DE68916010T2 - Optischer Messfühler. - Google Patents
Optischer Messfühler.Info
- Publication number
- DE68916010T2 DE68916010T2 DE68916010T DE68916010T DE68916010T2 DE 68916010 T2 DE68916010 T2 DE 68916010T2 DE 68916010 T DE68916010 T DE 68916010T DE 68916010 T DE68916010 T DE 68916010T DE 68916010 T2 DE68916010 T2 DE 68916010T2
- Authority
- DE
- Germany
- Prior art keywords
- optical sensor
- optical
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
- G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/346,123 US5008555A (en) | 1988-04-08 | 1989-05-02 | Optical probe with overlapping detection fields |
Publications (2)
Publication Number | Publication Date |
---|---|
DE68916010D1 DE68916010D1 (de) | 1994-07-14 |
DE68916010T2 true DE68916010T2 (de) | 1994-09-22 |
Family
ID=23358062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE68916010T Expired - Lifetime DE68916010T2 (de) | 1989-05-02 | 1989-09-08 | Optischer Messfühler. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5008555A (de) |
EP (2) | EP0395811B1 (de) |
JP (1) | JPH02302603A (de) |
DE (1) | DE68916010T2 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005021254A1 (de) * | 2005-05-02 | 2006-11-16 | Siemens Ag | Optische Sensoranordnung zur Lagebestimmung eines Messobjektes, Verwendung derselben und Verfahren zum Bestimmen der Lage eines Messobjektes |
Families Citing this family (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE1003136A3 (nl) * | 1990-03-23 | 1991-12-03 | Icos Vision Systems Nv | Werkwijze en inrichting voor het bepalen van een positie van ten minste een aansluitpen van een elektronische component. |
EP0477404B1 (de) * | 1990-09-27 | 1995-03-08 | Siemens Aktiengesellschaft | Verfahren zur Anlagendokumentation |
US5289261A (en) * | 1991-09-17 | 1994-02-22 | Opton, Co., Ltd. | Device for measuring a three-dimensional shape of an elongate member |
US5481361A (en) * | 1993-05-19 | 1996-01-02 | Matsushita Electric Industrial Co., Ltd. | Method of and device for measuring position coordinates |
FR2710407B1 (fr) * | 1993-09-20 | 1995-12-01 | Romer Srl | Procédé de repérage positionnel pour une machine de mesure tridimensionnelle et dispositif pour la mise en Óoeuvre du procédé. |
WO1996013455A1 (de) * | 1994-10-26 | 1996-05-09 | Siemens Aktiengesellschaft | Anordnung zum messtechnischen erfassen von lastpendelungen bei kranen |
GB9515311D0 (en) * | 1995-07-26 | 1995-09-20 | 3D Scanners Ltd | Stripe scanners and methods of scanning |
US6009737A (en) * | 1997-07-17 | 2000-01-04 | Arvin Industries, Inc. | Tube bender |
US6155091A (en) * | 1999-02-26 | 2000-12-05 | Arvin Industries, Inc. | Mandrel assembly for tube-bending apparatus |
US6480290B1 (en) * | 2000-01-31 | 2002-11-12 | Carnegie Mellon University | Method and apparatus to measure the cross-sectional area of an object |
US6661506B2 (en) | 2000-08-24 | 2003-12-09 | Og Technologies, Inc. | Engine bearing inspection system |
FR2814807B1 (fr) * | 2000-10-04 | 2003-01-03 | Laurent Senee | Dispositif et procede de determination de coordonnees surfacique et leurs utilisations |
DE10130937C1 (de) * | 2001-06-27 | 2003-01-30 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung zur Ermittlung der Raumgeometrie eines gebogenen Strangprofils |
US6920697B2 (en) * | 2002-02-14 | 2005-07-26 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated touch probe and improved handle assembly |
US6973734B2 (en) * | 2002-02-14 | 2005-12-13 | Faro Technologies, Inc. | Method for providing sensory feedback to the operator of a portable measurement machine |
US7246030B2 (en) * | 2002-02-14 | 2007-07-17 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US7073271B2 (en) * | 2002-02-14 | 2006-07-11 | Faro Technologies Inc. | Portable coordinate measurement machine |
US6952882B2 (en) * | 2002-02-14 | 2005-10-11 | Faro Technologies, Inc. | Portable coordinate measurement machine |
US7519493B2 (en) * | 2002-02-14 | 2009-04-14 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US6957496B2 (en) * | 2002-02-14 | 2005-10-25 | Faro Technologies, Inc. | Method for improving measurement accuracy of a portable coordinate measurement machine |
USRE42082E1 (en) | 2002-02-14 | 2011-02-01 | Faro Technologies, Inc. | Method and apparatus for improving measurement accuracy of a portable coordinate measurement machine |
US7881896B2 (en) | 2002-02-14 | 2011-02-01 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
DE20309976U1 (de) * | 2003-06-27 | 2003-09-04 | Weber Michael | Vorrichtung zur Akupunktur mittels Laserstrahlung |
FR2866708B1 (fr) * | 2004-02-23 | 2006-03-24 | Commissariat Energie Atomique | Procede et dispositif de controle par ombroscopie |
DE102004032394A1 (de) * | 2004-07-03 | 2006-01-19 | Weber, Michael, Dr. | Lasernadel zur Durchführung einer kombinierten Lasernadel-Elektroakupunktur |
CN101641566B (zh) * | 2007-02-09 | 2014-08-13 | Tezet技术股份公司 | 用于获得型材的几何特征的测量装置和方法 |
DE102007052033A1 (de) * | 2007-10-30 | 2009-05-07 | Rosenberger Ag | Verfahren und Messgerät zur berührungslosen Erfassung des räumlichen Formverlaufs von Bauteilen |
US7796278B2 (en) * | 2008-09-19 | 2010-09-14 | Gii Acquisition, Llc | Method for precisely measuring position of a part to be inspected at a part inspection station |
US20110112786A1 (en) | 2009-11-06 | 2011-05-12 | Hexagon Metrology Ab | Cmm with improved sensors |
DE102010007509A1 (de) * | 2010-02-11 | 2011-08-11 | Aktiebolaget Skf | Verfahren und Vorrichtung zur Vermessung eines Lagerbauteils |
JP5713634B2 (ja) * | 2010-11-10 | 2015-05-07 | 矢崎総業株式会社 | 部品位置計測方法 |
JP5638934B2 (ja) | 2010-12-24 | 2014-12-10 | 矢崎総業株式会社 | 端子 |
JP5700811B2 (ja) | 2011-03-30 | 2015-04-15 | 矢崎総業株式会社 | コネクタ |
CN103782130B (zh) * | 2011-07-08 | 2017-06-20 | 卡尔蔡司工业测量技术有限公司 | 在测量工件的坐标时的误差修正和/或避免 |
US8763267B2 (en) | 2012-01-20 | 2014-07-01 | Hexagon Technology Center Gmbh | Locking counterbalance for a CMM |
US9074871B1 (en) * | 2012-08-01 | 2015-07-07 | Steven M. Lubeck | Pipe measuring system |
WO2014130895A1 (en) | 2013-02-21 | 2014-08-28 | Nlight Photonics Corporation | Laser patterning multi-layer structures |
US10464172B2 (en) | 2013-02-21 | 2019-11-05 | Nlight, Inc. | Patterning conductive films using variable focal plane to control feature size |
US9842665B2 (en) | 2013-02-21 | 2017-12-12 | Nlight, Inc. | Optimization of high resolution digitally encoded laser scanners for fine feature marking |
DE102013221415A1 (de) | 2013-10-22 | 2015-04-23 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren und Vorrichtung zur Erfassung eines Objekts |
US10069271B2 (en) | 2014-06-02 | 2018-09-04 | Nlight, Inc. | Scalable high power fiber laser |
US10618131B2 (en) | 2014-06-05 | 2020-04-14 | Nlight, Inc. | Laser patterning skew correction |
CN105720463B (zh) | 2014-08-01 | 2021-05-14 | 恩耐公司 | 光纤和光纤传输的激光器中的背向反射保护与监控 |
CN104457668B (zh) * | 2014-12-05 | 2017-06-13 | 柳州科路测量仪器有限责任公司 | 便携式车轴轴径测量仪 |
US9837783B2 (en) | 2015-01-26 | 2017-12-05 | Nlight, Inc. | High-power, single-mode fiber sources |
US10050404B2 (en) | 2015-03-26 | 2018-08-14 | Nlight, Inc. | Fiber source with cascaded gain stages and/or multimode delivery fiber with low splice loss |
US10520671B2 (en) | 2015-07-08 | 2019-12-31 | Nlight, Inc. | Fiber with depressed central index for increased beam parameter product |
WO2017091606A1 (en) | 2015-11-23 | 2017-06-01 | Nlight, Inc. | Predictive modification of laser diode drive current waveform in high power laser systems |
US11179807B2 (en) | 2015-11-23 | 2021-11-23 | Nlight, Inc. | Fine-scale temporal control for laser material processing |
CN108367389B (zh) | 2015-11-23 | 2020-07-28 | 恩耐公司 | 激光加工方法和装置 |
EP3389915B1 (de) | 2016-01-19 | 2021-05-05 | NLIGHT, Inc. | Verfahren zur verarbeitung von kalibrierungsdaten in 3d-laserabtastsystemen |
CN106091991A (zh) * | 2016-08-04 | 2016-11-09 | 辽宁精智测控科技有限公司 | 导管扩口锥度及型面自动非接触检测设备和检测方法 |
US10732439B2 (en) | 2016-09-29 | 2020-08-04 | Nlight, Inc. | Fiber-coupled device for varying beam characteristics |
US10730785B2 (en) | 2016-09-29 | 2020-08-04 | Nlight, Inc. | Optical fiber bending mechanisms |
WO2018063452A1 (en) | 2016-09-29 | 2018-04-05 | Nlight, Inc. | Adjustable beam characteristics |
US11173548B2 (en) | 2017-04-04 | 2021-11-16 | Nlight, Inc. | Optical fiducial generation for galvanometric scanner calibration |
CN107116554B (zh) * | 2017-05-25 | 2021-05-04 | 北京理工大学 | 一种仿生灵巧手确定目标物体形状和位置的装置与方法 |
JP2019028010A (ja) * | 2017-08-03 | 2019-02-21 | 株式会社ミツトヨ | パイプ測定装置 |
WO2019204955A1 (zh) * | 2018-04-23 | 2019-10-31 | 深圳达闼科技控股有限公司 | 一种光学检测设备及检测方法 |
US11285623B2 (en) * | 2020-02-04 | 2022-03-29 | Toyota Motor Engineering & Manufacturing North America, Inc. | Fiber optic paint robot tool |
JP7276520B2 (ja) * | 2020-02-06 | 2023-05-18 | 村田機械株式会社 | 挟持装置及び段積み装置 |
CN114814266B (zh) * | 2022-05-20 | 2023-04-14 | 中国工程物理研究院流体物理研究所 | 一种弧形向心阵列测速探头及测速方法 |
CN117058220B (zh) * | 2023-10-11 | 2024-01-26 | 天津施格自动化科技有限公司 | 利用距离传感器测量金属棒直径及中心点拟合算法 |
Family Cites Families (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH502596A (de) * | 1967-11-15 | 1971-01-31 | Bayer Ag | Vorrichtung zum Feststellen von Streifen auf einer laufenden Bahn bei der Herstellung von Fotopapieren und -filmen |
US3529169A (en) * | 1967-12-06 | 1970-09-15 | Fmc Corp | Photoelectric apparatus for detecting shape of bottles |
SE321098B (de) * | 1967-12-07 | 1970-02-23 | Ericsson Telefon Ab L M | |
US3589815A (en) * | 1968-06-21 | 1971-06-29 | Information Dev Corp | Noncontact measuring probe |
CA930214A (en) * | 1969-10-27 | 1973-07-17 | D. Wason Thomas | Apparatus and method for optically inspecting the condition of a surface |
US3735036A (en) * | 1970-10-26 | 1973-05-22 | Express I M Co | Real time interferometry contour mapping system |
US3700903A (en) * | 1970-12-09 | 1972-10-24 | Zenith Radio Corp | Optical detecting systems for sensing variations in the lateral motion of light rays |
US3692414A (en) * | 1971-02-24 | 1972-09-19 | Harry L Hosterman | Non-contacting measuring probe |
DE2127751C3 (de) * | 1971-06-04 | 1974-08-01 | Exatest Messtechnik Gmbh, 5090 Leverkusen | Verfahren und Anordnung zur Ermittlung des Durchmessers eines Gegenstandes runder Querschnittsform mittels periodischer fotoelektrischer Abtastung |
US3782827A (en) * | 1971-08-04 | 1974-01-01 | Itek Corp | Optical device for characterizing the surface or other properties of a sample |
SE355608B (de) * | 1971-08-23 | 1973-04-30 | Nordiska Maskinfilt Ab | |
DE2304182A1 (de) * | 1972-02-01 | 1973-08-09 | Erik Gerhard Natana Westerberg | Vorrichtung zum lichtelektrischen abtasten von datenaufzeichnungstraegern |
GB1400253A (en) * | 1972-03-17 | 1975-07-16 | Ti Group Services Ltd | Gauging dimensions |
US3807870A (en) * | 1972-05-22 | 1974-04-30 | G Kalman | Apparatus for measuring the distance between surfaces of transparent material |
SE378302B (de) * | 1972-07-03 | 1975-08-25 | Aga Ab | |
DE2256736C3 (de) * | 1972-11-18 | 1979-01-25 | Ibm Deutschland Gmbh, 7000 Stuttgart | Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche |
US3806253A (en) * | 1972-12-13 | 1974-04-23 | Weyerhaeuser Co | Sweep measuring scheme |
US3901597A (en) * | 1973-09-13 | 1975-08-26 | Philco Ford Corp | Laser distance measuring device |
US3960006A (en) * | 1973-12-03 | 1976-06-01 | Alco Standard Corporation | Non-destructive test apparatus and method for a material having a cavity therein |
US4171917A (en) * | 1974-07-02 | 1979-10-23 | Centre De Recherches Metallurgiques-Centrum Voor Research In De Metallurgie | Determining the profile of a surface of an object |
US3975102A (en) * | 1974-07-29 | 1976-08-17 | Zygo Corporation | Scanning photoelectric autocollimator |
US4192613A (en) * | 1976-01-08 | 1980-03-11 | Martin Hammar | Contour detecting and dimension measuring apparatus |
US4122525A (en) * | 1976-07-12 | 1978-10-24 | Eaton-Leonard Corporation | Method and apparatus for profile scanning |
FR2363779A1 (fr) * | 1976-09-02 | 1978-03-31 | Iria | Procede et appareil optiques pour la determination tridimensionnelle de la forme d'objets a l'aide d'un calculateur |
GB1584452A (en) * | 1977-01-25 | 1981-02-11 | Schumag Gmbh | Optical scanners |
US4105925A (en) * | 1977-03-14 | 1978-08-08 | General Motors Corporation | Optical object locator |
US4144449A (en) * | 1977-07-08 | 1979-03-13 | Sperry Rand Corporation | Position detection apparatus |
US4158507A (en) * | 1977-07-27 | 1979-06-19 | Recognition Equipment Incorporated | Laser measuring system for inspection |
JPS6013443B2 (ja) * | 1978-09-11 | 1985-04-08 | 日本碍子株式会社 | 被測定物の高さ測定装置 |
US4204772A (en) * | 1978-09-25 | 1980-05-27 | Recognition Systems, Inc. | Optical measuring system |
IT1108255B (it) * | 1978-10-24 | 1985-12-02 | Fiat Spa | Procedimento e dispositivo per il controllo della rugosita della superficie di un pezzo che ha subito una lavorazione meccanica |
WO1980001002A1 (en) * | 1978-10-30 | 1980-05-15 | Fujitsu Ltd | Pattern inspection system |
BE872578A (fr) * | 1978-12-06 | 1979-03-30 | Centre Rech Metallurgique | Dispositif pour controler la surface de la charge d'un four a cuve |
SE421832B (sv) * | 1979-04-18 | 1982-02-01 | Pharos Ab | Anordning for att registrera topografin hos den chargerade massan i en masugn |
US4259013A (en) * | 1979-08-30 | 1981-03-31 | General Motors Corporation | Optical method for inspecting spherical parts |
US4576482A (en) * | 1979-09-07 | 1986-03-18 | Diffracto Ltd. | Electro-optical inspection |
US4348114A (en) * | 1979-12-07 | 1982-09-07 | Ciba-Geigy Ag | Method of inspecting coated web material to detect the presence of downlines thereon |
US4326804A (en) * | 1980-02-11 | 1982-04-27 | General Electric Company | Apparatus and method for optical clearance determination |
IT1130474B (it) * | 1980-05-28 | 1986-06-11 | Fiat Auto Spa | Procedimento e dispositivo per l ispezione ed il controllo della superficie interna di un pezzo cilindrico cavo che ha subito una lavorazione meccanica |
US4349274A (en) * | 1980-07-23 | 1982-09-14 | General Electric Company | Optical triangulation apparatus and method |
JPS59353B2 (ja) * | 1980-07-24 | 1984-01-06 | ファナック株式会社 | 把持装置 |
US4561776A (en) * | 1981-03-25 | 1985-12-31 | Diffracto Ltd. | Electro-optical sensors for tool and robotic inspection |
US4622462A (en) * | 1981-06-11 | 1986-11-11 | Mts Vektronics Corporation | Method and apparatus for three-dimensional scanning |
SE8105051L (sv) * | 1981-08-26 | 1982-08-30 | Kockumation Ab | Forfarande for indikering av ett foremals nervaro i en metzon och anordning for genomforande av forfarandet |
US4465937A (en) * | 1981-10-22 | 1984-08-14 | Forbes James A | Apparatus for optically scanning an object |
US4507557A (en) * | 1983-04-01 | 1985-03-26 | Siemens Corporate Research & Support, Inc. | Non-contact X,Y digitizer using two dynamic ram imagers |
US4710760A (en) * | 1985-03-07 | 1987-12-01 | American Telephone And Telegraph Company, At&T Information Systems Inc. | Photoelastic touch-sensitive screen |
KR910001268B1 (ko) * | 1985-12-10 | 1991-02-26 | 가부시기가이샤 쥬우오 덴기 세이사꾸쇼 | 봉형상물체의 비접촉 측정자 |
US4849643A (en) * | 1987-09-18 | 1989-07-18 | Eaton Leonard Technologies | Optical probe with overlapping detection fields |
US4880991A (en) * | 1987-11-09 | 1989-11-14 | Industrial Technology Institute | Non-contact dimensional gage for turned parts |
-
1989
- 1989-05-02 US US07/346,123 patent/US5008555A/en not_active Expired - Lifetime
- 1989-09-08 EP EP89309129A patent/EP0395811B1/de not_active Expired - Lifetime
- 1989-09-08 DE DE68916010T patent/DE68916010T2/de not_active Expired - Lifetime
- 1989-09-08 EP EP19930105462 patent/EP0554920A3/en not_active Withdrawn
-
1990
- 1990-02-09 JP JP2031314A patent/JPH02302603A/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005021254A1 (de) * | 2005-05-02 | 2006-11-16 | Siemens Ag | Optische Sensoranordnung zur Lagebestimmung eines Messobjektes, Verwendung derselben und Verfahren zum Bestimmen der Lage eines Messobjektes |
Also Published As
Publication number | Publication date |
---|---|
DE68916010D1 (de) | 1994-07-14 |
JPH02302603A (ja) | 1990-12-14 |
EP0395811A2 (de) | 1990-11-07 |
EP0554920A2 (de) | 1993-08-11 |
EP0395811A3 (de) | 1991-07-31 |
EP0395811B1 (de) | 1994-06-08 |
EP0554920A3 (en) | 1994-06-08 |
US5008555A (en) | 1991-04-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE68916010D1 (de) | Optischer Messfühler. | |
DE68920842T2 (de) | Optischer Wellenleitersensor. | |
FI891846A (fi) | Optisk avbrytare. | |
DK376389D0 (da) | Optisk foeler | |
DE59004780D1 (de) | Faseroptischer Sensor. | |
DE59202372D1 (de) | Optischer abstandssensor. | |
KR920700391A (ko) | 광학식 거리 센서 | |
DE69016919T2 (de) | Optischer Sensor. | |
DE69020189T2 (de) | Optisches Bauelement. | |
KR900006769A (ko) | 광학센서 | |
DE68900533D1 (de) | Optischer positionssensor. | |
FI912295A0 (fi) | Optisk hastighetsbestaemning. | |
DE69020625D1 (de) | Optisches System. | |
DE69023799D1 (de) | Lichtleiter-Messfühler. | |
KR910014686A (ko) | 광센서 | |
NO890698L (no) | Optisk fiberfoeler. | |
DE3750292D1 (de) | Optischer Verschiebungsaufnehmer. | |
DE3874508D1 (de) | Optischer positionssensor. | |
DE69007002T2 (de) | Rolamit-Messaufnehmer. | |
DE69011397D1 (de) | Stellungsfühler. | |
DE3885499D1 (de) | Optische Sensoranordnung. | |
DE69002126T2 (de) | Photodetektor. | |
DE69116636D1 (de) | Optischer Fühler | |
DE69000813T2 (de) | Signalleuchte. | |
DE69004569D1 (de) | Faseroptisches sensorsystem. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |