DE69120931T2 - Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf - Google Patents
Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurfInfo
- Publication number
- DE69120931T2 DE69120931T2 DE69120931T DE69120931T DE69120931T2 DE 69120931 T2 DE69120931 T2 DE 69120931T2 DE 69120931 T DE69120931 T DE 69120931T DE 69120931 T DE69120931 T DE 69120931T DE 69120931 T2 DE69120931 T2 DE 69120931T2
- Authority
- DE
- Germany
- Prior art keywords
- circuit
- redundancy
- examination
- series circuit
- vlsi design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/74—Testing of fuses
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/582,455 US5051691A (en) | 1990-09-13 | 1990-09-13 | Zero power dissipation laser fuse signature circuit for redundancy in vlsi design |
PCT/US1991/003435 WO1992005452A1 (en) | 1990-09-13 | 1991-05-16 | A zero power dissipation laser fuse signature circuit for redundancy in vlsi design |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69120931D1 DE69120931D1 (de) | 1996-08-22 |
DE69120931T2 true DE69120931T2 (de) | 1997-02-13 |
Family
ID=24329223
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69120931T Expired - Fee Related DE69120931T2 (de) | 1990-09-13 | 1991-05-16 | Leistungsfreie schaltung zur untersuchung von lasersicherungen zur redundanz beim vlsi-entwurf |
Country Status (7)
Country | Link |
---|---|
US (1) | US5051691A (de) |
EP (1) | EP0505511B1 (de) |
JP (1) | JP2527871B2 (de) |
KR (1) | KR970010627B1 (de) |
AT (1) | ATE140543T1 (de) |
DE (1) | DE69120931T2 (de) |
WO (1) | WO1992005452A1 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5506499A (en) * | 1995-06-05 | 1996-04-09 | Neomagic Corp. | Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad |
KR0149259B1 (ko) * | 1995-06-30 | 1998-10-15 | 김광호 | 반도체 메모리 장치의 퓨즈 시그너쳐 회로 |
US5731734A (en) * | 1996-10-07 | 1998-03-24 | Atmel Corporation | Zero power fuse circuit |
KR19990053744A (ko) * | 1997-12-24 | 1999-07-15 | 김영환 | 반도체 소자의 게이트전극 형성방법 |
US6424161B2 (en) * | 1998-09-03 | 2002-07-23 | Micron Technology, Inc. | Apparatus and method for testing fuses |
US6262919B1 (en) * | 2000-04-05 | 2001-07-17 | Elite Semiconductor Memory Technology Inc. | Pin to pin laser signature circuit |
US6492706B1 (en) | 2000-12-13 | 2002-12-10 | Cypress Semiconductor Corp. | Programmable pin flag |
JP2003152087A (ja) * | 2001-11-15 | 2003-05-23 | Mitsubishi Electric Corp | 半導体集積回路のレーザトリミングヒューズ検出装置およびその方法 |
CN103499767A (zh) * | 2013-10-21 | 2014-01-08 | 刘海先 | 一种电子仪表输入保险丝监视装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4701695A (en) * | 1983-12-22 | 1987-10-20 | Monolithic Memories, Inc. | Short detector for PROMS |
US4837520A (en) * | 1985-03-29 | 1989-06-06 | Honeywell Inc. | Fuse status detection circuit |
US4698589A (en) * | 1986-03-21 | 1987-10-06 | Harris Corporation | Test circuitry for testing fuse link programmable memory devices |
-
1990
- 1990-09-13 US US07/582,455 patent/US5051691A/en not_active Expired - Lifetime
-
1991
- 1991-05-16 EP EP91910582A patent/EP0505511B1/de not_active Expired - Lifetime
- 1991-05-16 DE DE69120931T patent/DE69120931T2/de not_active Expired - Fee Related
- 1991-05-16 AT AT91910582T patent/ATE140543T1/de not_active IP Right Cessation
- 1991-05-16 KR KR1019920701120A patent/KR970010627B1/ko not_active IP Right Cessation
- 1991-05-16 WO PCT/US1991/003435 patent/WO1992005452A1/en active IP Right Grant
- 1991-05-16 JP JP3510224A patent/JP2527871B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69120931D1 (de) | 1996-08-22 |
KR920702499A (ko) | 1992-09-04 |
EP0505511B1 (de) | 1996-07-17 |
WO1992005452A1 (en) | 1992-04-02 |
JPH05503159A (ja) | 1993-05-27 |
KR970010627B1 (ko) | 1997-06-28 |
US5051691A (en) | 1991-09-24 |
ATE140543T1 (de) | 1996-08-15 |
JP2527871B2 (ja) | 1996-08-28 |
EP0505511A4 (en) | 1993-02-03 |
EP0505511A1 (de) | 1992-09-30 |
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GB1304173A (de) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |