DE69009216D1 - Epitaxialstruktur für lichtemittierende Halbleiteranordnungen und lichtemittierende Halbleiteranordnung mit dieser Struktur. - Google Patents

Epitaxialstruktur für lichtemittierende Halbleiteranordnungen und lichtemittierende Halbleiteranordnung mit dieser Struktur.

Info

Publication number
DE69009216D1
DE69009216D1 DE69009216T DE69009216T DE69009216D1 DE 69009216 D1 DE69009216 D1 DE 69009216D1 DE 69009216 T DE69009216 T DE 69009216T DE 69009216 T DE69009216 T DE 69009216T DE 69009216 D1 DE69009216 D1 DE 69009216D1
Authority
DE
Germany
Prior art keywords
light emitting
semiconductor light
emitting device
emitting devices
epitaxial structure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69009216T
Other languages
English (en)
Other versions
DE69009216T2 (de
Inventor
Takashi Matsuoka
Toru Sasaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Application granted granted Critical
Publication of DE69009216D1 publication Critical patent/DE69009216D1/de
Publication of DE69009216T2 publication Critical patent/DE69009216T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/26Materials of the light emitting region
    • H01L33/30Materials of the light emitting region containing only elements of group III and group V of the periodic system
    • H01L33/32Materials of the light emitting region containing only elements of group III and group V of the periodic system containing nitrogen
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/0237Materials
    • H01L21/0242Crystalline insulating materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02367Substrates
    • H01L21/02433Crystal orientation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02436Intermediate layers between substrates and deposited layers
    • H01L21/02439Materials
    • H01L21/02455Group 13/15 materials
    • H01L21/02458Nitrides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02538Group 13/15 materials
    • H01L21/0254Nitrides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/0257Doping during depositing
    • H01L21/02573Conductivity type
    • H01L21/02579P-type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02656Special treatments
    • H01L21/02658Pretreatments
    • H01L21/02661In-situ cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0062Processes for devices with an active region comprising only III-V compounds
    • H01L33/0066Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
    • H01L33/007Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound comprising nitride compounds
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/16Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular crystal structure or orientation, e.g. polycrystalline, amorphous or porous
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/3202Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth
    • H01S5/32025Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth non-polar orientation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/32Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
    • H01S5/323Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/32308Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
    • H01S5/32341Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S2304/00Special growth methods for semiconductor lasers
    • H01S2304/04MOCVD or MOVPE
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/0206Substrates, e.g. growth, shape, material, removal or bonding
    • H01S5/0213Sapphire, quartz or diamond based substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/0233Mounting configuration of laser chips
    • H01S5/0234Up-side down mountings, e.g. Flip-chip, epi-side down mountings or junction down mountings
DE69009216T 1989-02-13 1990-02-10 Epitaxialstruktur für lichtemittierende Halbleiteranordnungen und lichtemittierende Halbleiteranordnung mit dieser Struktur. Expired - Lifetime DE69009216T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1033279A JP2704181B2 (ja) 1989-02-13 1989-02-13 化合物半導体単結晶薄膜の成長方法

Publications (2)

Publication Number Publication Date
DE69009216D1 true DE69009216D1 (de) 1994-07-07
DE69009216T2 DE69009216T2 (de) 1995-03-02

Family

ID=12382091

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69009216T Expired - Lifetime DE69009216T2 (de) 1989-02-13 1990-02-10 Epitaxialstruktur für lichtemittierende Halbleiteranordnungen und lichtemittierende Halbleiteranordnung mit dieser Struktur.

Country Status (4)

Country Link
US (1) US5006908A (de)
EP (1) EP0383215B1 (de)
JP (1) JP2704181B2 (de)
DE (1) DE69009216T2 (de)

Families Citing this family (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6830992B1 (en) * 1990-02-28 2004-12-14 Toyoda Gosei Co., Ltd. Method for manufacturing a gallium nitride group compound semiconductor
US5278433A (en) * 1990-02-28 1994-01-11 Toyoda Gosei Co., Ltd. Light-emitting semiconductor device using gallium nitride group compound with double layer structures for the n-layer and/or the i-layer
US6362017B1 (en) 1990-02-28 2002-03-26 Toyoda Gosei Co., Ltd. Light-emitting semiconductor device using gallium nitride group compound
DE69126152T2 (de) * 1990-02-28 1997-11-13 Toyoda Gosei Kk Lichtemittierende Halbleitervorrichtung mit Gallium-Nitrid-Verbindung
JP2593960B2 (ja) * 1990-11-29 1997-03-26 シャープ株式会社 化合物半導体発光素子とその製造方法
JPH089518B2 (ja) * 1990-12-28 1996-01-31 名古屋大学長 化合物半導体単結晶の作製方法
US5173751A (en) * 1991-01-21 1992-12-22 Pioneer Electronic Corporation Semiconductor light emitting device
US6953703B2 (en) 1991-03-18 2005-10-11 The Trustees Of Boston University Method of making a semiconductor device with exposure of sapphire substrate to activated nitrogen
WO1992016966A1 (en) * 1991-03-18 1992-10-01 Boston University A method for the preparation and doping of highly insulating monocrystalline gallium nitride thin films
US5633192A (en) * 1991-03-18 1997-05-27 Boston University Method for epitaxially growing gallium nitride layers
JP3352712B2 (ja) * 1991-12-18 2002-12-03 浩 天野 窒化ガリウム系半導体素子及びその製造方法
JP2778349B2 (ja) * 1992-04-10 1998-07-23 日亜化学工業株式会社 窒化ガリウム系化合物半導体の電極
EP0579897B1 (de) * 1992-07-23 2003-10-15 Toyoda Gosei Co., Ltd. Lichtemittierende Vorrichtung aus einer Verbindung der Galliumnitridgruppe
US6440823B1 (en) 1994-01-27 2002-08-27 Advanced Technology Materials, Inc. Low defect density (Ga, Al, In)N and HVPE process for making same
US5909040A (en) * 1994-03-09 1999-06-01 Kabushiki Kaisha Toshiba Semiconductor device including quaternary buffer layer with pinholes
US6130147A (en) * 1994-04-07 2000-10-10 Sdl, Inc. Methods for forming group III-V arsenide-nitride semiconductor materials
JP2698796B2 (ja) * 1994-04-20 1998-01-19 豊田合成株式会社 3族窒化物半導体発光素子
US6136626A (en) * 1994-06-09 2000-10-24 Matsushita Electric Industrial Co., Ltd. Semiconductor light-emitting device and production method thereof
EP0772247B1 (de) * 1994-07-21 2004-09-15 Matsushita Electric Industrial Co., Ltd. Lichtemittierende halbleitervorrichtung und herstellungsverfahren
KR960007835A (ko) * 1994-08-22 1996-03-22 강박광 청색 발광성 질화갈륨 적층막의 제조방법
US6996150B1 (en) 1994-09-14 2006-02-07 Rohm Co., Ltd. Semiconductor light emitting device and manufacturing method therefor
US5787104A (en) 1995-01-19 1998-07-28 Matsushita Electric Industrial Co., Ltd. Semiconductor light emitting element and method for fabricating the same
JP3557011B2 (ja) 1995-03-30 2004-08-25 株式会社東芝 半導体発光素子、及びその製造方法
US5625202A (en) * 1995-06-08 1997-04-29 University Of Central Florida Modified wurtzite structure oxide compounds as substrates for III-V nitride compound semiconductor epitaxial thin film growth
JP3564811B2 (ja) * 1995-07-24 2004-09-15 豊田合成株式会社 3族窒化物半導体発光素子
DE69636088T2 (de) * 1995-11-06 2006-11-23 Nichia Corp., Anan Halbleitervorrichtung aus einer Nitridverbindung
SG74012A1 (en) * 1996-05-10 2000-07-18 Sumitomo Chemical Co Device for production of compound semiconductor
JP3106956B2 (ja) * 1996-05-23 2000-11-06 住友化学工業株式会社 化合物半導体用電極材料
TW383508B (en) 1996-07-29 2000-03-01 Nichia Kagaku Kogyo Kk Light emitting device and display
WO1998019375A1 (fr) * 1996-10-30 1998-05-07 Hitachi, Ltd. Machine de traitement optique de l'information et dispositif a semi-conducteur emetteur de lumiere afferent
JPH10335750A (ja) * 1997-06-03 1998-12-18 Sony Corp 半導体基板および半導体装置
AU747260B2 (en) 1997-07-25 2002-05-09 Nichia Chemical Industries, Ltd. Nitride semiconductor device
JPH11220170A (ja) * 1998-01-29 1999-08-10 Rohm Co Ltd 発光ダイオード素子
US6294475B1 (en) 1998-06-23 2001-09-25 Trustees Of Boston University Crystallographic wet chemical etching of III-nitride material
JP3770014B2 (ja) 1999-02-09 2006-04-26 日亜化学工業株式会社 窒化物半導体素子
EP1168539B1 (de) * 1999-03-04 2009-12-16 Nichia Corporation Nitridhalbleiterlaserelement
GB2350927A (en) 1999-06-12 2000-12-13 Sharp Kk A method growing nitride semiconductor layer by molecular beam epitaxy
US6590336B1 (en) 1999-08-31 2003-07-08 Murata Manufacturing Co., Ltd. Light emitting device having a polar plane piezoelectric film and manufacture thereof
JP4897133B2 (ja) * 1999-12-09 2012-03-14 ソニー株式会社 半導体発光素子、その製造方法および配設基板
US6586819B2 (en) 2000-08-14 2003-07-01 Nippon Telegraph And Telephone Corporation Sapphire substrate, semiconductor device, electronic component, and crystal growing method
AU2002253834A1 (en) * 2000-10-20 2002-08-19 Emcore Corporation Improved light extraction efficiency of gan based leds
JP3988018B2 (ja) * 2001-01-18 2007-10-10 ソニー株式会社 結晶膜、結晶基板および半導体装置
US6794684B2 (en) 2001-02-01 2004-09-21 Cree, Inc. Reflective ohmic contacts for silicon carbide including a layer consisting essentially of nickel, methods of fabricating same, and light emitting devices including the same
US6791119B2 (en) * 2001-02-01 2004-09-14 Cree, Inc. Light emitting diodes including modifications for light extraction
US6576932B2 (en) 2001-03-01 2003-06-10 Lumileds Lighting, U.S., Llc Increasing the brightness of III-nitride light emitting devices
JP2002335015A (ja) * 2001-05-09 2002-11-22 Rohm Co Ltd 半導体発光素子
JP3912044B2 (ja) * 2001-06-06 2007-05-09 豊田合成株式会社 Iii族窒化物系化合物半導体発光素子の製造方法
US7211833B2 (en) 2001-07-23 2007-05-01 Cree, Inc. Light emitting diodes including barrier layers/sublayers
US6740906B2 (en) 2001-07-23 2004-05-25 Cree, Inc. Light emitting diodes including modifications for submount bonding
KR100597532B1 (ko) * 2001-11-05 2006-07-10 니치아 카가쿠 고교 가부시키가이샤 반도체 소자
US20030090103A1 (en) * 2001-11-09 2003-05-15 Thomas Becker Direct mailing device
US6635503B2 (en) 2002-01-28 2003-10-21 Cree, Inc. Cluster packaging of light emitting diodes
JP4233268B2 (ja) * 2002-04-23 2009-03-04 シャープ株式会社 窒化物系半導体発光素子およびその製造方法
US6958498B2 (en) * 2002-09-27 2005-10-25 Emcore Corporation Optimized contact design for flip-chip LED
US7009199B2 (en) * 2002-10-22 2006-03-07 Cree, Inc. Electronic devices having a header and antiparallel connected light emitting diodes for producing light from AC current
US7138648B2 (en) * 2003-12-17 2006-11-21 Palo Alto Research Center Incorporated Ultraviolet group III-nitride-based quantum well laser diodes
TWI453813B (zh) * 2005-03-10 2014-09-21 Univ California 用於生長平坦半極性的氮化鎵之技術
US8901699B2 (en) 2005-05-11 2014-12-02 Cree, Inc. Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection
CN100372137C (zh) * 2005-05-27 2008-02-27 晶能光电(江西)有限公司 具有上下电极结构的铟镓铝氮发光器件及其制造方法
JP5743127B2 (ja) 2005-06-01 2015-07-01 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 半極性(Ga,Al,In,B)N薄膜、ヘテロ構造およびデバイスの成長と作製のための方法及び装置
KR101347848B1 (ko) * 2005-09-09 2014-01-06 재팬 사이언스 앤드 테크놀로지 에이젼시 유기금속 화학기상증착법을 통한 반극성(Al,In,Ga,B)N의 성장강화방법
EP1977441A4 (de) * 2006-01-20 2010-12-01 Univ California Verfahren für verstärktes wachstum semipolarer (ai,in,ga,b)n mittels metallorganischer chemischer dampfabscheidung
US7691658B2 (en) 2006-01-20 2010-04-06 The Regents Of The University Of California Method for improved growth of semipolar (Al,In,Ga,B)N
US20070200119A1 (en) * 2006-02-26 2007-08-30 Yun-Li Li Flip-chip led package and led chip
US10586787B2 (en) 2007-01-22 2020-03-10 Cree, Inc. Illumination devices using externally interconnected arrays of light emitting devices, and methods of fabricating same
TW200837943A (en) * 2007-01-22 2008-09-16 Led Lighting Fixtures Inc Fault tolerant light emitters, systems incorporating fault tolerant light emitters and methods of fabricating fault tolerant light emitters
JP4462289B2 (ja) 2007-05-18 2010-05-12 ソニー株式会社 半導体層の成長方法および半導体発光素子の製造方法
JP5353113B2 (ja) * 2008-01-29 2013-11-27 豊田合成株式会社 Iii族窒化物系化合物半導体の製造方法
TWI362769B (en) * 2008-05-09 2012-04-21 Univ Nat Chiao Tung Light emitting device and fabrication method therefor
US8647967B2 (en) * 2008-05-28 2014-02-11 The Regents Of The University Of California Hexagonal wurtzite type epitaxial layer possessing a low alkali-metal concentration and method of creating the same
US9243329B2 (en) * 2009-08-12 2016-01-26 Georgia State University Research Foundation, Inc. High pressure chemical vapor deposition apparatuses, methods, and compositions produced therewith
WO2011086620A1 (ja) * 2010-01-18 2011-07-21 パナソニック株式会社 窒化物系半導体素子およびその製造方法
JP5759690B2 (ja) * 2010-08-30 2015-08-05 株式会社日立国際電気 膜の形成方法、半導体装置の製造方法及び基板処理装置
JP5707928B2 (ja) * 2010-12-21 2015-04-30 セイコーエプソン株式会社 照明装置、その製造方法、及び電子機器

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3740622A (en) * 1972-07-10 1973-06-19 Rca Corp Electroluminescent semiconductor device for generating ultra violet radiation
JPS5815480B2 (ja) * 1975-08-19 1983-03-25 松下電器産業株式会社 チツカガリウムタンケツシヨウノ セイチヨウホウホウ
SU773795A1 (ru) * 1977-04-01 1980-10-23 Предприятие П/Я А-1172 Светоизлучающий прибор
JPS553834A (en) * 1978-06-23 1980-01-11 Yasuko Shiomi Hand shower with water-stop valve
JPS54119400A (en) * 1978-07-11 1979-09-17 Sumitomo Electric Ind Ltd Production of nitrogen compound of 3b group element
US4396929A (en) * 1979-10-19 1983-08-02 Matsushita Electric Industrial Company, Ltd. Gallium nitride light-emitting element and method of manufacturing the same
JPS6055996B2 (ja) * 1979-12-05 1985-12-07 松下電器産業株式会社 電場発光半導体装置
JPS5710280A (en) * 1980-06-23 1982-01-19 Futaba Corp Gan light emitting element
JPS5948794B2 (ja) * 1982-09-27 1984-11-28 工業技術院長 窒化ガリウム単結晶膜の製造法
JPS6026079A (ja) * 1983-07-23 1985-02-08 Nitto Electric Ind Co Ltd 感圧接着剤の改質方法
JPS6118184A (ja) * 1984-07-04 1986-01-27 Agency Of Ind Science & Technol 発光素子
US4614961A (en) * 1984-10-09 1986-09-30 Honeywell Inc. Tunable cut-off UV detector based on the aluminum gallium nitride material system
JPS61179527A (ja) * 1985-02-04 1986-08-12 Nippon Telegr & Teleph Corp <Ntt> 化合物半導体単結晶膜の成長方法および装置
US4616248A (en) * 1985-05-20 1986-10-07 Honeywell Inc. UV photocathode using negative electron affinity effect in Alx Ga1 N
JPS6230696A (ja) * 1985-07-31 1987-02-09 Sharp Corp 広禁制帯幅半導体結晶の製造方法
JPS62119196A (ja) * 1985-11-18 1987-05-30 Univ Nagoya 化合物半導体の成長方法
JPS62119940A (ja) * 1985-11-19 1987-06-01 Sharp Corp 半導体基板
US4740606A (en) * 1986-07-01 1988-04-26 Morton Thiokol, Inc. Gallium hydride/trialkylamine adducts, and their use in deposition of III-V compound films
JPS63188938A (ja) * 1987-01-31 1988-08-04 Toyoda Gosei Co Ltd 窒化ガリウム系化合物半導体の気相成長方法
EP0460710B1 (de) * 1987-01-31 1994-12-07 Toyoda Gosei Co., Ltd. Galliumnitridartige Halbleiterverbindung und daraus bestehende lichtemittierende Vorrichtung sowie Verfahren zu deren Herstellung
JPH0614564B2 (ja) * 1987-07-13 1994-02-23 日本電信電話株式会社 半導体発光素子

Also Published As

Publication number Publication date
EP0383215B1 (de) 1994-06-01
EP0383215A2 (de) 1990-08-22
US5006908A (en) 1991-04-09
EP0383215A3 (de) 1991-01-09
JPH02211620A (ja) 1990-08-22
DE69009216T2 (de) 1995-03-02
JP2704181B2 (ja) 1998-01-26

Similar Documents

Publication Publication Date Title
DE69009216D1 (de) Epitaxialstruktur für lichtemittierende Halbleiteranordnungen und lichtemittierende Halbleiteranordnung mit dieser Struktur.
DE3787517T2 (de) Halbleiteranordnung mit konstantem Strom.
DE68913187T2 (de) Peltier-kühlungseinrichtung mit supraleiter-halbleiter-verbindung.
DE3886329D1 (de) Halbleiteranordnung mit Luftbrücken-Verbindungen.
DE3850855T2 (de) Halbleitervorrichtung.
DE3789096D1 (de) Beleuchtungsvorrichtung.
DE68911322D1 (de) Epitaxiales Substrat für hochintensive LEDS und Herstellungsverfahren.
DE3773078D1 (de) Integrierte halbleiterschaltung mit testschaltung.
DE68917848D1 (de) Halbleiteranordnung.
DE3889563D1 (de) Halbleiteranordnung mit Schmelzsicherung.
DE69016509D1 (de) Integrierte Halbleiterschaltungsanordnung mit Testschaltung.
DE69001548D1 (de) Lichtemittierende halbleitervorrichtung.
DE3889354D1 (de) Halbleiteranordnung.
GB2200797B (en) Semiconductor integrated light emitting device
DE3771637D1 (de) Beleuchtungsvorrichtung.
DE3887790T2 (de) Lichtemittierende Halbleitervorrichtung.
DE59007053D1 (de) Leistungs-Halbleiterbauelement mit Emitterkurzschlüssen.
DE69017301D1 (de) Halbleiter lichtemittierende Vorrichtung.
DE68917971T2 (de) Halbleitervorrichtung.
DE3784818D1 (de) Lichtemissions-vorrichtung mit halbleitern.
DE59003052D1 (de) Halbleiterbauelement.
DE3785426D1 (de) Beleuchtungsvorrichtung mit lichtschienen.
DE3772168D1 (de) Lichtaussendende halbleitervorrichtung.
DE68914790T2 (de) Integrierte Halbleiter-Vorrichtung mit einem optoelektronischen Schaltelement.
DE69026194T2 (de) Lichtemittierende Halbleitervorrichtung und Herstellungsverfahren

Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication of lapse of patent is to be deleted
8364 No opposition during term of opposition