DE60336534D1 - Vorrichtung zur OCT Bildaufnahme mit axialem Linienfokus für verbesserte Auflösung und Tiefenschärfe - Google Patents

Vorrichtung zur OCT Bildaufnahme mit axialem Linienfokus für verbesserte Auflösung und Tiefenschärfe

Info

Publication number
DE60336534D1
DE60336534D1 DE60336534T DE60336534T DE60336534D1 DE 60336534 D1 DE60336534 D1 DE 60336534D1 DE 60336534 T DE60336534 T DE 60336534T DE 60336534 T DE60336534 T DE 60336534T DE 60336534 D1 DE60336534 D1 DE 60336534D1
Authority
DE
Germany
Prior art keywords
depth
field
image acquisition
axial line
oct image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60336534T
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English (en)
Inventor
Guillermo J Tearney
Brett Eugene Bouma
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Hospital Corp
Original Assignee
General Hospital Corp
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Filing date
Publication date
Application filed by General Hospital Corp filed Critical General Hospital Corp
Application granted granted Critical
Publication of DE60336534D1 publication Critical patent/DE60336534D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02035—Shaping the focal point, e.g. elongated focus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02027—Two or more interferometric channels or interferometers
    • G01B9/02028—Two or more reference or object arms in one interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02034—Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02035—Shaping the focal point, e.g. elongated focus
    • G01B9/02036—Shaping the focal point, e.g. elongated focus by using chromatic effects, e.g. a wavelength dependent focal point
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
DE60336534T 2002-01-11 2003-01-10 Vorrichtung zur OCT Bildaufnahme mit axialem Linienfokus für verbesserte Auflösung und Tiefenschärfe Expired - Lifetime DE60336534D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US34752802P 2002-01-11 2002-01-11
PCT/US2003/000699 WO2003060423A2 (en) 2002-01-11 2003-01-10 Apparatus for low coherence ranging

Publications (1)

Publication Number Publication Date
DE60336534D1 true DE60336534D1 (de) 2011-05-12

Family

ID=32987184

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60336534T Expired - Lifetime DE60336534D1 (de) 2002-01-11 2003-01-10 Vorrichtung zur OCT Bildaufnahme mit axialem Linienfokus für verbesserte Auflösung und Tiefenschärfe

Country Status (9)

Country Link
US (1) US7310150B2 (de)
EP (4) EP2290319B1 (de)
JP (1) JP2005530128A (de)
CN (2) CN101598685B (de)
AT (1) ATE503982T1 (de)
AU (2) AU2003207507A1 (de)
CA (1) CA2473465C (de)
DE (1) DE60336534D1 (de)
WO (1) WO2003060423A2 (de)

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WO2003060423A2 (en) 2003-07-24
EP1468245B1 (de) 2011-03-30
WO2003060423A8 (en) 2005-05-19
EP2290319A1 (de) 2011-03-02
AU2009202383A1 (en) 2009-07-09
AU2003207507A2 (en) 2003-07-30
US7310150B2 (en) 2007-12-18
WO2003060423A3 (en) 2003-12-11
CA2473465A1 (en) 2003-07-24
ATE503982T1 (de) 2011-04-15
CN101598685A (zh) 2009-12-09
JP2005530128A (ja) 2005-10-06
EP1468245A2 (de) 2004-10-20
US20050018200A1 (en) 2005-01-27
EP2327954A1 (de) 2011-06-01
EP2290319B1 (de) 2015-08-26
EP2290318A1 (de) 2011-03-02
CA2473465C (en) 2011-04-05
AU2009202383B2 (en) 2012-09-13
AU2003207507A1 (en) 2003-07-30
EP2290318B1 (de) 2015-08-26
CN1639539A (zh) 2005-07-13
CN101598685B (zh) 2013-11-06

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