 퓨즈 시그너쳐 회로
US5731734A (en) * 1996-10-07 1998-03-24 Atmel Corporation Zero power fuse circuit
KR19990053744A (ko) * 1997-12-24 1999-07-15 김영환 반도체 소자의 게이트전극 형성방법
US6424161B2 (en) * 1998-09-03 2002-07-23 Micron Technology, Inc. Apparatus and method for testing fuses
US6262919B1 (en) * 2000-04-05 2001-07-17 Elite Semiconductor Memory Technology Inc. Pin to pin laser signature circuit
US6492706B1 (en) 2000-12-13 2002-12-10 Cypress Semiconductor Corp. Programmable pin flag
JP2003152087A (ja) * 2001-11-15 2003-05-23 Mitsubishi Electric Corp 半導体集積回路のレーザトリミングヒューズ検出装置およびその方法
CN103499767A (zh) * 2013-10-21 2014-01-08 刘海先 一种电子仪表输入保险丝监视装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4701695A (en) * 1983-12-22 1987-10-20 Monolithic Memories, Inc. Short detector for PROMS
US4837520A (en) * 1985-03-29 1989-06-06 Honeywell Inc. Fuse status detection circuit
US4698589A (en) * 1986-03-21 1987-10-06 Harris Corporation Test circuitry for testing fuse link programmable memory devices

Also Published As

Publication number Publication date
US5051691A (en) 1991-09-24
EP0505511B1 (de) 1996-07-17
EP0505511A4 (en) 1993-02-03
DE69120931D1 (de) 1996-08-22
ATE140543T1 (de) 1996-08-15
KR970010627B1 (ko) 1997-06-28
JPH05503159A (ja) 1993-05-27
EP0505511A1 (de) 1992-09-30
KR920702499A (ko) 1992-09-04
JP2527871B2 (ja) 1996-08-28
WO1992005452A1 (en) 1992-04-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee