DE69024255D1 - Defektprüfvorrichtung für scheibenförmigen Datenaufzeichnungsträger - Google Patents

Defektprüfvorrichtung für scheibenförmigen Datenaufzeichnungsträger

Info

Publication number
DE69024255D1
DE69024255D1 DE69024255T DE69024255T DE69024255D1 DE 69024255 D1 DE69024255 D1 DE 69024255D1 DE 69024255 T DE69024255 T DE 69024255T DE 69024255 T DE69024255 T DE 69024255T DE 69024255 D1 DE69024255 D1 DE 69024255D1
Authority
DE
Germany
Prior art keywords
disc
test device
data recording
recording media
shaped data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69024255T
Other languages
English (en)
Other versions
DE69024255T2 (de
Inventor
Yuuji Shimote
Mitsuo Fukuda
Masafumi Ototake
Koji Shindo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2102031A external-priority patent/JP2531293B2/ja
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Application granted granted Critical
Publication of DE69024255D1 publication Critical patent/DE69024255D1/de
Publication of DE69024255T2 publication Critical patent/DE69024255T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
    • G01R33/1207—Testing individual magnetic storage devices, e.g. records carriers or digital storage elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B27/00—Editing; Indexing; Addressing; Timing or synchronising; Monitoring; Measuring tape travel
    • G11B27/36—Monitoring, i.e. supervising the progress of recording or reproducing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/002—Recording, reproducing or erasing systems characterised by the shape or form of the carrier
    • G11B7/0037—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs
    • G11B7/00375—Recording, reproducing or erasing systems characterised by the shape or form of the carrier with discs arrangements for detection of physical defects, e.g. of recording layer

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Optical Recording Or Reproduction (AREA)
DE69024255T 1989-05-11 1990-05-09 Defektprüfvorrichtung für scheibenförmigen Datenaufzeichnungsträger Expired - Fee Related DE69024255T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11791189 1989-05-11
JP12930489 1989-05-23
JP2102031A JP2531293B2 (ja) 1989-05-11 1990-04-17 円盤状情報記録媒体の欠陥検査装置

Publications (2)

Publication Number Publication Date
DE69024255D1 true DE69024255D1 (de) 1996-02-01
DE69024255T2 DE69024255T2 (de) 1996-05-15

Family

ID=27309605

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69024255T Expired - Fee Related DE69024255T2 (de) 1989-05-11 1990-05-09 Defektprüfvorrichtung für scheibenförmigen Datenaufzeichnungsträger

Country Status (3)

Country Link
US (1) US5212677A (de)
EP (1) EP0397126B1 (de)
DE (1) DE69024255T2 (de)

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JP3210680B2 (ja) * 1990-12-18 2001-09-17 パイオニア株式会社 情報再生装置
JP3067349B2 (ja) * 1991-12-02 2000-07-17 ソニー株式会社 ディスク状記録媒体のアドレス情報検出装置
US5485444A (en) * 1991-06-07 1996-01-16 Deustsche Thomson-Brandt Gmbh Signalization of types of defects of an optical information carrier
JP2625609B2 (ja) * 1991-07-10 1997-07-02 インターナショナル・ビジネス・マシーンズ・コーポレイション ディスク記憶装置
JP3021880B2 (ja) * 1991-12-06 2000-03-15 ソニー株式会社 磁気ディスク記録媒体のアドレスマーク検出装置
US5434838A (en) * 1991-12-05 1995-07-18 Fuji Photo Film Co., Ltd. Data recording apparatus and method with verification of optical disc
EP0564916B1 (de) * 1992-04-10 2001-07-25 Wea Manufacturing Inc. Compact-Disc-Analysevorrichtung
US5812506A (en) * 1992-04-10 1998-09-22 Wea Manufacturing, Inc. System and methods for measuring and correcting for overshoot in a high frequency (HF) signal generated by a compact disc player during testing of a compact disc
JP3257027B2 (ja) * 1992-04-17 2002-02-18 ソニー株式会社 自己診断情報の記録機構を有する情報記録再生装置
US6088176A (en) * 1993-04-30 2000-07-11 International Business Machines Corporation Method and apparatus for separating magnetic and thermal components from an MR read signal
JPH08297928A (ja) * 1995-04-26 1996-11-12 Toshiba Corp 記録媒体の検査機能を有する磁気ディスク装置
SE504324C2 (sv) * 1995-11-27 1997-01-13 M2 Engineering Ab Förfaringssätt för automatisk avsyning av cirkulära informationsbärare
US5872676A (en) * 1996-01-02 1999-02-16 International Business Machines Corporation Method and apparatus for positioning a dual element magnetoresistive head using thermal signals
US5739972A (en) 1996-01-02 1998-04-14 Ibm Method and apparatus for positioning a magnetoresistive head using thermal response to servo information on the record medium
US5751510A (en) * 1996-01-02 1998-05-12 International Business Machines Corporation Method and apparatus for restoring a thermal response signal of a magnetoresistive head
KR100223632B1 (ko) * 1996-10-30 1999-10-15 윤종용 헤드 디스크 어셈블리 테스트공정의 수율향상을 위한 자동화시스템 및 그 운용방법
KR100208383B1 (ko) 1997-06-03 1999-07-15 윤종용 하드 디스크 드라이브의 용량변환 생산방법
US6239936B1 (en) 1997-08-19 2001-05-29 International Business Machines Corporation Method and apparatus for calibrating a thermal response of a magnetoresistive element
JP3724168B2 (ja) * 1998-02-03 2005-12-07 三菱電機株式会社 状態検出装置及び光ディスク装置
JP3839959B2 (ja) * 1998-06-05 2006-11-01 パイオニア株式会社 情報再生装置、情報記録装置、情報再生方法及び情報記録方法
US6557125B1 (en) * 1998-12-11 2003-04-29 Iomega Corporation System and method for generating a defect map for a data-storage medium without the use of a hard index
US20030182605A1 (en) * 1998-12-11 2003-09-25 Short Robert L. Process and device for identifying and designating radially-oriented patterns of defects on a data-storage medium
US6278784B1 (en) 1998-12-20 2001-08-21 Peter Gerard Ledermann Intermittent errors in digital disc players
US6548821B1 (en) 1999-06-21 2003-04-15 Komag, Inc. Method and apparatus for inspecting substrates
US6566674B1 (en) 1999-06-21 2003-05-20 Komag, Inc. Method and apparatus for inspecting substrates
EP1114419A1 (de) * 1999-07-15 2001-07-11 Koninklijke Philips Electronics N.V. Verfahren zum abtasten einer aufzeichnungsplatte auf defekte, und aufzeichnungsvorrichtung zur informationsaufzeichnung auf ein plattenförmiges aufzeichnungsmedium
US6985319B2 (en) * 2000-05-22 2006-01-10 Seagate Technology Llc Pattern-based defect description method
JP2002268829A (ja) * 2001-03-05 2002-09-20 Internatl Business Mach Corp <Ibm> コンピュータ装置、ディスクドライブ装置、データのリード／ライト制御方法、ディフェクトマップの登録方法
US20020191319A1 (en) * 2001-04-12 2002-12-19 Seagate Technology Llc Merged defect entries for defects running in circumferential and radial directions on a disc
US7206150B2 (en) * 2001-06-04 2007-04-17 Seagate Technology Llc In situ media defect image analysis
US6704153B1 (en) * 2001-11-30 2004-03-09 Western Digital Technologies, Inc. Method for analyzing magnetic media surface in a disk drive for indications of head impact
US20030161980A1 (en) * 2002-02-27 2003-08-28 Nelson Brent S. Plastic container
KR100667749B1 (ko) * 2002-10-18 2007-01-11 삼성전자주식회사 임시 결함 관리 영역을 사용한 결함 관리 방법, 그 장치및 그디스크
US20050138464A1 (en) * 2003-11-21 2005-06-23 Chong Pohsoon Scratch fill using scratch tracking table
EP1553590A1 (de) * 2004-01-07 2005-07-13 Thomson Licensing S.A. Wiedergabe/aufzeichnungsverfahren eines optischen Aufzeichnungsmediums
EP1553589A1 (de) * 2004-01-07 2005-07-13 Deutsche Thomson-Brandt Gmbh Wiedergabe/Aufzeichnungsverfahren eines optischen Aufzeichnungsmedium
KR100604892B1 (ko) * 2004-08-10 2006-07-28 삼성전자주식회사 재기록 가능한 광디스크의 결함 관리를 위한 결함 검출회로를 구비한 광디스크 재생/기록 시스템 및 그 방법
US7139145B1 (en) * 2004-09-23 2006-11-21 Western Digital Technologies, Inc. Cluster-based defect detection testing for disk drives
KR100688556B1 (ko) * 2005-07-12 2007-03-02 삼성전자주식회사 하드디스크 드라이브의 기록 제어 방법 그리고 이에 적합한하드디스크 드라이브 및 기록 매체
US7788555B2 (en) * 2005-07-22 2010-08-31 Broadcom Corporation Using fractional sectors for mapping defects in disk drives
US8854758B2 (en) * 2005-09-07 2014-10-07 Agere Systems Inc. Track defect map for a disk drive data storage system
US20070081123A1 (en) 2005-10-07 2007-04-12 Lewis Scott W Digital eyewear
US11428937B2 (en) 2005-10-07 2022-08-30 Percept Technologies Enhanced optical and perceptual digital eyewear
US9658473B2 (en) 2005-10-07 2017-05-23 Percept Technologies Inc Enhanced optical and perceptual digital eyewear
US8089715B1 (en) * 2006-02-01 2012-01-03 Link—A—Media Devices Corporation Split sector formatting of storage disks
US8566894B2 (en) * 2006-02-10 2013-10-22 Scott W. Lewis Method and system for distribution of media
US8451850B2 (en) * 2006-02-10 2013-05-28 Scott W. Lewis Method and system for distribution of media including a gigablock
US9740552B2 (en) * 2006-02-10 2017-08-22 Percept Technologies Inc. Method and system for error correction utilized with a system for distribution of media
US20070192819A1 (en) * 2006-02-10 2007-08-16 Lewis Scott W System for distribution of media utilized with a receiver/set top box
US7532422B2 (en) * 2006-10-25 2009-05-12 Mra Tek, Llc Method and system for distinguishing spatial and thermal defects on perpendicular media
JP5291468B2 (ja) * 2006-11-07 2013-09-18 パナソニック株式会社 光ディスク装置
US20090034109A1 (en) * 2007-07-30 2009-02-05 Kabushiki Kaisha Toshiba 1-1 Disk drive apparatus and media defect detection method
US8077571B1 (en) * 2007-12-05 2011-12-13 Link—A—Media Devices Corporation Storage media defect detection
DE102010061505B4 (de) * 2010-12-22 2012-10-31 Kla-Tencor Mie Gmbh Verfahren zur Inspektion und Detektion von Defekten auf Oberflächen von scheibenförmigen Objekten
US8654464B2 (en) * 2011-10-19 2014-02-18 HGST Netherlands B.V. Implementing magnetic defect classification using phase modulation
US11181740B1 (en) 2013-03-15 2021-11-23 Percept Technologies Inc Digital eyewear procedures related to dry eyes

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57161641A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for defect of surface
JPS60147945A (ja) * 1984-01-10 1985-08-05 Victor Co Of Japan Ltd 光デイスク検査装置
US4686563A (en) * 1984-11-21 1987-08-11 E. I. Du Pont De Nemours And Company Apparatus and method for locating dropouts
JPS61208627A (ja) * 1985-03-13 1986-09-17 Hitachi Maxell Ltd 情報記録用デイスクの検査装置
JPS6327779A (ja) 1986-07-22 1988-02-05 Matsushita Electric Works Ltd 車両用障害物検知装置
US4896227A (en) * 1987-08-11 1990-01-23 E. I. Dupont De Nemours & Co. Method of locating and inspecting dropouts on a magnetic disc
EP0303454A3 (de) 1987-08-11 1989-05-17 E.I. Du Pont De Nemours And Company Verfahren zum Orten und Prüfen von Fehlern auf einer magnetischen Scheibe

Also Published As

Publication number Publication date
EP0397126B1 (de) 1995-12-20
EP0397126A3 (de) 1992-07-01
EP0397126A2 (de) 1990-11-14
DE69024255T2 (de) 1996-05-15
US5212677A (en) 1993-05-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee