DE68916351D1 - Gerät zur Oberflächenprüfung. - Google Patents

Gerät zur Oberflächenprüfung.

Info

Publication number
DE68916351D1
DE68916351D1 DE68916351T DE68916351T DE68916351D1 DE 68916351 D1 DE68916351 D1 DE 68916351D1 DE 68916351 T DE68916351 T DE 68916351T DE 68916351 T DE68916351 T DE 68916351T DE 68916351 D1 DE68916351 D1 DE 68916351D1
Authority
DE
Germany
Prior art keywords
inspection device
surface inspection
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE68916351T
Other languages
English (en)
Other versions
DE68916351T2 (de
Inventor
Chiaki Fukazawa
Kenji Aizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Publication of DE68916351D1 publication Critical patent/DE68916351D1/de
Application granted granted Critical
Publication of DE68916351T2 publication Critical patent/DE68916351T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G01N2021/8905—Directional selective optics, e.g. slits, spatial filters
DE68916351T 1988-09-20 1989-09-19 Gerät zur Oberflächenprüfung. Expired - Lifetime DE68916351T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63233647A JPH0641923B2 (ja) 1988-09-20 1988-09-20 表面検査装置

Publications (2)

Publication Number Publication Date
DE68916351D1 true DE68916351D1 (de) 1994-07-28
DE68916351T2 DE68916351T2 (de) 1995-02-02

Family

ID=16958320

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68916351T Expired - Lifetime DE68916351T2 (de) 1988-09-20 1989-09-19 Gerät zur Oberflächenprüfung.

Country Status (5)

Country Link
US (1) US5074668A (de)
EP (1) EP0360232B1 (de)
JP (1) JPH0641923B2 (de)
KR (1) KR920009801B1 (de)
DE (1) DE68916351T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5616046B2 (ja) * 2009-10-15 2014-10-29 日本電産コパル電子株式会社 フライングスポット方式の表面あるいは内層検査装置
KR20140105593A (ko) * 2011-12-20 2014-09-01 쓰리엠 이노베이티브 프로퍼티즈 캄파니 표면 불균일도를 측정하기 위한 센서

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE732855C (de) * 1940-01-04 1943-03-13 Siemens Ag Lichtelektrische Einrichtung zum Feststellen von Loechern in lichtdurchlaessigen Werkstoffbahnen, z. B. aus weissem lichtdurchlaessigen Papier
US3612702A (en) * 1969-09-09 1971-10-12 Iris Corp Web defect determination by laser beam irradiation and reflected light examination
FR2076193A5 (de) * 1970-01-06 1971-10-15 Commissariat Energie Atomique
DE2208372A1 (de) * 1971-02-24 1972-09-07 Columbia Research Corp., Gaithersburg, Md. (V.St.A.) Vorrichtung zur Ermittlung von Fehlerstellen in dünnen Blechen oder Folien
DE2462346A1 (de) * 1974-07-12 1977-03-03 Sick Optik Elektronik Erwin Vorrichtung zur ueberwachung einer materialbahn auf fehlstellen
US4260899A (en) * 1979-06-14 1981-04-07 Intec Corporation Wide web laser scanner flaw detection method and apparatus
US4306808A (en) * 1979-12-14 1981-12-22 Ford Aerospace & Communications Corp. Glass flaw inspection system
JPS5698634A (en) * 1980-01-09 1981-08-08 Dainippon Printing Co Ltd Printed matter testing device
US4277178A (en) * 1980-01-15 1981-07-07 Ford Aerospace & Communications Corp. Web element concentration detection system
JPS5796242A (en) * 1980-12-06 1982-06-15 Fuji Electric Co Ltd Detector for defect of sheet-like substance
US4522497A (en) * 1981-06-17 1985-06-11 Ciba Geigy Ag Web scanning apparatus
DE3125189C2 (de) * 1981-06-26 1984-06-14 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Fehlersuchgerät für breite Bahnen
DE3334357C2 (de) * 1983-09-22 1986-04-10 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optisches Fehlersuchgerät für Bahnen
JPS6275236A (ja) * 1985-09-30 1987-04-07 Toshiba Corp 表面検査装置
JPS63182554A (ja) * 1987-01-23 1988-07-27 Fuji Photo Film Co Ltd 表面検査装置

Also Published As

Publication number Publication date
EP0360232A2 (de) 1990-03-28
JPH0641923B2 (ja) 1994-06-01
KR900005154A (ko) 1990-04-13
EP0360232A3 (de) 1991-06-05
KR920009801B1 (ko) 1992-10-22
US5074668A (en) 1991-12-24
DE68916351T2 (de) 1995-02-02
JPH0282142A (ja) 1990-03-22
EP0360232B1 (de) 1994-06-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition