DE60323327D1 - Anordnung und Verfahren zur Gestaltrekonstruktion aus optischen Bildern - Google Patents
Anordnung und Verfahren zur Gestaltrekonstruktion aus optischen BildernInfo
- Publication number
- DE60323327D1 DE60323327D1 DE60323327T DE60323327T DE60323327D1 DE 60323327 D1 DE60323327 D1 DE 60323327D1 DE 60323327 T DE60323327 T DE 60323327T DE 60323327 T DE60323327 T DE 60323327T DE 60323327 D1 DE60323327 D1 DE 60323327D1
- Authority
- DE
- Germany
- Prior art keywords
- reconstruction
- construct
- arrangement
- optical images
- images
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/392,948 US7352892B2 (en) | 2003-03-20 | 2003-03-20 | System and method for shape reconstruction from optical images |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60323327D1 true DE60323327D1 (de) | 2008-10-16 |
Family
ID=32824892
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60323327T Expired - Lifetime DE60323327D1 (de) | 2003-03-20 | 2003-11-03 | Anordnung und Verfahren zur Gestaltrekonstruktion aus optischen Bildern |
Country Status (3)
Country | Link |
---|---|
US (1) | US7352892B2 (de) |
EP (2) | EP1775684A1 (de) |
DE (1) | DE60323327D1 (de) |
Families Citing this family (50)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7162035B1 (en) | 2000-05-24 | 2007-01-09 | Tracer Detection Technology Corp. | Authentication method and system |
CA2525594C (en) * | 2003-07-24 | 2011-01-04 | Cognitens Ltd. | A system and method for monitoring and visualizing the output of a production process |
JP2007206797A (ja) | 2006-01-31 | 2007-08-16 | Omron Corp | 画像処理方法および画像処理装置 |
WO2007098587A1 (en) * | 2006-03-03 | 2007-09-07 | Philip Koshy | Assessment of surface roughness of objects |
GB0616293D0 (en) | 2006-08-16 | 2006-09-27 | Imp Innovations Ltd | Method of image processing |
US20080089577A1 (en) * | 2006-10-11 | 2008-04-17 | Younian Wang | Feature extraction from stereo imagery |
GB2453163B (en) * | 2007-09-26 | 2011-06-29 | Christopher Douglas Blair | Three-dimensional imaging system |
US8143600B2 (en) | 2008-02-18 | 2012-03-27 | Visiongate, Inc. | 3D imaging of live cells with ultraviolet radiation |
US9082164B2 (en) * | 2008-04-04 | 2015-07-14 | Lina Jamil Karam | Automatic cell migration and proliferation analysis |
US7995196B1 (en) | 2008-04-23 | 2011-08-09 | Tracer Detection Technology Corp. | Authentication method and system |
DE102008040774A1 (de) * | 2008-07-28 | 2010-02-04 | Robert Bosch Gmbh | Handgehaltenes Elektrowerkzeug |
US8289318B1 (en) | 2008-08-29 | 2012-10-16 | Adobe Systems Incorporated | Determining three-dimensional shape characteristics in a two-dimensional image |
US20100091127A1 (en) * | 2008-09-30 | 2010-04-15 | University Of Victoria Innovation And Development Corporation | Image reconstruction method for a gradient camera |
US20100085359A1 (en) * | 2008-10-03 | 2010-04-08 | Microsoft Corporation | Surface normal reconstruction from a single image |
EP2403396B1 (de) | 2009-03-04 | 2019-08-14 | Elie Meimoun | Vorrichtung und verfahren zur überprüfung von wellenfrontanalysen |
TW201110928A (en) * | 2009-09-16 | 2011-04-01 | Univ Chang Gung | Optical tracking apparatus and its positioning method |
CN102103747B (zh) * | 2009-12-16 | 2012-09-05 | 中国科学院电子学研究所 | 采用参照物高度的监控摄像机外部参数标定方法 |
WO2012037067A1 (en) * | 2010-09-14 | 2012-03-22 | Massachusetts Institute Of Technology | Multi-contrast image reconstruction with joint bayesian compressed sensing |
US8495527B2 (en) | 2010-10-28 | 2013-07-23 | International Business Machines Corporation | Pattern recognition with edge correction for design based metrology |
US8429570B2 (en) | 2010-10-28 | 2013-04-23 | International Business Machines Corporation | Pattern recognition with edge correction for design based metrology |
US9082188B2 (en) * | 2011-04-11 | 2015-07-14 | Hid Global Corporation | Optical topographic imaging |
KR101226913B1 (ko) | 2011-04-12 | 2013-01-28 | 주식회사 휴비츠 | 영상 합성을 위한 3차원 프로파일 지도 작성 방법 |
EP2719160A2 (de) | 2011-06-06 | 2014-04-16 | 3Shape A/S | 3d-scanner mit dualer auflösung |
CN102788559B (zh) * | 2012-07-19 | 2014-10-22 | 北京航空航天大学 | 一种宽视场结构光视觉测量系统及测量方法 |
DE102014107143B4 (de) * | 2013-05-22 | 2021-03-04 | Cognex Corp. | System und Verfahren zur Messung der Verschiebung einer Objektoberfläche |
US9605950B2 (en) | 2013-05-22 | 2017-03-28 | Cognex Corporation | System and method for efficient surface measurement using a laser displacement sensor |
WO2014200648A2 (en) * | 2013-06-14 | 2014-12-18 | Kla-Tencor Corporation | System and method for determining the position of defects on objects, coordinate measuring unit and computer program for coordinate measuring unit |
WO2015036994A1 (en) * | 2013-09-16 | 2015-03-19 | Technion Research & Development Foundation Limited | 3d reconstruction from photometric stereo with shadows |
EP2887055B1 (de) | 2013-12-17 | 2016-05-11 | CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement | Verfahren und Vorrichtung zur Detektion sichtbarer Fehler |
CN106030240B (zh) * | 2014-01-08 | 2019-04-30 | 雅马哈发动机株式会社 | 外观检查装置及外观检查方法 |
KR102401057B1 (ko) * | 2014-02-27 | 2022-05-24 | 인튜어티브 서지컬 오퍼레이션즈 인코포레이티드 | 정반사 검출 및 저감을 위한 시스템 및 방법 |
CN106572792B (zh) * | 2014-06-05 | 2020-03-06 | 海德堡大学 | 用于多光谱成像的方法和部件 |
JP6424020B2 (ja) * | 2014-06-09 | 2018-11-14 | 株式会社キーエンス | 画像検査装置、画像検査方法、画像検査プログラム及びコンピュータで読み取り可能な記録媒体並びに記録した機器 |
JP6470506B2 (ja) * | 2014-06-09 | 2019-02-13 | 株式会社キーエンス | 検査装置 |
JP6403445B2 (ja) * | 2014-06-09 | 2018-10-10 | 株式会社キーエンス | 検査装置、検査方法およびプログラム |
KR101794964B1 (ko) * | 2015-07-17 | 2017-11-07 | 주식회사 고영테크놀러지 | 검사 시스템 및 검사 방법 |
US9883167B2 (en) * | 2015-09-25 | 2018-01-30 | Disney Enterprises, Inc. | Photometric three-dimensional facial capture and relighting |
JP2017067632A (ja) * | 2015-09-30 | 2017-04-06 | キヤノン株式会社 | 検査装置および物品製造方法 |
CN106200279B (zh) * | 2016-09-22 | 2018-06-26 | 上海华虹宏力半导体制造有限公司 | 一种用于光刻版图opc的采样方法及装置 |
JP6578454B2 (ja) * | 2017-01-10 | 2019-09-18 | 富士フイルム株式会社 | ノイズ処理装置及びノイズ処理方法 |
US11204896B2 (en) | 2017-08-18 | 2021-12-21 | International Business Machines Corporation | Scalable space-time density data fusion |
US11328407B2 (en) * | 2018-02-26 | 2022-05-10 | Koh Young Technology Inc. | Method for inspecting mounting state of component, printed circuit board inspection apparatus, and computer readable recording medium |
US10839264B2 (en) | 2018-11-09 | 2020-11-17 | International Business Machines Corporation | Scalable feature classification for laser scanning data and digital elevation models |
US11360970B2 (en) | 2018-11-13 | 2022-06-14 | International Business Machines Corporation | Efficient querying using overview layers of geospatial-temporal data in a data analytics platform |
US10817290B2 (en) * | 2018-12-19 | 2020-10-27 | Zebra Technologies Corporation | Method and system for a machine vision interface |
CN111766253A (zh) * | 2019-03-15 | 2020-10-13 | 鸿富锦精密电子(成都)有限公司 | 锡膏印刷品质检测方法、数据处理装置及计算机存储介质 |
WO2021097134A1 (en) * | 2019-11-13 | 2021-05-20 | The Regents Of The University Of California | Pore measurement device |
JP6825067B2 (ja) * | 2019-11-13 | 2021-02-03 | 株式会社キーエンス | 検査装置およびその制御方法 |
CN112651888A (zh) * | 2020-11-25 | 2021-04-13 | 北京字跳网络技术有限公司 | 图像处理方法、装置、电子设备及存储介质 |
US11734812B2 (en) * | 2021-03-18 | 2023-08-22 | UnitX, Inc. | Fused imaging device and method |
Family Cites Families (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4876455A (en) * | 1988-02-25 | 1989-10-24 | Westinghouse Electric Corp. | Fiber optic solder joint inspection system |
DE68925901T2 (de) | 1988-05-09 | 1996-11-14 | Omron Tateisi Electronics Co | Substrat-prüfungsvorrichtung |
US4893183A (en) * | 1988-08-11 | 1990-01-09 | Carnegie-Mellon University | Robotic vision system |
JPH02231510A (ja) | 1989-03-02 | 1990-09-13 | Omron Tateisi Electron Co | 基板検査装置 |
US4988202A (en) * | 1989-06-28 | 1991-01-29 | Westinghouse Electric Corp. | Solder joint inspection system and method |
US5097516A (en) * | 1991-02-28 | 1992-03-17 | At&T Bell Laboratories | Technique for illuminating a surface with a gradient intensity line of light to achieve enhanced two-dimensional imaging |
US5283837A (en) * | 1991-08-27 | 1994-02-01 | Picker International, Inc. | Accurate estimation of surface normals in 3-D data sets |
DE69435333D1 (de) | 1993-04-21 | 2011-03-24 | Omron Tateisi Electronics Co | Vorrichtung zur visuellen kontrolle von platinen und deren verwendung zur kontrolle und korrektur von lötungen |
FR2736455B1 (fr) * | 1995-07-03 | 1997-08-08 | Commissariat Energie Atomique | Procede de reconstruction d'une image 3d avec amelioration du contraste et de la resolution et application de ce procede a la realisation d'une cartographie d'attenuation d'un objet |
GB2310557B (en) * | 1996-02-21 | 2000-05-10 | Rank Taylor Hobson Ltd | Image processing apparatus |
JPH1062140A (ja) * | 1996-08-14 | 1998-03-06 | Oki Electric Ind Co Ltd | 形状の再構成方法および形状の再構成装置 |
US6064759A (en) * | 1996-11-08 | 2000-05-16 | Buckley; B. Shawn | Computer aided inspection machine |
US5991434A (en) * | 1996-11-12 | 1999-11-23 | St. Onge; James W. | IC lead inspection system configurable for different camera positions |
US5760893A (en) | 1996-12-24 | 1998-06-02 | Teradyne, Inc. | Method and apparatus for inspecting component placement and solder connection in printed circuit board manufacture |
US5878152A (en) * | 1997-05-21 | 1999-03-02 | Cognex Corporation | Depth from focal gradient analysis using object texture removal by albedo normalization |
DE19721903C1 (de) * | 1997-05-26 | 1998-07-02 | Aicon Industriephotogrammetrie | Verfahren und Anlage zur meßtechnischen räumlichen 3D-Lageerfassung von Oberflächenpunkten |
US6219461B1 (en) * | 1997-07-29 | 2001-04-17 | Cognex Corporation | Determining a depth |
US6304680B1 (en) * | 1997-10-27 | 2001-10-16 | Assembly Guidance Systems, Inc. | High resolution, high accuracy process monitoring system |
US6173070B1 (en) * | 1997-12-30 | 2001-01-09 | Cognex Corporation | Machine vision method using search models to find features in three dimensional images |
US5974168A (en) * | 1998-04-16 | 1999-10-26 | International Business Machines Corporation | Acquiring bump maps from curved objects |
US6207946B1 (en) | 1998-09-03 | 2001-03-27 | Semiconductor Technologies & Instruments, Inc. | Adaptive lighting system and method for machine vision apparatus |
US6393141B1 (en) * | 1998-09-10 | 2002-05-21 | Warner-Lambert Company | Apparatus for surface image sensing and surface inspection of three-dimensional structures |
US6273338B1 (en) | 1998-09-22 | 2001-08-14 | Timothy White | Low cost color-programmable focusing ring light |
JP3740865B2 (ja) * | 1998-10-08 | 2006-02-01 | コニカミノルタホールディングス株式会社 | 多視点3次元データの合成方法および記録媒体 |
US6323942B1 (en) | 1999-04-30 | 2001-11-27 | Canesta, Inc. | CMOS-compatible three-dimensional image sensor IC |
US6512838B1 (en) | 1999-09-22 | 2003-01-28 | Canesta, Inc. | Methods for enhancing performance and data acquired from three-dimensional image systems |
KR100356016B1 (ko) * | 1999-12-21 | 2002-10-18 | 한국전자통신연구원 | 영상인식에 의한 소포우편물 부피계측시스템 및부피계측방법 |
US6515740B2 (en) | 2000-11-09 | 2003-02-04 | Canesta, Inc. | Methods for CMOS-compatible three-dimensional image sensing using quantum efficiency modulation |
US20030025906A1 (en) | 2001-08-06 | 2003-02-06 | Beamworks Ltd. | Optical inspection of solder joints |
SG129992A1 (en) * | 2001-08-13 | 2007-03-20 | Micron Technology Inc | Method and apparatus for detecting topographical features of microelectronic substrates |
US6765584B1 (en) * | 2002-03-14 | 2004-07-20 | Nvidia Corporation | System and method for creating a vector map in a hardware graphics pipeline |
US7171037B2 (en) * | 2003-03-20 | 2007-01-30 | Agilent Technologies, Inc. | Optical inspection system and method for displaying imaged objects in greater than two dimensions |
US7019826B2 (en) * | 2003-03-20 | 2006-03-28 | Agilent Technologies, Inc. | Optical inspection system, apparatus and method for reconstructing three-dimensional images for printed circuit board and electronics manufacturing inspection |
-
2003
- 2003-03-20 US US10/392,948 patent/US7352892B2/en active Active
- 2003-11-03 DE DE60323327T patent/DE60323327D1/de not_active Expired - Lifetime
- 2003-11-03 EP EP07001634A patent/EP1775684A1/de not_active Withdrawn
- 2003-11-03 EP EP03025303A patent/EP1462992B1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20040184648A1 (en) | 2004-09-23 |
EP1462992A2 (de) | 2004-09-29 |
EP1462992A3 (de) | 2006-02-08 |
EP1462992B1 (de) | 2008-09-03 |
US7352892B2 (en) | 2008-04-01 |
EP1775684A1 (de) | 2007-04-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE60323327D1 (de) | Anordnung und Verfahren zur Gestaltrekonstruktion aus optischen Bildern | |
DE602006001816D1 (de) | Vorrichtung und Verfahren zur optischen Tomographie | |
DE602004005520D1 (de) | Anordnung und Verfahren zur Bilderkennung | |
DE602004020032D1 (de) | Bildaufnahmevorrichtung und Verfahren zur Bildsynthese | |
DE602006021502D1 (de) | Vorrichtung und Verfahren zur Bildverarbeitung | |
DE602005000213D1 (de) | Verfahren und Einrichtung zur optischen Übertragung | |
DE602006014341D1 (de) | Vorrichtung und Verfahren zur Immersionslithographie | |
DE502006008842D1 (de) | Hörvorrichtung und entsprechendes Verfahren zur Eigenstimmendetektion | |
DE602005022779D1 (de) | Verfahren und vorrichtung zur alternierenden bild-videoeinfügung | |
DE602006007458D1 (de) | Verfahren und vorrichtung zur bohrlochfluidanalyse | |
DE602004005770D1 (de) | Vorrichtung und Verfahren zur Schlafapnödiagnose | |
DE602004014229D1 (de) | Verfahren und Gerät zur Röntgenbildverarbeitung | |
DE602005007131D1 (de) | Gerät und Verfahren zur Bewegungsdetektion | |
DE602004015700D1 (de) | Verfahren und Vorrichtung zur digitalen Videoverteilung | |
DE602005021437D1 (de) | Gerät und Verfahren zur tomografischen Bildrekonstruktion | |
DE602004000876D1 (de) | Verfahren und Gerät zur Bildung eines dreidimensionalen Bildes | |
DE602006002668D1 (de) | Gerät und Verfahren zur Informationsverarbeitung | |
DE602006003791D1 (de) | Gerät zur Bildinformationsverarbeitung und dessen Verfahren | |
DE602004032073D1 (de) | Verfahren und Gerät zur Röntgenanalyse | |
DE602006013558D1 (de) | Vorrichtung und Verfahren zur Bilderzeugung | |
DE602005026600D1 (de) | Verfahren und Vorrichtung zur Bilderzeugung | |
DE602004016105D1 (de) | Verfahren und Vorrichtung zur Schätzung des Tonerverbrauchs | |
DE602006020829D1 (de) | Verfahren und Vorrichtung zur Datenwiedergabe | |
DE602006002950D1 (de) | Verfahren und Vorrichtung zur dienstqualitätsbasierten-Routing | |
DE602004023801D1 (de) | Verfahren und Vorrichtung zur Informationsaufzeichnung in optischen Mehrfachschichten |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: MICRON TECHNOLOGY, INC., BOISE, ID., US |
|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: APTINA IMAGING CORP., GRAND CAYMAN, CAYMAN ISL, KY |